User Guide for FEDFOD8316 Evaluation Board
Contents
1. L c5 TP Coup o 915 L c12 Sint SZ Vss 1 A e A MSS TP12 Figure 5 Circuit Schematic 2013 Fairchild Semiconductor Corporation 7 FEBFOD8316 Evaluation Board Rev 1 0 0 A EA FAIRCHILD SSA SEMICONDUCTOR Fairchild Semiconductor WFEBFOD8316 i9 2012 10 18 J P4 ABLK 019 394v0 a BK b JTP5 PQ M KB 6160 E313218 JIP5A d TP14 Figure 6 Photograph of the Board This board consists of a FOD8316 component a non inverting bipolar NPN PNP totem pole current buffer two capacitor loads 10nF 51 nF as well as connectors and test terminals for power supplies and input signals The FOD8316 can be evaluated as a stand alone gate driver driving a 10 nF capacitor load or FOD8316 with the totem pole current buffer driving a 51 nF capacitor load O 2013 Fairchild Semiconductor Corporation 8 FEBFOD8316 Evaluation Board Rev 1 0 0 A FAIRCHILD ESAS SEMICONDUCTOR ww fairchildsemi com 4 Setup and Operation The setup requires three power supply sources Vpp on one side of the isolation barrier Vppo positive supply and Vss negative supply using two power supplies on the other side of the isolation barrier There are two CMOS TTL compatible inputs Nu and Vi to control the IGBT in non inverting and inverting configurations respectively When Vin is set LOW Num controls the driver outp2. 1 Life support devices or systems are devices or systems which a 2 A critical component is any component of a life support device or are intended for surgical implant into the body or b support or system whose failure to perform can be reasonably expected to sustain life or c whose failure to perform when properly used in cause the failure of the life support device or system or to affect its accordance with instructions for use provided in the labeling can be safety or effectiveness reasonably expected to result in significant injury to the user ANTI COUNTERFEITING POLICY Fairchild Semiconductor Corporation s Anti Counterfeiting Policy Fairchild s Anti Counterfeiting Policy is also stated on our external website www fairchildsemi com under Sales Support Counterfeiting of semiconductor parts is a growing problem in the industry All manufacturers of semiconductor products are experiencing counterfeiting of their parts Customers who inadvertently purchase counterfeit parts experience many problems such as loss of brand reputation substandard performance failed applications and increased cost of production and manufacturing delays Fairchild is taking strong measures to protect ourselves and our customers from the proliferation of counterfeit parts Fairchild strongly encourages customers to purchase Fairchild parts either directly from Fairchild or from Authorized Fairchild Distributors who are listed by country on our web page
3. U FAULT o l o Vo U U U U 4 i GND1 o a 8 1 Vigpi l o Vss ZB i o DESAT RESET oo o VE P A U U U U U Ad VLED2 Figure 2 FOD8316 Block Diagram O 2013 Fairchild Semiconductor Corporation 4 FEBFOD8316 Evaluation Board Rev 1 0 0 E FAIRCHILD ESAS SEMICONDUCTOR 2 12 011U09 ww fairchilds mi com Operations The application circuit and the timing diagram illustrate the functional use of the FOD8316 between a micro controller and a three phase system as well as the interaction of the internal and external signals 70 100pF 10uF p p H DpgsAT AAA Di em tQ ve SEH 15V Rg Pin 8 Vj gp4 is internally connected to pin 4 GND1 Figure 3 Typical Application Circuit The internal gate driving circuitry of FOD8316 can be used with either a single positive power supply Vpp2 or a dual positive and negative supply Von and Vss The output driver stage Vo is made up of a pair of PMOS and NMOS transistors which facilitates close to rail to rail output swing This allows a tight control of gate voltage during on state and short circuit condition Due to the low Rps ox of the MOSFETs the power dissipation is reduced as compared to bipolar type driver output stages The absolute maximum rating of the output peak current lorrax is 3 A FOD8316 provides short circuit protectio
4. FOD8316 Vin Vo and Vo Waveform O2 44 2 A BT AER oro eee vor eee eee A T EE WE db be bera 5 00 V Mi 00gs A Chl J 2 80 V chal 5 00v GE 5 00V 2Jan 2013 10 21 34 di 2 98400g0s Figure 10 FOD8316 Vin Vo and Voz Waveform During Soft Turn Off 2013 Fairchild Semiconductor Corporation 12 FEBFOD8316 Evaluation Board Rev 1 0 0 eee FAIRCHILD See LS Vind d SEMICONDUCTOR 7 Conclusion The FEDFOD83 16 evaluation board allows the user to quickly evaluate the performance of the Fairchild Semiconductor s FOD8316 smart gate driver optocoupler Measurement results clearly demonstrate the AC performance and critical protection features of the product that are needed during IGBT fault conditions With proper booster circuit design the gate drive capability can be enhanced without affecting key features such as desaturation detection and soft turn off timings 2013 Fairchild Semiconductor Corporation 13 FEBFOD8316 Evaluation Board Rev 1 0 0 ww fairchildsemi com E FAIRCHILD ESAS SEMICONDUCTOR 8 Revision History Rev Date Description 1 0 0 January 2013 _ Initial Release WARNING AND DISCLAIMER Replace components on the Evaluation Board only with those parts shown on the parts list or Bill of Materials in the Users Guide Contact an authorized Fairchild representative with any questions This board is intended to be used by certifie
5. cited above Products customers buy either from Fairchild directly or from Authorized Fairchild Distributors are genuine parts have full traceability meet Fairchild s quality standards for handling and storage and provide access to Fairchild s full range of up to date technical and product information Fairchild and our Authorized Distributors will stand behind all warranties and will appropriately address any warranty issues that may arise Fairchild will not provide any warranty coverage or other assistance for parts bought from Unauthorized Sources Fairchild is committed to combat this global problem and encourage our customers to do their part in stopping this practice by buying direct or from authorized distributors EXPORT COMPLIANCE STATEMENT These commodities technology or software were exported from the United States in accordance with the Export Administration Regulations for the ultimate destination listed on the commercial invoice Diversion contrary to U S law is prohibited U S origin products and products made with U S origin technology are subject to U S Re export laws In the event of re export the user will be responsible to ensure the appropriate U S export regulations are followed 2013 Fairchild Semiconductor Corporation 14 FEBFOD8316 Evaluation Board Rev 1 0 0
6. cuit to prevent the application of insufficient gate voltage to the IGBT This could be dangerous as it would drive the IGBT out of saturation and into the linear operation where the losses are very high and the device is quickly overheated 2013 Fairchild Semiconductor Corporation 6 FEBFOD8316 Evaluation Board Rev 1 0 0 eee FAIRCHILD ae Can cR SEMICONDUCTOR ww fairchilds mi com 3 Circuit Schematic The FEBFOD8316 evaluation board with a booster circuit is designed for the evaluation of FOD8316 timing sequence and AC test performance when driving an IGBT power module It is recommended to be used in conjunction with the datasheet The FOD8316 is designed to perform as a stand alone optically coupled gate driver in most applications If larger gate drive capability is needed for large IGBT modules or parallel operation an output booster stage may be added to driver for optimum performance One possible implementation is by a discrete NPN PNP totem pole configuration These booster transistors should be fast switching and have sufficient current gain to deliver the desired peak output current TP6 TP6A J13 D1 D2 Ddesat Ddesat TP7 J1 J2 U1 FOD8316 D AZUF 4TyF lol 7 35V y CTP LH c13 J8 T 10pF R2 Q NZ 35V 100 4 2 Vol TP10
7. d professionals in a lab environment following proper safety procedures Use at your own risk The Evaluation board or kit is for demonstration purposes only and neither the Board nor this User s Guide constitute a sales contract or create any kind of warranty whether express or implied as to the applications or products involved Fairchild warrantees that its products meet Fairchild s published specifications but does not guarantee that its products work in any specific application Fairchild reserves the right to make changes without notice to any products described herein to improve reliability function or design Either the applicable sales contract signed by Fairchild and Buyer or if no contract exists Fairchild s standard Terms and Conditions on the back of Fairchild invoices govern the terms of sale of the products described herein DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY FUNCTION OR DESIGN FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS NOR THE RIGHTS OF OTHERS LIFE SUPPORT POLICY FAIRCHILD S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION As used herein
8. ee eet FAIRCHILD a EPA hi indi d SEMICONDUCTOR User Guide for FEBFOD8316 Evaluation Board 2 5 A Output Current IGBT Drive Optocoupler with Desaturation Detection and Isolated Fault Sensing Featured Fairchild Product s FOD8316 Direct questions or comments about this evaluation board to Worldwide Direct Support Fairchild Semiconductor com 2013 Fairchild Semiconductor Corporation FEBFOD8316 Evaluation Board Rev 1 0 0 eee FAIRCHILD See LS Vind d SEMICONDUCTOR Table of Contents 1 DIE O D 3 1 1 Features and Renette ETUR ed 3 12 Applications e EDIT EE 4 2 Operations ses n cMERSTQTTTTITTTS 5 3 Circuit Schematic EE eren PEL erae SEa iaai 7 4 Setup o ORE D eee iil Nee meten 9 5 Test Pxeesdun stand ionditions eee LL eegnen EE 9 6 CEET Lees en oo eene 11 ent E emen e Sn A 13 8 BEC ASTM ES Leu EE mee e END en 14 2013 Fairchild Semiconductor Corporation 2 FEBFOD8316 Evaluation Board Rev 1 0 0 ee ee FAIRCHILD See bi Vind d SEMICONDUCTOR 1 Overview Fairchild Semiconductor s FOD8316 smart gate driver optocoupler an advanced 2 5 A output current IGBT drive optocoupler offers the critical protection necessary for preventing fault conditions that lead to destructive thermal runaway of IGBTs Pin for pin compatible with current solutions the FOD8316 consists of an integrated gate drive optocoupler featuring low Bra CMOS transistors to d
9. n by means of desaturation detection circuits that monitor the collector emitter voltage of the IGBT When the DESAT voltage increases above the threshold voltage a short circuit condition is detected and the driver output stage executes a soft IGBT turn off and is eventually driven low The soft turn off feature ensures the safe turn off of the IGBT under fault conditions This reduces the voltage spike on the collector of the IGBT Without this the IGBT would see a heavy spike on the collector resulting in a permanent damage to the device when it is turned off immediately The FAULT open drain output is triggered active LOW to report a desaturation error to the micro controller The FAULT signal is cleared by activating the RESET pin with an active LOW signal communicated by the external controller The DESAT fault detector should be disabled for a short period blanking time before the IGBT turns on to allow the collector voltage to fall below the DESAT threshold This blanking period protects against false trigger of the DESAT while the IGBT is turning on 2013 Fairchild Semiconductor Corporation 5 FEBFOD8316 Evaluation Board Rev 1 0 0 FAIRCHILD SSA SEMICONDUCTOR VIN VIN RESET VDESAT Vo FAULT Normal Operation oV 5V OV ww fairchilds mi com Fault Condition Reset Blanking Time 7V Figure 4 Timing Diagram The FOD8316 is also designed with an under voltage detection cir
10. r installed and TP7 Desat has to be pulled above the desat threshold voltage 5 Scope shots of the signals are shown in the following section using the board in standalone set up and with the totem pole current buffer 6 Additional evaluation is accomplished by changing the jumper configuration For example the board can be configured to positive gate drive Vo 0 V only requiring one power supply source at each side of the isolation barrier The desat threshold voltage seen at TP7 and the blanking time can also be varied using jumper J10 and by soldering additional capacitor on the C9 pads 7 The test points and their corresponding signals are listed in Table 2 on the next page 2013 Fairchild Semiconductor Corporation 9 FEBFOD8316 Evaluation Board Rev 1 0 0 E FAIRCHILD ESAS SEMICONDUCTOR ww fairchildsemi com Table 1 EVB Jumper Configurations Configuration J1 J2 J3 J4 J5 J6 J7 J8 J9 J10 J11 J12 J13 J14 J15 Vo swing 5 V to 15 V X X X X X FOD8316 standalone Vo swing 7 5 V to 15 V X X X X X X X X X FOD8316 totem pole Vo swing 5 V to 15 V X X X X X X X X FOD8316 and totem pole for soft turn off evaluation Vo swing 5 V to 15 V X X X X FOD8316 standalone for soft turn off evaluation X jumper short blank jumper open J4 is removed in the latest revision of the evaluation boa
11. rd Table 2 Test Points Test Point Description TP1 Vins non inverting gate drive control input TP1A Vin inverting gate drive control input TP2 Voo1 positive input supply voltage 3 V to 5 5 V TP3 RESET FAULT reset input TP4 FAULT fault output TP5 5A Vieo1 LED1 cathode must be connected to ground TP6 6A 6B Ve output supply voltage IGBT emitter TP7 DESAT desaturation voltage input TP8 Voppa positive output supply voltage TP9 Vs source of pull up PMOS transistor TP10 Vo1 gate drive output voltage TP11 Vo totem pole current buffer output voltage TP12 Vss negative output supply voltage 2013 Fairchild Semiconductor Corporation 10 FEBFOD8316 Evaluation Board Rev 1 0 0 SES FAIRCHILD SEMICONDUCTOR ww fairchildsemi com 6 Scope Shots Tek Run T wees ees eee ee el Vo1 TP10 PE Mons A Chi Y 2 80V Chi 5 00 V 22 May 2012 i 39 4600ps 15 15 35 Figure 7 FOD8316 Vum and Voi Waveform in Standalone Configuration Ch3 5 00 V 2Jan 2013 fie 2 98400ps 10 19 20 Figure 8 FOD8316 Vum and Vo1 Waveform in Standalone Configuration During Soft Turn Off 2013 Fairchild Semiconductor Corporation 11 FEBFOD8316 Evaluation Board Rev 1 0 0 FAIRCHILD SEMICONDUCTOR ww fairchilds mi c om Chi 5 00 V M20 0uS A Chl S 2 80V GIE 100V cha 10 0V 22 May 2012 ue 40 0000us 15 39 08 Figure 9
12. rive the IGBT from rail to rail and high speed isolated feedback circuitry for fault sensing It is ideally suited for driving fast switching power IGBTs and MOSFETs The FOD8316 offers best in class noise immunity resulting from its proprietary Optoplanar coplanar packaging technology The optoplanar technology ensures safe insulation thickness of more than 0 4 millimeters in attaining reliable high voltage isolation certified by UL1577 and DIN EN IEC60747 5 5 standards Figure 1 3 Dimensional Illustration of the Internal Die Set of Fairchild s Optoplanar Package Construction 1 1 Features and Benefits 2 5 A output current driving capability for most 1200 V 150 A IGBTs High noise immunity characterized by CMR 35 kV pus at Vem 1500 V peak 1414 Vak working insulation voltage and 8000 V transient isolation voltage rating Output voltage swing rail to rail low power dissipation Soft IGBT turn off High speed 500 ns propagation delay 3 3 V 5V CMOS TTL compatible inputs 2013 Fairchild Semiconductor Corporation 3 FEBFOD8316 Evaluation Board Rev 1 0 0 ww fairchilds mi com eee FAIRCHILD ESAS SEMICONDUCTOR 1 2 Applications Motor Drives Industrial Inverters Solar Power Inverters Uninterruptible Power Supplies UPS Induction Heating Isolated IGBT Drive VLED1 o Vi Vpp1 o3 o Vpp2 oVs Vin 1 1 Vin 02 t
13. ut Vo in non inverting configuration When Vy is set HIGH Vin controls the driver output in inverting configuration The subsequent sections describe the set up for non inverting configuration where Vw is connected to GND1 The input signal is applied at the Vin and the resulting output is used to drive either a 10 nF capacitor load C8 or a totem pole current buffer which in turn drives a bigger capacitor load C12 Test points located at selected positions as indicated in the schematics allow the technician to probe out the signals and measure the switching characteristics of the device 5 Test Procedures and Conditions This section describes the default setup of the FEBFOD8316 evaluation board Please refer to the schematic in Figure 5 1 Connect the power supplies across the following connector Across Vpp and GNDI Set the voltage to 5 V Across Vpp and Vg GND of the power supply Set the voltage to 15 V Across Vg and Vss GND of the power supply Set the voltage to 5 V This power supply configuration enables Vo to swing from 5 V to 15 V 2 Apply the following signal at Vy 10 kHz square wave 50 duty cycle amplitude 5 V 3 Evaluation can be completed with the FOD8316 as a standalone gate driver or together with the totem pole current buffer The jumper configurations are shown in Table 1 on the following page 4 If soft turn off evaluation is required J13 must be left open with no shorting jumpe
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