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HP Noise Reduction Machine 11 User's Manual

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1. absolute SSB phase noise of the 5 1280 MHz tunable signal dBe H S Rios 2 Re sure the LINE MODULE on the rear panel residual noise of the HP 11729C is set to the available line voltage If it needs to dBe Hz be changed see Figure 2 1 in Section II 3 15 Operation Phase Detector Method cont d 3 Plug the Carrier Noise Test Set into the avail able line supply Turn the Carrier Noise Test Set on and allow a 30 minute warm up before making any mea surements Ifthe microwave test signal is in the range of 0 010 1 28 GHz go to step 6 If the microwave test signal is greater than 1 28 GHz follow the instructions for step 5 Using a coaxial cable connect the synthesized 640 MHz source to the 640 MHz IN connector on the rear panel To configure and use the internal 640 MHz oscillator connect the 640 MHz OUT connec tor to the 640 MHz IN connector with the cable attenuator assembly HP 11729 60096 or HP 11729 60098 Option 140 provided Both connectors are on the rear panel Be sure to make the connection using the cable attenuator assembly that was shipped with the Carrier Noise Test Set NOTE The absolute system noise floor will be degraded close in to the car rier when using the internally gen erated 640 MHz signal compared to the 640 MHz signal being supp lied by the HP 8662A Synthesized Signal Generator Using a coaxial cable connect the FREQ CONT X OSC or FREQ CONT DC FM on the rea
2. When using the Phase Detector Method the signal under test is first down converted to the 5 MHz 1280 MHz range and then phase detected against the tunable 5 MHz 1280 MHz signal Phase detecting produces a dc signal with simultaneous ac voltage fluctuations These ac components are proportional to the combined phase noise of the two input signals the signal under test and the tunable 5 MHz 1280 MHz signal at rates cor responding to the offset frequency from the signal under test The phase detected output signal is also used as an error voltage to keep the signal under test and the tunable 5 MHz 1280 MHz sig nal in phase quadrature that is 90 degrees out of phase When using the Frequency Discriminator Method the down converted signal under test is phase detected against itself using an external delay line and the internal mixer phase detector The phase detected signal is proportional to the phase noise on the signal under test In the Frequency Dis criminator Method the signal under test does not have to be phase locked to an external reference signal The Carrier Noise Test Set accepts test signals from 10 MHz 18 GHz at a level of 7 dBm to 20 dBm The broad frequency range is user selec table from the front panel local or by using the Hewlett Packard Interface Bus remote When using the Carrier Noise Test Set in the Phase Detector Method the controls for acquiring and maintaining phase lock are user selec
3. k A jimi oOo h oS S CA ak KO as ele vk A san ho sh CO o gt N So Low i SS a i C3 k CO i 3 L d lt P an 3 V Decimal characters and the five address switches relate to the last five bits of both talk and listen addresses Factory set address 3 30 HP 11729C Performance Tests SECTION IV PERFORMANCE TESTS 4 1 INTRODUCTION The procedures in this section test the instrument s electrical performance using the specifications of Table 1 1 as the performance standards All tests can be performed without access to the interior of the instrument A simpler operational test is in cluded in Section HI under Basic Functional Checks NOTE A 80 minute warm up period is required before any tests are performed Line voltage must be within 8 and 10 of nominal if the performance tests are to be considered valid 4 2 EQUIPMENT REQUIRED Equipment required for the performance tests is listed in Table 1 4 Recommended Test Equipment in Section I Any equipment that satisfies the criti cal specifications given in the table may be substi tuted for the recommended model s 4 3 TEST RECORD Results of the performance tests may be tabulated on the Test Record at the end of the procedures The Test Record lists all of the tested specifica tions and their acceptable limi
4. 40 dBm to 0 dBm External AM Modulation capability 50 ohms BNC Hp 11593A UG 135 U to N HP X281C A Adjustments O Operator s Checks P Performance Tests T Troubleshooting HP 11729C Use OPAT For one HP 8662A or 8663A to operate with the Carrier Noise Test Set and give the best phase noise performance two rear panel connectors are required One connector must supply 640 MHz and the other connector must accept the Electronic Frequency Control signal from the Carrier Noise Test Set As of April 1984 these two connectors are on the rear panel of each standard HP 8662A or 8663A Before Apri 1984 these two connectors were specified by options H03 and H12 The HP 8662A or 8663A option 003 includes testing the phase noise of the 640 MHz signal Table 1 5 Recommended Aliernate Test Equipment instrument Type RF Synthesized Signal Generator Microwave Synthesized Source Low Frequency Spectrum Analyzer 1 12 Suggested Instrument Advantages of Alternate Replaced Alternate i E ANEA ENAA A EAA A EMIS AAAA AAAA vacl raaro p pananaiaranannannnnnnaanannnn aana anana anana AAAA AAAA AAAA aran HP 8668A HP 8662A j The HP 8663A is a direct substitnte for the HP 8662A HP 8673B HP 8340A Lesa expensive HP 3561A HP 3582A Better Accuracy HP 11729C Installation SECTION I INSTALLATION 2 1 INTRODUCTION This section provides the information needed to install the Carrier Noise Test Set I
5. Be sure to make the connection using the cable attenuator assembly that was shipped with the Carrier Noise Test Set NOTE The absolute system noise floor will be degraded close in to the carrier when using the internally generated 640 MHz signal compared to the 640 MHz sig DELAY LINE 5 TO 1280 MHz DEVICE UNDER TEST D U T Figure 3 7 Interconnections to the Carrier Noise Test Set When Making a Phase Noise Measurement Using the Frequency Discriminator Method 3 22 HP 11729C Frequency Discriminator Method contd 6 7 8 11 12 13 nal being supplied by the HP 8662A Synthesized Signal Generator Using a coaxial cable connect the device under test to the MICROWAVE TEST SIGNAL INPUT connector on the front panel Connect the IF OUTPUT on the front panel to a spectrum analyzer To select a PHASE NOISE MEASUREMENT press the MODE button on the front panel until the LED opposite CW is illuminated Select the BAND RANGE that includes the frequency of the signal under test For exam ple if the frequency of the signal under test is 10 GHz then the BAND RANGE would be 8 32 10 88 GHz Select this filter The LOCK BANDWIDTH FACTOR can be at any setting Using a spectrum analyzer determine the fre quency at the IF OUTPUT signal under test minus the BAND CENTER frequency of the BAND RANGE chosen NOTE A number of signals will be present at the IF OUTPUT The signals present
6. spectrum analyzer Changing the spectrum analyzer input sensitivity between calibration and measurement decreases the measurement accuracy For better accuracy recalibrate on a lower level calibration signal See step 14 of this procedure Select an appropriate resolution bandwidth for the the chosen frequency span at least lt 1 10 frequency span Because phase noise is a random quantity some sort of averaging or video filtering is desired In general it is not advisable to take mea surements on a portion of the spectrum ana 17 Operation very rapidly gt 20 dB per major division There fore increase the frequency span to where the offset frequency of interest is in the center of the spectrum analyzer display It is not recommended to measure noise levels that are in the bottom 10 dB of the display In general if spurious signals are seen when making a measurement they can be dis regarded Reduce the resolution bandwidth if necessary to determine the noise level near the spur Be careful not to measure on a spur With the preceeding considerations in mind a measurement can now be made Measure down from the reference point step 14 c at the offset of interest Corrections Subtract the reference level set during calibration from the level of the noise measured at the offset of interest Sum this value and the following correction factors Minus 40 dB for the attenuation a
7. will convert frequency fluctuations at any offsetto f dBe f dBc 10 log Pssb Ps where Pssb is the power density in one phase modulation sideband and Ps is the total sig nal power Minus 10 log 1 2 x spectrum analyzer reslu tion bandwidth This is for normalization toa 1 Hz noise equivalent bandwidth The result is in dB Plus 2 5 dB is the correction for log amplifi ers and peak detectors used in an analog spec trum analyzer Below is an example of how to calculate the correct amount of phase noise 67 dBm measured phase noise 10 dBm reference level set during calibration 20 dB carrier to sideband ratio set in step 15 10 dB 20 log fow 1 kHz db This formula is used to convert frequency fluctuations at any offset to lt f dBc For a complete explanation of the correction factors see Appendix A HP 11729C HP 117290 CARRIER NOISE D OU co Ct Last kas SPECTRUM lt 10 MHz SPECTRUM ANALYZER OUTPUT Operation RF SOURCE USED FOR CALIBRATION ONLY DEVICE UNDER TEST D U T Figure 3 8 Interconnections to the Carrier Noise Test Set When Making an AM Noise Measurement Frequency Discriminator Method cont d 20 8 dB 10 log 1 2 x spectrum analyzer resolution bandwidth 2 5 dB if an analog spectrum analyzer is used 67 dBm 10dBm 20 dB 10 dB 20 8 dB 2 5 dB 105 3 dBc Hz The actual amount
8. 1280 MHz signalis less than the mic rowave test signal The output and an oscillo scope can be used as an external quadrature monitor because of the direct proportionality of the dc level to the phase difference of the micro wave test signal and the tunable 5 1280 MHz signal NOISE SPECTRUM lt 1 MHz OUTPUT This is a female BNC connector with an output impe dance of 6002 This output is useful for measur ing the phase noise of the device under test at offsets from the carrier of dc to 1 MHz The signal output is a de level directly propor tional to the phase difference between the mic rowave test signal and the tunable 5 1280 MHz signal The dc level has ac fluctuations that are directly proportional to the phase noise of the the microwave test signal if the phase noise of the 640 MHz signal and 5 1280 MHz signal is less than the microwave test signal Figure 3 1 Front Panel Features 1 of 3 HP 11729C Operation FRONT PANEL FEATURES NOTE The bandwidth dc to 1 MHz is not com pletely flat The 3 db points are at dc and 1 5 MHz 7 5to 1280 MHz INPUT This is a female type N connector with a 500 input impedance The fre quency of theinput signal is 5 1280 MHz froma tunable source The frequency of the signal input is set to equal the microwave test signal minus the BAND CENTER frequency of the BAND RANGE chosen The input level should be 0 dBm 1 dBm The user sets this signal in phase quadrature
9. 436A Power Sensor e HP 8482A Power Splitter quantity 2 HP 11667A AMBUNE 2451 coe tu iea ren e eae HP 8447E F 1 dB Step Attenuator quantity 2 HP 355C Initial Instrument Settings 1 Connect the instruments as shown in Figure 4 3 2 Turn on and warm up the instruments for 30 minutes 3 Set both step attenuators to maximum attenuation 4 9 Performance Tests HP 11729C PERFORMANCE TESTS RESIDUAL PHASE NOISE PERFORMANCE TEST Using a test signal of 10 GHz cont d Procedure contd HP 117290 CARRIER NOISE TEST SET ere REFERENCE UNIT lw S so09000n0 000 MICROWAVE SYNTHESIZED e oo E MICROWAVE SOURCE 5 to 1280 MHz W aii STEP POWER i STEP AMPLIFIER ATTENUATOR SPLITTER ATTENUATOR E as SPLITTER _640 MHz_IN OUTPUT _ STEP 9 ae NE ELECTRONIC FREQ 640l FREQ CONTROL CONT 15 TO 1280 MHz MHz RF SYNTHESIZED X OSCE INPUT SIGNAL GENERATOR noooscao log amp TUNABLE REFERENCE ee 2 MICROWAVE LPS TFESTSIGNAL INPUT RF SPECTRUM ANALYZER HP 117290 CARRIER NOISE TEST SET MHz D U T ouTPUT OUTPUT LOW FREQUENCY SPECTRUM ANALYZER Figure 4 3 Residual Phase Noise Test Setup Using a Test Signal of 10 GHz 4 Set the Microwave Synthesized Soruce as follows Frequency xq vein ee 10 GHz Output Level 10 dBm to 20 dBm 5 Set the RF Synthesized Signal Generator tunable reference as follows Frequency 2 aed tiny Los 399 990 MH
10. Maintenance WARNING For continued protection against fire hazard replace the line fuse witha 250 V fuse of the same rating only Do not use repaired fuses or short circuited fuseholders The only maintenance that the operator should normally perform is the replacement of the prim ary power fuse All other maintenance should be referred to qualified service personnel The primary power fuse is located within the Line Power Module Refer to Figure 2 1 for instructions on how to change the fuse If the instrument does not operate properly and is being returned to Hewlett Packard for service please complete one of the blue tags located at the end of this manual and attach it to the instrument Refer to Section II for packaging instructions Operation 3 2 HP 11729C FRONT PANEL FEATURES A 7290 CARRIER MORSE TEST SEF gee fee aE ESE PIRES S Zass Ewa 0 PHASE LOCK INDICATOR The primary pur pose of the PHASE LOCK INDICATOR is to show when the device under test and the tunable 5 1280 MHz source are in phase quadrature that is 90 degrees out of phase When the device under test and the tunable 5 1280 MHz source are in phase quadrature a green LED will be illuminated in the center of the PHASE LOCK INDICATOR When the two sources are greater than 100 kHz apart a red LED will be illuminated to the left or right of the green LED As the frequency difference decreases all the LEDs will light up dimly Finally as t
11. OUTPUT for test signals 20 MHz around the BAND CENTER frequency High feedthrough signals mixer sum pro ducts and LO signals saturate the Low Noise Amplifier in the Carrier Noise Test Set and possibly the spectrum analyzer Do not use the lt 1 MHz NOISE SPEC TRUM OUTPUT for test signals 5 MHz around the BAND CENTER frequency LO feedthrough may possibly saturate the spectrum analyzer For test signals 5 MHz to 10 MHz around the BAND CENTER frequency the mea sured noise level will be 0 dBm to 3 dBm greater than the actual level The error is caused by an impedance change on the input of the internal Low Noise Amplifier For test signals 10 MHz to 20 MHz around the BAND CENTER frequency the measured noise level wili be 0 dBm to 1 dBm greater than the actual level Again the error is caused by an impedance change on the input of the Low Noise Amplifier Therefore the lt 1 MHz OUTPUT can be used for test signals 5 MHz to 20 MHz around the BAND CENTER frequency by subtracting the maximum error amount from the measured level To select a PHASE NOISE MEASURE MENT press the MODE button on the front panel until the LED opposite 4 CW is illuminated HP 11729C Phase Detector Method cont d 11 12 13 Set the LOCK BANDWIDTH FACTOR to 100 Select the BAND RANGE that includes the frequency of the signal under test For exam ple if the frequency of the signal under test is 10 GHz then the BAND RANG
12. Test Set Figure 1 1 shows the Carrier Noise Test Set with all of its externally supplied accessories The Carrier Noise Test Set Operating and Service manual has eight sections The subjects addressed are Section I General Information Section II Installation Section IHI Operation Section IV Performance Tests Section V Adjustments Section VI Replaceable Parts Section VII Manual Changes Section VIL Service Listed on the title page of this manual below the manual part number is a microfiche part number This number may be used to order 100 x 150 millime tre 4 x 6 inch microfilm transparencies of this manual Each microfiche contains up to 96 photo duplicates of the manual pages The microfiche package also includes the latest Manual Changes supplement as well as all pertinent Service Notes 1 2 SPECIFICATIONS Instrument specifications are listed in Table 1 1 These specifications are the performance stand ards or limits against which the instrument may be tested Supplemental characteristics are listed in Table 1 2 Supplemental characteristics are not warranted specifications but are typical charac teristics included as additional information for the user Typical system performance when using the Carrier Noise Test Set with the HP 8662A or 8663A is given in Table 1 3 1 3 SAFETY CONSIDERATIONS This product is a Safety Class I instrument that is one provided with a protective earth terminal The Ca
13. This adjust ment with the aid of an oscilloscope connected to the AUX NOISE connector on the front panel is used to eliminate the dc offset in the phase lock loop Figure 3 1 Froni Panel Features 2 of 3 3 3 Operation HP 11729C FRONT PANEL FEATURES 15 MEASUREMENT ANNUNCIATORS When a 3 4 continuous wave CW phase noise measure ment is selected the CW annunciator will be illuminated When a continuous wave CW AM noise measurement is selected the AM CW annunciator will be illuminated When a pulsed phase noise measurement is selected the PULSED annunciator will be illuminated When a pulsed AM noise measurement is selected the AM PULSED annunciator will be illuminated MODE Used to select either a phase noise CW or pulsed or AM noise CW or pulsed measure ment AM noise is only installed with Option 130 LOCK BANDWIDTH FACTOR These five switches partially control the bandwidth of the phase lock loop by setting the gain for anumber of operational amplifiers in the Carrier Noise Test Set Another factor in determing the loop andwidth is the frequency of the microwave test signal or the FM deviation set on the device under test or the tunable 51280 MHz source LINE SWITCH Applies ac power to the Carrier Noise Test Set when set to the ON position CAPTURE When CAPTURE is pressed the phase lock loop is changed from a second order loop to a first order loop The phase lock lo
14. adapt this manual to the newer instrument In addition to change information the supplement may contain information for correcting errors in the manual To keep the manual as current and as accu rate as possible Hewlett Packard recommends that you periodically request the latest Manual Changes supplement The supplement is identified with the manual print date and part number both of which appear on the manual title page Complimentary copies of the supplement are available from Hewlett Packard For information concerning a serial number prefix that is not listed on the title page or in the Manual Changes supplement contact your near est Hewlett Packard office 1 6 DESCRIPTION The Hewlett Packard Model 11729C Carrier Noise Test Set is an integral part of a phase noise mea surement system The Carrier Noise Test Set can perform the follow ing operations Up converts an external or internal reference signal 1 1 General Information DESCRIPTION coni d Down converts the signal under test to an inter mediate frequency IF Phase demodulates the phase noise of the test sig nal using the Phase Detector Method When the Phase Detector Method is used the signal under test is phase locked to a refer ence signal The signal under test is then phase detected against the same reference signal e Frequency demodulates the phase noise of the test signal using the Frequency Discriminator Method
15. and the front panel LOCAL key When entering local mode no instrument set tings or functions are changed Local Disables all front panel keys including LOCAL Only the controller Lockout can return the Carrier Noise Test Set to local front panel control Clear 3 The Carrier Noise Test Set returns to local front panel control Lockout and local lockout is cleared when the REN bus control line goes Set false When entering local mode no instrument settings or Local functions are changed Pass The Carrier Noise Test Set has no controller capability Control Take Control Require 3 If the SRQ mask is set see Tabie 3 4 HP IB Program Codes for a Service description of and one of the following conditions is valid then SRQ SRQ will be true 1 Invalid command 2 System in phase lock 3 System out of phase lock Related Operation HEB 4 Commands interface amp Controls Functions AH1 SH1 T5 TEO L83 LEO 3 27 Operation HP 11729C Table 3 3 HP IB Message Reference Table 2 of 2 Related HP IB Applicable Response Commands interface Message amp Controls Functions Status The Carrier Noise Test Set responds to a Serial Poll Enable SPE SPE T5 TEO Byte bus command by sending an 8 bit byte when addressed to talk If the instrument is holding the SRQ control line true issuing the Require Service message bit 7 RQS bit in the Status Byte and the bit representing the co
16. byte will indicate phase lock When position C is set to 1 and the corresponding bit in the status byte becomes 1 then RQS in the status byte and the SRQ line will be 1 Under the preceding condition a serial poll of the status byte will indicate an invalid command has been received CA1 Capture active CAD Capture inactive Forces RQS and invalid command bit to zero in the status byte Filter Bands 1 FT1 7 FT 2 FT2 8 FT8 3 FT3 9 FT9 4 FT4 10 FT10 5 FT5 L1 FT11 6 FT6 Phase Lock Range 1 Hz 1 LK1 10 Hz 2 LK2 100 Hz 3 LK3 1 kHz 4 LK4 10 kHz 5 LK5 When addressed to talk the Carrier Noise Test Set will send the current front panel settings in LP ASCII mnemonic string PU Pulse measurement 71D When addressed to talk the Carrier Noise Test Set will send an ASCII string which contains the model number of the instrument and software revision number RM When addressed to talk the Carrier Noise Test Set will send a single byte which is the binary pattern of the SRQ RO When addressed to talk the Carrier Noise Test Set will send the ASCII mnemonics of the options installed 3 29 Operation HP 11729C Table 3 5 Allowable HP IB Address Codes Talk Address Decimal Equiva Listen Address Address Switehes aloe lm lm P ek P P elelel k 1 vd k C as gt oO G R F ala s Q fele j S EA
17. display Details of phase locking are found in Section ITI 4 11 Performance Tests HP 11729C PERFORMANCE TESTS RESIDUAL PHASE NOISE PERFORMANCE TEST Using a test signal of 10 GHz cont d Procedure cont d 15 Adjust the RF spectrum analyzer to view the residual phase noise level ata 10 kHz offset from the carrier For the most accurate measurement use the smallest possible resolution bandwidth Use averaging if required Measure the residual phase noise level down from the reference point Measure on an average phase noise level do not measure on a peak or minimum phase noise level Record the phase noise level A along with the measurement resolution bandwidth B below Repeat this measurement for offsets of 100 kHz and 1 MHz Offset from Noise ievel A i Resolution Bandwidth 8 carrier relative to reference ievel dB Hz 16 On the low frequency spectrum analyzer select a Hanning filter and the normali zation to a 1 Hz bandwidth if these features are available If the spectrum ana lyzer does not have the feature for normalization to a 1 Hz bandwidth this figure will have to be calculated later using the formula at the end of the test 17 Adjust the low frequency spectrum analyzer to view the residual phase noise level at 10 Hz Measure the residual phase noise level down from the reference point Mea sure on an average phase noise level do not measure on a peak or minimum level NOTE Power line spu
18. input to the spectrum analyzer is 50 ohms Adjust the amplitude on the function generator so the sidebands displayed on the spectrum analyzer are 40 dBc Disconnect the Microwave Synthesized Source from the spectrum analyzer and connect it to the Carrier Noise Test Set MICRO WAVE TEST SIGNAL INPUT Connect the lt 10 MHz OUTPUT from the Carrier Noise Test Set to the spectrum analyzer Adjust the spectrum analyzer to view the 100 kHz sidebands on the 1 GHz signal Set the peak of the 100 kHz signal to a convenient reference point AM Noise Floor Measurement 11 12 Disconnect the Microwave Synthesized Source from the MICROWAVE TEST SIGNAL INPUT Connect the output of the low noise oscillator to the MICRO WAVE TEST SIGNAL INPUT NOTE The oscillator signal should come directly from the resonator with no amplification stage in between Under this condition itis likely thatthe AM noise coming from the oscillator is less than or equal to 155 dBc Hz at a 100 kHz offset Measure the noise level down from the reference point at a 100 kHz offset Record the AM noise level A and resolution bandwidth B below Measure the AM noise floor at a 1 MHz offset Record this level with the corresponding resolution band width below Offset from Noise level A Resolution Bandwidth B carrier relative to reference level dB Hz 100 kHz 1 MHz 4 16 HP 11729C Performance Tests PERFORMANCE TESTS AM NOISE FLOOR PERFORM
19. l feje z i aje k C3 1 oae kK O j alala x lt f k 1 T SE lt S fe L ad Foo Decimal characters and the five address switches relate to the last five bits of both talk and listen addresses Factory set address HP IB Address Selection cont d cant address bit Sliding the switch downward as viewed from the rear of the instrument sets the corresponding address bit to 1 while sliding the switch upwards clears the bit bit 0 Setting all of the address bits to 1 will result in an invalid HP IB address 31 decimal In this case an HP IB Installation address of 30 decimal will be stored in memory once the instrument is powered up If the HP IB address is changed when the instru ment is on the instrument will have to be turned off then turned on again This is necessary so the new address can be read by the microprocessor and stored in memory Along with the five address switches Al through A5 there are two other switches These two switches are labeled LO LISTEN ONLY and TO TALK ONLY When either the LO or TO switch is set to 1 the Carrier Noise Test Set becomes either a TALKER ONLY ora LISTENER ONLY and the HP IB address is overridden At the factory the LO and TO switches are set to ry 2 8 Interconnections For the Carrier Noise Test Set to be fu
20. log amplifiers and peak detectors in analog spectrum analyzer Total dBe Hz Refer to Application Note 150 4 HP 5952 1147 if additional information on calibration of spectrum analyzers for noise measurements is needed 20 Calculate the residual phase noise level of the Carrier Noise Test Set at 10 Hz 100 Hz and 1 kHz offsets from the carrier Sum the measured phase noise level C and the 3 correction factors below Do not add the normalization to a 1 Hz equivalent noise bandwidth factor when the spectrum analyzer accounts for this factor auto matically Verify the residual phase noise level does not exceed the specified limit shown at the bottom of each column Noise level C relative to refer ence level Normalization to 1 Hz equivalent noise bandwidth 10 log D x 1 2 Calibration Attenuation Step 10 50 dB f conversion factor 6 dB Total dBe Hz iene See Refer to Application Note 150 4 HP 5952 1147 if additional information on calibration of spectrum analyzers for noise measurements is needed NOTE If an analog spectrum analyzer was used to measure the noise floor at 10 Hz 100 Hz and 1 kHz add 2 5 dB to the totals above This is the correction factor for the log amplifiers and peak detectors in the analog spectrum analyzer For a complete explanation of the correction factors see Appendix A 4 13 Performance Tests HP 11729C PERFORMANCE TESTS 4 8
21. of phase would then be 105 3 dBe Hz After applying these correction factors the actual amount of phase noise will be known at a particu lar offset provided the sensitivity set up with the delay line is lower than the phase noise of the device under test 3 12 AM Measurement Option 130 only L Figure 3 8 shows interconnections to the Car rier Noise Test Set when making an AM noise measurement Be sure the LINE MODULE on the rear panel is set to the available line voltage Ifit needs to be changed see Figure 2 1 in Section H Plug the Carrier Noise Test Set into the avail able line supply Turn the Carrier Noise Test Set on and allow a 30 minute warm up before making any measurements Set the device under test to the frequency of interest Measure the power out of the device 10 li 12 under test with a power meter Note the power level for use later Set the RF source to 1 GHz Set the power of the RF source to the same power as that measured in step 5 Use a power meter to measure the power Connect the RF source to a spectrum analyzer Set the displayed RF source to a convenient reference point on the spectrum analyzer Amplitude modulate the RF source at a 1 kHz rate Adjust the AM level so the AM sidebands are 40 dBc NOTE If the RF source is a non synthesized source the modulating rate may have to be increased This is so the AM sidebands can be seen on the spectrum analyzer displ
22. reference level Below is an example of how to set the reference level on the spectrum analyzer for making a phase noise measurement 15 Operation a Increase the tunable 5 1280 MHz source by 50 kHz This will produce a 50 kHz beat note at the NOISE SPECTRUM OUT PUTS This 50 kHz offset is given as an exam ple only A different offset may be required because of the frequency range of the spec trum analyzer or to make it easier to calibrate with a fast drifting source b Add 40 dB of attenuation to the tunable 5 1280 MHz signal CAUTION Do not set the attenuation any higher than 80 dBm 30 dBm or lower is necessary for a linear calibration c Adjust the spectrum analyzer so the 50 kHz beat note is on the screen and placed ata convenient reference point Record the level of the reference point for use later d This reference point represents the power in the carrier minus 40 dB e Remove the 50 kHz offset and 40 dB of attenuation from the tunable 5 1280 MHz signal f The spectrum analyzer is now ready to be used for making a measurement Phase Locking The following discussion des cribes two methods for phase locking the device under test and the tunable 5 1280 MHz source When the device under test is a synthesized or very stable source phase locking can be accom plished using either the FREQ CONT X OSC or FREQ CONT DC FM connector and the fol lowing procedure The FREQ CONT X OSC or FR
23. signal generator tunable reference as follows PVCUUCHEY 55 9 eevee note nas sewn es 639 990 MHz Amplitude orrea e sk oa eee eis 0dBm 4 Set the Carrier Noise Test Set as follows Band Range correrlo ined crt yess 0 01 to 1 28 GHz Measurement Mode ccc cece cee eeeces CW Lock Bandwidth Factor 04 Any setting 5 Measure the power of the tunable reference signal at the end of cable B and adjust the amplitude of the tunable reference until the power meter reads 0 dBm Connect cable B to the 5 1280 MHz INPUT on the Carrier Noise Test Set 4 5 Performance Tests HP 11729C PERFORMANCE TESTS RESIDUAL PHASE NOISE PERFORMANCE TEST Using a test signal less than 1280 MHz cont d Procedure cont d 4 6 6 10 11 Disconnect cable A from the MICROWAVE TEST SIGNALINPUT on the Carrier Noise Test Set and terminate cable A with a 50 ohm load Connect the 640 MHz signal from the tunable reference rear panel tothe MICROWAVE TEST SIGNAL INPUT on the front panel of the Carrier Noise Test Set Decrease the amplitude of the tunable reference by 50 dB Adjust the RF spectrum analyzer to display the 10 kHz beat note The beat note is the result of mixing the 640 MHz and 689 990 MHz signals Set the 10 kHz beat note to a convenient reterence point Adjust the low frequency spectrum analyzer to view the 10 kHz beat note If the spectrum analyzer has selectable filters select a flat top filter If RM
24. the D U T as follows Frequency sin 56 cCe wie sana weeweuas 2 32 GHz Amplitude ease seeds 10 dBm Set the Carrier Noise Test Set as follows LC 6 Adjust the spectrum analyzer to display the 400 MHz IF OUTPUT D U T fre quency minus BAND CENTER frequency NOTE Present at the IF OUTPUT will be the IF signal signal under test minus the BAND CENTER frequency of the BAND RANGE chosen IF harmonics and spurious signals Any IF harmonics or spurious signals can be disregarded The signal with the highest amplitude is the desired signal The harmonics of the IF signal do not affect the phase noise measure ment since the NOISE SPECTRUM OUTPUTS are filtered The spur tous signals may appear as sidebands on the IF signal and as spurs at the NOISE SPECTRUM OUTPUTS 7 Check thatthe IF OUTPUT levelis above the specified limit of 7 dBm minimum Record the actual value of the IF OUTPUT frequency and level in Table 3 1 8 If the IF OUTPUT frequency and level did not measure within specified limits check the frequency and power level of the 640 MHz IN signal and the microwave test signal If a problem still exists refer to the troubleshooting on Service Sheet 1 9 Change the frequency of the D U T to the next microwave test signal frequency listed in Table 3 1 Change the BAND RANGE on the front panel to the next BAND CENTER listed in Table 3 1 10 Measure the IF OUTPUT frequency and level with the spectrum analyzer Re cord
25. the values and repeat the measurement for each of the BAND CENTER frequencies listed IF OUTPUT Check Using the 640 MHz oscillator in the Carrier Noise Test Set 11 Leave the settings on the D U T and Carrier Noise Test Set to those that were used for the last measurement in step 10 3 8 HP 11729C Operation OPERATOR S CHECKS OPERATOR S CHECKS cont d Procedure 12 Cont d 13 14 15 16 17 18 Disconnect the cable to the 640 MHz IN connector on the rear panel of the Carrier Noise Test Set Disconnect the SMA termination from the 640 MHz OUT connector on the rear panel of the Carrier Noise Test Set Connect the 640 MHz OUT connector to the 640 MHz IN connector using the cable attenuator assembly HP 11729 60096 or HP 11729 60098 Option 140 that was shipped with the Carrier Noise Test Set NOTE Itis essential that the cable attenuator assembly that was shipped with the Carrier Nosie Test Set be used to make the connection Measure the IF OUTPUT frequency and level with the spectrum analyzer Verify that the typical frequency measured is 400 MHz and the level is greater than 7 dBm Disconnect the cable between the 640 MHz OUT and 640 MHz IN connectors Reconnect the 50 Ohm SMA termination to the 640 MHz OUT connector Reconnect the 640 MHz signal from the tunable reference to the 640 MHz IN connector on the Carrier Noise Test Set Table 3 1 IF Output Check Microwave iF
26. to 10 88 10 88 to 13 44 13 44 te 16 0 from GHz GHz GHz GHz 16 0 to 18 0 Carrier ae Typ Spee Typ Specs Typ Spec 30 38 28B 60 68 58 57 80 88 78l 77 97 100 95 399 94 119 122 118 116 425 128 125 127 424 432 431 The HP 8663A Option 003 operated below 1280 MHz may be used in place of the HP 8662A with no change in system performance These system noise floor specifications apply for locking via the EFC of the HP 8662A crystal oscillator Locking via the HP 8662A dc FM changes the phase noise on the tuna ble HP 8662A signal and therefore total system noise Use the system phase noise equation at the end of footnote 3 to determine system phase noise when locking via the HP 8662A de FM The absolute system phase noise is dependent on the test signal frequency therefore the actual system noise may be lower than specified Since the noise contribution of the HP 8662A front panel signal is a function of frequency selected the overall system noise may improve for test frequencies lt 640 MHz from band centers For example for frequencies over the narrow range of 8 96 to 10 24 GHz typical system phase noise at a 100 kHz offset is 134 dBc Hz To deter mine the system phase noise for any test frequency see the system phase noise equation below Ce Wee 2 L system T 101 a oF ori Ee N 8 N x 10 10 10 1 8 SSB Phase Noise to Carrier Rat
27. 0 120 Vac operation This fuse has a 0 5A rat ing and is for reconfiguring the instrument for 220 240 Vac operation c ARO ohm BNC termination is supplied to be connected to the IF OUTPUT on the front panel With the 50 ohm termination in place the Carrier Noise Test Set meets the requirements of MILSTD 461 REO2 NOTE The 50 ohm termination must be con nected to the IF OUTPUT if the IF OUTPUT is not being used d The Carrier Noise Test Set has two connec tors on the rear panel labeled 640 MHz OUT and 640 MHz IN The 640 MHz OUT is connected to the 640 MHz IN to configure the internally generated 640 MHz signal for use during a measurement A cable attenuator assembly HP 11729 60096 or HP 11729 60098 Option 140 is supplied to make this connection The length and attenuation of this cable assembly is critical for the generation of the 640 MHz signal e A 500 SMA termination is supplied to be connected to the 640 MHz OUT connector on the rear panel For proper operation of an amplifier in the Carrier Noise Test Set the termination must be in place when the 640 MHz OUT connector is not being used 1 11 EQUIPMENT REQUIRED BUT NOT SUPPLIED For the Carrier Noise Test Set to be completely operational it will require one or two drive signals either a fixed 640 MHz signal or a 5 MHz 1280 MHz signal or both that are supplied from an external RF source Critical specifications of the RF source are in Table 1 4 in this se
28. 4 48 GHz 7 04 GHz 9 60 GHz 12 16 GHz 14 72 GHz 17 28 GHz IF OUTPUT Bandwidth 5 MHz to 1280 MHz Level 7 dBm Minimum AM NGISE DETECTION Option 130 Frequency Range 10 MHz to 18 GHz Input level 0 dBm to 18 dBm AM Noise Floor At 10 dBm input level Offset from Carrier Hz AM Noise dBc Hz Ik 138 10k 145 100k 155 1M 160 RESIDUAL NOISE Offset From Carrier Hz dBe Hz With a lt 1 28 GHz input signal 10 115 100 126 1k 135 10k 142 100k 151 1M 156 Yn eight 8 bands excluding 5 MHz around band center frequencies HP 11729C General Information Table 1 1 Specifications 2 of 2 Electrical Characteristics Performance Limits Conditions RESIDUAL NOISE cont d Offset From Carrier Hz dBe Hz With a 10 GHz input signal 10 90 100 105 ik 115 10k 127 100k 137 iM 142 GENERAL i Line Voltage 100 120 220 or 240V 5 10 Line Frequency 48 to 66 Hz Power Dissipation 75 V A maximum Temperature Operating 0 to 55 C Weight Net 10 4 kg 23 Ib Dimensions Height 99 mm 3 9 in Width 425 mm 16 8 in Depth 551 mm 21 7 in Remote Operation HP IB IEEE STD 488 1978 Compati bility Code SH1 AH1 T5 TEO L3 LEO SR1 RLA PP1 DCI DTO0 CO ELECTROMAGNETIC COMPATIBILITY Electromagnetic Conducted and radiated inter Interference ference is within
29. AM NOISE FLOOR PERFORMANCE TEST Electrical 1 Characteristics Performance Limits Conditions AM Noise Floor At 10 dBm input level Offset from Carrier 1 kHz 10 kHz 100 kHz 1 MHz Specification AM Noise dBe Hz 138 145 155 160 Description NOTE This test as written is only a partial verification of the AM Noise floor specification The test only verifies the AM noise floor for frequency offsets of 100kHz and higher From 1Hz to 100kHz the recommended low noise oscillator s AM noise floor is higher than the AM noise floor of the Carrier Noise Test Set For a complete verification an oscillator with lower AM noise specifications than the Carrier Noise Test Set would be needed The AM noise floor is measured at two offsets from the carrier 100 kHz and 1 MHz to verify AM noise detection is performing within limits A signal generator is used for calibrating the spectrum analyzer A low noise oscillator is connected to the MICRO WAVE TEST SIGNAL INPUT for the AM noise measurement The AM noise floor is observed from the lt 10 MHz OUTPUT on a spectrum analyzer Equipment Microwave Synthesized Source HP 8340A with AM modulation Spectrum Analyzer 00 000000 HP 8566B Function Generator 0000 e eee HP 3312A Coaxial to waveguide adapter HP X281A ka Ee T T aiid ican e ei abn eala nee HP 0955 0178 Power Supply HP 6214B Power Meter si s
30. ANCE TEST confd Procedure 13 Calculate the AM noise floor by summing the measured AM noise level A and the contd 3 correction factors shown below The normalization bandwidth factor is deter mined by putting the resolution bandwidth B into the equation below Verify the AM noise floor did not exceed the specified limit as shown at the bottom of each column 100 kHz Noise level A relative to refer ence level Normalization to 1 Hz equivalent noise bandwidth 10 log B x 1 2 Calibration Attenuation Step 8 Correction for log amplifiers and peak detectors in analog spectrum analyzer 2 5 dB 2 5 dB Total dBc Hz lt 155 lt 160 Refer to Application Note 150 4 HP 5952 1147 if additional information on calibration of spectrum analyzers for noise measurements is needed For a complete explanation of the correction factors see Appendix A Performance Tests HP 11729C Table 4 2 Performance Test Record Hewlett Packard Company l Test by Model HP 11729C Carrier Noise Test Set Serial Number Results Para No Test Description Actual 4 5 MEASUREMENT FREQUENCY RANGE IF OUTPUT BANDWIDTH AND LEVEL PERFORMANCE TEST IF Output Power Mirowave Band IF Output Signal Center Freq GHz GHz MHz Typ 2 82 1 92 400 7 dBm itt 4 88 4 48 400 7 dBm Re ae eet 7 44 7 04 400 7 dBm Postrel Samet 10 00 l 9 60 400 7 d
31. Bm La 12 56 12 16 400 7 dBm nae ee 14 740 14 72 20 7dBm eit 16 00 14 72 1280 7 dBm cl 17 30 17 28 20 7 dBm 18 56 17 28 1280 7 dBm 4 6 RESIDUAL PHASE NOISE PERFORMANCE TEST Using a 1280 MHz Test Signal Offset From The Carrier dBe Hz dBe Hz 10 Hz eee ae 115 100 Hz 126 1 kHz 135 10 kHz 142 100 kHz 151 1 MHz 156 4 7 RESIDUAL PHASE NOISE PERFORMANCE Using a 10 GHz Test Signal Offset From The Carrier dBc Hz dBc Hz 10 Hz Sense nas 90 100 Hz 108 1 kHz ee eT 115 10 kHz tee SS Free 127 100 kHz ae 137 1 MHz a canes 142 4 8 AM NOISE PERFORMANCE TEST Offset From The Carrier dBc Hz dBe Hz 100 kHz oe oie Lace 155 1 MHz anes 160
32. CT TO ART ATN GROUND SRO IFC NDAC NRFD lt A EITE EIT STE s wa ff lA fast Jaap for fmm APPR apo HE H i SO METRIC _____ THREAD M3 5 x 6 6 6 24 P1N MICRO RI BBON SERIES 57 CONNECTOR Logic Levels The Hewlett Packard Interface Bus Logic Levels are TTL compatible ie the true 1 state is 0 0 Vdc to 0 4 Vde and the false 0 state is 2 5 Vde te 5 0 Vde Programming and Output Data Format Refer to Section HI Operation Mating Connector HP 1251 0293 Amphenol 57 30240 Mating Cables Available HP 10833A 1 metre 3 3 ft HP 10833B 2 metres 6 6 ft HP 10833C 4 metres 13 2 ft HP 10833D 0 5 metres 1 6 ft Cabling Restrictions 1 A Hewlett Packard Interface Bus system may contain no more than 2 metres 6 6 ft of connecting cable per instrument 2 The maximum accumulative length of connecting cable for any Hewlett Packard Interface Bus system is 20 0 metres 65 5 ft Figure 2 3 Hewlett Packard Interface Bus Connection HP 11729C Mating Connectors cont d Coaxial Connectors Coaxial mating connectors used with the Carrier Noise Test Set should be 50 ohm Type N and 50 ohm BNC male connectors 2 10 Operating Environment The operating environment should be within the following limitations Temperature 6 sass beeen esek pes es 0 to 55C Humidity 5 to 95 relative at 40 C Altitude 2 ceed See lt 4600 metres 15 000 feet 2 11 Bench Operat
33. Connect the lt 10 MHz OUTPUT on the Carrier Noise Test Set front panel to the spec trum analyzer NOTE Do not use the lt 10 MHz NOISE SPEC TRUM OUTPUT for test signals 20 MHz around the BAND CENTER fre quency High feedthrough signals mixer sum products and LO signals saturate the Low Noise Amplifier in the Carrier Noise Test Set and possibly the spec trum analyzer Do not use the lt 1 MHz NOISE SPEC TRUM OUTPUT for test signals 5 MHz around the BAND CENTER fre quency LO feedthrough may possibly saturate the spectrum analyzer For test signals 5 MHz to 10 MHz around the BAND CENTER frequency the measured noise level will be 0 dBm to 3 dBm greater than the actual level The error is caused by an impedance change on the input of the internal Low Noise Amplifier For test signals 10 MHz to 20 MHz around the BAND CENTER frequency the measured noise level will be 0 dBm to 1 dBm greater than the actual level Again the error is caused by an impe dance change on the input of the Low Noise Amplifier Therefore the lt 1 MHz OUTPUT can be used for test signals 5 MHz to 20 MHz around the BAND CENTER frequency by subtracting the maximum error amount from the measured level 3 23 Operation Frequency Discriminator Method contd 18 19 20 21 Increase or decrease the frequency of the tunable 5 1280 MHz source until a green LED is seen in the center of the phase lock indicator on the Carrier N
34. E PERFORMANCE TEST Using a test signal less than 1280 MHz Electrical Performance Limits Characteristics Specification Offset From Carrier dBe Hz With a lt 1 28 GHz input 10 Hz 115 signal 100 Hz 126 L kHz 135 10 kHz 142 100 kHz 151 i MHz 156 Description NOTE This test does not check the down converting circuitry in the Carrier Noise Test Set However the test requires less equipment than the residual phase noise test using a 10 GHz test signal The Carrier Noise Test Set s residual phase noise for test signals lt 1280 MHz is verified by connecting a signal generator s RF output to a power splitter The output of the power splitter supplies the signals for both the MICROWAVE TEST SIGNAL INPUT and the 5 1280 MHz INPUT Since the microwave test signal and the 5 1280 MHz signal are identical the phase noise from the signal generator is canceled by the mixer phase detector in the Carrier Noise Test Set During the residual phase noise measurement the microwave test signal and the 5 1280 MHz signal must be in phase quadrature that is 90 degrees out of phase The difference in the lengths of cables A and B provide a time delay so at a selected frequency on the signal generator the two inputs will have a 90 degree phase difference The Carrier Noise Test Set s NOISE SPECTRUM OUTPUTS are measured on a low frequency spectrum analyzer and an RF spectrum analyzer Correction factors ar
35. E would be 8 382 10 88 GHz Select this filter Connect the IF OUTPUT on the front panel to a spectrum analyzer NOTE Present atthe IF OUTPUT will be the IF signal signal under test minus the BAND CENTER frequency of the BAND RANGE chosen IF harmonics and spurious sig nals The signal with the highest ampli tude is the desired signal Adjust the spectrum analyzer to determine the frequency of the IF OUTPUT signal under test minus the BAND CENTER frequency ofthe BAND RANGE chosen Set the tunable 5 1280 MHz source to the frequency read on the spectrum ana lyzer Disconnect the IF OUTPUT from the spec trum analyzer NOTE The following applys to those users with an IF signal of 625 MHz to 655 MHz IF signals between 625 MHz to 655 MHz cause a high level spur from one or both of the NOISE SPECTRUM OUTPUTS When setting the reference level on the spectrum analyzer during calibration use the beat note and not the high level spur The high level spur is a mixer pro duct from the 640 MHz rear panel input and the 5 1280 MHz front panel input The spur is within the passband of the NOISE SPECTRUM OUTPUT so it does not get filtered out For example with a 635 MHz IF signal you can expect a 5 MHz high level spur from the lt 10 MHz OUTPUT 14 Calibration At calibration a reference level is being set on the spectrum analyzer The Car rier Noise Test Set s effect on a given noise input is being used to set the
36. EQ CONT DC FM connector is connected to the electronic frequency control input of the tunable 5 1280 MHz source or the device under test The connector chosen will depend on the tun ing voltage required by the loop VCO device under test or the 5 1280 MHz source a Set the LOCK BANDWIDTH FACTOR to 100 b On the front panel press then release CAPTURE 3 17 Operation Phase Detector Method cont d c If phase lock is acquired a green LED will be illuminated in the center of the phase lock indicator on the left side of the front panel d If the two sources did not phase lock pro ceed as follows Connect the lt 10 MHz OUT PUT on the front panel to a spectrum ana lyzer with a 50 Ohm input impedance and a bandwidth that includes 10 Hz to 10 MHz Adjust the spectrum analyzer to view the beat note The beat note is the difference between the tunable 5 1280 MHz signal and the mic rowave test signal minus the BAND CENTER frequency of the BAND RANGE chosen Hold CAPTURE in while tuning the tunable 5 1280 MHz source until a green LED is seen in the center of the phase lock indicator The frequency resolution of the tunable 5 1280 MHz source should be lt 1 10 of the effective tuning range of it s crystal oscillator Figure 3 5 shows what the spectrum analyzer display should look like if the tunable 5 1280 MHz source is being tuned in the direction of phase lock that is towards dc or tuned away fro
37. OPERATING AND SERVICE MANUAL HP 117296 CARRIER NOISE TEST SET Including Options 003 007 011 015 019 023 027 130 and 140 SERIAL NUMBERS This manual applies directly to instruments with serial numbers prefixed 2509A For additional important information about serial numbers see INSTRUMENTS COVERED BY THIS MANUAL in Section I Kin HEWLETT PACKARD Copyright HEWLETT PACKARD COMPANY 1985 E 24001 MISSION AVE TAF C 34 SPOKANE WASHINGTON U S A 99220 OPERATING AND SERVICE MANUAL PART NUMBER 11729 90017 MICROFICHE PART NUMBER 11729 90018 Printed MARCH 1985 Safety Considerations HP 11729C SAFETY CONSIDERATIONS GENERAL This product and related documentation must be reviewed for familiarization with safety markings and instructions before operation This product is a Safety Class I instrument pro vided with a protective earth terminal BEFORE APPLYING POWER Verify that the product is set to match the avail able line voltage and the correct fuse is installed SAFETY EARTH GROUND An uninterruptible safety earth ground must be provided from the main power source to the pro duct input wiring terminals power cord or sup plied power cord set Any interruption of the protective grounding conductor inside or outside the instrument or disconnecting the protective earth terminal will cause a potential shock hazard that could result in personal injury Grounding one conductor of a two condu
38. Output Frequency IF Output Level Test Signal Band Center MHz dBm Phase Lock Check 19 Connect the lt 10 MHz OUTPUT from the Carrier Noise Test Set to the RF spectrum analyzer 20 Set the Carrier Noise Test Set as follows Lock Bandwidth Factor 100 Measurement Mode 05 d CW Band Range 8 32 to 10 88 GHz 3 9 Operation HP 11729C OPERATOR S CHECKS cont d Procedure cont d OPERATOR S CHECKS NOTE If this filter is not included in the Carrier Noise Test Set select an available BAND RANGE 21 Set the D U T as follows Frequency ccc ccc eevee 10 GHz Amplitude oe icia es svareh ewes 10 dBm NOTE The test signal is tuned 400 MHz above the center frequency of the BAND RANGE selected on the Carrier Noise Test Set 22 Set the tunable reference as follows Frequency 5 E 400 MHz Amplitude seas 0 dBm 23 Press and release CAPTURE on the Carrier Noise Test Set to phase lock the D U T to the tunable reference If the sources do not phase lock green bar does not remain illuminated on the front panel phase lock indicator the tunable reference must be tuned closer in frequency to the IF frequency fir fp u r fband center frequency Press CAPTURE while tuning the tunable reference in 1 kHz steps Watch the phase lock indicator on the Carrier Noise Test Set When the LED s on the indicator all light up reduce the reso
39. P IB address is switch selectable through five miniature slide switches located on the rear panel of the Carrier Noise Test Set These switches provide the means to select one of 31 valid HP IB addresses 00 through 30 HP IB addresses greater than 30 decimal areinvalid Refer to Table 2 1 for the allowable HP IB address codes Listed are the valid address switch settings and equivalent ASCII character and decimal value When the instrument is shipped from the factory the HP IB address is preset to 06 decimal In binary this is 00110 This preset address is shown shaded in Table 2 1 The following procedure describes how to change the settings of the HP IB address switches Use a small screwdriver to set the switches to the desired HP IB address in binary The five switches are labeled Al through A5 where Al is the least significant address bit and A5 is the most signifi 100 120V OPERATION 220 240V OPERATION PLUG NEMA 5 15P CABLE 8120 1378 PLUG NEMA 6 15P CABLE HP 8120 0698 220 240V OPERATION 220 240V OPERATION PLUG BS 1363A CABLE HP 8120 1351 The number shown for the plug is the industry identifier for the plug only The number shown for the cable is an HP part number for a complete cable including the plug Figure 2 2 Power Cable and Mains Plug Part Numbers 2 2 HP 11729C Table 2 1 Allowable HP IB Address Codes Talk Address Address Switches EE
40. S averaging is available select approximately 128 averages RMS averaging smooths out the noise floor If RMS averaging is not available the measurement should be made at an average level on the noise floor not a peak or valley Set the peak of the 10 kHz beat note to a convenient reference point Disconnect the 640 MHz signal from the MICROWAVE TEST SIGNALINPUT on the Carrier Noise Test Set Disconnect the 50 ohm load from cable A and connect cable A to the MICROWAVE TEST SIGNAL INPUT Residual Phase Noise Measurement 12 13 Increase the amplitude of the tunable reference by 50 dB Decrease the frequency of the tunable reference in 1 MHz steps until phase lock is acquired green LED is illuminated on the phase lock display The green LED should be illuminated when the tunable reference is around 425 MHz For details on phase locking see Section IIT Adjust the RF spectrum analyzer to view the noise level at a 10 kHz offset For the most accurate measurement use the smallest possible resolution bandwidth Use some averaging to smooth out the noise level Measure the noise level down from the reference point at 10 kHz Measure an average noise level do not measure on a peak or minimum noise level Record this noise level A along with the spectrum analyzer s resolution bandwidth setting B below Repeat the measurement and record for offsets of 100 kHz and 1 MHz Offset from Noise level A Resolution Bandwidth B carrier rel
41. With the addition of Option 130 the Carrier Noise Test Set is capable of detecting the signal under test for making AM noise measurements The Carrier Noise Test Set can be used in two methods of making phase noise measurements e Phase Detector Method e Frequency Discriminator Method The number of drive signals required for the Car rier Noise Test Set to be completely operational depends on the phase noise measurement method used and the frequency of the signal under test The drive signals are supplied from an external RF source In addition to the external RF source one of the drive signals 640 MHz can be supplied by the Carrier Noise Test Set The Carrier Noise Test Set can be configured to provide an internally generated 640 MHz signal the 640 MHz signal is available by connecting the provided cable attenu ator assembly HP 11729 60096 or HP 11729 60098 Option 140 between two rear panel connectors The absolute system noise floor will be degraded close in to the carrier when using the internally generated 640 MHz signal compared to the 640 MHz signal being supplied by the HP 8662A Syn thesized Signal Generator The following table lists when the drive signals are required Phase Detector Frequency Method Discriminator Method Frequency Range of Signal Under Test Brive Frequency Range af Signais Signal Under Test 640 MHz Tunable 5 MHz 1280 MHz X Drive signal is used 1 2 HP 11729C
42. aintain phase quadrature between the device under test and the tunable 5 1280 MHz source This is a female BNC connector with a nominal output impedance of 500 The output level is nominal from 1 volt de to 1 volt de LOOP TEST PORT OUT Once a signal has been input at the LOOP TEST PORT IN con nector this output is connected to a spectrum analyzer for displaying the phase lock loop transfer characteristic This is a de coupled female BNC connector with a nominal output impedance of 1 KO The gain outside the phase lock loop bandwidth is equal to one 649 MHz INPUT This is a female BNC connec tor with a 50 Ohm input impedance The input frequency must be 640 MHz 32kHz The input level must be 1 dBm to 4 dBm 50 Ohm TERMINATION For proper operation of an amplifier inside the Carrier Noise Test Set this termination must be connected to the 640 MHz OUT connector The 640 MHz OUT con nector is fully usable just replace the 50 Ohm termination when the 640 MHz OUT connector is not being used Figure 3 2 Rear Panel Features 2 of 2 HP 11729C Operation OPERATOR S CHECKS 3 6 OPERATOR S CHECKS Description Use the test set up shown below to verify the front panel controlled functions are being executed by the microprocessor CONTROLLER HP 117286 CARRIER NOISE TEST SET S 28223888 00 G Lg deer gon PT 5 to 1280 MHz IN IF OUTPUT MICROWAVE RF SYNTHESIZED SIGNAL 5 to 1280 MH
43. andwidth factor when using a spectrum analyzer with normalization to a 1 Hz bandwidth This correction factor is accounted for automatically Verify the residual phase noise level did not exceed the specified limit as shown at the bottom of each column Noise level C relative to refer ence level Sol 5 27 FN se et ae AB T aaa dB Normalization to 1 Hz equivalent noise bandwidth 10 log B x 1 2 _ _ dB aB nr S Calibration Attenuation Step 7 50 dB 50 dB L D conversion factor 6 dB 6 dB Total dBe Hz lt 126 __ RT Refer to Application Note 150 4 HP 5952 1 147 ifadditional information on calibration of spectrum analyzers for noise measurements is needed NOTE If an analog spectrum analyzer was used to measure the noise floor at 10 Hz 100 Hz and 1 kHz add 2 5 dB to the totals above as a correction for the log amplifiers and peak detectors in the analog spectrum analyzer For a complete explanation of the correction factors see Appendix A HP 11729C Performance Tests PERFORMANCE TESTS 4 7 RESIDUAL PHASE NOISE PERFORMANCE TEST Using a test signai of 10 GHz Specification Description Equipment Procedure Electrical Characteristics Offset From Carrier dBe Hz With a 10 GHz input 10 Hz 90 signal Performance Limits Conditions 100 Hz 105 1 kHz 115 10 kHz 127 100 kHz 137 1 MHz 142 NOTE This performance test is only nec
44. aracteristics delay was 100 ns attenuation was lt 10 dB and the cable used was RG 223 column describes the essential requirements for each piece of test equipment Other equipment can be substituted if it meets or exceeds these critical specifications Table 1 4 also includes some alternate equipment listings These alternate instruments are high lighted in Table 1 5 which also indicates the pos sible advantages of using them as substitutes i7 General Information HP 11729C The following information is supplied to aid the user when configuring the Carrier Noise Test Set in a system The system specifications are for the HP 11729C and the HP 8662A Also given are the general requirements for an unknown RF source being used with the HP 11729C Table 1 3 System Specifications 1 of 2 ABSOLUTE SYSTEM NOISE FLOOR System noise is specified only when the HP 11729Cis used with an HP 8662A Option 003 Phase Detector Method flocking via EFC HP 11729C 8662A Absolute System Noise dBe Hz Band Band 2 Band 3 Band 4 Offset 5 ta 1280 1 28 te 3 2 3 2 to 5 76 5 76 ta 8 32 from MHz GHz GHz GHz Caries gt Hz Typ Spee Typ Spee Typ Spec 58 48 53 43 47 37 10 88 78 83 73 7 67 100 108 98 103 93 97 87 1k 119 15 415 1410 109 104 10k 130 125 129 424 127 123 100k 130 126 130 126 430 1M 140 140 Band 5 Band 6 Band 7 Offset 8 32
45. ative to reference level 1081 Hz HP 11729C Performance Tests PERFORMANCE TESTS RESIDUAL PHASE NOISE PERFORMANCE TEST Using atest signal less than 1280 MHz cont d Procedure cont d 14 On the low frequency spectrum analyzer select a Hanning filter and the normali zation to 1 Hz bandwidth ifthe spectrum analyzer has these features available If the spectrum analyzer does not have the normalization to a 1 Hz bandwidth this figure will have to be calculated later using the formula at the end of the test NOTE Power line spurs are not specified for the Carrier Noise Test Set Power line spurs will appear at power line frequencies and multiples of power line frequencies Do not make a noise measurement ona spur make the measurement on an average noise level 15 Adjust thelow frequency spectrum analyzer to view the noise level at a 10 Hz offset For the most accurate measurement use the smallest possible resolution band width Use some averaging if required Measure the noise level down from the reference point at 10 Hz Measure an average noise level do not measure on a peak or minimum noise level Record this noise level C in the table below If the measurement was not made in a 1 Hz resolution bandwidth also record the spec trum analyzer s resolution bandwidth setting D below Repeat the measurement and record for offsets of 100 Hz and 1 kHz Offset from Noise ievel C Resolution Bandwidth 101 carrier rela
46. ay Press the MODE button on the front panel of the Carrier Noise Test Set until the LED next to AM CW is illuminated No other Carrier Noise Test Set front panel functions are used Disconnect the RF source from the spectrum analyzer Connect the RF source to the MIC ROWAVE TEST SIGNAL INPUT connector on the front panel of the Carrier Noise Test Set Connect the lt 10 MHz OUTPUT on the front panel of the Carrier Noise Test Set to the spec trum analyzer 3 25 Operation AM Measurements Option 130 only cont d 13 14 15 Set a reference point with the demodulated 1 kHz signal on the spectrum analyzer Note the reference level for use later Disconnect the RF source from the Carrier Noise Test Set Connect the device under test to the MICROWAVE TEST SIGNAL INPUT connector on the front panel of the Carrier Noise Test Set Measurement With calibration completed a measurement can now be made When making an AM measurement the following items must be taken into consideration Set the spectrum analyzer span to cover the offset frequency of interest Do not change the input sensitivity of the spectrum analyzer Changing the spectrum analyzer input sensitivity between calibration and measurement decreases the measurement accuracy For better accuracy recalibrate ona lower level calibration signal Use steps 5 13 to recalibrate the spectrum analyzer Select a resolution bandwidth thatis appr
47. ce tracking generator or sinusoidal input Bandwidth dc to 100 kHz typical input level less than 0 1V peak typical input impedance dc coupled 10 kO nominal Loop Test Ouiput Bandwidth dc to 100 kHz typical Quiput level gain outside loop bandwidth 1 Quiput impedance dc coupled 1 KO nominal AM NOISE DETECTION Option 130 AM Noise Floor at 10 dBm input level Offset From Carrier Hz Typical AM Neise dBc Hz ik 147 10k 152 100k 161 1M 165 HP 11729C General Information Table 1 2 Supplemental Characteristics 2 of 2 RESIDUAL NOISE Carrier lt 1 28GHz 5 GHz 10 GHz 18 GHz dBc Hz dBe Hz dBc Hz dBe Hz 112 106 120 116 130 125 137 132 146 141 148 144 148 144 The absolute phase noise of the internal saw oscil lator with a 10 GHz input signal Offset From Carrier Hz dBe Hz 1 12 ELECTRICAL EQUIPMENT AVAILABLE The Carrier Noise Test Set has an HP IB interface and can be used with any HP IB compatible com puting controller or computer for automatic sys tems applications 1 13 RECOMMENDED TEST EQUIPMENT Table 1 4 lists the test equipment recommended for use in testing adjusting and servicing the Car rier Noise Test Set The Critical Specification Sensitivity of the HP 11729C using the internal saw oscillator and a 10 GHz input signal The Frequency Discriminator Method was used which had a delay line with the following ch
48. ction If desired the 640 MHz drive signal can be supplied by the Carrier Noise Test Set On the rear panel of the Carrier Noise Test Set the 640 MHz OUT con nector is connected to the 640 MHz IN connector using the cable attenuator assembly HP 11729 60096 or HP 11729 60098 Option 140 supplied with the instrument The absolute system noise floor will be degraded close in to the carrier when 1 3 General Information HP 11729C HP Use on Carrier Part No Description Noise Test Set 11170B BNC M BNC M i 5 to 1280 MHz 24 inches INPUT 640 MHz IN EQUIPMENT REQUIRED BUT NOT SUPPLIED contd using the internally generated 640 MHz signal compared to the 640 MHz signal being supplied by the HP 8662A Synthesized Signal Generator The following table lists the coaxial cables required 11170C BNC M BNC M 48 inch FREQ CONT DC FM to connect the Carrier Noise Test Set to the HP Glen EOT X OSC 8662A or 8663A Synthesized Signal Generators NOISE SPECTRUM Also listed are the cables necessary to connect the lt 10 MHz OUTPUT lt 1 MHz OUTPUT Carrier Noise Test Set to a spectrum analyzer Table 1 1 Specifications 1 of 2 Electrical Characteristics Performance Limits Conditions TEST SIGNAL E Frequency Range 10 MHz to 18 GHz External low pass filtering may _ be required for test signals lt 20 MHz and 20 MHz around band centers Band Center 1 92 GHz Frequencies
49. ctor outlet is not sufficient protection In addition verify that a common ground exists between the unit under test and this instrument prior to energizing either unit Whenever it is likely that the protection has been impaired the instrument must be made inoperative and be secured against any unintended operation If this instrument is to be energized via an auto transformer for voltage reduction make sure the common terminal is connected to neutral that is the grounded side of the mains supply Servicing instructions are for use by service trained personnel only To avoid dangerous elec tric shock do not perform any servicing unless qualified to do so Adjustments described in the manual are per formed with power supplied to the instrument ji while protective covers are removed Energy avail able at many points may if contacted result in personal injury Capacitors inside the instrument may still be charged even if the instrument has been discon nected from its source of supply For continued protection against fire hazard re place the line fuse s only with 250V fuse s of the same current rating and type for example normal blow time delay etc Do not use repaired fuses or short circuited fuseholders SAFETY SYMBOLS Instruction manual symbol the product will be marked with this symbol when it is necessary for the user to refer to the in struction manual see Table of Contents for page ref
50. dded dur ing calibration Minus 6 dB for conversion to f Minus 10 log 1 2 x spectrum analyzer reso lution bandwidth This is for normalization to a 1 Hz noise equivalent bandwidth The result is in dB Plus 2 5 dB is the correction for log amplifi ers and peak detectors used in an analog spec trum analyzer Plus loop noise suppression at the appro priate offset frequency Only add loop noise suppression when making a measurement inside the loop bandwidth Below is an example of how to calculate the correct amount of phase noise 67 dBm measured phase noise 10 dBm reference level set during calibration 40 dB attenuation added during calibration For a complete explanation of the correction factors see Appendix A See Appendix B to determine the phase lock loop transfer lyzer display where the noise level is falling characteristic and the amount of loop noise suppression 3 21 Operation Phase Detector Method contd 6 dB conversion factor 20 8 dB 10 log 1 2 x spectrum analyzer resolution bandwidth 2 5 dB if an analog spectrum analyzer is used 20 dB for loop noise suppression if the measurement is made within the loop bandwidth 67 dBm 10 dBm 40 dB 6 dB 20 8 dB 2 5 dB 20 dB 101 3 dBe Hz The actual amount of phase would then be 101 38dBe Hz After applying these correction factors th
51. e actual amount of phase noise is known for the particular frequency offset 3 11 Frequency Discriminator Method 1 Figure 3 7 shows interconnections to the Car rier Noise Test Set when making a phase noise measurement 2 Be sure the LINE MODULE on the rear panel is set to the available line voltage If it needs to be changed see Figure 2 1 in Section IH HP 117280 CARRIER NOISE TEST SET a enea DO DOOD O O S l L le lele le Lal g Sano Oe 2 640 MHz IN NOISE SPECTRUM lt 10 MHz OUTPUT MICROWAVE TEST SIGNAL INPUT SPECTRUM ANALYZER The 640 MHz signal can be sup plied by the Carrier Noise Test Set See step 5 for an explanation of how to configure the Carrier Noise Test Set to supply the 640 MHz signal IF OUTPUT HP 11729C Plug the Carrier Noise Test Set into the avail able line supply Turn the Carrier Noise Test Seton and allowa 30 minute warm up before making any measurements If the microwave test signal is from 0 010 1 28 GHz go to step 6 If the microwave test signal is greater than 1 28 GHz follow the instructions for step 5 Using a coaxial cable connect a 640 MHz source to the 640 MHz IN connector on the rear panel To configure and use the internal 640 MHz oscillator connect the 640 MHz OUT connec tor to the 640 MHz IN connector with the cable attenuator assembly HP 11729 60096 or HP 11729 60098 Option 140 provided Both connectors are on the rear panel
52. e added and the residual phase noise is verified to be below the specified limit Equipment RF Synthesized Signal Generator HP 8662A Option 003 Low Frequency Spectrum Analyzer HP 3582A RF Spectrum Analyzer 005 HP 8566B Power Meter oi caked pods etacwaceyhd aphdats HP 436A Power Sensor HP 8482A Power Splitter 2c civeviskcusdciwie ees eueees HP 11667A Coaxial Cable A 9 inches HP 10502A Coaxial Cable B 24 inches HP 11170B 509 Termination 6s iws hs Ss oean is eG oeees HP 11598A NOTE The specified lengths of cable A and cable Bin Figure 4 2 are critical for obtaining phase quadrature 4 4 HP 11729C Performance Tests PERFORMANCE TESTS RESIDUAL PHASE NOISE PERFORMANCE TEST Using atest signal less than 1280 MHz cont d RF SPECTRUM ANALYZER LOW FREQUENCY HP 117282 SPECTRUM ANALYZER CARRIER NGISE FREQ CONT Heer eel HEE TO 1280 MHz IN i JUDG loc G SALAS IMICROWAVE LOG SrrEsT INPUT lt 10 MHz GIANNA INPUT OUTPUT INPUT BNC TEE RF SYNTHESIZED SIGNAL GENERATOR 640 MHz STEP 8 POWER METER EFC OUTPUT INPUT CABLE A 5 l a E CABLE B STEP 5 fe POWER POWER SPLITTER SENSOR Figure 4 2 Residual Phase Noise Test Setup Using a test signal of less than 1280 MHz Procedure Calibration 1 Connect the instruments as shown in Figure 4 2 2 Turn on and warm up all instruments in the test setup for 30 minutes 3 Set the RF synthesized
53. endent on method of phase lock chosen could require de coupled frequency controlled input accepting 1V or 10V with necessary devia g 0 Z 49 tion dependent on source under test S 80 gt pa L Sensitivity Use the following procedure to calculate the Absolute PE 0 5S System Noise Floor of the HP 11729C and an RF 28 Tec source other than the HP 8662A Z 100 a E 20 Typical System Noise Limit a Absolute System Noise Floor generai case E ve E 4 R E Measurement system noise floor is dependent on the S H 10 100 HS 10k 700k iM RF reference source s used For the frequency dis Oftset from Carrier Hz criminator method system noise is a composite of the noise on the multiplied 640 MHz signal plus the resid ual noise of the HP 11729C For the phase detector Typical noise contribution of HP 11729C 8662A frequency method system noise has the additional noise of the discriminator method at X band and typical system sensi RF tunable source at the phase detector input System tivity using a 50 ns delay line discriminator noise can be described by Ly Le 3 Listed below are general requirements for the RF source E system 10 lo y a r when used with the HP 11729C in a system S N x10 109 10 640 MHz signal source where N center frequency of selected filter 640 MHz jpegs pe erate ara A ge ete a 1 absolute SSB phase noise of the 640 MHz Frequency control dependent on method of phase lock
54. enter of the band range chosen IF harmonics And spurious signals ALL HARMONICS OF THE IF SIGNAL AND ANY SPURIOUS SIG NALS CAN BE DISREGARDED 5 Verify the IF OUTPUT level is within the specified limits in Table 4 1 and record the actual value 6 Adjust the frequency of the D U T to the next microwave test signal frequency listed in column one of Table 4 1 Select the corresponding band center frequency on the Carrier Noise Test Set listed in column two Verify and record the IF OUTPUT power level Repeat this process for each microwave test signal fre quency listed in Table 4 1 7 Ifthe IF OUTPUT power level did not measure within specified limits refer to the troubleshooting information on Service Sheet 1 Table 4 1 IF Output Level IF Output iF Output Microwave Band Center Frequency Level Test Signal Frequency MHz dBm GHz GHz GHz GHz Typical Minimum Actual 2 32 1 92 400 7 4 88 4 48 400 7 7 44 7 04 400 7 10 00 9 60 400 7 12 56 12 16 400 7 14 740 14 72 20 7 16 00 14 72 1280 7 17 30 17 28 20 7 18 56 17 28 1280 7 Because of the power requirements of the internal mixer the upper and lower ends of the bands with center frequencies of 14 72 GHz and 17 28 GHz are verified to be within specified limits The comb generator s output power is lowest at the higher 640 MHz harmonics 4 3 Performance Tests HP 11729C PERFORMANCE TESTS 4 6 RESIDUAL PHASE NOIS
55. erence by 1 MHz Verify that the unlocked condition red LED adjacent to the left of the green LED is detected by the microprocessor A decimal 4 should be displayed on the computer If the number 2 or 4 displayed on the computer does not correspond to the phase lock condition displayed on the front panel phase lock indicator perform the phase lock indicator adjustment procedures in Section V Run Program 1 again to verify the adjustments 3 13 Operation 3 7 GENERAL OPERATING INSTRUCTIONS ES Before the Carrier Noise Test Set is switched on all protective earth terminals extension cords autotransformers and devices connected to the instrument should be connected to a protective earth grounded socket Any interruption of the protective earth grounding will cause a potential shock hazard that could result in personal injury t CAUTION Before the Carrier Noise Test Set is switched on it must be set to the same line voltage as the power source or dam age to the instrument may result 3 8 Turn On Turn on Procedure If the Carrier Noise Test Setis already plugged in set the LINE switch to ON If the power cable is not plugged in follow these instructions On the rear panel 1 Check the line voltage selection card for cor rect voltage selection 2 Check the fuse for correct current rating The current rating is printed on the line power module label 3 Plug in the power cable On the front panel
56. erences Indicates hazardous voltages Indicates earth ground terminal RIES The WARNING sign denotes a WARNING hazard It calls attention to a procedure practice or the like which if not correctly performed or adhered to could result in per sonal injury Do not proceed be yond a WARNING sign until the indicated conditions are fully understood and met iF WS The CAUTION sign denotes a hazard It calls attention to an operating procedure practice or the like which if not correctly performed or adhered to could result in damage to or destruc tion of part or all of the product Do not proceed beyond a CAU TION sign until the indicated conditions are fully understood and met f CAUTION General Information HP 11728C aS DRESS Ro Be Gat SRN Cit EEE RES pete er RRS S oe SSS ERAN ie ST 117240 CARHIER NOISE TEST SEF rira S vrd De CABLE AND ATTENUATOR Cable attenuator assembly used to configure the internal 640 MHz oscillator SMA TERMINATION BNC TERMINATION The 500 termination is in stalled on the IF OUTPUT POWER CABLE port as shown in the photo graph Figure 1 1 HP Model 11729C Carrier Noise Test Set with Accessories Supplied HP 11729C General Information SECTION GENERAL INFORMATION 1 1 INTRODUCTION This manual contains information required to install operate test adjust and service the Hewlett Packard Model 11729C Carrier Noise
57. essary when the residual phase noise of the Carrier Noise Test Set is in question This test verifies the Carrier Noise Test Set s residual phase noise specifications using a 10 GHz test signal A second Carrier Noise Test Set is required as a reference unit in this test Since this test requires a second Carrier Noise Test Set we recommend that the phase noise of the other instruments in the phase noise measuring system be checked before this test is performed During the residual phase noise measurement the microwave test signal and the 5 1280 MHz signal must be in phase quadrature that is 90 degrees out of phase One microwave synthesized source supplies the MICROWAVE TEST SIGNAL INPUT to both of the Carrier Noise Test Sets device under test and reference The IF OUTPUT of the reference Carrier Noise Test Set then supplies the 5 1280 MHz INPUT of the Carrier Noise Test Set device under test The Carrier Noise Test Set s residual phase noise is measured on a low frequency spectrum analyzer and an RF spectrum analyzer Correction factors are added and the residual phase noise is verified to be below the specified limit Carrier Noise Test Set ee eee HP 11729C used as reference RF Synthesized Signal Generator HP 8662A Option 003 Microwave Synthesized Source HP 8340A Low Frequency Spectrum Analyzer HP 3582A RF Spectrum Analyzer 0 HP 8566B Power Meter sse hake bet S eee dot tess HP
58. f AM noise 67 dBm measured AM noise 10 dBm reference level set during calibration 40 dB The carrier to sideband ratio set in step 9 20 8 dB 10 log 1 2 x spectrum analyzer resolution bandwidth 2 5 dB if an analog spectrum analyzer is used 67 dBm 10 dBm 40 dB 20 8 dB 2 5 dB 115 3 dBce Hz The actual amount of AM noise would then be 115 8 dBc Hz For a complete explanation of the correction factors see Appendix A HP 11729C Table 3 3 HP IB Message Reference Table 1 of 2 HP IB Applicable Response Message Data Yes All Carrier Noise Test Set functions available in local except i the LINE switch are bus programmable Trigger The Carrier Noise Test Set has no trigger capability Clear The clear message sets the Carrier Noise Test Set to the following conditions Filter 1 ON Phase Lock Bandwidth 100 Hz Phase noise measurement Capture OFF Remote Remote mode is enabled when the REN bus control line is true However remote mode is not entered until the first time the Carrier Noise Test Set is addressed to listen The front panel REMOTE annunciator lights when the instrument is actually in the remote mode No instrument settings or functions are changed but all front panel keys except LOCAL are disabled The Carrier Noise Test Set returns to local mode front panel control Responds equally to the GTL bus command
59. f the Car rier Noise Test Set is given in two places namely detailed panel features and general operating instructions Detailed Panel Features Figure 3 1 and Figure 3 2 illustrate the front and rear panels of the Carrier Noise Test Set and provide descriptions of each key connector switch and annunciator General Operating Instructions Under general oper ating structions the following topics are covered Power on sequences Power on procedure Phase noise measurement using the Phase Detector Method Phase noise measurement using the Frequency Discriminator Method AM noise measurement 3 3 Remote Operation HP IB lt 3 The Carrier Noise Test Set is capable of remote operation via the Hewlett Packard Interface Bus Knowledge of local operation is essential for HP IB programming since most of the data messages contain the same keystroke like sequences HP IB information is presented in the following areas of this section Asummary of HP IB capabilities is provided in Table 3 3 A summary of program codes is provided in Table 3 4 3 4 Operator s Checks Operator s checks are simple procedures designed to verify that the main functions of the Carrier Noise Test Set operate properly These procedures require a microwave synthe sized source an RF synthesized signal generator a spectrum analyzer a controller for HP IB checks and interconnecting cables 3 5 Operator s
60. he two sources approach quadrature the LEDs will fully light one at a time from left to right When the center green LED is illuminated the two sources are in phase quadrature BAND RANGE BAND RANGE describes the range of microwave test signals that can be input for each of the buttons below FILTER RANGE The BAND RANGE chosen must con tain the microwave test signal The BAND RANGE desired is enabled by pressing the but ton below that BAND RANGE FILTER RANGE FILTER RANGE describes the range of microwave test signals that can be accepted by the Carrier Noise Test Set 0 010 18 GHz BAND CENTER The broad range of micro wave test signals is possible because of a 640 MHz comb generator in the Carrier Noise Test Set Through a series of filters certain har monics from the comb generator are passed The 5 BAND CENTER frequency of the BAND RANGE chosen is the only harmonic combline from the comb generator that is passed The fil ter used for selecting the harmonic is a 200 MHz passband filter centered around the combline AUX NOISE This is a female BNC connector with an output impedance of 6000 The signal output is a de level that is proportional to the phase difference between the microwave test signal and the tunable 5 1280 MHz signal The dc level has ac fluctuations directly proportional to the phase noise of the microwave test signal if the phase noise of the 640 MHz signal and the tunable 5
61. ignal under test The following table lists when the drive signals are required Phase Detector Frequency Method Discriminator Method Brive Frequency Range of Frequency Range Signal Signal Under Test of Signal Under Test 1OMHz 1 28GHz 10MHz 1 28 GHz to 128 t18GHz to 1 28 E 28 GHz GHz GHz Not X Not X 640 MHz needed l needed Tunable X X Not Not 5 1280 needed needed X Drive signal is needed 3 9 PHASE NOISE MEASUREMENT 3 10 Phase Detector Method NOTE The 640 MHz and 5 1280 MHz signals may come from the following sources Two synthesized sources One synthesized source and one cavity tuned source Two cavity tuned sources HP 11729C iFREQ CONT HP 11729 CARRIER NOISE 5 TEST SET e 3NOISE SPECTRUM lt 10 MHz OUTPUT DU D O0 Gm SPECTRUM ANALYZER under test MHz INPUT MICROWAVE TEST SIGNAL DEVICE UNDER TEST D U T The FREQ CONT signal can be connected to the source supplying the 5 1280 MHz signal or the device Operation TUNABLE 5 1280 MHz Two sources can supply the 640 MHz and 5 1280 MHz signals For important information see the note at the beginning of paragraph 3 10 The NOISE SPECTRUM lt 1 MHz or lt 10 MHz that is connected to the spectrum analyzer depends on the offset of interest and the input impedance of the spec
62. il the power meter reads the power level recorded in step 8 Connect the tunable reference to the 5 1280 MHz INPUT on the Carrier Noise Test Set device under test 10 Decrease the amplitude of the tunable reference by 50 dB Adjust the RF spectrum analyzer to display the approximately 10 kHz beat note The beat note is the result of mixing the 400 MHz IF MICROWAVE TEST SIGNAL INPUT minus the band center of the BAND RANGE chosen and the 399 990 MHz tunable reference signal Set the peak of the 10 kHz beat note to a convenient reference point 11 Adjust the low frequency spectrum analyzer to view the approximately 10 kHz beat note If the spectrum analyzer has selectable filters select a flat top filter If RMS averaging is available select approximately 128 averages RMS averaging smooths out the noise floor If RMS averaging is not available the measurement should be made at an average level on the noise floor not on a peak or valley 12 Set the peak of the beat note to a convenient reference point Residual Phase Noise Measurement 13 Disconnect the tunable reference from the 5 to 1280 MHz INPUT on the Carrier Noise Test Set device under test Reconnect cable A to the 5 1280 MHz INPUT on the Carrier Noise Test Set device under test 14 Decrease the frequency of the Microwave Synthesized Source in 1 MHz steps until the Carrier Noise Test Set device under test indicates phase quadrature green LED is illuminated on the phase lock
63. ing 6 Measure the power level of the low noise oscillator at the end of cable A the end that connects to the MICROWAVE TEST SIGNAL INPUT The level should be approximately 10 dBm Connect an attenuator pad at the oscillator s outputif the power level is above 10 dBm The value of the attenuator pad selected should bring the measured power level to 10 dBm Disconnect cable A from the power sensor Record the power level below Low noise oscillator power level dBm 4 15 Performance Tests HP 11729C PERFORMANCE TESTS AM NOISE FLOOR PERFORMANCE TEST coni d Procedure cont d 10 NOTE The AM noise floor of the Carrier Noise Test Set is specified for a 10 dBm input level Using an input signal lower than 10 dBm will increase the AM noise floor The noise floor will increase by the amount in dB that the input signal was lowered from 10 dBm As an example a 7 dBm input will raise the AM noise floor by 3 dB Because our specifications are higher than typical measured values an input signal of 5 dBm minimum will typically still measure within specifications Connect the end of the cable from the Microwave Synthesized Source to the power sensor Adjust the amplitude of the Microwave Synthesized Source until the power meter reads the power level recorded in step 6 Turn the Microwave Synthesized Source to external AM modulation Connect the Microwave Synthesized Source to the spectrum analyzer Be sure the
64. io where N center frequency of selected filter 640 MHz Ly absolute SSB phase noise of the 640 MHz ref erence signal dBce Hz o absolute SSB phase noise of the 5 to 1280 MHz tunable signal dBe Hz fs residual noise of the HP 11729C dBc Hz BOE 130 150 ee G 1 19 10 tk 10k 400k 1M Offset from Carrier Hz Typical HP 11729C 8662A system noise phase detector method locking via EFC Frequency Qiscriminator Method HP 11729C 8662A System Noise and Sensitivity In the fre quency discriminator mode the lower limit of the measurement system sensitivity is set by the noise contribution of the 11729C 8662A Typical system noise contribution of the HP 11729C 8662A is shown in the table below Typical System Noise dBe Hz Offset frequency discriminater from Carrier Hz 8 32 to 16 0 te 10 88 GHz 18 0 GHz The actual HP 11729C 8662A measurement sensitiv ity in the frequency discriminator method largely depends on the delay line delay time used The longer the delay time the closer the measurement sensitivity approaches the system noise limit The graph shows the HP 11729C 8662A noise contribu tion and atypically obtainable system sensitivity A 34 foot section of flexible RF cable RG 225 was used as the external time delay element r 50 ns HP 11729C General Information Table 1 3 System Specifications 2 of 2 Frequency Discriminator Method cont d Frequency control dep
65. ion The instrument cabinet has plastic feet and fold away tilt stands for convenience in bench opera tion The plastic feet are shaped to ensure self alignment of instruments when they are stacked The tilt stands raise the front of the Carrier Noise Test Set for easier viewing of the front panel 2 12 Rack Mounting WARNING The Carrier Noise Test Set weighs 10 4 kg 23 lb therefore care must be exercised when lifting to avoid personalinjury Use equipment slides when rack mounting Rack mounting information is provided with the rack mounting kits If the kits were not ordered with the instrument as options they may be ordered through the nearest Hewlett Packard office Refer to the paragraph entitled Mechanical Options in Section I 2 13 STORAGE AND SHIPMENT 2 14 Environment The instrument should be stored in a clean dry Installation environment The following environmental limi tations apply to both storage and shipment Temperature e K 55 C to 75 C Humidity kA xewsaedn asp euo lt 95 relative at 40 C Altitude 15 300 metres 50 000 feet 2 15 Packaging Tagging for Service If the instrument is being returned to Hewlett Packard for service please complete one of the blue repair tags located at the back of this manual and attach it to the instrument Original Packaging Containers and materials iden tical to those used in factory packaging are avail able through Hewlett Pac
66. ive con ductor grounding Installation ates a pe Operating voltage is shown 10 module window SELECTION GF OPERATING VOLTAGE 1 Open cover door pull the FUSE PULL lever and rotate to left Remove the fuse 2 Remove the Line Voltage Selection Card Position the card so the line voltage appears at top left corner Push the card firmly into the siot Rotate the FUSE PULL lever to its normal position Insert a fuse of the correct value in the holder Close the cover door WARNING To avoid the possibility of hazardous electri cal shock do not operate this instrument at line voltages greater than 126 5 Vac with line frequencies greater than 66 Hz leakage cur rents at these line settings may exceed 3 5 mA Figure 2 1 Line Voltage and Fuse Selection 220 240V OPERATION 220 240V OPERATION PLUG SEV 1011 1959 24507 TYPE 12 CABLE HP 8120 2104 PLUG NZSS 198 AS C112 CABLE HP 8120 1369 220 240V OPERATION PLUG CEE7 VII CABLE HP 8120 1689 PLUG CEE22 V1 CABLE HP 8120 1860 HP 11729C Power Cables cont d This instrument is equipped with a three wire power cable When connected to an appropriate ac power receptacle this cable grounds the instru ment cabinet The power cable plug shipped with each instrument depends on the country of desti nation Refer to Figure 2 2 for the part numbers of power cables available 2 7 HP IB Address Selection 2 4 3 The H
67. kard offices Mark the container FRAGILE to assure careful handling In any correspondence refer to the instrument by model number and full serial number Other Packaging The following general instruc tions should be used for re packaging with com mercially available materials a Wrap the instrumentin heavy paper or plas tic If shipping to a Hewlett Packard office or ser vice center complete one of the blue tags menti oned above and attach it to the instrument b Use a strong shipping container A double wall carton made of 2 4 MPa 850 psi test material is adequate c Use enough shock absorbing material 75 to 100 mm layer 3 to 4 inches around all sides of the instrument to provide firm cushion and prevent movementin the container Protect the front panel with an appropriate type of cushioning material to prevent damage during shipment d Seal the shipping container securely e Mark the shipping container FRAGILE to assure careful handling 2 5 2 6 HP 11729C Operation SECTION IlI OPERATION 3 1 INTRODUCTION This section provides complete operating infor mation for the Carrier Noise Test Set Included are general operation instructions detailed descrip tions of each front and rear panel key connector switch and annunciator information on remote operation operator s checks and operator s main tenance procedures 3 2 Local Operation Information covering local operation o
68. lly opera tional it may have to be connected to an external RF source for one or both of the drive signals 5 1280 MHz and 640 MHz The drive signals are essential to the operation of the Carrier Noise Test Set One of the drive signals can be supplied by the Carrier Noise Test Set An internally generated 640 MHz reference signal can be provided by con necting the supplied cable attenuator assembly between the proper rear panel connectors For proper operation it is essential that the supplied cable attenuator assembly HP 11729 60096 or HP 11729 60098 Option 140 be used to make the connection The following figures in Section HI OPERA TION show the interconnections to the Carrier Noise Test Set Figure 3 4 Phase Noise Measurement Setup Phase Detector Method Figure 3 7 Phase Noise Measurement Setup Frequency Discriminator Method Figure 3 8 AM Noise Measurement Setup Interconnection data for the Hewlett Packard Inter face Bus is provided in Figure 2 3 2 9 Mating Connectors HP IB interface Connector The HP IB mating connector is shown in Figure 2 3 Note that the two securing screws are metric 2 3 Installation 2 4 HP 11729C S SIGNAL GROUND PJO TWISTED PAIR WITH 11 P O TWISTED PAIR WITH 10 SHOULD BE GROUNDED P O TWISTED PAIR WITH 9 raa WoL i P O TWISTED PAIR WITH 8 TWISTED PAIR PIO TWISTED PAIR WITH 7 P O TWISTED PAIR WITH 6 REN DIOS DIO7 DIO6 D105 SHIELD CONNE
69. locked increase the LOCK BANDWIDTH FACTOR to 1k Press and release CAPTURE The two sources should now be phase locked If phase lock was aquired go to step g If phase lock was not aquired go to step f NOTE If the HP 8662A is used as the tunable 5 1280 MHz source and the system is locked using the crystal of the HP 8662A the tk LOCK BANDWIDTH FACTOR may cause an unstable phase lock loop for microwave test signals greater than 5 GHz If the loop is unstable lower the LOCK BANDWIDTH FACTOR to 100 If the loop ts still unstable try locking using DC FM f If the two sources are still not phase locked try locking using a loop VCO with a 3 18 h Connect the FREQ CONT X OSC or FREQ CONT DC FM connector to the elec tronic frequency control input of the leop VCO The connector used will depend on the tuning voltage required for DC FM Set the loop VCO as follows DC FM 50 kHz deviation Set amplitude to 0 dBm i Set the LOCK BANDWIDTH FACTOR to 100 1 Connect the lt 10 MHz OUTPUT on the front panel to a spectrum analyzer with a 50 Ohm input impedance and a bandwidth that HP 11729C Operation E REF 30 0dBm ATTEN 40 dB Qe REF 30 0 dBm ATTEN 40 dB 10 dB 10 dB i f L wa a aa Tart KTL START 5 0 MHz STOP 25 0 MHz START 5 0 MHz STOP 25 0 MHz RES BW 100 kH
70. lution of the tunable reference by a factor of 10 NOTE Connect the spectrum analyzer to the lt 10 MHz OUTPUT on the Car rier Noise Test Set if difficulties occur in determining the direction to tune the tunable reference to acquire phase lock The signals displayed on the spectrum analyzer represent the frequency difference between the two inputs to an internal mixer phase detector in the Carrier Noise Test Set The signals will decrease in frequency to de when tuning towards phase lock and increase in frequency when tuning away from phase lock Press CAPTURE and tune in this reduced resolution Watch the red LEDS on the Carrier Noise Test Set phase lock indicator step through one side of the display to the green bar then to the other side of the display Again reduce the resolution on the tunable reference by a factor of 10 Tune in this finer resolution until the green LED is illuminated When the green LED is illuminated release CAPTURE Display Deviation Check 24 Ifthe Carrier Noise Test Setis not phase locked perform the phase lock check steps 19 23 25 Hold CAPTURE in and increase the tunable reference in 10 Hz steps until the loop becomes unlocked Watch the phase lock indicator the red LEDs should fully light 3 10 HP 11729C Operation OPERATOR S CHECKS ee ee re es eee ee tea L Re POO re oe ON Lae eae eee OPERATOR S CHECKS cont d Procedure one ata time and move to theright When the last LED is illuminated a
71. m phase lock Figure 3 6 shows what the phase lock indicator on the front panel should be like as the two sources get closer to phase lock Release CAPTURE and the two sources should now be phase locked HP 11729C larger electronic tuning range g Reduce the LOCK BANDWIDTH FAC TOR if close in measurements are desired Make sure the phase lock indicator remains green or stays within the wide section of the indicator Iflockis broken hold CAPTURE in while tuning the tunable 5 1280 MHz source until the center green LED is illuminated on the phase lock indicator When the green LED is illuminated release CAPTURE If the green LED doesn t stay illuminated increase the LOCK BANDWIDTH FACTOR and press CAPTURE to re enable lock For accurate measurements reduce the loop bandwidth to below the lowest offset frequency of interest Use the following equation to find the maxi mum loop bandwidth for the offset frequency of interest NOTE Phase noise is suppressed within the phase lock loop bandwidth Nominal l fant x LBF x K loop bandwidth 2 0 H 100 S f frequency Hz dut device under test LBF LOCK BANDWIDTH FACTOR Ko The VCO slope in Hz volt For the HP 8662A K equals 10 Hz volt When the device under test is a free running source and the loop VCO has a DC FM feature use the following procedure e If the device under test and the tunable 5 1280 MHz source are still not phase
72. n specified limits for each band Equipment Microwave Synthesized Source HP 8340A RF Spectrum Analyzer HP 8566B RF Synthesized Signal Generator HP 8662A RF SYNTHESIZED SIGNAL GENERATOR HP 117290 CARRIER NOISE TEST SET ET nonoonon loo O g GG QOO OOO 8 for B gegeeee oe iF OUTPUT MICROWAVE to 1280 TEST SIGNAL MHz INPUT MICROWAVE SYNTHESIZED RF SPECTRUM ANALYZER SOURCE Figure 4 1 Measurement Frequency Range and IF Gutput Bandwidth and Level Test Set up Procedure 1 Connect the test set up shown in Figure 4 1 2 Set the Carrier Noise Test Set as follows Band Center Frequency 1 92 GHz NOTE If the unit does not contain a filter with this band center frequency select the next available band listed in column 2 of Table 4 1 3 Set the Microwave Synthesized Source D U T as follows Frequency e 2 32 GHz Amplitude watiolews Leos 10 dBm NOTE The frequency corresponds to the microwave test signal shown in Table 4 1 for the band center fre quency selected in step 2 kannn 4 2 HP 11729C Performance Tests PERFORMANCE TESTS MEASUREMENT FREQUENCY RANGE IF OUTPUT BANDWIDTH AND LEVEL PERFORMANCE TESTS cont d Procedure 4 Adjust the RF spectrum analyzer to display the 400 MHz IF OUTPUT cont d NOTE The IF OUTPUT will have the following signals The IF signal the microwave test signal minus the band c
73. nalyzer input sensitivity between calibration and measurement decreases the measurement accuracy For better accuracy recalibrate on a lower level calibration signal See steps 14 18 to recalibrate Select a resolution bandwidth thatis appropri ate for the chosen frequency span at least lt 1 10 frequency span Because phase noise is a random quantity some sort of averaging or video filtering is desired 3 24 22 HP 11729C In general it is not advisable to take mea surements on a portion of the spectrum ana lyzer display where the noise level is falling very rapidly gt 20 dB per major division Therefore increase the frequency span to where the offset frequency of interest is in the center of the spectrum analyzer display It is not recommended to measure noise levels that are in the bottom 10 dB of the display In general if spurious signals are seen when making a measurement they can be dis regarded If necessary reduce the resolution bandwidth to determine the noise level close to the spur With the preceding considerations in mind a measurement can now be made Measure down from the reference point step 18 at the offset of interest Corrections Subtract the reference level set in step 18 from the measured level Sum this result with the following correction factors Minus the carrier to sideband ratio set in step 15 Minus 20 log for 1 kHz dB This formula
74. ncluded is information pertinent to initial inspection power requirememts line voltage selection power cables interconnection environmemt instrument mount ing storage and shipment 2 2 INITIAL INSPECTION To avoid hazardous electrical shock do not perform electrical tests when there are signs of shipping damage to any portion of the outer enclosure covers panels displays Inspect the shipping container for damage Ifthe shipping container or cushioning material is dam aged it should be kept until the contents of the shipment have been checked for completeness and the instrument has been checked mechanically and electrically The contents of the shipment should be as shown in Figure 1 1 Procedures for checking electrical performance are given in Sec tion IV If the contents are incomplete if there is mechanical damage or defect or if the instrument does not pass the electrical performance test not ify the nearest Hewlett Packard office If the ship ping container is damaged or the cushioning material shows signs of stress notify the carrier as well as the Hewlett Packard office Keep the shipping materials for the carrier s inspection 2 3 PREPARATION FOR USE 2 4 Power Requirements The Carrier Noise Test Set requires a power source of 100 120 220 or 240 Vac 5 to 10 48 to 66 Hz single phase Power consumption is 75 VA maximum WARNINGS This is a Safety Class I product that is provided wi
75. nd you tune cont d further the entire indicator should dimly light With CAPTURE pressed decrease the tunable reference in 10 Hz steps The dimly illuminated indicator should change back to the red LEDs one at a time fully illuminated and moving to the left When the last LED on the left is illuminated and you tune further the entire indicator will dimly light 26 When the last LED on the left or right lights and the tunable reference is increased or decreased further the indicator should immediately dimly light Ifthe indicator goes blank perform the phase lock indicator adjustments in Section V AM Mode Check NOTE Perform this check only when the AM Noise Option is installed 27 Set the Carrier Noise Test Set as follows Measurement Mode AM CW All other functions Not used 98 Set the D U T as follows FVEQGUCNON 55 ca 0 RER R braa aa 1 GHz Amplit d aga R dd aR NTR eens 10 dBm 29 AM modulate the microwave test signal at a 1 kHz rate 30 Adjust the spectrum analyzer to view the 1 GHz signal and the 1 kHz AM sidebands 31 Adjust the percent of AM modulation so that the 1 kHz AM sidebands are 40 dB below the 1 GHz carrier approximately a 2 depth 32 Disconnect the microwave test signal from the spectrum analyzer Connect the microwave test signal to the MICROWAVE TEST SIGNALINPUT on the Carrier Noise Test Set 33 Connect the lt 10 MHz OUTPUT on the Carrier Noise Test Set to the
76. ndition causing the Require Service message to be issued will both be true The bits in the Status Byte are latched but can be cleared by 1 Removing the causing condition and 2 reading the Status Byte Status The status bit is used in a parallel poll when enabled and the SRQ Bit line is true The status bit position and the sense of the status bit true high or true low is set by the computer with the parallel poll configure message The Carrier Noise Test Set stops talking and listening T5 TEQ L3 LEO Complete HP IB compatibility as defined in IEEE Standard 488 and the identical ANSI Standard MC1 1 is SH1 AH1 T5 TEO L3 LEO SR1 RL1 PP1 DC1 DTO Co 3 28 HP 11729C Operation HP IB Table 3 4 HP IB Program Codes Alphabetical Order by Code Program AM AM noise measurement Option 130 only Causes the Carrier Noise Test Set to accept the next data byte as a binary mask for the status byte For example ABC SRQ Mask TX XIX XIX 1 1 1 1 X Don t care When position A is set to 1 and the corresponding bit in the status byte becomes 1 then RQS in the status byte and the SRQ line will be 1 Under the preceding condition a serial poll of the status byte will indicate that phase lock has been broken When position B is set to 1 and the corresponding bit in the status byte becomes 1 then RQS in the status byte and the SRQ line will be 1 Under the preceding condition a serial poll of the status
77. ndwidth 100 Hz HP 1740A T Vertical Sensitivity 5 mV div AC Coupled Accuracy 0 2 dBm HP 486A PA Frequency Range 100 MHz to 10 GHz HP 8481A PA Power Range 0 dBm to 15 dBm Input Impedance 500 SWR lt 1 25 Input Frequency Range 400 MHz to 700 MHz HP 11667A Output tracking lt 0 25 dB Input Frequency 10 GHz HP 11667A Output tracking lt 0 25 dB Voltage Output 10 Vde maximum HP 6214B P Frequency Range 1 kHz to 10 MHz HP 8566B OPT Dynamic Range 75 dBm to 0 dBm Resolution Bandwidth 100 Hz and 100 kHz Video Filtering Marker capability Reference Level Control l Video Readout Accuracy 0 5 dB Sensitivity 117 dB a er ne rrr ee EPL A Adjustments O Operator s Checks P Performance Tests T Troubleshooting Commercial Sources Division M A COM South Avenue Burlington MA 01803 1 11 General Information instrument RF Synthesized Signal Generator Termination Waveguide Table 1 4 Recommended Test Equipment 3 of 3 re ee ae Recommended Critical Specifications Model Auxillary 640 MHz Signal HP 8662A Opt 003 Absolute Phase Noise HP 86634 Opt 003 Offset From Level Carrier Hz dBc Hz 1 54 10 84 100 104 ik 121 10k 145 100k 157 1M 57 Level gt 1 dBm to lt 4 dBm Electronic Frequency Control 1 Vde or 10 Vde RF Output Frequency Range 300 MHz to 700 MHz Frequency resolution 10 Hz Amplitude
78. o priate for the chosen frequency span at least lt 1 10 frequency span Because AM noise is a random quantity some sort of averaging or video filtering is desired In general it is not advisable to take mea surements on a portion of the spectrum ana lyzer display where the noise level is falling very rapidly gt 20 dB per major division Therefore increase the frequency span to where the offset frequency of interest is in the center of the spectrum analyzer display It is not recommended to measure noise levels that are in the bottom 10 dB of the display 3 26 16 HP 11729C In general if spurious signals are seen when making a measurement they can be dis regarded If necessary reduce the resolution bandwidth to determine the noise level close to the spur A measurement can now be made Measure down from the reference point set in step 13 at the offset of interest Corrections Subtract the reference level in step 13 from the measured level Sum this result with the following correction factors Minus 40 dB The carrier to sideband ratio set in step 9 Minus 10 log 1 2 x specturm analyzer reso lution bandwidth This is for normalization to a 1 Hz noise equivalent bandwidth The result is in dB Plus 2 5 dB is the correction for log amplifi ers and peak detectors used in an analog spec trum analyzer Below is an example of how to calculate the correct amount o
79. oise Test Set The frequency resolution of the tunable 5 1280 MHz source should be lt 1 10 of 1 7 7 is the time delay caused by the cable connected from the IF OUTPUT to the 5 1280 MHz IN Once quadrature is established adjust the spectrum analyzer to position the 1 kHz FM sideband at the top line on the spectrum analyzer Note the level of the 1 kHz sideband for use later Disconnect the tunable 5 1280 MHz source from the Carrier Noise Test Set Connect the device under test to the MICROWAVE TEST SIGNAL INPUT connector on the Carrier Noise Test Set Select the proper BAND RANGE for the frequency of the signal under test Increase or decrease the length of the delay line or the frequency of the device under test to establish quadrature The frequency resolu tion of the device under test should be lt lt 1 10 of 1 7 When quadrature is set a green LED will be illuminated in the center of the phase lock indicator on the Carrier Noise Test Set Measurement With calibration completed a measurement can now be made When making a phase noise measurement the following items must be taken into consideration The operator should be aware that voltage fluctuations caused by frequency fluctuations are being measured Phase fluctuations are not being measured Set the spectrum analyzer span to cover the offset frequency of interest Do not change the input sensitivity of the spectrum analyzer Changing the spectrum a
80. ominal input impedance of 10k0 The signal input should be from a random noise source a tracking generator or a variable frequency sine wave source The input level is typically less than 0 1 volts peak The typical bandwidth is dc to 100 kHz FREQ CONT X OSC This output is to be con nected to the frequency control input of the tunable 55 1280 MHz source or the device under test whichever is being used as the loop VCO if the loop VCO requires 10 volts de for tuning When so connected the loop VCO will change frequency to maintain phase quadrature between the device under test and the tunable 5 1280 MHz source This is a female BNC connector with an output impedance of 1000 The output level is nominal from 10 volts de to 10 volts de HP IB ADDRESS SWITCH Used to select one of 31 valid HP IB addresses 00 through 30 The address is set in binary with A5 as the most significant bit and Al as the least significant To set a bit bit slide the switch down To clear a bit bit 0 slide the switch up By set ting TALK ONLY TO or LISTEN ONLY LO TO 1 the HP IB address is overriden When the address is changed the Carrier Noise Test Set must be turned off then back on This is necessary so the microprocessor will be aware of the address change SERIAL NUMBER PLATE First four digits and letter constitute the prefix which defines the instrument configuration The last five digits form a sequen
81. op consists of a voltage controlled oscillator the tunable 5 1280 MHz source or the device under test a phase detector and loop filter The phase detector and loop filter are in the Carrier Noise Test Set By changing to a first order loop the bandwidth of the loop is widened By widening the loop bandwidth acquiring phase quadrature is made easier When CAPTURE is pressed the LOCK BANDWIDTH FACTOR buttons are overridden Figure 3 1 Front Panel Features 3 of 3 HP 11729C Operation REAR PANEL FEATURES 1 640 MHz OUT This is a female SMA connec tor with an output impedance of 50 Ohms The output frequency is 640 MHz The output level is 11 13 dBm This output is used to generate an internal 640 MHz signal when connected to the 640 MHz IN connector When this output is not in use it must be terminated with the 50 Ohm termination that was shipped with the Carrier Noise Test Set LOOP TEST PORT IN If a phase noise mea surement is made within the phase lock loop bandwidth some of the phase noise will be sup pressed The LOOP TEST PORT IN connector lets the user input a signal to determine the transfer characteristic of the phase lock loop Once the transfer characteristic is known the amount of noise suppression at any offset within the loop bandwidth can be determined The amount of phase noise suppression is then used to correct the measured phase noise level This is a de coupled female BNC connector with a n
82. owing options may have been ordered and received with the Carrier Noise Test Set If they were not ordered with the original shipment and are now desired they can be ordered from the nearest Hewlett Packard office using the part numbers included in each of the following paragraphs instrument Siide Kit Option 160 The Carrier Noise Test Set can be easily removed from the instrument rack by using the instrument slide kit The part number of the slide kit is HP 1494 0026 Front Handle Kit Option 907 Ease of handling is increased with the front panel handles The Front Handle Kit part number is HP 5061 0088 Rack Flange Kit Option 908 The Carrier Noise Test Set can be solidly mounted to the instrument rack using the flange kit The Rack Flange Kit part number is HP 5061 9674 Rack Flange and Front Handle Combination Kit Option 909 This is a unique part which combines both functions It is not simply a front handle kit and arack flange kit packaged together The Rack Flange and Front Panel Combination Kit part number is HP 5061 9675 1 10 ACCESSORIES SUPPLIED The accessories supplied with the Carrier Noise Test Set are shown in Figure 1 1 a The line power cable is supplied in several configurations depending on the destination of General Information the original shipment Refer to Power Cables in Section IT of this manual b An additional fuse is shipped only with instruments that are factory configured for 10
83. r panel to an electronic frequency control port on either the tunable 5 1280 MHz source or the device under test Either FREQ CONT X OSC or FREQ CONT DC FM can be used to control the voltage con trolled oscillator VCO of the phase lock loop The output chosen will depend on the control voltage required for the VCO FREQ CONT X OSC has an output voltage of 10 volts de to 10 volts dc FREQ CONT DC FM has an output voltage of 1 volt de to 1 volt de When either output is used the device under test and the tunable 5 1280 MHz source will be maintained in phase quadrature thatis 90 degrees out of phase Using a coaxial cable connect the tunable 5 1280 MHz source to the 5 1280 MHz IN con 3 16 10 HP 11729C nector on the front panel Be sure the tunable 5 to 1280 MHz source is set to 0 dBm Using a coaxial cable connect the device under test to the MICROWAVE TEST SIGNAL INPUT on the front panel Using a coaxial cable connect one of the NOISE SPECTRUM OUTPUTS lt 1 MHz or lt 10 MHz on the front panel to a spectrum analyzer The lt 1 MHz OUTPUT is useful for measuring phase noise at offsets from dc to 1 MHz The lt 10 MHz OUTPUT is useful for measuring phase noise at offsets from 10 Hz to 10 MHz and has 40dB of gain over the lt 1 MHz OUTPUT The lt 1 MHz OUTPUT has an out put impedance of 6000 and the lt 10 MHz OUTPUT has an output impedance of 500 NOTE Do not use the lt 10 MHz NOISE SPEC TRUM
84. reference signal dBe Hz chosen Lo absolute SSB phase noise of the 5 to 1280 MHz tunable signal dBc Hz AAA L residual noise of the HP 11729C dBe Hz Frequency 5 1280 MHz Level 0 dBm 1 dB Typically usable to 10 dBm with change in loop bandwidth and system noise floor General Information HP 11729C Table 1 4 Recommended Test Equipment 1 of 3 Recommended instrument Critical Specifications Model Use Amplifier Input Frequency 640 MHz HP 8447E F P Gain 22 dB Noise Figure lt 10 dBm Attenuator i Input Frequency Range 640 MHz to 1 GHz HP 355C P Incremental Attenuation 1 dB steps Maximum attenuation 10 dB Cable RF BNC m to BNC m 9 inches HP 10502A P Cable RF BNC m to BNC m 24 inches HP 11170B OPAT Carrier Noise Test Set Controller Digital Multimeter Function Generator Isolator There isn t any substitute instrument for the HP 11729C D Carrier Noise Test Set Band Range 8 32 GHz to 10 88 GHz IF output bandwidth 400 MHz IF output level 7 dBm Residual Phase Noise Using a 10 GHz Test Signal Offset From Level Carrier Hz dBe Hz 10 90 100 105 1k 115 10k 127 100k 137 1M 137 Minimum controller capability as defined by HP 85B OA IEEE Standard 488 1975 and the identical ANSI Standard MC1 1 SH1 AH1 T4 TEO L2 LEO SRO RL1 PPO DCO DTO and C1 4 26 Input Range 0
85. rrier Noise Test Set and all related docu mentation should be reviewed for familiarization with safety markings and instructions before operation Refer to the Safety Considerations page found at the beginning of this manual for a sum mary of the safety information Safety informa tion for installation operation performance test ing adjustment or service is found in appropriate places throughout this manual 1 4 INSTRUMENTS COVERED BY THiS MANUAL Attached to the rear panel of the instrument is a serial number plate The serial number is in the form 0000A00000 The first four digits and the letter are the serial number prefix The last five digits are the suffix The prefix is the same for identical instruments it changes only when a con figuration change is made to the instrument The suffix however is assigned sequentially and is different for each instrument The contents of this manual apply directly to instruments having the serial number prefix es listed under SERIAL NUMBERS on the title page 1 5 MANUAL CHANGES SUPPLEMENT An instrument manufactured after the printing of this manual may havea serial number prefix that is not listed on the title page This unlisted serial number prefix indicates that the instrument is dif ferent from those documented in this manual The manual for this newer instrument is accompanied by a Manual Changes supplement The supplement contains change information that explains how to
86. rs are not specified for the Carrier Noise Test Set Power line spurs will appear at power line frequencies and multiples of power line frequencies Do not make a phase noise measurement on a spur make the measurement on an average noise level 18 Record the phase noise level C below If the measurement was not madein a 1 Hz resolution bandwidth also record the measurement resolution bandwidth D Repeat this measurement at 100 Hz and 1 kHz offsets Offset from Noise level 6 Resolution Bandwidth D carrier relative to reference level 1081 Hz 19 Calculate the residual phase noise of the Carrier Noise Test Set at 10 kHz 100 kHz and 1 MHz offsets from the carrier Sum the measured phase noise level A and the 4 correction factors listed below The normalization bandwidth factor is deter mined by putting the resolution bandwidth B into the equation below Verify the residual phase noise level did not exceed the specified limit as shown at the bottom of each column For a complete explanation of the correction factors see Appendix A 4 12 HP 11729C Performance Tests PERFORMANCE TESTS RESIDUAL PHASE NOISE PERFORMANCE TEST Using a test signal of 10 GHz cont d Procedure Contd Noise level A relative to refer ence level Normalization to 1 Hz equivalent noise bandwidth 10 log B x 1 2 Calibration Attenuation Step 10 50 dB L D conversion factor 6 dB Correction for
87. set the LINE switch to ON Turn on Sequence The Carrier Noise Test Set per forms a quick memory check ROM and RAM at turn on During this check all front panel annun ciators light for approximately 1 5 seconds to allow a quick visual inspection of each front panel annunciator If a memory failure is detected the front panel annunciators will not light during the 1 5 second time period Following the memory check the Carrier Noise Test Set powers up as follows Measurement CW Band Range Band 1 0 010 1 28 GHz Lock Bandwidth Factor 100 NOTE For the Carrier Noise Test Set to be operational it may require one or both of 3 14 HP 11729C the following drive signals when mak ing a phase noise measurement A synthesized 640 MHz signal A tunable 5 to 1280 MHz signal The drive signals can be supplied by an external RF source or the Carrier Noise Test Set can be configured to provide an internally generated 640 MHz signal that can supply the 640 MHz drive sig nal The absolute system noise floor will be degraded close in to the carrier when using the internally generated 640 MHz signal compared to the 640 MHz signal being supplied by the HP 8662A Syn thesized Signal Generator When using the Carrier Noise Test Set to make an AM noise measurement none of the drive signals are required The number of drive signals required is dependent on the measurement method chosen and the frequency of the s
88. spectrum analyzer 34 Adjust the spectrum analyzer to view the 1 kHz detected signal AM MODE is operating if the 1 kHz signal level is 7 dBm 3 dBm HP IB Address Verificaiion 35 Press and hold the front panel LOCAL key The LED s on the BAND RANGE select buttons will display the current address in binary 36 Check the address switch setting on the rear panel of the Carrier Noise Test Set to verify the display on the BAND RANGE select buttons is correct Operation HP 11729C OPERATOR S CHECKS iit i a a a a L OPERATOR S CHECKS cont d Procedure cont d Local Remote Operation Check 37 Set the Carrier Noise Test Set to remote using the following Remote 706 38 Press any front panel key except LOCAL to verify that the front panel keys are disabled 39 Press the LOCAL key This switches the instrument out of the remote mode NOTE When the local key is pressed the REMOTE annunciator will turn off but the LISTEN annunciator will stay illuminated Now press any front panel key to verify the front panel keys are enabled Status Byte Check 40 Enter Program 1 into the computer Insert the correct select code and HP IB address for your Carrier Noise Test Set into the SPOLL function The HP IB address of the Carrier Noise Test Set is factory preset to 06 The user can select the HP IB address by changing the position of the HP IB address switches on the rear panel of the Carrier Noise Test Set Refer to Sec
89. ssdaxdivectacixcsseade HP 436A Power Sensor ra Ka R 0 0 se e basani HD 8481A The isolator stabilizes load effects on the AM noise floor When an isolator is not available an attenuator pad may be used The attenuator pad may be used only if the output power of the oscillator is 10 dBm with the attenuator pad in place If the measured power is 10 dBm or lower an isolator will have to be used See step 5 of the test procedure Procedure Calibration 1 Connect the equipment as shown in Figure 4 4 2 Connect 10 Vde from the power supply to the low noise oscillator Warm up the oscillator for 30 minutes 4 14 HP 11729C Performance Tests PERFORMANCE TESTS _ AM NOISE FLOOR PERFORMANCE TEST cont d GENERATOR Procedure cont d RF SPECTRUM ANALYZER MICROWAVE SYNTHESIZED SOURCE HP 11729C CARRIER NOISE TEST SET K S I o E onaso Jen O PP INPUT lt 10 7 MICROWAVE FUNCTION MODULATION OUTPUT TEST SIGNAL STEP 10 INPUT i STEP 8 i WAVEGUIDE POWER TO COAXIAL SUPPLY OSCILLATOR ADAPTER Figure 4 4 AM Noise Floor Test Set up 3 Set the Microwave Synthesized Source as follows Frequency 6 SRC R oo ena tie 1 GHz AM modulation ccec eves 50 4 Set the function generator as follows RTT TTT sinewave Frequency lt x x K e eR ee 100 kHz 5 Set the Carrier Noise Test Set as follows Measurement Mode AM CW All other controls Any sett
90. t the phase lock indica tor on the front panel should be like as the two sources get closer to phase lock Release CAPTURE and the two sources should now be phase locked A solid red bar to the left of the center green bar indicates the signal under test and the tuna ble 5 1280 MHz signal are not phase locked and gt gt 100 kHz apart am op The red LEDs within the display step one at a time as the signal under test and the tunable 5 1280 MHz signal ap proach quadrature HP 11729C If the sources drift out of phase lock repeat the procedure then after releasing CAPTURE immediately increase the FM deviation to 100 kHz Again be sure the two sources stay phase locked k If the two sources are still not phase locked repeat the preceeding step each time increasing the FM deviation until maximum deviation is reached If maximum deviation is reached and the two sources still will not stay locked repeat step j but this time increase the LOCK BANDWIDTH FACTOR until the two sources are phase locked When the two sour ces are phase locked go to step m 1 If the two sources are still not locked try making the measurement using the Frequency Discriminator Method m Reduce the LOCK BANDWIDTH FAC TORifclose in measurements are desired Make sure the phase lock indicator remains green or stays within the wide section of the indicator With the display all iHumi nated the signal under test and the
91. table from the front panel local or by using the Hewlett Packard Interface Bus remote The Carrier Noise Test Set is compatible with HP IB to the extent indicated by the following codes SH1 AH1 T5 TEO L3 LEO SR1 RL PP1 DC1 DTO and CO The Carrier Noise Test Set interfaces with the bus via three state TTL circuitry An explanation of the compatibility code can be found in IEEE Standard 488 1978 IEEE Standard Digital Interface for Programmable Instrumenta tion or the identical ANSI Standard MC1 1 1 7 OPTIONS 1 8 Electrical Options Option 003 Option 003 has two bands installed 10 MHz to 1 28 GHz and 1 28 GHz to 3 2 GHz Option 007 Option 007 has two bands installed 10 MHz to 1 28 GHz and 3 2 GHz to 5 76 GHz HP 11729C Elecirical Options cont d Option 011 Option 011 has two bands installed 10 MHz to 1 28 GHz and 5 76 GHz to 8 32 GHz Option 015 Option 015 has two bands installed 10 MHz to 1 28 GHz and 8 32 GHz to 10 88 GHz Option 019 Option 019 has two bands installed 10 MHz to 1 28 GHz and 10 88 GHz to 13 44 GHz Option 023 Option 023 has two bands installed 10 MHz to 1 28 GHz and 13 44 GHz to 16 00 GHz Option 027 Option 027 has two bands installed 10 MHz to 1 28 GHz and 16 00 GHz to 18 00 GHz Option 130 Option 130 adds AM noise measure ment capabilities Option 140 Option 140 places all front panel con nectors on the rear panel 1 9 Mechanical Options The foll
92. th a protective earth termi nal An uninterruptible safety earth ground must be provided from the main 2 8 2 6 power source to the product input wiring terminals through the power cord or supplied power cord set Whenever it is likely that the protection has been im paired the product must be made tnop erative and be secured against any unin tended operation If this instrument is to be energized via an external autotransformer make sure the autotransformer s common terminal is connected to the neutral that is the grounded side of the mains supply Line Voltage and Fuse Seiection CAUTION BEFORE PLUGGING THIS INSTRU MENT into the mains line voltage be sure the correct voltage and fuse have been selected Verify that the line voltage selection card and the fuse are matched to the power source Refer to Figure 2 1 Line Voltage and Fuse Selection Fuses may be ordered under HP part numbers 2110 0001 1 0A 250 V for 100 120 Vac operation and 2110 0012 0 5A 250 V for 220 240 Vac operation Power Cabies WARNING BEFORE CONNECTING THIS IN STRUMENT the protective earth ter minal of this instrument must be con nected to the protective conductor of the mains power cord The mains plug shall only be inserted in a socket outlet provided with a protective earth con tact The protective action must not be negated by the use of an extension cord power cable without a protect
93. that is 90 degrees out of phase with the microwave test signal The IF OUTPUT is connected to this input through a delay line for the Frequency Discriminator Method of making a phase noise measurement MICROWAVE TEST SIGNAL INPUT This is a female type N connector with a 500 input impedance This connector is used to connect the microwave test signal to the Carrier Noise Test Set The input frequency range is 10 MHz to 18 GHz The input level should be as follows For test frequencies gt 1 28 GHz 7 dBm to 20 dBm Typically usable down to 15 dBm with potential noise floor degradation The optimal level is 7 dBm to 20 dBm For test frequencies lt 1 28 GHz 5 dBm to 10 dBm Typically usable down to 15 dBm with potential noise floor degradation The optimal level is from 2 dBm to 3 dBm NOISE SPECTRUM lt 10 MHz OUTPUT This is a female BNC connector with an output impe dance of 500 and 40 dB of gain over the lt 1 MHz OUTPUT This output is useful for measuring the phase noise or amplitude AM noise of the device under test at offsets from the carrier of 10 Hz to 10 MHz The signal output is a de level that is directly proportionai to the phase difference between the microwave test signal and the tunable 5 1280 MHz signal The de level has ac fluctuations 10 11 12 13 14 that are directly proportional to the phase noise of the microwave test signal if the phase noise of the 640 MH
94. the require ments of CE03 and REO2 as called out in MIL STD 461 and within the requirements of VDE 0871 and CISPR Publication 11 for ordering cabinet accessories the module sizes are 3 1 2H 1MW module width 20D The Hewlett Packard Interface Bus HP IB is Hewlett Packard s implementation of IEEE STD 488 1978 Digital Interface for Programmable Instrumentation All front panel functions with the exception of the line switch are HP IB programmable 1 5 General Information HP 11729C Table 1 2 Supplemental Characteristics 1 of 2 Supplemental characteristics are intended to provide information useful in applying the instrument by giving typical but non warranted performance parameters TEST SIGNAL Lavel For test signals gt 1 28 GHz 7 dBm to 20 dBm Typically useable down to 15 dBm with potential noise floor degradation For test frequencies lt 1 28 GHz 5 dBm to 10 dBm Typically usable down to 15 dBm with potential noise floor degradation optimal level from 2 dBm to 3 dBm IF OUTPUT Typically useable to 1500 MHz dependent on the test frequency NOISE SPECTRUM OUTPUTS lt 10 MHz Ouiput The lt 10 MHz Output is amplified by an internal 40 dB Low Noise Amplifier Bandwidth 10 Hz to 10 MHz 8 dB BW 10 Hz to 15 MHz typical Flatness 1 dB typical 50 Hz to 10 MHz Duin impedanes 500 nominal lt 1 MHz Output The lt 1 MHz Output is anon amplified output Bandwidth de
95. tial suffix that is unique to each instrument The plate also indicates any options supplied with the instrument PULSED BASEBAND These connectors are used when making a pulsed measurement The Figure 3 2 Rear Panel Features 1 of 2 3 5 Operation 3 6 HP 11729C REAR PANEL FEATURES user connects a filter between the input and out put to filter the pulse repetition frequency off the carrier The filter chosen is dependent on the pulse repetition frequency of the carrier The design of the filter must be such that the pulse repetition frequency and its multiples are termi nated into 50 Ohms FUSE Ordering information is presented in Section II Installation LINE POWER MODULE Permits operation from 100 120 220 or 240 Vac The number visible in the window indicates nominal line voltage to which the instrument must be connected see Figure 2 1 Center conductor is connected to the chassis for earth grounding HP 1B CONNECTOR 24 pin female connector used to connect the Carrier Noise Test Set to the Hewlett Packard Interface Bus HP IB for remote operation Connection information is presented in Section II Installation FREQ CONT DC FM This output is to be con nected to the frequency control input of the tunable 5 1280 MHz source or the device under test whichever is being used as the loop VCO if the loop VCO requires 1 volt de for tuning When so connected the loop VCO will change frequency to m
96. tion II paragraph 2 7 HP IB Address Selection for further information PROGRAM 1 10 A SPOLL G Current Carrier Noise Test Set select code 20 DISP A and address 30 GOTO 10 Example 706 7 Select code 06 Address This program monitors the status byte of the Carrier Noise Test Set and displays the equivalent decimal value on the computer The status of the phase lock detector sent out over HP IB should agree with the phase lock indicator on the front panel Table 3 2 defines the status bits and their decimal equivalents for the two phase lock conditions Table 3 2 Status Bits and Their Decimal Equivalents for Two Phase Lock Conditions Phase Status Bits Binary panis Condition DIOG DIO7 D106 DIOS pos p03 02 ETE Guiput ti i 0 0 4 1 0 2 unlocked locked green Bar If no other bits are logical one 3 12 HP 11729C Operation OPERATOR S CHECKS errr eT a Shiite TSS OPERATOR S CHECKS contr Procedure l contd 42 43 Set the Carrier Noise Test Set to the phase lock condition green LED is illuminated on the front panel phase lock display For help use the phase lock check steps 19 28 Run Program 1 and compare the number displayed on the computer to the phase condition of the phase lock indicator on the Carrier Noise Test Set The computer displays a decimal 2 when in the phase lock condition Increase the frequency of the tunable ref
97. tive to reference level dB Hz 10 Hz 100 Hz 1 kHz 16 Calculate the Carrier Noise Test Set s residual phase noise at 10 kHz 100 kHz and 1 MHz offsets from the carrier Sum the measured noise level A and the 4 correction factors as shown below The normalization bandwidth factor is determined by putting the resolution bandwidth B into the equation below Verify the residual phase noise level did not exceed the specified limit as shown at the bottom of each column For a complete explanation of the correction factors see Appendix A 4 7 Performance Tests HP 11729C PERFORMANCE TESTS RESIDUAL PHASE NOISE PERFORMANCE TEST Using a test signal less than 1280 MHz cont d Procedure cont d Noise level A relative to refer ence level Normalization to 1 Hz equivalent noise bandwidth 10 log B x 1 2 Calibration Attenuation Step 7 D conversion factor Correction for log amplifiers and peak detectors in analog spec trum analyzers 2 5 dB 2 5 dB Total dBe Hz Refer to Application Note 150 4 HP 5952 1147 if additional information on calibration of spectrum analyzers for noise measurements is needed 17 Calculate the Carrier Noise Test Set s residual phase noise at 10 Hz 100 Hz and 1 kHz offsets from the carrier Sum the measured noise level C and the 3 correction factors as shown below Do not add the normalization to 1 Hz equivalent noise b
98. to 1 MHz 8 dB BW de to 1 5 MHz typical Flatness 1 dB typical Quiput impedance 6000 nominal Auxiliary Neise Output impedance 6000 nominal Bandwidth de to 1 MHz typical PHASE LOCK LOOP FUNCTION FREQUENCY CONTROL OUTPUTS Freq Cont X Osc Output level 10V nominal Nominal Output impedance 1000 Freg Cont 0C FM Output level 1V nominal Nominal Output impedance 500 Lock Bandwidth Factor 1 10 100 1k 10k nominal Selec table by front panel pushbuttons Loop characteristics dependent on method of phase lock crystal or DC FM used and loop VCO chosen Loop Characteristics when using the HP 8662A Elec 1 6 tronic Frequency Control input for phase locking with the HP 8662A front panel output at 0 dBm Loop Holding Range LHR faut 10 Loop Bandwidth LBW HP 11729C LBF x Laut 19 os Loop Bandwidth Maximum 2 kHz typical Hz nominal Hz nominal f frequency dut Device under test LBE Lock Bandwith Factor set on HP 11729C Loop Characteristics when using the HP 8662A dc FM modulation input for phase locking with the HP 8662A front panel output at 0 dBm Losp Holding Range LHR FM deviation set on HP 8662A Hz nominal Loop Bandwidth LBW HP 8662A FPD x HP 11729C LBF nom _ Hz 10 nom Loop Bandwidth Maximum 100 kHz typical LBF Lock Bandwidth Factor set on HP 11729C FPD Front Panel Deviation LOOP TEST PORTS Loop Test input Source random noise sour
99. to 15 Vde HP 3468A AT Accuracy 1 mVde Frequency 1 kHz HP 3312A P Function sinewave Amplitude 500 mVde to 5 Vde DC Offset Capability Power Input level 15 dBm HP 0955 0178 Frequency Input 10 GHz S Sacre ae A Adjustments O Operator s Checks P Performance Tests T Troubleshooting This Carrier Noise Test Set must contain a Band Range that is included in the Carrier Noise Test Set under test Under certain conditions an attenuator can be used in place of the isolator For more information see the AM Noise Floor Performance Test in Section IV HP 11729C instrument Low Frequency Spectrum Analyzer Low Noise Oscillator Microwave Synthesized Source Oscilloscope Power Meter Power Sensor Power Splitter Power Splitter Power Supply RF Spectrum Analyzer General Information Table 1 4 Recommended Test Equipment 2 of 3 Critical Specifications Recommended Model Frequency Range 0 Hz to 1 kHz HP 3582A Measurement Range 75 dBm to 0 dBm HP 3561A Resolution Bandwidth 30 MHz Video Averaging Video Readout Accuracy 0 5 dB One Frequency between 5 MHz and 18 GHz MA 86651A Amplitude 10 dBm M A Com AM noise Offset From Level Carrier Hz dBc Hz 100k lt 155 1M lt 160 Frequency Range 2 GHz to 10 GHz HP 8340A OPAT Amplitude gt 10 dBm HP 8673B Short term Frequency stability 1 part in 10 External AM Modulation capability Ba
100. trum analyzer Figure 3 4 Interconnections to the Carrier Noise Test Set when making a Phase Noise Measurement Using the Phase Detector Method Phase Detector Method cont d Each configuration will have a different absolute system noise floor The absolute system noise floor is a function of the noise contributions from the 640 MHz signal 5 1280 MHz signal and the HP 11729C To calculate the absolute system noise floor use the following formula L L L system 10 log N X 10 109 10 where l N center frequency of selected filter 640 MHz absolute SSB phase noise of the 640 Two synthesized sources with their crystal time bases connected externally will give the lowest close in noise floor performance When a synthesized source and a cavity tuned source are used the 640 MHz signal should come from the synthesized source A synthesized source is desired for the 640 MHz signal since the 640 MHz signal mul tiplied to a microwave frequency is the major contributor to the system noise floor If the cavity tuned source selected has a wide DC FM bandwidth and Loop Holding Range this will help to phase lock a drifting source If two cavity tuned sources are used the absolute system noise floor close in will be degraded but the noise floor further out will be better Figure 3 4 shows the interconnections to the Carrier Noise Test Set when making a phase noise measurement MHz reference signal dBe Hz
101. ts The results recorded at incoming inspection can be used for comparison in periodic maintenance and trouble shooting and after repairs or adjustments 4 4 CALIBRATION CYCLE This instrument requires periodic verification of performance Depending on the use and environ mental conditions the instrument should be checked using the following performance tests at least once every year PERFORMANCE TESTS 4 5 MEASUREMENT FREQUENCY RANGE IF OUTPUT BANDWIDTH AND LEVEL PEFORMANCE TESTS Specifications Electrical Characteristics TEST SIGNAL Frequency Range Band Center Frequencies f H iF QUTPUT Bandwidth Level Performance Limits 10 MHz to 18 GHz 5 MHz to 1280 MHz 7 dBm Minimum Frequency range covered in eight bands excluding 5 MHz around band center frequencies Conditions External low pass filter ing may be required for test signals lt 20 MHz and 20 MHz around band centers 1 92 GHz 4 48 GHz 7 04 GHz 9 60 GHz 12 16 GHz 14 72 GHz 17 48 GHz Performance Tests HP 11729C PERFORMANCE TESTS r MEASUREMENT FREQUENCY RANGE IF OUTPUT BANDWIDTH AND LEVEL PERFORMANCE TEST cont d Description This test verifies the frequency range of the Carrier Noise Test Set A microwave test signal is input to the Carrier Noise Test Set for each BAND RANGE then the down converted IF OUTPUT is measured on a spectrum analyzer The IF OUTPUT level is verified to be withi
102. tunable 5 1280MHz signal are lt lt 100 kHz apart con Z j A green LED in the cen ter of the dispiay indi cates that the signal under test and the tuna ble 5 1280 MHz signal are in quadrature Figure 3 6 Front Panel Phase Lock Quadrature indicator HP 11729C Phase Detector Method cont d If lock is broken hold CAPTURE in while tuning the tunable 5 1280 MHz source until the center green LED is illuminated on the phase lock indicator When the green LED is illuminated release CAPTURE If the green LED doesn t stay illuminated increase the LOCK BANDWIDTH FACTOR and press CAPTURE to re enable lock For accurate measurements reduce the loop bandwidth to below the lowest offset frequency of interest Use the following equation to find the maxi mum loop bandwidth for the offset frequency of interest NOTE Phase noise is suppressed within the phase lock loop bandwidth Nominal loop bandwidth fau x LBF x Ko 100 f Frequency H2 dut Device under test LBF Lock Bandwidth Factor K The VCO slope in Hz volt For the HP 8662A K equals 107 Hz volt 16 Measurement With the spectrum analyzer cal ibrated and phase lock acquired a phase noise measurement may now be made When mak ing a phase noise measurement the following items must be taken into consideration Set the spectrum analyzer span to cover the offset frequency of interest Do not change the input sensitivity of the
103. will include the IF signal signal under test minus the BAND CENTER fre quency of the BAND RANGE chosen IF harmonics and spurious signals The signal with the highest amplitude is the desired signal Note the frequency for use later Disconnect the IF OUTPUT from the spectrum analyzer Connect a suitable delay line such as a length of flexible RF cable between the IF OUTPUT and the 5 1280 MHz INPUT on the front panel The length of delay line effects the sen sitivity of the descriminator In general sensi tivity increases with cable length 1 5 ns foot is the approximate amount of delay for flexi ble RF cable when the cable dielectric is Teflon Set the tunable 5 1280 MHz source to the following conditions Frequency Same as measured in step 11 Amplitude 10 dBm Modulation FM 1 kHz rate 14 15 16 T Operation Connect the tunable 5 1280 MHz signal to the input of the spectrum analyzer Set the FM sidebands on the tunable 5 1280 MHz signal to a convenient carrier to sideband ratio The ratio should be at least 20 dB ata 0 2 kHz rate Note the difference between the car rier and sidebands for use later Disconnect the device under test from the Carrier Noise Test Set and the tunable 5 1280 MHz source from the spectrum analyzer Con nect the tunable 5 to 1280 MHz source to the MICROWAVE TEST SIGNAL INPUT con nector on the Carrier Noise Test Set Enable the 0 010 1 28 GHz BAND RANGE
104. z Output Level dacs tae needa cease 0dBm 6 Set both Carrier Noise Test Sets as follows Band Center Frequency 9 6 GHz Lock Bandwidth Factor 1 Measurement Mode d CW 4 10 HP 11729C Performance Tests PERFORMANCE TESTS RESIDUAL PHASE NOISE PERFORMANCE TEST Using a test signal of 10 GHz cont d Procedure Power Level Checks cont d 7 Disconnect the cable which goes to the 640 MHz IN connector on the rear panel of the Carrier Noise Test Set device under test Connect the power sensor to this cable Adjust the step attenuator that is located before the power splitter supplying the 640 MHz signal such that the power meter reads between 0 dBm and 3 dBm Reconnect the cable to the 640 MHz INPUT on the rear panel of Carrier Noise Test Set device under test 8 Disconnect the end of cable A which is connected to the 5 1280 MHz INPUT on the Carrier Noise Test Set device under test Connect the cable to a power sensor Measure the IF OUTPUT power Adjust the 1 dB step attenuator located after the IF OUTPUT of the reference Carrier Noise Test Set until the power meter reads i dBm to 0 dBm Record the exact power meter reading below Reference Carrier Noise Test Set IF OUTPUT power lt dBm Spectrum Analyzer Calibration 9 Disconnect cable A from the power sensor Connect the cable from the tunable reference output to the power sensor Adjust the amplitude of the tunable reference unt
105. z TEST SIGNAL GENERATOR TUNABLE ee REFERENCE RF SPECTRUM ANALYZER STEPS 4 10 MICROWAVE SYNTHESIZED SOURCE D U T lt 10 MHz OUTPUT STEPS 19 23 AND 33 34 RF TPUT STEPS 4 29 and 32 34 Gee J J STEPS 30 31 S Figure 3 3 Basic Functional Checks Test Setup Equipment RF Synthesized Signal Generator HP 8662A tunable reference Option 003 Microwave Synthesized Source HP 8340A D U T Computer Controller HP 85B RF Spectrum Analyzer HP 8566B Procedure Microprocessor Checks 1 Turn on and warm up all instruments for 30 minutes before proceeding 2 Switch the Carrier Noise Test Set to ON and observe the front panel annunciators An internal memory check of ROM and RAM is initiated when the Carrier Noise Test Set is switched on If the memory system is working properly all front panel annunciators will light for approximately 1 5 seconds This also provides a quick visual inspection of each front panel annunciator If memory failure is detected no front panel annunciators will light during the 1 5 second time period 3 7 Operation HP 11729C OPERATOR S CHECKS 3 6 OPERATOR S CHECKS cont d Procedure 3 Press the FILTER RANGE buttons and MEASUREMENT MODE button The contd clicking sound verifies the switching control of the microprocessor and the switch operation IF OUTPUT Check Using an external source to supply the 640 MHz signal 4 Set
106. z VBW 300 kHz SWP 20 0 msec RES BW 100 kHz VBW 300 kHz SWP 20 0 msec The 5 to 1280 MHz source and device under test are The 5 to 1280 MHz source and device under test are 5 MHz from phase lock quadrature 2 5 MHz from phase iock quadrature REE 30 0dBm ATTEN 40 dB REF 30 0dBm ATTEN 40cB HP HP 10 dB 10 dB i l lT HE START 5 0 MHz STOP 25 0 MHz START 0 Hz STOP 10 0 MHz RES BW 100 kHz VBW 300 kHz SWP 20 0 msec RES BW 100 kHz VBW300 kHz SWP 20 0 msec The 5 to 1280 MHz source and device under test are The 5 to 1280 MHz source and device undee test are 1 25 MHz from phase lock quadrature close to phase lock quadrature Figure 3 5 Spectrum Analyzer Displays Used for Acquiring Phase Lock Quadrature 3 19 Operation Phase Detector Method cont d 3 20 includes 10 Hz to 10 MHz Adjust the spectrum analyzer to view the beat note The beat noteis the difference between the tunable 5 1280 MHz signal and the microwave test signal minus the BAND CENTER frequency of the BAND RANGE chosen Hold CAPTURE in while tuning the loop VCO until a green LED is seen in the center of the phase lock indicator The frequency resolution of the loop VCO should be lt 1 10 of the effec tive tuning range of it s crystal oscillator Figure 3 5 shows what the spectrum analyzer display should lock like if the loop VCO is being tuned in the direction of phase lock that is towards dc or tuned away from phase lock Figure 3 6 shows wha
107. z signal and the tunable 5 1280 MHz signal is less than the microwave test signal NOTE The bandwidth 10 Hz to 10 MHz is not completely flat The 3 dB points are at 10 Hz and 15 MHz iF OUTPUT 5 1280 MHz This is a female BNC connector with an output impedance of 500 The output frequency will be 5 to 1280 MHz The exact frequency is the intermediate differ ence frequency IF from the mixing of the mic rowave test signal and the BAND CENTER fre quency of the BAND RANGE chosen The output level is 7 dBm minimum 50 OHM TERMINATION With the 500 termi nation connected to the F OUTPUT the Carrier Noise Test Set meets the requirements of MIL STD 461 REO2 The IF OUTPUT is fully useable just replace the 50 Ohm termination when the IF OUTPUT is not being used HP IB ANNUNCIATORS Display the HP IB status The REMOTE RMT annunciator lights when the Carrier Noise Test Set is in the remote mode The TALK TLK annunciator lights when the Carrier Noise Test Set is addressed to talk The LISTEN LSN annunciator lights when the Carrier Noise Test Set is addressed to listen The SRQ annunciator lights when the Carrier Noise Test Set is sending a Require Service mes sage to the controller LOCAL Returns the Carrier Noise Test Set to local operation front panel control from remote HP IB control provided that the instrument is not in Local Lockout BAL This adjustment is used when making a measurement on a pulsed signal

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