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i.MX 6 Series USB Certification Guide

1. lr the DUT supports remote wake up enable it to wake up the system If the DUT does not support remote wake up this test does not need to be performed i MX 6 series is enumerated as a MSC Device so it does not support remote wake up gt The Interoperability Test on OHCI or UHCI is for information purposes only and is not required for the purposes of certification i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 92 Freescale Semiconductor Inc 5 1 1 Interoperability Tests Enumeration and driver installation Test instructions 1 We p e EN Construct a tree of USB devices as shown in Figure 94 Attach the Hub HS1 to a root port on the EHCI motherboard Attach the gold tree via hub HS2 to hub HS1 Plug the DUT into the open port on the multi TT hub HS5 Do NOT install any drivers or software prior to attaching the device Use a 5 meter cable if the device does not have a captive cable If the OS does not possess a native driver follow OS instructions to install the driver If the driver still does not load install the software as directed by the software vendor If the driver loads PASS with waiver and recommend the driver load via INF file If reboot is requested or required as a result of driver or application installation PASS with waiver and recommend removing reboot requirement 8 Check if DUT and other devices are enumerated Pass is c
2. DUT Device Under Test EHCI Enhanced Host Controller Interface USB2 0 xHCl Extensible Host Controller Interface USB3 0 OHCI Open Host Controller Interface UHCI Universal host controller interface USB1 1 Host Computer platform operated by Client PC through remote esktop connection HSETT High speed electrical test tool LAN Local area network Legacy free Any system that does not have PS 2 and other legacy ports PCle Peripheral Component Interconnect Express Bus PID Product Identification Number PS 2 port A legacy mouse or keyboard port located on some motherboards UAC User Account Control USB Universal Serial Bus VID Vendor Identification Number TID Product Test ID assigned by USB IF after passing the USB Certification Test i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 124 Freescale Semiconductor Inc 9 Revision history This table provides a revision history for this document Table 27 Revision history Revision history Revision number Date Substantive changes 0 10 2015 Initial release i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 125 How to Reach Us Home Page freescale com Web Support freescale com support a uu fr Li o gt J K 4 Information in this document is provided solely to enable system and software implemente
3. Test report Table 21 Embedded Host Interoperability Test report Num Test item Result 1 7 3 1 A UUT Functionality B device 2 7 3 2 A UUT Category Functionality B device Pass 3 7 3 3 A UUT Boot Test Pass 4 7 3 4 A UUT Legacy Speed Test Pass 5 7 3 5 A UUT Concurrent and Independently Test ER 6 7 3 6 A UUT Unsupported Device Message Test Pass 7 7 3 7 A UUT Hub Error Message Test 8 7 3 8 A UUT Hub Functionality Test Pass 9 7 3 9 A UUT Hub Maximum Tier Test Pass 10 7 3 10 A UUT Hub Concurrent and Independently Test Pass 11 7 3 11 A UUT Bus Powered Hub Power Exceeded Test Pass 7 3 12 A UUT Maximum Concurrently Device Exceed 12 Pass Message Test 13 7 3 13 A UUT Standby Test Pass 14 7 3 14 A UUT Standby Disconnect Test Pass 15 7 3 15 A UUT Standby Attach Test Pass 16 7 3 16 A UUT Standby Topology Change Test Pass 17 7 3 17 A UUT Standby Remote Wakeup Test Pass 5 2 1 A UUT functionality B device Purpose To prove the functionality of an OTG A device or EH Applies to OTG A devices and EHes that perform VID PID detection of TPL peripherals Description Test the functionality of the TPL peripherals Test setup At least one TPL device corresponding to each supported category The A UUT is powered ON Preconditions Use a Micro A plug to Standard A Receptacle adapter if the product is an OTG device Checklist TPL2 4 TPL7 Pass Criteria Prove the functionality of all TPL B devices in combination with the A UUT
4. The number of similar peripherals that the A UUT is able to handle concurrently plus one up to a maximum of four Preconditions The A UUT is powered ON Use a Micro A plug to Standard A Receptacle adapter if the product is an OTG device Checklist MSG1 MSG2 MSG7 Pass Criteria An appropriate error message was generated Test instructions 1 Power on the A UUT Ifthe product is an OTG device with a Micro AB receptacle then attach a Micro A plug to Standard A Receptacle adapter Ifthe B device requires external power power on the B device 2 Attach a B device and prove its functionality Keep increasing the number of similar peripherals attached until the maximum number is reached proving their functionality each time 4 Attach an additional similar peripherals Check that an appropriate error message is generated by the A UUT or that it is able to handle 4 peripherals without error 5 2 13 A UUT Standby test Purpose To prove that the host can handle standby correctly Applies to OTG A devices and EH products which support standby Description With a B device connected verify standby operation of the A UUT Test setup At least one TPL device from each category Preconditions The A UUT is powered ON Use a Micro A plug to Standard A Receptacle adapter if the product is an OTG device Checklist C2 Pass Criteria Compliant standby behav
5. 2 4 Test software Figure 2 E2646A B SQiDD test fixture Preparing for the test LOW FULL S0D0 The following table shows the software used for the USB Certification Test Table 5 Test software used for USB Certification Test 2 5 USB IF required tests Name Version Description USBET20 1 20 USB electrical analysis tool USBHSET 1 2 2 1 Windows based utility tool used to initiate test modes USB20CV 1 4 11 0 USB 2 0 command verifier for USB 2 0 device framework testing USB30CV 1 1 2 0 USB 3 0 command verifier for USB 3 0 device framework testing GraphicUSB 4 47 Test software for PET test Devices that support the features of USB OTG amp EH V2 0 will undergo additional testing beyond the tests described in this document This additional testing is a subset of existing tests for USB peripherals and USB host controllers Table 6 describes which tests are required for full USB IF certification by an EH with a Standard A or 1 Micro AB connector Table 7 describes which tests are required for full USB IF certification by a device with a Micro B connector The following symbols are used in these tables A Always required Required if feature is supported Required if there are multiple downstream ports USB IF allows Embedded Host to use the Micro AB receptacle in 2012 i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc Preparing f
6. Figure 23 Host Drop Droop Test fixture 3 3 Device High Speed Signal Test To perform the high speed device test you must install the HS Electrical Test Tool software on your computer which can set the DUT to specific test patterns To study the detailed description of the test items in the Data Rate Test see this document USB IF USB 2 0 Electrical Test Specification The Device Receiver Sensitivity Test requires additional equipment a digital signal generator for example Agilent 81130A and related accessories e Device High Speed Signal Quality Test EL 2 Data Rate Test EL 4 EL 5 Eye Pattern Test EL 6 Rise and Fall Time Test EL 7 Non Monotonic Edge Test e Device Packet Parameters Test EL 21 Sync Field Length Test EL 25 EOP Length Test EL 22 Measure Inter packet Gap Between First and Second Packets EL 22 Measure Inter packet Gap Between Second and Third Packets e Device CHIRP Timing Test EL 28 Measure Device CHIRP K Latency EL 29 Measure Device CHIRP K Duration EL 31 Device Hi Speed Terminations Enable and D Disconnect Time l For High Speed Device Test need to install HS Electrical Test Tool software on Computer which can set DUT into specific test pattern 2 To study the detailed description of the test items see this document USB IF USB 2 0 Electrical Test Specification i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor I
7. Figure 26 Device HS Signal Quality Test i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 29 Electrical test procedure and software configuration Initialize Port Tast Port mr E2645 66507 E2649 26401 Device Hi Speed Signal Quality Test Fixture Figure 27 Device Hi Speed Signal Quality Test environment USB IF HS Electrical Test Tool Select Type Of Test Select Host Controller For Use In Testing PCI bus 5 device 0 function 2 2 Ports Device Hub Host Controller System USB Exit Figure 28 Electrical Test Tool main menu i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 30 Freescale Semiconductor Inc Electrical test procedure and software configuration HS Electrical Test Tool Device Test differential signal V Figure 30 Device Hi Speed Test packet i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 31 Electrical test procedure and software configuration differential signal V 0 0 0 5 1 0 15 2 0 time ns Figure 31 Device HS eye diagram 3 3 3 Device Packet Parameters Test Test instructions 1 Select the test items in the USB Automated Test software on the oscilloscope as shown in Figure 32 Set the Test Type configuration option to Hi Speed Near End before running the test 2 Connect the equipment and test fixture as shown in
8. then record the measurement in the pop out dialog i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 67 FEE EE Electrical test procedure and software configuration Switch the test fixture to OFF mode Press the RESET button on DUT or repower it to reset the system 7 Detach the HSEHET board from the Init Port of the test fixture and select Test K Then connect the board to the Init Port again with a 5 meter cable 8 The host enumerates the HSEHET board and enters a hi speed K state D low D high Switch on the test fixture this switches on the termination Verify the yellow TEST LED is lit Use a multimeter to measure the DC voltage on the D lines at TP2 with respect to GND then record the measurement in the pop out dialog 9 Switch the test fixture to off mode 10 Remove the HSEHET board from the Init Port of the test fixture and select Test_SEO_NAK Then connect the board to the Init Port again with a 5 meter cable 11 The host enumerates the HSEHET board and enters the SEO State D low D low Switch on the test fixture this switches on the termination Verify the yellow test LED is lit Use a multimeter to measure the DC voltage on the D lines at TP2 with respect to GND then record the measurement in the pop out dialog 12 When the Testing Complete dialog appears click on Ok The Results tab shows the test results and the Html Report shows the complete
9. 3 0 V OUTPUT TRG 0x00 2 625 V Note that the chip functionality may be limited and not guaranteed near the extremes of the programming range PER Control bit to enable the regulator output 3 5 3 USBC_n_PORTSC1 Port control is usually used for status port reset suspend and current connect status Port control is also used to initiate test mode or force signaling and allows software to put the PHY into low power suspend mode and disable the PHY clock Command samples unit_tests memtool unit_tests memtool unit_tests memtool unit_tests memtool unit_tests memtool unit_tests memtool 0x2184184 1 OTG Port Read register data 0x2184184 0x18441205 OTG Port Test packet 0x2184184 0x18411205 OTG Port J_STATE 0x2184184 0x18421205 OTG Port K STATE 0x2184184 0x18431205 OTG Port SEO host NAK device 0x2184184 0x18401305 OTG Port Reset MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 72 Freescale Semiconductor Inc Electrical test procedure and software configuration unit tests memtool 0x2184184 0x18401285 OTG Port Suspend unit_tests memtool 0x2184184 0x18401245 OTG Port Resume unit tests memtool 0x2184384 1 Host Port Read register data unit tests memtool 0x2184384 0x18441205 Host Port Test packet unit tests memtool 0x2184384 0x18411205 Host Port J STATE unit tests memtool 0x2184384 0x18421205 Host Port K STATE unit tests memtool
10. Connect the Test Port of the test fixture into the downstream facing port of the DUT using the 4 inch USB cable Before connecting the HSEHET Board select the Test_Packet Then connect the board to the Init Port with a 5 meter cable Attach the differential probe on channel I to D D of TP2 on the test fixture Ensure the polarity on the probe lines up with D Click on the Run Tests button of the Automated Test software on the oscilloscope The host enumerates the HSEHET board and responds to continuously send the test_packet i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 54 Freescale Semiconductor Inc mE EEE EPP Electrical test procedure and software configuration Switch the test fixture to switch the termination on Ensure the yellow test LED is lit 9 You should see the transmitted test packet on the oscilloscope as shown in Figure 64 10 When the Testing Complete dialog appears click on Ok The Results tab shows the test results and the Html Report shows the complete report USB Test Environment Setup Device Under Test DUT Device TespPpint vy C Device Hub Host C On The Go EmbeddedHost HS Test Connection Test Method User Description Device Identifier Connection Option useer Select or Type v Select or Type Comments Droop Drop Ports I New DroopDrop Fixture HS Signal Quality Fixture Selection Agilent Fixture C USBIF C Other I Debug and
11. Embedded Host Interoperability Test Targeted Hosts or an OTG acting as a host are tested for interoperability with peripherals from the device s own Targeted Peripheral List plus other retail USB products which could be attached to the Targeted Host Silent failures are not allowed and therefore a clear message shall be generated when any sort of error situation occurs For example where hubs are non supported a clear Hub not supported or similar error message appears and not a generic not supported or similarly vague error message For the detailed description of the Embedded Host Interoperability Test see Chapter 7 of the USB On The Go and Embedded Host Automated Compliance Plan Test items e A UUT Functionality B device e A UUT Category Functionality B device e A UUT Boot Test e 7A UUT Legacy Speed Test e A UUT Concurrent and Independently Test e A UUT Unsupported Device Message Test e A UUT Hub Error Message Test e A UUT Hub Functionality Test e A UUT Hub Maximum Tier Test e A UUT Hub Concurrent and Independently Test e A UUT Bus Powered Hub Power Exceeded Test e A UUT Maximum Concurrent Device Exceed Message Test e A UUT Standby Test e A UUT Standby Disconnect Test e A UUT Standby Attach Test i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 99 Interoperability Tests e A UUT Standby Remote Wakeup Test
12. Test report Table 25 PET A UUT test report Num Test Item Result 1 6 7 2 A UUT Initial Power Up Test Pass 2 6 7 4 A UUT VBUS Voltage and Current Measurements Pass 3 6 7 5 A UUT Bypass Capacitance Pass 4 6 7 6 A UUT SRP Pass 5 6 7 8 A UUT ADP Pass 6 6 7 9 A UUT Leakage Pass 7 6 7 14 EH Capable of ADP and SRP State Transition Test _ Standard A 6 7 15 EH Capable of ADP but not SRP State Transition 8 Test Standard A E 9 6 7 16 EH Capable of SRP but not ADP State Transition O Test Standard A 6 7 17 EH with no Session Support State Transition Test 10 1 Pass Standard A 11 6 7 18 EH Capable of ADP and SRP Micro AB or OTG A _ Capable of ADP and SRP but not HNP State Transition Test 6 7 19 EH Capable of ADP but not SRP Micro AB or OTG 12 A Capable of ADP but not SRP or HNP State Transition Test 6 7 20 EH Capable of SRP but not ADP Micro AB or OTG 13 A Capable of SRP but not ADP or HNP State Transition Test 14 6 7 21 EH with no Session Support State Transition Test Micro AB or OTG A with no Session or HNP Support 15 6 7 22 A UUT Device No Response for connection timeout Pass 16 6 7 23 A UUT Unsupported Device Message Pass 17 6 7 24 A UUT Device No Response for HNP enable 18 6 7 25 EH using Micro AB Incorrect Connection Test instructions 1 Install and run GraphicUSB on your computer 2 Click on Operation gt Compliance T
13. USB 3 Gen X devices Device Summary v Chapter 9 Tests USB 2 M Chapter 9 Tests CVExe exe ver 1 5 0 0 CommandVerifierLog dil ver 1 5 0 0 TSMFCGuiDialogHelperDLL dll ver 1 5 0 0 TestUtilities dll ver 1 5 0 0 TestSuiteEngine dll ver 1 5 0 0 xhci_DevIOCTL dll ver 2 0 0 2 ixhci_TestServices dll ver 2 0 0 2 m gt 4 estPassed n ree E USB Command Verifier HCI USB 3 0 as 5 Test Not Run Please run MSC Tests on this device D 0x9c31 PCI 0 220 0 f 1 VID 15a2 PID 007b Each Configuration ptor Test Configuration Index 0 dressed State Device descriptor length 0x12 Device descriptor type 0x1 Major version 0x2 Minor version 0x0 Each interface specifies its own device class type nfigured State Could not open file usb if Failed to get vendor information for VendorID 0x15A2 Device ProductID 0x7B language string descriptor is Linux 3 10 53 02632 g8eb5fbd language string descriptor is Mass Storage Gadget g8eb5fbd Goto Reports Directory Update Display Exit Figure 85 Prompt box after USB30CV Chapter 9 Tests Upstream ar Port Function Controller 1 I er ee ee rer J 1 I Upstream V i j 1 unit load om pr eee Regulator Local Power Supply Figure 86 Self powered function i MX 6 Series USB Certification Guide User s
14. USB Device File View Tools Help i Dad nare al Task Flow f SetUp Select Tests configure Connect Run Tests Automation Results Html Report JO uss Tests JO Hi Speed JO Device Hi Speed JO Device Hi Speed Signal Quality Test H D O Device Packet Parameters H O O Device CHIRP Timing Device Suspend Resume Reset Timing EL 38 EL 38 Device Suspend Timing Response EL 40 Device Resume Timing Response EL 27 Device CHIRP Response ta Reset from Hi Speed Operation Set Up Select Tests Configure EL 28 Device CHIRP Response ta Reset from Suspend O Device Test J K SEO_NAK H O O Device Receiver Sensitivity f Low and Full Speed Inrush Current Test Connect Test Group Device Suspend Resume Reset Timing Run Tests Description Tests device suspend resume and reset timing response Figure 43 Device Suspend Reset Resume Timing Test i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 40 Freescale Semiconductor Inc Electrical test procedure and software configuration HS Electrical Test Tool Device Test Select Device Device Control Device Command Device Address VID Ox4b4 PID 0x6830 Address 1 Port 5 SUSPEND v NONE TEST J TEST K TEST SEO NAK TEST PACKET RESUME RESET DEVICE DESCRIPTOR LOOP DEVICE DESCRIPTOR Enumerate Bus SET ADDRESS Figure 44 Device suspend command File Control Setup
15. condition is reached Is the device ready to perform USB activity at a time no longer than TPURUP RDY from an identifiable povering on action or sequence of actions e g switching on Number of untested checklist items 0 Number of failing checklist items End of Script End of Test Sequence RESULT SUMMARY Pass Pass Pass Pass Pass Pass Pass CT PUT mpet CT VBUS mpet CT CAP mpet CT SRP mpet CT HNP mpet CT LKG mpet CT ST EH A DP mpet CT ST EH ADP NOSRP mpet CT ST EH mpet CT ST EH NOSESS mpet CT DevNoRes mpet CT UnsupDev mpet CT NoResHnp mpet CT OTG REP mpet of Report YES PASS Vendor Declaration n 3167 Colo Figure 101 USB PET Test report i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 121 Useful links 7 Useful links Freescale i MX 6 USB Certification Test Guide and Materials https community freescale com docs DOC 105609 USB Spec http www usb org developers docs usb20 docs usb 20 0702115 zi OTG and Embedded Host related documents http www usb org developers onthego OTG and Embedded Host Compliance Test Spec http www usb org developers onthego otgeh compliance plan 1 2 pdf Full and Low Speed Compliance Test Spec http www usb org developers compliance electrical tests USB IFTestProc1 3 pdf USB 2 0 Electrical Test Spec http www us
16. 0x2184384 0x18431205 Host Port SEO host NAK device unit tests memtool 0x2184384 0x18401305 Host Port Reset unit tests memtool 0x2184384 0x18401285 Host Port Suspend unit tests memtool 0x2184384 0x18401245 Host Port Resume Table 17 USBC n PORTSC1 register settings Name USBC n PORTSC1 This register defines the control and status bits for the 3 0 V regulator powered by the Description host USB VBUS pin 3 It is also used to initiate test mode or force signaling and allows software to put the PHY into low power suspend mode and disable the PHY clock Bit 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 16 Reset value 0 0 0 1 01 0 0 0 0 0 0 0 0 0 0 0 Field ve ENE NESS ES o definitions e loli PERES eRe eS oe a o ala o s s s Bit 15 14 13 12 11 10 9 8 7 6 5 4 Reset value 0 0 0 0 0 0 0 0 0 0 0 0 Field O a Oe a rm QO EEE a Se 7 13 8 Field Description Port Test Control Read Write Default 0000 b Refer to Port Test Mode for the operational model for using these test modes and chapter 7 of the USB Specification for details on each test mode The FORGE ENABLE FS and FORCE ENABLE LS are extensions to the test mode support specified in the EHCI specification Writing the PTC field to any of the FORCE_ENABLE_ HS FS LS values will force the port into the connected and enabled state at the se
17. 100 mA If no high power device is available on TPL use other high power device The A UUT is powered ON Preconditions Use a Micro A plug to Standard A Receptacle adapter if the product is an OTG o dowie O Checklist C5 Pass Criteria An appropriate error message was generated Test instructions 1 Power on the A UUT Ifthe product is an OTG device with a Micro AB receptacle then attach a Micro A plug to Standard A Receptacle adapter Ifthe B device requires external power power on the B device 2 Attach a bus powered hub 3 Attach a high power device downstream from a bus powered hub 4 Check that an appropriate error message is generated by the A UUT i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 107 Interoperability Tests 5 2 12 A UUT Maximum Concurrent Device Exceed Message Test To prove that the specified maximum number of concurrent peripherals function Purpose correctly and either that an error message is given when exceeding this number or that it is able to handle 4 peripherals OTG A devices and EHes which support a limited number of peripherals Applies to concurrently 7 Test the A UUT for appropriate behavior when exceeding the maximum number Description of supported concurrent peripherals up to a maximum of four May require hubs to be attached in order to exceed maximum number of Test setup peripherals
18. 225 454866 As 272 my 301 mv Figure 75 Time between SOF and last chirp J K i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 64 Freescale Semiconductor Inc Electrical test procedure and software configuration 3 4 6 Host Suspend Resume Timing Test Test instructions 1 Select the test items in the USB Automated Test software on the oscilloscope as shown in Figure 76 and ensure that the Test Type configuration option is set to Hi Speed Near End before running the test Connect the equipment and test fixture as shown in Figure 73 Attach the 5 V power supply to J5 of the Host hi speed signal quality test fixture E2649 66402 Leave the test switch at the off position Ensure that the green power LED is on and the yellow test LED is off Connect the Test Port of the test fixture into the downstream facing port of the DUT using the 4 inch USB cable Attach the single ended probes on channel 2 to D and attach channel 3 to D of TP2 on the test fixture Before connecting the HSEHET Board select HS_HOST_PORT_SUSPEND_RESUME Connect the board to the Init Port with a 5 meter cable NOTE The HSEHET board should be attached before clicking on the Run Tests button in case that you capture the Bus Enumeration instead of Suspend transition Click the Run Tests button of the Automated Test software on the oscilloscope 5 After 15 seconds the host port will enter Suspend state as show
19. A receptacle which does not keep VBUS high REID all the time it is powered up In either case it is assumed that SRP or ADP is available to detect the presence of a device SRP as A Check this box if the UUT as an A device devi Check box supports detecting and acting on an SRP PI13 evice pulse generated by a connected device HNP as A Check this box if the UUT as an A device A Check box supports HNP to enable the connected B PI13 device i ae device to become host if it so requires Check this box if the UUT as an A device HNP Polling as Check box supports HNP polling If it does it is allowed PI3 A device to remain as host for as long as the other device does not set its Host Request Flag ADP as A Check this box if the UUT as an A device desi Check box supports ADP probing to detect the presence PI13 evice or otherwise of a connected device Check this box if the UUT as a B device SRP as B Check box supports generating an SRP pulse in order to PI20 device start a session cause the connected A device to turn on VBUS HNP as B Check this box if the UUT as a B device device Check box supports HNP to allow it to become host if it PI20 SO requires Check this box if the UUT as a B device ADP as B Check box supports ADP sensing and probing to detect PI20 device the presence or otherwise of a connected device Check this box if UUT does not fully support FS Not full speed operation This is not permitted for Availa
20. Figure 27 Attach the 5 V power supply to J5 of the device hi speed signal quality test fixture E2649 66401 Leave the test switch at the off position Verify the green power LED is lit and the yellow test LED is not lit Connect the Test Port of the device hi speed signal quality test fixture into the upstream facing port of the DUT using the 4 inch USB cable Connect the Init Port of the test fixture to a hi speed capable port of the test bed computer with a 5 meter USB cable Attach the differential probe on channel 1 to D D of TP2 on the test fixture Ensure the polarity on the probe lines up with D 3 Reboot the device to restore the USB device to normal operation 4 Click on Enumerate Bus on the menu of the HS Electrical Test Tool Using the oscilloscope verify the SOF Start of Frame packets are being transmitted on the port under test You may i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 32 Freescale Semiconductor Inc Electrical test procedure and software configuration need to lower the trigger level to below 400 mV 5 Select the Single Step Set Feature from the Device Command window Click on Execute once The oscilloscope will measure the sync field length number of bits of the third from device packet EL 21 EOP End of Packet width number of bits of the third packet EL 25 inter packet gap between the second from host and the third from device in
21. Guide Rev 0 10 2015 80 Freescale Semiconductor Inc Device Framework Test 4 3 USBCV Class Test Appropriate class tests HID HUB MSC UVC PHDC should be done according to the prompt of Chapter 9 tests as shown in Figure 83 See the following documents for a detailed description of test items Universal Serial Bus Revision 2 0 USB Command Verifier Compliance Test Specification Universal Serial Bus Mass Storage Class Compliance Test Specification 4 3 1 MSC Test All devices that report a mass storage class interface will be required to pass this test in order to receive logo certification The tests described will be run on all interfaces that report themselves as MSC Test items e TD 1 1 Interface Descriptor Test e TD 1 2 Serial Number Test e TD 1 3 Class Specific Request Test e TD 1 3 Error Recovery Test e TD 1 5 Case 1 Test e TD 1 6 Case 2 Test e TD 1 7 Case 3 Test e TD 1 8 Case 4 Test e TD 1 9 Case 5 Test e TD 1 10 Case 6 Test e TD 1 11 Case 7 Test e TD 1 12 Case 8 Test e TD 1 13 Case 9 Test e TD 1 14 Case 10 Test e TD 1 15 Case 11 Test e TD 1 16 Case 12 Test e TD 1 17 Case 13 Test e TD 1 18 Power Up Test e TD 1 19 CB Length Test e TD 1 19 CB Length Test e TD 2 1 Required Commands Test e TD 2 2 Optional Commands Test i i MX 6 series is enumerated as mass storage in device mode therefore it is only necessary to implement the MSC Test i MX 6 Series USB Certi
22. Information Only Automation Using 81130A 81134A or E3631A or 344014 Click on Export Data to transform test C Yes No results Export Data Figure 61 Select Embedded Host for HS Electrical Test Export Data ntigure Devices 1 Select Embedded Host for non Windows products Click on the Connection Option button here to select a differential or single end probe if you are using the latest software i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 55 Freescale Semiconductor Inc Electrical test procedure and software configuration USB Test USB Device File View Tools Help DW onreg SetUp Select Tests Configure Connect Run Tests Automation Results Him Report JO uss Tests JO Hi Speed Host Hi Speed E Host Hi speed Signal Quality O EL 3 Data Eye and Mask Test O EL 6 Host Rise Time EL 6 Host Fall Time EL 7 Host Non Monotonic Edge Test Host Controller Packet Parameters Host CHIRP Timing Host Suspend Resume Timing 10 amp 39 Suspend Timing Response amp 41Resume Timing Response 4 Host Test J K SEO_NAK O O Low and Full Speed Click a test s name to see description Figure 62 Host HS Signal Quality test USB Gable Host Under Test PIDAVID Available from 5VDC Figure 63 Host HS Signal Quality Test environment i MX 6 Series US
23. Legacy USB compliance tests Upstream Full Speed Signal Quality Test Back Voltage Test Device Inrush Current Test Downstream Full Speed Signal Quality Test Downstream Low Speed Signal Quality Test Host Drop Test 3 2 1 Upstream Full Speed Signal Quality Test Test instructions 1 Select the test items in the USB Automated Test software on the oscilloscope as shown in Figure 4 Make sure you set the test type configuration option to Full Speed Far End before running the test Connect the equipment and test fixture as shown in Figure 5 Select the HS electrical test tool software on the computer Select the Device and click on the Test button to enter the Device Test menu See Figure 7 On the Device Test Menu of the HS Electrical Test Tool software click on Enumerate Bus once All devices attached to the host controller should appear in the device enumeration list Highlight the device under test and select the Loop Device Descriptor from the Device Command drop down menu Click on Execute once The VID of the Freescale product in USB IF is 15A2 in hex or 5538 in decimal i MX 6 series processors are enumerated as a MSC device low speed upstream is not supported Measure the upstream full speed EYE without the 5 tier of hubs as this has no effect on the signal integrity High speed electrical tests are performed either near end or far end depending on the configuration of the product The terms near end and far end are base
24. Measure Analyze Utilities Help 7 54AM 50 0 MSa s Figure 45 Device suspend waveform i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 41 42 Electrical test procedure and software configuration HS Electrical Test Tool Device Test Select Device Device Control NONE Device Command Device Address VID Ox4b4 PID 0x6830 Address 1 Port 5 RESUME X I NONE TEST J TEST K TEST SEO NAK TEST PACKET SUSPEND RESET Enumerate Bus DEVICE DESCRIPTOR _ LOOP DEVICE DESCRIPTOR SET ADDRESS Figure 46 Device resume command File Control Setup Measure Analyze Utilities Help 7 56 AM lo jula Hp 10 01 Figure 47 NE qop mi Device resume waveform i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc Electrical test procedure and software configuration HS Electrical Test Tool Device Test Select Device Device Control Device Command Device Address VID Ox4b4 PID 0x6830 Address 1 Port 5 RESET NONE TEST J TEST K TEST SEO NAK TEST PACKET SUSPEND RESUME DEVICE DESCRIPTOR LOOP DEVICE DESCRIPTOR Enumerate Bus SET ADDRESS Figure 48 Device reset command File Control Setup Measure Analyze Utilities Help 7 57 AM 25 0 MSa s 262 kpts Device CHIRP K Figure 49 Device reset from high speed waveform i MX 6 Series USB Certificatio
25. Run Tests Automation Results Html Report setup JO USB Tests Hi Speed Select Tests JO Host Hi Speed JO Host Hi speed Signal Quality 4 JO Host Controller Packet Parameters Z Host CHIRP Timing EL 33 CHIRP Timing Response EL_34CHIRP K Width EL_34CHIRP J Width EL_35 SOF Timing Response Host Suspend Resume Timing O O 1_39 Suspend Timing Response O O EL 41Resume Timing Response H O O Host Test J K SEO NAK H O Low and Full Speed Test Group Host CHIRP Timing Description Tests downstream port CHIRP K and CHIRP J timing response Figure 72 Host CHIRP Timing Test i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 62 Freescale Semiconductor Inc Electrical test procedure and software configuration USB Cable Host Under Test 5VDC Figure 73 Host CHIRP Timing Test environment i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 63 Electrical test procedure and software configuration File Control Setup Measure Analyze Utilities Help 11 03 AM Host chirp response timing CHIRP K Width ATime 2 2 ATime 2 2 12 80000 us 42 24910 us 40 96000 ys 12 80000 us 42 24910 us 40 96000 ys 12 90000 as 42 24910 us 40 26000 aS 45 940110 Figure 74 Host CHIRP J K waveform File Control Setup Measure Analyze Utilities Help 11 17 AM Dog uns us 89 951 n
26. Semiconductor Inc 66 Electrical test procedure and software configuration File Control Setup Measure Analyze Utilities Help 26 May 2009 11 04 AM Figure 78 EL 41 host resume waveform 3 4 7 Host test J K SEO NAK Test Test instructions 1 Select the test items in the USB Automated Test software on the oscilloscope as shown in Figure 79 and make sure you set the Test Type configuration option to Hi Speed Near End before running the test 2 Connect the equipment and test fixture as shown in Figure 80 Attach the 5V power supply to J5 of the Host Hi Speed signal quality test fixture E2649 66402 Leave the test switch at the off position Verify the green power LED is lit and the yellow test LED is not lit Connect the Test Port of the test fixture into the downstream facing port of the DUT using the 4 inch USB cable Before connecting the HSEHET Board put it in the right position by selecting Test_J Then connect the board to the Init Port with a 5m cable Attach the single ended probes on channel 2 to D channel 3 to D of TP2 on the test fixture 3 Click on the Run Tests button of Automated Test Software on the oscilloscope 4 The host enumerates the HSEHET board and enters a hi speed J state D high D low Switch on the test fixture this switches the termination on Verify the yellow TEST LED is lit Use a multimeter to measure the DC voltage on the D lines at TP2 with respect to GND
27. Test instructions 1 Power on the A UUT Ifthe product is an OTG device with a Micro AB receptacle then attach a Micro A plug to a Standard A Receptacle adapter Ifthe B device requires external power power on the B device 2 Attach a B device taken from the TPL and confirm functionality i MX 6 series does not support peripherals identified by their VID PID this test is not needed 2 The Concurrent and Independently test is only applied to an EH with multi ports i MX 6 EVK only has one downstream port so this test is not needed 3 i MX 6 series supports hub this test is not needed i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 100 Freescale Semiconductor Inc Interoperability Tests 3 Detach the B device and check if the device is disconnected correctly 4 Attach the B device and prove functionality 5 Repeat the above steps for each of the different supported categories 5 2 2 A UUT category functionality B device Purpose To prove the category functionality of an OTG A device or EH Applies to OTG A devices and EHes that support a certain category of device Description Test the functionality of each of the supported categories One B device of each supported category with 500 mA in their descriptor if not available use a device with highest maximum power descriptor value If available one B device of each supported category with an additional interface s co
28. Tests Current Measurement Test Device Summary CVExe exe ver 1 5 0 0 CommandVerifierLog dil ver 1 5 0 0 TSMFCGuiDialogHelperDLL dll ver 1 5 0 0 TestUtilities dll ver 1 5 0 0 TestSuiteEngine dil ver 1 5 0 0 EhcDevIOCTL dll ver 1 4 15 0 EhaTestServices dil ver 1 4 15 0 USBUtilities dil ver 1 4 5 0 StackSwitcher dil ver 1 4 5 1 USBCommandVerifier dil ver 1 4 15 0 TParse dil ver 1 4 5 0 HIDTests dll ver 1 4 15 0 am Hub Tests MSC Tests ATP Tanta Test Not Run Current Host PCI bus 0 device 29 function 0 Number of ports 3 Host PCI bus 0 device 29 function 0 Z For each Configuration HID Class Descriptor Test USB 2 0 eHCI Command Verifier M Protocol Test M Idle Test Please select device to test M Report Descriptor Test i Group i Z Other Speed Which Spec Compliant HS Device HID addr 2 VID 15a2 PID 008c i For each Other Speed Configuration For each Configuration i Other Speed Descriptor Test Device Configured Other Speed Descriptor Test Device Addressed Figure 89 USB20CV HID Tests 4 4 USBCV current measurement test In order to measure the power distribution of a USB device the average current is measured during unconfigured configured active and suspend states with a digital multimeter and fixture to measure the VBUS current The circumstances for measuring the average current are dependent on the speed of the device and the powe
29. device framework and the descriptor All USB 2 0 peripherals seeking certification are required to demonstrate enumeration on the USB 3 0 PDK Both USB20CV and USB30CV tests are required These test tools are available on the USB website at http www usb org developers tools Read the installation guide carefully before you start testing For hi speed peripherals the Chapter 9 tests must be executed twice once in full speed mode and once in hi speed mode It is not necessary to run HID Mass Storage MSC and Video Class UVC at both speeds Download the Company List at http www usb org developers tools comp_dump and save as usb if in the same directory where USBCV is installed You can find the company ID from this list Remember this list changes very regularly ensure you get the newest version when you use the tools Test items e USBCV Chapter 9 e USBCV Class Test e USBCV Current Measurement Test 4 2 USBCV Chapter 9 Test The Chapter 9 tests cover the device support of the commands set for the in Chapter 9 of the USB specification To see the detailed description of test items see the following documents Universal Serial Bus Revision 2 0 USB Command Verifier Compliance Test Specification Universal Serial Bus Revision 3 1 USB Command Verifier Compliance Test Specification Test Items e TD 9 1 Device Descriptor Test e TD 9 2 Configuration Descriptor Test e TD 9 3 Interface Association Descriptor Test e TD 9 4 Interfac
30. downstream USB connector with 500 mA load then record it as Vroapen Table 9 Host Drop Test Record Item Port01 Voltage Expected value VDC Vnon load 5 19 V 4 75 V lt VBUS lt 5 5 V VLoad 5 083 V 4 75 V lt VBUS lt 5 5 V Vdrop 107m V lt 750m V Vdroop lt 330m V NOTE Keep the following items in mind while performing the drop test When taking the measurement take the cable resistance voltage drop into account as it can be significant when operating with high currents For example if you have 0 25 ohm resistance for cable and connectors and a current of 500 mA you will have a voltage drop of 0 125 V The measurement must be performed as near to the A Receptacle as possible and if accessible you can measure at the A receptacle VBUS GND soldering pad The USB specifications define that the measurements should be taken at the A receptacle however as the A receptacle is often difficult to access you may use a fixture and a cable in between Note that these will give some additional voltage drop Re test the VBUS drop when changing the power supply during testing i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 24 Freescale Semiconductor Inc Electrical test procedure and software configuration Main Test 100mA 500mA Drop droop Droop test port USB Power port S1 Switct Loads 100mA Top surface Test port 500mA bottom indicator
31. entire Connectors Integrators List USB B plug 9 5 meter USB Any listed on USB IF Cables and cables Connectors Integrators List i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 PCI host adapter using certified USB xHCI USB IF SuperSpeed PDK FS hub bus powered Targus Numeric Keypad with 2 port Hub model PAUK10U Pommera Camera uve uve Hh speed using isoctvonous vanspon speed using Highspeed using isoonm vanspon transport Freescale Semiconductor Inc 91 Interoperability Tests Test items e Enumeration and driver installation e Operation with default drivers e Interoperability e Hot detach and reattach e Warm boot e Remote wake up test e S3 Active Suspend Test e S3 Active Suspend Resume Test e Root Port Test e S4 Active Hibernate Test e S4 Active Hibernate Resume Test e Topology change UHCI e Topology change OHCI e Topology change XHCI Test report Table 20 Device interoperability test report Num Test Item Result 1 Enumeration and driver installation Pass 2 Operation with default drivers Pass 3 Interoperability Pass 4 Hot detach and reattach Pass 5 Warm boot Pass 6 Remote Wake Up Test 7 S3 Active Suspend Test Pass 8 S3 Active Suspend Resume Test Pass 9 Root Port Test Pass 10 S4 Active Hibernate Test Pass 11 S4 Active Hibernate Resume Test Pass 12 Topology change UHCI Pass 13 Topology change OHCI Pass 14 Topology change XHCI Pass
32. fails to operate as expected One or more Gold Tree devices fail to operate 5 1 4 Hot detach and reattach Test instructions 1 You MUST stop the DUT operation 2 Detach and reattach the DUT to same hub port 3 Test functionality of the DUT only 4 Pass is considered when all of the following items are completed The DUT operates as expected 5 Fail is considered when any of the following items occur The DUT fails to operate as expected 5 1 5 Warm boot Test instructions 1 You MUST stop operation of all devices 2 Restart the computer 3 Check operation of all USB devices including DUT 4 Pass is considered when all of the following items are completed DUT operates as expected 5 Fail is considered when any of the following items occur The device fails to operate as expected i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 95 RET Interoperability Tests One or more Gold Tree devices fail to operate 5 1 6 Remote Wake up Test Test instructions 1 Ifthe DUT supports remote wake up enable the DUT to wake the system Computer gt Manage gt Device Manager gt DUT gt Power Management If it does not support remote wake up go to S3 Active Suspend Tests 2 While the device under test is actively operating suspend the system Start gt Shutdown gt Sleep Wait 5 10 seconds after device is fully shutdown 3 Ifthe system do
33. is not intermittent This is just above the minimum receiver sensitivity levels before squelch Using the oscilloscope markers to measure the packet amplitude read the Ay and By values and record the measurement in EL_17 Further reduce the amplitude of the packet from the data generator in small steps Maintain the balance between OUTPUT1 and OUTPUT until the receiver stops i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 48 Freescale Semiconductor Inc Electrical test procedure and software configuration responding with a NAK 16 This is the squelch level of the receiver 17 Measure the packet amplitude Read the Ay and By values and record the measurement in EL 16 18 When the Testing Complete dialog appears click on Ok The Results tab shows the test results and the Html Report shows the whole report USB Test USB Device File View Tools Help D me areale USS Tests Hi Speed JO Device Hi Speed H O O Device Hi Speed Signal Quality Test Device Packet Parameters Select teats Device CHIRP Timing O Device Suspend Resume Reset Timing oOo Device Test J K SEO_NAK Configure EL 18 Receiver sensitivity Test Minimum SYNC Field EL_17 Receiver sensitivity Test EL_16 Receiver sensitivity Test amp Squelch 2 J Low and Full Speed 10 Inrush Current Test JO Upstream Full Speed Signal Quality and Transition Time T
34. not performed beforehand Attach the DUT to the SQiDD board then set the switch on the SQiDD board to the discharge position opposite the on position Disconnect the DUT from the SQiDD board then set the switch on the SQiDD board to the on position Adjust the oscilloscope settings to match the current test requirement time base 50 ms div Vertical resolution 500 mA div sample rate gt 1MS s Re connect the DUT to the SQiDD board in order to capture the inrush current waveform then save the waveform as a wfm or csv i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 15 Electrical test procedure and software configuration 6 Use the analysis software USBET20 on your computer to analyze the waveform file then a page will show the test result as shown in Figure 14 Inrush failures mostly occur when VBUS and GND have too large a capacity between them SQDD Section 1 Discharge Switch Device Under Test Figure 12 Device Inrush Current Test environment Device Host SQ Hub DS SQ Inrush Current Inrush Current Data C Work IMX6 Documents Compliance Test report USB Inrush Current Data ftek0001CH_4_2 csv Browse Supply Voltage Figure 13 USBET20 operation interface i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 16 Freescale Semiconductor Inc Electrical test procedure and software configuration curre
35. other RTOS USB IF defines a method of entering the specified test modes via PID VID detection See chapter 6 4 1 of On The Go and Embedded Host Supplement to the USB specification for further information The certification lab provides an HSEHET Board to perform the Host or Embedded Host test This board can be set to different PIDs as shown in Figure 60 Table 13 Test modes product ID definitions PID Test Mode 0x0101 Test SEO NAK 0x0102 Test J 0x0103 Test K 0x0104 Test Packet 0x0105 Reserved 0x0106 HS HOST PORT SUSPEND RESUME 0x0107 SINGLE STEP GET DEV DESC 0x0108 SINGLE STEP GET DEV DESC DATA i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 53 Electrical test procedure and software configuration TOE z 7 lt Sp Pye fi Figure 60 HSEHET board for Host High Speed Test 3 4 3 Host High speed Signal Quality Test Test instructions 1 Select the test items in the USB Automated Test software on the oscilloscope as shown in Figure 61 Make sure to set the Test Type configuration option to Hi Speed Near End before running the test Connect the equipment and test fixture as shown in Figure 63 3 Attach the 5 V power supply to J5 of the Host Hi Speed signal quality test fixture E2649 66402 Leave the test switch at the off position Ensure the green Power LED is lit and the yellow test LED is not lit
36. respond to the host s packets EL 22 as shown in Figure 35 to Figure 37 6 Inthe Device Test menu of the HS Electrical Test Tool click on Step once more This is the second step of the two step Single Step Set Feature command The oscilloscope will measure the inter packet gap between the first from host and the second from device in respond to the host s packets EL_22 as shown in Figure 39 7 When the Testing Complete dialog appears click on Ok The Results tab shows the test results and the Html Report shows the complete report USB Test USB Device Dead var S cle Task Flow f SetUp Select Tests Configure Connect Run Tests Automation Results Himi Report B C O Use Tests Hi Speed JO Device Hi Speed cs oO Device Hi Speed Signa Quality Test Device Packet Parameters EL_21 Device Sync Field Length Test EL 25 Device EOP Length Test EL 22 Measure Interpacket Gap Between Second and Third Packets EL 22 Measure Interpacket Gap Between First and Second Packets Device CHIRP Timing Set Up Select Tests Configure o Device Suspend Resume Reset Timing JO Device Test J SEO NAK o Device Receiver Sensitivity 0O Low and Full Speed JO Inrush Current Test Test Group Device Packet Parameters Run Tests Description Measures sync field length end of packet EOP width and interpacket gap of transmitted packets Figure 32 Device Hi Speed P
37. shows the complete report USB Test USB Device File View Help B Pye FT J Device Hi Speed gt Device Hi Speed Signal Quality Test Device Packet Parameters gt Device CHIRP Timing Device Suspend Resume Reset Timing Device Test J K SEO NAK Select Tests EL 8 J Test EL_8K Test EL 95E0 NAK Test JO Device Receiver Sensitivity Test None Selected Description Select a Single Test 3 Tests Check the test s you would like to run Connection UNKNOWN Configure Figure 51 Device Test J K SEO NAK Test i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 45 Electrical test procedure and software configuration Q OD m 4 USB Cable V COM O Device Under Test USB Cable Host mH 5VDC Figure 52 Device Test J K SEO NAK Test environment HS Electrical Test Tool Device Test Device Control Device Command VID Oxdb4 PID 0x6830 Address 1 Port 5 Enumerate Bus Figure 53 Device Test_J command DEVICE DESCRIPTOR LOOP DEVICE DESCRIPTOR SET ADDRESS Table 11 Host Drop Test record Test Mode D Voltage mV D Voltage mV Expected value 360 mV lt D lt 440 mV 10 mV lt D lt 10 mV 360 mV lt D lt 440 mV 10 mV lt D lt 10 mV 10 mV lt D lt 10 mV 10 mV lt
38. test bed computer as shown in Figure 90 ensure that the gold tree HS hub is used 2 Insert a multimeter in series of the VBUS line ensure that the connection is for current test and the switch is in the correct range 3 Run USB20CV on your computer select the Current Measurement Test and then click the Run button to launch the tests 4 Select the DUT in the list click on Ok A pop out dialog will ask you to measure the unconfigured current as shown in Figure 91 After recording the maximum current value click on Ok 6 Another pop out dialog will ask you to measure the configured current as shown in Figure 92 7 Record the maximum current value then click on Ok to finish the test Intel D865GL EHCI oo I ooo Motherboard UHCI Hub HS1 Hub FS1 Digital Avg Current Multimeter Draw Test Jig 1 Meter Cable Figure 90 Current measurement environment i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 86 Freescale Semiconductor Inc Device Framework Test amp USB2 0 Command Verifier H GE ld fun 26 Compliance Test r Prompt for Test Parameters Da Debug Select Test Suite Chapter 9 Tests CVExe exe ver 1 4 7 0 CommandVerifierLog dll ver 1 4 8 0 i dil ver 1 4 7 0 TestUtilities dll ver 1 4 7 0 TestSuiteEngine dll ver 1 4 7 0 EhciDevIOCTL dil ver 1 4 10 2 EhaTestServices dil ver 1 4 10 2 USBUtilities dil ver 1 4 5 0 StackSwitcher dl
39. the oscilloscope The host enumerates the HSEHET board and responds by sending SOFs for 15 seconds Click on OK to close the Test Instruction dialog After the SOFs sending is complete the host initiates the setup phase of the GetDescriptor command The host sends SETUP and DATA first and second packet then the device sends an ACK You should see the transmitted test packet on the oscilloscope as shown in Figure 70 Click on OK to close the Test Instruction dialog Disconnect the HSEHET Board select SINGLE STEP GET DEVICE DESCRIPTOR DATA then reconnect it to the test fixture The host enumerates the HSEHET board and requests GetDescriptor then waits for 15 seconds The host then initiates an IN token the device responds with a DATA then the host sends an ACK You should see the transmitted test packet on the oscilloscope as shown in Figure 71 When the Testing Complete dialog appears click on Ok The Results tab shows the test results and the Html Report shows the complete report i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 58 Freescale Semiconductor Inc Electrical test procedure and software configuration USB Test USB Device VIT OG File View Tools Help D me Far e USE Tests A H 0 Hi Speed Fo Host Hi Speed O O Host Hi speed Signal Quality 3 Host Controller Packet Parameters EL_21 Sync Field Length Test EL_25 EOP Length Test E
40. when all of the following items are completed The system resumes well Active operation initiated in the previous step continues without error 5 Fail is considered when either of the following items occur The system does not resume The system blue screens or locks up The DUT is not functional or does not continue operation in the previous step 5 1 9 Root Port Test Test Instructions 1 You MUST stop operation of all devices 2 Plug the DUT into a root port of the system s motherboard 3 Check operation of all USB devices including the DUT 4 Pass is considered when all of the following items are completed The DUT operates as expected 5 Fail is considered when any of the following items occur i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 97 Interoperability Tests The DUT fails to operate as expected 5 1 10 54 Active Hibernate Test Test instructions 1 You must stop operation of all devices 2 Plug the DUT into a root port of the system s motherboard 3 Operate the DUT while the system enters hibernation Start gt Shutdown gt Hibernate wait 5 to 10 seconds after system has shutdown 4 Pass is considered when all of the following items are complete The system hibernates with no problems 5 Fail is considered when any of the following items occurs The system fails to hibernate The system blue screens or
41. 1 1 2 must support being set to Addressed Configured state Stop time Tue Jul 07 17 35 12 2015 Duration 1 second Stopping Test Configuration Descriptor Test Configuration Index 0 Number of Fails 1 Aborts 1 Warnings 0 Optional Test Description Abort Launch Re wer soto Reports Direc Update Display Figure 92 USB20CV Configured Current Measurement Test 4 4 2 Active Current Test The USB 2 0 DUT is operating correctly and during operation the device current is measured in worst case power consumption mode The active current must remain below the value defined in the bMaxPower field of the descriptor Test instructions 1 Connect the downstream port of a HS hub to the DUT and the upstream port of a HS hub to the test bed computer ensure that the gold tree HS Hub is used 2 Insert a multimeter in series of the VBUS line Ensure the connection is for the current test and the switch is in the correct range 3 Operating the DUT copy a file from your computer to the DUT which is enumerated as a MSC Device After the copy is completed recopy the file to your computer then copy another file from your computer to the DUT 4 Record the maximum current value during the bi direction copying period 4 4 3 Suspend Current Test The USB 2 0 DUT is suspended after being correctly enumerated by the host system If the device supports remote wakeup this feature must be enabled during measurement i MX
42. 2357A USB GPIB Interface Ifyou choose to use the Agilent 81130A Pulse Pattern Generator connect the 8493C 6 dB attenuators to OUTPUT1 and OUTPUT of Agilent 81130A Pulse Pattern Generator 4 Connect OUTPUT1 to SMAI D of the E2649 66403 Device Receiver Sensitivity test i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 47 Electrical test procedure and software configuration 10 11 12 13 14 15 fixture using the 8120 4948 SMA cables Connect OUTPUT to SMA2 D of the E2649 66403 Device Receiver Sensitivity test fixture using the 8120 4948 SMA cables Select the Memcard soft key on the 81130A If Memcard is not in the menu press the more key until Memcard is displayed The content of the memory will appear on the screen Use the cursor and the rotary knob to select the MIN ADD1 STO setup file Move the cursor to Perform Operation and turn the knob to select Recall Then press the Enter key to load it This generates IN packets of compliant amplitude with a 12 bit SYNC field packet pattern Reboot the device to restore the USB device to normal operation Click on Enumerate Bus on the menu of the HS Electrical Test Tool Choose the right device Select TEST SEO NAK from the Device Command drop down menu then click on Execute once to place the device into TEST SEO NAK test mode Set the test fixture Test Switch S1 to the test position This swi
43. 6 Series USB Certification Guide User s Guide Rev 0 10 2015 88 Freescale Semiconductor Inc Device Framework Test Test Instructions 1 4 Connect the downstream port of a HS hub to the DUT and the upstream port of a HS hub to the test bed computer ensure that the gold tree HS hub is used Insert a multimeter in series of the VBUS line Ensure the connection is for the current test and the switch is in the correct range After the DUT is enumerated as a MSC device by entering the following command in the Linux console you can force the DUT into suspend mode echo mem gt sys power state Record the maximum current value 4 4 4 Suspend current powered state Peripherals are required to support the suspend state whenever VBUS is powered on even if the bus reset has not occurred NOTE This measurement is not the regular suspend current measurement as described above in section 4 4 3 Test Instructions 1 Connect the downstream port of a HS hub to the DUT and the upstream port of a HS hub to the test bed computer as shown in Figure 90 Ensure that the gold tree HS Hub is used Insert a Multimeter in series of the VBUS line Ensure the connection is for the current test and the switch is in the correct range Run USB20CV on your computer Select the Current Measurement Test and then click on the Run button to launch the tests Select the DUT in the list click on OK After the unconfigured and c
44. 7 Attach the 5 V power supply to J5 of the Device Hi Speed signal quality test fixture E2649 66401 Leave the test switch at the OFF position Verify the green Power LED is lit and the yellow Test LED is not lit Connect the Test Port of the device high speed signal quality test fixture into the upstream facing port of the DUT using the 4 inch USB cable Connect the Init Port of the test fixture to a Hi Speed capable port of the test bed computer with a 5 meter USB cable Attach the differential probe on channel to D D of TP2 on the test fixture Ensure the polarity on the probe lines up with D 3 Invoke the HS Electrical Test Tool software on the Hi Speed Electrical Test Bed Computer i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 28 Freescale Semiconductor Inc Electrical test procedure and software configuration Select Device and click the Test button to enter the Device Test menu The DUT should be enumerated with the device s VID shown together with the root port in which it is connected Select the HS Electrical Test Tool software on the hi speed electrical test bed computer Select Device and click the Test button to enter the Device Test menu The DUT should be enumerated with the device s VID shown together with the root port in which it is connected Select TEST PACKET from the Device Command drop down menu and click on Execute This forces the DUT to continuously transmit
45. B Certification Guide User s Guide Rev 0 10 2015 56 Freescale Semiconductor Inc Electrical test procedure and software configuration A Pubs JenuauapjIp Figure 64 Host HS test packet A Peubis jenuavayip Figure 65 Host HS eye diagram i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 57 Electrical test procedure and software configuration 3 4 4 Host Packet Parameters Test Test instructions 1 Select the test items in the USB Automated Test software on the oscilloscope as shown in Figure 66 and make sure you set the Test Type configuration option to Hi Speed Near End before running the test Connect the equipment and test fixture as shown in Figure 63 Attach the 5 V power supply to J5 of the Host Hi Speed signal quality test fixture E2649 66402 Leave the test switch at the off position Verify the green power LED is lit and the yellow test LED is not lit Connect the Test Port of the test fixture into the downstream facing port of the DUT using the 4 inch USB cable Before connecting the HSEHET Board select its correct position at SINGLE_STEP_GET_DEVICE_DESCRIPTOR Then connect the board to the Init Port with a 5 meter cable Attach the differential probe on channel 1 to D D of TP2 on the test fixture Ensure the polarity on the probe lines up with D 3 Click the Run Tests button of the Automated Test software on
46. C Serial number characters must be 0 9 or A F in ASCII 0x0030 0x0039 or 0x0041 0x0046 For self powered devices ensure that the device is currently self powered for bus powered devices verify that the device is currently bus powered Change the HS hub to a gold tree FS Hub then run the test again in full speed mode Run USB30CV on your computer and perform the Chapter 9 Tests again both in high speed and full speed modes See gold tree devices list in Table 19 2 When you run USBCV it will replace the standard Microsoft EHCI host driver with its own test stack driver Therefore all standard peripherals on your computer such as mouse and u disk are invalid at this moment 3 The i MX 6 series acts as a self powered device in device mode i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 76 Freescale Semiconductor Inc Device Framework Test 5820 Command Vee Rani iii VEN Select Test Mode og Compliance Test IT Prompt for Test Parameters Test log initialized Debug Log Level Normal User Input module initialized Windows 7 Enterprise Build 7601 18717 x86fre win7sp1 gdr 150113 1808 Service Pack 1 0 Select Test Suite Current Measurement Test CVExe exe ver 1 5 0 0 Device Summary HID Tests Hub Tests MSC Tests USBUtilities dil ver 1 4 5 0 StackSwitcher dll ver 1 4 5 1 USBCommandVerifier dil ver 1 4 14 0 Please select device to test FS Device addr 3 VID 413
47. D lt 10 mV J 415 4 K 4 417 SEO NAK 1 1 3 3 7 Device Receiver Sensitivity Test Receiver sensitivity and squelch measurements are to be made at the upstream port pins as defined in the USB 2 0 Specification i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 46 Freescale Semiconductor Inc Electrical test procedure and software configuration The Transmission Envelope Detector of a A high speed capable device must be fast enough to enable the HS receiver to detect data transmission achieve DLL lock and detect the end of the SYNC field within 12 bit times When all packets are NAK by the device this test EL_18 is considered to have passed In Section 7 1 7 2 of USB2 0 Spec it requires squelch EL_16 to occur below 100 mV magnitude Therefore no packets must be acknowledged between 100 mV and 100 mV Full squelch may occur at higher voltages but it is mandatory between 100 mV and 100 mV Receiver sensitivity requires all packets to be reliably received down to 150 mV magnitude Packets may be received at lower voltages but it is mandatory for all packets to be received at levels above 150 mV magnitude This measurement is to be made at the upstream pins but the test fixture does not allow this The USB IF requires packets to be reliably received at levels above 200 mV 50 mV waiver to compensate for the voltage drop for EL_17 Packets can but do not need to be received bet
48. EL 21 Sync Field Length Test 32 bits 65 62 ns lt VALUE lt 67 700 ns EL_25 EOP Length Test 8 bits 15 620 ns lt VALUE lt 17 700 ns EL 23 Inter packet gap between first 2 Packets Test EL_55 SOF EOP Width Test 40 bits 81 100 ns lt VALUE lt 83 388 ns EL 22 Inter packet gap between Host and Device Packet Test EL 33 CHIRP timing response 1 ns lt VALUE lt 100 000 us EL 34 CHIRP J K width 40 000 us lt VALUE lt 60 000 us EL 7 Host Non Monotonic Edge Test 183 000 ns lt VALUE lt 399 400 ns 16 640 ns lt VALUE lt 399 90 ns i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 52 Freescale Semiconductor Inc EL 35 SOF Timing Response Electrical test procedure and software configuration 100 000 us lt VALUE lt 500 000 us EL 39 Suspend Timing Response 3 000 ms lt VALUE lt 3 125 ms EL 41 Resume Timing Response VALUE lt 3 000 ms EL 8 Host J Test 360 mV lt D lt 440 mV 10mV lt D lt 10 mV EL_8 Host K Test 360 mV lt D lt 440 mV 10 mV lt D lt 10 mV EL 9 Host SEO NAK Test 10 mV lt D lt 10 mV 10 mV lt D lt 10 mV 3 4 2 Test method and tool In USB Certification the host is a product based on Windows x86 or x64 systems which can implement the HS Electrical Test Tool to run the Host test An Embedded Host is a product based on Linux Android or
49. Freescale Semiconductor Inc User s Guide Document Number IMKUSBCGUG Rev 0 10 2015 i MX 6 Series USB Certification Guide 1 Introduction The purpose of this document is to describe how to perform the USB Certification Test on the i MX 6 series family of application processors This document contains the description of procedures tools and criteria for the USB Compliance Test O 2015 Freescale Semiconductor Inc All rights reserved pe Contents E E e rere errcr trey cree are ererrty ee errr er reer eer 1 PRS Pare ge RE 2 21 Test DOAKGS r E E E EA 2 PEN Test environment 2 3 Test egupment A T E E A E 2 4 Test sole nesana 2 USB IF required tests 2 6 Compliance checklist and TPL esineisiin ZT Register the product in USB IF eorrrrnnern 2 8 Compliance test reference documents Electrical test procedure and software configuration 10 Sel Software configuration for electrical test 10 3 2 Legacy USB compliance tests 3 3 Device high speed signal test 3 4 Host High Speed Signal Test eee 32 3 5 1 MX 6 series USB PHY registers and software re OE EE EE 69 Device Framework Tost iccisccasensssctiarscantsansensasossovenosasse 15 4 1 Introduction of device framework test 75 4 2 VSBEV Chip Team dnenee 75 4 3 WSBCY dass vvs 81 4 4 USBCY current measurement test Lun uaiamiarse 84 Interoperability Wests asccasssascsasexevanesaasasssasasasee
50. Host Inter packet gap host response to device waveform i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 61 Electrical test procedure and software configuration 3 4 5 Host CHIRP Timing Test Test instructions 1 Select the test items in the USB Automated Test software on the oscilloscope as shown in Figure 72 Ensure that the Test Type configuration option is set to Hi Speed Near End before running the test 2 Connect the equipment and test fixture as shown in Figure 73 Attach the 5 V power supply to J5 of the Host hi speed signal quality test fixture E2649 66402 Leave the test switch at the off position Ensure that the green power LED is on and that the yellow test LED is off Connect the Test Port of the test fixture into the downstream facing port of the DUT using the 4 inch USB cable Attach the single ended probes on channel 2 to D and attach channel 3 to D of TP2 on the test fixture Click the Run Tests button of the Automated Test software on the oscilloscope 4 Connect a good high speed device to the initialize port You must capture the CHIRP handshake as shown in Figure 74 5 When the Testing Complete dialog appears click on Ok The Results tab shows the test results and the Html Report shows the complete report USB Test USB Device File View Tools Help D me var e ele Task Flow Setup Select Tests Configure Connect
51. L 23 Inter packet Gap Between First 2 Packets Test EL_22 Inter packet Gap Between Host And Device Packet Test EL_55 SOF EOP Width Test C O Host CHIRP Timing Host Suspend Resume Timing O O 1_39 Suspend Timing Response oO EL_41 Resume Timing Response H O O Host Test J K SEO_NAK vw Click a test s name to see description HAs Run Tests Figure 66 Host HS Packet Parameters Test Utilitias File Control Setup Measure Analyze Help 4 31 PM oona DE Figure 67 Host SOF waveform i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 59 Electrical test procedure and software configuration File Control Setup Measure Analyze Utilities Help 7 18 AM i is opped K 67 6446 ns 735 6 ps 66 9090 ns 429 my ae Figure 68 EL 21 host sync field length waveform File Control Setup Measure Analyze Utilities Help 7 19AM 6 0075 ns 3 0984 ns 7 0909 ns Figure 69 EL 25 host EOP length waveform i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 60 Freescale Semiconductor Inc Electrical test procedure and software configuration File Control SEL Measure Analyze Utilities Help 10 28 AM Figure 70 EL_23 host EEE gap waveform File Control Setup Measure Analyze Utilities Help 10 31 AM VAL VA M i HEL JE mo EE aa ME EG M i i 361 7698 606 3152 244 5454 120 h Figure 71 EL 22
52. TXCAL45DM enable changing of the resistance of the high speed termination Increasing the termination resistor value will increase the DM DP TXCAL45DP signals level Decode to select a 45 ohm resistance to the USB_DP output pin Maximum resistance 0000 Decode to select a 45 ohm resistance to the USB_DN output pin TXCALASDN Maximum resistance 0000 With this field the current reference for the high speed driver can be trimmed Reducing the resistance will increase the driver current and therefore the amplitude of the transmitted signal will increase D_CAL Resistor Trimming Code 0000 0 16 0111 Nominal 1111 25 1 Remember to connect DUT to the corresponding host device before adjusting the registers otherwise the operation might be invalid or may cause the system to crash i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 70 Freescale Semiconductor Inc Electrical test procedure and software configuration 3 5 2 PMU REG 3P0 This register defines the control and status bits for the internal LDO USB module which is powered by either of the two USB VBUS pins This regulator supplies only low speed and full speed transceivers of USB PHYs Therefore it only impacts the voltage level of full speed and low speed transmissions but not the high speed Command samples unit_tests memtool 0x20c8120 1 Read register data unit tests memtool 0x20c8120 0x00011771 wri
53. Update Display Exit Figure 88 USBCV MSC Tests Repower device 4 3 2 HID Test All devices which report a Human Interface Device HID interface will be required to pass this test in order to receive logo certification The tests described in this section shall be run on all interfaces that report themselves as HID Test items HID Descriptor Test HID Get Set Idle Test HID Get Set Protocol Test HID Report Descriptor Test HID Specification Version Test Test instructions l Connect the downstream port of a HS hub to the DUT and the upstream port of a HS hub to the test bed computer ensure that the gold tree HS Hub is used Run USB20CV on your computer select HID Tests and then click the Run button to launch the tests i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 83 BRT STK Device Framework Test Select the DUT device in the list and click on Ok as shown in Figure 89 After the test is completed click on the Launch Report Viewer to view the test report 3 4 5 Change the HS hub to a gold tree FS Hub then run the test again in full speed mode 6 Run USB30CV on your computer do the HID Tests again r Select Test Mode re IT Prompt for Test Parameters C Debug g rd User Input module initialized Windows 7 Enterprise Build 7601 18717 x86fre win7sp 1_gdr 150113 1808 Select Test Suite Service Pack 1 0 Chapter 9
54. acket Parameters Test i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 33 Electrical test procedure and software configuration File Control Setup Measure Analyze Utilities Help eos Dm alal E 1 0000000 Figure 33 SOF waveform HS Electrical Test Tool Device Test i Select Device VID Qx4b PID 06560 Address 1 Port 5 Enumerate Bus Device Control Device Command NONE Device Address NONE TEST J TEST K TEST SEO NAK TEST PACKET SUSPEND RESUME RESET DEVICE DESCRIPTOR SET ADDRESS ENABLE WAKEUP DISABLE WAKEUP LOOP DEVICE DESCRIPTOR SINGLE STEP SET FEATURE etun To Main Figure 34 Single Step Set Feature for Packet Parameters Test i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 34 Freescale Semiconductor Inc Electrical test procedure and software configuration File Control Setup Measure Analyze Utilities Help 7 18 AM X 6 6446 ns 735 6 ps 66 9090 ns Figure 35 EL 21 device sync field length waveform File Control Setup Measure Analyze Utilities Help 719 AM Acquisition i 16 0075 ns 33 0984 ns 17 0909 ns o C407 Hy n Figure 36 EL 25 device EOP length waveform i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 35 Electrical tes
55. al Quality and Transition Time Test Description Tests device CHIRP K and CHIRP J timing response Figure 40 Device Chirp J K Test ee Hi speed Host 2645 66507 E2649 26401 Device Hi Speed Signal Quality Test Fixture Figure 41 Device Chirp J K Test environment i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 38 Freescale Semiconductor Inc Electrical test procedure and software configuration File Control Setup Measure Analyze Utilities Help 7 48 AM 50 0 MSa s 262 kpts i ERN 2 5uS to 3mS Device Turns on HS is lt 500uS Termination Device Device CHIRP CHIRP K Latency moun ATime 2 Time 2 2 current 1 23904001 ms 2 00064000 ms mean 1 23904001 ms 2 00064000 ms min 1 23904001 ms 2 00064000 ms Figure 42 Device CHIRP J K waveform 3 3 5 Device Suspend Reset Resume Timing Test Test instructions 1 Select the test items in the USB Automated Test software on the oscilloscope as shown in Figure 43 and make sure you set the test type configuration option to hi speed near end before running the test 2 Connect the equipment and test fixture as shown in Figure 41 Attach the 5 V power supply to J5 of the device high speed signal quality test fixture E2649 66401 Leave the Test switch at the off position Verify the grepower LED is lit and the yellow Test LED is not lit 4 Connect the Test Port of the device high speed signal quality test
56. ality of the all device categories listed in TPL attached downstream from one hub Test instructions Power on the A UUT 1 Ifthe product is an OTG device with a Micro AB receptacle then attach a Micro A plug to Standard A Receptacle adapter i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 106 Freescale Semiconductor Inc Interoperability Tests Ifthe B device requires external power power on the B device 2 Attach a B device to the hub s downstream port 1 Attach similar peripherals to available downstream hub ports 4 Prove the functionality of each attached device Do they operate concurrently and independently Or is a selection method available such that the user can select the active device 5 Detach one device and replace it with a device of another category if multiple categories are supported 6 Detach all peripherals 7 Repeat the above steps for each of the different supported category 5 2 11 A UUT Bus Powered Hub Power Exceeded Test To prove that the host generates an appropriate error message when Purpose connecting a high power device downstream from a bus powered hub Applies to OTG A device and EHes which support bus powered hubs Toci Check that the A UUT is able to detect and prevent an over current event on a Description bus powered hub A bus powered hub Test setup High power device from the TPL Max power descriptor gt
57. allowed to handle a limited number of concurrent peripherals Pass Criteria Test Instructions 1 Power on the A UUT Ifthe B device requires external power power on the B device Attach a B device to port 1 Attach another B device of the same category to an available downstream port Continue attaching B devices of the same category until all ports are full A a Prove functionality of each attached B device Do they operate concurrently and independently Or is a selection method available such that the user can select the active B device 6 Remove one device and replace it with a device of another category if multiple categories are supported 7 Remove all peripherals 8 Repeat the above steps for each of the different supported category i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 103 Interoperability Tests 5 2 6 A UUT Unsupported Device Message test To prove that the OTG A device or EH generates the correct error message Purpose when attaching an unsupported device Applies to OTG A devices and EHes Description Observe error messages when attaching unsupported peripherals One unsupported low speed device One unsupported full speed device Test setup One unsupported high speed device One unsupported super speed device One unsupported composite device with more than 8 interfaces The A UUT is powere
58. any List from the following website http www usb org developers tools comp_dump i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 7 Preparing for the test 2 8 Select the Test Lab for example Allion Labs Inc Fill in the detailed information for your product including the marketing name the revision checklists the product category and the contact window Wait for USB IF to approve your product Compliance test reference documents To get to know the whole environment settings and detailed test steps of the USB Compliance Test see the following documents Universal Serial Bus Implementers Forum Full and Low Speed Electrical and Interoperability Compliance Test Procedure USB IF http www usb org developers compliance electrical tests USB IFTestProc1 3 pdf USB On The Go and Embedded Host Automated Compliance Plan for the On The Go amp Embedded Host Supplement USB IF http www usb org developers onthego otgeh compliance plan 1 2 pdf On The Go and Embedded Host Supplement to the USB Revision 2 0 Specification Revision 2 0 USB IF http www usb org developers docs usb20 docs usb 20 0702115 zip USB IF USB 2 0 Certification Mandatory Test Matrix USB IF http compliance usb org resources usb2 0compliancetestprogram pdf Universal Serial Bus Specification USB IF http www usb org developers docs usb20 docs usb 20 0702115 zi USB IF USB 2 0 Electrica
59. attach a Micro A plug to Standard A Receptacle adapter Ifthe B device requires external power power on the B device 2 Place the A UUT into standby follow A UUT vendor guidelines to force the host in standby mode Attach Peripheral 4 Take the A UUT out of standby mode A UUT may also come out of standby automatically on attach 5 Verify that A UUT behaves normally 6 Prove the functionality of the peripheral 7 If different types of standby modes are supported repeat the test until all modes have been tested 5 2 16 A UUT Standby Topology Change test To prove the standby functionality of the OTG A device or EH when the Purpose topology changes during standby Applies to OTG A devices and EHes which support standby Switch the topology of TPL peripherals while the A UUT is in standby Description Verify that the A UUT does not behave abnormally after the A UUT leaves standby mode Test setup At least one TPL peripheral Preconditions The A UUT is powered ON Use a Micro A plug to Standard A Receptacle adapter if the product is an OTG device Checklist C2 Pass Criteria Compliant standby behavior is observed Test instructions i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 110 Freescale Semiconductor Inc Interoperability Tests 1 Power ON the A UUT Ifthe product is an OTG device with a Micro AB receptacle then attach a M
60. b org developers compliance USB IF USB 2 0 Electrical Test Spec081005 pdf Gold Tree Test procedure http compliance usb org resources GoldSuite 20Test 20Procedure pdf Test software and tools http www usb org developers tools Checklist and TPL t TPL form otgeh2 O v1 0 fill in pdf Electrical Test procedure for Different Oscilloscopes http www usb org developers compliance electrical_tests Detailed Electrical Test procedure for Keysight Oscilloscope with N5416A http www keysight com upload cmc upload All N5416A USB2 Compliance App Testing Notes pdf USB IF Compliance Updates http compliance usb org index html Search the TID for certified products http www usb org kcompliance view Company VID List http www usb org developers tools comp dum USB PET User Manual http www map com pdf manuals PET 20User 20Manual pdf i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 122 Freescale Semiconductor Inc Useful links USB PET Software http www mqp com sw GraphicUSB setup exe Independent Test Lab http www usb org developers compliance labs i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 123 Revision history 8 Abbreviations Table 26 Abbreviations used in this document Term Definition Client Computer Controller computer networked to host PC for remote control desktop connection
61. ble Chack box an OTG device but may be for an Rte PS Embedded Host IA VBUS RAT Edit box The rated output current of an A device in Pig ED mA units i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 117 Auto PET tests Input Type Purpose Checklist ref bMaxPower is the highest current in mA declared in any of the device s Configuration Descriptors This value ignores current drawn under the Battery Charging provisions Maximum time in seconds specified by vendor from powering on the UUT until it is TPWRUP RDY Edit box ready to perform USB functionality By PI24 default this is set to 30 seconds but a vendor is permitted to specify a longer time The maximum time in seconds that VBUS is left on for by an A device in the absence of a B device connecting The default value is TA_WAIT_BCO Edi thirty seconds A vendor is permitted to it box F N max specify a longer time but should be aware that this will have an impact on the time taken for and therefore possibly the cost of compliance testing The test will use the VID PID combination specified during tests for error messages Unknown Dev Edit boxes when an unknown B device not capable of _ No HNP HNP is connected A default value 1A0A 0201 is used but any other device not on the UUT s TPL may be defined here The test will use the VID PID combination specified during tests for error messages Unkn
62. c PID 8187 FS Device addr 4 VID Qa5c PID 5801 HS Hub addr 1 VID 8087 PID 0020 Update Display Exit Figure 82 Select USB20CV Chapter 9 Tests i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 77 78 Device Framework Test Testing Interface number 0 Alternate setting 0 Current Measurement Test Device Summary p HID Tests Hub Tests MSC Tests Optional Test Description abort e Launch Report Viewer Goto Reports Directory Update Display Figure 83 Prompt box after USB20CV Chapter 9 Tests E Compliance Test I Prompt for Test Parameters Debug Now Starting Test Endpoint Descriptor Test Configuration Index 0 ess OtherSpeedConfiguration Index 0 Start time Wed Dec 03 14 59 01 2014 Select Test Suite i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc Device Framework Test amp USB 3 Gen X Command Verifier oun mm i as ET A e r Select Test Mode Compliance Test D Validating Chapter 9 Tests USB 2 devices cvtests with MSXML Version 6 Debug Validation succeeded Select Test Suite Billboard Tests xHCI beta a Chapter 9 Tests USB 2 devices Chapter 9 Tests USB 3 Gen X devices E Current Measurement Test USB 2 devices Current Measurement Test USB 3 Gen X devices Device Summary HTN Ta
63. cond and Third Packets EL_22 Measure Interpacket Gap Between First and Second Packets EL 28 Measure Device CHIRP K Latency 2 500 us lt VALUE lt 6 000000 ms EL 29 Measure Device CHIRP K Duration 1 000 ms lt VALUE lt 7 000 ms EL_31 Device Hi Speed Terminations Enable and D Disconnect Time EL_7 Device Non Monotonic Edge Test 16 640 ns lt VALUE lt 399 400 ns 16 640 ns lt VALUE lt 399 400 ns 1 ns lt VALUE lt 500 000 us Must transition back to high speed operation within De Mesume Timing Response two bit times from the end of resume time signaling EL_27 Device CHIRP Response to Reset irom Hed ee 3 100 ms lt VALUE lt 6 000 ms i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 26 Freescale Semiconductor Inc Electrical test procedure and software configuration Test name Pass limits EL 28 Device CHIRP Response to Reset from Suspend 2 500 us lt VALUE lt 6 000000 ms EL 38 EL 39 Device Suspend Timing Response 3 000 ms lt VALUE lt 3 125 ms EL 8 Device J Test 360 mV lt D lt 440 mV 10 mV lt D lt 10 mV EL_8 Device K Test 360 mV lt D lt 440 mV 10 mV lt D lt 10 mV EL_9 Device SEO_NAK Test 10 mV lt D lt 10 mV 10 mV lt D lt 10 mV EL_18 Minimum SYNC Field Detect the end of the SYNC field within 12 bit times EL_17 Receiver sensit
64. ct device to test this an MSC Configuration this Configuration is MSC Interface Descriptor Test Device Co Class Request Test Device Configure Error Recovery Test Device Config Case 1 Device Configured Case 2 Device Configured Case 9 Device Configured Optional Test Description Abort Update Display Exit Figure 87 USB20CV MSC Tests It is only necessary to run these tests once at either high speed or full speed as described in the explanation in USB IF Compliance Updates i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 82 Freescale Semiconductor Inc Device Framework Test 4 USB 2 0 Command Verifier Running Power Up Test Device Configured Select Test Mode Compliance Test I Prompt for Test Parameters C Debug Select Test Suite Chapter 9 Tests Current Measurement Test Flags 0x0 Y CBW Data Transfer Length 0x0 CBW CDB Length 0xa Test Failed Test Not Run Disconnect and power off MSC device then click OK To abort this test click ABORT each Configuration Duration 2 seconds Stopping Test USB Mass Storage Required Command Test Configuration Index 0 Number of Fails 0 Aborts 0 Warnings 0 Now Starting Test USB Mass Storage Power Up Test Configuration Index 0 Start time Mon Jun 08 09 56 45 2015 Optional Test Description Abort
65. d A Receptacle adapter if the product is an OTG device Checklist TPL4 MSG2 MSG3 MSG5 Prove the functionality of the all device categories listed in TPL attached downstream from one hub Pass Criteria Test instructions 1 Power ON the A UUT Ifthe product is an OTG device with a Micro AB receptacle then attach a Micro A plug to Standard A Receptacle adapter Ifthe B device requires external power power on the B device Attach the hub Attach one supported high speed device downstream from the hub and prove its functionality Prove the functionality of each supported category downstream from one hub Detach the high speed device DAR 19 Attach one supported full speed device if supported downstream from the hub and prove its functionality 7 Detach the full speed device i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 105 Interoperability Tests 5 2 9 A UUT Hub Maximum Tier test To prove that a hub attached to an OTG A device or EH hub either functions or Purpose causes a hub error message Applies to OTG A devices and EHes which support hub s Description Test the hub functionality with TPL peripherals One 4 port High Speed Self Powered Hub If hub support is performed by VID PID in TPL use this Hub Test setup At least one TPL device from each category FS device if listed on TPL for TT stress Precon
66. d ON Preconditions Use a Micro A plug to Standard A Receptacle adapter if the product is an OTG device Checklist E15 E18 The functionality of the full or low speed device is proven If a device does not work a clear error message shall be shown to the user Pass Criteria Test instructions 1 Power on the A UUT Ifthe product is an OTG device with a Micro AB receptacle then attach a Micro A plug to Standard A Receptacle adapter Ifthe B device requires external power power on the B device Attach one of the peripherals listed in the test setup above Check if a clear message is generated to the end user Repeat the above steps for each of the peripherals listed in the test setup dr TD Note that an error message should be generated when attaching a device in a device class which is not already covered by a product on the TPL It is not permitted to support device classes without listing corresponding products on your TPL 5 2 7 A UUT Hub Error Message test To prove that the OTG A device or EH generates the correct error message Purpose when attaching an unsupported device Applies to OTG A devices and EHes Description Observe error messages when attaching unsupported peripherals One unsupported low speed device One unsupported full speed device Test setup One unsupported high speed device One unsupported super speed device One unsupported composite device with
67. d Signal Quality and Transition Time Test Host Low Speed Signal Quality Test Host Low Sosed Rise Tme Test information orly gt Host Low Speed Fall Time Test information only oprop Test Configure Host and Self Powered Hubs Drop Test Host and Self Powered Hubs Droop Test Description A USB Low Speed driver must have 10 to 90 single ended rise and fall times between 75ns and 300ns i 3Tests Check the test s you would like torun Connection UNKNOWN Hest Under Tast Path Direct Connect SiD0 Cable Low Spsed Teat Device I ouse Figure 20 Downstream LS Signal Test environment i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 21 22 Electrical test procedure and software configuration Dr and D Vv A 0 an ann ann y 550 A 309 400 500 600 Figure 21 Downstream low speed eye diagram i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc Electrical test procedure and software configuration Dr and D and commen mode signals W Figure 22 Downstream low speed waveform 3 2 6 Host Drop and Droop tests The Drop test is a measure of a host hub s ability to host full load current while keeping the output voltage above specification To perform this test VBUS is measured with all downstream ports loaded with 500 mA loads for host and self powered hubs The lowest value mea
68. d on which end of the cable the test fixture is attached in relation to the device being tested All HS peripherals with a B receptacle are tested near end at the peripheral s receptacle HS devices that have a captive cable are tested far end at the end of the captive cable Full speed electrical tests are always performed far end the length of the cable used in HS electrical tests is not important High speed electrical tests of downstream ports on hosts and hubs are always performed near end For detailed explanation of far end and near end in USB IF compliance updates see http compliance usb org index asp UpdateFile Electrical 8 i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc Electrical test procedure and software configuration 5 Click on Run Tests in the USB Automated Test software on the oscilloscope After the test is finished you can view the report on the Html Report page USB Test USB Device File View Help a abele Safe TaskFlow Setup Select Tests Configure Connect Run Tests Results Html Report J USB Tests Ell Hi Speed J Device Hi Speed Select Tests Low and Full Speed Upstream Full Speed Signal Quality Test O Upstream Low Speed Signal Quality Test Inrush Current Test El O Back voltage Test Before Enumerate El O Back voltage Test After Enumerate V 9 Tests Check the test s you would like to run Con
69. device of each supported category The A UUT is powered OFF Preconditions Use a Micro A plug to Standard A Receptacle adapter if the product is an OTG device Checklist C3 Prove the functionality of the B devices in combination with A UUT For the composite device it is not mandatory to prove functionality however if the device does not operate a clear message shall be generated by the A UUT If a device does not work a clear error message shall be shown to the user Pass Criteria Test instructions 1 Power OFF the A UUT Ifthe product is an OTG device with a Micro AB receptacle then attach a Micro A plug to Standard A Receptacle adapter Ifthe B device requires external power power on the B device 2 Attach a B device taken and prove that it functions correctly 3 Power ON the A UUT 4 Prove that the B device functions correctly 5 Repeat the above steps for each of the different supported category 5 2 4 A UUT Legacy Speed Test Purpose To prove the functionality of the OTG A device or EH in full or low speed High speed OTG A devices and EHes that have a full or low speed device on Applies to their TPL Perform this test only if it has not been performed in one of the previous tests Description Test the functionality of the full or low speed TPL device One supported full speed full speed support is mandatory or low speed device The A UUT is powered ON Preconditions U
70. ditions The A UUT is powered ON Use a Micro A plug to Standard A Receptacle adapter if the product is an OTG device Checklist TPL4 MSG2 MSG3 MSG5 Pass Criteria Prove the functionality of the all device categories listed in TPL attached downstream from one hub Test instructions Power on the A UUT 1 2 3 4 5 Ifthe product is an OTG device with a Micro AB receptacle then attach a Micro A plug to Standard A Receptacle adapter Attach hubs to the maximum tier Attach one TPL device downstream from the last hub and prove functionality Attach another hub downstream from the max tier of hubs Check that an appropriate error message is generated 5 2 10 A UUT Hub Concurrent and Independently test To prove that a hub attached to an OTG A device or EH hub either functions or Purpose if it does not function that it causes a hub error message Applies to OTG A devices and EHes which support hub s Description Test the hub functionality with TPL peripherals One 4 port high speed self powered hub If hub support is performed by VID PID in TPL use this hub Test setup At least one TPL device from each category FS device if listed on TPL for TT stress Preconditions The A UUT is powered ON Use a Micro A plug to Standard A Receptacle adapter if the product is an OTG device Checklist TPL4 MSG2 MSG3 MSG5 Pass Criteria Prove the function
71. e 18 USBCV current requirements Device State Measurement Current Requirement Device Feature Unconfigured 0 17mA lt 100 mA All peripheral devices lt bMaxPower lt 100 mA Low power bus powered device Configured 0 17 mA lt bMaxPower lt 100 mA Self powered device lt bMaxPower lt 500 mA High power bus powered device lt 100 mA Low power bus powered device Active lt 500 mA High power bus powered device 0 17 mA lt 100 mA Self powered device Suspend lt 0 5 mA Remote wakeup unsupported device 0 17 mA lt 2 5 mA Remote wakeup supported device Powered state 0 17 mA lt 2 5 mA Battery charging not supported device suspend lt 100 mA Battery charging supported device 4 4 1 Unconfigured Configured Current Test The USB 2 0 DUT is set to unconfigured configured state by using the tool USB20CV For a USB 3 0 device the unconfigured configured state can be forced by using USB30CV l bMaxPower is defined as the maximum power consumption of the USB device from the bus in this specific configuration when the device is fully operational expressed in 2 mA units Da puai i MX 6 series acts as a self powered device in device mode i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 85 Device Framework Test Test instructions 1 Connect the downstream port of a HS hub to a DUT and the upstream port of a HS hub to the
72. e Descriptor Test e TD 9 5 Endpoint Descriptor Test e TD 9 7 BOS Descriptor Test e TD 9 9 Halt Endpoint Test e TD 9 12 Remote Wakeup Test e TD 9 13 Set Configuration Test e TD 9 14 Suspend Resume Test e TD 9 16 Enumeration Test e TD 9 17 Other Speed Configuration Descriptor Test i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 75 Device Framework Test TD 9 18 Device Qualifier Descriptor Test TD 9 21 LPM L 1 Suspend Resume Test Test instructions 1 Install USB20CV on the test bed computer with USB2 0 ports and USB30CV on the test bed Computer with USB3 0 ports Connect the downstream port of a HS hub to DUT and the upstream port to the test bed computer Ensure that the gold tree HS hub is used Run USB20CV on your computer Select Chapter 9 Tests and then click the Run button to launch the tests Select the DUT device in the list click on Ok as shown in Figure 82 After Chapter 9 tests are finished the USB20CV pop out window shows which other tests need to be done as shown in Figure 83 The i MX 6 series acts as a mass storage in Device Mode If the pop out box prompts you to do more tests than just the MSC you must check the configuration of the supported device class Click the Launch Report Viewer to view the test report From the basic Chapter 9 Tests you can get VID PID and other information about the DUT The VID must be your company VID The MS
73. e document Configuring USB on i MX 6 Series AN4589 3 5 1 USBPHYx_TXn The USB PHY Transmitter Control Register handles the transmit controls Bit fields TXCAL45DP and TXCAL45DM D_CAL adjust the output voltage amplitude I The software does not support full feature OTG this port is usually used as a device or Embedded Host selected by USB ID i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 69 Electrical test procedure and software configuration Command samples unit tests memtool 0x20c9010 1 OTG Port Read register data unit tests memtool 0x20cA010 1 Host Port Read register data unit tests memtool 0x20c9010 0x1c060607 write oTG PHY TX unit tests memtool 0x20cA010 0x1c060607 write HOST PHY TX Table 15 USBPHYx_TXn register settings Name USBPHYx TXn Description The USB PHY Transmitter Control Register handles the transmit controls Bit 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 16 Reset value 0 0 0 1 0 0 0 0 0 0 0 0 0 1 1 0 i fe x E ele a Field D Z A 5 2 ie gt gt lt gt definitions a 2 ois a O H q cc m aa amp Q 9 EVE lt k Bit 15114113 1 111101 9 8 7 6 4 3 2 1 0 a z NE 3 f 3 efinitions 3 39 a D q oc Zia O cc a Li gt gt X lt kK Signal vi s r Nemes Description Bit fields TXCAL45DP and
74. er USB PET 6 2 Test environment The following section outlines the test environment 6 2 1 Test cables required The cables required by the PET tester are described below Each cable should be labeled and specify the lead loop resistance value required to be entered into the test dialog if the cable is replaced The tester application contains a check box to specify whether the UUT has a captive cable as in this case the captive test cable is deemed to be part of the unit under test i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 113 Auto PET tests 6 2 2 Test set up Table 22 Special test cable A Micro B plug to Micro B plug Micro B plug Micro B plug Purpose PET UUT 1 1 VBUS 2 2 D 3 3 D 4 4 ID 5 5 GND Table 23 Special test cable B Micro B plug to Standard A plug Micro B plug Standard A plug Purpose PET UUT 1 1 VBUS 2 2 D 3 3 D 5 4 GND The cables required by the PET tester are described below Each cable should be labeled and specify the lead loop resistance value required to be entered into the test dialog if the cable is replaced The tester application contains a check box to specify whether the UUT has a captive cable as in this case the captive test cable is deemed to be part of the unit under test 6 2 3 OTG device as Unit Under Test When running a test suite relat
75. erial Bus Rev 3 1 USB Command Verifier Compliance Test Specification USB IF http www usb org developers tools USB30CVSpec 1 4 pdf e Universal Serial Bus Mass Storage Class Compliance Test Specification USB IF http www usb org developers docs devclass_docs Mass Storage Specification Overview v1 4 2 19 2010 pdf e i MX 6Dual 6Quad Applications Processor Reference Manual IMX6DQRM e i MX 6Solo 6DualLite Applications Processor Reference Manual IMX6SDLRM e i MX 6SoloLite Applications Processor Reference Manual IMX6SLRM e i MX 6SoloX Applications Processor Reference Manual IMX6SXRM e Configuring USB on i MX 6 Series AN4589 i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 9 Electrical test procedure and software configuration 3 Electrical test procedure and software configuration 3 1 Software configuration for electrical test Compared to a standard Linux Android release you may need to perform the software changes below to implement the certification tests it is applicable from the imx_3 10 31_1 1 0 Linux BSP GA release For the release previous to that you may need to apply the related patches and some examples may be different for former releases the user needs to change accordingly See the detailed information in this document How to do USB Compliance Test for 3 10 y kernel on the Freescale website https community freescale com docs DOC 105609 3 2
76. es not go into suspend then a message will appear saying that the active DUT will not allow suspend to occur 4 Use DUT to wake the system check operation of all USB devices including DUT Pass is considered when all of the following items are complete The system suspends and wakes up with no problems All devices including DUT operates as expected 6 Fail is considered when any of the following items occur The system blue screens or locks up The system cannot suspend and wake up The DUT fails to operate as expected One or more Gold Tree devices fail to operate f Computer Management File Action View Help es P aFHe rss Computer Management Local 4 4 838367 11 A a System Tools Batteries Task Scheduler Q Bluetooth Radios HID compliant mouse Properties es Event Viewer JE Computer FEET EEE Fl Shared Folders amp ControlVault Device General Diver Batata Power Management Local Users and Groups w Disk drives HID compliant mouse Performance Display adapters P d Device Manager 25 Human Interface Devices 4 amp Storage J Intel R Dynamic Platform Allow the computer to tum off this device to save power f Disk Management amp Keyboards V Allow this device to wake the computer By Services and Applications A Mice and other pointing di Dell Touchpad A HID compliant mouse Monitors amp Network adapters amp Bluetoo
77. est Description Tests the sensitivity of the receivers on the upstream facing port of the device under test Figure 55 Device Receiver Sensitivity Test i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 49 Electrical test procedure and software configuration Hi speed Host Initialize Port D Test Port D E2645 66503 E2649 26403 Device Receiver Test Fixture coaxial cable oP 8493C or 154335 pulse generator Figure 56 Device Receiver Sensitivity Test environment HS Electrical Test Tool Device Test Select Device Device Control i Device Command VID Ox4b4 PID 0 6330 Address 1 Port 5 DEVICE DESCRIPTOR LOOP DEVICE DESCRIPTOR SET ADDRESS Figure 57 Device Test SEO NAK command i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 50 Freescale Semiconductor Inc Electrical test procedure and software configuration File Control Setup Measure Analyze Utilities Help 1 05 PM vw USB Hi Speed Receiver Sensitivity Test G ata generator pevice r Instructions Refer to Test Documentation mu m arket generator packet le eag Measurements DELGA K Y 9 9719900 us 720 mY 10 0462313 us 691 mV 20 0182213 1 411 Figure 58 Receiver respond with NAK to IN from data generator gt File Control Setup Measure Analyze Utilities Help 1 07 PM Acquisition is stopped 10 0 Instruc
78. ester on the menu bar The Test Suite dialog appears as shown in Figure 100 3 Select the type of unit to be tested using the Unit Under Test combo box l If the Embedded Host uses a standard Type A receptacle and it does not support ADP SRP HNP session Therefore only 6 7 17 should be tested 2 Only the Embedded Host using Micro AB receptacle needs to run this test i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 119 BERE SST Auto PET tests 4 Then refer to the completed Compliance Checklist and ensure that the other Unit Under Test checkboxes and parameters are correctly entered 5 The appropriate tests will be loaded into the Selected Tests list box These tests are now ready to automatically run in sequence 6 Specify a Product name so that the reports can be saved into an appropriate folder Click on Run to start the test suite 8 A text report file will be created into which the test results are written as shown in Figure 101 USB PET Test Suites Ez OTG 2 0 and BC 1 2 Device Emulator Command Verifier m Unit Under Test Tests available for USB PET m Options Ge IA VBUS RATED 100 ma po Anavser Can C OTG Device Embedded Host JT Uses Micro AB bMaxPower 100 mA I Debug Peripheral Only I Save Info Only z I Supports Sessions TPWRUP_RDY 30 sec I SAP as Mts Cable A 230 mOhm TA WAIT BCON max 30 sec IT HNP as A d
79. evice T FS Not Avaliable CableB 500 mOhm I HNP Polling as A des p urce IMAX_BC 1500 ma I ADP as j Product Folder Name I SRP as IT HNP asB C ouin Jul VID PID Poa Unkn Dev No HNP TADA 0201 h I ADP as B device Unikn Dev HNP a h m Test Selection Vers Script Folder ee ee EEE Risen ol Official NOTG 2 0 BC 1 2N Er E Leakage CT A ST OTG ADP mpet A OTG capable of ADP and SRP State Transition Test ICT A CT ATA AND NMACDD mant ANTE manahin af AND h nnt COD Omia Terntinn Tant Selected Tests Description v Remove Add Custom Remove All C A IT t A sts Leakage CT A ST EH ADP mpet EH Standard A capable of ADP and SRP State Transition Test CT A ST EH ADP NOSRP mpet EH Standard A capable of ADP but not SRP State Transition Test CT A CT CU CDD man CU fCiandard AV nanakia af COD h aat AND Cian Trnntinn Tant High speed Electrical Test Modes Host rens Figure 100 USB PET Test suites i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 120 Freescale Semiconductor Inc ca GraphicUSB Report Final Test 0003 File Edit View Operations Window Help Auto PET tests LIER ETL ENESTE Blam Am aale eo Vbus 0 000V ADP29 FSEErr EO When the A device is ready to act in host or peripheral role does VBUS reach VOTG 5ESS VLD within TA VBUS ATT of an attachment event being detected by ADP unless an over current
80. fication Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 81 Device Framework Test Test instructions 1 Connect the downstream port of a HS hub to the DUT and connect the upstream port of the HS hub to the test bed computer Ensure that the gold tree HS hub is used 2 Run USB20CV on your computer select MSC Tests and then click the Run button to launch the tests Select the DUT device in the list and click on Ok as shown in Figure 87 as 4 During the test a pop out dialog will ask you to disconnect and power off DUT and then repower DUT as shown in Figure 88 After the test is completed click on Launch Report Viewer to view the test report A Change the HS hub to a gold tree FS hub then run the test again in full speed mode 7 Run USB30CV on your computer do the MSC Tests again gt amp USB 2 0 Command Verifier Running InitializeTestSuite m Select Test Mode Compliance Test I Prompt for Test Parameters Debug Windows 7 Enterprise Build 7601 18717 x86fre win7sp1 gdr 150113 1808 Select Test Suite Service Pack 1 0 Chapter 9 Tests a Current Measurement Test CVExe exe ver 1 5 0 0 CommandvVerifierLog dil ver 1 5 0 0 TSMFCGuiDialogHelperDLL dil ver 1 5 0 0 TestUtilities dll ver 1 5 0 0 TestSuiteEngine dll ver 1 5 0 0 EhciDevIOCTL dll ver 1 4 14 0 EhciTestServices dll ver 1 4 14 0 USB 2 0 eHCI Command Verifier WN lam Please sele
81. fixture into the upstream facing port of the DUT using the 4 inch USB cable 5 Connect the Init Port of the test fixture to a high speed capable port of the test bed computer with a 5 meter USB cable 6 Attach the single end probes on channel 2 to D of TP2 and on channel 3 to D of TP2 7 Reboot the device to restore the USB device to normal operation 8 Click on Enumerate Bus on the menu of the HS Electrical Test Tool Choose the correct device select Suspend from the Device Command drop down menu then click on Execute i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 39 Electrical test procedure and software configuration once to place the device into suspend The captured suspend transition should appear as in Figure 45 9 Select Resume then click on Execute once to resume the device from suspend The captured resume transition should appear as in Figure 47 10 Select Reset then click on Execute once to reset the device operating in high speed The captured transition should appear as in Figure 49 11 Select Suspend and click on Execute to place the device into suspend once more Then select Reset and click on Execute once to reset the device from suspend The captured transition should appear as in Figure 50 12 When the Testing Complete dialog appears click on Ok The Results tab shows the test results and the Html Report shows the complete report USB Test
82. icro A plug to Standard A Receptacle adapter Ifthe B device requires external power power on the B device 2 Attach a hub if required Attach the B device and prove functionality 4 Place the A UUT into standby follow A UUT vendor guidelines to force the host in standby mode Detach the B device and attach it to another EH port or another downstream hub port 6 Take the A UUT out of standby mode standby A UUT may also come out of standby automatically on attach 7 Verify that the A UUT behaves normally Prove functionality of the B device 9 If different types of standby modes are supported repeat the test until all modes have been tested 5 2 17 A UUT Standby Remote Wakeup test Purpose To prove the remote wakeup functionality of an OTG A device or EH Applies to OTG A devices or EHes which support standby and remote wakeup D scrintion Perform a USB remote wakeup event and verify that the A UUT operates p correctly after the A UUT leaves standby mode Test setup At least one TPL peripheral which supports remote wakeup The A UUT is powered ON Preconditions Use Micro A plug to Standard A Receptacle adapter if the product is an OTG device Checklist C2 Compliant standby behavior is observed when a remote wakeup event is performed during standby Pass Criteria Test instructions 1 Power ON the A UUT Ifthe product is an OTG device with a Micro AB receptacle then at
83. igure 10 2 Connect the power supply to the DUT and connect the device upstream port to the back voltage test fixture using a known good USB cable as shown in Figure 11 Measure and record DC voltages on VBUS D and D Voltages should all be less than or equal to 400 mV Any voltages greater than 400 mV will be recorded as a failure 3 Plug the DUT into a known good host and verify proper enumeration Unplug the USB cable from the host and reconnect the USB cable to the back voltage test fixture Measure and record the DC voltages of VBUS D and D All voltages must be less than or equal to 400 mV Any voltages greater than 400 mV will be recorded as a failure 4 After the test is finished you can view the report on the Html Report page USB Test USB Device ag j lt File View Tools Help DW Set Up Select Tests H 0 Device Suspend Resume Reset Timing JO Device Test J K SE0_NAK o Device Receiver Sensitivity O Low and Full Speed 10 Inrush Current Test O O Upstream Full Speed Signal Quality and Transition Time Test o O Upstream Low Speed Signal Quality and Transition Time Test J Backvoltage Test Before Enumerate VBUS Before Enumerate D Before Enumerate D Before Enumerate 3 Back voltage Test After Enumerate VBUS After Enumerate D After Enumerate D After Enumerate Test Group Back voltage Test Before Enumerate Description Measures the voltages of VBUS D and D at up
84. ing to an OTG device the first test will prompt you to attach it to the PET using special cable A i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 114 Freescale Semiconductor Inc Auto PET tests PC Host for PET High Speed USB Link PET Special Test Cable A OTG Unit Under Test Figure 97 Setup number 1 OTG device 6 2 4 Embedded Host as Unit Under Test When running a test suite relating to an Embedded Host using a Standard A receptacle the first test will prompt you to attach it to the PET using special cable B When running a test suite relating to an Embedded Host using a Micro AB receptacle the first test will prompt you to attach it to the PET using special cable A i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 115 Auto PET tests PC Host for PET High Speed USB Link Special Test Cable A or Special Test Cable B Embedded Host Unit Under Test Figure 98 Setup number 2 Embedded Host 6 2 5 Peripheral only as Unit Under Test When running a test suite relating to a peripheral only OTG device the first test will prompt you to attach it to the PET using special cable A PC Host for PET High Speed USB Link Captive Cable or Special Test Cable A OTG Peripheral Only Device Unit Under Test Figure 99 Setup number 3 peripheral only 1 If the peri
85. ior is observed Test instructions 1 Power on the A UUT i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 108 Freescale Semiconductor Inc Interoperability Tests Ifthe product is an OTG device with a Micro AB receptacle then attach a Micro A plug to Standard A Receptacle adapter Ifthe B device requires external power power on the B device 2 Attach a B device and prove its functionality Place the A UUT in standby follow the A UUT vendor guidelines to force the host into standby mode 4 Take the A UUT out of standby mode A UUT may also come out of standby automatically on detach Prove the functionality of the B device 6 Repeat the above steps for each of the different supported category 5 2 14 A UUT Standby Disconnect test To prove the standby functionality of the OTG A device or EH when a Purpose peripheral is detached during standby mode Applies to OTG A devices and EHes which support standby Description Detach TPL peripheral while A UUT is in standby mode Verify that the A UUT operates correctly after the A UUT leaves standby mode Test setup At least one TPL peripheral The A UUT is powered ON Preconditions Use a Micro A plug to Standard A Receptacle adapter if the product is an OTG device Checklist C2 Pass Criteria Compliant standby behavior is observed Test instructions 1 Power on the A UUT Ifthe product is a
86. ivity VALUE lt 200 mV EL 16 Squelch VALUE gt 100 mV 1 If the product used for certification only has a standard Micro B receptacle and no captive cable EL 5 should not be used TP1 TP2 Transceiver Connector Hub Circuit Board D hd B TP3 TP4 Transceiver Connector Device Circuit Board Figure 24 HS signal measurement planes i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 27 Electrical test procedure and software configuration 400mV Differential 0 Volts Differential 400mV Differential Unit Interval 0 100 Figure 25 Template 1 for device without a captive cable 3 3 2 Device High Speed Signal Quality Test These tests measure the ability of transmitters to do valid high speed signaling The high speed signal quality is measured on upstream ports A high speed scope with differential probes is used Signaling data is captured with the scope and then translated to an eye pattern The signal quality eye patterns obtained from the measurements must adhere with the transmit eye patterns in the USB 2 0 specification Test Instructions 1 Select the test items in the USB Automated Test software on the oscilloscope as shown in Figure 26 and make sure you set the test type configuration option to Hi Speed Near End before running the test 2 Connect the equipment and test fixture as shown in Figure 2
87. l Test Specification USB IF http www usb org developers compliance USB IF USB 2 0 Electrical Test Spec081005 pdf Embedded Host High Speed Electrical Test Procedure USB IF http www usb org developers onthego PIDVID USB 2 0 High Speed Electrical Embedded Host and OTG MOI 1 0 pdf Universal Serial Bus Implementers Forum Device Hi Speed Electrical Test Procedure For Agilent Infiniium USB IF http www usb org developers compliance Device HS Test for Agilent pdf Universal Serial Bus Implementers Forum Host Hi Speed Electrical Test Procedure For Agilent Infiniium USB IF http www usb org developers compliance electrical tests Host HS Test for Agilent pdf Agilent N5416A USB 2 0 Compliance Test Option Agilent http www keysight com upload cmc_upload All N5416A_USB2 Compliance App Testing Not es pdf Gold Suite Summary Test Procedure V1 35 Draft USB IF http compliance usb org resources GoldSuiteTestProcedure pdf 1 i Make sure the marketing name is the same as the product name in checklists Save the checklists and TPLs in a zip file i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc Preparing for the test Allion HSEHET User Manual Allion http www allion com TestTool Allion HSEHET User Manual pdf e Universal Serial Bus Rev 2 0 USB Command Verifier Compliance Test Specification USB IF http www usb org developers tools usb20_tools usb20cv e Universal S
88. l ver 1 4 5 1 USBCommandVerifier dll ver 1 4 10 2 Device Summary state Optional Test Description i Abort Launch Report Viewer Goto Reports Directory Update Display Figure 91 USB20CV Unconfigured Current Measurement Test i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 87 Device Framework Test amp USB 2 0 Command Verifier Running Configured Current gt zx m Select Test Mode Cc nce Tes I Prompt for Test Parameters EhciTestServices dil ver 1 4 10 2 Gr USBUtilities dll ver 1 4 5 0 StackSwitcher dil ver 1 4 5 1 USBCommandVerifier dll ver 1 4 10 2 Select Test Suite Current Host PCI bus 0 device 29 function 0 Number of ports 2 Host selected PCI bus 0 device 29 function 0 DUT ected d D 0a5c PID 5800 Chapter 9 Tests Device Summary HID Tests Hub Tests MSC Tests ATA Tanta USB 2 0 eHCI Command Verifier Measure Configured Current for configuration 0 now Validate with device to Unconfigured state Test Passed Maximum Current value reported in Config Descriptor shown in the TJ display window Hit OK to proceed Test Failed Test Not Run Select Test Current Measurement Test ice to Unconfigured state elective Enumeration 3 m M For each Configuration aa ETS STEEN for Test Configuration Index 0 Configured Current id ra 0
89. lected speed Writing the PTC field back to TEST_MODE_DISABLE will enable the port state machines to progress normally from that point NOTE Low speed operations are not supported as a peripheral device PTC Any value other than zero indicates that the port is operating in test mode Value Specific Test 0000 TEST_MODE_DISABLE 0001 J STATE 0010 K STATE 0011 SEO host NAK device 0100 Packet 0101 FORCE ENABLE HS 0110 FORCE ENABLE FS 0111 FORCE ENABLE LS 1000 1111 Reserved i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 73 Electrical test procedure and software configuration Field Description Port Reset Read Write or Read Only Default 0 b In Host Mode Read Write 1 Port is in Reset 0 Port is not in Reset Default 0 When software writes a one to this bit the bus reset sequence as defined in the USB Specification Revision 2 0 is started This bit will automatically change to zero after the reset sequence is complete This behavior is different from EHCI where the host controller driver is required to set this bit to a zero after the reset duration is timed in the driver In Device Mode This bit is a read only status bit Device reset from the USB bus is also indicated in the USBSTS register Suspend Read Write or Read Only Default 0 b 1 Port in suspend state 0 Port not in suspend state In Host Mode Read Write Port Enabled Bit and Suspend bit
90. lity Tests e Provides isochronous bulk interrupt and control traffic e Tests the device behind 5 levels of nested hubs the maximum allowed e Tests the device up to 30 meters from the host the maximum allowed e Contains a high speed branch and full speed speed branch e EHCI UHCI and OHCI controllers available for testing The Gold Tree is to consist of USB IF certified consumer devices that are widely available in the market If a specific gold tree device cannot be obtained it may be substituted with a similar certified device Table 19 Gold Tree device list Multicore processor certified USB EHCI with integrated UHCI DELL XPS8700 example certified USB xHCl USB host system xHCl SuperSpeed host adapter HS hub Hi speed hub Minimum of 4 exposed Belkin F5U233 Self powered downstream ports Full speed hub Minimum of 2 exposed downstream ports likely to be a compound device USBmouse HID Low speed using interrupt transport Microsoft basic optical mouse HS Mass Memorex TravelDrive model High speed using bulk transport 32509051 Logitech QuickCam Ultra Vision P N 961471 0403 Average current Fixture to measure current consumed http www usb org developers adapt draw test jig from VBus ers enema Any listed on USB IF Cables and shorter USB Connectors Integrators List cable re er Any listed on USB IF Cables and Connectors Integrators List B plug 2 meter USB Any listed on USB IF Cables and CADIE
91. locks up 5 1 11 54 active Hibernate Resume Test Test instructions 1 Place the system in hibernation as described in section 5 1 10 2 Turn on the system 3 Check operation of all USB devices including the DUT 4 Pass is considered when all of the following items are completed The system resumes well Active operation initiated in previous step continues without error 5 Fail is considered when either of the following items occurs The system does not resume The system blue screens or locks up The DUT is not functional or does not continue operation in the previous step 5 1 12 Topology change to UHCI Test instructions 1 Change the EHCI motherboard to UHCI motherboard All other connections remain the same See Figure 94 2 Run all tests from sections 5 1 1 to 5 1 11 3 Record the test result 5 1 13 Topology change to OHCI Test instructions i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 98 Freescale Semiconductor Inc Interoperability Tests 1 Change the EHCI motherboard to the OHCI motherboard All other connections remain the same See Figure 94 2 Runall tests from sections 5 1 1 to 5 1 11 3 Record the test result 5 1 14 Topology change to XHCI Test instructions 1 Change the EHCI motherboard to the XHCI motherboard All other connections remain the same See Figure 94 2 Runall tests from 5 1 1 to 5 1 11 3 Record the test result 5 2
92. lsewhere 2015 Freescale Semiconductor Inc All rights reserved Document Number IMXUSBCGUG Rev 0 10 2015 p Po freescale K
93. lt driver connected to hub 5 with the 5 meter cable if cable is not captive 2 Check if the DUT and other devices are enumerated Pass is considered when the following is complete The DUT operates as expected with the 5 meter cable if cable is not captive 4 Fail is considered when any of the following items occur The DUT cannot be installed because it requires driver installation or application software before DUT is plugged in The DUT fails to operate The device application blue screens or crashes system The device fails to operate as expected below Hub 5 i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 94 Freescale Semiconductor Inc Interoperability Tests 5 1 3 Interoperability Test instructions 1 Operate all the devices in Gold Tree Verify that the DUT functions correctly while all other devices are operating concurrently Operate the device under test View live video from the Veo camera Transfer a large file between the Maxtor drive and the JumpDrive Pro Strike keys on the Logitech keyboard Disconnect and reconnect the Logitech mouse in the same port on Hub FS3 Move the Logitech Mouse to ensure that it still works 2 Pass is considered when all of the following items are complete The DUT operates as expected All Gold Tree devices operate well 3 Fail is considered when any of the following items occur The DUT
94. mbedded Device Low full Part Number Description Manufacturer Host hidh speed apssd high speed gasp P 81130A Pulse pattern generator Keysight Agilent 82357A USB GPIB interface Keysight Agilent 1 8493C 6 dB attenuators Keysight Agilent 1 50 ohm coaxial cable with 8120 4948 or male SMA connectors at Keysight Agilent 2 equivalent both ends i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc Preparing for the test Table 4 Miscellaneous cables and devices Required equipment Tests ee Em bedded Device Low full Description Host high ee Ne speed 5 meter USB cable any listed on USB IF web site 1 1 6 1 5 meter USB cable any listed on USB IF web site 1 1 meter USB cable any listed on USB IF web site 1 4 inch USB cable any listed on USB IF web site 1 1 1 High speed USB hub any listed on USB IF web site 4 4 Full speed USB hub any listed on USB IF web site 1 1 High speed USB device any listed on USB IF web site 1 1 Full speed USB device any listed on USB IF web site 1 Low speed USB device any listed on USB IF web site 1 Figure 1 E2649 high speed test fixture set i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 4 Freescale Semiconductor Inc te Agilent Technologies 4810 64540
95. more than 8 interfaces The A UUT is powered on Preconditions Use a Micro A plug to Standard A Receptacle adapter if the product is an OTG device Checklist E15 E18 The functionality of the full or low speed device is proven If a device does not work a clear error message shall be shown to the user Pass Criteria i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 104 Freescale Semiconductor Inc Interoperability Tests Test instructions 1 Power on the A UUT Ifthe product is an OTG device with a Micro AB receptacle then attach a Micro A plug to Standard A Receptacle adapter Ifthe B device requires external power power on the B device 2 Attach the hub 3 Aclear hub not supported message should appear 4 Attach a TPL device downstream from the hub 5 Check that the device does not function downstream from the hub 5 2 8 A UUT Hub Functionality test To prove that a hub attached to an OTG A device or EH hub either functions or Purpose causes a hub error message Applies to OTG A devices and EHes which support hub s Description Test the hub functionality with TPL peripherals One 4 port high speed self powered hub If hub support is performed by VID PID in TPL use this hub Test setup At least one TPL device from each category FS device if listed on TPL for TT stress The A UUT is powered ON Preconditions Use a Micro A plug to Standar
96. mposite device If not available use a device with one interface Test setup The A UUT is powered on Preconditions Use a Micro A plug to Standard A Receptacle adapter if the product is an OTG device Checklist MSG2 MSG3 TPL2 4 TPL7 Prove the functionality of the B devices in combination with A UUT For the composite device it is not mandatory to prove functionality however if the device does not operate a message shall be generated by the A UUT If a device does not work an error message will be shown to the user Pass Criteria Test instructions 1 Power ON the A UUT Ifthe product is an OTG device with a Micro AB receptacle then attach a Micro A plug to Standard A Receptacle adapter Ifthe B device requires external power power on the B device Attach a B device and confirm that it functions correctly Detach the B device and ensure that the device is disconnected correctly Attach the B device and confirm that it functions correctly en 3 3 Repeat the above steps for each of the different supported category with five different peripherals i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 101 Interoperability Tests 5 2 3 A UUT Boot Test Purpose To prove the functionality of an OTG A device or EH after boot Applies to OTG A devices and EHes Description Observe boot behavior while a B device is attached Test setup One B
97. n Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 43 Electrical test procedure and software configuration File Control Setup Measure Analyze Utilities Help 7 58 AM 10 0 MSa s 262 kpts Me onion my Me ge Me I ee i te td oe ee van te at bas a T current 1 2375000 ms mean 1 2375000 ms min 1 2375000 ms Figure 50 Device reset from suspend waveform 3 3 6 Device Test J K SEO NAK Test Test instructions 1 Select the test items in the USB Automated Test software on the oscilloscope as shown in Figure 51 2 Connect the equipment and test fixture as shown in Figure 52 Attach the 5 V power supply to J5 of the device high speed signal quality test fixture E2649 66401 Leave the Test switch at the off position Verify the green power LED is lit and the yellow test LED is not lit Connect the Test Port of the device high speed signal quality test fixture into the upstream facing port of the DUT using the 4 inch USB cable Connect the Init Port of the test fixture to a high speed capable port of the test bed computer with a 5 m USB cable Attach the single end probes on channel 2 to D of TP2 and on channel 3 to D of TP2 Reboot the device to restore the USB device to normal operation 4 Click on Enumerate Bus on the menu of the HS Electrical Test Tool Choose the correct device Select TEST_J from the Device Command drop down menu then click on Execute once to place the device int
98. n OTG device with a Micro AB receptacle then attach a Micro A plug to Standard A Receptacle adapter Ifthe B device requires external power power on the B device 2 Attach a peripheral and prove its functionality Place A UUT into standby follow A UUT vendor guidelines to force the host into standby mode 4 Detach the peripheral Take the A UUT out of standby A UUT may also come out of standby automatically on detach Verify that A UUT operates correctly 7 If different types of standby modes are supported repeat the test until all modes have been tested i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 109 Interoperability Tests 5 2 15 A UUT Standby Attach test To prove the standby functionality of the OTG A device or EH when a Purpose peripheral is attached during standby mode Applies to OTG A devices and EHes which support standby Description Attach a TPL peripheral while the A UUT is in standby mode Verify A UUT operates correctly after the A UUT leaves standby mode Test setup At least one TPL peripheral Preconditions The A UUT is powered ON Use a Micro A plug to Standard A Receptacle adapter if the product is an OTG device Checklist C2 Pass Criteria Compliant standby behavior is observed Test instructions 1 Power on the A UUT Ifthe product is an OTG device with a Micro AB receptacle then
99. n in Figure 77 The captured transition should be as shown in Figure 77 Click on OK to close the Test Instruction dialog After 15 seconds of suspend state the host shall issue a Resume K state on the bus then continue sending SOFs The captured transition should be as shown in Figure 78 When the Testing Complete dialog appears click on Ok The Results tab shows the test results and the Html Report shows the complete report i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 65 Electrical test procedure and software configuration USB Test USB Device File View Tools Help Dm 3 Task Flow SetUp Select Tests Configure Connect Run Tests Automation Results Html Report en EE ay Set Up Fe 4 7 Select Tests Host CHIRP Timing mink Host Suspend Resume Timing NY EL 39 Suspend Timing Res S i EL 41 Resume Timing Response EE Host Test J K SED NAK j JO Low and Full Speed Connect 4 Test Group Host Suspend Resume Timing a Run Tests Description Tests host suspend and resume timing response 7 Figure 76 Host Suspend Resume Timing Test Fie Control Setup Measure Analyze Utilities Help 2 02 PM Soos MEN I lt gt gt Figure 77 EL 39 host suspend waveform i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale
100. nc 25 Electrical test procedure and software configuration e Device Suspend Reset Resume Timing Test EL_38 EL_39 Device Suspend Timing Response EL_40 Device Resume Timing Response EL_27 Device CHIRP Response to Reset from Hi Speed Operation EL_28 Device CHIRP Response to Reset from Suspend e Device Test J K SEO_NAK Test EL_8 Device J Test EL_8 Device K Test EL 9 Device SEO_NAK Test e Device Receiver Sensitivity Test EL_18 Minimum SYNC Field EL_17 Receiver Sensitivity Test EL_16 Squelch The Device Receiver Sensitivity Test requires additional equipment digital signal generator for example the Agilent 81130A and related accessories 3 3 1 HS Device Electrical Test limits The following table shows the Electrical Test limits for the HS device Table 10 HS Device Electrical Test limits Test name Pass limits EL_2 Data Rate Within 480 Mb s 0 05 Must meet template 1 transform waveform requirements at TP3 EL_4 Eye Pattern without captive cable Must meet template 2 transform waveform requirements at TP2 EL_6 Device Rise Fall Time gt 500 ps EL_5 Eye Pattern with captive cable Must have monotonic data transitions over the vertical openings EL_21 Device Sync Field Length Test 32 bits 65 62 ns lt VALUE lt 67 700 ns EL_25 Device EOP Length Test 8 bits 15 600 ns lt VALUE lt 17 700 ns EL_22 Measure Interpacket Gap Between Se
101. nclude VID PID vendor product information features and accessories your product supports To get more information about these documents contact your certification lab The document templates can be downloaded from the USB IF website http www usb org developers compliance check list Checklist e Compliance checklist for USB On The Go and Embedded Host Supplement revision 2 0 e USB Compliance Checklist Peripheral Silicon excluding hub silicon e USB Compliance Checklist Peripherals excluding hubs e USB Compliance Checklist Systems Target Peripheral List e TPL Form for USB On The Go and Embedded Host Supplement revision 2 0 e TPL Hub Form for USB On The Go and Embedded Host Supplement revision 2 0 2 7 Register the product in USB IF After you get the test reports from your certification lab you need to submit your product to USB IF for registration to get the TID 1 Check that your company is a member of USB IF register and login to your account at https www usb org members landing 2 Click on My Account and then click on Add a Product to enter the Product Register page select a product type for your product as shown in the following figure If you do not know what product type you should choose consult your test lab Select a Product Type USB Development gt Cable Assemblies amp Connectors gt Hi Speed Development gt Cable Assemblies amp Connectors gt SuperSpeed Development gt Device Wire Ada
102. nection UNKNOWN A Test None Selected Description Select a Single Test Probe D and D in Device Under Test Path Adjacent Full Speed Device Under Test Figure 5 Upstream FS Signal Test environment 1 A full speed hub here can force the downstream devices to operate in full speed mode i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 11 Electrical test procedure and software configuration USB IF HS Electrical Test Tool PCI bus 5 device 0 function 2 2 Ports HS Electrical Test Tool Device Test NONE VID Ox4b4 PID 046560 Address 1 Port 5 VID Ox58f PID 0x9254 Address 2 Port 5 VID Ox4b4 PID Ox6550 Address 3 Port 5 SINGLE STEP SET FEATURE SINGLE STEP GET DEV DESC Figure 7 Device Control Command i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 12 Freescale Semiconductor Inc Electrical test procedure and software configuration D and D V Dt and D and common mode signals V 0 0 02 0 4 0 6 08 10 12 14 18 time ps Figure 9 Upstream full speed waveform i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 13 Electrical test procedure and software configuration 3 2 2 Back Voltage Test Test instructions 1 Select the test items in the USB Automated Test software on the oscilloscope as shown in F
103. nt Figure 14 Device Inrush Current Test result 3 2 4 Downstream Full Speed Signal Quality Test Test instructions 1 Select the test items in the USB Automated Test software on the oscilloscope as shown in Figure 15 Make sure you set the test type configuration option to Full Speed Far End before running the test 2 Connect the equipment and test fixture as shown in Figure 16 Click on Run Tests After the test is finished you can view the complete report on the Html Report page i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 17 Electrical test procedure and software configuration USB Test USB Device File View Tools Cm Select Tests Configure Connect Run Tests Automaton Results Htmi Report amp JO Hi Speed amp Low and Full Speed E Host Full Speed Signal Quality and Transition Time Test EJ O Host Full Speed Signal Quality Test Host Full Speed Rise Time Test information only EJ O Host Full Speed Fall Time Test information only Host Low Speed Signal Quality and Transition Time Test Droop Drop Test Configure 10 Host and Self Powered Hubs Drop Test CIO Host and Seif Powered Hubs Droop Test Description A USS Full Speed driver must have 10 to 90 single ended rise and fall times between 5ns and 20ns 3Tests Check the test s you would like torun Connection UNKNOWN Probe D and D in Hos
104. ntial probe amplifier Keysight Agilent 1 1 i i i Keysight Agilent N5381A Differential solder in probe ysight Agilent i _ head E2697A Single ended probe Keysight Agilent 3 N2774A Current probe Keysight Agilent 1 High speed Embedded f ion gt PRENE Bord Host electrical test board Alion 1 Packet Master USB USB protocol and electrical MQP 1 E PET tester 33401A Digital multimeter Keysight Agilent 1 1 1 i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc Preparing for the test Test equipment Tests Embedded Device Low full Part Number Description Manufacturer Host high D high speed speed speed P40A 1P2J DC5V Power Supply SunPower 1 1 1 Table 2 Test fixtures for the USB electrical test Test fixture Tests Embedded Device ah P Low full Part number Description Manufacturer Host high high Speed speed speed E2649 66401 Device high speed signal ight Agilent 1 quality test fixture E2649 66402 Host high speed signal Keysight Agilent 1 quality test fixture USB 2 0 3 0 E2649 66405 Droop Drop test fixture Keysight Agilent 1 USB inrush SQiDD E E2646A B iest fiture Keysight Agilent 1 E2649 66403 ee r test Keysight Agilent 1 ixture Table 3 Test fixtures for the USB electrical test Required equipment Tests eat e
105. o TEST_J test mode 5 Switch the test fixture into the test position Use a multimeter to measure the DC voltage on the D lines at TP2 with respect to GND then record the measurement in the pop out dialog i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 44 Freescale Semiconductor Inc Electrical test procedure and software configuration Reboot the device to restore the USB device to normal operation 7 Click on Enumerate Bus on the menu of the HS Electrical Test Tool Choose the correct device Select TEST K from the Device Command drop down menu then click on EXECUTE once to place the device into TEST K test mode 8 Switch the test fixture into the test position Use a multimeter to measure the DC voltage on the D lines at TP2 with respect to GND then record the measurement in the pop out dialog 9 Reboot the device to restore the USB device to normal operation 10 Click on Enumerate Bus on the menu of the HS Electrical Test Tool Choose the correct device Select TEST SEO NAK from the Device Command drop down menu then click on exectute once to place the device into TEST SEO NAK test mode 11 Switch the test fixture to the test position Use a multimeter to measure the DC voltage on the D lines at TP2 with respect to GND then record the measurement in the pop out dialog 12 When the Testing Complete dialog appears click on Ok The Results tab shows the test results and the Html Report
106. of this register define the port states as follows Bits Port Enabled Suspend Port State Ox Disable 10 Enable 11 Suspend SUSP When in suspend state downstream propagation of data is blocked on this port except for port reset The blocking occurs at the end of the current transaction if a transaction was in progress when this bit was written to 1 In the suspend state the port is sensitive to resume detection Note that the bit status does not change until the port is suspended and that there may be a delay in suspending a port if there is a transaction currently in progress on the host controller will unconditionally set this bit to zero when software sets the Force Port Resume bit to zero The host controller ignores a write of zero to this bit If host software sets this bit to a one when the port is not enabled that is Port enabled bit is a zero the results are undefined PR Force Port Resume Read Write 1 Resume detected driven on port O No resume K state detected driven on port Default 0 In Host Mode Software sets this bit to one to drive resume signaling The Host Controller sets this bit to one if a J to K transition is detected while the port is in the Suspend state When this bit transitions to a one because a J to K transition is detected the Port Change Detect bit in the USBSTS register is also set to one This bit will automatically change to zero after the resume sequence is complete This behavior is diffe
107. onfigured state are completed do not switch off the USBCV You must detach and reattach the DUT and then measure the current Record the maximum current value then click on OK to finish the test i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 89 Interoperability Tests av Hub Reset 3 or Hub Deconfigured Configured Powered Suspend State is N Inactive Suspended A WE Bus nn d Inactive Default Suspended gm Address lie di N ioe i Assigned Suspended Bus petty A eo Device Device econfigured Configured Bus Inactive a aa Kosa Figure 93 Powered suspend state 5 Interoperability Tests 5 1 Device Interoperability Test The Device Interoperability test evaluates the device s ability to interoperate with the host system and coexist with other USB devices The test also provides some insight into usability issues of the device and associated software See the detailed description of the Embedded Host Interoperability Test and also see the Interoperability section of the Gold Suite Summary Test Procedure V1 35 Draft Interoperability makes use of an arrangement of USB peripherals known as the Gold Tree The Gold Tree consists of these characteristics i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 90 Freescale Semiconductor Inc Interoperabi
108. onsidered when all following items are complete The DUT enumerates behind HS5 using a 5 meter cable or its own captive cable The driver installs with an INF file provided on a disk or a CD or is enumerated automatically by the system class driver The DUT does not require a reboot The DUT is correctly identified by Device Manager and no yellow exclamation point is shown for any device 10 Fail is considered when any of the following items occur The DUT cannot be installed because it requires driver installation or application software before DUT is ever plugged in The DUT does not enumerate below hub 5 The driver blue screens during enumeration The DUT requires reboot The DUT is incorrectly identified by the device manager or a device is flagged as not operational yellow exclamation point i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 93 Interoperability Tests EHCI OHCI 7 de 3 PCI adapter Mass Storage 2 Hub FS2 Intel EHCI UHCI Motherboard O00000000000007 C0000000000000 C0000000000007 C00000000000C7 DOC 3000 v Bus powered Hub FS1 Keypad On ta tan ak LITT y v nnunnn Mass Storage 1 Figure 94 Interoperability Test environment 5 1 2 Operation with default drivers Test instructions 1 The DUT demonstrates correct operation using the defau
109. or the test Table6 Embedded Host test requirements for a Standard A connector i a USB IF test gt Big is 6 6 l USB speed V g 3 45 K a 6 ro 4 ri x 5 G 2 on n a lt A A A a High speed Host A A Al A Full speed Host A A Low speed Host A A A Table 7 Device test requirements for a Micro B connector To amp x F su al els o 5 E o gt 5 3 3 5 6 6 8 3 i E 3 8 o o i USB IF test gt 2 3 E T z lt lo D o USB speed V a D S z mlS Se A HE TE O gt 3 ej n n 2 no Z lt lt 2 co E gt gt gt Full speed device A A 7 A A A A High speed device A A E A A A A A For the peripheral if the silicon is only compliant with the general USB 2 0 specification it is recognized as a standard USB2 0 peripheral The automated test Ch6 must not be launched If the silicon is compliant to the supplement of OTG and EH rev 2 0 with OTG descriptor in the declaration the device is recognized as a B peripheral and the automated test channel 6 must be launched i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 6 Freescale Semiconductor Inc Preparing for the test 2 6 Compliance checklist and TPL Before sending the product and accessories to the certification lab several checklists and TPLs must be prepared These documents i
110. own Dev Edit boxes when an unknown B device capable of HNP gt gt HNP is connected A default value 1A0A 0202 is used but any other device not on the UUT s TPL may be defined here bMaxPower Edit box PI17 PI10 6 3 A UUT tests Test items e A UUT VBUS Voltage and Current Measurements e A UUT Bypass Capacitance e A UUT SRP e A UUT ADP e A UUT Leakage e EH Capable of ADP and SRP State Transition Test Standard A e EH Capable of ADP but not SRP State Transition Test Standard A e EH Capable of SRP but not ADP State Transition Test Standard A e EH with no Session Support State Transition Test Standard A e EH Capable of ADP and SRP Micro AB or OTG A Capable of ADP and SRP but not HNP State Transition Test e EH Capable of ADP but not SRP Micro AB or OTG A Capable of ADP but not SRP or HNP State Transition Test e EH Capable of SRP but not ADP Micro AB or OTG A Capable of SRP but not ADP or HNP State Transition Test i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 118 Freescale Semiconductor Inc Auto PET tests e EH with no Session Support State Transition Test Micro AB or OTG A with no Session or HNP Support e A UUT Device No Response for connection timeout e A UUT Unsupported Device Message e A UUT Device No Response for HNP enable e EH using Micro AB Incorrect Connection
111. pheral is not compliant with OTG and the EH rev 2 0 supplement meaning it is only compliant with the general USB 2 0 specification then the Auto PET test for peripheral only is not needed i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 116 Freescale Semiconductor Inc 6 2 6 User input before test runs Before running any test suite the PET needs to be informed of a number of parameters by the test operator Most of the information should be available from the checklist supplied by the vendor The Auto PET tests following tables describe the information required Typically PET software would modify the available options to those applying to the currently chosen device type Table 24 Information obtained from the checklist Input Type Purpose Checklist ref OTG Device Automatically selected by UUT items OTG A Mutually LOTS Embedded Host exclusive check Automatically Selected UUT item PI2 boxes Embedded Host Peripheral Onl Automatically selected by UUT item P y Peripheral Only Check this box for an EH which uses a Uses Micro AB Check box Micro AB receptacle instead of a Standard A PI5a receptacle It will be automatically selected for OTG devices Check this box if the OTG A UUT or EH with Micro AB receptacle does not keep VBUS enabled all the time that the ID pin is held Supports low Check this box for an EH with Standard Sessions neck Dax
112. pter Silicon gt Wireless Development gt Device Wire Adapters gt Wireless Home p ve at et Development gt Embedded Hosts gt Full Speed lt lt Development gt Embedded Hosts gt Hi Speed Development gt Embedded Hosts gt SuperSpeed Product Search gt Compliance Mem Development gt ExpressCard gt Connector Development gt ExpressCard gt Host Ha Register a Product f Development gt ExpressCard gt Module Development gt ExpressCard gt Power Switch Register a new product for testing Development gt Host Wire Adapter Silicon gt Wireless The USB IF reserves the right not to Development gt Host Wire Adapters gt Wireless acceptor to remove a product from t Development gt Hubs Silicon gt Full Speed Integrators List for any reason Development gt Hubs Silicon gt Hi Speed Development gt Hubs Silicon gt SuperSpeed Select Product Type Development gt IP Building Blocks gt Hi Speed Select the type of product you are sy Development gt IP Building Blocks gt Low Full Speed Required Field Development gt IP Building Blocks gt SuperSpeed Product Type Development gt Embedded Hosts gt Hi Speed v Cancel lt lt Back Select gt gt Figure 3 USB product type 1 Use the VID of your company registered on USB IF and not the VID of your USB silicon provider The VID of the Freescale product on USB IF is 15A2 in hex or 5538 in decimal You can download the whole Comp
113. r mode the device is in for instance whether they are self powered or bus powered For a hi speed device the average current is measured in hi speed and full speed mode All hi speed measurements are performed by connecting the DUT after one self powered hi speed hub A full speed It is only necessary to run these tests once at either high speed or full speed as described in the explanation in USB IF Compliance Updates i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 84 Freescale Semiconductor Inc Device Framework Test self powered hub is connected to the first hi speed hub in order to force a hi speed DUT to enter its full speed mode A device should also be measured using the supported power mode in the following circumstances e When a device is only capable of operating in self powered mode all measurements are performed in self powered mode This means that the device is unable to enumerate without being connected to an external power supply e When a device is capable of operating in bus powered mode all measurements are performed in bus powered mode even when the device claims to be self powered in its device descriptor e When a device has battery charging capabilities over USB the power measurements are performed in worst case scenario This is most likely when the product has a dead battery Test items e Unconfigured current e Configured current e Active current e Suspend current Tabl
114. rent from EHCI where the FPR host controller driver is required to set this bit to a zero after the resume duration is timed in the driver In Device mode After the device has been in Suspend State for 5 ms or more software must set this bit to one to drive resume signaling before clearing The Device Controller will set this bit to one if a J to K transition is detected while the port is in the Suspend state The bit will be cleared when the device returns to normal operation Also when this bit will be cleared because a K to J transition detected the Port Change Detect bit in the USBSTS register is also set to one 3 5 4 Other useful commands and scripts Command samples echo mem gt sys power state Let the system enter suspend standby mode echo enabled gt sys class tty ttymxc0 power wakeup Set Console as the system wakeup source for i in find sys name wakeup grep usb do echo enabled gt Si echo echo enabled gt i done USB remote wakeup as system wakeup source is not enabled by default user can enable this feature by using this script after plugging in the USB device i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 74 Freescale Semiconductor Inc Device Framework Test 4 Device Framework Test 4 1 Introduction of Device Framework Test When testing a USB device or hub you must test the USBCV Command Verifier It will automatically test the
115. report USB Test USB Device File View Tools Help Daw Enr Tjo uss Tests Set Up JO Hi Speed JO Host Hi Speed y H O Host Hi speed Signal Quality H O Host Controller Packet Parameters raser I Host CHIRP Timing H O Host Suspend Resume Timing H Host Test J k SED NAK EL_8 Host J Test Configure EL_8 Host K Test EL_9 Host SEO NAK Test Test Group Host Test J K SEO NAK JO Low and Full Speed Description Measures the K and J signal amplitudes Figure 79 Host Test_J K SEO NAK Test i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 68 Freescale Semiconductor Inc Electrical test procedure and software configuration Figure 80 Host Test J K SEO NAK Test environment Table 14 Host Drop Test record Test mode D Voltage mV D Voltage mV Expected value so oe ME ee SEO_NAK Hom cx D lt 10mV 3 5 i MX 6 series USB PHY registers and software configurations USB signal integrity depends on many factors such as circuit design PCB layout stack up and impedance Each product may be different from one another so customers need to fine tune the parameters in order to obtain the best signal quality The test board has routed out two USB Ports one OTG and one host Each of the ports has several registers to adjust the signal voltage level and slew rate See the detailed description of the registers in th
116. rs to use Freescale products There are no express or implied copyright licenses granted hereunder to design or fabricate any integrated circuits based on the information in this document Freescale reserves the right to make changes without further notice to any products herein Freescale makes no warranty representation or guarantee regarding the suitability of its products for any particular purpose nor does Freescale assume any liability arising out of the application or use of any product or circuit and specifically disclaims any and all liability including without limitation consequential or incidental damages Typical parameters that may be provided in Freescale data sheets and or specifications can and do vary in different applications and actual performance may vary over time All operating parameters including typicals must be validated for each customer application by customer s technical experts Freescale does not convey any license under its patent rights nor the rights of others Freescale sells products pursuant to standard terms and conditions of sale which can be found at the following address freescale com SalesTermsandConditions Freescale and the Freescale logo are trademarks of Freescale Semiconductor Inc Reg U S Pat amp Tm Off All other products or service names are the property of their respective owners ARM and Cortex are registered trademarks of ARM Limited or its subsidiaries in the EU and or e
117. se a Micro A plug to Standard A Receptacle adapter if the product is an OTG device Checklist E15 E18 The functionality of the full or low speed device is proven If a device does not work a clear error message shall be shown to the user Test setup Pass Criteria Test instructions 1 Power ON the A UUT Ifthe product is an OTG device with a Micro AB receptacle then attach a Micro A plug to Standard A Receptacle adapter i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 102 Freescale Semiconductor Inc Interoperability Tests Ifthe B device requires external power power on the B device 2 Attach a Full Speed B device and prove functionality 5 2 5 A UUT Concurrent and Independently Test Purpose To prove the functionality of all downstream ports Applies to EH with multiple ports ns Test the concurrent and independent functioning of the TPL peripherals on Description each downstream port For each downstream port a similar device from the TPL If detection is made using VID PID and or for category support the number of B devices is equal to the number of ports This test shall be performed on each supported category Preconditions The A UUT is powered ON Test setup Checklist E17 The A UUT can operate the device concurrently and independently or a selection method is available for the end user to select a device Note that a A UUT is
118. sseevsasesases 90 Sl Device Interoperability Test iusnsndsmem 90 Diz Embedded Host Interoperability Test 99 PET BR 113 6 1 Introduction of PET 5 ALS 6 2 Test EnyiroNMent sic 2 d 03e dsdsclostedecdacdseeaelidedhataias 113 6 3 AUUT EE 118 Useful links Abbreviate ararnar ER aaa 124 PE ea EE ER EN 125 ey lt freescale Preparing for the test 2 Preparing for the test This chapter lists all required materials for running the compliance test including equipment documents software and other necessary materials 2 1 Test boards Tests were performed on the following boards e MCIMX6SXSDB e MCIMX6SLEVK e MCIMX6QAICPU 1 e MCIMX6DLAICPUI e MCIMX6ULEVK 2 2 Test environment DUT OS Linux 3 10 31_1 1 0_ GA e Test bed computer OS WIN7 2 3 Test equipment The following tables list the test equipment and the tests for which they are required Keysight Agilent USB electrical test equipment was used in testing however you may use equipment from other vendors instead such as Tektronix and Lecroy Table 1 Digital oscilloscope software and accessories Test equipment Tests Embedded Device Low full Part Number Description Manufacturer Host high P speed high speed speed USB 2 0 automated N5416A software Keysight Agilent 1 1 1 igi ti Keysight Agil DS09254A Digital real time eysight Agilent 1 i oscilloscope 1169A Differe
119. ste estPassed Seton Fun Failed Test Not Select Test Chapter 9 Tests USB 2 A Chapter 9 Tests a For Each Configuration M Default State M TD 9 1 Device Descriptor Test M TD 9 2 Configuration Descriptor Test M TD 9 3 Interface Association Descriptor Test TD 9 4 Interface Descriptor Test M TD 9 5 Endpoint Descriptor Test M TD 9 7 BOS Descriptor Test Addressed State MITD 9 1 Device Descriptor Test M TD 9 2 Configuration Descriptor Test TD 9 3 Interface Association Descriptor Test M TD 9 4 Interface Descriptor Test M TD 9 5 Endpoint Descriptor Test M TD 9 7 BOS Descriptor Test Z Configured State MITD 9 1 Device Descriptor Test ye m r m Optional Test Description Run Launch Report Viewer Goto Reports Directory Update Display Exit Figure 84 Select USB30CV Chapter 9 Tests i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 79 Device Framework Test amp USB 3 Gen X Command Verifier Running Display Other Tests To Run X Select Test Mode Compliance Test I Prompt for Test Parameters ER EE User Input module initialized E Windows 7 Ultimate Build 7601 18798 amd64fre win7sp1_gdr 150316 1654 Select Test Suite Service Pack 1 0 HIN Tactc Select Test Chapter 9 Tests USB 3 Gen X devices Current Measurement Test USB 2 devices Current Measurement Test
120. stream port of device to test that device does not supply VBUS at its upstream port or provide power to D D VW 6 Tests Check the test s you would like to run Connection UNKNOWN 7 Figure 10 Automated Test software setting for the Back Voltage Test i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 14 Freescale Semiconductor Inc Electrical test procedure and software configuration Upstream USB Port Figure 11 Back Voltage Test environment Table 8 Back Voltage Test record DC voltage before DC voltage after Test point enumeration MV enumeration MV Expected value VDC VBUS 72 72 lt 400 mV D 0 0 lt 400 mV D 0 0 lt 400 mV 3 2 3 Device Inrush Current Test The USB 2 0 specification enables a maximum capacity of 10 uF and therefore a maximum inrush of 50 uC Note that it is required to have at least 1 uF of capacity in order to make ADP detection possible The DUT cannot consume more that 100 mA during the 100 ms starting up period Inrush current should be measured for a minimum of 100 ms after attachment Test instructions 1 Connect the equipment and test fixture as shown in Figure 12 Use the current probe to capture the VBUS current waveform Ensure the probe direction is the same When taking the measurement first calibrate the current probe to 0 mA A current probe will produce a DC offset that will result in an incorrect measurement if
121. sured across all ports must be between 4 75 V and 5 5 V for host and self powered hubs The Droop test is a transient test on adjacent ports When a device is hot plugged into another port the droop in VBUS supplied to a port must be less than or equal to 330 mV for host self powered and bus powered hubs This test is not needed there is only one host port on board Test instructions 1 First power the test fixture from your computer or a USB charger The DS1 LED must illuminate green LED 2 There are several switches buttons used for general control of the test fixture These include Switch S5 enables you to select either the Droop or Drop test USB IF has published an ECN to increase the maximum voltage on VBUS from 5 25 V to 5 5 V in August 2014 The maximum voltage is now 5 5 V i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 23 Electrical test procedure and software configuration Switch S4 enables you to select either the 100 mA or 500 mA load Press and hold S1 for at least three seconds to turn the test fixture on While pressing and holding S2 press S1 to turn the test fixture off When the fixture is on pressing S2 will enable the left port When the fixture is on pressing S1 will enable the right port 3 Measure VBUS at the downstream USB connector with no cable or device inserted no load then record it as Vu 4 Measure VBUS at the
122. t Under Test Path full speed hub Self poweree Hub 1 Hi speed hub Salt power d Hub 2 Host Under Tast Full Spoad Test Device 5n Cab Figure 16 Downstream FS Signal Test environment i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 18 Freescale Semiconductor Inc Electrical test procedure and software configuration Aa pur ag O w EA Zs time ns Figure 17 Downstream full speed eye diagram i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 19 Electrical test procedure and software configuration De and D and common mode signals V time us Figure 18 Downstream full speed waveform 3 2 5 Downstream Low Speed Signal Quality Test Test instructions 1 Select the test items in the USB Automated Test software on the oscilloscope as shown in Figure 19 Ensure that you set the Test Type configuration option to Low Speed Near End before running the test 2 Connect the equipment and test fixture as shown in Figure 1 Click on Run Tests After the test is finished you can view the report on the Html Report page i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 20 Freescale Semiconductor Inc Electrical test procedure and software configuration USB Test USB Device Low and Full Speed F Host Ful Speed Signal Quality and Transition Time Test Host Low Spee
123. t procedure and software configuration File Control Setup Measure Analyze Utilities Help 7 19 AM Seas HE PETE Scales Figure 37 EL 22 device inter packet gap between second and third packets waveform HS Electrical Test Tool Device Test i Select Device Device Control Device Command Device Address Status Window Operation Successful Enumerate Bu Return To Main Figure 38 Single Step Set Feature second step i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 36 Electrical test procedure and software configuration File Control Setup Measure Analyze Utilities Help 7 20 AM ofe ae 50 0 ns PENG Scales Figure 39 EL 22 Device inter packet gap between first and second packets waveform 3 3 4 Device CHIRP Timing Test Test instructions ie Select the test items in the USB Automated Test software on the oscilloscope as shown in Figure 40 and make sure you set the Test Type configuration option to Hi Speed Near End before running the test Connect the equipment and test fixture as shown in Figure 41 Attach the 5 V power supply to J5 of the device hi speed signal quality test fixture E2649 66401 Leave the Test switch at the off position Verify the green power LED is lit and the yellow test LED is not lit Connect the Test Port of the device hi speed signal quality test fixture into the upstream facing port of
124. tach a Micro A plug to Standard A Receptacle adapter Ifthe B device requires external power power on the B device 2 Attach the B device Prove the functionality of the A UUT with the B device 4 Put the A UUT into standby follow A UUT vendor guidelines to force the host in standby mode 5 Performa USB remote wakeup event from the B device i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 111 Auto PET tests 6 Prove the functionality of the A UUT with the B device i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 112 Freescale Semiconductor Inc Auto PET tests 6 Auto PET tests 6 1 Introduction of PET The PET Protocol and Electrical Tester is a unit that is designed to perform compliance testing or assist with development work leading towards compliance testing on Battery Charging On the Go and other general USB applications The tests in this section test only a partial list of all the possible parameters and compliant behavior The tests should not be considered as a full validation test plan For the detailed description of PET Test see Chapter 6 of USB On The Go and Embedded Host Automated Compliance Plan The Packet Master USB PET is used by most Compliance Test Labs and is delivered complete with MQP s Windows application Graphic USB for generating test reports and also analyzer style captures Figure 96 Packet Mast
125. tches the data generator in place of the host controller The data generator emulates the IN packets from the host controller Verify that all packets from the data generator are NAK d by the port under test as shown in Figure 58 Record the pass fail in EL 18 Use the cursor and the rotary knob on the 81130A to select the IN ADDI STO setup file Move the cursor to Perform Operation and turn the knob to select Recall Then press the enter key to load it This generates IN packets of compliant amplitude with a 32 bit SYNC field packet pattern Verify that all packets from the data generator are NAK d by the port under test as shown in Figure 59 Adjust the output level of each channel as follows Select the levels soft key then move the cursor to the numeric value for high voltage value Adjust the output level with the rotary knob or using the number keys while monitoring the actual level on the oscilloscope Use the cursor arrow buttons to select the channel to change Reduce the amplitude of the data generator packets in 20 mV steps on the generator before the attenuator while monitoring the NAK response from the device on the oscilloscope The adjustment should be made to both channels such that OUTPUT and OUTPUT are matched as indicated by the data generator readout Reduce the amplitude until the NAK packets become intermittent At this point increase the amplitude such that the NAK packet
126. te LDO USB 3 2 V unit tests memtool 0x20c8120 0x00010F71 write LDO USB 3 0 V unit tests memtool 0x20c8120 0x00010071 write LDO USB 2 65 V i MX6Q USB USB OTG CHD USB OTG VBUS USB OTG VBUS USB OTG DN USB OTG DN USB OTG DP lt gt gt USB OTG DP VDDUSB CAP T ap USB USB H1 DP lt gt gt USB HOST DP USB H1f DN USB HOST DN USB H1 VBUS REQGAVT10AC Figure 81 i MX 6 USB ports i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 71 Electrical test procedure and software configuration Table 16 USBPHYx_TXn register settings Name PMU REG 3P0 Description This register defines the control and status bits for the 3 0 V regulator powered by the p host USB VBUS pins Bit 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 16 Reset value 0 0 0 0 olojo 0 0 0 1 01 0 0 0 0 0 O O 3 amp PE Z a A Field definitions 3 gt cc x Sla Bit 15 14 13 12 11 10 9 8 7 6 5 4 3 0 Reset value 0 0 0 0 1 1 1 1 0 1 1 1 0 0 m f a m on F 5 O0 g 8 E 3 g 5 92 2 a H m L 2 E S a Field definitions D 5 Zi LL o w a l D A O O olga ar X 5 S OQ r lt 7 0a re a Zz LU a Oo LLI zZ ul Wi cc Signal Names Description Control bits to adjust the regulator output voltage in 25 mV steps Ox1F 3 4 V 0x0F
127. test packets Click on the Run Tests button of the Automated Test software on the oscilloscope Switch the Test Switch S1 to the Test position according to the requirement of the Automated Test Software Verify the yellow test LED is lit You should see the transmitted test packet on the oscilloscope as shown in Figure 30 When the Testing Complete dialog appears click on Ok The Results tab shows the test results and the Html Report shows the complete report USB Test USB Device File View Tools Help D M nare Go SetUp Select Tests Configure Connect Run Tests Automation Results Html Report USB Tests B D O Device Hi Speed E Device Hi Speed Signal Quality Test O EL_2EL_4EL_5 Data Eye and Mask Test O EL 6 Device Rise Tme EL 6 Device Fall Time j amp 7 Device Non Monotonic Edge Test Ea O Device Packet Parameters Configure H O O Device CHIRP Timing Device Suspend Resume Reset Timing E Device Test J K SEO_NAK E Device Receiver Sensitivity Low and Full Speed 10 Inrush Current Test Test Group Device Hi Speed Signal Quality Test Description Tests signal quality of hi speed test packet transmitted from the device under test The signal quality test looks at signal eye End of Packet EOP width signaling rate rise fall times consecutive jitter paired JK jitter and paired KJ jitter 4Tests Check the test s you would like to run Connection UNKNOWN
128. th Device Pers amp Bluetooth Device RFC i Cisco AnyConnect Sec amp Dell Wireless 1707 802 amp Intel R Ethernet Conng amp Microsoft Virtual WiFi N IF Ports COM amp LPT 0 Processors 8 Smart card readers Sound video and game cq lt gt Storage controllers OK Cancel sil System devices Figure 95 Enable the device to wake up the computer i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 96 Freescale Semiconductor Inc Interoperability Tests 5 1 7 53 Active Suspend Test Test instructions 1 Disable remote wake up on all USB devices including the DUT 2 Operate the DUT while placing the system into suspend mode Start gt Shutdown gt Sleep wait 5 10 seconds after the system shutdown 3 Ifthe system does not go into suspend mode then a message will appear saying that the active DUT will not allow suspend to occur 4 Pass is considered when all of the following items are complete The system suspends with no problems The system notifies the user that it cannot go into suspend 5 Fail is considered when either of the following items occur The system does not enter suspend without notification The system blue screens or locks up 5 1 8 53 Active Suspend Resume Test Test instructions 1 Place the system into suspend mode as described in section 5 1 7 2 Wake the system 3 Check operation of the DUT 4 Pass is considered
129. the DUT using the 4 inch USB cable Connect the Init Port of the test fixture to a hi speed capable port of the test bed computer with a 5 meter USB cable Attach the single end probes on channel 2 to D of TP2 attach channel 3 to D of TP2 Reboot the device to restore the USB device to normal operation Click on Enumerate Bus on the menu of the HS Electrical Test Tool The oscilloscope will capture and measure the Chirp handshake as shown in Figure 42 When the Testing Complete dialog appears click on Ok The Results tab shows the test i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc 37 Electrical test procedure and software configuration results and the Html Report shows the complete report USB Test USB Device File View Tools Help Cad or eae Task Flow SetUp Select Tests Configure Connect Run Tests Automation Results Htmi Report USB Tests Set Up m pT H 0 O Hi Speed Select Tests Device Hi Speed H 0 O Device Hi Speed Signal Quality Test H D O Device Packet Parameters EL 28 Measure Device CHIRP K Latency BL 28 Measure Device CHIRP K Duration EL_31 Device Hi Speed Terminations Enable and D Disconnect Time Device Suspend Resume Reset Timing O O Device Test J K SED NAK O O Device Receiver Sensitivity J Low and Full Speed i JO Inrush Current Test H O O Upstream Full Speed Sign
130. tions Refer to Test Documentation ANN x Yy 9 9719900 us 277 mV 10 0462313 us 268 mY 20 0182213 545 mv Figure 59 Measuring the packet amplitude i MX 6 Series USB Certification Guide User s Guide Rev 0 10 2015 Freescale Semiconductor Inc Electrical test procedure and software configuration 3 4 Host High Speed Signal Test e Host High Speed Signal Quality Test EL 2 Data Rate Test EL 3 Eye Pattern and Mask Test EL 6 Rise and Fall Time Test EL 7 Non Monotonic Edge Test e Host Packet Parameters Test EL 21 Sync Field Length Test EL 25 EOP Length Test EL 23 Inter packet Gap Between First 2 Packets Test EL 22 Measure Inter packet Gap Between Host And Device Packet Test EL 55 SOF EOP Width Test e Host CHIRP Timing Test EL 33 Measure Host CHIRP response time EL 34 Measure Host CHIRP J K duration e Host Suspend Resume Timing Test EL_39 Host Suspend Timing Response EL 41 Host Resume Timing Response e Host Test J K SEO NAK Test EL 8 Host J Test EL 8 Host K Test EL 9 Host SEO NAK Test 3 4 1 HS host electrical test limits Table 12 HS host Electrical Test limits Test name Pass limits EL 2 Data rate Within 480 Mb s 0 05 Must meet Template 1 transform waveform requirements at TP2 EL 6 Host rise fall time gt 500 ps EL 3 Data Eye and Mask Test Must have monotonic data transitions over the vertical openings
131. ween 200 mV and 200 mV For a detailed explanation of device receiver sensitivity see the following http compliance usb org index asp UpdateFile Electrical amp Format Standard 3 Packets Received Packets Received i me 200M Dont Care Don t Care Squelch p 100m me eee 1 S ZOOM wersi Combining EL_16 and EL_17 Creates Transmission Detection Envelope Figure 54 Device sensitivity detection envelope Test instructions 1 Select the test items in the USB Automated Test software on the oscilloscope as shown in Figure 55 and ensure sure the Test Type configuration option is set to Hi Speed Near End before running the test 2 Connect the equipment and test fixture as shown in Figure 56 Attach the 5 V power supply to J5 of the Device Hi Speed signal quality test fixture E2649 66401 Leave the test switch at the off position Verify the green power LED is lit and the yellow test LED is not lit Connect the Test Port of the device hi speed signal quality test fixture into the upstream facing port of the DUT using the 4 inch USB cable Connect the Init Port of the test fixture to a high speed capable port of the test bed computer with a 5 meter USB cable Attach the differential probe on channel to D D of TP2 on the test fixture Ensure the polarity on the probe lines up with D 3 Connect the 81130A pulse generator to the oscilloscope using the 8

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