Panasonic Toughpad FZ-M1 Certification
Contents
1. The AOS TARRY AS LPL AL OP LOSE IA LEELA PAIRTE AEA PERII AII PENER BERARDI DIA LADERA LER ALLER LEAL REDDER V EVOO LIA BORAT ALA LRA IE DTREIS A PORIS LEA REREAD IA A 047 13 V Page 1 of 124 Report No A 047 13 V Date of Issue 3 March 2014 Department of Defense Interface Standard Military Standard 461 JE KF This test report is to certify that the device was tested according to the requirements of the above The results of this report should not be construed to imply compliance of devices other than the sample tested 4 Without the laboratory approval by the documents this report should not be copied in part 2 1 Applicant Company Name IT Products Business Division AVC networks company Panasonic Corporation Mailing Address 1 10 12 Yagumo higashi machi Moriguchi City Osaka 570 0021 Japan 2 Identification of Tested Device Device Name Personal Computer f Model Number FZ M1 j Serial Number 3KTSA00014 4 Trade Name Panasonic A Type of Test L Product Validation Design Validation Development Purpose j Test Plan Number KEC G111_A 047 13 V Date 2014 2 3 j Modification of Test Plan JNo Yes refer to deviation information in this report y 3 Test Items and Procedure f CE101 Conducted Emissions Power Leads X Pass Fail J N A CE102 Conducted Emissions Power Leads Pass Fail LIN A CS101 Conducted Susceptibility Power Leads X Pass OQ Fail O N A f CS106 Conducted Susceptibility Transients2. Power Leads C Pass Fail I N A 3 5 CS114 Conducted Susceptibility Bulk Cable Injection KiPass QO Fai N A CS115 Conducted Susceptibility Bulk Cable Injection Impulse Excitation l Pass Q Fail I N A CS116 Conducted Susceptibility Damped Sinusoidal Transients Pass Fail LJIN A Cables and Power Leads j RE101 Radiated Emissions Magnetic Field JPass Fai IN A f RE102 Radiated Emissions Electric Field X Pass Fail O N A 4 RS101 Radiated Susceptibility Magnetic Field XdPass Fail LJN A RS103 Radiated Susceptibility Electric Field K Pass O Fail JN A Refer the below reason s with respect to the decision and justification not to test 4 1 DUT Specification 2 Request of Applicant 3 According to Test Plan KEC Electronic Industry Development Center Testing Division j 3 2 2 Hikari dai Seika cho Soraku gun Kyoto 619 0237 Japan Test Engineer s 4 r f rr rn I A Hironori Okamoto Po fr a A A f ff A i A j Cy ae Hy N Me S LA w4 N Kk yt Aiba JAB i nite RTLO2810 Approved by Ikuya Minematsu Group Manager PP BEALL ML BELLA LS BAREIS EA REEDE AAR BP OGL ALD DLS LL AAA BERL BAA BELA AA EVVEL E BE ELITRE LO LTE LORS RSD LE AACA ELL MER ABAL BELL RVE RLRE ORAL LEMMA MEME LLG Report Version A KEC Testing Division
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