EMC TEST REPORT
Contents
1. XN NVLAP LAB CODE 200097 0 REPORT NO E910239 EMC TEST REPORT According to EN 55022 1998 EN 61000 3 2 1995 A1 1998 2 1998 EN 61000 3 3 1995 EN 50130 4 1995 A1 1998 EN 61000 4 2 1995 1 1998 EN 61000 4 3 EN 61000 4 4 EN 61000 4 5 ENV 50141 EN 61000 4 11 Main Supply Voltage Variations EQUIPMENT PHOTOELECTRIC BEAM SENSOR MODEL NO PB 80HD PB 60HD PB 30HD APPLICANT YUAN HSUN ELECTRIC CO LTD NO 57 CHUNG HE RD KAOHSIUMG CITY TAIWAN Test Engineer JOHSONG CHANG Checked by JASON GONG Issued Date APR 09 2002 The test report shall not be reproduced except in full without the written approval of the laboratory The report can t be used by the client to claim product endorsement by PEP Testing Laboratory This report is only for the equipment which described in page 7 Page 1 of 46 TABLE CONTENTS General 1 1 General Information 1 2 Place of Measurement 1 3 Test standard Product Information EUT Description and Test Methods Modification Software Used Support Equipment Used EN 55022 Conducted Disturbance Test EN 55022 Radiated Disturbance Test 8 1 Test Description 8 2 Test Setup 8 3 Test Limits 8 4 Test Setup photo 8 5 Test Data EN 61000 4 2 Electrostatic Discharge Test 9 Test Description 9 2 Test Setup 9 3 Test Limits 9 4 Direct Discharge Drawing 9 5 Test Data Page 2 of 46 XN2. NVLAP LAB CODE 200097 0 REPORT NO E910239 10 11 12 18 10 11 12 13 14 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 EN 61000 4 3 Radio Frequency Electromagnetic Field Test 26 10 1 10 2 10 3 10 4 Test Description Test Block Diagram Test Limits Test Setup Photo EN 61000 4 4 Fast Transient Burst Test 11 1 11 2 11 3 11 4 11 5 Test Description Test Setup Test Limits Test Setup Photo Test Data EN 61000 4 5 Surge Immunity Test 12 1 12 2 12 3 12 4 12 5 The Test Description Test Setup Test Limits Test Setup Photo Test Data List of Test Instruments EUT Photographs Page 3 of 46 31 37 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 1 General 1 1 General Information Applicant YUAN HSUN ELECTRIC CO LTD NO 57 CHUNG HE RD KAOHSIUMG CITY TAIWAN C Manufacturer YUAN HSUN ELECTRIC CO LTD NO 57 CHUNG HE RD KAOHSIUMG CITY TAIWAN R O C Measurement Procedure 55022 amp EN 50130 4 Measurement Uncertainty The uncertainty of the testing result is given as below The method of uncertainty Calculation is provided in PEP Testing Lab document No PEPD 15 Frequency MHz 0 15 30 30 100 Combined Uncertainty H 1 77 dB 2 08 dB 1 2 Place of Measurement PEP TESTING LABORATORY 12 3Fl 27 1 Lane 169 Kang Ning St
3. Level PB 80HD 30MHz to 1GHz above 1GHz 23 C Over Limit dBuV m dB 14 14 14 61 14 67 13 84 16 48 22 91 Note 1 2 15 86 15 39 15 33 16 16 20 52 14 09 Limit Line Read Level Detector Detector Humidity Antenna Cable Factor dBuV m dBuV dB 30 00 30 00 30 00 30 00 37 00 37 00 27 98 2222 23 00 24 23 23 53 25 13 6 07 12 09 11 22 8 86 11 33 16 40 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 Quasi Peak Value Quasi Peak A verage Value 55 Loss dB 0 10 0 30 0 30 0 60 1 02 1 76 Preamp Factor dB 20 01 20 00 19 85 19 85 19 40 20 38 Azimuth angle 255 0 253 0 258 0 251 0 252 0 256 0 Level Read Level Antenna Factor Cable Loss Preamp Factor Over Limit Level Limit Line Page 16 of 46 Test distance 10m Antenna High m 4 0 4 0 4 0 4 0 4 0 3 8 NVLAP LAB CODE 200097 0 REPORT NO E910239 Model No PB 80HD Frequency range 30MHzto1GHz Detector Quasi Peak Value Frequency range above 1GHz Detector Quasi Peak Average Value Temperature 23 Humidity 55 Antenna polarization VERTICAL Test distance 10m Freq MHz 31 632 120 413 127 340 172 055 230 256 449 445 Over Limit Read Antenna Cable Preamp Level Limit Line Level Factor Loss Factor Azimuth Antenna dBuV m dB dBuV m dBuV dB
4. dB dB angle High m 17 03 12 97 30 00 19 39 1747 0 10 19 93 259 0 1 0 16 87 1313 3000 2446 1204 030 19 93 2500 1 0 16 78 13 22 30 00 2500 1128 0 30 19 80 25 0 1 0 13 80 16 20 30 00 24 03 8 96 0 60 19 79 254 0 1 0 13 12 23 88 37 00 22 02 9 96 0 94 19 80 2530 1 0 21 91 15 09 3700 2413 1641 1 76 20 39 254 0 1 1 1 Level Read Level Antenna Factor Cable Loss Preamp Factor 2 Over Limit Level Limit Line Page 17 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 9 EN 61000 4 2 Electrostatic Discharge Test EN 6100 42 PB 80HD Criteria for Compliance There shall be no damage malfunction or change of status due to the conditioning Flickering of an indicator during the application of the discharges is permissable providing that there is no residual change in the EUT or any change in outputs Page 18 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 9 1 Electrostatic Discharge Test Description This standard relates to equipment systems sub systems and peripherals which may be involved in static electricity discharges owing to environmental and installation conditions such as low relative humidity use of low conductivity artificial fibre carpets vinyl garments etc which may exist in allocations classified in standards relevant to electrical and electronic equipment The test set up shall consist of a wooden able 0 8 m high sta
5. 2002 2Year Interference Tester 4 3 HP Signal 8648 36190 00426 Sep 15 2002 1 3 2 HP Harmonic 3 3 Flicker Test 6842A 3531 00141 Nov 26 2002 2Year System Page 44 of 46 8 2 NVLAP LAB CODE 200097 0 REPORT NO E910239 14 EUT Photographs MODEL NO PB 80HD 910239 Page 45 of 46 8 2 NVLAP LAB 200097 0 REPORT NO E910239 i t Page 46 of 46 VERIFICATION of conformity with European EMC Directive No E910239 D ocument holder YUAN HSUN ELECTRIC CO LTD T ype of equipment PHOTOELECTRIC BEAM SENSOR designation PB 80HD PB 60HD PB 30HD EM C sample of the equipment has been tested for C E marking according to the D irective 89 336 EE C 5 tandard s used for showing compliance with the essential requirements of the directive 5 tandard s P erformance C riterion EN 55022 1998 Class B EN 61000 3 2 1995 1998 A2 1998 61000 3 3 1995 50130 4 1995 EN 61000 4 2 1995 A1 1998 1 1998 EN 61000 4 3 1996 61000 4 4 1995 61000 4 5 1995 50141 1993 EN 61000 4 11 1994 Main Supply V oltage V ariations T he referred test report s show that the product fulfills the requirements in the E M C D irective for CE marking O n this basis together with the manufacturer s own documented production control the manufacturer or his E uropean authorized
6. Hsi Chin Taipei Hsien Taiwan R O TEL 8862 26922097 FAX 8862 26956236 NVLAP LAB CODE 200097 0 FCC Registration No 90868 Nemko Aut No ELA133 BSMI Aut No SL2 IN E 11 SL2 A1 E 11 VCCI Registration No C 493 R 477 Page 4 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 1 3 Test standard Tested for compliance with EN 55022 1998 Information Technology Equipment Radio disturbance characteristics Limits and methods of measurement EN 61000 3 2 1995 Electromagnetic compatibility EMC Part 3 2 Limits A1 1998 A2 1998 Limits for harmonic current emissions equipment input Current up to and including 16A per phase EN 61000 3 3 1995 Electromagnetic compatibility Part 3 2 Limits Limitation of voltage fluctuations and flicker in low voltage supply systems for equipment with rated current up to 16A Page 5 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 EN 50130 4 1995 1 1998 Alarm systems Part 4 Electromagnetic compatibility Product family standard Immunity requirements for components of fire intruder and social alarm systems EN 61000 4 2 1995 A1 1998 Electromagnetic compatibility EMC Part 4 Testing and measurement techniques Section 2 Electrostatic discharge immunity test Basic EMC Publication EN 61000 4 3 1996 Electromagnetic compatibility EMC Part 4 Testing and measurement techniques
7. Section 3 Radiated radio Frequency electromagnetic field immunity test EN 61000 4 4 1995 Electromagnetic compatibility EMC Part 4 Testing and measurement techniques Section 4 Electrical fast transient Burst immunity test Basic EMC publication EN 61000 4 5 1995 Electromagnetic compatibility EMC Part 4 Testing and measurement techniques Section 5 Surge immunity test includes corrigendum 1995 EN 50141 1993 Electromagnetic compatibility Basic immunity standard Conducted disturbances induced by radio frequency fields Immunity test EN 61000 4 11 1994 Electromagnetic compatibility EMC Part 4 Testing and measurement techniques Section 11 Voltage dips short interruptions and voltage variations immunity tests Page 6 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 2 Product Information EUT PHOTOELECTRIC BEAM SENSOR b Model PB 80HD c Chipset Type N A d System speed N A e Crystal Oscillator s N A f Port connector s N A Memory Expansion h Power Rating DC 12V From DC Power Supplier i Chassis Used ABS j Condition of EUT Prototype Sample V Engineering Sample Production Sample k Test Receipt Date MAR 28 2002 Page 7 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 3 EUT Description The equipment under test EUT is PHOTOELECTRIC BEAM SENSO
8. representative can in his E C D edaration of Conformity verify compliance with the E M C D irective Signed for and on behalf of PEP Testing Laboratory AH 4 Date RPR 03 2002 M Y Tsui President Declaration of Conformity The following Applicant 5 YUAN HSUN ELECTRIC CO LTD Equipment PHOTOELECTRIC BEAM SENSOR Model No PB 80HD PB 60HD PB 30HD Report No E910239 is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the Laws of the Member States relating to Electromagnetic Compatibility 89 336 EEC and the amendments the Council Directive 92 31 EEC 93 68 EEC For the evaluation of above mentioned Directives the following standards were applied EN 55022 1998 Class B EN 61000 3 2 1995 A1 1998 A2 1998 EN 61000 3 3 1995 EN 50130 4 1995 A1 1998 EN 61000 4 2 1995 A1 1998 EN 61000 4 3 1996 EN 61000 4 4 1995 EN 61000 4 5 1995 ENV 50141 1993 EN 61000 4 11 1994 Main Supply Voltage Variations The following manufacturer is responsible for this declaration YUAN HSUN ELECTRIC CO LTD NO 57 CHUNG HE RD KAOHSIUMG CITY TAIWAN R O C TAIWAN APR 09 2002 Place and Date Signature of responsible Person
9. stated If the equipment is designed to be mounted in a panel rack or cabinet it shall be tested in this configuration Page 27 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 10 2 Radio Frequency Electromagnetic Field Test Block Diagram Field Leveling Fiber Signal 5 Optic 3 Detector Input RF Source Power Amplifier RF Input Bulkhead Feedthrough Page 28 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 10 3 Radio Frequency Electromagnetic Field Test Limits Frequency range MHz 80to 1000 Modulation Amplitude modulation 80 1 kHz sinusoidal Pulse modulation 1 Hz 0 5 s ON 0 5 s OFF P The field strength quoted is the RMS value for the continuous wave before modulation Page 29 of 46 8 2 NVLAP LAB 200097 0 REPORT NO E910239 10 4 Radio Frequency Electromagnetic Field Test Setup Photos FRONT VIEW IEC EN 61000 4 3 ORB ers R S immunity test E910239 Page 30 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 11 EN 61000 4 4 Fast Transient Burst Test EN 61000 4 4 PB S0HD Criteria for Compliance There shall be no damage malfunction or change of status due to the conditioning Flickering of an indicator during the application of the bursts is permissable providing that there is
10. F Fail 3 no test 4 Applicable only to cables which according to the manufacturer s specification supports communication on cable lengths greater than 3m Page 36 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 12 EN 61000 4 5 Surge Immunity Test EN 61000 4 5 PB 80HD Criteria for Compliance There shall be no damage malfunction or change of status due to the conditioning Flickering of an indicator during the application of the surge is permissable providing that there is no residual change in the EUT or any change in outputs Page 37 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 12 1 Surge Immunity Test Description The task of the described laboratory test is to find the reaction of the EUT under specified operational conditions caused by surge voltages from switching and lightning effects at certain threat levels The following equipment is part of the test set up equipment under test EUT auxiliary equipment AE cables of specified type and length coupling device capacitive or arrestors test generator combination wave generator 1 2 50 us generator decoupling network protection devices additional resistors 10 ohm and 40 ohm The surge is to be applied to the EUT power supply terminals via the capacitive coupling network Decoupling networks are required in order to avoid possible adverse effects on equi
11. R model PB 80HD PB 60HD and PB 30HD These models have identical electrical design and construction except their maximum beam ranges are different PB 80HD outdoor 80M PB 60HD outdoor 60M PB 30HD outdoor 30M After verifying these models we only took the worst case model PB 80HD for test The EUT consists of one transmitter and one receiver Power provided to EUT is DC 12V from DC Power Supplier For more detail specification about EUT please refer to the user s manual Test method The EUT powered by DC power source was placed on turntable for test Test engineer tried to obtain the worst case test data by placing obstruction between transmitter and receiver to trigger off operating during the test The worst case test result was recorded and provided in this report As pre scan we took radiated emission first EUT configuration including peripheral devices placement and data cables coupling was compliant with EN55022 requirement Test engineer tried to find the worst data cables coupling in order to perform the final test that radiated emission would keep the same configuration under test Conducted emission test N A Radiated emission test The maximum readings were found by varying the height of antenna and then rotating the turntable Both polarization of antenna horizontal and vertical are measured The effect of varying the position of the interface cables has been investigated to find the configuration that produces maximum e
12. aried 1 to 4 meters and stopped at the azimuth or height producing the maximum emission Page 12 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 8 2 Radiated Disturbance Test Setup 10m 4m EUT im GROUND s PLANE TURN TABLE TO RECEIVER EUT Equipment Under Test Page 13 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 8 3 Radiated Disturbance Test Limits Limits for radiated disturbance of Class A ITE at a measuring distance of 10 m Frequency Field Strength MHz dB H V m 30 to 230 NOTES Thelower limit shall apply at the transition frequency 2 Additional provisions may be required for cases where interference OCCUIS Limits for radiated disturbance of Class B ITE at a measuring distance of 10 Frequency Field Strength MHz dB H V m 30 to 230 NOTES 1 The lower limit shall apply at the transition frequency 2 Additional provisions may be required for cases where interference occurs Page 14 of 46 8 80 NVLAP LAB CODE 200097 0 REPORT NO 910239 8 4 Radiated Disturbance Test Setup Photo FRONT VIEW gt Y E910239 8 RA 225 lt REAR VIEW gt V Page 15 of 46 8 5 Radiated Disturbance Test Data Model No Frequency range Frequency range Temperature Freq MHz 74 745 119 829 127 921 173 836 239 904 450 199 Antenna polarization HORIZONTAL
13. ion This radiation is frequently generated by such sources as the small hand held radio transceivers that are used by operating maintenance and security personnel fixed station radio and television transmitters vehicle radio transmitters and various industrial electromagnetic sources In addition to electromagnetic energy deliberately generated there is also spurious radiation caused by devices such as welders thyristors fluorescent lights switches operating inductive loads etc For the most part this interference manifests itself as conducted electrical interference and as such is dealt with in other parts of this standard Methods employed to prevent effects from electromagnetic fields will normally also reduce the effects from these sources The electromagnetic environment is determined by the strength of the electromagnetic field field strength in volts per metre The field strength is not easily measured without sophisticated instrumentation nor is it easily calculated by classical equations and formulae because of the effect of surrounding structures or the proximity of other equipment that will distort and or reflect the electromagnetic waves testing of equipment shall be performed in a configuration as close as possible to the installed case Wiring shall be consistent with the manufacturer s recommended procedures and the equipment shall be in its housing with all covers and access panels in place unless otherwise
14. mission The highest emissions were also analyzed in details by operating the spectrum analyzer in fixed tuned quasi peak mode to determine the precise amplitude of the emissions While doing so the antenna height was varied between one and four meters and the turntable was slowly rotated to maximize the emission Page 8 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 4 Modification s N A 5 Test Software Used N A Page 9 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 6 Support Equipment Used 1 DC1 FCC ID N A Manufacturer MEEILEHLIH Model Number TH 1225A Power Supply Linear Power Cord N A Data Cable N A Page 10 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 7 EN 55022 Conducted Disturbance Test Test Standard Model No EN 55022 1998 PB 80HD Note a In technical view this product cannot generate disturbances above the limit As defined in the standard so we didn t do the test Page 11 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 8 EN 55022 Radiated Disturbance Test Test Standard Model No EN 55022 PB 80HD 8 1 Radiated Disturbance Test Description Preliminary measurements were made indoors chamber at 3 meter using broadband antennas broadband amplifier and spectrum analyzer to determine the frequency producing the maximum EME Appropriate precau
15. nding on the ground reference plane A horizontal coupling plane HCP 1 6 m x 0 8 m shall be placed on the table The EUT and cables shall be isolated from the coupling plane by an insulating support 0 5 mm thick A ground reference plane shall be provided on floor of the laboratory It shall be metallic sheet of 0 25 mm minimum thickness The minimum size of the reference plane is 1 m the exact size depending on the dimensions of the It shall project beyond the EUT or coupling plane by at least 0 5 m on all sides and shall be connected to the protective grounding system In order to minimize the impact of environmental parameters on test results the tests shall be carried out in climatic and electromagnetic reference conditions Climatic conditions ambient temperature 15 C to 35 relative humidity 30 to 6096 atmospheric pressure 86 KPa 860 mbar to 106 KPa 1 060 mbar NOTE Any other values are specified in the product specification Electromagnetic conditions The electromagnetic environment of the laboratory shall not influence the test results Page 19 of 46 NA NVLAP LAB 200097 0 REPORT NO E910239 9 2 Electrostatic Discharge Test Setup BR P nen gt Ground reterence piane y Wooden tabie 9 8 Power supply Dimensions in merres Example of test set up for table top equipment laboratory test
16. nduction R amp S No 1 LISN ESH3 Z5 844982 039 Jul 25 2002 1Year Spectrum R3261A 91720076 May 03 2002 1Year Analyzer RF Cable Rg400 N A Jul 08 2002 1Year Schaffner ISN T411 N A Jul 01 2002 1Year R amp S 2 ESVS30 863342 012 May 07 2002 1Year Receiver Anritsu MH648A M15080 Apr 10 2003 IYear Pre Amp R amp S ESMI Z7 612278 011 Aug 02 2002 1Year Pre Amp Schaffner CBL6112B lYear Radiation Antenna 30MHz 2GHz x AH 118 OP No 1 COM Power Horn Ant 1IGHz 18GH2 10095 Jul 25 2002 1Year EMCO RF Cable 175series NO 1 Apr 10 2003 1Year Sch beck VHAP Ms ec 30MHz 1GHz 970 971 Jun 27 2003 3Year Precision 953 954 Dipole Ant R amp S Signal Generar 681201 841104 037 Aug 26 2002 1 6 RF Cable No 1 N A Jul 26 2002 1Year inue 9904 1307 Jul 01 2002 1Year Antenna 26MHz 2GHz Page 43 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 Test Cal Measurement Test Mode Instrument Model No Serial No Next Cal Date item Interval Uncertainty 42 ESD Test ESS 100L 50001970 July 17 2002 1Y System A TC 815D car 4 3 Comtest G 320 CC112 0008 Oct 01 2002 2Year G Strip 44 KeyTek EFT Noise CE 40 9508266 Dec 14 2002 2Year EMS Generator 4 5 HAEFELY NO 1 PSURGE 4 083665 17 Nov 24 2002 2Year Surge Tester 4 11 HAEFELY Line PLINE 1610 083732 01 Nov 26
17. no residual change in the EUT or any change in outputs Page 31 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 11 1 Fast Transient Bursts Test Description The repetitive fast transient test is a test with bursts consisting of a number of fast transients coupled into power supply control and signal ports of electrical and electronic equipment Significant for the test are the short rise time the repetition rate and the low energy of the transients The test shall be carried out on the basis of a test plan including verification of the performances of the EUT as defined in the technical specification Climatic conditions The tests shall be carried out in standard climatic conditions in accordance with IEC 68 1 ambient temperature 15 to 35 relative humidity 25 to 75 atmospheric pressure 86kPa 860 mbar to 106Kpa 1 060 mbar NOTE Any other values are specified in the product specification Electromagnetic conditions The electromagnetic conditions of the laboratory shall be such to guarantee the correct operation of the EUT in order not to influence the test results Page 32 of 46 NIA NVLAP LAB CODE 200097 0 REPORT NO E910239 11 2 Fast Transient Burst Test Setup Lines terminals Couping decupling sections to be tested shall be mounted directly on Capacitor the reference ground plane or clamp Bonding connections shall be as sho
18. nt and at the maximum and minimum points on he mains voltage wave Page 40 of 46 8 80 NVLAP LAB CODE 200097 0 REPORT NO 910239 12 4 Surge Immunity Test Setup Photos FRONT VIEW gt Page 41 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 12 5 Surge Immunity Test Data MODEL NO PB 80HD TEST SETUP According to EN 61000 4 5 1995 Temperature 26 C Relative Humidity 46 Waveform __1 2 x 50 us Test rate 15 sec Times 20 times each condition DC power Phase Wottage Mode F olarity Result ee 1 1 supply Neutral 0 5KV supply Neutral IKV 1 mains Line supply Ground 5 7 0 5KV Neutral 1KV Ground Line Signal line Ground oV Neutral 1KV G 4 noun 3 Note 1 P means EUT function is correct during the test 2 no test Page 42 of 46 13 List of Test Instruments XN NVLAP LAB CODE 200097 0 REPORT NO E910239 Test Mode Instrument Model No Serial No Next Cal Date Cal Measurement Interval Uncertainty R amp S Receiver ESHS10 830223 008 Nov 14 2001 1Year Rolf Heine NO NEED Co
19. pment not under test that may be powered by the same lines and to provide sufficient decoupling impedance to the surge wave so that the specified wave may be developed on the lines under test Page 38 of 46 XN NVLAP LAB 200097 0 REPORT NO E910239 12 2 Surge Immunity Test Setup Combination wave generator Decoupling network AC DC power supply network N Earth reference Example of test set up for capacltive coupling on a c d c kines 7 line to earth coupling according to 7 2 Combination wave generator 10 ohm Decoupling network AC DC power supply network N Earth reference Example of test set up for capacltive coupling on a c d c kines line to line coupling according to 7 2 Page 39 of 46 XN NVLAP LAB 200097 0 REPORT NO E910239 12 3 Surge Immunity Test Limits Test voltages a c mains supply lines line to line line to eround other supply signal lines line to ground Polarity Minimum number of surges at each polarity voltage coupling mode and line mains supply lines other supply signal lines P The test voltages specified are the open circuit voltages The test voltages for the lower severity levels are included because all the lower severity levels must also be satisfied 2 via a 10 O series resistor gt via a 10 O series resistor 5 at each Zero crossing poi
20. rt as possibke x Decoupling Coupling network device Insulating support Grounding conection according to the manufacturer s specification Electrical fast Length to be specified in the test plan transievt burst t generator This length should be lt 1m Block diagram for electrical fast transient burst immunity test Page 33 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 11 3 Fast Transient Burst Test Limits Test voltages 0 5 1 2 a c mains supply lines other supply signal lines Polarity Duration per application P The test voltages specified are the open circuit voltages The test voltages for the lower severity levels are included because all the lower severity levels must also be satisfied Page 34 of 46 8 80 NVLAP LAB CODE 200097 0 REPORT NO E910239 11 4 Fast Transient Burst Test Setup Photos FRONT VIEW Rm w Eien 010239 Page 35 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 11 5 Fast Transient Burst Test Data MODEL NO PB 80HD REGULATION According to EN 61000 4 4 1995 Spec TEST RESULT Temperature 26 degree Last min Relative Humidity 46 RH Rest 60 second Pulse 5 50 ns ACPower N A Vac Burst 15ms 300 ms DCPower 12 Vdc Note 1 P mean the EUT function is correct during the test 2
21. s Page 20 of 46 XN NVLAP LAB 200097 0 REPORT NO E910239 9 3 Electrostatic Discharge Test Limits Test voltages Air discharges Contact discharges Polarity Interval between discharges The test voltages specified are the open circuit voltages The test voltages for the lower severity levels are included because all the lower severity levels must also be satisfied Page 21 of 46 8 2 NVLAP LAB CODE 200097 0 REPORT NO E910239 9 4 Direct Discharge Test Drawing Page 22 of 46 8 2 NVLAP LAB 200097 0 REPORT NO E910239 Indirect Discharge Test Drawing Page 23 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 9 5 Electrostatic Discharge Test Data Direct Discharge Model No PB 80HD Test Direct Discharge Instrument NoiseKen ESS 100L Temperature 26 C Relative Humidity 46 Storage Capacitor 150 pf Discharge Resistor 330 Ohm Discharge Rate lt 1 Contact Discharge Air Discharge V 4KV 6 KV d lt EA 9 101 d 0 1 5 P means the function is correct during the test 2 pnotest Page 24 of 46 XN NVLAP LAB 200097 0 REPORT NO E910239 Electrostatic Discharge Test Data Indirect Discharge Model No PB 80HD Test Indirect Discharge Instrument Noi
22. seKen ESS 100L Temperature 26 C Relative Humidity 46 Storage Capacitor 150 pf Discharge Resistor 330 Ohm Discharge Rate lt 1 sns asss Pars Fara eras Pee E 1 1 1 161 1 Bed Meal fl Pe Lavelle E3ESESESESEXESEXENENEXESENESEREAIER EXESENENESEZXEREXEEESESERNEZIENESESES 9 1 1 P means the function correct during the test 2 pnotest Page 25 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 10 EN 61000 4 3 Radio Frequency Electromagnetic Field Test EN 61000 4 3 PB 80HD Field Strength 10 VM Modulation AM 80 ON YES OFF Start 80 Stop 1000 MHz DCPower 12 Vac Pulse modulation 1 Hz ON YES OFF Start 80 Stop 1000 MHz DCPower 12 Vac Criteria for Compliance There shall be no damage malfunction or change of status due to the conditioning Flickering of an indicator during the conditioning is permissable providing that there is no residual change in the EUT or any change in outputs Page 26 of 46 XN NVLAP LAB CODE 200097 0 REPORT NO E910239 10 1 Radio Frequency Electromagnetic Field Test Description Most electronic equipment is in some manner affected by electromagnetic radiat
23. tion was taken to ensure that all EME from the EUT were maximized and investigated The system configuration clock speed mode of operation or video resolution turntable azimuth with respect to the antenna were noted for each frequency found The spectrum was scanned from 30 to 1000 MHz using logbicon antenna Above 1GHz linearly polarized double ridge horn antenna were used Final measurements were made outdoors at 10 meter test range using biconical dipole antenna or horn antenna The test equipment was placed on a wooden bench situated on a 1 5x1 meter area adjacent to the measurement area Sufficient time for the EUT support equipment and test equipment was allowed in order for them to warm up to their normal operating condition Each frequency found during pre scan measurements was re examined and investigated using Quasi Peak Adapter The detector function was set to CISPR quasi peak mode and the bandwidth of the receiver was set to 120kHz The half wave dipole antenna was tuned to the frequency found during preliminary radiated measurements The EUT support equipment and interconnecting cables were re configured to the set up producing the maximum emission for the frequency and were placed on top of a 0 8 meter high non metallic 1 x 1 5 meter table The EUT support equipment and interconnecting cables were re arranged and manipulated to maximize each EME emission The turntable containing the system was rotated the antenna height was v
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