601-327A - NSG 5071 User Manual english.indd
Contents
1. NSG 5071 INDUCTIVE SWITCH TRANSIENT TEST CIRCUIT USER MANUAL 601 327A Advanced Test Solutions for EMC 5071 INDUCTIVE SWITCH TRANSIENT TEST CIRCUIT USER MANUAL CONTENTS Explanation of the symbols used in this manual Warning symbols on the test system General safety Overcurrent protection Voltage protection General warnings Introduction to the NSG 5071 Installation of the NSG 5071 Usage of the NSG 5071 for CI 220 Battery input CI 220 DUT output Selecting the pulse Controlling the input signal Usage of CI 260 waveform F Relay monitoring usage and replacement Resetting the counter Replacing the relays Relay usage Maintenance Cleaning Batteries Calibration Example plots Dimensions and weight Specifications Environmental conditions Declaration of conformity Addresses 12 15 15 16 17 19 21 22 22 23 24 26 26 26 26 27 31 32 33 34 36 1 EXPLANATION OF THE SYMBOLS USED IN THIS MANUAL Please take note of the following explanations of the symbols used in order to achieve the optimum benefit from this manual and to ensure safety during operation of the equipment The following symbol draws your attention to a circumstance where failing to observe the warning could lead inconvenience or impairment in perfor mance Example Please mind the polarity when connecting DUT cables The following symbol draws your atte2. Manufacturer Teseq 45421 uterbach Switzerland T 41 32 681 40 40 41 32 681 40 48 sales teseq com France Teseq Sarl T 33 1 39 47 4221 33 139 47 4092 francesales teseq com Japan Teseq K K T 4813 5725 9460 81 3 5725 9461 japansales teseq com Switzerland Teseq AG T 41 32 681 40 50 41 32 681 40 48 sales teseq com UK Teseq Ltd T 44 845 074 0660 F 44 845 074 0656 uksales teseq com December 2010 Teseq Specifi cations subject to change without notice Teseq is ISO registered company Its products are design ed and manufactured under the strict quality and environmental requirements of the ISO 9001 This document has been carefully checked However Teseg does not assume any liability for errors or inaccuracies
3. switch posi tions and monitoring the DUT For clarification the purposes of the SW1 SW4 are outlined below 5 1 Switch 1 enables open or disabled closed the Mode self chattering relay Mode SW2 Switches 220 Ohms in parallel with L2 effectively shaping the pulse shape SW3 Switches 100 nF capacitor in parallel with L2 effectively shaping the pulse shape SWA Increases the impedance between L1 and earth NSG 5071 Inductive switch transient test circuit 6 4 Controlling the input signal Once the NSG 5071 is connected to a battery voltage source the relay can be driven with a standard TTL signal The timings of the control signals can be found in the standard but are shown below for reference ode 1 pulses are pulses that are triggered at fixed intervals ode 2 pulses are pulses that occur at defined pseudorandom intervals ode 3 pulses use the same trigger signal as Mode 2 pulses but the relay is self chattering during the trigger Think of Mode 3 pulses as gated self chattering events The user must supply the TTL signals or use an NSG 5600 and the supplied cable TASEO Advanced Test Solutions for EMC N EUBIS pue 9POW SUL CUBIS 9poiN eu NSG 5071 Inductive switch transient test circuit 7 USAGE OF 260 WAVEFORM mmm Waveform is complex dropout test that depends on two controlled signal sources called Sign
4. 30 and CI 260 respectively Resetting the counter may be performed by pressing the red button on the counter Resetting the counter NSG 5071 Inductive switch transient test circuit 8 2 Replacing the relays The relays may be replaced by loosening the five thumbscrews on the top of the NSG 5071 and carefully sliding the top cover to the rear Take care not to damage the copper guide pins or the RF gasket Everything should be disconnected to the NSG 5071 when exchanging relays Loosening the thumbscrews Removing the cover Next the relays can be removed by firmly grasping and lifting the relay and with a slight rocking motion TASEO Advanced Test Solutions for EMC 23 24 Firmly grasping and lifting the relay Replacing the relay is a simple matter of pressing the relay into the supplied socket and closing the cover Take care not to damage the copper guide pins and RF gasket The copper guides and RF gasket 8 3 Relay usage The NSG 5071 contains two of the Potter amp Brumfield KUP 14A15 12 that are specified in the standard However with the authorization of the standards writer other relays may be used For this reason the NSG 5071 is designed for more current than the built in relay can handle and it provides connections for other relays The convenient screen on the circuit board defines the various connections Take care with the connections and the overall current limit of the system when us
5. F there are two signal sources that must be independantly controlled These two signal sources both power the DUT and control the relay For detials see section 7 Installation for Cl 260 waveform NSG 5071 Inductive switch transient test circuit 6 USAGE OF THE NSG 5071 FOR 220 15 6 1 Battery input The NSG 5071 is used per the guidelines in the standard As seen in the circuit diagram SWO connects and disconnects the battery and O respectively from the entire test circuit and DUT As the circuit does nothing without battery SWO can be thought of as the power switch The connectors labeled BAT IN are to be connected to the battery While a power supply may be used Ford specified a actual automotive battery during compliance testing and tests without an automotive battery are not considered compliant without specific permission from the standards writer It is important to use only correct polarity The negative BAT IN connector is as defined in the standard directly connected to chassis ground The BAT IN connector and SWO provides battery to the test circuit and DUT The switching condition of RLY1 is dependant upon battery and the status of the FG IN voltage The NPN transistor will pull activate the relay based on a positive TTL input signal RLY1 is rated for 10 A TASEO Advanced Test Solutions for EMC Failure to observe proper polarity may result damage HH to the DUT and NSG 5071 T
6. al Source 1 and Signal Source 2 in the standard As you can see in the following schematic Signal Source 2 controls primarily the relay switching When 12 V is supplied by Signal Source 2 the relay RLY2 will chatter When Signal Source 2 is at 0 V the DUT will be powered through Signal Source 1 which is also independently controlled 1 1 gt lt 3 The control of CI 260 waveform TASEO Advanced Test Solutions for EMC 21 22 8 RELAY MONITORING USAGE AND RECPLACEMENT The NSG 5071 is supplied with two Potter amp Brumfield KUP 14A15 12 relays Due tothe extreme nature ofthe test the relays performance may be degraded over time Therefore the relays are recommended by the standard to be replaced after 100 hours of operation A counter is provided to determine how long the relays are used Any time the relay is active the counter will count The NSG 5071 does not need to be actively switching at the time but if the relay gets power from BAT IN CI 220 or Signal sSurce 1 is set to battery voltage 260 the timer will run This is of course the most conservative interpretation of usage but repre sents a compromise to give the users of tracking the relay usage while at the same time having no effect on the pulses applied to the DUT 8 1 Resetting the counter Each counter operates independently for RLY1 and RLY2 for CI 220 RI 1
7. ase note that these pulses are pseudo random every pulse will usually not appear exactly as shown Additionally it if often necessary to trigger on current see the standard for more details Measure P1 max C2 P2 min C2 P3freq C2 P4 5 6 1251 3143V status v Pulse 1 TASEO Advanced Test Solutions for EMC 28 a Measure P1 max C2 P2 min C2 P31req C2 4 5 P6 value 208 1V 3693V status L4 Pulse A2 1 Detail Measure P1 max C2 P2 min C2 P3 freq C2 4 5 value 1745 2681V status v Pulse A2 2 Contact break NSG 5071 Inductive switch transient test circuit 29 Ly Measure P1 max C2 P2 min C2 P3 pkpk C1 P4 P5 P6 value 1072 216V 277A status Pulse A2 2 Contact make and break Measure P1 max C2 P2 min C2 P3 pkpk C1 P4 5 value 2132V 2832V 37A status 7 Pulse C1 TASEO Advanced Test Solutions for EMC 30 Measure P1 max C2 P2 min C2 P3 pkpk C1 4 5 6 value 1468V 2280V 370A status Pulse C2 P1 max C2 P2 min C2 P3 pkpk C1 P4 5 P6 13 85 2 79V 16A 260 Waveform F NSG 5071 Inductive switch transient test circuit 11 DIMENSIONS AND WEIGHT Dimens
8. h The purpose of this instrument is the generation of pseudo random interference signals for EMI immunity testing Depending on the arrangement of the test rig the configuration the cabling and the properties of the EUT itself a significant amount of electromagnetic radiation may result that could also affect other equipment and systems The user himself or herself is ultimately responsible for the Correct and controlled operation of the rig In case of doubt the tests should be carried out in a Faraday cage Place and Date Luterbach May 2 2010 E ek lt Johannes Schmid President NSG 5071 Inductive switch transient test circuit 5 TASEO Advanced Test Solutions for EMC 35 36 Headquarters Teseq AG 4542 Luterbach Switzerland T 41 32 681 40 40 41 32 681 40 48 sales teseq com www teseq com China Teseq Company Limited T 86 10 8460 8080 F 86 10 8460 8078 chinasales teseq com Germany Teseq GmbH T 49 30 5659 8835 F 49 30 5659 8834 desales teseq com Singapore Teseq Pte Ltd T 65 6846 2488 F 65 6841 4282 singaporesales teseg com Taiwan Teseq Ltd T 886 2 2917 8080 F 886 2 2917 2626 taiwansales teseq com USA Teseq Inc T 1 732 417 0501 F 1 732 417 0511 Toll free 1 888 417 0501 usasales teseq com To find your local partner within Teseq s global network please go to www teseq com
9. he supplied relay is exactly that specified in the standard The standard rec ognizes the need for occasionally needing more battery current and other relays may be used with written approval of Ford In this case the NSG 5071 has been specifically designed to accept up to 30 A of battery current However the supplied relay is specified for only 10 A While the NSG 5071 can supply with up to 30 A the supplied relay is specified 10 A For more information on exchanging the relays please see the section 8 6 2 CI 220 DUT output For all CI 220 testing the DUT will be connected to either the pulse A or pulse C outputs Pulse name Output connector to use Pulse 2 1 Pulse 2 2 Pulse 1 Pulse 2 Pulse C NSG 5071 Inductive switch transient test circuit The 1 A2 1 2 2 output The C1 and 2 DUT output 6 3 Selecting the pulse Selecting the pulse is based on the switch positions of SW1 through SWA Each pulse may be run in several modes and some must be run in all three modes Selectthe pulse using the handy reference printed on the front of the NSG 5071 and selecting the appropriate switch positions TASEO Advanced Test Solutions for EMC 18 Cae 2 2 2 The pulse selection table In all cases the switch postioins is described below During actual testing it is a simple matter of choosing the correct
10. ing relays other than the KUP 14A15 12 NSG 5071 Inductive switch transient test circuit The user is responsible to limit the current of the battery 25 voltage source to a level safe for the installed relay 10 A delivered In case other relays are used the current should be limited to a value of the installed relay and not exceeding 30 A The connections provided for other relays It is important to remove the KUP 14A15 12 before using any other type of relay TASEO Advanced Test Solutions for EMC 9 mmm The only user replaceable parts are the relays RLY1 and RLY2 No other user serviceable parts are inside The 14 15 12 should be regularly checked In some cases it may wear out in much less than 100 hours This is relay considered a consumable item in the NSG 5071 9 1 Cleaning Clean only with a clean dry cloth No cleaners are recommended 9 2 Batteries The clock has an internal non replaceable battery This battery is rated for 10 years Contact your Teseq representative for replacements 9 3 Calibration No calibration is required You should periodically check your NSG 5071 to ensure that the output can be compared to the example plots in the standard and in this document NSG 5071 Inductive switch transient test circuit 10 5 27 mmm Your NSG 5071 should have plots that are representative of the plots seen here and in the standard Ple
11. ions LXWXH 353 x 270 x 126 mm 13 9 x 10 6 x 5 inch Weight 8 65 kg 19 1 5 TASEO Advanced Test Solutions for EMC 31 32 12 SPECIFICATIONS Maximum input voltage Umax Signal Source 1 Signal Source 2 BAT IN Maximum DUT current Imax Signal Source 1 Signal Source 2 BAT IN TTL control signal 15V 10 A Installed KUP 14A15 12 relay 30 A Other relay TTL low 0 0 4 V TTL high 2 63 5 V NSG 5071 Inductive switch transient test circuit 13 ENVIRONMENTAL CONDITIONS ENEN Temperature range Operation at Storage at Humidity Air pressure 10 to 40 1010 60 30 to 78 condensing 860 to 1060 hPa TASEO Advanced Test Solutions for EMC 33 34 Declaration of conformity Manufacturer Address Product Options Generic standards Technical file 14 DECLARATION OF CONFORMITY T3SEO Advanced Test Solutions for Teseq AG Nordstrasse 11 4542 Luterbach Switzerland 7 41 32 681 4040 F 41 32 681 40 48 www teseg com E Teseq AG Nordstrasse 11F 4542 Luterbach Switzerland declares that the following product NSG 5071 Ford Transient Generator all conforms to the following Directives and Regulations Directive 2004 108 EEC LVD Directive 2006 95 EEC EN61326 1 2005 61326 2 1 2005 EN61010 1 2001 The relevant technical file is available for inspection NSG 5071 2010 LVD NSG 5071 2010 Teseq AG CH 4542 Luterbac
12. munity tests but from a fixed design of the generator using several pre defined components Many of these components are defined in the standard as critical with no substitutions allowed Overview of the NSG 5071 NSG 5071 Inductive switch transient test circuit YMS HU 001 21 ee du 001 LO MS 006 ZMS 25 1 2 E L4 o O 2 0 5 a LMS 5 m o 5 n e lt lt Circuit Diagram NSG 5071 TASEO Advanced Test Solutions for EMC 11 12 5 INSTALLATION OF THE NSG 5071 mE For RI 220 pulses the NSG 5071 must be placed on and connected to the test bench earth using the convenient connections The ARB signals must be provided as shown in the following diagrams and expanded in the following sections Mode 1 111111 Mode2 amp 2 Installation for Cl 220 pulses NSG 5071 Inductive switch transient test circuit RI 130 contains a similar setup but the output of the NSG 5071 is connected 13 via two BNC cables to the parallel wire fixture Installation for RI 130 pulses For CI 220 and RI 130 pulses the NSG 5071 must be connected to earth using the supplied earth connections The earth connection of the NSG 5071 TASEO Advanced Test Solutions for EMC The installation for 260 waveform F is somewhat different In waveform
13. ntion to a circumstance where failing to observe the warning could lead to component damage or danger to the operating personnel Caution sign A situation that may cause damage to the equipment Example Connect the system only to rated mains power TASEO Advanced Test Solutions for EMC 5 Danger sign Possibly dangerous situation that may cause damage to persons or heavy damage to the test equipment or DUT Example It is dangerous to fail to observe safety warnings NSG 5071 Inductive switch transient test circuit 2 WARNING SYMBOLS ON THE TEST 7 SYSTEM a This symbol is used on the test system to signify a dangerous condition if misused Please read and understand the complete documenta tion of the NSG 5071 and the applicable standard refe rences before putting the equipment into operation TASEO Advanced Test Solutions for EMC 8 3 GENERAL SAFETY The NSG 5071 system itself contains no dangerous voltages or currents however the application requires an external power source and can use up to 30 A for DUT power Up to 30 A may be switched using the NSG 5071 Care should be taken in connecting and operating the DUT 3 1 Overcurrent protection The NSG 5071 is designed using and includes the required Potter amp Brumfield 14 15 12 relay The design can also with the approval of Ford be used with other relays It is important to limit the current in the applicati
14. on so as not to damage the relay that is installed and in no case exceed 30 A which is the maximum current limit of the NSG 5071 voltage source to a level safe for the installed relay 10 A delivered In case other relays are used the current should be limited to a value of the installed relay and not exceeding 30 A m The user is responsible to limit the current of the battery 3 2 Voltage protection The NSG 5071 does not generate on its own dangerous voltages However it does contain inductances as part of the test setup that are switched to perform high voltage transient simulations These transients may be high voltages caused by inductive kickbacks Care should be used when powering the DUT through the NSG 5071 system Refer to engineering or product documentation for your specific DUT NSG 5071 Inductive switch transient test circuit Potentially dangerous voltage may be present at the cables leading to and from the DUT Take care and follow all applicable safety guidelines given for your specific DUT Operation of the NSG 5071 without the cover is dange rous and strictly forbidden 3 3 General warnings DANGER It is imperative that you read the following safety ins tructions and all safety instructions in the manuals of the connected peripheral systems before installing and starting this test system for the first time DANGER The electrical and mechanical safety equipment must not be removed put o
15. ut of operation or bypassed Handle all safety equipment with care If a safety device should be broken or is not working the system must be put out of operation until the safety device is repaired or exchanged and fully in working order again DANGER HAZARDOUS AREA Connectors on the test equipment should not be touched The equipment may only be operated within an area that is explicitly declared a Test Floor with approp riate signs and protected against improper access The operating instructions form an integral part of the equipment and must be available to the operating personnel at all times All the safety instructions and advice notes are to be observed TASEO Advanced Test Solutions for EMC 10 4 INTRODUCTION TO THE NSG 5071 mmm The NSG 5071 is designed exactly in accordance with EMC CS 2009 1 hereafter referred to as the standard for test 220 pulses A1 A2 1 A22 C1 C2 and RI 130 using an inductive relay transient generator test circuit hereafter called test circuit Because the same type of relay is used 260 waveform F is included in this test circuit This test circuit is defined in annex F for the A C Pulses and RI 130 and figure 19 10 for CI 260 waveform F The basic philosophy of this test circuit is better reproducibility of actual switch ing transients The reproducibility of this test circuit comes not from the output characteristics as in traditional conducted automotive im
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