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1. s A370 LSI test system combines analog and digital testing capabilities System tests mixed signal devices Teradyne has announced a new analog LSI test system designed to characterize and test mixed signal devices The A370 provides up to 50 percent greater through put than its predecessor the A360 The A370 is based on Teradyne s vector bus architecture designed as an A360 op tion to test chips with analog and digital components It also includes a high speed test computer based on bit slice tech nology flexible high speed digital testing a new module for increased throughput in dc parametrics testing and software tools to reduce programming time The A370 LSI test system ranges in price from 115 000 to 500 000 For more information contact Tera dyne 32 Harrison Ave Boston MA 02118 617 482 2700 Reader Service Number 35 Vax Pascal T announced for Teradyne memory testers A Vax Pascal T compiler is available for Teradyne s J380 series of memory test systems the company announced The compiler runs on a Vax 11 750 or larger computer with the VMS 3 0 or higher operating system Device test programs are created main tained and compiled on the Vax then downloaded to a test system The compiler accepts programs written in Teradyne s Pascal T language and generates a listing file and an object file The compiler software package includes the Vax Pascal T compiler a Vax to Teradyne computing con
2. prerecorded from an operating line to diagnose the line being tested Several tests can be preprogrammed on separate PROMs The MDT preprograms the PROM when connected in parallel The MDT allows service technicians to test both ends of the line making it a universal data communications test sys tem The MDT costs 1000 For further information contact Tech line 871 Seventh Ave Suite 32 New York NY 10019 212 333 5689 Reader Service Number 36 I O handling utility a Vaxcom to Teranet format file conversion utility and documentation For more information contact Tera dyne 660 Summer St Building 114 Box 120 Boston MA 02210 Reader Service Number 37 two wire channels The reed relay multi plexer assembly can measure period sig nals up to 125 volts The multimeter can format ASCII 16 bit binary and 32 bit binary data It also includes a buffer memory that lets the user transfer memory to a computer at rates of up to 3000 bytes per second The HP 3457A digital multimeter costs 2800 The HP44491A and HP44492A plug in scannrs cost 450 each For more information contact Hewlett Packard 1820 Embarcadero Rd Palo Alto CA 94303 Reader Service Number 38 Robots install surface mounted devices on boards at Teradyne Teradyne s Semiconductor Test Divi sion in Agoura California has added two pick and place robots for its surface mounted device board assembly opera tions Each machine can instal
3. rates up to 50 MHz System prices begin at 30 000 depend ing on the configuration Availability is estimated at 14 weeks ARO For more information contact Hew lett Packard 1820 Embarcadero Rd Palo Alto CA 94303 Reader Service Number 33 April 1985 Hewlett Packard s hybrid test card combines analog and digital board testing capabili ties for the HP 3065 New card combines analog digital board testing Hewlett Packard introduced a new hybrid card using advanced pin electronics and associate software that combines analog and digital capabilities for board testing Advantages include increased test speed reliability and drive current for testing logic families such as Fast AS and ALS according to the company The new card enhances the HP 3065 board test system A software upgrade will be available in the third quarter this year at no cost to increase hybrid point capabilities The card is compatible with the existing HP 3065 hardware and soft ware The hybrid card and its associated soft ware costs 6700 It replaces a digital card priced at 5700 or an analog card priced at 3600 Availability is about eight weeks ARO For more information contact Hew lett Packard 1820 Embarcadero Rd Palo Alto CA 94303 Reader Service Number 34 Three enhancements to existing HP data generators and analyzers allow the HP 81800S system to test high volumes of small and medium scale ICs 99 Teradyne
4. AM available from Motorola Motorola has announced the availabili ty of a 16K static RAM the MCM6168 in 45 55 and 70 nanosecond access times These SRAMs provide the speed needed for cache memory video applications engineering workstations and automated test equipment CMOS circuitry offers a maximum of 80 milliamps in active mode five milli amps in TTL level standby and two milli amps in CMOS input level standby Use of a single 5 volt power supply elimin ates the need for external clocks or timing probes The MCM6168 is packaged in a 300 mil 20 pin plastic dual line package with JEDEC standard pinout Piece pricing in quantities of 10 000 is 8 25 for the 45 na nosecond SRAM 6 00 for the 55 nanose cond version and 5 50 for the 70 nano second memory For further information contact Mot orola Memory Products Division 3501 Ed Bluestein Blvd Austin TX 78721 512 928 7505 Reader Service Number 23 DMST 2002 uses new micro based VLSI test strategy Digalog Systems has introduced the DMST 2002 a new version of the com pany s 2000 series functional test system The 2002 features a new approach for mi croprocessor based VLSI board testing improved signal source and measurement capabilities an optional Winchester hard disk and a 14 inch VDT The new testing strategy uses the tested unit s own microprocessor to run func tional test programs selected by the 2002 Test programs are stored
5. New Products lesi Editor Conrad Zagwyn LTX Corp LTX Park at University Westwood MA 01090 MTS offers mechanical test system controllers MTS Systems announced a family of controllers to automate mechanical testing systems targeted for automotive aero space and rail industries The controllers are configured into specific software and hardware packages to meet each client s needs Generally the systems provide profile generation and data acquisition classification and moni toring and test data analysis A basic sys tem includes single test station capability but can be expanded to control up to four independent or multichannel tests simul taneously Applications packages include compo nent fatigue testing structural fatigue testing field data playback multichannel data acquisition analysis and data ac quisition and classification systems Each has a true multitasking real time operating system menu driven selection and test set up routines For more information contact MTS Systems Box 24102 Minneapolis MN 55424 612 937 4000 Reader Service Number 20 Circuit simulator runs on IBM PC A version of the standard electrical cir cuit simulator Spice2 runs on IBM PCs using PC DOS AllSpice from Acotech incorporates all the simulation algorithms included in the original mainframe system including distortion analysis AllSpice can simulate more than 120 transistor devices in either the PC or t
6. ader Service Number 27 97 Computest has introduced the Series 30 lines of manufacturing defect analyzers The Model 3020 can test up to 512 points while the Model 3500 can examine as many as 2048 Both models can measure resistance over a range of 10 to 250K ohms capacitors for 0 01 to more than 10 000 microfarads as well as diode and active component orientation They also include a probe to identify any node and pin translation to identify a wrong or failed component by name or pin designation Starting prices are less than 15 000 For more information contact Computest 6055 Grissom Pkwy Titusville FL 32780 305 268 3410 Reader Service Number 28 Kollmorgen s Electronic Equipment Division has added auto ranging resistance testing to its Integri test 4510 fixtureless bare circuit board tester The resistance mode verifies values of all specified nets against assigned values in a testing range of 0 01 to 10M ohms The measurement range is 0 01 to 1 ohms 0 01 to 100 ohms 0 01 to 1K ohms and 0 01 to 1M ohms Accuracy is 0 1 percent of reading the company said Integri test uses a DEC RT 11 operating system on a PDP 11 23 with 256K RAM For more information contact Kollmorgen 320 S Service Rd Melville NY 11747 516 391 4100 Reader Service Number 29 98 Idea Inc s PLCC LCC Auto Loader in serts boards for burn in operations as fast as 6000 devices per hour Device a
7. ce Number 26 April 1985 The Zycad Fault Evaluator left available as a field upgrade to the company s Logic Evaluator right is claimed to perform fault analysis at speeds up to 1000 times greater than software simulators Zycad announces Fault Evaluator Richard Landry Managing Editor IEEE Micro Zycad Corporation last month announced the Fault Evaluator as an upgrade to its present model the Logic Evaluator According to Zycad president Richard E Offerdahl the combined package offers a project level simulation tool for designs of up to 100 000 gates or 16 000 concurrent faults per pass at speeds ap proximately 1000 times faster than software simulators The Logic Evaluator is rated at speeds from 500 000 to 16 million events per second depending upon model According to Offerdahl the Fault Evaluator is based on a concurrent fault simulation algorithm implemented with a proprietary high speed pipeline ar chitecture The Fault Evaluator is supported by the company s Zilos software a version of SimuTec s Silos Operating in either a menu driven or command based mode the software provides the capability for interactive simulation with a transparent interface to the Fault Evaluator Translators for Tegas CAE Systems Daisy IBM Mentor and Apollo systems to either Zilos or to ZIF the Fault Evaluator s internal object code are also available Zycad reported the following benchmark results for desi
8. e Number 31 IEEE DESIGN amp TEST Computer Automation has introduced a new series of compact testers for price sensitive users The new models are aimed at companies with high volume homoge neous production that do not require modular expansion to increase functional testing throughput The testers may op tionally include a high speed data link to connect the tester to the modular Mara thon test system an additional VDT for programming without interrupting tests simulation and a management informa tion system The options are available in four prepackaged configurations For more information contact Computer Automation 2181 DuPont Dr Irvine CA 92713 714 833 8830 Reader Service Number 32 High volume testing provided for digital circuits Three new products allow Hewlett Packard data generators and analyzers to be configured for high volume testing of small and medium scale ICs in incoming inspection and production test applica tions The HP 15424A performance board the HP 15425A test head and the HP 81800A software package in combination with the HP 8180A data generator the HP 8182A data analyzer and the HP 8181A data generator extender make up the HP81800S digital circuit test system The system allows the installation of 64 timing and non return to zero channels for the characterization of VLSI devices such as custom ICs and gate arrays It features data
9. gns described in Zilos for a 2500 gate design 3200 faults using 462 vectors were simulated in 30 seconds and 8600 faults in 71 seconds for a 5800 gate design 2618 faults using 9259 test vectors were simulated in 8 2 minutes In a benchmark against the Tegas 5 running on the Vax 11 780 the Fault Evaluator simulated a 2538 gate design with 3137 faults and 462 test vectors for 65 percent fault coverage in 30 seconds as compared with a reported 10 hours for the Tegas 5 Responding to criticism that the Fault Evaluator substitutes long compilation time for long runtime David Allenbaugh Zycad project manager said This is a myth Whenever you take care of one portion of the problem the other part naturally pops into view Allenbaugh claimed that using Zilos or some other language for which a translator exists total throughput time remains very fast For a single 8000 gate array compilation time for Zilos on a Vax 11 750 was 2 5 minutes versus 6 3 minutes on a Daisy system simulation time was 1 9 seconds For 16 8000 gate arrays total compilation time was 25 minutes and simulation time was 18 seconds For a 10 000 gate design executed on a Vax 11 780 compila tion ran at a rate of 110 gates per second as compared with 50 gates per second on an Apollo 300 The Fault Evaluator is available for between 450 000 and 2 million depending on model Zycad s address is 1315 Red Fox Road Arden Hills MN 55112 612 631 3175 Re
10. he PC XT versions the firm said It uses the standard UC Berkeley Spice2 version 2G 7 and requires 512K bytes of memory and an 8087 math coprocessor in the IBM PC or compatible microcom puter The package also requires DOS ver sion 2 1 or higher AllSpice costs 250 in cluding the user manual For more information contact Aco tech 713 Santa Cruz Ave 2 Menlo Park CA 94025 415 325 7999 Reader Service Number 21 96 ZIP video I O converter speeds processing Mercury Computer Systems has an nounced ZIPVID a video I O converter that combines with the ZIP 3216 array processor to speed video acquisition dur ing high speed processing of sophisticated arithmetic algorithms ZIPVID digitizes an image from an RS 170 input and passes it directly to the array processor s memory in real time eliminating the need for an external frame grabber The video I O converter also generates composite video images with resolution of 640 x 480 pixels The ZIPVID is a single Multibus board that connects directly to the ZIP 3216 which executes algorithms such as 2D FFTs convolution image rotation and erosion dilation at a rate of 30 million in structions per second ZIPVID costs 3000 in single units with quantity discounts to 1950 The ZIP 3216 costs 8000 with discounts to 5200 For more information contact Mercury Computer Systems 600 Suffolk St Lowell MA 01854 617 458 3100 Reader Service Number 22 16K SR
11. in ROM on the unit s board or are applied from EPROM memory in a close coupled functional test adapter module Standard serial or paral lel interfaces handle comunication be tween the tester and the unit The 2002 s analog source board in cludes two channels of arbitrary wave form generators each with two com plementary TT1 pulse output channels The generators have 12 bit by 2K word memory with programmable clock rates from 10 MHz to 10 Hz capable of produc ing any type of analog waveform Digital pulse streams with programmable ampli tude and duty cycles can also be produced up to 5 MHz The amplitude measurement system modes include dc filtered dc RMS and dc plus RMS as well as triggered ampli tude and equivalent time digitizing on waveforms and pulse streams to 10 MHz The time measurement system is based on the 100 MHz TCXO reference and features 10 nanosecond interval resolu tion The 2002 s measurement display electronics provides a real time waveform display with marked measurement points For more information contact Digalog Systems 3180 S 166th St New Berlin WI 53151 414 797 8000 Reader Service Number 24 IEEE DESIGN amp TEST Pattern generation card debugs hardware Northwest Instrument Systems has an nounced its Model 2300 interactive pattern generator which can either be used as a standalone debugging system or inte grated with the MicroAnalyst 2000 logic analysis workstati
12. l 1500 parts per hour compared to 200 per hour by human assemblers The company said mounting com ponents by hand is both fatiguing and 100 prone to errors As many as 160 com ponents with up to 60 part numbers are used on a single board but once they are out of their bags assemblers can t identify them visually The robots are faster and more ac curate Teradyne said The company has reassigned the displaced human installers to package bulk parts that do not come prepackaged for insertion and to finish and touch up the robot assembled boards Humans are still needed to install elec trically matched components the com pany said For more information contact Tera dyne 21255 Califa St Woodland Hills CA 91367 818 888 4850 Reader Service Number 39 IEEE DESIGN amp TEST
13. on The pattern generator provides con trolled input to stimulate the system under test while logic analysis monitors the se quence of events at key points in the system The Model 2300 can be programmed through disk based automatic setups to simulate worst case microprocessor bus timing before initial microprocessor samples are available The operating soft ware can run standalone under the IBM PC DOS or concurrently with the state and timing analyzers under IBM s Top View multitasking environment The Model 2300 including a clock con troller board and a 32 channel simulation board costs 5900 Additional 32 channel boards cost 2550 each The complete MicroAnalyst station is priced at 23 025 For more information contact North west Instrument Systems 15201 N W Greenbrier Pkwy Suite 140 Beaverton OR 97006 503 654 5151 Reader Service Number 25 Vibration Test Systems has introduced a printed circuit board random screening test system that uses two VTS shakers working in tandem through a single con trol unit The RCS 1 s design permits the use of smaller shakers and offers a broad screen capability in a compact system The system can accommodate boards ranging in size from 7 5 to 18 inches A system de signed to produce six grms with a three pound board costs less than 10 000 For more information contact Vibration Test Systems 10246 Clipper Cove Aurora OH 44202 216 562 5729 Reader Servi
14. troller file transfer program a computing controller Multimeter extends resolution to 712 digits Hewlett Packard announced its new HP 3457A multimeter which provides sytems and bench users seven measure ment functions extended resolution to 7 2 digits and scanner capabilities The 3 6 digit multimeter returns reading rates that vary from less than one every second for extremely stable readings to 1350 per second for high speed mea surement bursts New to the multimeter are frequency and period funcitons These were added to its previous dc and ac volts dc and ac cur rent and resistance functions The HP 3457A offers basic dc volts ac curacy of up to 5 ppm The maximum amplitude through the input terminals is 300 volts rms Two optional plug in scan ner cards allow multiplexed access of as many as 10 signal channels One of the optional scanners the HP 44491A offers eight two wire channels and two current actuator channels It can switch channels at a rate of 30 channels per second with a maximum amplitude of 250 volts in either ac or dc The other scanner the 44492A can scan up to 300 channesl per second with 10 RAD unveils self programming field tester RAD Computers has developed a por table self programmable MDT field tester designed to test terminals and com puter ports under any protocol using any code and at any speed between 1200 and 9600 baud A PROM plugged in the MDT contains a dialogue
15. uto loads PLCC LCC burn in boards Idea Inc s PLCC LCC Auto Loaders automatically insert up to 6000 devices per hour for burn in operations The auto loaders can handle multiple board styles that have automatic sockets Force sensing and force relieving insert heads protect the carriers from package damage The automation relieves manual insertion problems such as misorientation of parts and electrostatic discharge The insert head accommodates misaligned sockets by 0 05 inches on either the x or y axes allowing use of both new and used boards Prices begin at 44 800 For information contact Idea Inc 500 Alaska Ave Torrance CA 90503 213 320 7750 Reader Service Number 30 HP enhances Q STAR Network software Hewlett Packard has upgraded its Quality Systems for Test Analysis and Repair Network software to include three new automatic alarms and to support the recently introduced HP 2392A display ter minal on the HP 3065 board test system The new alarms alert the operator when overall yield sample yield and consecu tive failure problems are encountered The current software has a looping board alarm The new automatic alarms have user definable thresholds The new HP 2392A terminal includes a 12 inch green phosphor screen four pages of memory local edit keys and a de tachable low profile keyboard For further information contact Hew lett Packard 1820 Embarcadero Rd Palo Alto CA 94303 Reader Servic

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