Transcend 256MB DDR333 Unbuffer Non-ECC Memory
Contents
1. 03 VSS 49 CB2 95 DQ5 141 A10 04 DQ1 50 VSS 96 VDDQ 142 CB6 05 DQS0 51 CB3 97 DM0 143 VDDQ 06 DQ2 52 BA1 98 DQ6 144 CB7 07 VDD 53 DQ32 99 DQ7 145 VSS 08 DQ3 54 VDDQ 100 VSS 146 DQ36 09 NC 55 DQ33 101 NC 147 DQ37 10 NC 56 DQS4 102 NC 148 VDD 11 VSS 57 DQ34 103 NC 149 DM4 12 DQ8 58 VSS 104 VDDQ 150 DQ38 13 DQ9 59 BA0 105 DQ12 151 DQ39 14 DQS1 60 DQ35 106 DQ13 152 VSS 15 VDDQ 61 DQ40 107 DM1 153 DQ44 16 CK1 62 VDDQ 108 VDD 154 RAS 17 CK1 63 WE 109 DQ14 155 DQ45 18 VSS 64 DQ41 110 DQ15 156 VDDQ 19 DQ10 65 CAS 111 CKE1 157 CS0 20 DQ11 66 VSS 112 VDDQ 158 CS1 21 CKE0 67 DQS5 113 NC 159 DM5 22 VDDQ 68 DQ42 114 DQ20 160 VSS 23 DQ16 69 DQ43 115 A12 161 DQ46 24 DQ17 70 VDD 116 VSS 162 DQ47 25 DQS2 71 NC 117 DQ21 163 NC 26 VSS 72 DQ48 118 A11 164 VDDQ 27 A9 73 DQ49 119 DM2 165 DQ52 28 DQ18 74 VSS 120 VDD 166 DQ53 29 A7 75 CK2 121 DQ22 167 NC 30 VDDQ 76 CK2 122 A8 168 VDD 31 DQ19 77 VDDQ 123 DQ23 169 DM6 32 A5 78 DQS6 124 VSS 170 DQ54 33 DQ24 79 DQ50 125 A6 171 DQ55 34 VSS 80 DQ51 126 DQ28 172 VDDQ 35 DQ25 81 VSS 127 DQ29 173 NC 36 DQS3 82 NC 128 VDDQ 174 DQ60 37 A4 83 DQ56 129 DM3 175 DQ61 38 VDD 84 DQ57 130 A3 1762. Byte No Function Described Standard Specification Vendor Part 0 of Bytes Written into Serial Memory 128bytes 80 1 Total of Bytes of S P D Memory 256bytes 08 2 Fundamental Memory Type DDR SDRAM 07 3 of Row Addresses on this Assembly 13 0D 4 of Column Addresses on this Assembly 10 0A 5 of Module Rows on this Assembly 1 bank 01 6 Data Width of this Assembly 64bits 40 7 Data Width of this Assembly 0 00 8 VDDQ and Interface Standard of this Assembly SSTL 2 5V 04 9 DDR SDRAM Cycle Time at CAS Latency 2 5 6ns 60 10 DDR SDRAM Access Time from Clock at CL 2 5 0 7ns 70 11 DIMM configuration type non parity Parity ECC Non ECC 00 12 Refresh Rate Type 7 8us Self Refresh 82 13 Primary DDR SDRAM Width X8 08 14 Error Checking DDR SDRAM Width 00 15 Min Clock Delay for Back to Back Random Column Address tCCD 1CLK 01 16 Burst Lengths Supported 2 4 8 0E 17 of banks on each DDR SDRAM device 4 bank 04 18 CAS Latency supported 2 2 5 0C 19 CS Latency 0 CLK 01 20 WE Latency 1 CLK 02 21 DDR SDRAM Module Attributes Differential Clock Input 20 22 DDR SDRAM Device Attributes General 0 2V voltage tolerance 00 23 DDR SDRAM Cycle Time CL 2 0 7 5ns 75 24 DDR SDRAM Access from Clock CL 2 0 0 7ns 70 25 DDR SDRAM Cycle Time CL 1 5 00 26 DDR SDRAM Access from Clock CL 1 5 00 27 Minimum Row Precharge Time tR
3. with tRCD satisfied after this command Transcend Information Inc 8 TTTSSS333222M MMLLLD DD666444VVV333FFFIII 184PIN DDR333 Unbuffered DIMM 256MB With 32Mx8 CL2 5 SIMPLIFIED TRUTH TABLE V Valid X Don t Care H Logic High L Logic Low COMMAND CKEn 1 CKEn CS RAS CAS WE BA0 1 A10 AP A0 A9 A11 A12 Note Register Extended Mode Register Set H X L L L L OP CODE 1 2 Register Mode Register Set H X L L L L OP CODE 1 2 Auto Refresh H 3 Entry H L L L L H X 3 L H H H 3 Refresh Self Refresh Exit L H H X X X X 3 Bank Active amp Row Addr H X L L H H V Row Address Auto Precharge Disable L 4 Read amp Column Address Auto Precharge Enable H X L H L H V H Column Address A0 A9 4 5 Auto Precharge Disable L 4 Write amp Column Address Auto Precharge Enable H X L H L L V H Column Address A0 A9 4 5 Burst Stop H X L H H L X 6 Bank Selection V L Precharge All Banks H X L L H L X H X H X X X Entry H L L V V V Active Power Down Exit L H X X X X X H X X X Entry H L L H H H H X X X Precharge Power Down Mode Exit L H L V V V X DM H X X 7 H X X X No Operation Command H X L H H H X Note 1 OP Code Operand Code A0 A12 amp BA0 BA1 Program keys EMRS MRS 2 EMRS MRS can be issued only a
4. CK rising setup time tDSS 0 2 tCK DQS falling edge from CK rising hold time tDSH 0 2 tCK DQS in high level width tDQSH 0 35 tCK DQS in low level width tDQSL 0 35 tCK DQS in cycle time tDSC 0 9 1 1 tCK Address and Control input setup time tIS 0 75 ns Address and Control input hold time tIH 0 75 ns Data out high impedance time from CK CK tHZ 0 7 0 7 ns Data out low impedance time from CK CK tLZ 0 7 0 7 ns Mode register set cycle time tMRD 12 ns DQ amp DM setup time to DQS tDS 0 45 ns DQ amp DM hold time to DQS tDH 0 45 ns DQ amp DM input pulse width tDIPW 1 75 ns Exit self refresh to non read command tXSNR 75 ns 4 Exit self refresh to read command tXSRD 200 tCK Refresh interval time tREF 7 8 us 1 Clock half period tHP tCLmin or tCHmin ns DQS write postamble time tWPST tRCD or tRAS min tCK 3 Note 1 Maximum burst refresh of 8 2 The specific requirement is that DQS be valid High or Low on or before this CK edge The case shown DQS going from High_Z to logic Low applies when no writes were previously in progress on the bus If a previous write was in progress DQS could be High at this time depending on tDQSS 3 The Maximum limit for this parameter is not a device limit The device will operate with a great value for this parameter but system performance bus turnaround will degrade accordingly 4 A write command can be applied
5. MMLLLD DD666444VVV333FFFIII 184PIN DDR333 Unbuffered DIMM 256MB With 32Mx8 CL2 5 AC OPERATING CONDITIONS Parameter Symbol Min Max Unit Input High Logic 1 Voltage DQ DQS and DM signals VIH AC VREF 0 31 V Input Low Logic 0 Voltage DQ DQS and DM signals VIL AC VREF 0 31 V Input Differential Voltage CK and CK inputs VID AC 0 7 VDDQ 0 6 V Input Crossing Point Voltage CK and CK inputs VIX AC 0 5 VDDQ 0 2 0 5 VDDQ 0 2 V Note 1 VIH max 4 2V The overshoot voltage duration is lt 3ns at VDD 2 VIL min 1 5V The undershoot voltage duration is lt 3ns at VSS 3 VID is the magnitude of the difference between the input level on CK and the input on CK 4 The Value of VIX is expected to equal 0 5 VDDQ of the transmitting device and must track variations in the DC level of the same AC OPERATING TEST CONDITIONS VDD 2 5 VDDQ 2 5 TA 0 to 70 C Parameter Value Unit Note Input reference voltage for Clock 0 5 VDDQ V Input signal maximum peak swing 1 5 V Input Levels VIH VIL VREF 0 31 VREF 0 31 V Input timing measurement reference level VREF V Output timing measurement reference level Vtt V Output load condition See Load Circuit ZO 50ohm VTT 0 5 VDDQ RT 50ohm CLOAD 30pF Output Output Load circuit VREF 0 5 VDDQ INPUT OUTPUT CAPACITANCE VDD 2 5V VDDQ 2 5V TA 25 C f 1MHz Parameter Symbol Min Max Unit Input capacitanc
6. P 18ns 48 28 Minimum Row Active to Row Activate delay tRRD 12ns 30 29 Minimum RAS to CAS Delay tRCD 18ns 48 30 Minimum active to Precharge time tRAS 42ns 2A 31 Module ROW density 256MB 40 32 Command Address Input Setup Time 0 8ns 80 33 Command Address Input Hold Time 0 8ns 80 34 Data Signal Input Setup Time 0 45ns 45 35 Data Signal Input Hold Time 0 45ns 45 36 61 Superset Information 00 62 SPD Data Revision Code 00 Transcend Information Inc 10 TTTSSS333222M MMLLLD DD666444VVV333FFFIII 184PIN DDR333 Unbuffered DIMM 256MB With 32Mx8 CL2 5 63 Checksum for Bytes 0 62 20 64 71 Manufacturers JEDEC ID Transcend 7F 4F 72 Manufacturing Location T 54 54 53 33 32 4D 4C 44 36 34 56 33 46 73 90 Manufacturers Part Number TS32MLD64V3FI 49 20 20 20 20 20 91 92 Revision Code 93 94 Manufacturing Date By Manufacturer Variable 95 98 Assembly Serial Number By Manufacturer Variable 99 127 Manufacturer Specific Data 128 255 Unused Storage Locations Undefined Transcend Information Inc 11
7. TTTSSS333222M MMLLLD DD666444VVV333FFFIII 184PIN DDR333 Unbuffered DIMM 256MB With 32Mx8 CL2 5 Description The TS32MLD64V3FI is a 32M x 64bits Double Data Rate SDRAM high density for DDR333 The TS32MLD64V3FI consists of 8pcs CMOS 32Mx8 bits Double Data Rate SDRAMs in 66 pin TSOP II 400mil packages and a 2048 bits serial EEPROM on a 184 pin printed circuit board The TS32MLD64V3FI is a Dual In Line Memory Module and is intended for mounting into 184 pin edge connector sockets Synchronous design allows precise cycle control with the use of system clock Data I O transactions are possible on both edges of DQS Range of operation frequencies programmable latencies allow the same device to be useful for a variety of high bandwidth high performance memory system applications Features Power supply VDD 2 5V 0 2V VDDQ 2 5V 0 2V Max clock Freq 166MHZ Double data rate architecture two data transfers per clock cycle Differential clock inputs CK and CK Burst Mode Operation Auto and Self Refresh Data I O transactions on both edge of data strobe Edge aligned data output center aligned data input Serial Presence Detect SPD with serial EEPROM SSTL 2 compatible inputs and outputs MRS cycle with address key programs CAS Latency Access from column address 2 5 Burst Length 2 4 8 Data Sequence Sequential amp I
8. VSS 39 DQ26 85 VDD 131 DQ30 177 DM7 40 DQ27 86 DQS7 132 VSS 178 DQ62 41 A2 87 DQ58 133 DQ31 179 DQ63 42 VSS 88 DQ59 134 CB4 180 VDDQ 43 A1 89 VSS 135 CB5 181 SA0 44 CB0 90 NC 136 VDDQ 182 SA1 45 CB1 91 SDA 137 CK0 183 SA2 46 VDD 92 SCL 138 CK0 184 VDDSPD Please refer Block Diagram Transcend Information Inc 3 TTTSSS333222M MMLLLD DD666444VVV333FFFIII 184PIN DDR333 Unbuffered DIMM 256MB With 32Mx8 CL2 5 Block Diagram BA0 BA1 DQ0 DQ7 RAS CAS WE CS CKE CK CK DM DM0 BA0 BA1 DQ0 DQ7 RAS CAS WE CS CKE DM DM3 BA0 BA1 DQ0 DQ7 RAS CAS WE CS CKE DM DM2 BA0 BA1 DQ0 DQ7 RAS CAS WE CS CKE DM DM1 BA0 BA1 DQ0 DQ7 RAS CAS WE CS CKE DM DM4 BA0 BA1 DQ0 DQ7 RAS CAS WE CS CKE DM DM5 BA0 BA1 DQ0 DQ7 RAS CAS WE CS CKE DM DM6 BA0 BA1 DQ0 DQ7 RAS CAS WE CS CKE DM DM7 A0 A12 BA0 BA1 DQ0 DQ63 RAS CAS WE CS0 CKE0 DQS DQS0 DQS DQS DQS DQS DQS DQS DQS DQS1 DQS2 DQS3 DQS7 DQS6 DQS5 DQS4 CK CK CK CK CK CK CK CK CK CK CK CK CK CK CK1 CK1 CK0 CK0 CK2 CK2 32Mx8 DDR SDRAM DDR SDRAM DDR SDRAM DDR SDRAM DDR SDRAM DDR SDRAM DDR SDRAM DDR SDRAM 32Mx8 32Mx8 32M
9. e A0 A12 BA0 BA1 RAS CAS WE Input capacitance CKE0 Input capacitance CS0 Input capacitance CLK0 CLK1 CLK2 Data and DQS input output capacitance DQ0 DQ63 Input capacitance DM0 DM7 CIN1 CIN2 CIN3 CIN4 COUT CIN5 49 42 42 22 6 6 57 50 50 25 8 8 pF pF pF pF pF pF Transcend Information Inc 7 TTTSSS333222M MMLLLD DD666444VVV333FFFIII 184PIN DDR333 Unbuffered DIMM 256MB With 32Mx8 CL2 5 AC TIMING PARAMETERS amp SPECIFICATIONS These AC characteristics were tested on the component Parameter Symbol Min Max Unit Note Row cycle time tRC 60 ns Refresh row cycle time tRFC 72 ns Row active time tRAS 42 70K ns RAS to CAS delay tRCD 18 ns Row active to Row active delay tRP 18 ns Row active to Row active delay tRRD 12 ns Write recovery time tWR 15 ns Last data in to Read command tWTR 1 tCK Col Address to Col Address delay tCCD 1 tCK Clock cycle time tCK 6 ns Clock high level width tCH 0 45 0 55 tCK Clock low level width tCL 0 45 0 55 tCK DQS out access time from CK CK tDQSCK 0 6 0 6 ns Output data access time from CK CK tAC 0 7 0 7 ns Data strobe edge to output data edge tDQSQ 0 45 ns Read Preamble tRPRE 0 9 1 1 tCK Read Postamble tRPST 0 4 0 6 tCK CK to valid DQS in tDQSS 0 75 1 25 tCK DQS in setup time tWPRES 0 ns 2 DQS in hold time tWPREH 0 25 tCK DQS falling edge to
10. nging once per clock cycle VIN VREF for DQ DQS and DM IDD2F 200 mA Active power down standby current one bank active power down mode CKE lt VIL max tCK tCK min VIN VREF for DQ DQS and DM IDD3P 280 mA Active standby current CS gt VIH min CKE gt VIH min one bank active active precharge tRC tRASmax tCK tCK min DQ DQS and DM inputs changing twice per clock cycle address and other control inputs changing once per clock cycle IDD3N 440 mA Operating current burst read Burst length 2 reads continuous burst One bank active address and control inputs changing once per clock cycle CL 2 5 at tCK tCK min 50 of data changing at every burst lout 0 mA IDD4R 1 360 mA Operating current burst write Burst length 2 writes continuous burst One bank active address and control inputs changing once per clock cycle CL 2 5 at tCK tCK min DQ DM and DQS inputs changing twice per clock cycle 50 of input data changing at every burst IDD4W 1 360 mA Auto refresh current tRC tRFC min IDD5 1 440 mA Self refresh current CKE lt 0 2V IDD6 24 mA Operating current Four bank operation Four bank interleaving with BL 4 Refer to the following page for detailed test condition IDD7 2 600 mA Note Module IDD was calculated on the basis of component IDD and can be differently measured according to DQ loading cap Transcend Information Inc 6 TTTSSS333222M
11. nterleave Placement H G E I F A B D C PCB 09 1670 Transcend Information Inc 1 TTTSSS333222M MMLLLD DD666444VVV333FFFIII 184PIN DDR333 Unbuffered DIMM 256MB With 32Mx8 CL2 5 Dimensions Side Millimeters Inches A 133 35 0 20 5 250 0 008 B 72 39 2 850 C 6 35 0 250000 D 2 20 0 0870 E 31 75 0 20 1 250 0 00800 F 19 80 0 779 G 4 00 0 157 H 12 00 0 472 I 1 27 0 10 0 050 0 004 Refer Placement Pin Identification Symbol Function A0 A12 BA0 BA1 Address input DQ0 DQ63 Data Input Output DQS0 DQS7 Data strobe input output CK0 CK0 CK1 CK1 CK2 CK2 Clock Input CKE0 Clock Enable Input CS0 Chip Select Input RAS Row Address Strobe CAS Column Address Strobe WE Write Enable DM0 DM7 Data in Mask VDD 2 5 Voltage power supply VDDQ 2 5 Voltage Power Supply for DQS VREF Power Supply for Reference VDDSPD 2 5 Voltage Serial EEPROM Power Supply SA0 SA2 Address in EEPROM SCL Serial PD Clock SDA Serial PD Add Data input output VSS Ground NC No Connection Transcend Information Inc 2 TTTSSS333222M MMLLLD DD666444VVV333FFFIII 184PIN DDR333 Unbuffered DIMM 256MB With 32Mx8 CL2 5 Pinouts Pin No Pin Name Pin No Pin Name Pin No Pin Name Pin No Pin Name 01 VREF 47 DQS8 93 VSS 139 VSS 02 DQ0 48 A0 94 DQ4 140 DM8
12. s 0V TA 0 to 70 C Parameter Symbol Min Max Unit Note Supply voltage VDD 2 3 2 7 V I O Supply voltage VDDQ 2 3 2 7 V I O Reference voltage VREF VDDQ 2 50mV VDDQ 2 50mV V 1 I O Termination voltage VTT VREF 0 04 VREF 0 04 V 2 Input logic high voltage VIH DC VREF 0 15 VDDQ 0 3 V 4 Input logic low voltage VIL DC 0 3 VREF 0 15 V 4 Input Voltage Level CK and CK inputs VIN DC 0 3 VDDQ 0 3 V Input Differential Voltage CK and CK inputs VID DC 0 36 VDDQ 0 6 V 3 Input crossing point voltage CK and CK inputs VIX DC 1 15 1 35 V 5 Input leakage current II 2 2 uA Output leakage current IOZ 5 5 uA Output High Current Normal strength driver VOUT VTT 0 84V IOH 16 8 mA Output Low Current Normal strength driver VOUT VTT 0 84V IOL 16 8 mA Output High Current Half strength driver VOUT VTT 0 45V IOH 9 mA Output High Current Half strength driver VOUT VTT 0 45V IOL 9 mA Note 1 Includes 25mV margin for DC offset on VREF and a combined total of 50mV margin for all AC noise and DC offset on VREF bandwidth limited to 20MHz The DRAM must accommodate DRAM current spikes on VREF and internal DRAM noise coupled TO VREF both of which may result in VREF noise VREF should be de coupled with an inductance of lt 3nH 2 VTT is not applied directly to the device VTT is a system supply for signal termination resistors is expec
13. t all banks precharge state 3 Auto refresh functions are same as the CBR refresh of DRAM The automatic precharge without row precharge command is meant by Auto Auto self refresh can be issued only at all banks precharge state 4 BA0 BA1 Bank select addresses If both BA0 and BA1 are Low at read write row active and precharge bank A is selected If both BA0 is High and BA1 is Low at read write row active and precharge bank B is selected If both BA0 is Low and BA1 is High at read write row active and precharge bank C is selected If both BA0 and BA1 are High at read write row active and precharge bank D is selected 5 If A10 AP is High at row precharge BA0 and BA1 are ignored and all banks are selected 6 During burst write with auto precharge new read write command cannot be issued Another bank read write command can be issued after the end of burst New row active of the associated bank can be issued at tRP after the end of burst 7 Burst stop command is valid at every burst length 8 DM sampled at the rising and falling edges of the DQS and Data in is masked at the both edges Write DM latency is 0 9 This combination is not defined for any function which means No Operation NOP in DDR SDRAM Transcend Information Inc 9 TTTSSS333222M MMLLLD DD666444VVV333FFFIII 184PIN DDR333 Unbuffered DIMM 256MB With 32Mx8 CL2 5 SERIAL PRESENCE DETECT SPECIFICATION Serial Presence Detect
14. ted to be set equal to VREF and must track variations in the DC level of VREF 3 VID is the magnitude of the difference between the input level on CK and the input level on CK 4 These parameters should be tested at the pin on actual components and may be checked at either the pin or the pad in simulation The AC and DC input specifications are relative to a VREF envelop that has been bandwidth limited to 200MHZ 5 The value of VIX is expected to equal 0 5 VDDQ of the transmitting device and must track variations in the dc level of the same Transcend Information Inc 5 TTTSSS333222M MMLLLD DD666444VVV333FFFIII 184PIN DDR333 Unbuffered DIMM 256MB With 32Mx8 CL2 5 DC CHARACTERISTICS Recommended operating condition unless otherwise noted TA 0 to 70 C Parameter Symbol Max Unit Note Operating current One bank Active Precharge tRC tRCmin tCK tCK min DQ DM and DQS inputs changing twice per clock cycle Address and control inputs changing once per clock cycle IDD0 720 mA Operating current One bank Active Read Precharge Burst 2 tRC tRC min CL 2 5 tCK tCK min VIN VREF fro DQ DQS and DM IDD1 960 mA Percharge power down standby current All banks idle power down mode CKE lt VIL max tCK tCK min VIN VREF for DQ DQS and DM IDD2P 24 mA Precharge Floating standby current CS gt VIH min All banks idle CKE gt VIH min tCK 166MHz for DDR333 Address and other control inputs cha
15. x8 A0 A12 A0 A12 A0 A12 A0 A12 A0 A12 A0 A12 A0 A12 A0 A12 32Mx8 32Mx8 32Mx8 32Mx8 SCL SDA SCL SDA Serial EEPROM A0 A1 A2 SA0 SA1 SA2 This technical information is based on industry standard data and tests believed to be reliable However Transcend makes no warranties either expressed or implied as to its accuracy and assumes no liability in connection with the use of this product Transcend reserves the right to make changes in specifications at any time without prior notice Transcend Information Inc 4 TTTSSS333222M MMLLLD DD666444VVV333FFFIII 184PIN DDR333 Unbuffered DIMM 256MB With 32Mx8 CL2 5 ABSOLUTE MAXIMUM RATINGS Parameter Symbol Value Unit Voltage on any pin relative to Vss VIN VOUT 0 5 3 6 V Voltage on VDD supply to Vss VDD VDDQ 1 0 3 6 V Storage temperature TSTG 55 150 C Power dissipation PD 12 W Short circuit current IOS 50 mA Mean time between failure MTBF 50 year Temperature Humidity Burning THB 85 C 85 Static Stress C Temperature Cycling Test TC 0 C 125 C Cycling C Note Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded Functional operation should be restricted to recommended operating condition Exposure to higher than recommended voltage for extended periods of time could affect device reliability DC OPERATING CONDITIONS Recommended operating conditions Voltage referenced to Vs
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