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TITLE : SUN_2 COLOR BOARD DIAGNOSTIC USER'S MANUAL

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1. 2 Test On board Registers cccscsccscssrssscesssnessesssssserscsssssssseseesesseneestncnessaees 23 Test Interrupts MEET 3 4 Test Color Map inier cte etcetera sanpeesoccsaesdaceenuseseosataveecceee 8 5 Frame Buffer Tests Word mode and Pixel mode sss 3 6 Digital to Analog Converter Tests eese tentent nnne nnne 3 7 Zoom and Pan Tests csccccssssserscsrersscssncesssvsvananscesansacsaesecuaenscessosesassecoees 38 ROPG Tests EET EEEE ANa 3 9 Per plane Mask and Per plane loading of ROPC tests esse d bp bh hm hw WwW Ww Ww Co 4 MANUAL INTERACTIVE MODE ccscscssssesceecesseenenscneeseenesassaseaseeseaenees 4 1 1 Add aDevice to Device List seesssessseessessssseeveeneorerererereevensessesessssssasrereeee 4 1 2 Select a Device for Manual Test ccssscccssseescssecssesceeeescesceseenensnsseaennes 4 1 3 Access Board Continously sccescsccccssssssceseeesesneveeenscacessccscessesensoesecsseee 4 1 4 Test Control Registers eeseeseseeeeeeee eene nnne nne nenne REENEN ENEE 4 1 5 Interrupts Tests ineei aeeaiei eniai neret etant ne en nennen enean tese nnne 4 1 6 Color Map Tests eese ES 4 1 7 Frame Buffer VT 4 1 8 ROPC Tests 4 run hu ENER AE a TEEN AE T 4 1 0 Zoom aud Pan Tests cies DEER eege ne Een EE EN av E anne vi ee ENEE 4 1 10 DAC and Monitor Tests eege eto eonne coo te seat one ua nonu ndn 4 1
2. 11 Brief monitor Testa cccccesssscccceeseessesseenecaaascasecceaeneeseseuensoessssssesseseeees 4 1 12 Perform Auto Test deese ere eterna rr tenent ikea Pa dra euo eben EEE e 00 0000 00 10 Oo o Om Om Om Om On April 5 1985 DO NOT COPY SUN MICROSYSTEMS INC COMPANY CONFIDENTIAL 1 INTRODUCTION 1 1 Purpose The purpose of this document is to describe the Sun 2 Color Video board diagnostic pro gram scdiag This diagnostic serves as the primary tool in determining the functionality of Sun 2 s Color Video Board l 1 2 Applicable Documents For further information on the Sun_2 Color Video Board hardware please refer to Sun_ Color Video Board Engineering Manual PM zzz z211 Sun 2 Color Video Board User s Manual PM 222 2222 1 3 General Description Scdiag is a standalone diagnostic program dedicated totally for testing the Sun 2 Color Video Board and capable of performing diagnostics on a maximum of four boards This diagnostic is a bootable program only therefore it requires some means of booting The diagnostic user is required to be familiar with booting diagnostics and noting messages apperearing upon the screen Sections 3 and 4 cover the detailed information of each diag nostic test April 5 1985 DO NOT COPY SUN MICROSYSTEMS INC COMPANY CONFIDENTIAL 3 SCDIAG USER INTERFACE This section describes how to boot and run scdiag Redirect input and output to an auxillary terminal so that the user communic
3. TITLE SUN_2 COLOR BOARD DIAGNOSTIC USER S MANUAL AUTHOR Susan Rohani REPORT NO xxx xxxx 01 REVISION NO A DATE April 5 1985 APPROVALS DATE Hardware Design Engineer d Peter Costello Department Manager eee Terry Horwath April 5 1985 DO NOT COPY SUN MICROSYSTEMS INC COMPANY CONFIDENTIAL Document Review Form Please make note and initial on this page all corrections and or proposed amendments by page number and or section number Peet es cone cocws cece coe teen wenn secs sescesse Recommendations Differences Construction Errors and comments eren Typographical Errors Attach additional sheet s as needed April 5 1985 DO NOT COPY SUN MICROSYSTEMS INC COMPANY CONFIDENTIAL TABLE OF CONTENTS 1 TABLE OF CONTENTS T INTRODUCTION 5 severi eee raton o ted eee han en v TEEN BENI IAE 1 2 Applicable Documents eese eene enne enn nennen entente tune sen none enero 1 8 General Description cccssssssscocseesensacssnscesevssseeseseeesssneuensceseescaseeensssees bai NN ke t2 2 SCDIAG USER INTERFACE eee eene nnne nnnn entente seen natns nennen 3 AUTOMATIC MODE ederet Eege aso eani ie ih one ea at Ea e SET YER Eon ua enses 3 1 Digital to Anolag Converter Verification eese 3
4. ation is not obstructed by the video display The prom monitor command u a redirects the I O To boot scdiag from disk issue the following prom monitor command b stand scdiag The Cpu Prom Monitor manual contains directions for booting from other devices Upon booting scdiag attempts to locate all color boards configured in the system Each board s base address is displayed and if there are any differences between this address and switch setting then follow the procedure below power down system check jumpers reinsert board power up again boot scdiag If there is still a problem set aside board in question for further test and component replace ment Scdiag next requests whether to proceed with an automatic or manual test of the configured board s Respond with an a to select the automatic diagnostics or m to choose the manual interactive mode Refer to section 3 and 4 for descriptions of automatic and manual diagnostics April 5 1985 DO NOT COPY SUN MICROSYSTEMS INC COMPANY CONFIDENTIAL 3 AUTOMATIC MODE Scdiag performs extensive tests on the Sun_2 Color Board s The following sections include test descriptions and possible test error messages s that are generated during the automatic testing The automatic diagnostic repeats until halted 3 1 Digital to Anolag Converter Verification After each DAC Verification test any key may be struck to continue the next test The fol lowing tests are executed Check Red ramp monot
5. checker board pattern set 2 An error occuring during this test appears as follow Entry n BLU Read value compare w n XOR n April 5 1985 B DO NOT COPY SUN MICROSYSTEMS INC COMPANY CONFIDENTIAL Entry n RED Read value compare w n1 XOR n Entry n GRN Read value compare w n1 XOR An value is data read nl is data written and n2 is XOR of value and n1 3 5 Frame Buffer Tests Word mode and Pixel mode The Frame Buffer diagnostic include Test 1 6 A constant data test is performed six times and the data used are 0x0000000 OXFFFF000 OXFFFFFFFF 0X00AACC33 OXOOFF3355 and OxAA33CCFF Test 7 The address test fills each long integer with its address then reads and compares with the data written Test8 Check the frame buffer with the random data test Test 9 A Checker tests find the stuck at 0 and stuck at 1 via filling the memory with a checker board patterns of increasing size If an error occurs the following message will be displayed Device d Test n n is the number of errors occured 3 6 Digital to Analog Converter Tests Display Red Display Green Display Blue Display White Display rbgw hramp Stability Verify that DAC output is a stable gray pattern Verify that all screen border is visible Display outline of frame buffer Display RGB simultaneously 8 7 Zoom and Pan Tests First a checker board pattern is displayed then for each zoom factor the origin pans down and up to lower ri
6. egister Mask2 Register Shift Value Register Function Register Width Register Op Count Register Function Output Register Manual Load Destination Register Manual Load Souce Register Flag Register Auto Register Tests This test automatically writes and reads bit patterns to each of the following registers Destination Register Source 1 Register Source 2 Register Pattern Register Mask Register Mask2 Register Shift Value Register Function Register Width Register Op Count Register Function Output Register Flag Register Auto Function unit test Writes reads compares random patterns to from sourcel source2 destination pattern and function registers Auto Destination Register Tests for a chosen addressing mode 0 9 the destination register is tested Auto Source Register Tests for achosen addressing mode 0 9 the source register is tested April 5 1985 DO NOT COPY SUN MICROSYSTEMS INC COMPANY CONFIDENTIAL Auto Mask Tests Test proper decrement and reload of Opcounter At each step read diagnostic function output and write to frame buffer Verify that right and left makes are enabled at the proper time Continuous Auto Tests Continuous Auto Function Unit Tests Test Per_Plane Mask Register Loads the plane mask register with all possible values 0 255 in both pixel and word modes 4 1 9 Zoom and Pan Tests The use of hardware zoom and pan does not change the addressing of the color frame buf
7. evice list then an individual Color Board must be selected for diagnostic testing Also if the device address of the board is different than the one scdiag found the device address should be entered 4 1 3 Access Board Continously Test continuously Word Pan register by writing and reading OX0O0AAAAAA This is a minimum test of Color Board s VME bus interface The VME bus interface can also be tested by the Control Register Tests 4 1 4 Test Contzol Registers The following registers are tested via read once read continuously write once write continuously write read once write read continuously write read compare and incre ment by 1 write read and increment continuously write read compare write read compare and increment data by n and write read alternating data Status Register Per plane Mask Register Word Pan Register Pixel Pan Register Line Offset and Zoom Register Variable Zoom Register Interrupt Vector Register If a test fails a corresponding error message will be displayed on the monitor i e the values written and read to the register are shown 4 1 5 Interrupts Tests The following tests check the interrupt part of VME Color Board interface If interrupts are failing then a usefull test is Enable trap and Reset interrupts Repeat forever Enable interrupts on CPU Disable interrupts on CPU Enable trap and Reset interrupts Repeat 50 times Enable trap and Reset interrupts Repeat forever Set U
8. fer it alters the region of the frame buffer that is actually displayed Thus a frame buffer memory scan line is not necessarily equivalent to a displayed scan line The Sun 2 Color Board supports pixel pan and zoom in integer magnification of zero to 8 Alter Zoom change the magnification factor Alter Origin Absolute set frame buffer coordinates for center of region to be displayed while zooming Alter Origin Relative add a relative offset to the current origin Set No Zoom Line Number set line number below which zoom is disabled Excercise Pan this test automatically moves the zoom origin around the frame buffer Auto Test draw achecker board pattern first and then repeats exercise pan test for zoom factors 0 to 7 Toggle Origin toggles between two zoom origins forever 4 1 10 DAC and Monitor Tests The following tests load various ramps and patterns to the frame buffer and thus are usefull for debugging the video DAC and monitor Write a Horizontal Red Ramp Write a Horizontal Green Ramp Write a Horizontal Blue Ramp Write a Horizontal White Ram Write a vertical Red Ramp Write a Vertical Green Ramp Write a Vertical Blue Ramp Write a Veritcal White Ram Write Simultaneous RGBW horizontal Ramps Write Screen Borders x 0 1152 y 0 899 Write alternating bars of color to test DAC glitches Continuous Auto Tests Test Screen Stability 4 1 11 Brief monitor Tests Brief monitor Tests are mainly visual d
9. ght and back to right and left to original starting point Next a check is done for the n lower lines zoom disable function 3 8 ROPC Tests The ROPC tests include Register tests Dst Srel Src2 Pattern Mask1 Mask2 Shift Function Width Op_count and Flag Random D ata Tests Srel Src2 Det Pattern Function Implicit word mode Tests For each bit plane Test Dst Mode 0 2 4 6 Test Src Mode 0 2 4 6 Mask Test Test opcount and Mask1 and Mask2 Pixel mode test Dst Mode 1 Src mode 1 Note modes 3 5 and 7 are not tested 3 9 Per plane Mask and Per plane loading of ROPC tests Test mask register for all bit combinations in pixel mode For each mask combination an alternating zero and one pattern is written to each bit plane April 5 1985 DO NOT COPY SUN MICROSYSTEMS INC COMPANY CONFIDENTIAL 4 MANUAL INTERACTIVE MODE This diagnostic includes all the functions of the Automatic tests In addition the following features are provided add a device to device list select a device for manual operation and write continusouly to board The manual tests are listed in section 4 1 4 1 1 Add a Device to Device List This menu adds a device to the device list and requests for monitor type 1152x900 or 1024x1024 and device address Up to four devices can be added to the device list Device selection is explained in the following section 4 1 2 Select a Device for Manual Test If multiple Color Boards are included in the d
10. iagnostics and help identify the screen purity convergence ringing and bleeding monitor problems Once in the menu use cr to continue to next test 4 1 12 Perform Auto Test refer to section 3 1 April 5 1985 DO NOT COPY SUN MICROSYSTEMS INC COMPANY CONFIDENTIAL
11. in frame buffer test even byte frame buffer addressing Write odd vertical lines in frame buffer test odd byte frame buffer addressing Access word mode location 0 Trap Bus error used for checking basic VME bus interface to frame buffer Pound alternating word location with data read write or read write words to the two chosen word addresses April 5 1985 DO NOT COPY SUN MICROSYSTEMS INC COMPANY CONFIDENTIAL Scan word mode memory for a value searches planes 0 8 for a given bit pattern Fill frame buffer with addresses writes to each frame buffer word address the 16 least significant bits of its om Verify frame buffer with addresses verifies that data from previous test was written correctly 4 1 8 ROPC Tests There is a ROPC for each bit plane in the frame buffer Since the data paths connecting and coordinating there per_plane RasterOp units are somewhat complex refer to Sun 2 Color Board Engineering manual for detailed information Select ROPC Default 0 used for ROPC bit plane selection Register Tests The following registers are tested via read once read continuously write once write continuously write read once write read continuously write read compare and increment by 1 write read and increment continuously write read com pare write read compare and increment data by n and write read alternating data Destination Register Source 1 Register Source 2 Register Pattern Register Mask R
12. onicity Check Green ramp monotoncity Check Blue ramp monotonicity Check White ramp monotonicity Adjust 5 2 precision voltage to remove DAC glitches Verify that DAC output is a stable gray pattern Verify that all screen borders are visible 3 2 Test On board Registers The registers below are tested Status register Per_plane mask register Word pan register Line Offset and zoom register Pixel Pan register Variable Zoom Register An error occurring during this test appears as follows Device d z Wrote valu Read valu d specifies the board address causing the error x is the register address valul and valu2 are the hex values written and read respectively 8 3 Test Interrupts Interrupts are disabled and all possible values are written to and read from the status regis ter An error occurring during this test appears as follows Device d Retrace bit in Status Register never toggles Device d No interrupt when expected d specifies the board address causing the error 3 4 Test Color Map First a checker board pattern is written to video memory The following ten different color maps are loaded and verified automatically Test 1 red OxAA grn 0x55 blu OxCC Test 2 red 0x00 grn OxFF blu 0xC3 Test 3 red OxC3 grn 0x28 blu 0xB7 Test 4 red ramp Test 5 grn ramp Test 6 blu ramp Test 7 monochrome ramp Test 8 color map loaded with checker board pattern set 1 Test 9 color map loaded with
13. p NOTE to activate the shadow map it must be loaded into ECL map i e third menu choice 4 1 7 Frame Buffer Tests The Frame Buffer Memory Tests allow reading writing to from frame buffer memory These tests are usefull for checking word or pixel mode addressing and frame buffer data or address line stuck_at conditions The frame buffer tests are self explanatory Write checkerboard write a series of rectangular regions with different gray level values Write a vertical line a vertical line with a given gray value is written into frame buffer Write a Horizontal Line a horizontal line with a given gray value is written into frame buffer Verify a Vertical line read and compare vertical line previously written Verify a Horizontal Line read and compare horizontal line previously written Fill a Region with constant fill a frame buffer rectangle with a gray value Print all Vertical Lines lists all pixel values for all vetical lines Print all Horizontal Lines lists all pixel values for all horizontal lines Test Single Location read or write from a word location Auto test Continuous Auto Test Fill Frame Buffer in Word Mode fill planes 0 7 with constant data Fill one Ram ram is specified by entering plane and column pattern choices are all zeros all ones alternating zeros and ones Write Horizontal line in Word Mode write a censtant horizontal line in a given plane and row Write even vertical lines
14. ser Interrupt vector Set All User Interrupt vectors A 4 1 0 Color Map Tests To display the image in the Sun_2 color frame buffer memory each 8 bit pixel is used as an index into a 256 element color lookup table Each element of the table is 24 bits 8 bits drive the red DAC 8 drive the green and 8 for the blue The color lookup tables consist of a high speed ECL lookup table used during video display and a TTL shadow color lookup table that can be access at any time The TTL shadow color lookup table is April 5 1985 DO NOT COPY SUN MICROSYSTEMS INC COMPANY CONFIDENTIAL loaded into ECL lookup table during vertical blanking Acquire access to TTL CMAP enable shadow color map modifications Relinguish access to TTL cmap disable shadow color map modifications Load TTL to ECL cmap once load content of shadow color map into ECL color map Load cmap with defualt arrays load ckecker board pattern into color map Verify cmap with default arrays verify that color map has been loaded correctly with the default arrays Load cmap with solid value load color map with a constant value Verify cmap with solid value verify that color map has been loaded with the constant value Set 0 255 red 256 511 green 512 767 blue Test single location Auto test Continous auto test Load cmap with ramp loads shadow color map with monochrome ramp Verify cmap with ramp verify that shadow color map is loaded with a monochrome ma

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