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Model 2002 Multimeter User`s Manual

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2. PRINT 1 output 16 form bord swap bord Reverse byte order PRINT 1 enter 16 Get response message from 2002 EXPonent lt name gt FO RM at EXPonent lt name gt Set exponent format lt name gt NORMal Normal format HPRecision High precision format EXPonent Query exponent format This command defines the exponent format The default setting is NORMal in which case the returned value is formatted according to the engineering units of the present range for example 0 0012341E 03 on the 2k 20k or 200k range Choosing HPRecision selects the highest pre cision possible so the above example would be returned as 1 2341234E 00 with three extra digits of precision PRINT 1 output 16 form exp hpr Set high precision Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 15 INPut subsystem The INPut subsystem is used for the Model 1801 Nanovolt Preamp These commands are sum marized in Table 3 7 PREamp Commands The PREamp commands are used to control the Model 1801 Nanovolt Preamp card Refer to the Model 1801 instruction manual for detailed operating information STATe lt b gt INPut PREamp STATe lt b gt Enable or disable preamp Parameters lt b gt 1orON Enable preamp 0 or OFF Disable preamp Query STATe Query state of preamp Description With the Model 1801 installed in the option slot t
3. Default Command Description parameter SCPI Ref FREQuency Path to configure frequency COUPling ACIDC Specify input coupling AC 3 18 7 COU Pins Query input coupling REFerence lt n gt Specify reference 0 to 1586 0 3 18 9 STATe lt b gt Enable or disable reference OFF STATe Query state of reference ACQuire Use input signal as reference REFerence Query reference value DIGits lt n gt Specify measurement resolution 4 or 5 5 3 18 10 DIGits Query resolution SOURce lt name gt Select source CURRent or VOLTage VOLTage 3 18 15 SOURce Query source THReshold Path to configure threshold 3 18 16 CURRent Path to set current threshold RANGe lt n gt Specify range 0 to 1 0 001 RANGe Query range LEVel lt n gt Specify threshold level 0 LEVel Query threshold level VOLTage Path to set voltage threshold RANGe lt n gt Specify range 0 to 1000 10 RANGe Query range LEVel lt n gt Specify threshold level 0 LEVel Query threshold level TTL Set threshold to TTL level TEMPerature Path to configure four wire resistance APERture lt n gt Set integration rate in seconds 166 67e 6 to 1 Note 2 3 18 5 AUTO lt b gt Enable or disable auto aperture OFF AUTO ONCE Enable and then disable auto aperture AUTO Query auto aperture APERture Query aperture integration rate NPLCycles lt n gt Set integration rate line cycles 0 01 to 50 1 3 18 6 AUTO
4. PRINT 1 output 16 calc3 pass sour 3 sour Select line 3 PRINT 1 enter 16 Get response message from 2002 CLIMits FAIL CALCulate3 CLIM its FAIL Read composite result of limit tests This query command is used to obtain the composite result of the LIMIT 1 and LIMIT 2 tests The composite result is the logical OR ed summary of LIMIT 1 and LIMIT 2 1 One or both tests have failed 0 Both tests have passed In the event of a failure 1 you can determine which test s has failed by using the fail com mand of each limit LIMit1 FAIL and LIMit2 FAIL Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Program fragment Parameters Query Description Program fragment Description Program fragment IEEE 488 Reference This command like the other fail commands does not clear the fail indication for LIMIT 1 or LIMIT 2 PRINT 1 output 16 calc3 clim fail Query composite results of tests PRINT 1 enter 16 Get response message from 2002 BSTRobe STATe lt b gt CALCulate3 BSTRobe STATe lt b gt Control binning strobe lt b gt 1orON Enable binning strobe 0 or OFF Disable binning strobe STATe Query state of binning strobe This command is used to enable or disable the strobe for the binning operation When enabled digital output line 4 is used for the binning strobe pulse After the appropr
5. an error occurs when this command is sent The ACQuire command is coupled to the REFerence lt n gt command See the description for REFerence for details Program fragment PRINT 1 output 16 func volt dc Select DCV function SLEEP 1 Allow reading to settle PRI 1 output 16 volt dc ref acg stat on Acquire and enable refer ence PRINT 1 output 16 volt dc ref Query reference valu PRINT 1 enter 16 Get response from 2002 3 100 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 3 18 10 DIGits lt n gt SEN Se 1 CU RRent AC DIGits lt n gt Specify resolution for ACI SEN Se 1 CURRent DC DIGits lt n gt Specify resolution for DCI SEN Se 1 VO LTage AC DIGits lt n gt Specify resolution for ACV SEN Se 1 VO LTage DC DIGits lt n gt Specify resolution for DCV SEN Se 1 RESistance DIGits lt n gt Specify resolution for Q2 SEN Se 1 FRESistance DIGits lt n gt Specify resolution for Q4 SEN Se 1 FREQ uency DIGits lt n gt Specify resolution for FREQ SEN Se 1 TEM Perature DIGits lt n gt Specify resolution for TEM P Parameters lt n gt 4 3 digits for DCI ACI ACV DCV 02 Q4 31 digits 1 resolution for TEMP 4 digits for FREQ 3 412 digits for DCI ACI ACV DCV Q2 04 41 digits 0 1 resolution for TEMP 5 digits for FREQ 6 5 2 digits for DCI ACI ACV DCV Q2 Q4 5 2 digits
6. CALL initialize 21 0 CALL setoutputEOS 10 0 CALL setinputEOS 10 CALL settimeout 5000 cmd syst pres GOSUB sendcmd cmd init cont off abor GOSUB sendcmd cmd syst azer stat off GOSUB sendcmd cmd init cont on GOSUB sendcmd cmd sens func Volt DC GOSUB sendcmd Example Programs When the prompt is displayed on the computer CRT press Enter to display the 1000 readings Required equipment e Model 2002 Multimeter e Microsoft QuickBASIC 4 5 e Any one of the following IEEE 488 interfaces Keithley Model KPC 488 2 Keithley Model KPC 488 2AT Capital Equipment Corporation PC lt gt 488 The program assumes that the Model 2002 is set to address 16 Loading user library The user library for QuickBASIC 4 5 is provided with the TEEE 488 interface ieeeqb qlb Assuming QuickBASIC and the user library are in the same DOS directory enter the following command line from the DOS prompt QB L ieeegb qlb The above command line will load QuickBASIC and the user library PC controller at 21 Set Input EOS to LF Set Output EOS to LF Set timeout 5 seconds Reset 2002 Stop Trigger Model Turn Autozero off Start Trigger Model Set 2002 for DCV cmd sens volt dc dig 4 5 rang auto off Set for 4 5 Digits GOSUB sendcmd cmd sens volt dc rang upp 20 GOSUB sendcmd Autoranging off Set for 20VDC Range
7. as the decimal point for readings COMMA This option selects the comma as the decimal point for readings CLOCK The Model 2002 has a real time clock that is used for time stamping bus and buffer readings real time timestamp and as a control source for the Arm Layer Arm Layer 1 This GENERAL MENU selection is used to set the time date and format 12 hour or 24 hour for the real time clock Front Panel Operation The menu items for CLOCK are explained as follows TIME This item is used to set the time for the clock If the 12 hour format is selected AM or PM will be displayed The absence of AM or PM denotes the 24 hour format The format for time can be changed with the FORMAT menu item Use the cursor keys and the range keys to set the time hours minutes seconds DATE This item is used to set the date for the clock Use the cursor keys and the range keys to set the date Note that the day of the week Sun Mon etc is automatically calculated and displayed for the date FORMAT This item is used to select the time format for the clock e 12 HOUR With this selection real time timestamps for buffer readings are provided in the 12 hour format AM or PM Also the real time clock control source for the Arm Layer must be set using the 12 hour format e 24 HOUR With this selection real time timestamps for buffer readings are provided in the 24 hour format Also the real t
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9. l rsel real 1 1 l real offs 0 05463 l real tco 0002 emp rjunl gt Y 2 rm lay2 sour imm 2 2 acq 1 1 m layl sour imm tlin Reset 2002 and disable continuous initiation Place 2002 in idle Reset 7001 and disable continuous initiation Place 7001 in idle Enable auto zero Use only the reading in the data string Set DCV reading rate for 0 01 nplc Select 2V range Select TEMP function Disable filter Set TEMP reading rate for 0 01 nplc Assign RJUN1 to external channel 1 Assign TEMP to channels 2 and 3 Assign DCV to channels 4 and 5 External scan list chans 1 thru 5 Select TC transducer type Specify K type TC transducer Select REAL reference type Close channel 1 1 Set 07C voltage offset to 0 05463V Set temperature coefficient to 0 0002 Update reference temperature SLEEP 1 Open channel 1 1 Set arm layer 1 source to Immediate Set arm layer 2 source to Immediate Set trigger layer source to Triglink Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Program bufclint bas cont cmd GOS Arm buffer trig tcon asyn ilin 2 olin 1 UB send2002 trig tcon dir sour B send2002 ia B send ia B send B sen Tia NK NK S5 NB NK Oo S rout open all B send7001 rout scan 1 1 1 5 B send7001 arm
10. nel point C Note that the Bypass is in effect only on the first pass through the model D After the relay settles the Model 7001 7002 pulls down the Trigger Link trigger line point D Since the in strument is programmed to scan ten channels operation loops back up to point B where it waits for an input trigger Note that Bypass is no longer in effect E and Q Remember that the Model 2002 operation is at point A waiting for a trigger When the trigger line is pulled low by the Model 7001 7002 the leading negative going edge triggers the Model 2002 to measure DUT 1 point E Note that the multimeter holds the trigger line low After the measurement is complete The Model 2002 releases the trigger line point F and then loops back to point A where it waits for another input trigger 2 63 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation When the Model 2002 releases the trigger line the leading positive going edge triggers the Model 7001 7002 to close the next channel in the scan This pulls the trigger line low triggering the Model 2002 to measure the next DUT The process continues until all ten channels are scanned and mea sured 2 8 Buffer The Model 2002 has a buffer to store reading data It can acquire readings at two different rates normal and burst modes The maximum possible number of stored readings depends on the installed
11. 2 7 1 2 7 2 2 7 3 2 7 4 2 7 5 2 7 6 2 7 7 2 8 2 8 1 2 8 2 2 8 3 2 8 4 2 9 2 9 1 2 9 2 2 9 3 2 9 4 2 9 5 2 10 2 10 1 2 10 2 2 10 3 2 10 4 2 10 5 2 11 2 11 1 2 11 2 2 11 3 2 11 4 2 11 5 2 11 6 2 11 7 2 11 8 2 12 2 12 1 2 12 2 2 12 3 2 12 4 2 12 5 2 12 6 2 12 7 Multiple display of rel A E E E A cuss edea cone eave ans cons vu OE E E E A Trie ser ENG es Configu urne themeas re AAA ri ni nenien E aic Riian raie asak ehita Contisurme the scan ladito a cie ie Conbisurmp the an layer ini iia oe Ee ue Extemal E EE D Tragger EE BUS EMOS atestado iaa die dare alinea Eet Storing and recalling Teadim gs cisninionma oa EES Butter multiple E EE Hilti ii is id Filter NT D Lee E Dee e TE D OD thefilters EE Polynomial cos taa or aaa Percocet tia al ile Percent EE e EE as Selecting and configuring math Calculate multiple display its vicesssabenuccaiesetesscabs neto carrito EE AEPA EE dansa deberas AE Ee NN O Ee EG e Front panel scanner controls Using CHAN key to close and open internal channels 0 0 0 eee cee ceseceeceseeeeeeeeeeeeseeeeeeaeeseeeaeeeaee Using CONFIGURE CHAN to configure channels AA Using CONFIG SCAN to configure scanning occocccocconnononnnononnonnnncnnnon conan nc nn nnnn non cnn acc nn conc rnn an nro craneo Using SCAN to configure scan parameters cooooccnnocnnnnnonnnnnonnonoconncnncnonon nono non nono non nn non anna nana n rn enn crearan Starting and Stopping SCANNING
12. 3 23 5 Parameters Query D escription Program fragment IEEE 488 Reference These action commands are used to bypass the specified control source of the Trigger Model They are used when you do not wish to wait for the programmed event Note from the Trigger Model Figure 3 13 that arm lay2 imm and trig imm also bypass the delay The instrument must be waiting for the appropriate event when this command is sent Other wise an error occurs and the command is ignored When the command is sent the bypass occurs and operation continues on PRINT 1 output 16 trig imm Bypass measure control source COUNt lt n gt ARM SEQ uence 1 LAYer 1 COUNt lt n gt Set arm layer count ARM SEQ uence 1 LAYer2 COUNt lt n gt Set scan layer count TRIG ger SEQ uence 1 COUNt lt n gt Set measure layer count lt n gt to 99999 Specify count INF Sets count to infinite DEFault Sets count to 1 MINimum Sets count to 1 MAXimum Sets count to 99999 COUNt Queries programmed count COUNt DEFault Queries RST default count COUNt MINimum Queries lowest allowable count COUN MA Ximum Queries largest allowable count These commands are used to specify how many times operation loops around in the specified layer of operation For example if the measure count is set to 10 operation continues to loop around in the measure layer until 10 measurements are performed After the 10th measurement operation proceeds bac
13. 544 PRINT 1 output 16 stat oper enab 514 enab Set Bl and B9 of Op Enable Register and query PRINT 1 enter 16 Get response message from 2002 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Bit Position B15 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 BO Event BPT BFL BHF BAV RAV HL2 LL2 HL1 LL1 ROF Decimal Weighting 2048 512 256 128 32 16 8 4 2 1 212 29 28 27 25 24 23 22 24 2 Value 0 1 0 1 0 1 01 O 1 0 1 0 1 0 1 0 1 0 1 Value 1 Enable Measurement Event Events BPT Buffer Pretriggered 0 Disable M ask Measurement Event BFL Buffer Full BHF Buffer Half Full BAV Buffer Available RAV Reading Available HL2 High Limit 2 LL2 Low Limit 2 HL1 High Limit 1 LL1 Low Limit 1 ROF Reading O verflow Figure 3 27 Measurement Event Enable Register Bit Position B15 B14 B13 B9 B8 B7 B5 B4 B3 BO Event Decimal Weighting Value Value 1 Enable Questionable Event 0 Disable M ask Questionable Event Figure 3 28 Questionable Event Enable Register Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Events Warn Command W arning Cal Calibration Summary Temp Temperature Summary 3 123
14. FILTER AUTO AVERAGING AVERAGING MODE RESLN AUTO 1 0 1 0 01 0 001 Acquire reference temperature Select internal temperature transducer Temperature units menu Select desired temperature units Measurement speed integration time menu Select 1 PLC power line cycle 16 67msec for 60Hz 20msec for 50Hz and 400Hz Select 0 01 PLC Select 0 1 PLC Select 10 PLC Set integration time in PLC 0 01 50 Default to setting appropriate for resolution Digital filter menu Default to filter appropriate for integration time Select simple average filter 1 100 readings Select moving average or repeating average mode Display resolution menu Default to resolution appropriate for sensor Select a specific resolution Note With the Model 1801 Nanovolt Preamp installed and enabled the SENSOR menu item is used for differential thermocouple configuration 2 36 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com SENSOR This parameter is used to select the temperature sensor 4 WIRE RTD or RTD If using a 4 wire or 3 wire RTD sensor select 4 WIRE RTD If using a 2 wire RTD select RTD Selecting an RTD sensor displays the options for RTD standards Five are configured for common RTDs and the sixth allows you to enter your own RTD factors e PT100 D100 F100 PT385 and PT3916 Selects the following default parameters for the RTD standards RZ
15. Get response message from 2002 OPEN lt list gt ROUTe OPEN lt list gt lt list gt chanlist Specify channel to open ALL Open all channels where chanlist 1 to 10 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Query Description Program fragment 3 17 3 Description Program fragment 3 17 4 Parameters Query Description Program fragment IEEE 488 Reference OPEN lt list gt Query specified channel The OPEN lt list gt command is used to open a channel on the Model 2001 SCAN scanner card Since only one channel can be closed the chanlist for this command can only consist of one channel An alternate way to open a closed channel is to simply use the ALL parameter It opens whichever channel is closed The OPEN lt list gt query command is used to determine the state opened or not opened of each channel specified by the list parameter For this command the chanlist can consist of mul tiple channels See the CLOSe command for examples to express a chanlist After sending this query command and addressing the Model 2002 to talk the values for the specified channels are sent to the computer A value of 1 indicates that the channel is open and a 0 indicates that the channel is not open PRINT 1 output 16 rout clos 5 open e 1 10 Close channel and query PRINT 1 enter 16
16. Q Queues 3 16 QuickBASIC 4 5 programming 3 3 R Range 2 40 RANGe commands 3 96 Relative REN remote enable 3 157 Response time RTCLock commands S Safety symbols and terms 1 2 SAVESETU P Scanner operation examples Scanning Scanning overview SCPI conformance informatio n E 1 SDC selective device clear Selecting and configuring math Sense subsystems Signal oriented measurement commands 3 41 SPE SPD serial polling Specifications Starting and stopping scanning Status and error messages Status byte Sc request SRQ STATUS MSG 2 99 Status structure 3 6 Storing and recalling readings TCON figure commands 3 155 Temperature TEST THReshold commands 3 107 Transition filters Trigger Link Trigger model Trigger model IEEE 488 operation Trigger subsystem Triggers Two and four wire resistance 2 28 U Using CHAN key to close and open internal channels 2 78 Using CONFIGURE CHAN to configure channels 2 79 Using CONFIG SCAN to configure scanning Using SCAN to_configure scan parameters Warm up period Warranty information Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com KEITHLEY Service Form Model No Serial No Date Name and Telephone No Company
17. Query deadlocked EE 440 Query unterminated after indefi EE Table 2 4 Status and error messages Number Description E vent 900 Internal System Error EE 611 Questionable Temperature SE 610 Questionable Calibration SE 519 Excessive temp drift during cal EE 518 Low level calibration data lost EE 517 Preamp calibration data lost EE 516 Install option id lost EE 515 Calibration dates lost EE 514 DC calibration data lost EE 513 AC calibration data lost EE 512 Power on state lost EE 511 GPIB address lost EE 510 Reading buffer data lost EE 444 to Calibration Errors EE 350 see Calibration Manual 312 Buffer pretriggered SE 311 Buffer lost SE 310 Buffer full SE 309 Buffer half full SE 308 Buffer Available SE 307 Voltmeter complete SE 306 Reading Available SE 305 High limit 2 event SE 304 Low limit 2 event SE 303 High limit 1 event SE 302 Low limit 1 event SE 301 Reading overflow SE 174 Re entering the idle layer SE 173 Waiting in arm layer 2 SE 172 Waiting in arm layer 1 SE 171 Waiting in trigger layer SE 161 Program running SE 126 Device calculating SE 125 Device measuring SE 124 Device sweeping SE 123 Device ranging SE 122 Device settling SE 121 Device calibrating SE
18. Real time clock timestamp shown Figure 3 18 ASCII data format 3 79 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference REAL 32 or SREal will select the binary IEEE754 single precision data format Figure 3 19 shows the normal byte order format for each data element For example if three valid elements are specified the data string for each reading conversion is made up of three 32 bit data blocks Note that the data string for each reading conversion is preceded by a 2 byte header that is the binary equivalent of an ASCII sign and 0 Header Byte 1 s sign bit 0 positive 1 negative e exponent bits 8 f fraction bits 23 Normal byte order shown For swapped byte order bytes sent in reverse order Header Byte 4 Byte 3 Byte 2 Byte 1 The Header is only sent once for each measurement conversion Figure 3 19 IEEE754 single precision data format 32 data bits REAL 64 or DREal selects the binary IEEE754 double precision data format and is shown in Figure 3 20 normal byte order shown This format is similar to the single precision format except that it is 64 bits long Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Program fragment Parameters Query Description IEEE 488 Reference Header Byte 1 Bytes 3 4 5 and 6 notshown s sign bit 0 positive 1 n
19. SWEEP 0 1 100 0 1 interval 100 samples To program the trigger event T lt event gt TRIG lt event gt Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com HP3458A Emulation Mode Parameter Default Query Description Example TARM Purpose Format Parameter Default Query Description Example H 20 lt event gt lt event gt parameter Numeric equivalent Description AUTO 1 EXT 2 SGL 3 HOLD 4 SGL power on AUTO TRIG listed are not supported by the Model 2002 EXT Select external trigger TRIG SGL Single trigger To specify the event that arms the trigger event TARM lt event gt lt _arms gt lt event gt lt event gt parameter Numeric equivalent Triggers automatically Triggers on the negative edge of signal on external trigger connector Triggers once and reverts to HOLD Disables triggering Returns the currently specified trigger event TRIG selects the trigger event Only those events listed may be used the remaining trigger events not Description Arms automatically Arms on the negative edge of signal on external trigger connector Arms once and reverts to HOLD Disables arming AUTO 1 EXT SGL 3 HOLD 4 AUTO TARM Returns the currently selected arm event TARM defines the event that enables triggers The number of arms can range from 1 to 99999 but HP3458A parameter
20. There are two sets of limits each with high and low limit val ues You can program and enable one or both limit sets With both sets enabled the values can overlap or one set can be included in the other The only restriction is that within the same set the high limit must be greater than the low limit for a valid test The limit test is performed after polynomial and percent math operations Unit prefixes are applied before the limit test for example e Low limit 1 0 High limit 1 0 A 150mV reading equals 0 15V PASS e Low limit 1 0 High limit 1 0 A 0 6kQ reading equals 600Q FAIL Limit set 1 is available as a multiple display which shows a bar graph and a pass fail indication for the measurements Note The PASS FAIL indication is not available for ACV 2 97 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation ACI and in circuit current because other information is dis played in its place While the limits bar graph is displayed the programmed values for limit set 1 can be viewed by pressing INFO The digital output lines can be programmed to reflect the re sults of limit tests The first test that fails sets a programma ble digital output pattern where the test execution order is LOW1 HIGH1 LOW2 HIGH2 If all tests pass another programmable pattern is set Also see DIGITAL I O in para graph 2 12 7 LIMIT SE
21. 3 148 POINts lt n gt TRACe POINts lt n gt Specify buffer size No memory option MEM 1 MEM 2 lt n gt 2 to 404 2 to 1381 2 to 5980 Full 2 to 2027 2 to 6909 2 to 29908 Compact MAXimum 404 1381 5980 Full 2027 6909 29908 Compact DEFault 100 all cases MINimum 2 all cases POINts This command is used to specify the size of the buffer Notice that the valid parameter range depends on which memory option is installed and which element group full or compact is being used see EGRoup PRINT 1 output 16 trac poin 50 poin Set size of buffer PRI 1 enter 16 Get response from 2002 AUTO lt b gt TRACe POINts AUTO lt b gt Control auto buffer sizing lt b gt OorOFF Disable auto buffer sizing lorON Enable auto buffer sizing AUTO This command is used to enable or disable auto buffer sizing When enabled the buffer size defaults to the measure count value in the Trigger Model see TRIGger COUNt in Trigger sub system With auto buffer enabled changing the Trigger Model s measure count value changes the buffer size to that value Disabling auto buffer sizing does not affect the size of the buffer It simply means that you must then use the POINts command to change the buffer size If you use the POINts command to change the buffer size while auto is enabled the buffer size changes to that value and auto buffer sizing disables If you try to enable auto buffer sizi
22. 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Program fragment Parameters Query Description Program fragment 3 18 12 Parameters Query Description Program fragment IEEE 488 Reference PRINT 1 output 16 volt dc aver adv ntol 20 ntol Get noise tolerance PRINT 1 enter 16 Get response from 2002 STATe lt b gt SEN Se 1 CU RRent AC AVERage ADVanced STATe lt b gt Control advanced filter for ACI SEN Se 1 CU RRent D C AVERage AD Vanced STATe lt b gt Control advanced filter for DCI SEN Se 1 VO LTage AC AVERage AD Vanced STATe lt b gt Control advanced filter for ACV SEN Se 1 VO LTage D C AVERage AD Vanced STATe lt b gt Control advanced filter for DCV SEN Se 1 RESistance AVERage AD Vanced STATe lt b gt Control advanced filter for Q2 SEN Se 1 FRESistance AVERage AD Vanced STATe lt b gt Control advanced filter for 24 lt b gt OorOFF Disable advanced filter 1 or ON Enable advanced filter STATe Query state of advanced filter These commands are used to enable or disable the advanced filter for the specified function The ADVanced NTOLerance commands are used to set tolerance levels PRINT 1 output 16 volt dc aver adv on adv Enable advanced filter PRINT 1 enter 16 Get response from 2002 DETector commands FUNCTION lt name gt SEN Se 1 CU RRent AC D ETector
23. 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 2 3 Front Panel Operation 2 2 4 High energy circuit safety precautions To optimize safety when measuring voltage in high energy distribution circuits read and use the directions in the fol lowing warning WARNING Dangerous arcs of an explosive nature in a high energy circuit can cause severe personal injury or death If the multi meter is connected to a high energy cir cuit when set to a current range low resistance range or any other low impedance range the circuit is virtually shorted Dangerous arcing can result even when the multimeter is set to a voltage range if the minimum voltage spacing is reduced When making measurements in high energy circuits use test leads that meet the following requirements e Test leads should be fully insulated e Only use test leads that can be connected to the circuit e g alligator clips spade lugs etc for hands off mea surements e Do not use test leads that decrease voltage spacing This diminishes arc protection and creates a hazardous condition Use the following sequence when testing power circuits 1 De energize the circuit using the regular installed connect disconnect device such as a circuit breaker main switch etc 2 Attach the test leads to the circuit under test Use appro priate safety rated test leads for this application 3 Set the multimeter to the proper function and ran
24. After the measure event occurs the instrument waits until the delay period times out 0 999999 999sec before perform ing a device action COUNT With this selection you determine the number count of measurements per scan sequence The user programmed count can be smaller equal to or larger than the number of channels in the scan list For example if the scan list is made up of four channels you can program a count of 12 With this count value the instrument repeats the scan three times An advantage of repeating channels rather than scans is that delays in the scan layer of operation are avoided The mea sure delays among all 12 channels are the same INFINITE Use this selection to continuously repeat mea surements and looping in the measure layer ENTER CHAN COUNT With this selection the user determines the number of readings per scan You can pro gram the Model 2002 to measure up to 99999 times CONTROL Use this menu item to enable or disable the source bypass The source bypass is used to bypass the measure event on the first pass through the measure layer SOURCE With this selection the source bypass is enabled The measure event will be bypassed on the first pass through the scan layer This allows operation to proceed to the Delay and Device Action without having to wait for the pro grammed event ACCEPTOR With this selection the source bypass is disabled 2 47 Test Equipment Depot 800 517
25. C 10mV C coefficient Offset OmV 0 C OmV 0 C Units E C Triggers Armed Idled arm layer Source Immediate Immediate Triglink input Line 2 Line 2 Triglink output Line 1 Line 1 Count 1 1 Control Acceptor Acceptor scan layer Source Immediate Immediate Triglink input Line 2 Line 2 Triglink output Line 1 Line 1 Delay 0 0 Count Infinite 1 Control Acceptor Acceptor measure layer Source Immediate Immediate Triglink mode Asynchronous Asynchronous Triglink input Line 2 Line 2 Triglink output Line 1 Line 1 Timer 0 1sec 0 1sec Delay 0 0 Count Infinite 1 Control Acceptor Acceptor Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 2 95 Front Panel Operation 2 12 2 GPIB The GPIB menu is used for the following operations e To view or change the IEEE 488 address e To select the talk only mode and its parameters e To select the data elements to send e To view the status byte of the instrument Changing between Addressable and Talk only causes triggers to be halted ADDRESSABLE With the instrument set for Addressable it can listen and talk to a bus controller This menu item lets you check and or change the IEEE 488 address of the instrument At the factory the address is set to 16 but it can be changed to any value from 0 to 30 After selecting ADDRESSABLE the present IEEE 488 address will be displayed If y
26. ERAL MENU see paragraph 2 12 7 e Chan The channel number on which the reading was taken e Timestamp The real time or relative timestamp for each reading Timestamp type is selected from the GENERAL MENU see paragraph 2 12 7 e Status The reading status information normal read ing measurement overflow relative reading STATUS Use this menu item to view the IEEE 488 status byte Refer to Section 3 IEEE 488 Reference for information on the status byte The bits in the status byte are refreshed by exiting and re entering its menu 2 12 3 CALIBRATION The CALIBRATION menu is used for the following operations e To perform comprehensive calibration e To perform point calibration e To view or change the calibration date Some of the menu items are locked to prevent unintended changing of calibration constants COMPREHENSIVE The procedure for comprehensive calibration is locked to enable it requires the CAL switch to be pressed The proce dure uses accurate calibration equipment to supply precise DC voltages DC currents and resistance values Refer to the Model 2002 Calibration Manual for instructions POINT CALS This menu item is used to perform calibration for selected functions AC calibration requires no external equipment and can be performed by the operator at any time to ensure the accuracy of ACV and ACI measurements Test Equipment Depot 800 517 8431 99 Washington Street
27. GER BNC connector See paragraph 2 7 6 for detailed information on external triggering NOTE The front panel TRIG key see MAN UAL is active with external triggering selected Pressing the TRIG key passes operation into the scan layer MANUAL With this selection the front panel TRIG key controls the arm source Operation passes into the scan layer when the TRIG key is pressed NOTE The front panel TRIG key is active when EXTERNAL GPIB or TRIGLINK is selected GPIB With this selection bus triggers control the arm source Operation passes immediately into the scan layer when a bus trigger GET or TRG is received by the Model 2002 See Section 3 for detailed information on bus triggers NOTE The front panel TRIG key see MAN UAL is active with bus triggering selected Pressing the TRIG key passes operation into the scan layer TRIGLINK With this selection the arm source is con trolled by the Trigger Link of the Model 2002 Trigger Link is an enhanced trigger system that uses up to six lines to direct trigger pulses to and from other instruments Opera tion passes into the scan layer when the Model 2002 receives a trigger over the Trigger Link See paragraph 2 7 7 for details on using the Trigger Link NOTE The front panel TRIG key see MAN UAL is active with the Trigger Link selected Pressing the TRIG key passes operation into the scan layer 2 49 Test Equipment Depot 800 517 8431 99 Washi
28. Get response mes sage from 2002 STATe lt b gt DISPlay WIN Dow 1 TEXT STATe lt b gt Control on off message top display DISPlay WINDow2 TEXT STATe lt b gt Control on off message bottom display lt b gt 0 or OFF Disable text message for specified display 1 or ON Enable text message for specified display STATe Query state of message mode for specified display These commands enable and disable the text message modes When enabled a defined message is displayed When disabled the message is removed from the display A user defined text message remains displayed only as long as the instrument is in remote Tak ing the instrument out of remote by pressing the LOCAL key or sending LOCAL 16 cancels the message and disables the text message mode Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Program fragment Description Program fragment Description Program fragment Parameters Query Description Program fragment Parameters Query IEEE 488 Reference PRINT 1 output 16 disp text stat on stat Enable and query messag mode PRINT 1 enter 16 Get response message from 2002 DATA DISPlay W IN Dow 1 DATA DISPlay WINDow2 DATA Read top display Read bottom display These query commands are used to read what is currently being displayed on the top and bottom displays After sending
29. List all control settings describe problem and check boxes that apply to problem J Intermittent 1 Analog output follows display J Particular range or function bad specify 7 IEEE failure J Obvious problem on power up J Batteries and fuses are OK J Front panel operational LJ All ranges or functions are bad J Checked all cables Display or output check one LJ Drifts 1 Unable to zero 1 Unstable J Will not read applied input 1 Overload J Calibration only LJ Certificate of calibration required J Data required attach any additional sheets as necessary Show a block diagram of your measurement system including all instruments connected whether power is turned on or not Also describe signal source Where is the measurement being performed factory controlled laboratory out of doors etc What power line voltage is used Ambient temperature F Relative humidity Other Any additional information If special modifications have been made by the user please describe Be sure to include your name and phone number on this service form EH Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com This page left blank intentionally Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com
30. PRINT Rdg i Readings i NEXT i PRINT PRINT Total time t3 PRINT t4 t3 35 PRINT Seconds per channel t4 END G 20 Select Next buffer control mode Set OPC upon completion of commands Select external scan mode Take 7001 out of idle Take 2002 out of idle IT Loop until buffer fills Read all readings in buffer EC can only handle up to 64kB UNTalk and UNListen all devices Display reading Display total processing time for all readings Display the average time for each reading Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Example Programs Program bufclint bas cont send2002 CALL send DmmAddr cmd status RETURN send7001 CALL send ScanAddr cmd status RETURN G 21 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com HP3458A Emulation Mode Introduction This appendix provides detailed information on using the Model 2002 HP3458A emulation mode The emulation mode gives the Model 2002 a high degree of compatibility with the Hewlett Packard HP3458A Digital Multimeter allowing the instrument to be substituted for an HP3458A in an existing measurement system with little or no program modifications Firmware revision level The HP3458A emulation mode is available in Model 2002s equipped with revision
31. Program for 5 measurements and stop idle PRI 1 output 16 arm lay2 coun 1 PRI 1 output 16 trig coun 5 sour tim PRI 1 outut 16 init opc Start measurements and send opc PRI 1 enter 16 Get response when 2002 goes into idle INE INPUT 2 a Read contents of Output Queue PRINT a Display the ASCII 1 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 3 10 7 Description Program fragment 3 10 8 Parameters Description Program fragment IEEE 488 Reference O PT option identification Query Determine which options are installed in the Model 2002 The response message is made up of two comma separated fields The first field indicates the presence or absence of extra memory 0 No extra memory 8k bytes volatile MEM1 Memory Option 1 32k bytes non volatile MEM2 Memory Option 2 128k bytes non volatile The second field indicates the presence or absence of the Model 2001 SCAN scanner card 0 No scanner card installed 2001 SCAN Model 2001 SCAN installed Example The following response message indicates that Memory Option 2 and the scanner card are installed MEM2 2001 SCAN PRINT 1 output 16 opt Query installed options PRINT 1 enter 16 Send response message to 2002 RCL recall Return to a setup stored in memory No extended Model 2002 MEM1 Model 2002 MEM2 memory installed installed
32. e Timer Event detection is immediately satisfied on the initial pass through the layer Each subsequent detection is satisfied when the programmed timer inter val 1 to 999999 999 seconds elapses A timer resets to its initial state when operation loops back to a higher layer or idle Note that a timer is not available in the Arm Layer External Event detection is satisfied when an input trigger via the EXTERNAL TRIGGER connector is received by the Model 2002 Triglink Event detection is satisfied when an input trigger via the TRIGGER LINK is received by the Model 2002 e Hold With this selection event detection is not satis fied by any of the above control source events and oper ation is held up Source Bypasses As can be seen in the flowchart each layer has a path that allows operation to loop around the con trol source Each path is called a source bypass When a source bypass is enabled and the external or trigger link triglink control source is selected operation loops around the control source on the initial pass through the lay er If programmed for another event detection in the layer the bypass loop will not be in effect though it is still enabled The bypass loop resets be in effect if operation loops back to a higher layer or idle In the Arm Layer and Scan Layer enabling a source bypass also enables the respective output trigger In the Trigger Lay er its output trigger is alw
33. lt NRf gt 0 lt NRf gt 0 to 4 lt NRf gt 0 to 9 This command is used to return the Model 2002 to a setup configuration stored at a memory location The SAV command is used to store a setup configuration at a memory location see paragraph 3 10 10 If the Model 2002 does not have any extended memory installed only one setup configuration can be saved and recalled In this situation memory location 0 is the only valid parameter for the RCL command If the Model 2002 MEM1 memory element is installed up to five setup configurations can be saved and recalled In this situation memory locations 0 through 4 are valid parameters If the Model 2002 MEM2 memory element is installed up to 10 setup configurations can be saved and recalled Memory locations 0 through 9 are then valid parameters The Model 2002 is shipped from the factory with SYSTem PRESet defaults loaded into the available setup memories If a recall error occurs the setup memories default to the SYSTem PRESet values PRINT 1 output 16 rcl 0 Recall setup stored at memory location 0 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 10 9 Description Program fragment 3 10 10 Parameters Description Program fragment 3 10 11 Parameters Description RST reset reset the Model 2002 When the RST command is sent the Model 2002 perf
34. 0 01 resolution for TEMP 7 612 digits for DCI ACI ACV DCV Q2 Q4 612 digits 0 001 resolution for TEMP 8 7 digits for DCI ACI ACV DCV Q2 Q4 9 8 digits for DCI ACI ACV DCV Q2 Q4 DEFault T digits for DCV Q2 and Q4 6 digits for DCI and ACI 5 digits for ACV 5 digits 0 01 resolution for TEMP 5 digits for FREQ MINimum 31 digits for DCI ACI ACV DCV 02 Q4 31 digits 1 resolution for TEMP 4 digits for FREQ MAXimum 8 digits for DCI ACI ACV DCV 02 04 612 digits 0 001 resolution for TEMP 5 digits for FREQ Query DIGits Query selected resolution DIGits DEFault DIGits MINimum IEEE 488 Reference Query RST default resolution Query minimum allowable resolution DIGits MAXimum Query maximum allowable resolution Description These commands are used to select display resolution for the specified measurement function Even though the parameters for this command are expressed as integers 4 to 9 you can specify resolution using real numbers For example to select 31 2 digit resolution let lt n gt 3 5 for 4 ad let lt n gt 4 5 and so on Internally the instrument rounds the entered parameter value to the nearest integer Program fragment PRINT 1 output 16 volt dc dig 4 5 dig Select 4Vd DCV resolution PRINT 1 enter 16 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Get response f
35. AUTO Default to filter appropriate for integration time AVERAGING Program a simple average filter 1 100 readings ADVANCED Program a simple average filter 1 100 readings with a noise tolerance window 0 100 of range Select moving average or repeating average mode RESOLUTION Display resolution menu AUTO Default to resolution appropriate for integration time 3 5d 4 5d 5 5d 6 5d Select a specific resolution 7 5d 8 5d 2 10 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Table 2 7 Front Panel Operation CONFIGURE ACV menu structure Menu item Description SPEED Measurement speed integration time menu NORMAL Select 1 PLC power line cycle 16 67msec for 60Hz 20msec for 50Hz and 400Hz FAST Select 0 01 PLC MEDIUM Select 0 1 PLC HIACCURACY Select 10 PLC SET SPEED EXACTLY Set integration time in PLC 0 01 50 SET BY RSLN Default to setting appropriate for resolution FILTER Digital filter menu AUTO Default to filter appropriate for integration time AVERAGING Program a simple average filter 1 100 readings ADVANCED Program a simple average filter 1 100 readings with a noise tolerance AVERAGING MODE RESOLUTION AUTO 3 5d 4 5d 5 5d 6 5d 7 5d 8 5d UNITS VOLTS dB dBm COUPLING AC AC DC AC TYPE RMS AVERAGE PEAK LOW FREQ RMS POSITIVE PEAK NEGATIVE PEAK window 0 100 of range Select moving average or repeating a
36. COUNt Query scan count y DELay lt n gt Program delay 0 to 999999 999 sec 0 y 3 23 5 DELay Query delay y SOURce lt name gt Select control source HOLD IMMediate TIMer IMMediate Note 2 3 23 6 MANual BUS TLINk or EXTernal SOURce Query control source y TIMer lt n gt Set timer interval 0 001 to 999999 909 sec 1 y 3 23 7 TIMer Query timer y SIGNal Loop around control source y 3 23 8 TCON figure Path to configure Triggers 3 23 9 DIRection lt name gt Enable SOURce or disable ACCeptor Bypass ACCeptor DIRection Query direction ASYNchronous Path to configure asynchronous Trigger Link ILINe NR Select input line 1 to 6 2 ILINe Query input line OLINe lt NRf gt Select output line 1 to 6 1 OLINe Query output line TRIGger SEQuence 1 Path to program Trigger Layer y IMMediate Loop around control source y 3 23 3 COUNt lt n gt Set measure count 1 to 99999 or INF Note 3 y 3 23 4 COUNt Query measure count y DELay lt n gt Set delay 0 to 999999 999 sec 0 y 3 23 5 DELay Query delay y SOURce lt name gt Select control source HOLD IMMediate TIMer IMMediate Note 2 3 23 6 MANual BUS TLINk or EXTernal SOURce Query control source y Table 3 15 Continued Trigger command summary IEEE 488 Reference Default Command Description parameter SC PI Ref TRIGger SEQuence 1 TIMer lt n gt Set timer interval 0 001 to
37. Commands ccccccsscecsssceeessceceesseeceneecesaeecseaeeecseecessesecsuaeeeseeeeceeaeeecesaecesnseecesaesesnnaees Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 iii TestEquipmentDepot com 3 18 3 3 18 4 3 18 5 3 18 6 3 18 7 3 18 8 3 18 9 3 18 10 3 18 11 3 18 12 3 18 13 3 18 14 3 18 15 3 18 16 3 18 17 3 18 18 3 18 19 3 18 20 3 18 21 3 18 22 3 18 23 3 19 3 20 3 20 1 3 20 2 3 20 3 3 20 4 3 20 5 3 20 6 3 20 7 3 21 3 21 1 3 21 2 3 21 3 3 21 4 3 21 5 3 21 6 3 21 7 3 21 8 3 21 9 3 21 10 3 21 11 3 21 12 3 21 13 3 21 14 3 21 15 3 22 3 22 1 3 22 2 3 22 3 3 22 4 3 22 5 3 22 6 3 22 7 AA nutes iacapscessanvunescssten dacsvaierbaicedstesboncs E STATUS SUBSYSTEM cti a eiii di EEEE Eai SYSTem subsystem PRACE SUD EE H LUN CIA EE eh EES DATA ee APERTESAS Ee Ee ENP e REENERT RANGE COMMANDOS EN GE ET TEE DIS EE SAVER ase COMMANAS EES EE Eder FFUNCELION amie cnt a ria a NA o A METHod lt name gt SOURce lt name gt THReshold command ccccccccccsssssceccecsesscececesessecececeeaeccecsessaesesceesesseseecsesssesecesessuaeeescenseaseeseeeses STRANSdUCEeLr lt name gt c ccccecssescccceesesscececesesseecececesseacecececseessescecseseesecesenseesecesessuaeececessnsnesecesennaees RPD COMMANA S put tios Couple TYPE Sp ane iii dio a ad RJUNCtionX COMMANAS coooooccnccnnooonnnnonononnnononononnnnncnnonnnonnnnno
38. Digital calibration The instrument may be digitally calibrated from either the front panel or over the bus Standard IEEE 488 interface Bus operation con forms to the IEEE 488 2 and SCPI standards Trigger link This is a new trigger concept that pro vides more versatile and precise external triggering It is in addition to the standard Trigger In Measurement Complete BNC external triggering techniques Optional field installable internal scanner This is a 10 channel scanner card which includes eight channels of 2 pole relay switching and two channels of 2 pole solid state switching All channels can be configured for 4 pole operation Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 1 1 TestEquipmentDepot com General Information 1 3 Warranty information Warranty information is located on the inside front cover of this instruction manual Should your Model 2002 require warranty service contact the Keithley representative or authorized repair facility in your area for further informa tion When returning the instrument for repair be sure to fill out and include the service form at the back of this manual to provide the repair facility with the necessary information LA Manual addenda Any improvements or changes concerning the instrument or manual will be explained in an addendum included with the manual Be sure to note these changes and incorporate them into the manual 1
39. FOR Mar Query math format y STATS lt b gt Enable or disable calculation 0 y STATe Query state of math function y IMMediate Recalculate raw input data in buffer y DATA Read math result of CALC 2 y 3 46 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Table 3 4 Continued CALCulate command summary IEEE 488 Reference Default Command Description parameter SCPI Ref CALCulate3 Subsystem to control CALC 3 limit tests y 3 12 3 LIMit 1 Path to control LIMIT 1 test y UPPer Path to configure upper limit y DATA lt n gt Set upper limit 9 999999e35 to 9 999999e35 1 y DATA Query upper limit y SOURce lt NRf gt Specify digital output 0 to 15 0 y SOURce Query source y LOWer Path to configure lower limit y DATA lt n gt Set lower limit 9 999999e35 to 9 999999e35 1 y DATA Query lower limit y SOURce lt NRf gt Specify digital output 0 to 15 0 y SOURce Query source y STATe lt b gt Enable or disable limit test OFF y STATe Query state of limit test y FAIL Query test result 1 pass 0 fail y CLEAR Path to clear failed test y IMMediate Clear failed test indication y AUTO lt b gt Enable or disable auto clear ON y AUTO Query auto clear y LIMit2 Path to control LIMIT 2 test y UPPer Path to configure upper limit y DATA lt n gt Set upper limit 9 999999e35 to 9 999999e
40. FUNCTION lt name gt Specify detector for ACI SEN Se 1 VO LTage AC D ETector FUNCTION lt name gt Specify detector for ACV ACI lt name gt RMS AC RMS amps measurements AVERage AC average amps measurements ACV lt name gt RMS AC RMS volts measurements AVERage AC average volts measurements LFRMs Low frequency AC volts measurements PEAK AC peak volts measurements NPEak AC negative peak spike volts measurements PPEak AC positive peak spike volts measurements FUNCtion Query selected measurement type These commands are used to select the measurement type for the ACI and ACV functions Refer to paragraphs 2 4 1 ACV and 2 4 2 ACI for details on AC TYPE ct average detector PRINT 1 output 16 curr ac det aver det Sel Get response from 2002 PRINT 1 enter 16 3 105 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 18 13 Parameters Query Description Program fragment 3 18 14 Parameters Query Description Program fragment 3 18 15 Parameters Query 3 106 PWINdow lt n gt SEN Se 1 VO LTage AC DETector PWINdow lt n gt Set peak detection window for ACV lt n gt 0 1 to 9 9 Peak spike detection window in seconds DEFault 0 1sec window MINimum 0 1sec window MAXimum 9 9sec window PWINdow Query spike detection window PWINdow DEFault Query RST default window P
41. Measurement mode menu NORMAL Select normal current measurement use AMPS terminals IN CIRCUIT Select in circuit current measurement use INPUT and SENSE terminals Table 2 12 CONFIGURE ACI menu structure Menu item Description SPEED Measurement speed integration time menu NORMAL Select 1 PLC power line cycle 16 67msec for 60Hz 20msec for 50Hz and 400Hz FAST Select 0 01 PLC MEDIUM Select 0 1 PLC HIACCURACY Select 10 PLC SET SPEED EXACTLY Set integration time in PLC 0 01 50 SET BY RSLN Default to setting appropriate for resolution FILTER Digital filter menu AUTO Default to filter appropriate for integration time AVERAGING Program a simple average filter 1 100 readings ADVANCED Program a simple average filter 1 100 readings with a noise tolerance window AVERAGING MODE 0 100 of range Select moving average or repeating average mode RESOLUTION Display resolution menu AUTO Default to resolution appropriate for integration time 3 5d 4 5d 5 5d 6 5d 7 5d 8 5d Select a specific resolution COUPLING Coupling menu AC Select AC coupled measurements AC DC Select DC coupled measurements AC TYPE Type of ACI measurement menu RMS Select true RMS ACI AVERAGE Select average ACI 2 24 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com SPEED The SPEED parameter sets the integration time of the A D converter the period of time the input signal
42. NOTE The front panel TRIG key is active when EXTERNAL GPIB TRIGLINK or TIMER is selected GPIB With this selection bus triggers control the scan source Operation passes immediately into the measure layer when a bus trigger GET or TRG is received by the Model 2002 See Section 3 for detailed information on bus triggers 2 48 NOTE The front panel TRIG key see MAN UAL is active with bus triggering selected Pressing the TRIG key passes operation into the measure layer TRIGLINK With this selection the scan source is con trolled by the Trigger Link of the Model 2002 Trigger Link is an enhanced trigger system that uses up to six lines to direct trigger pulses to and from other instruments Opera tion passes into the measure layer when the Model 2002 receives a trigger over the Trigger Link See paragraph 2 7 7 for details on using the Trigger Link NOTE The front panel TRIG key see MAN UAL is active with the Trigger Link selected Pressing the TRIG key passes operation into the measure layer After selecting TRIGLINK you will be prompted to select an input line and then an output line Note that you cannot use the same trigger line for both input and output TIMER Use the timer feature to control the time interval between scan sequences when scanning The timer can be set for an interval from 0 001 seconds Imsec to 999999 999 seconds with 1msec resolution After a scan sequence is triggered to start
43. One of the multiple displays lets you view the reading on the bottom line of the display and the result of the calculation on the top line This display is available by repeatedly pressing either the NEXT or PREVious DISPLAY key to scroll through the multiple displays for the particular function The following is a typical message for a percentage calculation 7 0431e 01 VDC Reading 0 704311 The display resolution on the bottom line follows that chosen for the top line If scientific notation is required on the top line it is fixed at 4 5 digits The value on the bottom line tracks the units and prefix of the top line For example if the top line displays uA then the units on the bottom line are HA Note that this multiple display is not available on the fre quency function 2 11 Scanning The Model 2002 can be used with an internal scanner card Model 2001 SCAN or 2001 TCSCAN or with external scanner cards installed in switching mainframes such as the Models 706 7001 and 7002 The following paragraphs dis cuss various aspects of using scanning with the Model 2002 2 11 1 Scanning overview A scanner allows you to switch among a number of input sig nals to the Model 2002 for measurement The channel con trol and scanning capabilities depend on whether an internal or external scanner card is being used as well as on the capa bilities of the scanner card in question Refer to the docu mentation supplied with the sc
44. RANGe UPPer MINimum Query lowest measurement range RANGe UPPer MAXimum Query highest measurement range This command is used to manually select the measurement range for the specifed measurement function The range is selected by specifying the expected reading as an absolute value The Model 2002 will then go to the most sensitive range that will accommodate that expected read ing For example if you expect a reading of approximately 100mA simply let the parameter lt n gt 0 1 or 100e 3 in order to select the 200mA range PRINT 1 output 16 curr ac rang 1 rang Select 2A ACI range PRINT 1 enter 16 Get response from 2002 AUTO lt b gt ONCE SEN Se 1 CU RRent AC RANGe AUTO lt b gt ONCE Control auto range for ACI SEN Se 1 CURRent DC RANGe AUTO lt b gt ONCE Control auto range for DCI SEN Se 1 VO LTage AC RANGe AUTO lt b gt ONCE Control auto range for ACV SEN Se 1 VO LTage DC RANGe AUTO lt b gt ONCE Control auto range for DCV SEN Se 1 RESistance RANGe AUTO lt b gt ONCE Control auto range for Q2 SEN Se 1 FRESistance RANGe AUTO lt b gt ONCE Control auto range for 24 lt b gt lorON Enable auto range 0 or OFF Disable auto range ONCE Enable and then disable auto range AUTO Query autorange on or off These commands are used to control autoranging With autoranging enabled the instrument automatically goes to the most sensitive range to perform the measurement see
45. Select INTERNAL CHANS The Model 2002 will dis play the following SET INTERNAL CHANNELS 1 DCV 2 DCV 3 DCV 4 DCV 5 DCV a 6 DCV 7 DCV 8 DCV 9 DCV_ 10 DCV 3 Use the cursor and range keys to select channels and functions Set the function type to TMP for all channels connected to RTD probes Select none for channels without probes connected 4 Press ENTER to return to normal display Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation Step 4 Configure scan 1 From normal display press CONFIG SCAN The instrument will display the following SCAN OPERATION INTERNAL EXTERNAL RATIO DELTA 2 Select INTERNAL then press ENTER Step 5 Scan channels To start scanning press the SCAN key and program the scan count scan timer and data storage Then press ENTER When the scan has completed you can recall stored data and or scan again Press EXIT while scanning to interrupt data storage and disable scanning Using the scanner with the data storage buffer The Model 2002 internal data storage buffer can be used to store readings taken while using the scanner The following paragraphs outline the basic steps necessary for data storage of scanner readings Refer to paragraph 2 8 for additional information on using the data storage buffer Step 1 Configure channels 1 Press CONFIG CHAN The instrument will display the following CONFIG
46. Set upper limit for ACI SEN Se 1 CU RRent DC RANGe AUTO ULIMit lt n gt Set upper limit for DCI SEN Se 1 VO LTage AC RANGe AUTO ULIMit lt n gt Set upper limit for ACV SEN Se 1 VO LTage DC RANGe AUTO ULIMit lt n gt Set upper limit for DCV SEN Se 1 RESistance RANGe AUTO ULIMit lt n gt Set upper limit for Q2 SEN Se 1 FRESistance RANGe AUTO ULIMit lt n gt Set upper limit for Q4 LLIMit lt n gt SEN Se 1 CU RRent AC RANGe AUTO LLIMit lt n gt Set lower limit for ACI SEN Se 1 CURRent DC RANGe AUTO LLIMit lt n gt Set lower limit for DCI SEN Se 1 VO LTage AC RANGe AUTO LLIMit lt n gt Set lower limit for ACV SEN Se 1 VO LTage DC RANGe AUTO LLIMit lt n gt Set lower limit for DCV SEN Se 1 RESistance RANGe AUTO LLIMit lt n gt Set lower limit for Q2 SEN Se 1 FRESistance RANGe AUTO LLIMit lt n gt Set lower limit for Q4 lt n gt 0to2 1 Range limit for ACI and DCI 0 to 775 Range limit for ACV 0 to 1100 Range limit for DCV Oto 1 05e9 Range limit for Q2 0 to 2 1e6 Range limit for Q4 DEFault 2 1 ACI and DCI 775 ACV 1100 DCV 1 05e9 Q2 2 1e6 94 MINimum 0 All functions MAXimum Same as DEFault ULIMit Query upper range limit ULIMit DEFault Query RST default upper limit ULIMit MINimum Query lowest allowable upper limit ULIMit MAXimum Query largest allowable upper limit LLIMit Query lower range limit LLIMit DEFault Query RST default lower limit LLIMit
47. Specifications are subject to change without notice All Keithley trademarks and trade names are the property of Keithley Instruments Inc All other trademarks and trade names are the property of their respective companies KEITHLEY A GIR EAT EIR MEASURE G F C0 NF TD EN SE Keithley Instruments Inc Corporate Headquarters 28775 Aurora Road Cleveland Ohio 44139 440 248 0400 Fax 440 248 6168 1 888 KEITHLEY www keithley com 12 06 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com
48. With the multiple display enabled channels 4 and 6 will appear on the lower display line 2 11 8 Scanner operation examples The following paragraphs give step by step procedures for various scanner operating modes Closing and opening channels Use the front panel CHAN key to close and open specific channels on the internal scanner card as follows 1 From normal display press the CHAN key The instru ment will display the following menu CHANNEL SELECTION CLOSE CHANNEL OPEN ALL CHANNELS 2 Select CLOSE CHANNEL then press ENTER The Model 2002 will display the following prompt ENTER CHANNEL 01 1 10 3 Use the cursor and range keys to select the channel you wish to close 1 10 then press ENTER Any previously closed channel will open and the selected channel will close 4 To open the close channel select OPEN ALL CHAN NELS in the CHANNEL SELECTION menu then press ENTER Manual scanning and using the multiple display The and gt keys can be used to manually scan through channels on the internal scanner card The multiple display mode can also be used to display adjacent scanner channels while scanning manually NOTE Adjacent channel display cannot be used when the instrument is scanning automatically Follow the steps below to scan manually and display alter nate channels 1 Manually close a channel by using the CLOSE CHANNEL selection accessible with the CHAN key 2 Press the key to
49. addressing the Model 2002 to talk two values separated by commas are sent to the computer The first value indicates how many bytes of memory are available and the second value indi cates how many bytes are reserved to store readings PRINT 1 output 16 trac free Query status of memory PRINT 1 enter 16 Get response from 2002 EGRoup lt name gt TRACe EGRoup lt name gt Specify element group lt name gt FULL Time stamp included with each stored reading COMPact Time stamp not included EGRoup Query element group This command is used to select the element group that is sent with each reading Common to both element groups are function channel if applicable and buffer location The FULL ele ment group includes the time stamp The first reading in the buffer has a time stamp of 0 sec onds The time stamp for all subsequent readings are then referenced to the first reading The COMpact element group excludes the time stamp This allows more readings to be stored in the buffer see POINts PRINT 1 output 16 trac egr comp egr Select compact element group PRINT 1 enter 16 Get response from 2002 3 147 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 22 4 Parameters Query D escription Program fragment Parameters Query D escription Program fragment 3 22 5 Parameters
50. enter 16 Set al and query Get response from 2002 MA2Factor lt NRf gt CALCulate 1 KMATh MA2Factor lt NRf gt Specify a2 factor lt NRf gt 9 999e20 to 9 999e20 MA2Factor Query a2 factor This command is used to specify the a2 factor for the polynomial calculation PRINT 1 output 16 calc kmat ma2f 6 ma0 PRINT 1 enter 16 Set a2 and query Get response from 2002 PERCent lt NRf gt CALCulate 1 KMATh PERCent lt NRf gt Specify Percent target value lt NRf gt 9 999999e35 to 9 999999e35 Specify target value for Percent calculation PERCent Query Percent target value This command is used to specify the target value for the Percent calculation PRINT 1 output 16 calc kmat perc 10 perc Set target to 10 and query Get response message from PRINT 1 enter 16 2002 STATe lt b gt CALCulate 1 STATe lt b gt Control CALC 1 lt b gt 0 or OFF Disable CALC 1 calculation 1 or ON Enable CALC 1 calculation STATe Query state on or off of CALC 1 This command is used to enable or disable the CALC 1 calculation When enabled each instru ment reading will reflect the selected calculation see FORMat PRI 1 output 16 calc stat on stat Enable CALC1 and query PRINT 1 enter 16 Get response message from 2002 DATA commands LATest CALCulate 1 DATA LATest Read
51. gt vo neuen amp 3 Re b e 235 Al Soo vi D Dm d Y Z m 2 52 ki y zm um um Qu lt 230000 H Giese E aRRERRSHEESHRHL GBS 20 I U Q a re o Y kh E SE puewwo gt a Oo ag OR SEET HE T 52 Fox um E wu E 0 A aso xooo s SEILER 28 ES o on md mort oo OO D zg E UO eo o o oo oo oo OHOH OCHO o gt OO d FH OO FH d OO dd OO gi aA d OO OO gid gd gd OO OO gd gd d gd Se o oo oo oo oo oo oo oo o BEA AAAA Figure D 3 Command codes D 6 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Don t Care DIO8 X PPC PARALLEL POLL CONFIGURE PPU PARALLEL POLL UNCONFIGURE Dy and TCT TAKE CONTROL not implemented by Model 2002 Note D DIO1 IEEE 488 Bus Overview Typical command sequences Table D 2 Hexadecimal and decimal command codes For the various multiline commands a specific bus sequence must take place to properly send the command In particular Decimal the correct listen address must be sent to the instrument Command Hex value value before it will respond to addressed commands Table D 3 lists a typical bus sequence for sending the addressed multi GTL 01 1 line commands In this instance the SDC command is being SDC 04 4 sent to the instrument UNL is generally sent as part of the GET 08 8 sequence to ensure that no other active listeners are present LLO 11 17 Note that ATN is true for both
52. in Figure 2 17 for the Models 2002 and 7001 7002 Channel Ready Output of the Model 706 is connected to External Trigger Input of the Model 2002 External Trigger Input of the Model 706 is connected to Meter Complete Output of the Model 2002 The trigger configuration of the Model 2002 does not change from the previous example The Model 706 is configured for external triggering 2 7 7 Trigger Link The Model 2002 has enhanced external triggering capabili ties using the Trigger Link The Trigger Link has six lines allowing up to six instruments to be controlled over this trig ger bus The 8 pin micro DIN sockets used for the Trigger Link are shown in Figure 2 18 3 5 Trigger Link Line Line 1 Line 2 Line 3 Line 4 Line 45 Line 6 Digital Common Digital Common IN OUT TRIGGER LINK 00 Y O U UNER Figure 2 18 Trigger link connectors NOTE The two rear panel Trigger Link connec tors are actually connected in parallel It does not matter which connector you use when connecting the Trigger Link to an other instrument Front Panel Operation In general Trigger Link input triggers to the Model 2002 are used to control the measure operation For the Model 2002 to respond to Trigger Link compatible triggers the appropriate layers of the trigger model must be programmed for it For example if you want Trigger Link input triggers to control the measuring process you must program Measure Source for TRIGLINK
53. layer You can program the Model 2002 to scan up to 99999 times CONTROL Use this menu item to enable or disable the source bypass The source bypass is used to bypass the scan event on the first pass through the scan layer SOURCE With this selection the source bypass is enabled The scan event will be bypassed on the first pass through the scan layer This allows operation to proceed into the measure layer without having to wait for the programmed event ACCEPTOR With this selection the source bypass is disabled 2 7 4 Configuring the arm layer The arm layer is used for the following operations e To select the arming event SOURCE for the instru ment To designate the number of times the instrument is to be armed COUNT e To enable or disable the Source Bypass The arm layer is configured from the ARM item of the CON FIGURE TRIGGER menu which is displayed by pressing the CONFIG key and then the TRIG key General rules for navigating through the menu structure is contained in para graph 2 3 4 SOURCE This menu item selects the event that controls the arm source Front Panel Operation IMMEDIATE With this selection operation passes imme diately into the scan layer EXTERNAL With this selection external triggers are used to control the arm source A trigger stimulus applied to the Model 2002 passes operation into the scan layer The exter nal trigger is applied to the rear panel EXTERNAL TRIG
54. lt b gt Enable or disable auto NPLC OFF AUTO ONCE Enable and then disable auto NPLC AUTO Query auto line cycle integration NPLCycles Query line cycle integration rate REFerence lt n gt Specify reference 200 to 1821 C 0 3 18 9 STATe lt b gt Enable or disable reference OFF STATe Query state of reference ACQuire Use input signal as reference REFerence Query reference value DIGits lt n gt Specify measurement resolution 4 to 7 6 3 18 10 AUTO lt b gt Enable or disable auto resolution ON AUTO ONCE Enable and then disable auto resolution AUTO Query auto resolution DIGits Query resolution 3 57 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Table 3 10 Continued SENSe command summary Default Command Description parameter SCPI Ref TEMPerature AVERage Path to configure and control the filter 3 18 11 TCONtrol lt name gt Select filter type MOVing or REPeat Note 3 TCONtrol Query filter type COUNt lt n gt Specify filter count 1 to 100 10 COUNt Query filter count STATe lt b gt Enable or disable filter Note 4 STATe Query state of digital filter AUTO lt b gt Enable or disable auto filter Note 5 STATe lt b gt Enable or disable filter Note 4 STATe Query state of digital filter AUTO lt b gt Enable or disable auto filter Note 5 AUTO ONCE Enable and then d
55. lt list gt Define external scan list lt list gt scanlist where scanlist is the specified list of external channels 1 to 80 to be scanned EXTernal Query programmed scan list The Model 2002 can operate with an external switch system such as the Keithley Model 7001 or 7002 The Model 2002 can measure up to 80 channels that are switched by the external switching system This command is used to define the external scan list for the Model 2002 See paragraph 2 11 for details on scanning The scan list can contain 2 to 80 channels See SCAN INTernal for examples to express a scan list The external scan by the Model 2002 is enabled by the ROUTe SCAN LSELect EXTernal command PRINT 1 output 16 rout scan ext 1 40 Define external scan list FUNCtion lt list gt lt name gt ROUTe SCAN INTernal FUNCtion lt list gt lt name gt Assign functions to channels Internal RO UTe SCAN EXTernal FUNCtion lt list gt lt name gt Assign functions to channels External lt list gt chanlist where chanlist is the specified list of channels 1 to 10 for Internal 1 to 80 for External lt name gt NONE VOLTage DC VOLTage AC TEMPerature FREQuency RESistance FRESistance RJUNctionX where X 1 to 5 ALTernate 1 CURRent DC External only CURRent AC External only FUNCtion lt list gt Query functions for specified channe
56. rms Peak Full Scale Maximum Burden of reading of range C Range Input rms Resolution Voltage Outside Tcal 5 C 200 pA TmA 210 0000 100 pA 0 35 V 0 01 0 001 2mA 10 mA 2 100000 nA 0 45 V 0 01 0 001 20 mA 100 mA 21 00000 10 nA 0 5 V 0 01 0 001 200 mA TA 210 0000 100 nA 0 5 V 0 01 0 001 2A 2A 2 100000 THA 15 V 0 01 0 001 24 42 e ACI ACCURACY 90 Days 1 Year or 2 Years Ton 5 C for 5 to 100 of range of reading of range Range 20Hz 50Hz 50Hz 200Hz 200Hz 1kHz 1kHz 10kHz 10kHz 30kHz 30kHz 50kHz 50kHz 100kHz 200 pA 0 35 0 015 0 2 0 015 0 4 0 015 0 5 0 015 2 mA 0 3 0 015 0 15 0 015 0 12 0 015 0 12 0 015 0 25 0 015 0 3 0 015 0 5 0 015 20 mA 0 3 0 015 0 15 0 015 0 12 0 015 0 12 0 015 0 25 0 015 0 3 0 015 0 5 0 015 200 mA 0 3 0 015 0 15 0 015 0 12 0 015 0 15 0 015 0 5 0 015 1 0 015 3 0 015 2A 0 35 0 015 0 2 0 015 0 3 0 015 0 45 0 015 1 5 0 015 4 0 015 AC Current Uncertainty ppm Accuracy accuracy x 10 000 0 015 of Range 30 counts at 5H digits ACI READING RATES 72 of reading x measured value of range x range used 100 Readings Second with Measurement Default Readings Second to Memory Readings Second to IEEE 488 Time Stamp to IEEE 488 PLC Aperture Bits Digits Autozero Off Autozero On Autozero Off Autozero On Autozer
57. until the next reading conversion occurs This action command allows you to reprocess the current input data to reflect a new calculation For example assume the instrument is in a non continuous measurement mode and requires a manual trigger to cause the next reading conversion Changing the calculation will not affect the currently displayed reading However sending the MMediate command reprocesses that dis played reading to reflect the new calculation Note that sending the MMediate command does not initiate a reading conversion An alternate way to perform the calculation and read the result is by using the query form of the command MMediate When this command is sent the calculation is performed and the result is queried Select defaults Place 2002 in one shot measure mode Wait three seconds Select polynomial math calculation Set a0 to 50 Enable MATH calculation Wait three seconds Perform calculation adds 50 to reading PRINT 1 output 16 syst pres PRINT 1 output 16 trig sour bus SLEEP 3 PRINT 1 output 16 calc form pol PRINT 1 output 16 calc kmat ma0f 50 PRINT 1 output 16 calc stat on SLEEP 3 PRINT 1 output 16 cal imm CALCulate2 This Calculate subsystem is used to configure and control CALC 2 operations on readings stored in the buffer 3 69 Test Equipment Depot 800 517 8431 99 Washington Street Me
58. which summarizes operation over the bus is called the Trigger model It is called the trigger model because operation is controlled by SCPI commands from the Trigger subsystem see paragraph 3 23 Notice that key SCPI commands are included in the trigger model Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference SY ST PRES Idle INIT IMM or and INIT CONT ON age Initiate INIT IMM Yes or INIT CONT ON ARM TCONfigure DIRection SOURce Source Bypass Enabled Arm Layer 1 ARM IMMediate ARM COUNt lt n gt INFinite Arm Layer AAA Control Arm Event Source Detection ARM SOURce IMMediate ARM SOURce MANual ARM SOURce BUS ARM SOURce EXTernal ARM SOURce TLINk ARM SOURce RTCLock ARM SOURce HOLD ARM LAYer2 TCON figure DIRection SOURce Source Bypass Enabled Arm Layer 2 ARM LAYer2 IM Mediate Output Trigger Source Bypass Enabled Another Scan Scan Layer Output Trigger Yes ARM LAYer2 SOURce IMM ediate ARM LAYer2 SOURce MANual ARM LAYer2 SOURce BUS ARM LAYer2 SOURce TlMer ARM LAYer2 SOURce EXTernal ARM LAYer2 SOURce TLINk ARM LAYer2 SOURce HOLD Source Bypass Enabled ARM LAYer2 DELay lt num gt TRIGger TCO Nfigure DIRection SOU Rce Source Bypass Enabled TRIG ger IM M ediate TRIG ger SIG N al M eas
59. 101 Operation complete SE 000 No error SE 100 Command error EE 101 Invalid character EE 102 Syntax error EE 103 Invalid separator EE 104 Data type error EE 105 GET not allowed EE 108 Parameter not allowed EE 109 Missing parameter EE 110 Command header error EE 111 Header separator error EE 112 Program mnemonic too long EE 2 8 nite response SE Status event EE Error event Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 2 34 Navigating menus There are basically two types of menu structures the Main Menu and the Configure menus The Main Menu accesses items for which there are no dedicated keys and Configure menus are used to configure measurement functions and oth er instrument operations Use the following rules to navigate through the menu struc ture 1 The top level of the Main Menu is accessed by pressing the MENU key A Configuration menu is accessed by pressing CONFIG and then the desired function DCV ACV etc or operation TRIG STORE etc 2 A menu item is selected by placing the cursor on it and pressing ENTER Cursor position is denoted by the blinking menu item or parameter The cursor keys lt q and P control cursor position 3 A displayed arrow lt q and on the bottom line indi cates that there are one or more additional items mes
60. 1166 F 0 001 F 0 110 F 0 119 F 0 122 F 0 126 F RTD Type 1000 platinum DIN 43760 4 wire ITS 90 PT100 D100 F100 and IPTS 68 PT385 PT3916 Sensor Current 960UA pulsed Temperature Coefficient 0 001 C C or 0 002 F C outside Tea 5 C Maximum Source HI Lead Resistance 2000 Maximum Source LO Lead Resistance 1000 Subject to 2 x 10 V Hz product for inputs above 20V Valid for the lowest range For each range increase multiply these numbers by 10 45 Specifications are for 10 power line cycles autozero on 10 reading repeat digital filter 4 wire mode Exclusive of RTD probe errors For Ten 1 C following 4 hour warm up Specifications are subject to change without notice Page 10 of 14 SPEC 2002 Rev H February 2009 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Model 2002 Multimeter Specifications KEITHLEY Keithley Instruments Inc 28775 Aurora Road Cleveland Ohio 44139 1 888 KEITHLEY www keithley com RTD TEMPERATURE READING RATES 2 or 4 Wire Readings or Readings with Time Stamp Second to Memory or IEEE 488 PLC Autozero Off Autozero On 10 3 2 5 1 0 8 2 12 10 4 3 3 1 20 16 17 13 0 1 51 49 41 39 0 01 58 58 46 46 TEMPERATURE THERMOCOUPLE Thermocouple Type Range Resolution Accuracy J 200 to 760 C
61. 1500 CLS CALL SEND 16 RST GPIB STATUS SLEEP 2 format readings CALL SEND 16 form elem read GPIB STATUS e Microsoft QuickBASIC 4 5 e Any one of the following IEEE 488 interfaces Keithley Model KPC 488 2 Keithley Model KPC 488 2AT Capital Equipment Corporation PC lt gt 488 The program assumes that the Model 2002 is set to address 16 Loading user library The user library for QuickBASIC 4 5 is provided with the TEEE 488 interface ieeeqb qlb Assuming QuickBASIC and the user library are in the same DOS directory enter the following command line from the DOS prompt QB L ieeegb qlb The above command line will load QuickBASIC and the user library Init as system controller Reset 2002 Return readings only dev config CALL SEND 16 sens func VOLT DC GPIB STATUSS CALL SEND 16 CALL SEND 16 configure scan Select DCV function sens volt de nplc 01 GPIB STATUSS Select 0 01 plc reading rate sens volt dc rang 2 GPIB STATUS Select 2V range CALL SEND 16 rout scan int 5 10 GPIB STATUS config trig CALL SEND 16 CALL SEND 16 CALL SEND 16 arm lay2 sour imm GPIB STATUS CALL SEND 16 CALL SEN 2 8 on DA init cont on GPIB STATUS arm layl sour bus GPIB STATUS Scan list chans 5 10 init cont off abor GPIB S
62. 1kg lt 20 Ibs EMI RFI Conforms to VDE 0871B per Vfg 1046 1984 IEC 801 2 Meets FCC part 15 Class B CISPR 22 EN55022 Safety Conforms to IEC348 CAN CSA C22 2 No 231 MIL T 28800E Designed to UL1244 Accessories Supplied full calibration data EXTENDED MEMORY NON VOLATILE MEMORY OPTIONS The unit is shipped with line cord high performance modular test leads operator s manual option slot cover and DATA STORAGE 67 Digit with Setup Storage Model Size Bytes 4 Digit Time Stamp Type Number Type 2002 8k 2 027 404 volatile 1 non volatile 2002 MEM1 32k 6 909 1 381 non volatile 5 non volatile 2002 MEM2 128k 29 908 5 980 non volatile 10 non volatile These are the minimum sizes to expect Specifications are subject to change without notice Page 14 of 14 SPEC 2002 Rev H February 2009 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Interface Function Codes The interface function codes which are part of the IEEE 488 standards define an instrument s ability to support various interface functions and should not be confused with programming commands found elsewhere in this manual The interface function codes for the Model 2002 are listed in Table B 1 The codes define Model 2002 capabilities as follows Table B 1 Model 2002 interface function codes Code Interface function SH1 Source Handshake capabilit
63. 2 3 3 4 4 5 Additional Error 0 0 1 0 2 0 4 AVERAGE ACI MEASUREMENT rms specifications apply for 10 to 100 of range Settling Characteristics lt 300ms to 1 of step change lt 450ms to 0 1 of step change lt 500ms to 0 01 of step change Autoranging Autoranges up at 105 of range down at 10 of range FREQUENCY COUNTER FREQUENCY PERIOD INPUT CHARACTERISTICS AND ACCURACY 90 Days 1 Year or 2 Years Frequency Period Minimum Signal Level Maximum Trigger Accuracy Range Range Resolution 1Hz 1MHz 1 5MHz 5 15MHz Input Level of reading AC Voltage Input 1Hz 15 MHz 67ns 1s 5 digits 60 mV 60 mV 400 mV 1100 V pk 0 600V 0 03 AC Current Input 1Hz 1 MHz 1us 1s 5 digits 150 pA 1A pk 0 600mA 0 03 Time Base 7 68MHz 0 01 0 C to 55 C Reading Time 420ms maximum Voltage Input Impedance 1MQ 2 with lt 140pF Trigger Level Adjustment Trigger level is adjustable in 0 5 of range steps to 60 of range in real time using the up and down range buttons Frequency Ranging Autoranging from Hz to MHz Frequency Coupling AC only TEMPERATURE RTD 4 Wire Accuracy Range Resolution 24 Hours 90 Days 1 Year 2 Years 100 to 100 C 0 001 C 0 016 C 0 020 C 0 021 C 0 022 C 200 to 630 C 0 001 C 0 061 C 0 066 C 0 068 C 0 070 C 148 to 212 F 0 001 F 0 029 F 0 036 F 0 038 F 0 040 F 328 to
64. 2 32 Use lt gt v ENTER EXIT or INFO ENTER USE SCAN TIMER YES NO YES INTERVL 000000 000 Use lt gt v ENTER EXIT or INFO ENTER NO DATA NO MEMORY YES NO YES XXXXX RDGS TO BUFFER Press ENTER to continue ENTER NO Press ENTER to begin INFO SCAN COUNT Number of scans INFO TIMER For TIMER source the interval gt lt in seconds between triggers Use CONFIG STORE to change number of readings XXXX scans of XX channels or gt lt press EXIT to abort ENTER 000 0000 mVDC CHXX storing reading XXX of XXX SCAN COMPLETE Storage complete press RECALL SCAN COMPLETE RECALL DATA SCAN AGAIN EXIT RECALL DATA SCAN AGAIN EXIT SCAN key menu structure 000 0000 mVDC INFO RECALL BY RDG Rdg 00000 Use lt gt v to change reading gt lt Use NEXTDISP to see statistics EXIT SCAN COMPLETE RECALL DATA SCAN AGAIN EXIT Press ENTER to begin XXXX scans of XX channels or gt lt press EXIT to abort DISABLE EXT SCANNER Set CHAN SPACING to MANUAL gt lt Press ENTER to continue Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 2 11 7 Starting and stopping scanning Internal and external scanning After an internal or external scan is configured pressing the ENTER key from the SCAN menu starts scanning Pressing the EXIT key disables scanning An internal or external scan cannot be temporarily disabled Ratio d
65. 2 wire and 4 wire resistance frequency and temperature Range Covers both manual and autoranging operation Relative Gives details on using the relative feature that can be used to null offsets or subtract a baseline value from present and future readings Triggering Details types of trigger modes as well as trigger sources that can be used Buffer Covers use of the reading buffer including pro gramming buffer size and recalling data time stamp and statistics information Filter Covers the use of the digital filter types that can be used to reduce reading noise 2 10 Math Describes the calculations that can be per formed on readings in continuous operation 2 11 Scanning Discusses setting up internal and external scans along with ratio and delta calculations 2 12 Menu Covers selections controlled from the main menu such as saving instrument setups GPIB IEEE 488 bus configuration calibration self tests limits and the digital I O port 2 2 Power up 2 2 1 Line power connections Follow the procedure below to connect the Model 2002 to line power and turn on the instrument 1 The Model 2002 operates from a line voltage in the range of 90 134V or 180 250V at a frequency of 50 60 or 400Hz Check to see that the operating voltage in your area is compatible CAUTION Operating the instrument on an incor rect line voltage may cause damage to the instrument possibly voiding the warranty 2 B
66. 21 9 KEY Query the last pressed key y CLEar Clears messages from the Error Queue 3 21 10 LFRequency Query frequency of line power 3 21 11 DATE lt yr gt lt mo gt lt day gt Set date 3 21 12 DATE Query date TIME lt hr gt lt min gt lt sec gt Set time 24 hour format 3 21 13 TIME Query time TSTamp Path to configure and control timestamp 3 21 14 TYPE lt name gt Select timestamp type RELative or RTClock TYPE Query timestamp type RELative Path to reset timestamp RESet Reset relative timestamp to 0 sec RNUMber Path to reset reading number 3 21 15 RESet Reset reading number ot zero Not 3 62 e Clearing the Error Queue Power up and CLS Clears the Error Queue RST SYSTem PRESet and STATus PRESet No effect Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Table 3 14 TRACe command summary Power up Command D escription defaults SCPI Ref TRACel DATA Use TRACe or DATA as root command CLEar Clear readings from buffer 3 22 1 FREE Query bytes available and bytes in use y 3 22 2 EGRoup lt name gt Select element group FULL or COMPact 3 22 3 EGRoup Query element group POINts lt n gt Specify size of buffer y 3 22 4 AUTO lt b gt Enable or disable auto buffer sizing y AUTO Query state of auto buffer sizing y POINts Quer
67. 3 LSYN c STATe lt b gt 3 143 M ETH od lt name gt NPLCycles lt n gt NTRansition lt N Rf gt 0 CO Mpensated lt b gt OPEN lt list gt O PEN ALL OUTPut subsystem POINts lt n gt 3 148 PO Setup lt name gt 3 137 PRESET 3 134 PRESet 3 137 PTRansition lt NRf gt PWIN dow lt n gt Q U Eue command REFerence lt n gt 3 99 RJUN ctionX commands RNU Mber RESet ROUTe subsystem RTD commands SCAN commandg 3 87 GEN Se subsystem 3 115 SIGN al SO U Rce lt name gt SOU Rce subsystem STATus subsystem SYSTem subsystem TCouple TYPE lt name gt TIME lt hr gt lt min gt lt sec gt TIM er lt n gt 3 154 TRAN sducer lt name gt 3 108 TSTamp commands 3 146 TSTamp FO RM at lt name gt 3 151 UNIT subsystem 3 159 VERSion 3 138 EVENt 3 117 FUNCTION lt name gt 3 105 SEN Se 1 subsystem A ASCII character codes and IEEE 488 multi line interface command messages C 1 Auto filtering Autoranging Buffer 2 64 Buffer multiple displays Burst mode Calculate multiple displa Calculate subsystem CALIBRATION Common deeg Condition registers Configuring data storage Configuring rel Configuring the arm la er 2 49 Configuring the filters Configuring the scan laye Configuring the measure layer 2 46 D DC and AC current DC and AC voltage 2 9 DCL device clear
68. 3 Conversion Moving 20 19 18 17 16 15 14 13 12 11 Conversion Reading Reading 2 3 Conversion Repeating e Noise window For the advanced type a tradeoff of speed accuracy and response to input signal changes 2 9 4 Auto filtering For those measurement functions with a filter one of the pos sible selections is automatic filtering Depending on the mea surement function and type the AUTO selection may disable filtering Auto filtering is summarized in Table 2 35 2 73 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation Table 2 35 Auto filters Measurement Filter Noise Averaging Tolerance Function Type State Type Readings Mode Level DC voltage On Advanced 10 Moving 1 AC voltage RMS average low fre Off Advanced for 10 Moving 5 quency RMS volts Average for dB dBm Peak pos peak spikes On Advanced for 10 Moving 5 neg peak spikes volts Average for dB dBm DC current Normal On Advanced 10 Moving 1 In circuit On Advanced 10 Moving 1 AC current RMS average Off Advanced 10 Moving 5 2 wire resistance On Advanced 10 Moving 1 4 wire resistance On Advanced 10 Moving 1 Frequency See note Temperature On Average 10 Moving Note A filter is not available on the frequency function 2 9 5 Configuring the filters Each meas
69. 3 seconds Take 2002 out of remote PRINT 1 remote 16 SLEEP 3 PRINT 1 local 16 3 5 5 DCL device clear The DCL command may be used to clear the IEEE GPIB interface and return it to a known state Note that the DCL command is not an addressed command so all instruments equipped to implement DCL will do so simultaneously When the Model 2002 receives a DCL command it clears the Input Buffer and Output Queue cancels deferred com mands and clears any command that prevents the processing of any other device command A DCL does not affect instru ment settings and stored data Program fragment PRINT 1 clear Clear all devices 3 5 6 SDC selective device clear The SDC command is an addressed command that performs essentially the same function as the DCL command How ever since each device must be individually addressed the SDC command provides a method to clear only selected instruments instead of clearing all instruments simulta neously as is the case with DCL Program fragment PRINT 1 clear 16 Clear 2002 3 5 7 GET group execute trigger GET is a GPIB trigger that is used as an arm scan and or measure event to control operation The Model 2002 will re act to this trigger if it is the programmed control source GET can also be used as the pre trigger for the reading buffer The control source is programmed from the SCPI TRIGger sub system With the instrument programmed and waiti
70. 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Description Program fragment This command is used to enable and disable the front panel display circuitry When disabled the instrument operates at a higher speed While disabled the display is frozen with the follow ing message FRONT PANEL DISABLED Press LOCAL to resume As reported by the message all front panel controls except LOCAL are disabled Normal dis play operation can be resumed by using the ENABle command to enable the display or by put ting the Model 2002 into local PRINT 1 output 16 disp enab off enab Disable and query display circuitry PRINT 1 enter 16 Get response message from 2002 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 14 FORMat subsystem The commands for this subsystem are used to select the data format for transferring instrument readings over the bus The BORDer command and DATA command affect readings transferred from the buffer ONLY i e SENSE DATA or CALC DATA is always be sent in ASCII These commands are summarized in Table 3 6 DATA lt type gt length FORMat DATA lt type gt I lt length gt Specify data format Parameters lt type gt lt length gt ASCii ASCII format REAL 32 TEEE754 single precision format REAL 64 TEEE754 double precision format SREal TEE
71. 5d Terminals Voltage Voltage Trigger level 0 0 0 0 Function DCV DCV 2 92 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation Table 2 42 Factory default conditions cont Function or operation Bench default GPIB default Limits Limit set 1 Off Off Low limit 1 1 0 1 0 Low limit 1 action 0 0 High limit 1 1 0 1 0 High limit 1 action 0 0 Limit set 2 Off Off Low limit 2 1 0 1 0 Low limit 2 action 0 0 High limit 2 1 0 1 0 High limit 2 action 0 0 Strobe control Off Off Pass pattern 0 0 Line synchronization Off Off Math Off Off Function Percent Percent Reference for percent 1 0 1 0 a0 factor for polynomial 0 0 al factor for polynomial 1 1 a2 factor for polynomial 0 0 Resistance 2 wire Filter On Off Auto On Off Averaging Off Off Readings 10 10 Advanced On On Readings 10 10 Noise tolerance level 1 1 Filter mode Moving Repeat Offset compensation Off Off Range Auto Auto Maximum autorange 1GQ 1GQ Relative Off Off Value 0 0 0 0 Resolution Auto 7 5d Auto 7 5d Speed Normal 1 PLC Normal 1 PLC Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 2 93 Front Panel Operation Table 2 42 Factory default conditions cont Function or operation Bench default GPIB default Resistance 4 w
72. 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation 2 7 3 Configuring the scan layer The scan layer is used for the following operations e To select the scanning event SOURCE for the instru ment e To delay operation in the scan layer e To designate the number of scan sequences the instru ment will perform COUNT e To enable or disable the Source Bypass The scan layer is configured from the SCAN item of the CONFIGURE TRIGGER menu which is displayed by pressing the CONFIG key and then the TRIG key General rules for navigating through the menu structure is contained in paragraph 2 3 4 SOURCE This menu item selects the event that controls the scan source IMMEDIATE With this selection operation passes imme diately into the measure layer EXTERNAL With this selection external triggers are used to control the scan source A trigger stimulus applied to the Model 2002 passes operation into the measure layer The external trigger is applied to the rear panel EXTERNAL TRIGGER BNC connector See paragraph 2 7 6 for detailed information on external triggering NOTE The front panel TRIG key see MAN UAL is active with external triggering selected Pressing the TRIG key passes operation into the measure layer MANUAL With this selection the front panel TRIG key controls the scan source Operation passes into the measure layer when the TRIG key is pressed
73. 8681 Miniature RTD Surface Probe This is a low cost platinum 4 wire RTD with unterminated wires It is designed to measure the temperature of flat surfaces or free space Model 8693 General Purpose Immersion RTD Probe This probe has a platinum RTD sensor It is designed for immersion in liquids as well as other general purpose applications 1 3 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com General Information Model 8695 Surface RT D Probe This probe has a platinum Model 8696 Air Gas RTD Probe This probe has a platinum RTD sensor It is designed to measure the temperature of flat RTD sensor It has an exposed junction within a protective surfaces of solids shroud for measuring the temperature of air or gases 1 4 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 2 1 Front Panel O peration Introduction This section contains detailed reference information for front panel operation of the Model 2002 It is organized as follows 2 2 2 3 2 4 2 5 2 6 2 7 2 8 2 9 Power up Covers information on connecting the instrument to line power warm up period default con ditions and the power up sequence Display Covers display format and messages that may appear while using the instrument Functions Describes the measurement functions of the instrument DC and AC voltage DC and AC current
74. 999999999 sec 0 1 y 3 23 7 TIMer Request the programmed timer interval y SIGNal Loop around control source y 3 23 8 TCONfigure Path to configure Triggers 3 23 9 PROTocol lt name gt Select protocol ASYNchronous or SSYNchronous ASYNchronous PROTocol Query protocol DIRection lt name gt Enable SOURce or disable ACCeptor Bypass ACCeptor DIRection Query direction ASYNchronous Path to configure asynchronous Trigger Link ILINe lt NRf gt Select input line 1 to 6 2 ILINe Query input line OLINe lt NRf gt Select output line 1 to 6 1 OLINe Query output line SSYNchronous Path to configure semi synchronous Trigger Link LINE lt NRf gt Select trigger line 1 to 6 1 LINE Query trigger line Notes 1 Defaults for continuous initiation SYSTem PRESet enables continuous initiation RST disables continuous initiation 2 TLINK and RTCLock Arm Layer 1 are non SCPI parameters for the SOURce command The command SOURce and all the other parameters are SCPI confirmed 3 Defaults for count Arm Layer 2 and Trigger Layer SYSTem PRESet sets the count to INF infinite RST sets the count to 1 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 3 65 IEEE 488 Reference Table 3 16 UNIT command summary Default Command Description parameter SCPI UNIT TEMPerature lt name gt Select temperature measureme
75. A05 and later main processor firm ware The firmware revision level is displayed during the power up cycle and may be displayed at any time by using the GENERAL SERIAL selection in the main MENU Enabling the HP3458A emulation mode The HP3458A emulation mode may be enabled from the front panel by using the LANGUAGE selection in the GPIB menu as follows Press the MENU key to display the main menu Select GPIB then press ENTER Select LANGUAGE then press ENTER Choose HP3458 EMULATION then press ENTER Enable or disable the emulation mode as desired then press ENTER to complete your selection a BW N a 6 Press EXIT as required to return to normal display Unsupported commands Table H 1 summarizes commands not supported by the Model 2002 HP3458A emulation mode Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 H 1 TestEquipmentDepot com HP3458A Emulation Mode Table H 1 Commands not supported by HP3458A emulation mode ACAL ACBAND AUXERR BEEP gt CAL CALL CALNUM CALSTR COMPRESS CONT DEFEAT DEFKEY DELSUB DIAGNOST DSAC DSDC END EXTOUT FIXEDZ gt INBUF gt ISCALE LEVEL LFILTER gt LFREQ MATH MENU MMATH PAUSE PURGE QFORMAT RATIO gt RES RMATH SCAL SCRATCH SECURE SLOPE SMATH SSAC SSDC SSPARM SSRC SUB SUBEND TBUFF gt TEST TONE Non fatal commands All other commands will result in fatal errors except as noted
76. ACCEPTOR Disable Source Bypass 2 42 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Table 2 27 Front Panel Operation CONFIGURE TRIGGER menu structure cont Menu item Description ARM Arm layer menu SOURCE Select arm source IMMEDIATE Use to arm meter immediately and pass operation into the scan layer EXTERNAL Use external triggers to arm meter MANUAL Use TRIG key to arm meter GPIB Use bus triggers to arm meter TRIGLINK Use Trigger Link triggers to arm meter Enter Trigger Link lines RT CLOCK Use clock to arm meter Enter time and date HOLD Use to hold up the measurement in the arm layer COUNT Define number of times to arm meter INFINITE Continuously re arm meter ENTER ARM COUNT User defined count value 1 99999 CONTROL Select trigger control mode SOURCE Enable Source Bypass ACCEPTOR Disable Source Bypass HALT Use to halt triggers Press TRIG key to resume triggering 2 43 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation Halt triggers enable scanning or burst mode TRIG or SCAN Idle l l Arm Trigger Control Source Arm Layer Source Bypass Enabled Another Arm Count Arm H Arm Layer 1 Output Arm Event Trigger Detection Immediate External Manual GPIB Triglink RT Clock Hold Scan Trigger Control Source
77. BO Operation Complete OPC Set bit indicates that all pending selected device oper ations are completed and the Model 2002 is ready to accept new commands This bit only sets in response to the OPC query command see paragraph 3 10 6 Bit B1 Not Used Bit B2 Query Error QY E Set bit indicates that you attempted to read data from an empty Output Queue Bit B3 Device dependent Error DDE Set bit indicates that an instrument operation did not execute properly due to some internal condition Bit B4 Execution E rror EXE Set bit indicates that the Model 2002 detected an error while trying to execute a command Bit B5 Command Error C ME Set bit indicates that a command error has occurred Com mand errors include 3 31 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Program fragment 3 10 4 Description Program fragment 3 32 1 TEEE 488 2 syntax error Model 2002 received a message that does not follow the defined syntax of the IEEE 488 2 standard 2 Semantic error Model 2002 received a command that was misspelled or received an optional IEEE 488 2 command that is not implemented 3 The instrument received a Group Execute Trigger GET inside a program message Bit B6 U ser R equest U RQ Set bit indicates that the LOCAL key on the Model 2002 front panel was pressed Bit B7 Power On PON Set
78. Bar graph zero at left multiple display For measurement functions with a range voltage current and resistance the right endpoint of the bar graph is plus full scale of the present range for positive readings and minus full scale for negative readings When the 100 line changes to an arrow the reading exceeds the present range Note that the normal bar graph is not available when the ACV units are dB or dBm For functions without a range frequency and temperature the right endpoint of the bar graph is user programmable by pressing either CONFIG NEXT DISPLAY or CONFIG PREV DISPLAY Note that these configuration menus are context sensitive If the unit is in any function except fre quency or temperature CONFIG NEXT DISPLAY results in the zero bar graph configuration display Perform the following to view or change the range of the bar graph 1 From the frequency or temperature function press the CONFIG key and then the NEXT or PREV DISPLAY key The following menu is displayed BARGRAPH TYPE ZERO AT LEFT ZERO CENTERED 2 Use the cursor keys lt q and to place the cursor on ZERO AT LEFT and press ENTER You will access one of the following menus 2 6 For frequency FREQ BARGRAPH RANGE 2Hz 20Hz 200Hz 2kHz 20kHz Y 200kHz 2MHz 15MHz For temperature BARGRAPH 0 to 0040 C 3 Change the frequency range by highlighting one of the selections and pressing ENTER For the temperature range use the c
79. CALC 1 result This query command is used to read the result of the CALC 1 calculation If CALC 1 is disabled or NONE is selected the raw reading will instead be read Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Program fragment Description Program fragment Query Description Program fragment 3 12 2 IEEE 488 Reference PRINT 1 output 16 calc data Query result of CALC1 PRINT 1 enter 16 Get response message from 2002 FRESh CALCulate 1 DATA FRESh Recalculate CALC 1 This query command is used to return a new fresh math result of CALC1 This command will not request the same result twice If a new reading is triggered this command will wait until the math result is available When CALC1 is disabled there is no difference between SENS DATA FRES and CALC DATA FRES PRINT 1 output 16 calc data fresh Query new result of CALC PRINT 1 enter 16 Get response from 2002 IMM ediate CALCulate 1 1M M ediate Recalculate CALC 1 IMMediate Perform calculation and read result equivalent to CALCulate 1 IMMediate DATA When you change the math calculation the next instrument reading reflects the new calculation assuming CALC 1 math is enabled If the instrument is not in a continuous measurement mode 1 e waiting for a trigger the displayed reading will not update to reflect the new calculation
80. Clears previous readings stores new readings as last in first out FIFO 2 Clears previous readings stores new readings as first in last out CONT 3 Clears previous readings and selects previous memory storage mode FIFO power on OFF MEM Returns the present memory mode The MEM command enables or disables reading memory and it also selects the storage mode If there was no previous mode chosen for the CONT mode FIFO is selected Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Example MFO RMAT Purpose Format Parameter D efault Query Description Example MSIZE Purpose Query Description NDIG Purpose Format Parameter Default Query HP3458A Emulation Mode EM FIFO Store as first in last out EM OFF Turn off storage To clear reading memory and to designate the storage format for new readings MFORMAT lt format gt lt format gt lt format gt parameter Numeric equivalent Description ASCII 1 ASCII SREAL 4 Single real DREAL 5 Double real SREAL MFORMAT Returns the present setting of the memory format The MFORMAT command clears reading memory and designates the storage format for new readings Available formats include ASCII as well as single and double real Unlike the HP3458A the Model 2002 MFORMAT command does affect the OFORMAT setting These two commands
81. DATA lt a gt Define ASCII message a up to 20 characters y DATA Query text message y STATe lt b gt Enable or disable message mode Note 2 y STATe Query text message state y DATA Read data on top portion of display WINDow2 Path to locate message to bottom display y TEXT Path to control user text messages y DATA lt a gt Define ASCII message a up to 32 characters Note 1 y DATA Query text message y STATe lt b gt Enable or disable message mode Note 2 y STATe Query text message state y DATA Read data on bottom portion of display CNDisplay Clear NEXT or PREV display messages and cancel associated operations SMESsage lt b gt Enable or disable status message mode OFF SMESsage Query status message state ENABle lt b gt Enable or disable the front panel display Note 3 y ENABle Query state of the display y Notes 1 RST and SYSTem PRESet has no effect on a user defined message Cycling power cancels all user defined messages 2 RST and SYSTem PRESet has no effect on the state of the message mode Cycling power disables OFF the message mode 3 RST and SYSTem PRESet has no effect on the display circuitry Cycling power enables ON the display circuitry Table 3 6 FORMat command summary D efault Command Description parameter SCPI FOR Mat DATA lt type gt lt length gt Select data format ASCii REAL 32 REAL 64 SREal or DREal ASCii y DATA Query data format y
82. DC and AC voltage Only the differences for temperature are noted here SET BY RSLN This parameter optimizes the integration time for the present resolution setting The defaults for set by resolution integration times of temperature are listed in Table 2 24 Table 2 24 Temperature integration time set by resolution Resolution Resolution Integration degrees digits time 1 degree 3 5d 1 0 PLC 0 1 degree 4 5d 1 0 PLC 0 01 degree 5 5d 1 0 PLC 0 001 degree 6 5d 1 0 PLC Note If the integration time is SET BY RSLN and the resolution AUTO the integration time will be 1 0 PLC and the resolution set by sensor FILTER FILTER lets you set the digital filter response The filter menu is available from the function configuration menus 1 e CONFIG TEMPERATURE or by pressing CONFIGURE FILTER with the desired function already selected All of the parameters menu items for FILTER are explained in para graph 2 9 Since the AUTO parameter has specific effects on TEMP it is covered here The advanced filter is not available for the temperature func tion AUTO This parameter for a digital filter optimizes its use for the present measurement function The defaults for auto matic filtering of temperature are as follows Averaging State Type Readings Mode On Averaging 10 Moving Front Panel Operation RESLN Resolution for temperature is not expressed in number of digits but in fractions of a degree ra
83. DET FUNC APER varies per function APER AUTO is ON DIG varies per function DIG AUTO is ON LAVER STAT varies per function AVER AUTO is ON AVER COUN n varies per functio ANER AUTO is ON AVER TCON n varies per functio AVER AUTO is ON ANER AIDN STAT n varies per functio AVER AUTO is ON AVER ADV NTOL n varies per functio AVER AUTO is ON RES OCOM RES RANG UPP 200k RES OCOM is ON and RES RANG UPP gt 200k RES OCOM is ON and RES RANG AUTO ULI M gt 200k RES OCOM is ON and RES RANG AUTO LLI M gt 200k CURR DC METH is ICIR CURR DC METH is ICIR CURR DC AVER AUTO is ON CURR DC AVER AUTO is ON CURR DC AVER AUTO is ON CURR DC AVER AUTO is ON CURR DC AVER AUTO is ON TEMP DIG AUTO is ON TEMP RTD TYPE is not USER TEMP RTD TYPE is not USER TEMP RTD TYPE is not USER TEMP RTD TYPE is not USER Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com E 5 TIEEE 488 Conformance Information Table E 2 cont Coupled commands Command Also changes To If TEMP RTD BETA TEMP RTD TYPE USER TEMP RTD DELT TEMP RTD TYPE USER TEMP RTD RZER TEMP RTD TYPE USER TEMP TC TYPE TEMP DIG varies per TC type TEMP DIG AUTO is ON ROUT CLOS ROUT SCAN LSEL NONE ROUT OPEN ROUT SCAN LSEL NONE the command actually opens a channel ROUT OPEN ALL ROUT SCAN LSEL NONE ROUT SCAN INT ROUT SCAN LSEL INT ROUT SCAN RAT FUN
84. Display 2 4 Display resolution 2 40 Enable registers Enabling rel Error and status message 3 5 Event registers Example programs G 1 External triggering 2 50 1 1 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Filter Filter modes Filter types 2 71 Frequency Front panel aspects of IEEE 488 operation Front panel operation Front panel scanner controls Functions G GENERAL 2 99 General bus commands General information GET f Se executive trigger GPIB GTL go to local H Halting triggers 2 50 High energy circuit safety precautions 2 4 HP3458A emulation mode I IEEE 488 conformance information E 1 IEEE 488 bus connections IEEE 488 bus overview IEEE 488 primary addresg 2 4 IEEE 488 reference IEEE 488 status indicators IFC interface clear Information messages Inspection Interface functi O on codes B 1 Introduction L LIMITS 2 97 Line fuse rep acement 2 2 Line power connections 2 1 LLO local lockout 3 4 LOCAL key Manual addenda M anual ranging Math Maximum readings Menu Multiple display of rel Multiple displays Navigating menus 2 9 O Options and accessories 1 2 Percent Percent deviation 2 76 Polynomial Power on default conditions 2 4 Power up 2 1 Power up sequence Primary address selection Programming syntax
85. EENE eare ASCH data TOrmat viore eara E oase sevens TE ii di E IEEE754 single precision data format 32 data bits ooooncnionnnnncnncnonccnorononcnnnnconononnnonn non onn ran cnnon crac IEEE754 double precision data format 64 data bits ooooocnncnccninnoonoccnocnnononononononnonncnnnonrnonnonnnnnnnns Measurement Event Register secie esias kenean raeo ear ae EEEa E EEEE SENESE EEE A TEE Ke Aei Ees Questionable Ev nt Register vieires onsere nitre r E EE EE EE rara aii seda Operation Event Register c csissisccssscssshccesstasisezsestesnbaadescdstonaacvsbaeneiicavdedvons Es EEE ORDRENE tienes Tigger CO A a a E AEEA A E Ee ea Armm Event EE E Sequence Event RESISTED mia risereu ee eee care ET D Measurement Event Enable Register e neoseeosessesseeroerreerorseereteronreereerrorreeresrseererreereetrerretrertssrsstres Questionable Event Enable Register sci ssscsi stesceaeeauens ENEE SEENEN Operation Event Enable Register Trigger Event Enable AAA A Arm Event Enable Register 2 sc sscts sceecsceoccensiegdeccassvedeccdusvushsvenaeveshivgtece nebo sdeesgevecbasscdasostdssetartbedescsusvasalens Sequence Event Enable Re Sister eegene tosch ibseenceasbevosusersssvdaesvbsnscnvtesvenbabiysauddsatespiaeseancvecdacens Measurement Transition Filter sssisccscccssessssscessesnzansdeiseeyaeseaatieuncssideseueossubesbannsnvcevies easdanssevavnyaasbesseonas Questionable Transition Filter ii a ice Operation Transition Filter csi iccseccssehsseascdanssssceai
86. FILT annunciator comes on Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com AVERAGING Use this selection for a non windowed averaging filter A message indicating the presently set number of reading con versions to average the stack size is displayed If you change the filter value be sure to press ENTER Note that the number of reading conversions selected for the averaging filter type is also coupled to that for the advanced filter type ADVANCED This selection is for an averaging filter with a noise window It is not available with dB or dBm units ratio or delta tem perature or frequency A message indicating the presently set number of reading conversions to average the stack size is displayed You can retain the present filter value or you can key in an other value In either case press ENTER to display the max imum noise window The displayed level is the plus or minus percentage of range window around the first reading conversion in the stack Be sure to press ENTER if you key in a different percentage Note that the number of reading conversions filter value se lected for the advanced filter is also coupled to that for the averaging filter AVERAGING MODE This selection determines the mode of a digital filter for a measurement function either a moving or repeating average MOVING This item selects a moving filter where a new readi
87. G 9 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Example Programs Program astream bas cont cmd sens volt dc aver stat off adv stat off GOSUB sendcmd cmd syst amet astr GOSUB sendcmd SLEEP 1 CLS PRINT Test in Progress r SPACES 16 t1 TIMER FOR x 1 TO 1000 CALL enter r length 16 status rdg x VAL r NEXT x t2 TIMER PRINT Starting Time PRINT Ending Time t2 PRINT Elapsed Time t2 tl PRINT R CALL transmit listen 16 sdc status SLEEP 1 INPUT zz FOR x 1 TO 1000 PRINT rdg x IF rdg x gt 30 THEN BEEP JEXT Xx END sendcmd G 10 IF status lt gt 0 THEN PRINT status TOP ID IF ETURN un DO DG CALL send 16 cmd status init cont on eadings Per Second 1 t2 t1 1000 Turn Filters off Set for ASCII stream 1 second delay for setup Clear Screan Alocate string space Get starting time Take 1000 readings Get Readings Get ending time Print starting time Print ending time Print elapsed time Print reading rate Send device clear to 2002 1 second delay Display reading End test Send commands check send status Stop on errors Test Equipment Depot 800 517 8431 99 Washington Stre
88. GQ 0 4 1 5 3 5 3 15 8 19 9 23 10 2 18 EMA 2 10000000 10 nv gt 100 GQ 0 2 0 15 12 0 3 6 0 8 10 0 9 14 1 0 2 0 18 20V 21 0000000 100 nV gt 100 GQ 0 1 0 05 1 2 0 1 6 0 15 10 0 15 14 0 15 0 3 0 02 200 V 210 000000 1 uN 10 MO 1 0 5 0 08 5 04 14 2 22 2 30 2 1 5 0 3 1000 V7 1100 00000 10 pV 10 MO 1 1 0 05 5 0 08 14 0 4 22 0 4 30 0 4 1 5 0 06 1 o Fort 1 C 2ForT_ 5 C CAL For 2 C of last AC self cal Specifications are for 10 power line cycles synchronous autozero 10 reading repeat digital filter autorange off except as noted 5 Specifications apply for 20 reading repeat digital filter TREF 0 5 C TREF is the initial ambient temperature and for measurements within 10 of the initial measurement value and within 10 minutes of the initial measurement time For Ten 1 C following 4 hour warm up TCAL is ambient temperature at calibration 23 C at the factory Add 0 5 ppm of reading uncertainty if the unit is power cycled during this interval 7 For Tea 5 C following 4 hour warm up Care must be taken to minimize thermal offsets due to operator cables Add 20ppm x VIN 1000V Y additional uncertainty for inputs above 200V except in transfer accuracy specifications Specifications are subject to change without notice SPEC 2002 Rev H February 2009 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Page 1 of 14 KEITHLEY Kei
89. Get response messag from 2002 O PEN ALL ROUTe O PEN ALL O pen closed channel This action command is used to open a closed channel on the Model 2001 SCAN Note that this command performs the same function as the ROUTe OPEN ALL command that was previous ly discussed PRINT 1 output 16 rout open all Open all channels SCAN commands INTernal lt list gt RO UTe SCAN INTernal lt list gt Define internal scan list and enable scan lt list gt scanlist where scanlist is the specified list of channels 1 to 10 to be scanned INTernal Query programmed scan list This command is used to define the scan list for the internal Model 2001 SCAN scanner card The scan list can contain 2 to 10 channels The following examples demonstrate the various forms for expressing a scan list list 2 4 6 Channels separated by commas 1 8 Range of channels 1 though 8 Range limits separated by a colon O 1 5 7 Range entry and single entry separated by a comma See paragraph 2 11 and the Model 2001 SCAN instruction manual for details on scanning PRINT 1 output 16 rout scan 1 5 Define scan list and scan chan nels Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Parameters Query Description Program fragment Parameters Query Description EXTernal lt list gt RO UTe SCAN EXTernal
90. Melrose MA 02176 TestEquipmentDepot com DCV ohms and DCI calibration requires the use of accurate calibration equipment and is only intended to be performed by qualified service personnel Refer to the Model 2002 Cal ibration Manual to calibrate these functions AC CAL Use this menu item to perform the AC self calibration procedure NOTE The AC calibration constants generated by this procedure are not permanently stored They are in effect only until the power is turned off To permanently store AC cali bration constants refer to the Model 2002 Calibration Manual To perform an AC only calibration follow these steps 1 The Model 2002 must be allowed to warm up for at least one hour before calibration 2 Disconnect all test leads or cables from the front and rear INPUT and SENSE jacks 3 Select POINT CALS from the PERFORM CALIBRA TION menu 4 Press ENTER to begin AC calibration which takes about six minutes to complete NOTE All keypresses are locked out when a cali bration step is in progress 5 Once the process has successfully completed the AC CAL COMPLETE message is displayed and you can press ENTER or EXIT to return to a normal display DCV OHMS and DCI These menu items are used to cali brate DCV ohms and DCI The calibration procedures are locked out to prevent accidental changing of calibration con stants These calibration procedures should only be per formed by qualified service
91. NTOLerance lt n gt Specify noise tolerance level 0 to 100 1 NTOLerance Query noise tolerance level STATe lt b gt Enable or disable advanced filter ON STATe Query state of advanced filter STATe lt b gt Enable or disable filter Note 4 STATe Query state of digital filter AUTO lt b gt Enable or disable auto filter Note 5 AUTO ONCE Enable and then disable auto filter AUTO Query auto filter 3 54 Test Equipment Depot 800 517 8431 99 Washington Street Melrose TestEquipmentDepot com MA 02176 Table 3 10 Continued SENSe command summary IEEE 488 Reference Default Command Description parameter SCPI Ref RESistance Path to configure resistance y APERture lt n gt Set integration rate in seconds 166 67e 6 to 1 Note 2 y 3 18 5 AUTO lt b gt Enable or disable auto aperture OFF AUTO ONCE Enable and then disable auto aperture AUTO Query auto aperture APERture Query aperture y NPLCycles lt n gt Set integration rate line cycles 0 01 to 50 1 y 3 18 6 AUTO lt b gt Enable or disable auto NPLC OFF AUTO ONCE Enable and then disable auto NPLC AUTO Query auto line cycle integration NPLCycles Query line cycle integration rate y RANGe Path to configure measurement range y 3 18 8 UPPer lt n gt Select range 0 to 1 05e9 1 05e9 y UPPer Query range y AUTO lt b gt Enable or disable auto range ON y AU
92. Pressing FILTER a second time disables the filter Filtering is performed only on primary display measure ments it has no effect on multiple displays 2 9 1 Filter types The Model 2002 has two types of digital filters averaging and advanced Both types are a simple average of one to 100 reading conversions The difference between them is the user programmable noise window of the advanced filter The noise window which is expressed as a percentage of range 0 100 allows a faster response time to large signal step changes e g scanned readings A reading conversion outside the plus or minus noise window fills the filter stack immediately If the noise does not exceed the selected percentage of range the reading is based on an average of reading conversions In this case the advanced filter works the same as the averaging filter If the noise does exceed the selected percentage the reading is a single reading conversion and new averaging starts from this point The two filter types are compared in Figure 2 30 2 9 2 Filter modes An additional filter parameter is the mode either moving or repeating A moving filter is a first in first out stack where the newest reading conversion replaces the oldest An aver age of the stacked reading conversions yields a reading Therefore after a selected number of conversions a moving filter gives a new reading for every new conversion A repeating filter takes a selec
93. SOURce lt name gt Specify measure event control source lt name gt HOLD Hold operation in specified layer IMMediate Pass operation through specified layer RTCLock Select real time clock as event Arm Layer 1 only MANual Select manual event BUS Select GPIB trigger as event TLINk Select Trigger Link as event EXTernal Select External Triggering as event TIMer Select timer as event not available for Arm Layer 1 SOURce Query programmed control source These commands are used to select the event control source for the specified layer With HOLD selected operation stops and waits indefinitely in the specified layer While in HOLD operation can be continued by sending the MMediate command or the SIGNal command Keep in mind however that if the layer count is gt 1 HOLD is again enforced when operation loops back around With IMMediate selected do not confuse SOURce IMMediate with MMediate operation immediately passes through the specified layer A specific event can be used to control operation through a layer With BUS selected operation continues when a GPIB trigger GET or TRG is sent With TLINk selected operation contin ues when an input trigger via the Trigger Link is received With EXTernal selected operation continues when an External Trigger is received A real time clock event is available for the arm layer Arm Layer 1 With RTCLock selected event detection is satisfied at the programmed date and time
94. Set C7 0 Subrange 10 273 15K 429 7485K A10 to A7 B10 to B7 Set C7 0 Subrange 11 273 15K 302 9146K A11 to A7 Set B7 0 C7 0 Suppose you are using an SPRTD that has been calibrated for subrange 2 above that is cali brated for measurements between 24 5561 and 273 16K The Model 2002 however supports only SPRTD temperatures down to 83 805K so temperatures below this value will be reported as an overflow even though the SPRTD is capable of measuring lower The calibration certificate lists A2 B2 C1 C2 and C3 as the calibration coefficients You can set up the Model 2002 for this measurement as follows 1 Set the temperature sensor type to FRTD 4 wire measurement by sending SENS1 TEMP TRAN FRTD 2 Choose the RTD type as SPRTD SENS1 TEMP RTD TYPE SPRTD 3 Set the RTD sensor 0 C resistance value SENS1 TEMP RTD SPRTD RZER lt R_zero gt 4 Set the A4 coefficient to the RTD certificate value for A2 SENS1 TEMP SPRTD A4 lt certificate_A2_value gt 5 Set the B4 coefficient to the RTD certificate value for B2 SENS1 TEMP SPRTD B4 lt certificate_B2_value gt Note that the A7 B7 and C7 values will not be used for this sensor 6 Change to the temperature function and begin taking readings TCouple TYPE lt name gt SEN Se 1 TEM Perature TCouple TYPE lt name gt Specify TC type lt name gt J Set operation for Type J thermocouples T Set operation for Type T thermocouples K Set operation for T
95. Source Channel layer Channel spacing TrigLink Trigger link mode Asynchronous Input line 4 Output line 3 Number of channels 20 Channel trigger control Source Indicates that the setting is the RESET and factory default condition Notice that the Model 2002 is reset to BENCH defaults With this selection the multimeter stays armed Since the arm source and scan source are set to Immediate the Model 2002 waits in the measure layer for a trigger Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com To run the test and store the readings in the Model 2002 press STORE on the multimeter enter the desired number of readings 20 and press ENTER The Model 2002 waits with the asterisk annunciator lit for a Trigger Link trigger from the Model 7001 7002 Press STEP on the Model 7001 7002 to start the scan The following explanation on operation is referenced to the oper ation model shown in Figure 2 25 A Pressing STEP on the Model 7001 7002 takes it out of the idle state and places operation at point A in the flowchart Since the arm layer is programmed for Immediate Spacing operation drops down to the scan layer at point A Since Scan Trigger Control of the Model 7001 7002 is set for Source the scan does not wait at point A for a trigger Instead it bypasses Wait for Trigger Link Trigger and pro ceeds to point B Note that this Bypass is in effect only o
96. Street Melrose MA 02176 TestEquipmentDepot com Example Programs Program bufclint bas cont Idle 2002 and 7001 cmd RST init cont off GOS cmd GOS cmd GOS cmd GOS VT UB send2002 abor B send2002 abor B send7001 UI UB send7001 UI nitialize 2002 RST init cont off cmd syst azer stat on B send2002 B send2002 sens volt 2 sens volt 2 sens func B send2002 form elem read de nple 01 dc rang 1 temp aver stat off UI UI UI UI UI sens temp UB send2002 UI UI UI UI 5 UI sens temp B send2002 rout scan B send2002 rout scan B send2002 rout scan B send2002 rout scan B send2002 Set up TC parameters G 18 cmd GOS cmd GOS cmd GOS cmd GOS cmd GOS cmd GOs cmd GOS cmd GOS cmd GOS cmd GOs cmd GOS temp tran B send2002 B send2002 B send2002 rout clos B send7001 D ct B send2002 UI UI 5 UI 5 UI UI UB sen 5 UI UI 5 UI 5 UI UI ct 2002 D ct B send2002 rout open B sen D Da B send Di D send trig sour temp rJun1 emp rjun emp rjun nple 01 ext func 1 rjunl ext func 2 3 temo ext func 4 5 volt dc ext 1 5 te temp tc type k
97. TRACE Iin cxt Isource 2 The instrument then measures the voltage Vmeas2 across the conductor without sourcing an additional current Vugas2 Cy cxt R trace or _ VMEAS2 R TRACE Ulm ce H Note The distance X must be greater than 10 times the distance Y or additional errors will be introduced Circuit Under Test p ech Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 3 It then calculates the in circuit current by combining the equations and solving for La cx VMEASI _ Veeas2 Uu eer Isource Um cx Nuwpasllm cv Vueas2 ln cxr source Vueasi n cxt Vmeasz lm ckr Nawpaszllsouscr Veeasi in cxt Vmeas2Un ckr Vmeasz lsource Tin cxt Y measi Vmeas2 V meas2U source Vueas2U source I ro BASE OUNCE IN CKT Vugasi Y mEas2 Because of accuracy considerations in circuit current read ings are limited to traces with a resistance of 1mQ to 10Q If either of these limits is exceeded in the resistance calcula tion the in circuit current cannot be calculated The bottom line of the front panel display will show and update the trace resistance A procedure to measure in circuit current follows 1 Select the in circuit current measurement mode from the CONFIGURE DCI menu and place the instrument in the DCI function Note that the 4W annunciator lights to indicate this is a 4 wire measurement 2 Connect a set of Ke
98. The program assumes that the Model 2002 is set to address 16 Loading user library The user library for QuickBASIC 4 5 is provided with the TEEE 488 interface ieeeqb qlb Assuming QuickBASIC and the user library are in the same DOS directory enter the following command line from the DOS prompt QB L ieeegb qlb The above command line will load QuickBASIC and the user library Include only the readings in the data string Select the ohms function Close channel 2 Fetch reading Print reading Select the temperatur function Close channel 4 Fetch reading Display reading Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Scan Thermocouple Card Model 7014 Microsoft QuickBASIC 4 5 Keithley KPC 488 2 Interface 1992 Keithley Instruments Inc Description This program scans and measures five channels of the Model 7014 Thermocouple Multiplexer Card Channels 2 and 3 are configured for Type K TC temperature measurements using channel 1 as the reference junction Channels 4 and 5 are configured for DCV measurements on the 2V range Seven scans are performed for a total of 35 measurements After all 35 readings are stored in the buffer they are dumped out over the bus to the computer where each reading is dis played Also displayed on the computer CRT is the total pro cessing time in seconds for the 35 readings and the average time for each reading
99. after changing the reference level dBm dBm is defined as decibels above or below a 1mW ref erence With a user programmable reference impedance the Model 2002 reads OdBm when the voltage needed to dissi pate 1mW through the reference impedance is applied The relationship between dBm a reference impedance and the voltage is defined by the following equation 2 Vin Zrep dBm 10108 where Vis the AC input signal Zrer is the specified reference impedance NOTE Do not confuse reference impedance with input impedance The input impedance of the instrument is not modified by the dBm parameter If arelative value is in effect when dBm is selected the value is converted to dBm If a relative value is stored after dBm units are selected the units of the relative value is dBm To set the reference impedance perform the following steps After selecting dBm the present reference impedance is displayed 1 9999Q To change the reference impedance use the cursor keys lt q and and the RANGE A and Y keys Be sure to press ENTER after changing the reference impedance dB dBm notes 1 dB and dBm units are not allowed with positive or neg ative peak spike measurements 2 dB and dBm units are not allowed with an advanced filter 3 With dB or dBm units selected there is no bar graph or zero centered bar graph multiple display 2 14 4 When units are changed from volts to dB or dBm all values less th
100. and readings from memory The OFORMAT command is identical to the MFORMAT command Both commands control the format of both normal and memory readings OFORMAT ASCII Select ASCII format To request a report of installed options OPT No installed options 1 MEM1 or MEM2 extended memory option installed The OPT query requests a report of installed options The response is a numeric value that indicates whether or not a memory option is installed To select the period measurement function PER lt max_input gt lt _resolution gt lt max_input gt lt _resolution gt Ignored The PER command selects the period function as the measurement mode for the Model 2002 Both parameters are ignored as the Model 2002 uses only autoranging for period measurements The front panel does not display period measurements PER Select period function PRESET lt type gt lt type gt NORM FAST or DIG NORM AZERO ON NDIG 6 DCV AUTO NPLC 1 DISP ON NRDGS 1 AUTO FSOURCEACV OCOMP OFF TARM AUTO TIMER 1 TRIG SYN Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com D efault Description Example RANGE Purpose Format Parameter Default Query Description Example RESET Purpose Format Parameter Description HP3458A Emulation Mode FAST Same as NORM with the following exceptions DCV 10 OFORMAT DINT DISP OFF TRI
101. back into the previous layer or idle Enabling the Source Bypass for the arm and scan layers also enables their output triggers When operation leaves the arm or scan layer the appropriate output trigger pulse occurs If the Trigger Link TLINk control source is selected the output trigger is available on the programmed Trig ger Link output line For all other control source selections the output trigger pulse is available at the METER COMPLETE Output connector The output trigger in these two layers is disabled when the source bypass is disabled The output trigger in the measure layer is always enabled and occurs after the device action With ACCeptor selected the bypass is disabled This simply means that operation will not pro ceed through the specified layer until the appropriate event occurs PRINT 1 output 16 trig tcon dir sour dir Enable measure sourc bypass PRINT 1 enter 16 Get response from 2002 ASYN chronous commands ILINe lt NRf gt ARM SEQ uence 1 LAYer 1 TCO N figure ASYN chronous ILINe lt NRf gt Select input trigger line arm layer ARM SEQ uence 1 LAYer2 TCO N figure ASYNchronous ILINe lt NRf gt Select input trigger line scan layer TRIGger SEQ uence 1 1 TCO Nfigure ASYN chronous ILINe lt NRf gt Select input trigger line mea sure layer lt NRf gt 1 Line 1 lt NRf gt 4 Line 4 2 Line 2 5 Line 5 3 Line 3 6 Line 6 ILINe Query programmed
102. below These commands will not be accepted and will generate a syntax error if any parameter is sent Otherwise they will return a Function not supported error 1 CALSTR query is supported and returns the calibration date 2 END ALWAYS or END 2 will be accepted but does nothing because END ALWAYS it the normal state of the Model 2002 3 QFORMAT 0 or QFORMAT NUM will be accepted as a no op QFORMAT always returns a 1 4 RATIO returns a 0 for compatibility 5 The following commands will be accepted but do nothing because they are the normal state of the Model 2002 BEEP OR BEEP OFF INBUF or INBUF OFF MMATH or MMATH OFF DEFEAT or DEFEAT OFF LFILTER or LFILTER OFF RATIO or RATIO OFF FIXEDZ or FIXEDZ OFF MATH or MATH OFF TBUFF or TBUFF OFF Command syntax and compatibility The following paragraphs discuss certain command syntax and compatibility issues that apply to the HP3458A emula tion mode Parameter defaults The Model 2002 will assume default parameters if the parameters are omitted Default parameters assigned a value of 1 Sequential commas or omission of the first parameter however are not supported Examples FUNC Supported FUNC ACV Supported FUNC ACV 1 1 Not Supported FUNC AUTO Not Supported FUNC ACV Not Supported Delimiting parameters The Model 2002 supports an undocumented feature of the HP3458A which allows parameters to be separated by either spaces or commas H 2 Examples RANGE
103. between buffer readings FOR Mat Query timestamp format This command is used to select the timestamp format for buffer readings With ABSolute selected each timestamp is referenced to the first reading stored in the buffer With DELTa selected timestamps provide the time between each buffer reading See paragraphs 3 14 FORMat ELEMents and 3 21 14 SYSTem TSTamp for more information PRINT 1 output 16 trac tst form delt form Select DELTa timestamp and query PRINT 1 enter 16 Get response from 2002 3 151 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 23 Trigger subsystem 3 23 1 Description Program fragment Parameters Query Description Program fragment 3 23 2 Description Program fragment 3 23 3 3 152 The Trigger subsystem is made up of a series of commands and subsystems to configure the three layers of the Trigger Model see paragraph 2 7 and 3 8 for details These commands and subsystems are summarized in Table 3 15 IN T ate commands IM Mediate IN ITiate IM M ediate Take 2002 out of idle This command takes the Model 2002 out of the idle state After all programmed operations are completed the instrument leaves the trigger layers and returns to the idle state if continuous ini tiation is disabled see next command PRINT 1 output 16 init Take 2002 out of idle CONTinuous
104. cancelled when a device clear DCL or SDC is sent to the Model 2002 Keep in mind that the instrument remains at the settings that it assumed for the stream mode After cancelling the stream mode again wait before sending any more commands See Table 3 17 The delay times in Table 3 17 only account for processing the stream command and the device clear command Commands that precede the stream command must be allowed to finish execut ing before the stream command is sent The OPC command is recommended for this purpose When OPC is sent subsequent commands will not execute until the operations of all previous commands are completed The use of OPC is demonstrated in Program Fragment 2 Triggering In stream the trigger model functions normally except that the Manual and Hold control sources cannot be used The Group Execute Trigger GET is functional when the Bus control source is selected For optimum speed set up the measure layer for Immediate control source infinite count and zero delay Reading Rates The maximum possible reading rate for the SSTReam mode is 2000 per sec ond and is only achievable for controllers that can pull each reading out of the Model 2002 in less than 100usec The maximum possible reading rate for the ASTReam mode is 1000 per sec 3 141 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference ond Maximum reading rates require t
105. covers syntax for both common commands and SCPI commands For information not covered here refer to the IEEE 488 2 and SCPI standards Command words Program messages are made up of one or more command words 1 Commands and command parameters Common commands and SCPI commands may or may not use a parameter Examples SAV NR Parameter NRf required RST No parameter used INITiate CON Tinuous lt b gt Parameter lt b gt required SYSTem PRESet No parameter used Note that there must be at least one space between the command word and the parameter Brackets There are command words that are enclosed in brackets These brackets are used to denote an optional command word that does not need to be included in the pro gram message For example INI Tiate IMMediate The brackets indicate that MMediate is implied optional and does not have to be used Thus the above command can be sent in one of two ways INITiate or INITiate IMMediate Notice that the optional command is used without the brackets Do not include the brack ets when using an optional command word Parameter types Some of the more common parameter types are explained as follows lt b gt Boolean Used to enable or disable an instrument operation 0 or OFF dis ables the operation and or ON enables the operation Example CURRent AC RANGe AUTO ON Enable auto ranging ACIDC Explicit This is an example of two explicit parameters to c
106. day gt 1to31 Specify year Specify month Specify day DATE Query the date This command is used to set the date for the real time clock Setting an invalid date i e Febru ary 29 1994 result in an error and the previous date is retained Set date to December 1 1993 and query PRINT 1 enter 16 Get response message from 2002 PRINT 1 output 16 syst date lt 1993 gt lt 12 gt lt l gt date TIME lt hr gt lt min gt lt sec gt SYSTem TIM E lt hr gt lt min gt lt sec gt Set time for clock lt hr gt Oto 23 lt min gt 0 to 59 lt sec gt 0 00 to 59 99 Specify hour 24 hr format Specify minute Specify second rounded to 1 100 sec TIME Query the time This command is used to set the time for the real time clock Note that the time must be set using the 24 hour format i e hour 13 is 1PM Setting an invalid time results in an error and the pre vious time is retained TIME returns the time to nearest hundreth of a second Set time to 2 36 pm and query Get response mes sage from 2002 PRINT 1 output 16 syst time lt 14 gt lt 36 gt lt 0 gt time PRINT 1 enter 16 3 145 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 21 14 TSTamp commands The following commands are used to configure and control the timestamp For more informa tion on times
107. display or to clear the display ON selects normal operation OFF displays a message if a valid message parameter has been sent otherwise all dashes are displayed Readings are no longer dis played and the display is not updated except to service front panel keystrokes The MSG parameter simply displays a message on the front panel and the CLR parameter clears the display entirely The lt message gt parameter is any string up to 52 characters enclosed in double quotation marks DISP OFF Turn off display DISP ON Enable normal display operation DISP MSG Model 2002 Display message To enable certain error conditions to set the error bit in the status register EMASK lt bit_value gt Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Parameter D efault Query Description Note Example ERR Purpose Format R esponse Description Note HP3458A Emulation Mode lt bit_value gt Decimal lt bit_value gt Bit number Error condition 1 0 Hardware error 4 2 Trigger too fast error 8 3 Syntax error 16 4 Command not allowed from remote 32 5 Undefined parameter received 64 6 Parameter out of range 2048 11 Settings conflict 16384 14 Function not supported 32767 EMASK Returns the weighted decimal sum of all enabled error conditions The EMASK command enables certain error conditions to set the error bit in the status register Note that the
108. displays 2 20 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation RMS RANGE Set by ACV range auto or fixed Autoranges independently of other functions REL O perates normally SPEED Set by ACV speed FILTER Set by ACV filter RESOLUTION Set by ACV resolution UNITS Set by ACV units COUPLING Set by ACV coupling AC TY PE Fixed on normal mode RMS 000 000 mVAC RMS AVG 000 000mV Peak 000 0mV RANGE Set by ACV range auto or fixed RANGE Set by ACV range auto or fixed Autoranges independently of other functions Autoranges independently of other functions REL No effect REL No effect SPEED Set by ACV speed SPEED Fixed at 100msec Peak window has no FILTER Unaffected by ACV filter effect RESO LU TIO N Fixed at 5 5 digits FILTER Unaffected by ACV filter UNITS Fixed on volts RESOLUTION Fixed at 4 digits COUPLING Set by ACV coupling UNITS Fixed on volts COUPLING Set by ACV coupling B AC RMS average and peak voltages Figure 2 6 AC voltage multifunction multiple displays cont 2 21 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation Crest factor The crest factor of a waveform is the ratio of its peak value to its RMS value Thus the crest factor speci fies the dynamic range of a true RMS instrument For sin
109. filtering of DCV and ACV are listed in Table 2 9 Table 2 8 DCV and ACV integration times set by resolution Measurement Integration function and type Resolution time DCV 3 5d 4 5d 0 01 PLC 5 5d 0 02 PLC 6 5d 0 10 PLC 7 5d 1 00 PLC 8 5d 10 00 PLC DCV peak spikes 3 5d to 7 5d Not used RMS average 3 5d 4 5d 0 01 PLC 5 5d 0 02 PLC 6 5d 7 5d 8 5d 10 00 PLC Low frequency RMS 3 5d to 8 5d Not used ACV peak 4d to 8d Not used Notes 1 For DCV measurements if the integration time is SET BY RSLN and the resolution AUTO the integration time will be 1 0 PLC and the resolution 7 5 digits For RMS and average measurements if the integration time is SET BY RSLN and the resolution is AUTO the integration will be 1 0 PLC and the resolution 5 5 digits For DCV peak spikes low frequency RMS and ACV peak measure ments the integration time setting is ignored The resolution of DCV peak spikes can be from 3 5d to 8 5d but the accuracy is specified at 3 5d The resolution of ACV peak can be from 4d to 8d but the accuracy is specified at 4d N LA S Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation Table 2 9 DCV and ACV auto filter Measurement function Noise Averaging and type Units State Type Readings tolerance Mode DCV On Advanced 10 1 0 Moving DCV peak s
110. goes into idle INE INPUT 2 a Read the reading PRINT a Display the reading Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 11 Signal oriented measurement commands The signal oriented command group is used to acquire readings using a set of high level instructions to control the measurement process These commands are summarized in Table 3 3 Table 3 3 Signal oriented measurement command summary Command Description FETCh Requests the latest reading CONFigure lt function gt Places the 2002 in a one shot measurement mode for the specified function READ Performs an ABORt INITiate and a FETCh MEASure lt function gt Performs an ABORt CONFigure lt function gt and a READ FEIT Ch Description This query command is used to request the latest post processed reading After sending this command and addressing the Model 2002 to talk the reading will be sent to the computer This command does not affect the instrument setup This command does not trigger a measurement It simply requests the last available reading Note that this command can repeatedly return the same reading In the absence of a new reading this command will simply return the old reading If your application requires fresh readings use the DATA FRESh command see SENSe Subsystem This command is automatically asserted when the RE
111. in all three layers of the Trigger Model are set to Immediate e The count values in all three layers of the Trigger Model are set to one 1 e The delay in all three layers of the Trigger Model are set to zero 0 e The Model 2002 is placed in the idle state e All math calculations are disabled e Buffer operation is disabled A storage operation currently in process will be aborted e Autozero controls are set to the RST default values e The acquisition method is set to normal e All operations associated with switching cards scanning are disabled This command is automatically asserted when the MEA Sure command is sent PRINT 1 output 16 conf volt dc Perform CONFigure operations READ This command is typically used to acquire a post processed reading after the instrument has been configured by the CONFigure command The CONFigure command places the instru ment in a one shot measurement mode Every time the READ command is then sent a mea surement conversion will occur and the reading will be acquired When this command is sent the following commands will be executed in the order that they are presented ABORt INITiate FETCh When ABORt is executed the instrument will go into the idle state if continuous initiation is disabled Otherwise operation will re start at the beginning of the Trigger Model If the instrument is in the idle state INITiate will take the instrument out of the idle
112. instruments that measure 4 terminal resistance The Model 5805 is 0 9m long the Model 5805 12 is 3 6m long Model 5806 K elvin C lip Lead Set Includes two Kelvin clip test leads 0 9m with banana plug termination Designed for instruments that measure 4 terminal resistance A set of eight replacement rubber bands for the Model 5806 is available as Keithley P N GA 22 Model 8604 SMD Probe Set Consists of two test leads 3ft each terminated with a surface mount device grabber clip on one end and a banana plug with retractable sheath on the other end Model 8610 Low Thermal Shorting Plug Consists of four banana plugs mounted to a 1 inch square circuit board inter connected to provide a short circuit among all plugs Model 8611 Low Thermal Patch Leads Consists of two test leads 3ft each with a banana plug with a retractable sheath at each end These leads minimize the thermally induced offsets that can be created by test leads Model 8612 Low Thermal Spade Leads Consists of two test leads 3ft each terminated with a spade lug on one end and a banana plug with a retractable sheath on the other end These leads minimize the thermally induced offsets that can be created by test leads Model 8680 RTD Probe Adapter This adapts RTDs with terminated and unterminated cables to instruments with banana jacks for measuring 4 terminal resistance It has a 4 pin T style connector and a 4 pin screw terminal block Model
113. is measured also known as aperture It is discussed in paragraph 2 4 1 DC and AC voltage Only the differences for DC and AC cur rent are noted here SET BY RSLN This parameter optimizes the integration time for the present resolution setting The defaults for set by resolution integration times of DCI and ACTI are listed in Table 2 13 Table 2 13 DCI and ACI integration time set by resolution Measurement Integration function and type Resolution time DC current 3 5d 4 5d 0 01 PLC 5 5d 0 02 PLC 6 5d 0 20 PLC 7 5d 8 5d 2 00 PLC DC in circuit current 3 5d to 7 5d Not used RMS average 3 5d 4 5d 0 01 PLC 5 5d 0 02 PLC 6 5d 7 5d 8 5d 10 00 PLC Notes For normal DC current if the integration time is SET BY RSLN and the resolution is AUTO the integration time will be 1 0 PLC and the resolution 6 5 digits 2 For DC in circuit current the integration time setting is ignored For AC current if the integration time is SET BY RSLN and the res olution is AUTO the integration time will be 1 0 PLC and the reso lution 5 5 digits U Front Panel Operation FILTER FILTER lets you set the digital filter response The filter menu is available from the function configuration menus i e CONFIGURE DCI or by pressing CONFIGURE FILTER with the desired function already selected All of the param eters menu items for FILTER are explained in paragraph 2 9 Since the AUTO parameter has specif
114. is used to read the latest instrument reading This command returns the raw reading or a reading that is the result of the Reference REL from the front panel opera tion For example if a reference value of 1 0 is established the reading returned by this com mand is the raw reading minus 1 0 Calculated MATH readings cannot be read with this command see the CALCulate subsystem to read math calculations The reading is returned in exponent form For example a 10V DC reading will be displayed on the CRT as follows 1 000000E 01 Notice that the measurement function is not included in the response message Thus you may want to perform a function query see previous command after a reading query PRINT 1 output 16 data func Query a reading and query function PRI 1 enter 16 Get response from 2002 FRESh SEN Se 1 D ATA FRESh Return new reading This query command is used to return a new fresh reading This command will not request the same reading twice If a new reading is triggered this command will wait until the reading is available rather than request the old reading PRINT 1 output 16 data fresh Query new reading PRINT 1 enter 16 Get response from 2002 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 3 18 5 Parameters Query Description Program fragment IEEE 488 Reference
115. layl sour imm arm lay2 sour imm B send7001 trig sour tlin B send7001 trig tcon asyn ilin 1 olin 2 B send7001 arm layl coun 1 B send7001 trig del 0 B send7001 trig tcon dir sour B send7001 S SRE GOSUB send2002 stat meas ptr 32767 ntr 0 enab 512 GOSUB send2002 cmd trac feed calc GOSUB send2002 cmd trac poin 35 GOSUB send2002 cmd trac egr full GOSUB send2002 cmd form data sre GOSUB send2002 Example Programs Select Triglink lines input line 2 output line 1 Enable source bypass for trigger layer Set arm layer 1 count to 1 Set arm layer 2 count to 1 Set trigger layer count to 35 Set arm layer 2 delay to zero Set trigger layer delay to zero Open all channels Scan list chans 1 1 thru 1 5 Set arm layer 1 source to Immediate Set arm layer 2 source to Immediate Set trigger layer source to Triglink Select Triglink lines input line 1 output line 2 Set arm layer 1 count to 1 Set arm layer 2 count to 1 Set trigger layer count to 35 Set arm layer 2 delay to zero Set trigger layer delay to zero Enable source bypass of trigger layer Set MSB bit of SRE register Set all PTR bits and clear all NIR bits for measurement events Set Buffer Full bit of Measurement Event Enable Register Select Calculate as reading source Set buffer
116. limit These commands are used to set the upper and lower limits for LIMIT 1 and LIMIT 2 The actual limit depends on which measurement function is currently selected For example a limit value of 1 is 1V for the volts functions DCV or ACV 1A for the current functions DCI or 3 71 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Program fragment Parameters Query Description Program fragment 3 72 Parameters Query ACD 1 on the ohms functions Q2 or Q4 and 1 C F or K for the temperature function TEMP A limit value is not range sensitive A limit of 2 for DCV is 2V on all measurement ranges Note that limit tests cannot be performed on frequency FREQ measurements PRINT 1 output 16 calc3 lim upp 10 upp Set upper LIMIT 1 and query PRINT 1 enter 16 Get response message from 2002 SOURce lt NRf gt CALCulate3 LIM t 1 UPPer SOURce lt NRf gt Specify pattern upper LIMIT 1 failure CALCulate3 LIMit 11 LOWer SOURce lt NRf gt Specify pattern lower LIMIT 1 failure CALCulate3 LIM t2 UPPer SOURce lt NRf gt Specify pattern upper LIMIT 2 failure CALCulate3 LIMit2 LOWer SOURce lt NRf gt Specify pattern lower LIMIT 2 failure lt NRf gt 0to 15 Specify digital pattern for output port SOURce Query source value for specified limit These commands are used to specify which line s of the Digital
117. limited to 1 5kQ 31 Offset compensation voltage plus source current times measured resistance must be less than source current times resistance range selected 32 H For 2 wire mode 33 Current source is paralleled with a 10MA resistance ER Specifications are for 10 power line cycles 10 reading repeat digital filter synchronous autozero autorange off 4 wire mode offset compensation on for 200 to 20kQ ranges except as noted 35 For Ten 1 C following 4 hour warm up Tea is ambient temperature at calibration 23 C at the factory Specifications are subject to change without notice Page 6 of 14 SPEC 2002 Rev H February 2009 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com KEITHLEY Keithley Instruments Inc 28775 Aurora Road Cleveland Ohio 44139 1 888 KEITHLEY www keithley com Model 2002 Multimeter Specifications Resistance Uncertainty ppm of reading x measured value ppm of range x range used 1 000 000 Accuracy ppm accuracy 10 000 1ppm of Range 20 counts for ranges up to 200MQ and 10 counts on 1GQ range at 7H digits SPEED AND ACCURACY 90 Days Accuracy ppm of reading ppm of range ppm of range rms noise 10PLC DFILT On 10PLC 1PLC DFILT On 1PLC 0 1PLC 0 01PLC RANGE 10 Readings DFIL
118. lt b gt IN T ate CO N Tinuous lt b gt Control continuous initiation lt b gt OorOFF Disable continuous initiation 1 or ON Enable continuous initiation CONTinuous Query continuous initiation When continuous initiation is selected ON the instrument is taken out of the idle state At the conclusion of all programmed operations the instrument returns to Arm Layer 1 PRINT 1 output 16 init cont on cont Enable continuous initiation PRI 1 enter 16 Get response from 2002 ABO Rt ABORt Abort operation When this action command is sent the Model 2002 aborts operation and returns to the top of the Trigger Model If continuous initiation is disabled the instrument goes the idle state If con tinuous initiation is enabled operation continues on into Arm Layer 1 The abort command resets the source bypasses of the Trigger Model If scanning the scan pointer resets back to the first channel in the scan list PRINT 1 output 16 abor Abort operation IMM ediate ARM SEQ uence 1 LAYer 1 1M M ediate ARM SEQ uence 1 LAYer2 IM M ediate TRIGger SEQ uence 1 IM M ediate Bypass arm control source Bypass scan control source and delay Bypass measure control source and delay Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Description Program fragment 3 23 4 Parameters Query D escription Program fragment
119. lt bit_value gt parameter is sent as a decimal weighted value and multiple error conditions may be enabled by adding up the weighted values of all bits to be set Bits 1 7 10 12 and 13 are used in the HP3458A but are not supported by the Model 2002 Unlike the HP3458A a masked out error will not appear on the front panel display If the lt bit_value gt 0 errors returned by ERR will not be reported EMASK 2 Enable trigger too fast error EMASK 9 Enable hardware and syntax errors EMASK 2048 Enable settings conflict error To request the error register value ERR Decimal value Bit number Error condition 1 0 Hardware error 4 2 Trigger too fast error 8 3 Syntax error 16 4 Command not allowed from remote 32 5 Undefined parameter received 64 6 Parameter out of range 2048 11 Settings conflict 16384 14 Function not supported The ERR query returns the number representing all set bits in the error register Sending this query and reading the response also clears the error register Bits 1 7 10 12 and 13 are used in the HP3458A but are not supported by the Model 2002 If the EMASK lt bit_value gt above is set to 0 errors will not be reported by ERR H 7 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com HP3458A Emulation Mode ERRSTR Purpose Format Response Description FREQ Purpose Format Parameter Description Exam
120. new program message must begin with the root command unless it is optional Leg SENSe If the root is optional simply treat a command word on the next level as the root B The colon at the beginning of a program message is optional and need not be used Example stat pres stat pres C When the path pointer detects a colon it will move down to the next command level An exception is when the path pointer detects a semicolon which is used to separate commands within the program message see next rule D When the path pointer detects a colon that immediately follows a semicolon it resets back to the root level E The path pointer can only move down It cannot be moved up a level Executing a com mand at a higher level requires that you start over at the root command 4 Using common commands and SC PI commandsin same message Both common com mands and SCPI commands can be used in the same message as long as they are separated by semicolons A common command can be executed at any command level and will not affect the path pointer Example stat oper enab lt NRf gt ptr lt NRf gt ESE lt NRf gt ntr lt NRf gt 5 Program Message Terminator PMT Each program message must be terminated with an LF line feed EOI end or identify or an LF EOI The bus will hang if your computer does not provide this termination The following example shows how a multiple command program message must be termin
121. one of these commands and addressing the Model 2002 to talk the dis played data message or reading will be sent to the computer PRINT 1 output 16 disp data PRINT 1 enter 16 Query displayed data Get response message from 2002 CN Display DISPlay CN Display Clear cancel NEXT display This action command is used to clear the bottom display of NEXT or PREV messages and cancel the operations associated with them This command has no effect on any other message types This example assumes that a NEXT operation is currently being displayed PRINT 1 output 16 cnd Clear NEXT display SM ESsage lt b gt DISPlay SM ESsage lt b gt Control status message lt b gt 0or OFF Disable status messages 10rON Enable status messages SMESsage Query state of status message mode This command is used to enable disable the status message mode The status message mode is a diagnostic tool that provides real time messages that relate to the current operating state of the instrument Table 2 4 lists the status messages PRINT 1 output 16 disp smes on smes Enable and query status message mode PRINT 1 enter 16 Get response message from 2002 ENABle lt b gt DISPlay ENABle lt b gt Control display circuitry lt b gt 0or OFF Disable display circuitry 1orON Enable display circuitry ENABle Query state of display 3 77 Test Equipment Depot 800
122. or characters that are enclosed in brackets are optional and need not be included in the program message 3 25 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 26 Program messages A program message is made up of one or more command words sent by the computer to the instrument Each common command is simply a three letter acronym preceded by an asterisk SCPI commands are categorized into subsystems and are structured as command paths The following command paths are contained in the STATus subsystem and are used to help explain how command words are structured to formulate program messages STATus Path Root OPERation Path PTRansition lt NRf gt Command and parameter NTRansition lt NRf gt Command and parameter ENABle lt NRf gt Command and parameter PRESet Command 1 Single command messages There are three levels to the above command structure The first level is made up of the root command STATus and serves as a path The second level is made up of another path OPERation and a command PRESet The third path is made up of three commands for the OPERation path The four commands in this structure can be executed by sending four separate program messages as follows stat oper ptr lt NRf gt stat oper ntr lt NRf gt stat oper enab lt NRf gt stat pres In each of the above program messages the path pointer starts at the
123. paragraph 2 5 4 for details The ONCE parameter is analogous to a momentary toggle switch When RANGe AUTO ONCE is sent auto range enables and the most sensitive range is selected for the input signal Auto range will then disable but the selected measurement range is retained Note that the instrument must currently be on the specified function in order for ONCE to be effective Using ONCE while on any other function results in an error The autorange command RANGe AUTO is coupled to the command that manually selects the measurement range RANGe lt n gt When autorange is enabled the parameter value for RANGe lt n gt changes to the automatically selected range value Thus when autorange is dis abled the instrument remains at the automatically selected range When a valid RANGe lt n gt command is sent autoranging disables When using auto range upper and lower range limits can be established to keep the instrument from autoranging to ranges that are not going to be used see AUTO ULIMit and AUTO LLIMit commands PRINT 1 output 16 curr ac rang auto on auto Enable auto range for ACT PRINT 1 enter 16 Get response from 2002 3 97 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Parameters Query Description Program fragment 3 98 ULIMit lt n gt SEN Se 1 CU RRent AC RANGe AUTO ULIMit lt n gt
124. personnel Refer to the Model 2002 Calibration Manual for details on performing point cal ibration for these functions CALIBRATION DATES Use this menu item to view or change the calibration dates Use the VIEW option of the menu to display the last calibration date and the next calibration date The DISPLAY AT POWERUP option controls whether the next calibration date is displayed during the power up sequence Front Panel Operation The CHANGE option is locked to enable it requires the CAL switch to be pressed The option allows you to change the calibration date and next calibration date Refer to the Model 2002 Calibration Manual for instructions 2 12 4 TEST The SELF TEST MENU is used as a diagnostic tool to iso late problems with the Model 2002 Information on using these test procedures is included in the optional Model 2002 Repair Manual 2 12 5 LIMITS The LIMITS menu is used for the following operations e To set and control the limit values that determine the PASS FAIL and HI LO status of subsequent measure ments e To set the digital output patterns that signify passing or failing limit checks e To enable disable a binning strobe signal on digital out put 4 for triggering a user supplied device handler NOTE Since the logic sense of the digital output lines is programmable high true or low true this discussion of limits uses the log ical terms TRUE FALSE and ON OFF rather than HIGH and LOW
125. programming the function 2 All HP3458A functions not listed above are not supported by the Model 2002 FUNC DCV Select DCV function FUNC ACV AUTO Select ACV function autorange DCI AUTO Select DCI function without using header To request the instrument s identification string ID HP3458A H 9 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com HP3458A Emulation Mode Description LINE Purpose Format Response Description MCOUNT Purpose Format Response Description MEM Purpose Format Parameter Default Query Description The ID query allows you to request the instrument s identification string The multimeter responds with the string HP3458A To request the AC power line frequency LINE Line frequency in Hz The LINE query measures and returns the frequency of the AC power line The returned value is in Hz for example 60 To request the number of readings presently stored in memory MCOUNT Number of readings The MCOUNT query requests the total number of readings currently stored in memory The instru ment returns the total number of stored readings in standard numeric form To enable disable reading memory and to designate the storage mode MEM lt mode gt lt mode gt lt mode gt parameter Numeric equivalent Description OFF 0 Stops storing readings stored readings stay intact LIFO 1
126. relative value from the CONFIG REL display see para graph 2 6 1 A rel value can be established for each measurement func tion The state and value of rel for each measurement func tion are saved when changing functions Once a rel value is established for a measurement function the value is the same for all ranges For example if 150V is set as a rel value on the 200V range the rel is also 150V on the 1000V 20V 2V and 200mV ranges A relative value can be as large as the highest range for the particular function Table 2 26 lists the allowable range of rel values for each function Selecting a range that cannot accommodate the rel value does not cause an overflow condition but it also does not increase the maximum allowable input for that range For example on the 2mA range the Model 2002 still overflows for a 2 1mA input Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Table 2 26 Allowable rel values Function Rel range DC voltage 1 1e3 to 1 1e3 1100V AC voltage 7 75e2 to 7 75e2 775V DC current 1 2e1 to 1 2e1 12A AC current 2 1e0 to 2 1e0 2 1A 2 wire 0 to 1 05e9 0 to 1 05GQ resistance 4 wire 0 to 2 1e6 0 to 2 1MQ resistance Frequency 0 to 1 5e7 0 to 15MHz Temperature 3 28e2 to 3 3le3 328 to 3310 2 6 1 Configuring rel Pressing CONFIGURE REL displays the rel value for the present measurement funct
127. root command stat and moves down the command levels until the command is executed 2 Multiple command messages Multiple commands can be sent in the same program mes sage as long as they are separated by semicolons Example showing two commands in one program message stat pres stat oper enab lt NRf gt When the above message is sent the first command word is recognized as the root com mand stat When the next colon is detected the path pointer moves down to the next com mand level and executes the command When the path pointer sees the colon after the semicolon it resets back to the root level and starts over Commands that are on the same command level can be executed without having to retype the entire command path Example stat oper enab lt NRf gt ptr lt NRf gt ntr lt NRf gt After the first command enab is executed the path pointer is at the third command level in the structure Since ptr and ntr are also on the third level they can be typed in without repeating the entire path name Notice that the leading colon for ptr and ntr are not included in the program message If a colon were included the path pointer would reset to the root level and expect a root command Since neither ptr nor ntr are root commands an error would occur Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 Command path rules A Each
128. should match that used in the frequency measurement RESOLUTION The available display resolutions are 4 digits and 5 digits There is no auto resolution parameter on the frequency func tion 4 DIGITS Sets display resolution for frequency measure ments to 4 digits 5 DIGITS Sets display resolution for frequency measure ments to 5 digits Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Table 2 22 Front Panel Operation CONFIGURE FREQUENCY menu structure Menu item Description MAX SIGNAL LEVEL 1V 10V 100V 1000V TTL 1mA 10mA 100mA 1A RESOLUTION 4 DIGITS 5 DIGITS INPUT TERMINALS Display maximum signal level menu Select maximum voltage level for voltage inputs Select maximum current level for current inputs Display resolution menu Select a specific resolution Input terminals for frequency measurements menu VOLTAGE CURRENT COUPLING AC DC Select INPUT HI and INPUT LO terminals Select AMPS and INPUT LO terminals Coupling menu AC Select AC coupled measurements Select DC coupled measurements Notes 1 The maximum signal level menu is coupled to the input terminals menu i e voltage levels are shown if voltage is the selected input 2 With the Model 1801 Nanovolt Preamp installed and enabled the maximum signal level is fixed at 2mV INPUT TERMINALS Both the volts and amps input terminals can
129. source of readings to be placed in the buffer Front Panel Operation AFTER CALC With this item readings are stored in the buffer after any enabled math operations are performed BEFORE CALC With this item selected readings are placed in the buffer before any math is performed NONE With NONE selected no readings are placed in the buffer when storage is performed Pressing the STORE key changes NONE to the AFTER CALC selection 2 8 3 Storing and recalling readings Tables 2 32 through 2 34 detail the sequence of steps for the various modes of buffer control The tables assume the buffer is configured as explained in paragraph 2 8 2 Note that during data storage the reading number on the bot tom line of the display is one ahead of the reading on the top line There are multiple displays available when recalling buff ered readings These are explained in paragraph 2 8 4 Table 2 32 Fill and stop sequence Action Result Annunciator STORE STORE 00100 READINGS ENTER Storing reading xx of 100 on Storage complete press RECALL off RECALL _ Rdg 00000 Time 000 000000 sec Rdg 00099 Time 002 700473 sec EXIT normal reading display 2 69 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation Table 2 33 Continuous sequence Acquired 100 of 100 readings normal reading display Acti
130. state If continuous initiation is enabled INITiate CONTinuous ON then the INITiate command will generate an error and ignore the command The FETCh for details Note that an Init ignored error will not cancel the execution of the FETCh command PRI 1 output 16 conf volt dc Select one shot DCV function PRINT 1 output 16 read Perform READ operations PRINT 1 enter 16 Get response message from 2002 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Description Program fragment IEEE 488 Reference MEASure lt function gt where lt function gt VOLTage DC DCV function CURRent DC DCI function VOLTage AC ACV function CURRent AC ACI function RESistance Q2 function FRESistance Q4 function FREQuency FREQ function TEMPerature TEMP function This command combines all of the other signal oriented measurement commands to perform a one shot measurement and acquire the reading When this command is sent the following commands are executed in the order that they are presented ABORt CONFigure lt function gt READ When ABORt is executed the instrument will go into the idle state if continuous initiation is disabled Otherwise operation will re start at the beginning of the Trigger Model When CONFigure is executed the instrument will go into a one shot measurement mode See C
131. structure one con tained in paragraph 2 3 4 SOURCE This menu item selects the event that controls the measure source 2 46 IMMEDIATE With this selection events such as TIMER and EXTERNAL triggers do not control the measurement interval Once the Model 2002 starts measuring it will take readings as fast as its measurement configuration allows EXTERNAL With this selection external triggers are used to control the measure source Each trigger stimulus applied to the Model 2002 performs a device action as defined by the trigger model In addition to a measurement this may include range changing filtering calculations data storing scanning and other operations The external trigger is applied to the rear panel EXTER NAL TRIGGER BNC connector See paragraph 2 7 6 for detailed information on external triggering NOTE The front panel TRIG key see MANU AL is active with external triggering se lected Pressing the TRIG key performs a device action MANUAL With this selection the front panel TRIG key controls the measure source A device action is performed when the TRIG key is pressed NOTE The front panel TRIG key is active when EXTERNAL GPIB TRIGLINK or TIM ER is selected GPIB With this selection bus triggers control the measure source When the Model 2002 receives a bus trigger GET or TRG it performs a device action as defined by the trigger model In addition to a measurement this
132. temp tran int Select the internal transducer PRINT 1 output 16 func temp Select the TEMP function RTD commands See paragraph 2 4 5 for detailed information on making temperature measurements TYPE lt name gt SEN Se 1 TEM Perature RTD TYPE lt name gt Set RTD parameters lt name gt PT100 Selects default parameters for the PT 100 type ITS 90 D100 Selects default parameters for the D100 type ITS 90 F100 Selects default parameters for the F100 type ITS 90 PT385 Selects default parameters for the PT385 type ITS 68 PT3916 Selects default parameters for the PT3916 type ITS 68 USER Selects user defined parameters SPRTD Selects SPRTD type TYPE Query RTD type This command is used to select the RTD standard and the other related factors When one of the parameters other than USER is selected the instrument defaults to the following RTD factors RZero Standard Type Alpha Beta Delta Q at 0 C ITS 90 PT100 0 003850 0 10863 1 49990 1009 ITS 90 D100 0 003920 0 10630 1 49710 100Q ITS 90 F100 0 003900 0 11000 1 49589 1002 IPTS 68 PT385 0 003850 0 11100 1 50700 100 IPTS 68 PT3916 0 003916 0 11600 1 50594 100 Changing Alpha see ALPHa Beta see BETA Delta see DELTa or Q at 0 C see RZERo automatically changes the Type to USER TYPE USER Thus once you program the appropriate factors for your RTD you can later recall that setup by using the TYPE USER command PR
133. the current ranges one for the front terminals another for the rear This procedure describes how to change an AMPS fuse WARNING Make sure the instrument is disconnect ed from the power line and other equip ment before replacing an AMPS fuse 1 Turn off the power and disconnect the power line and test leads 2 Perform one of the following steps A For the front panel AMPS fuse gently push in the AMPS jack with your thumb and rotate the fuse car rier one quarter turn counter clockwise Release pressure on the jack and its internal spring will push the jack out of the socket B For the rear panel AMPS fuse place the end of a flat blade screwdriver into the rear panel AMPS holder Push in gently and rotate the fuse carrier one quarter turn counter clockwise Release pres sure on the holder and its internal spring will push the fuse carrier out of the holder Front Panel Operation 3 Remove the fuse and replace it with the same type 2A 250V fast blow 5 x 20mm The Keithley part number is FU 48 CAUTION Do not use a fuse with a higher current rating than specified or instrument damage may occur If the instrument repeatedly blows fuses locate and cor rect the cause of the trouble before replacing the fuse See the optional Model 2002 Repair Manual for trouble shooting information 4 Install the new fuse by reversing the above procedure Current configuration The following information explains the
134. the listen command and the DCL 14 20 SDC command byte itself SPE 18 24 SPD 19 25 Table D 4 gives a typical common command sequence In LAG 20 3F 32 63 Se ee Se E Ee SS aan is being TAG 40 5F 64 95 addressed but it is set high while sending the common com mand string SCG 60 7F 96 127 UNL ae sa IEEE command groups UNT SF 95 Command groups supported by the Model 2002 are listed in Table D 5 Common commands and SCPI commands are not included in this list Table D 3 Typical addressed command sequence Data bus Step Command ATN state ASCII Hex Decimal 1 UNL Set low 3F 63 2 LAG Stays low 0 30 48 3 SDC Stays low EOT 04 4 4 Returns high Assumes primary address 16 Table D 4 Typical common command sequence Data bus Step Command ATN state ASCII Hex Decimal 1 UNL Set low 3F 63 2 LAG Stays low 0 30 48 3 Data Set high gt 2A 42 4 Data Stays high R 52 82 5 Data Stays high S 53 83 6 Data Stays high T 54 84 Assumes primary address 16 D 7 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Bus Overview Table D 5 IEEE command groups HANDSHAKE COMMAND GROUP NDAC NOT DATA ACCEPTED NRFD NOT READY FOR DATA DAV DATA VALID UNIVERSAL COMMAND GROUP ATN ATTENTION DCL DEVICE CLEAR IFC INTERFACE CLEAR REN REMOTE ENABLE SPD SERIAL POLL DISABLE SPE SERIAL POLL ENABLE ADDRESS COMMAND GROUP LISTEN LAG
135. to the selected level 2 6 3 Multiple display of rel One of the multiple displays allows you to view the read ing without rel applied on the bottom line of the display and the rel d reading on the top line The display is available by repeatedly pressing either the NEXT or PREVious DIS PLAY key to scroll through the multiple displays of the par ticular function The following is a typical message for a rel multiple display 000 012 mVAC RMS Actual 001 012 without REL 2 7 Triggers The following paragraphs discuss front panel triggering trigger configuration and external triggering including ex ample setups Model 2002 triggers are set up in the CONFIGURE TRIG GER menu The menu structure is shown and summarized in Table 2 27 Some general rules to navigate menus are given in paragraph 2 3 4 2 7 1 Trigger model The following information describes triggering of the Model 2002 from the front panel The flowchart of Figure 2 12 sum marizes front panel triggering It is called the Trigger Model because it is patterned after the SCPI commands sent over the IEEE 488 bus to control triggering 2 41 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation Table 2 27 CONFIGURE TRIGGER menu structure Menu item Description MEASURE Measure layer menu SOURCE Select measure source IMMEDIATE Use to make measurements imme
136. trigger events Typically a Trigger Link out put trigger from the Model 2002 would be used to trigger a scanner to close the next channel There are two modes of operation for Trigger Link asyn chronous and semi synchronous In the asynchronous mode separate lines are used for input and output triggers in the semi synchronous mode the same line is used for both input and output triggers Asynchronous operation In the asynchronous operating mode Trigger Link functions fundamentally in the same manner as External Triggering see paragraph 2 7 6 Like External Triggering the asynchronous mode uses separate lines for input and output triggers Also the asynchronous mode uses the same TTL compatible pulses as External Triggering The specifications for the input and output trigger signals of asynchronous mode are shown in Figure 2 14 and Figure 2 15 respectively For typical asynchronous Trigger Link operation the mea sure layer is configured with Measure Source set to TRIGLINK and Triggerlink mode set to ASYNCHRO NOUS You must also select input and output lines for the measure layer Input and output triggers can be set to any of the six lines but they cannot use the same line For example if you select line 1 for input triggers then output triggers must use one of the other five lines 2 through 6 During operation in the measure layer each Trigger Link input trigger makes a measurement After the user programmed D
137. 0 OPEN ALL CHANNELS Selecting OPEN ALL CHAN NELS will immediately open any closed scanner card chan nels or channel pair for 4 wire functions Menu item CLOSE CHANNEL ENTER CH ANSOT 1 10 OPEN ALL CHANNELS Description Close channel menu Use cursor range and ENTER keys Press ENTER to open closed channel s Note This menu is only available with a scanner card installed 2 78 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 2 11 4 UsingCONFIGURE CHAN to configure channels The CONFIGURE CHANNELS menu allows you to e Select measurement functions for internal scanner card channels and define which channels to use when scan ning e Select measurement functions and the number of chan nels in an external scanner used with the Model 2002 e Define save and restore an alternate measurement function which can then be assigned to specific chan nels Table 2 39 summarizes the CONFIGURE CHANNELS menu structure which is discussed in detail in the following paragraphs Again see paragraph 2 3 4 for more information on navigating menus The CONFIGURE CHANNELS menu is displayed by pressing CONFIG and then CHAN INTERNAL CHAN The INTERNAL CHANS selection allows you to set the measuring function for each of the internal scanner card channels When this selection is made the currently selected function for each channel is displayed Ch
138. 0 Right Arrow 27 MAT 11 EXIT 28 CONFIG 12 02 29 DCI 13 RECALL 30 TRIG 14 CHAN 31 INFO 15 DCV KEY Query last pressed key This command is used to simulate front panel key presses For example to select DCV you can send the following command to simulate pressing the DCV key 3 143 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Program fragment 3 144 isyst key 15 The parameter listing provides the key press code in numeric order Figure 3 39 also provides the key press code The KEY command allows you to select the NEXT displays over the bus Sending SYS Tem KEY 16 over the bus is the same as a single press of the NEXT key Sending SYS Tem KEY 8 is the same as a single press of the PREV key The NEXT display that is selected depends on which function is currently selected and how many times the NEXT key is pressed using the KEY command The instrument can always be returned to the normal display by pressing the PREV key a similar number of times or by sending the DISPlay CNDisplay command For example on the FREQ function you can display the trigger level by pressing the NEXT key twice as follows isyst key 16 key 16 To return to the normal display press the PREV key twice as follows isyst key 8 key 8 The queue for the KEY query command can only hold one key press When KEY is sent over the bus
139. 0 001 C 0 5 C K 200 to 1372 C 0 001 C 0 5 C T 2007 to 400 C 0 001 C 0 5 C E 200 to 1000 C 0 001 C 0 6 C R 0 to 1768 C 0 001 C 3 C S 0 to 1768 C 0 001 C 3 C B 350 to 1820 C 0 001 C 5 C TC Temperature Reading Rates Error Bookmark not defined Readings Second to Memory Readings Second to IEEE 488 Readings Secondwith Time Stamp to IEEE 488 Autozero Autozero Autozero PLC Off On Off On Off On 10 6 5 2 1 7 6 5 2 1 6 6 5 2 1 6 2 29 25 9 7 6 29 24 9 7 4 27 22 9 7 4 1 57 48 47 40 56 46 46 38 50 41 42 34 0 1 131 126 107 103 100 96 84 81 83 80 72 69 0 01 168 168 112 112 121 121 89 89 96 96 74 74 OPERATING SPEED FUNCTION CHANGE SPEED Typical delay before measurement initiation after making a function change From Function To Function Range Time Any except 4WQ Temp DCV Any 4 6 ms 4WQ Temp Any 7 6 ms Any ACV Any 574 ms ACV DCV 2W0 Freq DCI Any 7 1 ms 4W0 Temp Any 10 ms ACI Any 22 ms Any ACI Any 523 ms Any except 4WQ Temp 2W0 200 to 2kO 4 7 ms 20kO 15 ms 200kQ 27 ms 2MQ 103 ms 20MQ 153 ms 200MQ 1GO 253 ms 4WQ Temp 2WQ 200 to 2kO 7 7 ms 20kO 18 ms 200kQ 30 ms 2MQ 105 ms 20MQ 157 ms 200MQ 1GQ 256 ms Any AW 200 to 2kO 7 7 ms 20kO 18 ms 4 Relative to external 0 C reference
140. 0 004 0 001 2V DV 2 100000 Tu 1MQ 2 with lt 140pF 0 004 0 001 20V 100 V 21 00000 10 pV 1MQ 2 with lt 140pF 0 006 0 001 200 V 800 V 210 0000 100 uV 1MQ 2 with lt 140pF 0 006 0 001 750 V 1100 V 775 000 1mV 1MQ 2 with lt 140pF 0 012 0 001 AC Voltage Uncertainty of reading x measured value of range x range used 100 PPM Accuracy accuracy x 10 000 0 015 of Range 30 counts for ranges up to 200V and 113 counts on 750V range at 5H digits LOW FREQUENCY MODE RMS 90 Days 1 Year or 2 Years 2 C from last AC self cal for 1 to 100 of range of reading of range Range 1 10Hz 10 50Hz 50 499Hz 501Hz 2kHz 2 10kHz 10 30kHz 30 50kHz 50 100kHz 100 200kHz 0 2 1MHz 1 2MHz 200 mV _ 0 09 0 015 0 06 0 015 0 035 0 015 0 03 0 02 0 02 0 02 0 025 0 02 0 05 0 02 0 3 0 015 0 75 0 025 2 0 1 5 0 2 EN 0 09 0 015 0 04 0 015 0 025 0 015 0 02 0 02 0 02 0 02 0 025 0 02 0 05 0 02 0 3 0 015 0 75 0 025 2 0 1 5 0 2 20V 0 1 0 015 0 06 0 015 0 035 0 015 0 03 0 015 0 04 0 015 0 05 0 015 0 07 0 015 0 3 0 015 0 75 0 025 4 0 2 7 0 2 200V 0 1 0 015 0 05 0 015 0 03 0 015 0 03 0 015 0 04 0 015 0 05 0 015 0 07 0 015 0 3 0 015 0 75 0 025 4 0 2 750 V7 0 13 0 015 0 09 0 015 0 05 0 015 0 05 0 015 0 06 0 015 0 08 0 015 0 1 0 015 0 5 0 015 NORMAL MODE RMS 90 Days 1 Year or 2 Years 2 C from last AC self cal for 1 to 100 of
141. 0 to 5 Specify RTD Delta value DELTa Query the Delta value This command is used to check and or change the Delta value Keep in mind that changing the current Delta value changes the Type to USER see RTD TYPE PRI 1 output 16 temp rtd delt 1 75 delt PRINT 1 enter 16 Specify delta value Get response from 2002 RZERo lt NRf gt SEN Se 1 TEM Perature RTD RZERo lt NRf gt Specify resistance at 0 C lt NRf gt 0 to 10000 Specify RTD Resistance at 0 C in ohms RZERo Query RTD resistance at 0 C This command is used to check and or change the Resistance at 0 C Keep in mind that chang ing the current resistance value changes the Type to USER see RTD TYPE PRI 1 output 16 temp rtd rzer 200 rzer PRINT 1 enter 16 Specify RZero valu Get response from 2002 SPRTD commands SEN Se 1 TEM Perature SPRTD RZERo lt N Rf gt SEN Se 1 TEM Perature SPRTD A4 lt NRf gt SEN Se 1 TEM Perature SPRTD B4 lt N Rf gt SEN Se 1 TEM Perature SPRTD A7 lt NRf gt SEN Se 1 TEM Perature SPRTD B7 lt N Rf gt SEN Se 1 TEM Perature SPRTD C7 lt NRf gt RZERo lt NRf gt A4 lt NRf gt B4 lt NRf gt AT lt NRf gt B7 lt NRf gt C7 lt NRf gt RZERo Query RTD 0 C resistance value A4 Query A4 coefficient B4 Query B4 coefficient A7 Query A7 coefficient B7 Query B7 coefficient C7 Query C7 coefficient Set RTD 0 C resistan
142. 00 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 13 D ISPlay subsystem Parameters Query D escription Program fragment Parameters Query D escription The display subsystem controls the display of the Model 2002 and is summarized in Table 3 5 TEXT commands DATA lt a gt DISPlay WINDow 1 TEXT DATA lt a gt Define message for top display DISPlay WINDow2 TEXT DATA lt a gt Define message for bottom display lt a gt ASCII characters for message Types String aa a or aa a Indefinite Block Mag a Definite Block HXYaa a where Y number of characters in message Up to 20 for top display Up to 32 for bottom display X number of digits that make up Y 1 or 2 DATA Query the defined text message These commands define text messages for display A message can be as long as 20 characters for the top display and up to 32 characters for the bottom display A space is counted as a char acter Excess message characters results in an error An indefinite block message must be the only command in the program message or the last com mand in the program message If you include a command after an indefinite block message on the same line it will be treated as part of the message and is displayed instead of executed PRINT 1 output 16 disp text data Model 2002 data Define and query message PRINT 1 enter 16
143. 00 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Program fragment 3 82 Parameters RNUMber The instrument keeps track of the number of readings it has performed This reading counter starts at zero when the instrument is turned on or when SYStem RNUMber RESet is sent over the bus When a reading is sent over the bus i e FETCh the RNUMber element indicates the reading number The instrument also keeps track of the number of readings it has stored in the buffer When buffer readings are sent over the bus TRACe DATA each reading number is referenced to the first reading which is 0 stored in the buffer If using Pre trigger to store readings the pre trigger readings are assigned negative numbers UNITs This element attaches the function unit to the reading the time unit sec to the times tamp and the channel unit internal or external to the channel number An internal channel refers to an internally installed switching card such as the Model 2001 SCAN channel while an external channel refers to the channel for an external switch system This element is not avail able for the binary formats TIMEstamp A timestamp is available to reference each reading to a point in time There are two basic types of timestamps real time timestamp and relative time timestamp The real time timestamp provides the time 24 hour clock format and date for each reading sent over the bus Th
144. 0002 TCOefficient Query TC OFFSet lt n gt Specify voltage offset at 0 C 0 05463 OFFSet Query voltage offset ACQuire Update reference temperature 3 58 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Table 3 10 Continued SENSe command summary IEEE 488 Reference Default Command Description parameter SCPI Ref TEMPerature DTCouple Differential path 3 18 22 TYPE lt type gt Select thermocouple type lt type gt JIKIT E R S B N USER TYPE Return thermocouple type J K T R R S B N USER USLope lt n gt Select thermocouple slope lt n gt slope in V C 0 is invalid USLope Return thermocouple slope V C min 0 099999 max 0 099999 default 20E 6 RTEMperature lt n gt Select reference thermocouple temperature lt n gt refer ence temperature in degrees RTEMperature Return thermocouple reference temperature in degrees min 273 C max 2000 C default 0 C SENSe2 3 18 23 TTL 1 Path to read digital input port DATA Query read the digital input port Notes 1 The saved alternate setup is lost when power is cycled or if RST or SYSTem PRESet is sent over the bus 2 The default parameter is power line cycle integration 16 67msec for 60Hz power line and 20msec for 50Hz or 400Hz power line 3 REPeat is the RST default parameter and MOVing is the S YSTem PRESet de
145. 01 7002 to start the scan The following explanation on operation is referenced to the operation model shown in Figure 2 29 Sour Cee y e AS Link 2002 Multimeter Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 7001or 7002 Press STEP to start scan Bypass W ait for Trigger Link Trigger Scan Channel Pull Trigger Line Low Scanned 10 Channels Figure 2 29 Operation mode for semi synchronous Trigger Link example A The BENCH RESET condition arms the Model 2002 and places multimeter operation at point A in the flowchart where it is waiting for a Trigger Link trigger Note that since both the arm layer and scan layer are programmed for Imme diate Source operation immediately drops down to the mea sure layer at point A Pressing STEP takes the Model 7001 7002 out of the idle state and places operation at point B in the flowchart Since both the arm layer and scan layers are programmed for Immediate Spacing operation drops down to the Channel Layer at point B Since Channel Trigger Source is set to Source the scan does not wait at point B for a trigger Instead it bypass es Wait for Trigger Link Trigger and closes the first chan Front Panel Operation 2002 Wait for Trigger Link Trigger Make Measurement Release Le BE j Trigger Line M easurements
146. 02 features include Full range of functions Among other functions the multimeter can measure DC voltage normal and peak spikes AC voltage RMS average and peak DC current normal and in circuit AC current RMS and average two and four wire resistance normal and offset compensated frequency voltage and current and temperature resistance temperature devices or thermocouples Two line display Readings and front panel messages are shown on an alphanumeric display having a 20 character top line and a 32 character bottom line Multifunction measuring and display From the front panel you can configure the instrument to sequentially measure and simultaneously display readings of multi ple functions Reading and setup storage Readings and setup data can be stored and recalled from the front panel or over the IEEE 488 bus For example the buffer can be pro grammed to store up to 850 readings at 4 5 digits or up to 250 time stamped readings at 6 5 digits The Model 2002 can be configured with memory options that extend the storage capacity up to 30 000 readings and ten setups High speed measurements The instrument is capable of acquiring for example 2000 readings second at 4 5 digits of resolution and 215 readings second at 6 5 digits Talk only mode From the front panel you can set the instrument to send readings to an IEEE 488 printer or with an optional adapter to a Centronics printer
147. 02176 TestEquipmentDepot com To check the present primary address or to change to a new one perform the following procedure 1 Display the MAIN MENU by pressing the MENU key 2 Use the cursor keys and P to place the cursor on GPIB and press ENTER The GPIB PRINTER SETUP menu will then be displayed 3 Use the cursor keys to place the cursor on ADDRESS ABLE and press ENTER 4 The current primary address of the instrument will be displayed For example if the instrument is set to prima ry address 16 the following message will be displayed ADDRESS 16 0 30 5 To retain the displayed address press EXIT three times to return the instrument to the measurement display state 6 To change the primary address use the and gt keys and the and Y keys to display the new address value 0 to 30 The and gt keys control cursor position and the and Y keys increment and decrement the selected digit 7 With the desired address value displayed press ENTER The address will be stored in non volatile memory That 1s 1t will not be lost when the instrument is turned off 8 Press EXIT two times to return to the measurement dis play state NOTE Each device on the bus must have a unique primary address Failure to observe this precaution will probably result in erratic bus operation 3 4 QuickBASIC 4 5 programming Programming examples are written in Microsoft QuickBA SIC 4 5 using the Keithley
148. 1 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 132 3 20 4 Parameters Query Description NTRansition lt NRf gt STATus M EASurement NTRansition lt NRf gt Program Measurement Transition Filter NTR STATus Q U EStionable NTRansition lt NRf gt Program Questionable Transition Filter NTR STATus O PERation NTRansition lt NRf gt Program Operation Transition Filter NTR STATus O PERation TRIGger NTRansition lt NRf gt Program Trigger Transition Filter NTR STATus O PERation ARM NTRansition lt NRf gt Program Arm Transition Filter NTR STATus O PERation ARM SEQ uence NTRansition lt NRf gt Program Sequence Transition Filter NTR lt NRf gt 0 Clear NTR register lt NRf gt 128 Set bit B7 of NTR register 1 Set bit BO of NTR register 256 Set bit B8 of NTR register 2 Set bit B1 of NTR register 512 Set bit B9 of NTR register 4 Set bit B2 of NTR register 1024 Set bit B10 of NTR register 8 Set bit B3 of NTR register 2048 Set bit B11 of NTR register 16 Set bit B4 of NTR register 16384 Set bit B14 of NTR register 32 Set bit B5 of NTR register 65535 Set all bits 64 Set bit B6 of NTR register NTRansition Query NTR register These commands are used to program the negative transition NTR registers A negative tran sition is defined as a 1 to O state change in the condition register Thus when an event is pro grammed for a negative transition the appropriate bit in
149. 1 7002 Switch System Notice that only one Trigger Link cable is needed OUTPUT Input HI Lx OO OOOO OO 4 hone I gt gt CD a ZS 812 2 CIO CI CI Vi 0 Input LO 2002 Multimeter 2002 Multimeter Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com For this example the Models 2002 and 7001 7002 are con figured as follows Model 2002 Idle state Bench reset INIT CONT ON Arm layer Arm source Immediate Arm count 1 Arm trigger control Acceptor Scan layer Scan source Immediate Scan count Infinite Scan trigger control Acceptor Measure layer Measure source TrigLink Trigger link mode Asynchronous Input line 2 Output line 1 Measure count 10 Measure trigger control Acceptor Indicates that the setting is the BENCH RESET and factory default con dition Model 7001 or 7002 Idle state Reset INIT CONT OFF Scan list 1 1 1 10 Arm layer Arm spacing Immediate Arm count 1 Arm trigger control Acceptor Scan layer Scan spacing Immediate Number of scans 1 Scan trigger control Acceptor Channel Layer Channel spacing TrigLink Trigger link mode Asynchronous Input line 1 Output line 2 Number of channels Use Scanlist length Channel trigger control Source Indicates that the setting is the RESET and factory default con
150. 16 syst azer type sync type Select SYNC autozero PRINT 1 enter 16 Get response message from 2002 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Parameters Query Description Program fragment 3 21 7 Parameters Query D escription IEEE 488 Reference STATe lt b gt SYSTem AZERo STATe lt b gt Control autozero lt b gt 1 or ON Enable autozero Oor OFF Disable autozero STATe Query state of autozero This command is used to disable or enable autozero Important Note Before you can enable or disable auto zero the Model 2002 must first be in the idle state The Model 2002 can be placed in the idle state by first disabling continuous initiation INITiate CONTinuous OFF and then sending the ABORt command After sending the STATe command readings can be re started by sending INITiate CONTinuous ON or INITiate Place 2002 in idle Disable autozero Get response from 2002 Read response Display response Take 2002 out of idle PRINT 1 output 16 init cont off abor PRINT 1 output 16 syst azer stat off stat PRINT 1 enter 16 INE INPUT 2 a PRINT a PRINT 1 output 16 init cont on NOTE When finished be sure to re enable autozero AMEThod lt name gt SYSTem AM EThod lt name gt Specify acquisition method lt name gt NORMal Normal acquisition method for buffer BUR
151. 176 TestEquipmentDepot com CAUTION Do not apply more than 100mA maxi mum current or exceed 30V maximum voltage on pin 4 of J 1031 the digital I O port Applying current or voltage ex ceeding these limits may damage the in strument An externally powered relay connected to the digital output port is shown in Figure 2 38 Other externally powered de vices can be similarly connected by replacing the relay with the device When using the Model 2002 s collector outputs Pin 7 Digital Output 2 Pin 8 Digital Output 4 Pin 9 Digital Output 3 Digital Output ees Flyback Diodes Figure 2 37 Digital I O port simplified schematic Front Panel Operation to turn on externally powered devices set the corresponding digital output line parameters as follows through the GEN ERAL DIGITAL I O menus OUTPUT STATE ON OUTPUT SENSE ACTIVE LOW In the low state OV the output transistor sinks current through the external device In the high state the output tran sistor is off transistor switch is open This interrupts current flow through the external device Most applications use ac tive low ON 0V OUTPUT SENSE Use the OUTPUT SENSE menu to check or change the sense of the digital out put line 109 Mk Pin 4 External Voltage Flyback connection 5V to 30V 5V Pin 6 Digital Output 1 Pin 7 Digital O utput 2 Pin 8 Digital Output 4 Pin 9 Digital O utput 8 Pin 5 Digital Ground Dig
152. 18 105 0 1 1 67 ms 2 ms 22 6 318 305 173 166 308 295 168 161 181 174 121 116 0 02 334 ys 400 us 20 5 325 325 179 179 308 308 173 173 182 182 124 124 0 01 167 us 167 ps 19 4 390 390 186 186 365 365 182 182 201 201 125 125 0 0111 167 us 167 ps 19 4 2000 2000 2000 2000 Linearity lt 0 1ppm of range typical lt 0 2ppm maximum Zero Stability Typical maximum variation in 1 hour Trer 0 5 C 7H digit resolution 10 reading digital filter synchronous autozero Range 1 PLC 10 PLC 200 mv 4 60 counts 40 counts av4 6 counts 4 counts 20V 4 counts 1 count 200 V 5 counts 2 counts 1000 V 2 counts 1 count Polarity Reversal Error This is the portion of the instrument error that is seen when HI and LO are reversed This is not an additional error it is included in the overall instrument accuracy specification Reversal Error lt 4 counts at 10V input at 7H digits 10 power line cycles synchronous autozero 10 reading repeat digital filter Input Bias Current lt 100pA at 25 C Settling Characteristics lt 50us to 10ppm of step size for the 200mV 20V ranges lt 1ms to 10ppm of step size for the 200V and 1000V ranges Reading settling times are affected by source impedance and cable dielectric absorption characteristics Autoranging Autoranges up at 105 of range down at 10 of range DCV PEAK SPIKES MEASUR
153. 2 Define 2 second sample interval H 21 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Index Symbols CLS clear status 3 29 ESE lt NRf gt event eed 3 30 ESE event enable query 3 ESR event status register que IDN identification que O PC operation complete 3 33 O PC operation complete query O PT option identification que RCL recall RST reset 3 SAV save 3 SRE lt NRf gt service request enable 3 36 SRE service request enable query 3 3 36 STB status ue 3 38 38 TRG p38 TST self test que 13 39 39 W Al wait to continue ABORt 3 ALTernatalT command AMEThod lt name gt APERture lt n gt 3 93 AVER age commands AZERo commands CALCulate 1 3 67 CALCulate2 3 69 CALCulate3 3 71 CLEar CLO Se lt list gt 3 86 CONDition COUNt lt n gt COUPling AC DC DATA 3 151 DATA commands DATE lt yr gt lt mo gt lt day gt 3 145 DELay lt n gt DIGits lt n gt DISPlay subsystem 3 76 DTCouple commands EG Roup lt name gt ENABle lt NRf gt 3 122 ERRor E FEED lt name gt FO RM at subsystem FREE 3 147 FRSW itch 3 137 FUNCtion lt name gt IM M ediate 3 152 IN ITiate command AN Put subsystem 3 84 KEY lt NRf gt 3 143 LFRequency
154. 2 are con figured as follows Model 2002 Idle State Bench reset INIT CONT ON Arm layer Arm source Immediate Arm count 1 Arm trigger control Acceptor Scan layer Scan source Immediate Scan count Infinite Scan trigger control Acceptor Measure layer Measure source External Measure count Infinite Measure trigger control Acceptor Indicates that the setting is the BENCH RESET and factory default con dition Model 7001 or 7002 Idle State Reset INIT CONT OFF Scan List 1 1 1 10 Arm layer Arm spacing Immediate Arm count 1 Arm trigger control Acceptor Scan layer Scan spacing Immediate Number of scans 1 Scan trigger control Acceptor 2 52 External Trigger Meter Complete Output 000 External Trigger Input 2002 Multimeter Channel Layer Channel spacing External Number of channels Use Scanlist length Channel trigger control Source Indicates that the setting is the RESET and factory default condition Notice that the Model 2002 is reset to BENCH defaults With this selection the multimeter stays armed Since the arm source and scan source are set to Immediate the Model 2002 waits in the measure layer for a trigger With the Channel Trigger Control of the switch system set for Source scan operation initially bypasses the need for an external trigger to close the first channel Since arm spac
155. 2 summarizes commands supported by the HP3458A emulation mode Each command is described in detail in subsequent paragraphs HP3458A Emulation Mode Table H 2 Supported HP3458A commands Command Description APER Aperture ARANGE _ Range AZERO Autozero CALSTR Request calibration date CSB Clear status register DELAY Trigger sample time interval DISP Display mode and message EMASK Error conditions ERR Request error register ERRSTR Request error number and string FREQ Frequency function FSOURCE Frequency period signal source FUNC Measurement function and range ID Request unit identification LINE Request power line frequency MCOUNT Request number of readings stored in memory MEM Memory storage MFORMAT Reading format MSIZE Request memory size NDIG Number of display digits NPLC A D integration time in line cycles NRDGS Readings per trigger event OCOMP Offset compensated ohms OFORMAT Reading format OPT Request installed options PER Period measurement function PRESET Instrument configurations RANGE Measurement range RESET Power on state REV Request firmware revision levels RMEM Request number of readings in memory RQS Status register bits RSTATE Recall instrument configuration SETACV ACV mode SRQ Enable SRQ SSTATE Save instrument configuration STB Request status register value SWEEP Interval samples per trigger Tor TRIG Trigger event TARM Trigger arm event TEMP Request internal t
156. 200 29 5 2000 7 7 2k0 6 4 20 kQ 7 8 200 kO 7 3 2MO 14 9 20MO 14 9 200 MQ 14 9 1GQ 14 9 KEITHLEY FACTORY CALIBRATION UNCERTAINTY Factory calibration uncertainty represents traceability to NIST This uncertainty is added to relative accuracy specifications to obtain absolute accuracies The 200 2MQ range uncertainties are equal to the uncertainty of the respective calibration sources The 20MQ 200M0 and 1GQ range uncertainties are equal to the uncertainty of the 2MQ calibration source ENHANCED ACCURACY 10PLC Offset comp on DFILT 10 Relative Accuracy TemperatureCoefficient ppm of reading ppm of range ppm of reading ppm of range C Range Transfer 24 Hours 90 Days 1 Year 2 Years Outside Tcal 5 C 200 2 5 3 5 4 5 15 6 17 6 20 6 2 5 0 7 2000 25 2 5 3 15 4 17 4 20 4 2 5 0 5 2k0 1 3 0 2 2 5 0 3 7 04 9 04 11 0 4 0 8 0 05 20 kQ 1 3 0 2 2 5 0 3 7 04 9 0 4 11 0 4 0 8 0 05 200 kO 2 5 0 4 5 5 0 5 29 0 8 35 0 9 40 1 3 5 0 18 2MO 5 0 2 12 0 3 53 0 5 65 0 5 75 0 5 7 0 1 20MO 15 0 1 50 0 2 175 0 6 250 0 6 300 0 6 20 0 1 200 MO 50 0 5 150 1 500 3 550 3 600 3 80 0 5 160 250 2 5 750 5 2000 15 2050 15 2100 15 400 2 5 2 Current source has an absolute accuracy of 5 Refers to source lead resistance Sense lead resistance is limited only by noise considerations For best results it is suggested that it be
157. 2002 to setup stored at a memory location up to 1 5 or 10 POWERON Power on Menu BENCH Power on to bench default setup conditions GPIB Power on to GPIB default setup conditions USER SETUP NUMBER Power on to setup stored at a memory location up to 1 5 or 10 RESET Reset Menu BENCH Return 2002 to bench default setup GPIB Return 2002 to GPIB default setup GPIB GPIB Printer Setup menu ADDRESSABLE Check change IEEE 488 bus address 0 30 TALK ONLY GPIB Printer Talk only mode menu FEED GPIB Output Feed menu AFTER CALC Specify reading after math operation BEFORE CALC Specify reading before math operation NONE Specify no readings INTERFACE Select printer interface TEEE 488 Specify IEEE 488 printer CENTRONICS Specify Centronics parallel printer INTERVAL Specify printing interval every reading to 1 out of 9999 FORMFEED Formfeeds menu CONTROL Enable disable page breaks SET PAGE SETUP Set number line between form feeds 1 255 ELEMENTS Select GPIB data elements reading units reading number channel number timestamp status STATUS Display IEEE 488 bus status byte CALIBRATION Calibration menu COMPREHENSIVE Perform DC and AC calibration POINT CAL Perform point calibrations CALIBRATION DATES Check change calibration date TEST Self test menu BUILT IN TEST Test analog and digital boards AUTOMATIC Run all tests automatically MANUAL Select tests to run DIAGNOSTICS Factory diagnostic tests FRONT PAN
158. 230 to output the next programmed voltage level After the voltage level is set the Model 230 outputs a trigger pulse point G The trigger pulse applied to the Model 7001 7002 from the Model 230 places operation at point B The Bypass is again in effect because this is the beginning of a new scan This al lows operation to drop down to point C where the first chan nel is again closed and eventually measured As previously explained all ten channels are scanned and measured After the last channel of the second scan is closed and mea sured the Model 7001 7002 returns to the idle state 2 59 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation 7001or 7002 Press STEP Bypass Bypass Wait for Trigger Link Ko ooo 1 Trigger eae Scan Channel i Output Trigger Trigger 2002 Trigger O Trigger to make 700lor Measurement 2002 7002 and Output Trigger 2002 Scanned 10 Channels i Trigger 230 O Trigger Sida Trigger Tigger SEET EE qe roger 7001 0r Eine 3 7002 and Output Trigger 230 No Pero mey Scans Yes Figure 2 25 Operation model for asynchronous Trigger Link example 2 2 60 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Semi sy
159. 3 Operation complete messages Description or reference See paragraph 3 10 4 Not applicable Not applicable See paragraphs 3 10 9 3 10 8 3 10 10 and Tables 3 4 through 3 16 See paragraph 3 10 14 See paragraph 3 7 All are sequential except INIT and INIT CONT ON which are overlapped OPC see paragraph 3 10 5 OPC see paragraph 3 10 6 WAT see paragraph 3 10 15 E 2 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Conformance Information Table E 2 Coupled commands Command Also changes To If SYST AMET BURS RANG AUTO OFF INPLC 0 01 APER 0 01 line frequency DIG AUTO OFF DIG 4 AVER AUTO OFF AVER TCON MOV INIT CONT OFF SYST AZER STAT OFF ARM LAY 1 COUN 1 ARM LAY2 COUN 1 TRIG COUN TRACe POIN TRACe EGR COMP TRACe FEED CALCI TRACe FEED is NONE TRACe FEED CONT NEXT SYST AMET ASTR SYST AZER STAT OFF and SYST LSYN STAT OFF SYST AMET SSTR CALC STAT OFF RANG AUTO OFF NPLC 0 01 INPLC AUTO OFF DIG 4 DIG AUTO OFF AVER STAT OFF AVER AUTO OFF REF STAT OFF TRIG COUN TRAC POIN AUTO OFF TRAC POIN AUTO is ON and TRIG COUN is an illegal buffer size TRAC POIN TRIG COUN TRAC POIN AUTO is ON TRAC FEED PRET AMO READ TRIG COUN TRAC POIN AUTO is TRAC FEED PRET A ON MO PERC 100 TRAC FEED CONT TRI
160. 35 1 y DATA Query upper limit y SOURce lt NRf gt Set digital output 0 to 15 0 y SOURce Query source digital output value y LOWer Path to configure lower limit y DATA lt n gt Specify lower limit 9 999999e35 to 9 999999e35 1 y DATA Query lower limit y SOURce lt NRf gt Specify digital output 0 to 15 0 y SOURce Query source digital output value y STATe lt b gt Enable or disable limit test OFF y STATe Query state of limit test y FAIL Query test result 1 pass 0 fail y CLEAR Path to clear failed test y IMMediate Clear failed test indication y AUTO lt b gt Enable or disable auto clear ON y AUTO Query auto clear y PASS Path to define pass digital output pattern SOURce lt NRf gt Specify digital output 0 to 15 0 CLIMits Command path for composite limits y FAIL Query composite result of LIMIT 1 and LIMIT 2 tests y 1 pass 0 fail BSTRobe Path to control limit binning strobe STATe lt b gt Enable or disable strobe OFF STATe Query state of binning strobe IMMediate Re perform limit tests y 3 47 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Table 3 5 DISPlay command summary Default Command Description parameter SC PI DISPlay WINDow 1 Path to locate message to top display y TEXT Path to control user text messages Note 1 y
161. 5 2 5 1 2 5 2 2 5 3 2 5 4 2 6 2 6 1 2 6 2 General Information reel ee E Features gesaten een eege ES EEE AE AEE E OTE dee Eden dE aio ci AAA ero r aeree EEE EREE EEK EEES ERER SEE EE ERO eE ERE ER EEE rE EEE Ee Manual saddens sorserien er a EE EERE ENRE Safety symbolsand terms c tercscessessincesesessansveasveanentnnsnsasbacnnonsisbiaecesabevesovesvsessisuvessdeaurs bnasssi beans EEV paises sad PEREA SPCCWICALLONS murio leida O Options aNd ACCESSOLLES casks cased ss coh costhoes voce gests iaa Front Panel O peration TiO UCI idiota lil Power UP aii nasal Line power connections Line fuse replacement said denia die Power p TE VE High energy circuit safety precautions oooococccoccconnnoonnconnnonnnnnoncconenonnannncconnnnonncnnn con nncon nc cnc conca nan ccnnc non nccna Deco Power on default conditions oo ee eteeeeeceecnceseesecsecseeeeaecsecaceecsaecesseceecnaeseeaecnecaeesssaesaecaseseeascaseecetenarapenes Ku ue TEEN BE TEEE 488 primary e ET oiy IK EE D et EE E D Information Messages eiii tddi died Status and ET G Navigating menus tee EE E O R E DC and AC voltage DC amid AC Current inline Tw6 and four wire resistance aiii dou ibas ERGOE RE EG EE a an Display resolution EE ae Maximum reading S east iaa redil O EUREN e Ree E E Relative EE I ee E EG Enabling EE a Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 i TestEquipmentDepot com 2 6 3
162. 5 Safety symbols and terms The following symbols and terms may be found on an instru ment or used in this manual The AN symbol on an instrument indicates that the user should refer to the operating instructions located in the manual The A symbol on an instrument shows that high voltage may be present on the terminal s Use standard safety pre cautions to avoid personal contact with these voltages The WARNING heading used in this manual explains dan gers that might result in personal injury or death Always read the associated information very carefully before per forming the indicated procedure The CAUTION heading used in this manual explains haz ards that could damage the instrument Such damage may invalidate the warranty 1 6 Specifications Full Model 2002 specifications are included in Appendix A 1 7 Inspection The Model 2002 was carefully inspected both electrically and mechanically before shipment After unpacking all items from the shipping carton check for any obvious signs of physical damage that may have occurred during transit Note There may be a protective film over the display lens 1 2 which can be removed Report any damage to the shipping agent immediately Save the original packing carton for pos sible future reshipment The following items are included with every Model 2002 order e Model 2002 Multimeter with MEM1 or MEM2 mem ory option if ordered with line cord Model 8605 High Perf
163. 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference The individual bits of the Service Request Enable Register can be set or cleared by using the following common com mand see paragraph 3 10 11 for details SRE lt NRf gt The Service Request Enable Register can be read using the following common query command see paragraph 3 10 11 for details SRE The Service Request Enable Register is not cleared when it is read using the SRE query command The Service Request Enable Register clears when power is cycled or a parameter n value of zero is sent with the SRE command SRE 0 Serial poll and SRQ Any enabled event summary bit that goes from 0 to 1 will set RQS and generate a service request SRQ The user s test program can periodically read the Status Byte Register to check to see if a service request SRQ has occurred and what caused it In the event of an SRQ the program can for example branch to an appropriate subroutine that will ser vice the request Typically service requests SRQs are man aged by the serial poll sequence of the Model 2002 If an SRQ does not occur bit B6 RQS of the Status Byte Regis ter will remain cleared and the program will simply proceed normally after the serial poll is performed If an SRQ does occur bit B6 of the Status Byte Register will set and the pro gram can branch to a service subroutine when the SRQ is de tected by the s
164. 57A and 7402 use Channel 1 as the reference junction and must be configured on the Model 2002 for volt age references and offset Temperature configuration The following information explains the various configura tion options for temperature measurements The configura tion menu is summarized in Table 2 23 This menu is accessed by pressing CONFIG and then TEMP Paragraph 2 3 5 summarizes the rules for navigating through the menus Note that a function does not have to be selected in order to be configured When the function is selected 1t will assume the programmed status Platinum RTD Sense Q4 wire LO A Connections to Banana Jacks Model 2002 E 000 00 C 4W RTD type PT385 2002 MULTIMETER Sek E Eo Er EL S DS B Connections to Terminal Block Figure 2 9 3 wire RTD temperature measurements 2 34 WARNING To avoid a shock hazard and possible instrument damage do not use the Model 8680 RTD Probe Adapter to measure voltages exceeding 30V RMS 42 4V peak UU o 000 cel 9999 Short Sense Q4 wire LO Input HI Input LO Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Model 2002 ES 000 00 C RTD type PT385 A Connections to Banana Jacks Model 2002 8680 ES 000 00 C FTD PROBE ADAPTER RTD type PT385 2002 MULTIMETER o 8 O wO E Em E
165. 6 usl Set TC slope PRINT 1 enter 16 Get response from 2002 RTEMperature lt n gt SEN Se 1 TEM Perature DTCouple RTEM perature lt n gt Specify reference TC temperature lt n gt 273 to 2000 Specify reference TC temperature in C DEFault Reference TC 0 C MINimum Reference TC temperature 273 C MAXimum Reference TC temperature 2000 C RTEMperature Query reference TC temperature RTEMperature DEFault Query RST default temperature RTEMperature MINimum Query minimum temperature RTEMperature MAXimum Query maximum temperature When one of the seven standard thermocouples J K T E R S or B is selected see TYPE command this command is used to enter the reference temperature at which the reference ther mocouple will be operated during measurement Refer to the Model 1801 Nanovolt Preamp Instruction manual for details on making differential thermocouple temperature measurements PRINT 1 output 16 temp dtc rtem 100 rtem Specify reference tempo PRINT 1 enter 16 Get response from 2002 SEN Se2 subsystem This subsystem is used to read the digital I O port TTL 1 D ATA SEN Se2 TTL 1 D ATA Read input port This command is used to read the single line of the digital input port A value of 1 indicates that the input port is high ON and a value of 0 indicates that the port is low OFF PRINT 1 output 16 sens2 ttl data Read input po
166. 6 0 8 0 1 7 1 13 130 200 3 20 V 6 0 15 0 6 0 15 0 03 7 0 15 0 05 8 0 15 0 08 15 0 5 0 7 130 200 3 200 V 14 2 0 14 2 0 1 14 2 0 15 14 2 0 25 15 2 1 130 200 3 1000 V7 14 04 0 14 0 4 0 05 14 0 4 0 05 14 0 4 0 1 15 0 5 0 5 90 200 2 PLC Power Line Cycles DFILT Digital Filter NOISE REJECTION DB AC and DC CMRR AC NMRR Speed Number of Power Line Sync On Line Sync On Internal Trigger Line Cycles Line Sync On Internal Trigger Readings DFILT On DFILT Off DFILT Off PLC gt 1 140 120 90 80 60 PLC lt 1 90 60 60 50 0 Effective noise is reduced by a factor of 10 for every 20dB of noise rejection 140dB reduces effective noise by 10 000 000 1 CMRR is rejection of undesirable AC or DC signal between LO and earth NMRR is rejection of undesirable power line related AC signal between HI and LO KEITHLEY FACTORY CALIBRATION UNCERTAINTY Range ppm of reading 200 mV 3 2 2 V 3 2 20 V 26 200 V 2 6 1000 V 2 6 Factory calibration uncertainty represents traceability to NIST This uncertainty is added to relative accuracy specifications to obtain absolute accuracies The 200mV and 2V range uncertainties are equal to the uncertainty of the 2V calibration source The 20V 200V and 1000V range uncertainties are equal to the uncertainty of the 20V calibration source 10 Specifications are for 1 power line cycle normal autozero digital filter off autoran
167. 7 NPLC 10 NRDGS 1 AUTO OCOMP OFF OFORMAT ASCII TARM AUT TIMER 1 TRIG AUTO All other commands and settings are unaffected To request the main and front panel revision levels REV Main firmware revision Front panel firmware revision The REV query allows you to request both the main processor firmware revision level and the front panel display controller firmware revision level The instrument returns two numbers separated by a slash 1 the main processor firmware revision level and 2 the front panel display controller firm ware revision level The response form used by the Model 2002 is different from that of the HP3458A To request readings stored in memory RMEM Reading 1 Reading 2 Reading n The RMEM query returns all readings currently stored in memory Note that the format of readings returned differs from that of the HP3458A The Model 2002 returns all readings in one text block separated by commas with a string terminator only at the end of the block The HP3458 includes a terminator between each reading Also note that this command has been changed to a query only format To enable disable status register bits that can cause an SRQ ROS lt mask gt Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Parameter Default Query Description Example RSTATE Purpose Format Parameter Default Description Exampl
168. 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation 2 5 Range The selected measurement range affects both the ultimate resolution and accuracy of the measurements as well as the maximum signal that can be measured The range setting fixed or auto for each measurement function is saved when changing functions 2 5 1 Display resolution The display resolution of a Model 2002 reading depends on the selected range and the resolution setting The default and maximum display resolutions for every range on each func tion are included in the specifications of Appendix A You can set the display resolution as described in paragraph 2 4 2 5 2 Maximum readings The full scale readings for every range on each function are included in the specifications of Appendix A Input values more than the maximum reading listed cause the Overflow message to be displayed 2 5 3 Manual ranging To select a manual range simply press the RANGE A or Y key The instrument changes one range per key press The selected range is displayed on the bottom line of the display If the instrument displays the Overflow message on a par ticular range select a higher range until an on range reading is displayed Use the lowest range possible without causing an overflow to ensure best accuracy and resolution Note that the frequency and temperature functions have just one range For the frequency
169. 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 3 IEEE 488 Reference Table 3 1 General bus commands and associated statements ooccnocnnncnnnnononncconcnnccnnonnnnn non no cnn nnn non cnn ran rra crac Table 3 2 TEEE 488 2 common commands and queries o ococccncnnoncnncnononnconnonncnononnnnnnon nn nono nnnn canon nn anar rn ran rn enanos Table 3 3 Signal oriented measurement command SUMMALY coccoccnncncnnnonnnonnnononononnnnnnon nc non cono nn non narrar nnn nn craneo Table 3 4 CAL Culate command Summary EE Table 3 5 DISPlay Command SUMMArY sscscissecssasssisesssscescsnsnncvaiasstnesceutsssnesoniesnacesonsisbineavneuaaasssbsecastondecstdasnapsopndeee Table 3 6 FORMat command Summary besiitos ricerca tar Table 3 7 INPUt command AAA tates ih esbiaecbedeesdnessiaess Table 3 8 OUT put Command SUMA e la Table 3 9 NOS OS Table 3 10 SENSe COMMANG E EE Table 3 11 SOURCE command S MMAFY sissien tr terneros tune carer n EE Ee E EEEE EEEE EEEE OR EEE SEE EERE EES t Table 3 12 STATUS command SUNDAY ini e E OE EAE E TAER Table 3 13 SYS Lem command SUMUMALY AA ONO ERE Erea EEEa O Table 3 14 TRACE command summary aint ici ir cr ai et Table 3 15 Trigger command SUMMATY AAA O Table 3 16 UNIT command AA aE res EEEE REE T EE TEE E SEESE Table 3 17 Minimum delay times for stream mode coooooccccnconcnononnnonnnononononn nono cnn nnnno no nono cnn neon ono non sensi nn nero non nen nsari s saes B Interface Function Codes Table B 1 Mod
170. 9 times CONTROL Use this menu item to enable or disable the source bypass The source bypass is used to bypass the arm event on the first pass through the arm layer SOURCE With this selection the source bypass is enabled The arm event will be bypassed on the first pass through the arm layer This allows operation to proceed into the scan layer without having to wait for the programmed event ACCEPTOR With this selection the source bypass is disabled 2 50 2 7 5 Halting triggers The Halt option of the CONFIGURE TRIGGER menu is used to disarm the instrument and place it in the idle state You can press the TRIG key to resume front panel triggers 2 7 6 External triggering The Model 2002 has BNC connections on the rear panel for external triggering see Figure 2 13 The EXTERNAL TRIGGER INPUT jack allows the Model 2002 to be trig gered by other instruments The METER COMPLETE OUTPUT jack allows the Model 2002 to trigger other instru ments EXTERN AL METER TRIGGER COMPLETE INPUT OUTPUT Figure 2 13 External triggering connectors BNC External trigger The EXTERNAL TRIGGER INPUT jack requires a falling edge TTL compatible pulse with the specifications shown in Figure 2 14 In general external triggers can be used as events to control measure operations For the Model 2002 to respond to exter nal triggers the appropriate layers of trigger model must be configured for it Paragraphs 2 7 2 through 2 7 4 e
171. A2 A3 A4 As Ae By B2 B3 B4 Bs Ay Ay A gt A3 Ay As Ae By B3 B3 Bs rs Ay Ay Ay Az Az Ae Ae Ag By B2 Bs SES Ay Ay Ay Az A2 Ae Ae Ae Ae By Bs Ay Ay Ay Az Ai Ae Ae Ae Ae Ae Bs Mode repeating Reading Reading 1 2 Type advanced Conversions Ai A2 A3 A4 As Ae By Ba B3 Ba Bs Ay Ay A gt A3 Ag Ae By By B gt B3 Ba Readings 5 Ay Ay Ay Az Az As By By By B2 B3 S Az Ay Ay Al A2 Ae By By By By B2 Mode repeating A A Ay A A As B B B B n Noise level 1 of range Reading Reading 1 2 Figure 2 30 Averaging and advanced filter types Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Conversion Conversion 11 9 10 9 8 7 Conversion Conversion A Type Average Readings 10 Mode Conversion 10 Conversion 9 7 Reading 1 Conversion 1 Conversion B Type Average Readings 10 Mode Figure 2 31 Moving and repeating filter modes 2 9 3 Response time The various filter parameters have the following effects on the time needed to display store or output a filtered reading e Filter type The time to the first reading is the same for both types but thereafter averaging mode yields a faster reading than repeating mode Also advanced has a faster response to changes in the input signal than averaging e Number of reading conversions Speed and accuracy are tradeoffs Front Panel Operation Conversion 12 Reading Reading 2
172. AD or MEASure command is sent Program fragment PRINT 1 output 16 syst pres Select system preset defaults PRINT 1 output 16 fetch Request the latest reading PRINT 1 enter 16 Get response message from 2002 CON Figure lt function gt where lt function gt VOLTage DC DCV function CURRent DC DCI function VOLTage AC ACV function CURRent AC ACI function RESistance Q2 function FRESistance 04 function FREQuency FREO function TEMPerature TEMP function Q uery CONFigure Query the selected function Short form format conf Response message CURR DC VOLT AC CURR AC VOLT DC RES FRES FREQ or TEMP 3 41 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Description Program fragment Description Program fragment 3 42 This command is used to configure the instrument for subsequent measurements on the specified function Basically this command places the instrument in a one shot measurement mode The READ command can then be used to trigger a measurement and acquire a reading see READ When this command is sent the Model 2002 will be configured as follows e The function specified by this command is selected e All controls related to the selected function are defaulted to the RST values e Continuous initiation is disabled INTTiate CONTinuous OFF e The control sources
173. APERture lt n gt SEN Se 1 CU RRent AC APERture lt n gt Set aperture for ACI SEN Se 1 CURRent DC APERture lt n gt Set aperture for DCI SEN Se 1 VO LTage AC APERture lt n gt Set aperture for ACV SEN Se 1 VO LTage DC APERture lt n gt Set aperture for DCV SEN Se 1 RESistance APERture lt n gt Set aperture for Q2 SEN Se 1 FRESistance APERture lt n gt Set aperture for Q4 SEN Se 1 TEM Perature APERture lt n gt Set aperture for TEMP lt n gt 166 6666666667e 6 to 1 Integration period in seconds DEFault Power line cycle integration 16 67msec for 60Hz power line 20msec for 50Hz and 400Hz power line MINimum 166 6666666667e 6sec MAXimum 1sec APERture Query programmed aperture value APERture DEFault Query RST default aperture value APERture MINimum Query minimum aperture value APERture MAXimum Query maximum aperture value The integration period measurement speed for the Model 2002 can be set using either of two commands NPLCycle paragraph 3 18 6 or APERture The NPLC method specifies the inte gration period as the number of power line cycles per integration while aperture specifies the time in seconds per integration Refer to paragraph 2 4 for details on integration SPEED The relationship between NPLC and aperture is expressed as follows Aperture NEES where Aperture is the integration rate in seconds per integration NPLC is the number of power line cycles per integ
174. AUTO 2 FUNC OHMF 200 0 03 FUNC ACI 750 10 Function command short forms The HP3458A emulation mode supports the short forms of the following FUNC commands DCV DCI ACV ACI ACDCV ACDCI OHM OHMF The short forms of these commands are essentially the same as sending the FUNC command but with FUNC omitted Examples Standard Form Short Form FUNC ACI 0 01 10 ACI 0 01 10 FUNC OHM 2000 OHM 2000 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com U nsupported queries If an unsupported query is detected a 1 will be returned as the query response in most cases These are queries support ed by the HP3458A but not supported by the Model 2002 FIXED2 and EXTOUT will not return 1 however Sending the query form of commands not supported by the HP3458A will result in an error Query format The query format set by the QFORMAT command will always be set to NUM Error checking The following commands pertain to HP3458A emulation mode error checking EERR ONIOFF Enable disable checking emulation mode error EERR Query current state of emulation mode error checking If EERR is ON an error message will appear on the front panel as well as in the error queue and bit 14 in the error register will be set when an error occurs To generate an SRQ when an emulation mode error is detected set EMASK to 16384 and RQS to 32 Supported H P3458A commands Table H
175. B test status Press any key to end program Read input port Check integrity of read operation PRINT Test z Status status Databyte rdata test status IF status lt gt 0 THEN SLEEP 3 STOP END IF RETURN G 8 Display status and state of input port END Print error message and stop program if the read operation is corrupt 1 PRINT Failure on IEEE Bus Status status Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com High Speed Data Transfer O ver Bus Microsoft QuickBASIC 4 5 Keithley KPC 488 2 Interface 1992 Keithley Instruments Inc Description This program demonstrates how fast the Model 2002 can make measurements and send them to the computer Speed 1s optimized by configuring the Model 2002 as follows Function Range 20 VDC Auto Zero Off Autorange Off Resolution 4 1 2 digits Acquisition Method ASTREAM Display Disabled This program will take 1000 measurements on the 20VDC range and send them to the computer The total elapsed time in seconds to take the readings and send them to the com puter is displayed on the computer CRT The rate readings per second is also calculated and displayed Program astream bas SINCLUDE ieeeqb bi DIM rdg 1000
176. C AVER STAT varies per function AVER AUTO is ON ANER COUN varies per function AVER AUTO is ON LAVER TCON varies per function ANER AUTO is ON ANER AIDN STAT varies per function AVER AUTO is ON AVER ADV NTOL n varies per functio AVER AUTO is ON ROUT SCAN LSEL AVER STAT varies per function varies per function AVER AUTO is ON ANER COUN varies per function AVER AUTO is ON AVER TCON varies per function AVER AUTO is ON AVER ADV STAT varies per function AVER AUTO is ON AVER ADV NTOL varies per function AVER AUTO is ON FUNC ROUT SCAN LSEL is ROUT SCAN RAT FU RAT FUNC NC ROUT SCAN LSEL is ROUT SCAN DELT DELT ROUT CLOS FUN ROUT SCAN LSEL is ROUT SCAN RAT RAT ROUT CLOS MCH ROUT SCAN LSEL is ROUT SCAN DELT DELT MCH Valid function command words i e VOLT DC VOLT AC etc E 6 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com SCPI Conformance Information Introduction The Model 2002 complies with SCPI version 1991 0 Tables 3 4 through 3 16 list the SCPI confirmed commands and the non SCPI commands implemented by the Model 2002 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 F 1 TestEquipmentDepot com Example Programs The following programs demonstrate various aspects of The programs are written in Microsoft QuickBASIC 4 5 or Model 2002 operation Mo
177. C voltage Only the differences for 2 wire and 4 wire resistance are noted here SET BY RSLN This parameter optimizes the integration time for the present resolution setting The defaults for set by resolution integration times of Q2 and Q4 are listed in Table 2 18 Table 2 18 22 and Q4 integration time set by resolution Resolution Integration time 3 5d 4 5d 0 01 PLC 5 5d 0 02 PLC 6 5d 0 10 PLC 75d 1 00 PLC 8 5d 10 00 PLC Note If the integration time is SET BY RSLN and the resolution AUTO the integration time will be 1 0 PLC and the resolution 7 5 digits FILTER FILTER lets you set the digital filter response The filter menu is available from the function configuration menus i e CONFIGURE OHMS 2W or by pressing CONFIGURE FILTER with the desired function already selected All of the parameters menu items for FILTER are explained in para graph 2 9 Since the AUTO parameter has specific effects on Q2 and Q4 it is covered here AUTO This parameter for a digital filter optimizes its use for the present measurement function The defaults for auto matic filtering of Q2 and Q4 are listed in Table 2 19 RESOLUTION The RESOLUTION parameter sets the display resolution It is discussed in paragraph 2 4 1 DC and AC voltage Only the differences for Q2 and Q4 are noted here Note that all scientific notation displays are 7 1 2 digits Labels on the far right such as channel number may be omitted to pr
178. CV the two high speed channels ch 5 and 10 of the Model 2001 SCAN Scanner Card Each channel is measured five times for a total of 10 measure ments The DCV reading and the elapsed time for each mea surement are displayed on the computer CRT Required equipment e Model 2002 Multimeter Program scan2001 bas SINCLUDE ieeegb bi CLS CALL initialize 21 0 DIM k2002data AS STRING 20 CALL send 16 RST CALL send 16 trig sour bus coun 10 gpib status CALL send 16 CALL send 16 CALL send 16 CALL send 16 CALL send 16 init cont on gpib statsu sens func Volt DC gpib status sens volt dc nplce 01 gpib status form elem read chan gpib status e Model 2001 SCAN Scanner Card installed in the Model 2002 e Microsoft QuickBASIC 4 5 e Any one of the following IEEE 488 interfaces Keithley Model KPC 488 2 Keithley Model KPC 488 2AT Capital Equipment Corporation PC lt gt 488 The program assumes that the Model 2002 is set to address 16 Loading user library The user library for QuickBASIC 4 5 is provided with the TEEE 488 interface ieeeqb qlb Assuming QuickBASIC and the user library are in the same DOS directory enter the following command line from the DOS prompt QB L ieeegb qlb The above command line will load QuickBASIC and the user library init cont off abor gpib status Disable continuous initiation a
179. Command Description parameter SCPI Ref CURRent DC Path to configure DC current y APERture lt n gt Set integration rate in seconds 166 67e 6 to 1 Note 2 y 3 18 5 AUTO lt b gt Enable or disable auto aperture OFF AUTO ONCE Enable and then disable auto aperture AUTO Query auto aperture APERture Query aperture integration rate y NPLCycles lt n gt Set integration rate line cycles 0 01 to 50 1 y 3 18 6 AUTO lt b gt Enable or disable auto NPLC OFF AUTO ONCE Enable and then disable auto NPLC AUTO Query auto line cycle integration NPLCycles Query line cycle integration rate y RANGe Path to configure measurement range y 3 18 8 UPPer lt n gt Select range 0 to 2 1 2 1 y UPPer Query range y AUTO lt b gt Enable or disable auto range ON y AUTO ONCE Set range based on present input signal y ULIMit lt n gt Set upper limit for auto range 0 to 2 1 2 1 ULIMit Query upper limit LLIMit lt n gt Set lower limit for auto range 0 to 2 1 0 0002 LLIMit Query lower limit AUTO Query auto range y REFerence lt n gt Specify reference 2 1 to 2 1 0 y 3 18 9 STATe lt b gt Enable or disable reference OFF y STATe Query state of reference y ACQuire Use input signal as reference REFerence Query reference value y DIGits lt n gt Specify measurement resolution 4 to 9 7 3 18 10 AUTO lt b gt Enable or disable auto resolution ON AUTO ONCE Enable and then disable aut
180. DCV men Structure srein ena eeen a ne E a S N Eae chose dEr CONFIGURE ACV menu Structure eee eeceeeneeceeceeeeceneceaeceneeceaeessaeeeneeceeeeeneceneesaeeeaeeeeeeess DCV and ACV integration times set by resOlUtion coocnccnonnocnnoncnnncnncnnnonnnnnncnn cnn ran cro conocen ncnnno DEV and ACV auto E DCV and ACV auto resolution ecvvevni dondon nodsoiqanon snoras eire Eo na See reirei eanes iaasa CONFIGURE DCI menu Structure nicieni ei ear ia ieee tnea Er EE NAER E r CONFIGURE ACI menu structure csarnoka onenarena es aa aeaa aE EE E Ea a DCI and ACI integration time set by resolution sssesseseesesssrerrseersrreerreerrnserrnsrnrrsrrererreeres DCEFand ACT ato filter aii ios DCLand ACT auto tesolution ccs sescceesccaniiadsecansonsdieceetvesicveceestabeocesbacaseceussenssdendovebscndeseanesendives CONFIGURE OHMS 2W menu Structure 0 eee eeeeeeceseceseeceneeceeeesseeeneeceeeeneceeneesaeeeseeceeees CONFIGURE OHMS 4W menu Structure 0 eee eeeeeeceeeceseeceneeceeeesseeeneeceeeeneceeneesaeeeaeeseeeees Q2 and Q4 integration time set by resOlUtion oo eee eeeeeceecneeeeeeecneceeeseesecaecaeesesaeeaseeeeaeees OD and OA auto Miller asesores eiers EE EE EE e EE AE EEE A EEEE Er eE LU and O4 auto resoluton Trigger level range and Increments s sc vcessccssscsnstecsvecacvendvosieooneovasesvancdenavsstavecepssaeeeceessceonoeezense CONFIGURE FREQUENCY menu Structure cocooooccnonnncnonnnnnononnnonnnnnnnnnnnonnn crono nncnnnnnnrconnnnnnnnnno CO
181. Delta computation During configuration one channel is defined as the reference channel and a second channel is defined as the measurement channel Ratio and delta are computed from signals measured on these channels as follows Measure Ratio Reference Delta Measure Reference 2 11 6 Using SCAN to configure scan parameters Once an internal or external scan list is enabled you use the SCAN key to configure internal or external scanning The menu structure of Figure 2 32 shows the procedure The procedure changes scan layer parameters in the trigger model When scanning is disabled by the EXIT key the trig ger model is restored to its pre scanning configuration Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation 2 82 Entry for external list gt Entry for CONFIG EXT SCANNER Reset scanner press ENTR to gt lt continue ENTER CONFIG EXT SCANNER Set CHAN COUNT to infinite gt lt Press ENTER to continue ENTER SELECT TRIG SOURCE TRIGLINK EXTERNAL TIMER gt lt GPIB MANUAL IMMEDIATE XXXXX CONFIG EXT SCANNER Set CHAN SPACing to XXXXX gt lt Press ENTER to continue ENTER CONFIG EXT SCANNER Set SCAN LIST for 80 channels gt lt Press ENTER to continue ENTER CONFIG EXT SCANNER STEP scanner to first cahnnel gt lt Press ENTER to continue ENTER internal list gt SCAN SCAN COUNT 00010 Figure
182. E Control auto aperture for ACI SEN Se 1 CU RRent DC APERture AUTO lt b gt ONCE Control auto aperture for DCI SEN Se 1 VO LTage AC APERture AUTO lt b gt ONCE Control auto aperture for ACV SEN Se 1 VO LTage DC APERture AUTO lt b gt ONCE Control auto aperture for DCV SEN Se 1 RESistance APERture AUTO lt b gt ONCE Control auto aperture for Q2 SEN Se 1 FRESistance APERture AUTO lt b gt ONCE Control auto aperture for Q4 SEN Se 1 TEM Perature APERture AUTO lt b gt ONCE Control auto aperture for TEMP lt b gt lorON Enable auto aperture 0 or OFF Disable auto aperture ONCE Enable and then disable auto aperture AUTO Query state of auto aperture These commands are used to enable or disable auto aperture for the specified measurement func tion With auto aperture enabled the instrument automatically optimizes the aperture value for the present resolution setting This is the same as selecting SET BY RSLN from the front panel see paragraph 2 4 Tables 2 8 2 13 2 18 and 2 24 provide the integration times for SET B Y RSLN AUTO Note that the times are provided as NPLC values To convert to aperture times use the formula in paragraph 3 18 5 The ONCE parameter is analogous to a momentary toggle switch When AUTO ONCE is sent auto aperture turns on momentarily and then disables While enabled it automatically selects the appropriate value as summarized in the tables When auto aperture disables the aperture
183. E754 single precision format DREal TEEE754 double precision format NOTES 1 When using the ASCii SREal or DREal parameter a lt length gt parameter is not required 2 If you do not use a lt length gt parameter with the REAL parameter the lt length gt defaults to 32 single precision format Query DATA Query data format Description This command is used to select the data format for transferring readings over the bus For every reading conversion the data string sent over the bus contains the elements specified by the ELEMents command The specified elements are sent in a particular order The ASCII data format is in a direct readable form for the operator Most BASIC languages eas ily convert ASCII mantissa and exponent to other formats However some speed is compro mised to accommodate the conversion Figure 3 18 shows the ASCII format that includes all the data elements Reading Channel Reading Time Stamp Number Number 1 2345678E 00N VDC 13 45 23 65 03 SEP 1993 123456RDNG Olintchan SS ve Es Mantissa Exponent Time Date d reading 5 Units Units VDC DC Volts number intchan Internal channel VAC AC Volts extchan External channel ADC DC Current AAC AC Current OHM 2 wire Resistance OHM4W 4 wire Resistance HZ Frequency C Temperature in C F Temperature in F K Temperature in K 00 No channel Status 01 to 80 Channel Number N Normal O Overflow R Reference Rel
184. EITHLEY www keithley com ACV CREST FACTOR MEASUREMENT Crest Factor Peak AC rms AC Crest Factor Resolution 3 digits Crest Factor Accuracy Peak AC uncertainty AC normal mode rms uncertainty Measurement Time 100ms plus rms measurement time Input Characteristics Same as ACV input Crest Factor Frequency Range 20Hz 1MHz Crest Factor Display Access as multiple display on AC volts AC COUPLING For AC only coupling add the following of reading 1 10Hz 10 20Hz 20 50Hz 50 100Hz 100 200Hz Normal Mode rms average 0 41 0 07 0 015 Low Frequency Mode rms 0 1 0 01 0 0 0 For low frequency mode below 200Hz specifications apply for sine wave inputs only AC DC COUPLING For DC gt 20 of AC rms voltage apply the following additional uncertainty multiplied by the ratio DC total rms Applies to rms and average measurements Range of Reading of Range 200mV 20V 0 05 0 1 2V 200V 750V 0 07 0 01 AVERAGE ACV MEASUREMENT Normal mode rms specifications apply from 10 to 100 of range for 20Hz 1MHz Add 0 025 of range uncertainty for 50kHz 100kHz 0 05 of range uncertainty for 100kKHz 200kHz and 0 5 of range uncertainty for 200kHz 1MHz HIGH CREST FACTOR ADDITIONAL ERROR OF READING Applies to rms measurements Crest Factor 1 2 2 3 3 4 4 5 Additional Error 0 0 1 0 2 0 4 ACV PEAK VALUE MEASUREMENT Repetitive Peak Accuracy
185. EL TESTS Test display board KEYS Verify operation of front panel keys DISPLAY PATTERNS Verify operation of display Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Table 2 41 Main menu structure cont Front Panel Operation STROBE CONTROL PASS PATTERN Menu item Description LIMITS Limits menu LIMIT SET 1 Limit Set 1 menu CONTROL Enable disable limit set 1 LOLIM1 Set value of low limit 1 HILIM1 Set value of high limit 1 LIMIT SET 2 Limit Set 2 menu CONTROL Enable disable limit set 2 LOLIM2 Set value of low limit 2 HILIM2 Set value of high limit 2 Enable disable limit strobe signal of digital output 4 when trigger occurs Specify patterns on digital outputs to signify limits pass STATUS MSG Enable disable status message mode GENERAL General menu DIGITAL I O Digital I O menu OUTPUT STATE Check change states of digital output lines OUTPUT SENSE Check change sense of digital output lines INPUT Read digital input line SERIAL Display serial number memory option SCPI version and firmware revisions A D CONTROLS A D menu LINE SYNC Enable disable line synchronization of measurements Also displays the power line frequency AUTO ZERO Disable or enable normal or synchronous autozero mode TIMESTAMP Configure timestamp TYPE Check or change type RELATIVE TIME Reference timestamp to relative time REAL TIME Reference timestamp t
186. ELAY and the measurement settling time the Model 2002 outputs a Trigger Link completion pulse typically to a scanner to close the next channel The measure layer is configured using the CONFIG TRIG menu see paragraph 2 7 2 The scan layer and or arm layer can also be programmed for Trigger Link where Scan Source is set to TRIGLINK and Arm Source is set to TRIGLINK When using Trigger Link in these layers you must also select input and output lines as you did in the measure layer Keep in mind that you can use the same lines in the Scan and arm layers as selected in the measure layer 2 53 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation Asynchronous Trigger Link example 1 In a typical test system you may want to close a channel and then measure the DUT connected to the channel with a mul timeter Such a test system is shown in Figure 2 19 which uses a Model 2002 Multimeter to measure ten DUTs switched by a Model 7011 multiplexer card in a Model 7001 7002 Switch System 7011 MUX Card Figure 2 19 DUT test system 7001 or 7002 Switch System IN E G oUT ei Le Trigger Link Link Cable 8501 Figure 2 20 Trigger Link connections asynchronous example 1 2 54 The Trigger Link connections for this test system are shown in Figure 2 20 Trigger Link of the Model 2002 is connected to Trigger Link of the Model 700
187. ELEMents lt item list gt Specify data elements READing CHANnel RNUMber UNITs Note TIMEstamp and STATus ELEMents Query data elements BORDer lt name gt Select binary byte order NORMal or SWAPped SWAPped y BORDer Query byte order y EXPonent lt name gt Select exponent precision NORMal or HPRecision NORMal Note READing is the RST default and All is the S YSTem PRESet default 3 48 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Table 3 7 INPut command summary D efault Command Description parameter SCPI INPut PREamp Path to control the Model 1801 Preamp STATe lt b gt Enable or disable the preamp OFF STATe Query the state of the preamp FILTer lt name gt Select filter response SLOW MED or FAST MED FILTer Query the selected filter response Table 3 8 OUTput command summary Default Command Description Parameter SCPI OUTPut Note 1 Note 2 TTL 1 Path to set polarity of digital output line 1 LSENse lt name gt Select polarity active high AHIGH or active low ALOW LSENse Query polarity of line 1 TTL2 Path to set polarity of digital output line 2 LSENse lt name gt Select polarity active high AHIGH or active low ALOW LSENse Query polarity of line 2 TTL3 Path to set polarity of digital output line 3 LSENse lt name gt
188. EMENT REPETITIVE SPIKES ACCURACY 90 Days 1 Year or 2 Years Ton 45 C of reading of range Temperature Coefficient 1kHz 10kHz 30kHz 50kHz 100kHz 300kHz 500kHz 750kHz t of reading of range C Range 0 1kHz 10kHz 30kHz 50kHz 100kHz 300kHz 500kHz 750kHz 1MHz Outside TCAL 5 C 200 mV 0 08 0 7 0 09 0 7 0 1 0 7 0 15 0 7 0 25 0 7 1 0 0 7 2 5 0 7 5 5 0 7 9 0 7 0 002 0 03 2V 0 08 0 3 0 09 0 3 0 1 0 3 0 15 0 3 0 25 0 3 1 0 0 3 2 5 0 3 5 5 0 3 9 0 3 0 002 0 03 20 V 0 1 0 7 0 11 0 7 0 14 0 7 0 19 0 7 0 25 0 7 1 0 0 7 2 5 0 7 5 5 0 7 9 0 7 0 004 0 03 200 vi 0 1 0 3 0 11 0 3 0 14 0 3 0 19 0 3 0 25 0 3 1 0 0 3 2 5 0 3 5 5 0 3 9 0 32 0 004 0 03 1000 V 0 12 0 6 0 16 0 6 0 2 0 6 0 25 0 6 0 5 0 6 0 01 0 02 Max of Range 125 125 125 125 125 125 125 100 75 Default Measurement Resolution 3H digits Maximum Input 1100V peak value 2x10 V Hz for inputs above 20V Non Repetitive Spikes 10 of range per us typical slew rate Spike Width Specifications apply for spikes 21us Range Control In Multiple Display mode voltage range is the same as DCV range Spikes Measurement Window Default is 100ms per reading settable from 0 1 to 9 9s in Primary Display mode Input Characteristics Same as ACV input characteristics Spikes Display Access as multiple display on DC Volts First option presents positive peak spikes and highest spike since re
189. Ference REFerence DEFault REFerence MINimum REFerence MAXimum 3 159 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Description Program fragment Parameters Query Description Program fragment 3 160 This command is used to specify the dB reference level When DB units is selected VOLT age AC DB ACV db measurements are made using the specified dB reference level The reference level is specified in volts and is not range dependent For example a dB reference level of 1 is 1V on all ACV measurement ranges PRINT 1 output 16 unit volt ac do ref 2 ref Set dB reference PRINT 1 enter 16 Get respons messag from 2002 DBM IMPedance lt n gt UNIT VO LTage AC DBM IMPedance lt n gt Specify dB reference lt n gt 1to09999 Specify reference impedance IMPedance IMPedance DEFault IMPedance MINimum IMPedance MAXimum This command is used to specify the dBm reference impedance level When dBm units is select ed ACV dBm measurements are made using the specified dBm reference impedance The reference impedance is specified in ohms and is not range dependent For example a dBm reference level of 600 is 600Q on all ACV measurement ranges A rational number is rounded to the nearest valid integer value PRINT 1 output 16 unit volt ac dom imp 600 imp Select dBm impedance PR
190. For example if the D 2 primary address is 16 the actual listen address is 36 36 16 20 In a similar manner the talk address is obtained by ORing the primary address with 40 With the present example the talk address derived from a primary address of 16 decimal would be 56 56 16 40 The IEEE 488 standards also include another addressing mode called secondary addressing Secondary addresses lie in the range of 60 7F Note however that many devices including the Model 2002 do not use secondary addressing Once a device is addressed to talk or listen the appropriate bus transactions take place For example if the instrument is addressed to talk it places its data string on the bus one byte at a time The controller reads the information and the appro priate software can be used to direct the information to the desired location Bus lines The signal lines on the IEEE 488 bus are grouped into three different categories data lines management lines and hand shake lines The data lines handle bus data and commands while the management and handshake lines ensure that proper data transfer and operation takes place Each bus line is active low with approximately zero volts representing a logic 1 true The following paragraphs describe the opera tion of these lines Data lines The IEEE 488 bus uses eight data lines that transfer data one byte at a time DIO1 Data Input Output through DIOS Data Inpu
191. G AUTO AZERO OFF DIG Not supported NORM The PRESET command selects one of two preset instrument configurations one for normal opera tion and one for fast operation The DIG preset configuration supported by the HP3458A is not sup ported by the Model 2002 PRESET FAST Select fast configuration To select the measurement range RANGE lt max_input gt lt _resolution gt Manual range or AUTO autorange lt max_input gt lt _resolution gt Ignored AUTO RANGE Returns the present measurement range for the current function The RANGE command allows you to select a manual measurement range or autorange See paragraph 3 18 for range information specific to each function Specifying AUTO for the lt max_input gt parameter enables autoranging and the lt _resolution gt parameter is ignored RANGE AUTO Select autorange To reset the Model 2002 to the power on state RESET None The RESET command resets the multimeter to the power on state without cycling power Reset effectively executes Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com HP3458A Emulation Mode REV Purpose Format R esponse Description RMEM Purpose Format Response Description RQS Purpose Format AZERO ON DCV AUTO DISP ON EMASK 32767 all errors enabled FSOURCE ACV MEM OFF MFORMAT SREAL NDIG
192. G SOUR TIM TRAC FEED CONT is PRET and TRIG SOUR is neither IMM nor TIM TRAC POIN TRAC POIN AUTO OFF TRAC FEED CONT NEV TRAC FEED PRET AMO READ TRAC POIN TRAC FEED PRET AMO PERC 100 TRIG COUN TRAC POIN SYST AMET is BURS E 3 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com TIEEE 488 Conformance Information Table E 2 cont Coupled commands Command TRAC FEED PRET AMO PERC TRAC FEED PRET AMO READ TRAC EGR TRAC CLE UNIT VOLT AC FUNC ROUT OPEN ALL APER NPLC DIG RANG UPP REF ACQ JAVER STAT LAVER COUN LAVER TCON ANER ADV NTOL SAVER ADV STAT E 4 Also changes TRAC FEED PRET AMO READ TRAC FEED CONT TRAC FEED PRET AMO PERC TRAC FEED CONT TRAC FEED CONT TRAC FEED CONT VOLT AC AVER STAT VOLT AC AVER COUN VOLT AC AVER TCON VOLT AC AVER ADV STAT VOLT AC AVER ADV NTOL APER AUTO NPLC AUTO NPLC DIG APER AUTO NPLC AUTO APER DIG DIG AUTO APER INPLC RANG AUTO REF ANER AUTO ANER AUTO ANER AUTO ANER AUTO ANER AUTO To TRAC POIN TRAC FEED PRET AMO PERC 100 NEV TRAC FEED PRET AMO READ TRAC POIN 100 NEV NEV NEV varies per units varies per function varies per function varies per function varies per function OFF OFF APER line frequency varies per functi
193. IEEE 488 Reference Bit Position B15 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 BO Event Idle Am Trig Set Cal Decimal Weighting e 1024 64 32 2 1 210 26 25 21 2 Value 01 O 1 D I 0 1 0 1 Value 1 Enable O peration Event Events Idle Idle state of the 2002 0 Disable Mask O peration Event Arm Waiting for Arm Trig Waiting for Trigger Set Settling Cal Calibrating Figure 3 29 Operation Event Enable Register Bit Position B15 B2 Event Decimal Weighting Value Value 1 Enable Trigger Event Event Seql Sequence 1 0 Disable Mask Trigger Event Figure 3 30 Trigger Event Enable Register Bit Position B15 B2 Event Decimal W eighting Value 0 1 Value 1 Enable Arm Event Event Seql Sequence 1 0 Disable Mask Arm Event Figure 3 31 Arm Event Enable Register 3 124 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 3 20 3 Parameters Query Description IEEE 488 Reference Bit Position B15 B3 Event Lay2 Lay1 Decimal Weighting Value Value 1 Enable Sequence Event Events Layl Layer 1 0 Disable M ask Sequence Event Lay2 Layer 2 Figure 3 32 Seq
194. IG key is pressed After each burst acquisition the instrument returns to idle e Configure an internal or external scan with the SCAN key Disabling the scan resumes triggering Trigger Model Layers As can be seen in Figure 2 12 the trigger model uses three layers the Arm Layer Scan Layer and Measure Layer For TEEE 488 bus operation these layers are known as Arm Lay er 1 Arm Layer 2 and the Trigger Layer Once the Model 2002 is taken out of the idle state operation proceeds through the layers of the trigger model down to the device action where a measurement occurs Control Sources In general each layer contains a control source which holds up operation until the programmed event occurs The control sources are described as follows e Immediate With this control source selected event detection is immediately satisfied allowing operation to continue e Manual Event detection is satisfied by pressing the TRIG key Note that the Model 2002 must be taken out of remote before it will respond to the TRIG key Press ing LOCAL or sending LOCAL 716 over the bus takes the instrument out of remote e GPIB Event detection is satisfied when a bus trigger GET or TRG is received by the Model 2002 e RT Clock Event detection in the Arm Layer is satis fied when the programmed time and date occurs The real time clock control source is not available in the Scan Layer and Measure Layer Front Panel Operation
195. INT 1 enter 16 Get response messag from 2002 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Specifications Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 A 1 TestEquipmentDepot com KEITHLEY Keithley Instruments Inc 28775 Aurora Road Cleveland Ohio 44139 1 888 KEITHLEY www keithley com Model 2002 Multimeter Specifications The following pages contain the complete specifications for the 2002 Every effort has been made to make these specifications complete by characterizing its performance under the variety of conditions often encountered in production engineering and research The 2002 provides Transfer 24 hour 90 day 1 year and 2 year specifications with full specifications for the 90 day 1 year and 2 year intervals This allows the operator to utilize 90 day 1 year or 2 year recommended calibration intervals depending upon the level of accuracy desired As a general rule the 2002 s 2 year performance exceeds a 6H digit DMM s 90 day 180 day or 1 year specifications ABSOLUTE ACCURACY All DC specifications are given as relative accuracies To obtain absolute accuracies the absolute uncertainties of the calibration sources must be added to the relative accuracies The absolute uncertainties for the calibration sources used during Keithley s factory calibration are given in a table included in the specifications The uncer
196. INT 1 output 16 temp rtd type pt385 type Select standard PRINT 1 enter 16 Get response from 2002 ALPHa lt NRf gt SEN Se 1 TEM Perature RTD ALPHa lt NRf gt Specify Alpha value lt NRf gt 0 to 0 01 Specify RTD Alpha value ALPHa Query the Alpha value This command is used to check and or change the Alpha value Keep in mind that changing the current Alpha value changes the Type to USER see RTD TYPE PRINT 1 output 16 temp rtd alpha 0035 alph Specify alpha value PRINT 1 enter 16 Get response from 2002 3 109 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Parameters Query Description Program fragment Parameters Query Description Program fragment Parameters Query Description Program fragment Parameters Query 3 110 BETA lt NRf gt SEN Se 1 TEM Perature RTD BETA lt NRf gt Specify Beta value lt NRf gt 0 to 1 Specify RTD Beta value BETA Query the Beta value This command is used to check and or change the Beta value Keep in mind that changing the current Beta value changes the Type to USER see RTD TYPE PRINT 1 output 16 temp rtd beta 11 beta PRINT 1 enter 16 D ELTa lt N Rf gt SEN Se 1 TEM Perature RTD DELTa lt NRf gt Specify Delta value Specify beta valu Get response from 2002 lt NRf gt
197. KPC 488 2 or Capital Equip ment Corporation IEEE interface and the HP style Universal Language Driver CECHP Before any programming example can be run the Universal Language Driver must first be installed From DOS execute the following command to install the driver cechp If you include the CECHP command in your AUTOEX EC BAT file the driver will automatically be installed every time you turn on your computer IEEE 488 Reference Program fragments Program fragments are used extensively throughout this manual to demonstrate proper programming syntax As the name implies only a fragment of the whole program is used in order to avoid redundancy At the beginning of each program driver files have to be opened and the input terminator should be set for CRLF OPEN ieee FOR OUPTUT AS 1 OPEN ieee FOR INPUT AS 2 PRINT 1 interm crlf A typical program fragment includes an OUTPUT command and an ENTER command The OUTPUT command sends a program message command string to the Model 2002 If the program message includes a query command then the ENTER command is required to get the response message from the Model 2002 The ENTER command addresses the Model 2002 to talk The following example program frag ment demonstrates how OUTPUT and ENTER are used Note that the commands assume address 16 which is the fac tory set address of the Model 2002 PRINT 1 output 16 func volt ac func PRINT 1
198. LISTEN ADDRESS GROUP MLA MY LISTEN ADDRESS UNL UNLISTEN TALK TAG TALK ADDRESS GROUP MTA MY TALK ADDRESS UNT UNTALK OTA OTHER TALK ADDRESS ADDRESSED COMMAND GROUP ACG ADDRESSED COMMAND GROUP GTL GO TO LOCAL SDC SELECTIVE DEVICE CLEAR STATUS COMMAND GROUP RQS REQUEST SERVICE SRQ SERIAL POLL REQUEST STB STATUS BYTE EOI END D 8 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Conformance Information Information The IEEE 488 2 standard requires specific information about how the Model 2002 implements the standard Paragraph 4 9 of the IEEE 488 2 standard Std 488 2 1987 lists the documentation requirements Table E 1 provides a summary of the require ments and provides the information or references the manual for that information Table E 1 IEEE 488 documentation requirements Requirement Description or reference 1 2 3 4 5 a b c d e 6 7 8 9 10 1 12 13 14 15 TEEE 488 Interface Function Codes Behavior of 2002 when the address is set outside the range 0 30 Behavior of 2002 when valid address is entered Power On Setup Conditions Message Exchange Options Input buffer size Queries that return more than one response message unit Queries that generate a response when parsed Queries that generate a response when read Coupled co
199. M compatibles require the swapped byte order and HP requires normal byte order see FORMat BORDer Important Note Before going into a stream mode the instrument must be in continuous initia tion If continuous initiation is disabled or you are not sure send the following command to enable it INITiate CONTinuous ON When the AMEThod command is sent with one of the stream parameters the instrument will go into the stream mode and lock out all front panel controls and ignore all SCPI and Common commands When a stream mode is entered you must wait before addressing the Model 2002 to talk The minimum delay period is dependent on function and range see Table 3 17 In a stream mode the instrument configures itself as follows Auto zero disabled SYSTem AZERo STATe OFF CALC 1 disabled CALCulate 1 STATe OFF Line synchronization disabled SYSTem LSYNCc STATe OFF For each valid function lt function gt VOLTage AC VOLTage DC CURRent AC CURRent DC RESistance Auto range disabled lt function gt RANGe AUTO OFF NPLC 0 01 lt function gt NPLCycles 0 01 Auto NPLC disabled lt function gt NPLCycles AUTO OFF Resolution 4 digits lt function gt DIGits 5 Auto resolution disabled lt function gt DIGits AUTO OFF Filter disabled lt function gt AVERage STATe OFF Auto filter disabled lt function gt AVERage AUTO OFF Reference disabled lt function gt REFerence STATe OFF The stream mode is
200. MEM2 is memory option 2 Table 2 2 Power up error messages Message Action Error 515 The cal dates are set to factory default values but they are not stored into EEPROM Calibration dates lost To do this perform a comprehensive calibration Error 514 DC cal constants are set to factory default values but they are not stored into DC calibration data lost EEPROM To do this perform a comprehensive calibration Error 513 AC cal constants are set to factory default values but they are not stored into AC calibration data lost EEPROM To do this perform a comprehensive calibration Error 512 Power on defaults are reset to factory defaults bench and stored into EEPROM Power on state lost Error 511 GPIB address is reset to factory default 16 and stored into EEPROM GPIB address lost Error 510 The reading buffer controls are reset to factory defaults but they are not stored into Reading buffer data lost NVRAM To do this store readings in the buffer Error 314 Instrument setup is reset to bench defaults and stored into EEPROM Save recall memory lost Notes 1 Any of these error conditions may occur the first time a unit is turned on or after replacing the firmware 2 Error 510 Reading buffer data lost applies to units with optional memory 3 Error 512 Power on state lost may occur the first time the unit is powered up after replacing the MEM2 memory option with MEM1 Test Equipment Depot 800 517 8431
201. MINimum Query lowest allowable lower limit LLIMit MAXimum Query largest allowable lower limit Automatic range changes slow down the reading rate By setting upper and lower measurement range limits you can prevent inadvertent range changes to ranges that you are not going to use The upper range limit is selected by specifying the maximum expected reading that you expect to measure For example if the maximum expected reading is approximately 100mA let the parameter lt n gt 0 1 or 100e 3 The lowest most sensitive range that can measure 100mA is the 200mA range Thus the 200mA range is selected as the upper range limit With this upper limit the instrument cannot uprange to the 2A measurement range The lower range limit is selected by specifying the lowest expected reading that you expect to measure PRINT 1 output 16 curr ac rang auto ulim 1 Set upper limit for ACI Set lower limit and query limits PRINT 1 output 16 curr ac rang auto llim 10e 3 ulim llim PRINT 1 enter 16 Get response from 2002 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 3 18 9 Parameters Query Description Program fragment IEEE 488 Reference REFerence lt n gt SEN Se 1 CURRent AC REFerence lt n gt Specify reference for ACI SEN Se 1 CURRent DC REFerence lt n gt Specify reference for DCI SEN Se 1 VO LTage AC REFerence l
202. MOCOUPLE Select THERMOCOUPLE when using the Model 2001 TCSCAN installed in the option slot of the Model 2002 or an external thermocouple scanner card Model 7057A or Model 7402 e THERMOCOUPLE TYPE This menu is used to select the type of thermocouple that you are going to use Select one of the following thermocouple types J K T E R S B or N e REF JUNCTION Typically a thermocouple card uses a single reference junction This menu item is used to select one of the five following reference junctions for further configuration JCN1 JCN2 JCN3 JCN4 or JCNS After choosing one of these reference junctions you can configure it further or acquire a reference temperature e CONFIGURE This menu item displays the con figuration menu for the selected reference junction SIMULATED TEMP This option allows you to enter a default temperature Typical reference junc tion temperatures are 0 C and 23 C Note the refer ence junction temperature is shown in the units selected by the SET TEMP UNITS menu REAL JUNCTION This option lets you enter val ues for a temperature coefficient for the selected ref 2 38 erence junction in mV C and an offset voltage in mV at 0 C Consult the thermocouple card manual for correct configuration e ACQUIRE REF TEMP This option updates the stored reference temperature used for generating a temperature measurement If the junction type JCN is simulated the de
203. Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 7 5 Queues The Model 2002 uses two queues the Output Queue and the Error Queue The queues are first in first out FIFO regis ters The Output Queue is used to hold readings and response messages and the Error Queue is used to hold error mes sages and status messages The Model 2002 status model Figure 3 4 shows how the two queues are structured with the other registers Output Queue The Output Queue is used to hold data that pertains to the normal operation of the instrument For exam ple when a query command is sent the response message is placed in the Output Queue When data is placed in the Output Queue the Message Available MAV bit in the Status Byte Register sets A data message is cleared from the Output Queue when it is read The Output Queue is considered cleared when it is empty An empty Output Queue clears the MAV bit in the Status Byte Register A message from the Output Queue is read by addressing the Model 2002 to talk after the appropriate query is sent Error Queue The Error Queue is used to hold error mes sages and status messages When an error or status event occurs a message that defines the error status is placed in the Error Queue This queue will hold up to 10 messages When a message is placed in the Error Queue the Error Available EAV bit in the Status Byte Register is set An error message is cleared from the Erro
204. Model 2002 Multimeter User s Manual 2002 900 01 Rev E February 2009 KEITHLEY A GREATER MEAS URE OF CONFIDENCE Model 2002 Multimeter User s Manual Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com KEITHLEY Safety Precautions The following safety precautions should be observed before using this product and any associated instrumentation Although some instruments and accessories would normally be used with non hazardous voltages there are situations where hazardous conditions may be present This product is intended for use by qualified personnel who recognize shock hazards and are familiar with the safety precautions required to avoid possible injury Read and follow all installation operation and maintenance information carefully before using the product Refer to the user documentation for complete product specifications If the product is used in a manner not specified the protection provided by the product warranty may be impaired The types of product users are Responsible body is the individual or group responsible for the use and maintenance of equipment for ensuring that the equipment is operated within its specifications and operating limits and for ensuring that operators are adequately trained Operators use the product for its intended function They must be trained in electrical safety procedures and proper use of the instrument They must be protected fr
205. NCE Power Environmental Calibration Voltage 90 134V and 180 250V universal self selecting Frequency 50Hz 60Hz or 400HZ self identifying at power up Consumption lt 55VA Operating Temperature 0 C to 50 C Storage Temperature 40 C to 70 C Humidity 80 R H 0 C to 35 C per MIL T 28800E Para 4 5 5 1 2 Type Software No manual adjustments required Sources 2 DC voltages 6 resistances and 5 DC currents All other functions calibrated adjusted from these sources and a short circuit No AC calibrator required for adjustment Average Time to Perform 40 minutes for comprehensive calibration 6 minutes for AC only calibration Process MIL STD 45662A 5 For voltages between other terminals these ratings can be added 5 For MIL T 28800E applies to Type Ill Class 5 Style E Specifications are subject to change without notice SPEC 2002 Rev H February 2009 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Page 13 of 14 KEITHLEY Keithley Instruments Inc 28775 Aurora Road Cleveland Ohio 44139 1 888 KEITHLEY www keithley com Physical Standards Model 2002 Multimeter Specifications Case Dimensions 90mm high x 214mm wide x 369mm deep 3 in x 8 in x 14 in Working Dimensions From front of case to rear including power cord and IEEE 488 connector 15 0 inches Net Weight lt 4 2kg lt 9 2 Ibs Shipping Weight lt 9
206. NFIG TEMPERATURE menu Structure 0 00 ceeeeceeccesseceneeceneesnseeeneeceeeseneceeeeesaeeeseeeeeeees Temperature integration time set by resOlUtion 2 0 eee ceteeeeceeceeeceeeeeeeeeeeeeeeaetaeetaeeseeeaees Temperature auto resolution sessscssscesasstenscveresbtaveceusvacies cadesvacesonnvanssenvecensesdenscsiesetessnateseueesbnseebe Allowable rel Vallina dee ee Ee Eege CONFIGURE TRIGGER menu Structure 0 cece eecceeeeceeecessecenceceeesaeeeneeceeeeneceeneesaeeeseeenenees Reading storage Options tee CONFIGURE DATA STORE menu Structure oe eeeceecceeseceneeceseeesseeeeeeceeeeeneceeneesaeeeseeeeenees Available functions in burst mode BUrst TE UE Fillsand Stop E UE Ss sisipe soto recer errereen E ENEE EES ETE RE EREE ENEE EE EENS PRET PSE Ee Autol o e E Eet CONFIGURE FILTER menu Structure 2 0 cee eeeeeecceesecesecesseceneeceseeesaeeeneeceeeeneceeneeaeeeaeeeeeeees CONFIGURE MATH Menu Structure cee eeccececeseeceeeceseeceneeceseecaeeeneeceeeeeneceeneeaeeeaeeeneeees CHANNEL SELECTION menu Structure cece ceeeeceseceseeceeeeceseeeseseneeceeeeeneceeneesaeeeaeeceeeees CONFIGURE CHANNELS menu Structure ee eeeceecceseeceeeeceneeeeeeeneeceeeeneceeneeaeeeaeeceeeees SCAN OPERATION Menu Structure 0 eeeceeeeceseeeseeeeeeceecesneceeneeseeceseeceeecsaeeeneeceeesaeeeneenas Mam menu Sri Chane us sucks OO RAN UU zadsseesbbeesbeeesnsessdeniseteeseedeseenbeuanieee Factory default CONGMUODS ugereegt Een Seed Test Equipment Depot
207. Nt lt n gt Specify filter count 1 to 100 10 COUNt Query filter count ADVanced Path to configure and control advanced filter NTOLerance lt n gt Specify noise tolerance level 0 to 100 5 NTOLerance Query noise tolerance level STATe lt b gt Enable or disable advanced filter ON STATe Query state of advanced filter STATe lt b gt Enable or disable filter Note 4 STATe Query state of digital filter AUTO lt b gt Enable or disable auto filter Note 5 AUTO ONCE Enable and then disable auto filter AUTO Query auto filter 3 53 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Table 3 10 Continued SENSe command summary Default Command Description parameter SCPI Ref VOLTage AC DETector Path to select AC type 3 18 12 FUNCtion lt name gt Select type of AC measurement RMS AVERage RMS PEAK LFRMs NPEak PPEak FUNCtion Query detector function PWINdow lt n gt Specify window in seconds 0 1 to 9 9 0 1 3 18 13 PWINdow Query peak spike detection window VOLTage DC Path to configure DC voltage y APERture lt n gt Set integration rate in seconds 166 67e 6 to 1 Note 2 y 3 18 5 AUTO lt b gt Enable or disable auto aperture OFF AUTO ONCE Enable and then disable auto aperture AUTO Query auto aperture APERture Query aperture integration rate y NPL Cycles lt n gt Set int
208. OCOMpensated lt b gt Enable or disable Offset Compensation OFF y 3 18 21 OCOMpensated Query Offset Compensation y 3 55 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Table 3 10 Continued SENSe command summary Default Command Description parameter SCPI Ref FRESistance Path to configure four wire resistance y APERture lt n gt Set integration rate in seconds 166 67e 6 to 1 Note 2 y 3 18 5 AUTO lt b gt Enable or disable auto aperture OFF AUTO ONCE Enable and then disable auto aperture AUTO Query auto aperture APERture Query aperture integration rate y NPLCycles lt n gt Set integration rate line cycles 0 01 to 50 1 y 3 18 6 AUTO lt b gt Enable or disable auto NPLC OFF AUTO ONCE Enable and then disable auto NPLC AUTO Query auto line cycle integration NPLCycles Query line cycle integration rate y RANGe Path to configure measurement range y 3 18 8 UPPer lt n gt Select range 0 to 2 1e6 2 1e6 y UPPer Query range y AUTO lt b gt Enable or disable auto range ON y AUTO ONCE Set range based on present input signal y ULIMit lt n gt Set upper limit for auto range 0 to 2 1e6 2 1e6 ULIMit Query upper limit LLIMit lt n gt Set lower limit for auto range 0 to 2 1e6 20 LLIMit Query lower limit AUTO Query auto range y REFerence lt n gt Specify reference 0
209. ONFigure for details When READ is executed its operations will then be performed In general another ABORt will be performed than an INITiate and finally a FETCh to acquire the reading See READ for details PRINT 1 output 16 meas Perform MEASure operations PRINT 1 enter 16 Get response message from 2002 3 43 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 44 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference SCPI command subsystems SCPI commands are categorized into subsystems and are summarized in Tables 3 4 through 3 16 Following the tables the subsystems are covered in the following alphabetical order 3 12 3 13 3 14 3 15 3 16 3 17 3 18 3 19 3 20 3 21 3 22 3 23 3 24 Calculate subsystems Use CALCulate1 to configure and control the math operations Use CALCulate2 to manipulate readings stored in the buffer and use CALCulate3 to con figure and control the limit tests D1SPlay subsystem Use to control display readings and messages FOR Mat subsystem Use to select the data format for transferring instrument readings over the bus IN Put subsystem Use the Model 1801 Preamp OUT Put subsystem Use to select the polarity for the digital output lines ROU Te subs
210. Off Autozero On Autozero Off Autozero On Autozero Off Autozero On 10 167 ms 200 ms 29 6H 6 5 2 1 7 6 5 2 1 6 6 5 2 1 6 2 33 4 ms 40 ms 27 5H 29 25 9 7 6 28 23 9 7 4 26 21 9 7 4 1 16 7 ms 20 ms 26 5H 56 48 47 40 52 43 44 36 48 39 40 33 0 2 3 34 ms 4 ms 23 5H 145 129 110 98 131 117 100 88 102 91 79 70 0 1 1 67 ms 2 ms 22 5H 150 144 112 108 132 127 101 97 102 98 80 77 0 02 334 us 400 us 20 5H 150 150 115 115 132 132 103 103 102 102 80 80 0 01 167 us 167 ys 19 4H 382 382 116 116 251 251 103 103 163 163 80 80 0 01 167 us 167 ys 19 4H 2000 2000 2000 2000 e Temperature coefficient applies to rms and average readings For frequencies above 100kHz add 0 01 of reading C to temperature coefficient 2 Specifications apply for sinewave input AC DC coupling 1 power line cycle autozero on digital filter off following 55 minute warm up 2 For 1 to 5 of range below 750V range and for 1 to 7 of 750V range add 0 01 of range uncertainty For inputs from 200kHz to 2MHz specifications apply above 10 of range Specifications are subject to change without notice Page 4 of 14 SPEC 2002 Rev H February 2009 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Keithley Instruments Inc Multimeter Specifications 28775 Aurora Road Cleveland Ohio 44139 1 888 K
211. Output Port will go true when a limit test failure occurs The first failure in the test sequence determines the digital output pat tern Subsequent failures in the test sequence will not change the digital output pattern on the output port Each output line is assigned a decimal weight as follows Digital Output Decimal Weight Line 1 1 Line 2 2 Line 3 4 Line 4 8 The parameter value for the digital pattern is determined by adding the decimal weights of the desired output lines For example if you want output lines 2 and 3 to go true when the upper limit of LIMIT 1 is the first failure in the test sequence use a parameter value of 6 2 4 The actual true state high or low of each Digital Output line depends on its programmed po larity Polarity is programmed from the OUTPut subsystem see paragraph 3 16 Note that when the binning strobe is enabled see BSTRobe command path output line 4 is not considered to be part of the digital output pattern The binning strobe uses line 4 With the binning strobe enabled parameters 8 through 15 are treated the same as parameters 0 through 7 PRINT 1 output 16 calc3 lim upp sour 4 sour Select line 4 and query PRINT 1 enter 16 Get response messag from 2002 STATe lt b gt CALCulate3 LIM t 1 STATe lt b gt Control LIMIT 1 test CALCulate3 LIM t2 STATe lt b gt Control LIMIT 2 test lt b gt lorON Enable specified limit test Oor OFF Disable sp
212. PC operation complete query Place a 1 in the Output Queue after all pending operations are completed On power up or when CLS or RST is executed the Model 2002 goes into the Operation Complete Command Query Idle State OQIS In this state there are no pending overlapped commands There are three overlapped commands used by the Model 2002 INITiate INITiate CONTinuous ON TRG When the OPC command is sent the Model 2002 exits from OQIS and enters the Operation Complete Command Active State OQAS In OQAS the instrument continuously monitors the No Operation Pending flag After the last pending overlapped command is completed No Operation Pending flag set to true an ASCII character 1 is placed into the Output Queue the Message Available MAV bit in the Status Byte sets and the instrument goes back into OQIS Addressing the Model 2002 to talk sends the ASCII 1 to the computer Note that the instrument always goes into OQAS when OPC is executed If there are no pend ing command operations e g trigger model in idle state the Model 2002 immediately places an ASCII 1 in the Output Queue sets the MAV bit and returns to OQIS When used with the INITiate or INITiate CONTinuous ON command an ASCII 1 will not be sent to the Output Queue and the MAV bit will not set until the Model 2002 goes back into the idle state The initiate operations are not considered finished until the instrument goes i
213. Q Select a specific range 200kQ 20kQ Table 2 17 CONFIGURE OHMS 4W menu structure Menu item Description SPEED Measurement speed integration time menu NORMAL Select 1 PLC power line cycle 16 67msec for 60Hz 20msec for 50Hz and 400Hz FAST Select 0 01 PLC MEDIUM Select 0 1 PLC HIACCURACY Select 10 PLC SET SPEED EXACTLY Set integration time in PLC 0 01 50 SET BY RSLN Default to setting appropriate for resolution FILTER Digital filter menu AUTO Default to filter appropriate for integration time AVERAGING Program a simple average filter 1 100 readings ADVANCED Program a simple average filter 1 100 readings with a noise tolerance window AVERAGING MODE RESOLUTION AUTO 3 5d 4 5d 5 5d 6 5d 7 5d 8 5d OFFSETCOMP MAXAUTORANGE 2MQ 200kQ 20kQ 2kQ 2000 200 0 100 of range Select moving average or repeating average mode Display resolution menu Default to resolution appropriate for integration time Select a specific resolution Enable disable offset compensation 20Q 20kQ ranges Set upper limit for autoranging of 4 wire resistance Select a specific range 2 29 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation SPEED The SPEED parameter sets the integration time of the A D converter the period of time the input signal is measured also known as aperture It is discussed in paragraph 2 4 1 DC and A
214. Reading available Sets B5 when the next reading is being taken Buffer available Sets B7 when the trace buffer has become empty Buffer half full Sets B8 when the trace buffer is no longer half full Buffer full Sets B9 when the trace buffer is no longer full Buffer pretriggered Sets when the trace buffer pretrigger operations are completed Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Program fragment IEEE 488 Reference Effects of negative transitions on the Questionable E vent R egister Negative transition effect on Questionable event Questionable Event Register Temperature summary Sets B4 when a valid reference junction measurement follows an invalid reference junction measurement Calibration summary Sets B8 when an invalid calibration constant clears after a success ful calibration Command warning Sets B14 when a Signal Oriented Measurement Command parame ter executes correctly after a previous Signal Oriented Measurement Command parameter has been ignored Effects of negative transitions on the Operation E vent R egister Negative transition effect on Operation event Operation Event Register Calibrating Sets BO at the end of calibration Measuring Sets B1 at the end of a measurement Trigger layer Sets B5 when leaving the Trigger Layer Arm layer Sets B6 when leaving an arm layer Idle Sets B10 when leaving the idle state Effects of negative tr
215. Rent D C AVERage AD Vanced NTOLerance lt n gt Specify noise tolerance DCI SEN Se 1 VO LTage AC AVERage ADVanced NTOLerance lt n gt Specify noise tolerance ACV SEN Se 1 VO LTage DC AVERage ADVanced N TO Lerance lt n gt Specify noise tolerance DCV SEN Se 1 RESistance AVERage AD Vanced NTOLerance lt n gt Specify noise tolerance Q2 SEN Se 1 FRESistance AVERage AD Vanced NTOLerance lt n gt Specify noise tolerance Q4 lt n gt 1to100 Specify noise tolerance in percent DEFault 1 for DCV DCI Q2 and Q4 5 for ACV and ACI MINimum 0 MAXimum 100 NTOLerance Query noise tolerance NTOLerance DEFault Query RST default noise tolerance NTOLerance MINimum Query lowest allowable noise tolerance NTOLerance MAXimum Query largest allowable noise tolerance Each measurement function except TEMP and FREQ can utilize the advanced filter which adds a noise tolerance window to the averaging algorithm These commands are used to set the noise tolerance level of the advanced filter for the specifed function The ADVanced STATe commands are used to enable or disable the advanced filter The noise tolerance level is expressed as a percent of the last averaged reading In general if the noise is within this window the reading is simply based on the normal averaging algorithm If a reading is outside this window then the advanced averaging algorithm is used See paragraph 2 9 1 for details Test Equipment Depot
216. Required equipment e Model 2002 Multimeter e Model 7001 or 7002 Switch System Program bufclint bas SINCLUDE IEEEQB BI Initialize global variables CLS DmmAddr 16 ScanAddr 7 Rdg SPACES 200 cmd SPACES 80 Sme SPACES 10 Initialize GPIB CALL initialize 21 0 CALL setoutputEOS 10 0 CALL setinputEOS 10 CALL settimeout 5000 cmd CLS GOSUB send2002 cmd CLS GOSUB send7001 Example Programs e Model 8501 1 Trigger Link Cable connect 2002 to 7001 or 7002 Model 7014 Thermocouple Multiplexer Card installed in slot 1 of 7001 or 7002 e Two Type K Thermocouples connected to channels 2 and 3 of 7014 Microsoft QuickBASIC 4 5 e Any one of the following IEEE 488 interfaces Keithley Model KPC 488 2 Keithley Model KPC 488 2AT Capital Equipment Corporation PC lt gt 488 The program assumes that the Model 2002 is set to address 16 and the address of the switch system Model 7001 or 7002 is set to 7 Loading user library The user library for QuickBASIC 4 5 is provided with the TEEE 488 interface ieeeqb qlb Assuming QuickBASIC and the user library are in the same DOS directory enter the following command line from the DOS prompt QB L ieeegb qlb The above command line will load QuickBASIC and the user library Clear 2002 Clear 7001 Test Equipment Depot 800 517 8431 99 Washington
217. SOLUTION Fixed at 3 5 digits DCV key or changing function i e leaving this UNITS Fixed on volts display COUPLING Fixed on AC DC coupling NOTE The peak detector captures the minimum value of the input signal C DC voltage and negative peak spikes functions Figure 2 5 DC voltage multifunction multiple displays cont Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation DCV RANGE Set by DCV range auto or fixed Autoranges independently of other functions REL Operates normally SPEED Set by DCV speed FILTER Set by DCV filter RESOLUTION Set by DCV resolution 000 0000 mVDC Pos Pk 000 0mV Neg Pk 000 0mV RANGE Follows the DCV range RANGE Follows the DCV range REL No effect REL No effect SPEED Fixed at 100msec SPEED Fixed at 100msec Peak window has no effect Peak window has no effect FILTER Unaffected by DCV and ACV filters FILTER Unaffected by DCV and ACV filters RESOLUTION Fixed at 3 5 digits RESOLUTION Fixed at 3 5 digits UNITS Fixed on volts UNITS Fixed on volts COUPLING Fixed on AC DC coupling COUPLING Fixed on AC DC coupling NOTE The peak detector captures the maximum NOTE The peak detector captures the minimum value of the input signal value of the input signal D DC voltage positive and negative peak spikes functions Figure 2 5 DC voltage multifunction multiple displa
218. Select polarity active high AHIGH or active low ALOW LSENse Query polarity of line 3 TTL4 Path to set polarity of digital output line 4 LSENse lt name gt Select polarity active high AHIGH or active low ALOW LSENse Query polarity of line 4 Notes 1 None of the OUTPut subsystem commands are affected by RST and SYSTem PRESet 2 All OUTPut subsystem commands are non SCPI 3 49 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Table 3 9 ROUTe command summary Default Command D escription parameter SCPI Ref ROUTe CLOSe lt list gt Path and command to close specified channel y 3 17 1 STATe Query closed channel y CLOSe lt list gt Query specified channels 1 closed O open y OPEN lt list gt Open specified channel or all channels y 3 17 2 OPEN ALL Open all channels y 3 17 3 OPEN lt list gt Query specified channels 1 open 0 closed y SCAN Command path to configure and control scan operations y 3 17 4 INTernal lt list gt Specify internal scan list 2 to 10 channels All 10 y INTernal Query the internal scan list y FUNCtion lt list gt lt name gt Assign function to specified channels FUNCtion lt list gt Query function for each specified channel EXTernal lt list gt Specify external scan list 2 to 80 channels All 80 EXTernal Query the exter
219. Set bit B9 4 Set bit B2 1024 Set bit B10 8 Set bit B3 2048 Set bit B11 16 Set bit B4 16384 Set bit B14 32 Set bit B5 65535 Set all bits 64 Set bit B6 ENABle Query enable register These commands are used to set the contents of the event enable registers see Figures 3 27 through 3 32 An ENABle command is sent with the decimal equivalent of the binary value that determines the desired state 0 or 1 of each bit in the appropriate register Each event enable register is used as a mask for events see EVENt for descriptions of events When a bit in an event enable register is cleared 0 the corresponding bit in the event register is masked and thus cannot set the corresponding summary bit of the next register set in the sta tus structure Conversely when a bit in an event enable register is set 1 the corresponding bit in the event register is unmasked When the unmasked bit in the event register sets the summary bit of the next register set in the status structure will set The decimal weighting of the bits for each event enable register are included in Figures 3 27 through 3 32 The sum of the decimal weights of the bits that you wish to set is sent as the parameter lt NRf gt for the appropriate ENABle command For example to set the BFL and RAV bits of the Measurement Event Enable Register send the following command stat meas enab 544 where BFL bitB9 Decimal 512 RAV bit B5 Decimal 32 lt NRf gt
220. Source Bypass Enabled Scan Event Detection Scan Layer Another Scan Scan Count H Arm Layer 2 Immediate External Manual GPIB Triglink Timer Hold Source Bypass Enabled Scan Delay Measure Layer Measure Trigger Control Source Source Bypass Enabled Another Measure Count Measure Trigger Layer Measure Event Detection Trigger Immediate External Manual GPIB Triglink Timer Hold Measure Delay Device Action Take bypass path the first time a layer is entered Figure 2 12 Trigger model front panel operation 2 44 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Idle The instrument is considered to be in the idle state whenever 1t is not operating within one of the three layers of the Trigger Model The front panel ARM indicator is off when the instru ment is in the idle state While in the idle state the instrument cannot perform any measurement or scanning functions From the front panel there are four ways to put the instru ment into idle e Select RESET GPIB from the SAVESETUP option of the main menu Press the TRIG key to take a reading After each reading the instrument returns to the idle state Select HALT from the CONFIGURE TRIGGER menu Press the TRIG key to resume triggering Enable BURST MODE from the CONFIGURE DATA STORE menu This places the instrument in idle until the TR
221. St Burst acquisition method for buffer ASTReam ASCII stream mode SSTReam Single integer stream mode AMEThod Query acquisition method BURST and NORMal These parameters are used to specify the acquisition method for storing readings in the buffer With the NORMAL method readings are stored at a rate that is determined by how the instru ment is configured i e integration period resolution and filter When BURSt acquisition is selected the Model 2002 is automatically configured for optimum speed The instrument s previous configuration is restored when normal acquisition is again selected The burst mode configures the buffer for compact grouping see TRACe EGRoup Thus the time stamp is not available for burst acquisition See paragraph 2 8 for complete infor mation on burst mode Before selecting the burst acquisition mode configure the Model 2002 for the desired measure ments such as a valid function a manual measurement range and a math calculation CALCulate1 if desired Also configure the buffer for the number of readings to be stored see Trace subsystem After burst acquisition is selected the instrument goes into the idle state ARM indicator off After taking the instrument out of idle INITiate or INITiate CONTinuous ON the pro grammed scan event see ARM LAYer2 SOURce will start the storage process 3 139 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipme
222. Sudden shifts in reading To minimize pick up keep the voltage source and the Model 2002 away from strong AC magnetic sources The voltage in duced due to magnetic flux is proportional to the area of the loop formed by the input leads Therefore minimize the loop area of the input leads and connect each signal at only one point Thermal EMF s Thermal emfs thermoelectric potentials are generated by thermal differences between the junctions of dissimilar metals These can be large compared to the sig nal that the Model 2002 can measure Thermal emfs can cause the following conditions e Instability or zero offset is much higher than expected 2 22 e The reading is sensitive to and responds to temperature changes This effect can be demonstrated by touching the circuit by placing a heat source near the circuit or by a regular pattern of instability corresponding to heating and air conditioning systems or changes in sunlight To minimize the drift caused by thermal emfs use copper leads to connect the circuit to the Model 2002 A banana plug generates a few microvolts A clean copper conductor such as 10 bus wire is ideal for this application The leads to the input may be shielded or unshielded as necessary Refer to Shielding Widely varying temperatures within the circuit can also cre ate thermal emfs Therefore maintain constant offset tem peratures to minimize these thermal emfs A cardboard box around the circ
223. Summary Bit EAV Error Available MSB Measurement Summary Bit amp Logical AND OR Logical OR Figure 3 12 Status byte and service request SRQ Service Request Enable Register This register is pro grammed by the user and serves as a mask for the Status Summary Message bits BO B2 B3 B4 B3 and B7 of the Status Byte Register When masked a set summary bit in the Status Byte Register cannot set bit B6 MSS RQS of the Status Byte Register Conversely when unmasked a set summary bit in the Status Byte Register sets bit B6 A Status Summary Message bit in the Status Byte Register is masked when the corresponding bit in the Service Request Enable Register is cleared 0 When the masked summary bit in the Status Byte Register sets it is ANDed with the cor responding cleared bit in the Service Request Enable Regis ter The logic 0 output of the AND gate is applied to the input of the OR gate and thus will not set the MSS RQS bit in the Status Byte Register A Status Summary Message bit in the Status Byte Register is unmasked when the corresponding bit in the Service Request Enable Register is set 1 When the unmasked summary bit in the Status Byte Register sets it is ANDed with the corre sponding set bit in the Service Request Enable Register The logic 1 output of the AND gate is applied to the input of the OR gate and thus sets the MSS RQS bit in the Status Byte Register Test Equipment Depot 800
224. T 1 and LIMIT SET 2 These menu items are similar in that you can enable or dis able either or both limit sets and program the high and low limit values for either or both limit sets The options for these menu items are explained as follows CONTROL This item enables or disables control of the dig ital output lines by the results of either or both limit set tests For example to let limit set 1 control the digital output lines highlight the CONTROL item in the previous menu and press ENTER Then highlight the ENABLE item in the next menu and press ENTER The instrument returns to the LIMIT SET 1 MENU LOLIM1 HILIM1 LOLIM2 HILIM2 These items allow you to set values for the low and high limits and the action performed on the digital output lines for each limit test failure After selecting a limit the value for that limit will be dis played To change the limit use the cursor keys and the range keys to display the desired value Note that you must enter values in scientific notation Press ENTER to select your value and display the next menu which selects the digital output action to be taken if the selected limit is the first limit to be exceeded The digital out puts can be toggled between ON and OFF with the range keys Each measurement function except frequency has a multiple display for the limits bar graph It shows a pass fail indica tion and a graphical representation of the reading compared to limit set 1 N
225. T AS 2 CLS PRINT 1 TIME OUT 5 PRIN 1 TERM OUT LF EOI PRIN 1 TERM IN LF EOI This program configures the Model 2002 as follows Function Q4 Filter Repeat averaging mode 5 readings Resolution 7 1 2 digits Required equipment Model 2002 Multimeter e Microsoft QuickBASIC 4 5 IOtech GP488B IEEE 488 Interface e IOtech Driver488 Software installed and configured as described in the instruction manual for the interface The program assumes that the Model 2002 is set to address 16 Open GP488B for output Reset Personal488 Open GP488B for input Set up 2002 for 5 readings 7 5 digits 4 wire ohms 10 NPLC store readings in buffer return buffered readings to host computer and then repeat the process PRINT 1 Output 16 RST PRINT 1 Output 16 sens func fres Perform reset Set for 4 wire ohms cmd sens fres nplc 10 dig 7 5 aver coun 5 tcon rep cmd cmd Stat On PRINT 1 Output 16 cmd PRINT 1 Output 16 form elem read cmd init cont off abor trac cle PRINT 1 Output 16 cmd PRINT 1 Output 16 cmds Set for 10 PLC 7 5 digits average 5 readings repeat mode Return readings only Turn off trigger model Clear data buffer arm seql layl sour bus coun 1 arm seql lay2 sour imm cmd trig seql sour imm coun 5 stat meas PTR 512 NTR 0 Set the 2002 t
226. T Off 10 Readings DFILT Off DFILT Off DFILT Off 200 15 11 0 15 11 0 5 15 13 0 5 15 13 1 15 16 25 110 200 35 200 0 15 8 0 15 8 0 5 17 8 0 5 17 8 1 17 10 15 110 200 35 2kQ 7 0 8 0 7 0 8 0 05 8 0 8 0 07 8 0 8 0 2 8 1 2 130 230 5 20 kQ 7 0 8 0 7 0 8 0 1 8 0 8 0 1 9 0 8 0 2 40 1 2 130 230 5 200 kO 29 0 8 0 29 0 8 0 1 31 0 8 0 1 34 0 8 0 2 250 1 2 2 MO 55 0 5 0 53 0 5 0 1 58 0 5 0 1 68 0 5 0 2 750 0 7 2 20 MQ 175 0 6 0 175 0 6 0 175 0 6 0 200 0 6 0 200 MO 500 3 0 510 3 0 510 3 0 550 3 0 1 GO 2000 15 0 2100 15 0 2100 15 0 2500 15 0 PLC Power Line Cycles DFILT Digital Filter 2 WIRE ACCURACY ppm of range Additional Temperature Uncertainty Coefficient Range inside Teca 5 C outside Tea 5 C 200 300 ppm 70 ppm C 200 0 30 ppm 7 ppm C 2kO 3 ppm 0 7 ppm C NORMAL ACCURACY 1PLC offset comp off DFILT off Relative Accuracy Temperature Coefficient ppm of reading ppm of range ppm of reading ppm of range C RANGE 24 Hours 90 Days 1 Year 2 Years Outside Tea 5 C 200 5 12 15 16 17 17 20 19 2 5 2 5 200 0 7 8 17 11 19 12 22 13 2 5 1 8 2kO 3 5 1 1 8 1 4 10 1 5 12 1 6 0 8 0 18 20kQ 4 5 1 1 9 1 4 11 1 5 13 1 6 0 8 0 18 200kO 1141 1 34 1 4 40 1 5 45 1 6 3 5 0 18 2MQ 27 0 9 68 1 1 80 1 1 90 1 1 7 0 1 20M0 75 0 2 200 0 6 275 0 6 325 0 6 20 0 1 200M0 200 1 550 3 600 3 650 3 80 0 5 160 1250 5 2500 15 2550 15 2600 15 400 2 5 Settling Characteristics Pre programmed settling delay times are for
227. TATUS Disable continuous initiation and place 2002 in idle Set layer 1 to bus source Set layer 2 to inmediate source trig sour imm coun inf GPIB STATUSS Set trigger layer to immediate source and infinite count Take 2002 out of idle Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Program fastscan bas cont config buffer ALL SEND 16 CALL S Trigger 2 SLEEP 002 1 END 16 trac feed cont next GPIB STATUS CALL TRANSMIT UNL UNT LISTEN 16 GET wait for PRINT SLEEP get data buffer to fill Collecting Data 15 CALL SEND 16 trac data STATUS CALL PRINT END DCV k2002data STATUS Enter k2002dataS Gpib len 16 GPIB STATUS Example Programs trac cle poin 1810 egr comp feed sens GPIB STATUSS Clear readings from buffer Set buffer size to 1810 points Select COMPACT element group Select SENSE as source of readings Select the NEXT buffer control mode Start scan Read buffer Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Example Programs Measure High Speed Channels Model 2001 SCAN Microsoft QuickBASIC 4 5 Keithley KPC 488 2 Interface 1992 Keithley Instruments Inc Description This program measures D
228. TO ONCE Set range based on present input signal y ULIMit lt n gt Set upper limit for auto range 0 to 1 05e9 1 05e9 ULIMit Query upper limit LLIMit lt n gt Set lower limit for auto range 0 to 1 05e9 20 LLIMit Query lower limit AUTO Query auto range y REFerence lt n gt Specify reference 0 to 1 05e9 0 y 3 18 9 STATe lt b gt Enable or disable reference OFF y STATe Query state of reference y ACQuire Use input signal as reference REFerence Query reference value y DIGits lt n gt Specify measurement resolution 4 to 9 8 3 18 10 AUTO lt b gt Enable or disable auto resolution ON AUTO ONCE Enable and then disable auto resolution AUTO Query auto resolution DIGits Query resolution AVERage Path to configure and control filter 3 18 11 TCONtrol lt name gt Select filter type MOVing or REPeat TCONtrol Query filter type Note 3 COUNt lt n gt Specify filter count 1 to 100 COUNt Query filter count 10 ADVanced Path to configure and control advanced filter NTOLerance lt n gt Specify noise tolerance level 0 to 100 NTOLerance Query noise tolerance level 1 STATe lt b gt Enable or disable advanced filter STATe Query state of advanced filter ON STATe lt b gt Enable or disable filter STATe Query state of digital filter Note 4 AUTO lt b gt Enable or disable auto filter AUTO ONCE Enable and then disable auto filter Note 5 AUTO Query auto filter
229. Transition Register Sequence event status 3 12 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Trigger Condition Register a EE whe Trigger NTR Transition Filter Trigger Event Register To Waiting for Trigger Bit Trig of O peration Event Condition Register Seal See Figure 3 6 Ka E Trigger Event 815 B14 B2 pu Bo Enable Register Seq 1 Sequence 1 Set bit indicates that the 2002 is in the trigger layer of Sequence 1 amp Logical AND OR Logical OR PTR Positive Transition Register NTR Negative Transition Register Figure 3 9 Trigger event status 3 13 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference To Measurement Summary Bit M SB of Status Byte Register See Figure 3 12 Figure 3 10 Measurement event status 3 14 OR Measurement Condition Register PTR Measurement BPT BFL BHF BAV Rav 85 84 BPT Buffer Pretriggered BFL Buffer Full BHF Buffer Half Full BAV Buffer Available RAV Reading Available HL2 High Limit 2 LL2 Low Limit 2 HL1 High LL1 Low Li ROF Readi HL2 Limit 1 mit 1 amp Logical AND OR Logica OR PTR Posit
230. URE CHANNELS INTERNAL CHANS EXTERNAL INPUTS gt lt SAVE ALT FCN RESTORE ALT FCN 2 Select INTERNAL CHANS The Model 2002 will dis play the following SET INTERNAL CHANNELS 1 DCV 2 DCV 3 DCV 4 DCV 5 DCV gt d 6 DCV 7 DCV 8 DCV 9 DCV_ 10 DCV 3 Use the cursor and range keys to select channels and functions then press ENTER when you have set all functions and channels Step 2 Configure scan 1 From normal display press CONFIG SCAN The instrument will display the following SCAN OPERATION INTERNAL EXTERNAL RATIO DELTA 2 Select INTERNAL then press ENTER 2 86 Step 3 Trigger scan Press SCAN to program the scan count scan timer data stor age and select YES to the Data to memory prompt Then press ENTER The unit will cycle through the channels stopping to take and store a reading on each channel Step 4 Recall readings From the SCAN COMPLETE menu select the RECALL DATA option to display readings stored in the buffer Use the cursor and range keys to select the reading number to dis play Note that the instrument will display the channel num ber for each buffer reading in addition to other pertinent buffer information Press EXIT to return to the SCAN COM PLETE menu External scanning Follow the general steps below to set Model 2002 modes for external scanning Step 1 Make scanner card connections Be sure to connect your scanner signal lines and trigger cables as appropriate See the sca
231. US QUEStionable Path to control questionable status registers y EVENt Read the event register Note 2 y 3 20 1 ENABle lt NRf gt Program the enable register Note 3 y 3 20 2 ENABle Read the enable register y PTRansition lt NRf gt Program the positive transition register Note 4 y 3 20 3 PTRansition Read the positive transition register y NTRansition lt NRf gt Program the negative transition register Note 5 y 3 20 4 NTRansition Read the negative transition register y CONDition Read the condition register y 3 20 5 PRESet Return status registers to default states y 3 20 6 OU Bue Path to access error queue y 3 20 7 NEXT Read the most recent error message Note 6 y ENABle lt list gt Specify error and status messages for queue Note 7 y ENABle Read the enabled messages y DISable lt list gt Specify messages not to be placed in queue Note 7 DISable Read the disabled messages CLEar Clears all messages from Error Queue Notes 1 Commands in this subsystem are not affected by RST and SYSTem PRESet The effects of cycling power CLS and STATus PRESet are explained by the following notes 2 Event Registers Power up and CLS Clears all bits of the registers STATus PRESet No effect 3 Enable Registers Power up and STATus PRESet Clears all bits of the registers CLS No effect 4 PTR Registers CLS No effect 5 NTR Registers CLS No effect 6 Error Queu
232. WINdow MINimum Query lowest allowable window PWINdow MAXimum Query largest allowable window This command is used to set the detection window for peak spike measurements NPEak or PPEak The instrument measures and displays the largest peak spike that occurs within each specified detection window For example for a Y2 second window the instrument displays the peak spike after every L second See paragraph 2 4 1 AC TYPE Positive Peak and Negative Peak for more information PRI 1 output 16 volt ac det pwin 1 pwin PRINT 1 enter 16 Specify 1 sec window Get response from 2002 METHod lt name gt SEN Se 1 CURRent DC METHod lt name gt Specify measurement technique for DCI lt name gt NORMal Normal DCI measurement technique ICIRcuit In circuit DCI measurement technique METHod Query measurement technique This command is used to select the DCI measurement technique NORMal is used to make con ventional current measurements which are performed by breaking the circuit and placing the ammeter in series with it The ICIRcuit selection allows you make an in circuit current measurement of a wire or circuit board trace This measurement technique is performed by making four wire INPUT connections to the wire or trace the AMPS input is not used The instrument automatically performs a four wire ohms offset compensated measurement and calculates the current See paragraph 2 4 2 IN CIRCUIT for de
233. Zz Zz Zz Yo AVW AV 240 Lg 240 ae1duos uopeedo e2150 T bes O 1 bas T bes Tbes 11907196611 ul ER aso 850 as 6Oy Jeton E Ava Ava alqeuz smes R 2 S I T SMES quen 5oy asoy Ald asoy SCH 6 SCH As puepueys 3 qeu3 e uogisues uogipuoD X puepuers quen 66u 66u fu say say 66u aen akg ypenbey smes SOS anand andino TK St O St St st 0w9zsAempy K ST ST ST ST 0w95zsAemiv k 210 We Wwe wem Guiue m puewwuop k PL e PL PL PL K ET ET ET ET k ET ET ET ET Al Al Al Al k Al a Zt aq anand Joa K uo TL TL TL k ida OH lag 149 1d9 perbb6uaud yng K oT OT OT OT k or Ho oT oT Or K 6 6 6 6 ua ug ug ug m3 eme wo ELE eD 1e9 EI AteLuuuns voa 3H9 EISE ES 3H8 ma ien ung e2601 Kit 4 1 1 1 Ae Ava Ava Ava Ava aiqeeny yng KH o 9 9 9 sn E Ho Ha Ho Ki ei S S a oH ave Ave Ave Tage Dupeen K duel duet duet due Aewuuns aumeseduue k ZH ZH ZH ZH Z wun yb Ke e fan fan au CT zan wen emm z z z K TIH TIH TIH TIH ran vpm a rT T H H K m oH m CT TT taun mo Ke o o o K sou oH 308 ES 209 mioyano Buipesy asoy Jaysibey Je Joy Jaysibey open M4 asoy IT ST juan uopEue1t uogipuoD jqeug queng uogisuel uogipuoD EZE a qeuonsand ajqeuoysenO ajqeuonsend EZE JU W NSE W JL AWANSE W 21 BIqeuonsand ALUS Model 2002 status register structure Figure 3 4 3 7 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 7 1 Condition reg
234. a comma 3 135 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Program fragment Parameters Query Description Program fragment Description Program fragment 3 136 Note To disable all messages from entering the Error Queue send the following command stat que enab PRINT 1 output 16 stat que enab 0 999 enab Enable all messages and query PRINT 1 enter 16 Get response messag from 2002 DiSable lt list gt STATus Q UEue DISable lt list gt Disable messages for Error Q ueue lt list gt numlist where numlist is a specified list of messages that you wish to disable for the Error Queue DISable Query list of disabled messages On power up all error messages are enabled and will go into the Error Queue as they occur Sta tus messages are not enabled and will not go into the queue This command is used to specify which messages you want disabled Disabled messages are prevented from going into the Error Queue Messages are specified by numbers see Table 2 4 See QUEue ENABle for examples to ex press a numlist PRINT 1 output 16 stat que dis 140 150 dis Disable messages and query PRINT 1 enter 16 Get response mes sage from 2002 CLEar STATus QUEue CLEar Clear Error Queue This action command is used to clear the Error Queue of messages PRINT 1 output 16 sta
235. able D 1 IEEE 488 bus command summary State of Command type Command ATN line Comments Uniline REN Remote Enable X Set up devices for remote operation EOI X Marks end of transmission IFC Interface Clear X Clears interface ATN Attention Low Defines data bus contents SRQ X Controlled by external device Multiline Universal LLO Local Lockout Low Locks our local operation DCL Device Clear Low Returns device to default conditions SPE Serial Enable Low Enables serial polling SPD Serial Poll Disable Low Disables serial polling Addressed SDC Selective Device Clear Low Returns unit to default conditions GTL Go To Local Low Returns device to local Unaddressed UNL Unlisten Low Removes all listeners from the bus UNT Untalk Low Removes any talkers from the bus Common High Programs IEEE 488 2 compatible instruments for common operations SCPI High Programs SCPI compatible instruments for particular operations Uniline commands ATN IFC and REN are asserted only by the controller SRQ is asserted by an external device EOI may be asserted either by the controller or other devices depending on the direction of data transfer The following is a description of each com mand Each command is sent by setting the corresponding bus line true REN Remote Enable REN is sent to set up instruments on the bus for remote operation When REN is true devices will be removed from the local mode De
236. abled Control Source and the Scan Source is programmed for External an output trigger occurs on each return path through the scan layer If the arm layer Source Bypass is enabled Control Source and the Arm Source is programmed for External an output trigger occurs on each return path through the arm layer See para graphs 2 7 3 and 2 7 4 for programming the Scan and arm layers External triggering example 1 In a typical test system you may want to close a channel and then measure the DUT connected to that channel with a mul timeter Such a test system is shown in Figure 2 16 which uses a Model 2002 Multimeter to measure ten DUTs switched by a Model 7011 multiplexer card in a Model 7001 or 7002 Switch System The external trigger connections for this test are shown in Figure 2 17 Channel Ready output of the Model 7001 or 7002 is connected to External Trigger Input of the Model 2002 Meter Complete Output of the Model 2002 is con nected to External Trigger input of the Model 7001 or 7002 OUTPUT 2 OO 000000 bel IT DO DD DO H cocS SS aS Input LO 2002 Multimeter 2 51 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation 7051 2 BNC to BNC Cables 2 Figure 2 17 External trigger connectors For this example the Models 2002 and 7001 700
237. accuracy and speed Low frequency RMS mode is more accurate but slower Both modes are specified between 20Hz and 2MHz with low frequency RMS specified additionally down to 1Hz Some guidelines for choosing between the two modes follow e Below 50Hz use low frequency RMS mode for its greater accuracy Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Between 50 and 100Hz use either mode e Above 100Hz use normal RMS mode for its greater speed AVERAGE When this item is selected the signal path in the instrument bypasses the RMS converter and the average ACV measurement is the filtered output of a full wave rectifier PEAK For AC peak measurements the instrument displays the largest peak positive or negative of the input signal The measurement window is fixed at 100msec Note that you can configure the resolution of ACV peak mea surements from 4 digits 3 5d from SET ACV RESOLU TION menu to 9 digits 8 5d but the accuracy is specified at 4 digits In addition the accuracy specifications for AC peak measurements assume AC DC coupling below 200Hz POSITIVE PEAK and NEGATIVE PEAK Peak spike measurements are available as an ACV primary display top line They are also available as a DCV multiple display bot tom line The menu items POSITIVE PEAK and NEGA TIVE PEAK enable the measurement as a primary display See Figure 2 4 for a description of the primary
238. after readings Percentage Enter percentage of stored readings before trigger Reading count Enter count of stored readings before trigger Event Select source for pretrigger event Continuous Store readings in buffer continuously Never Readings are not stored Timestamp Configure timestamp Type Check or change type Relative Time Reference timestamp to relative time Real Time Reference timestamp to real time Format Select timestamp format Absolute Reference each timestamp to the first buffer reading relative or to the time and date real Delta Reference each timestamp to the previous buffer reading Clear all Clear all stored readings and buffer statistics Count Select buffer size Enter count Enter number of readings to store Use trigger model Use finite measure count from trigger model Feed Select type of reading to store After calc Store readings after math calculation Before calc Store readings before math calculation None No readings are placed in the buffer 2 8 1 Burstmode Configuring the unit for burst mode The burst data acquisition mode maximizes the reading rate of the Model 2002 Burst mode consists of two distinct phas es e Acquiring raw readings A D counts e Post processing the raw readings by applying calibra tion constants and storing the resulting readings in the buffer In burst mode the Model 2002 acquires 4 5 digit readings at 2000 readings second The post process
239. age is defined by the following equation v dB 20 l0g 2 VREF where Vis the AC input signal Ver is the specified voltage reference level If the DCV resolution is AUTO and the integration time SET BY RSLN the resolution will be 7 5 digits and the integration time 1 0 PLC For DCV peak spikes low frequency RMS and ACV peak measure ments the integration time setting is ignored 3 For RMS and average measurements if the resolution is AUTO and the integration time is SET BY RSLN the resolution will be 5 5 digits and the integration time 1 0 PLC N The instrument will read OdB when the reference voltage level is applied to the input dB measurements are possible on all ACV measurement types except positive peak spikes and negative peak spikes as these may be negative and the log of a negative number is not defined Note that dB mea Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation surements are specified only for the low frequency RMS measurement type If a relative value is in effect when dB is selected the value is converted to dB If a relative value is stored after dB units are selected the units of the relative value are dB After selecting dB the present reference voltage level is dis played To change the reference level use the cursor keys lt q and and the RANGE A and Y keys Be sure to press ENTER
240. al Standards Institute ANSI states that a shock hazard exists when voltage levels greater than 30V RMS 42 4V peak or 60VDC are present A good safety practice is to expect that hazardous voltage is present in any unknown circuit before measuring Operators of this product must be protected from electric shock at all times The responsible body must ensure that operators are prevented access and or insulated from every connection point In some cases connections must be exposed to potential human contact Product operators in these circumstances must be trained to protect themselves from the risk of electric shock If the circuit is capable of operating at or above 1000V no conductive part of the circuit may be exposed Do not connect switching cards directly to unlimited power circuits They are intended to be used with impedance limited sources NEVER connect switching cards directly to AC mains When connecting sources to switching cards install protective devices to limit fault current and voltage to the card Before operating an instrument ensure that the line cord is connected to a properly grounded power receptacle Inspect the connecting cables test leads and jumpers for possible wear cracks or breaks before each use 11 07 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com When installing equipment where access to the main power cord is restricted such as rack mounting a separate
241. allowing operation to continue on in the Trigger Model See paragraph 3 23 10 to set the date and time for the RTCLock control source A TIMer event is available for the scan and measure layers With TIMer selected for the speci fied layer the event occurs at the beginning of the timer interval and every time it times out For example if the measure layer timer is programmed for a 30 second interval the first pass through the measure layer control source occurs immediately Subsequent scan events will then occur every 30 seconds The interval for the timer is set using the TIMer command PRINT 1 output 16 trig sour imm sour Set measure control source PRINT 1 enter 16 Get response from 2002 TiMer lt n gt ARM SEQ uence 1 LAYer2 TIMer lt n gt Set interval for scan layer timer TRIGger SEQuence 1 TIMer lt n gt Set interval for measure layer timer lt n gt 0 001 to 999999 999 Specify timer interval in seconds DEFault 0 1 second MINimum 0 001 second MAXimum 999999 999 seconds Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Query TIMer Query programmed timer interval TIMer DEFault Query RST default timer interval TIMer MINimum Query lowest allowable timer interval TIMer MAXimum Query largest allowable timer interval Description These commands are used to set the interval for the scan layer and measure layer ti
242. am fragment Parameters Query Description 3 104 AUTO lt b gt ONCE SEN Se 1 CU RRent AC AVERage AUTO lt b gt ONCE Control auto filter for ACI SEN Se 1 CU RRent DC AVERage AUTO lt b gt ONCE Control auto filter for DCI SEN Se 1 VO LTage AC AVERage AUTO lt b gt ONCE Control auto filter for ACV SEN Se 1 VO LTage DC AVERage AUTO lt b gt ONCE Control auto filter for DCV SEN Se 1 RESistance AVERage AUTO lt b gt ONCE Control auto filter for Q2 SEN Se 1 FRESistance AVERage AUTO lt b gt ONCE Control auto filter for Q4 SEN Se 1 TEM Perature AVERage AUTO lt b gt ONCE Control auto filter for TEMP lt b gt 0 or OFF Disable auto filter 1 or ON Enable auto filter ONCE Enable and then disable auto filter AUTO Query state of auto filter These commands are used to control auto filter for the specifed function The configuration for the filter is summarized in tables 2 9 2 14 and 2 19 Disabling auto filter has no effect on the currently programmed filter state and count The ONCE parameter is analogous to a momentary toggle switch When ONCE is sent the auto filter turns on momentarily and then disables Enable auto filter Get response from 2002 PRINT 1 output 16 volt dc aver auto on auto PRINT 1 enter 16 AD Vanced commands NTOLerance lt n gt SEN Se 1 CU RRent AC AVERage AD Vanced NTOLerance lt n gt Specify noise tolerance ACI SEN Se 1 CU R
243. am message syntax Covers the syntax rules for common commands and SCPI commands 3 10 Common commands Covers the IEEE 488 2 com mon commands used by the Model 2002 3 11 SCPI Signal Oriented Measurement Commands Covers the signal oriented commands used by the Model 2002 3 12 3 24 SCPI command subsystems Covers the SCPI commands used by the Model 2002 The IEEE 488 is an instrumentation data bus with hardware and programming standards originally adopted by the IEEE Institute of Electrical and Electronic Engineers in 1975 and given the IEEE 488 designation In 1978 and 1987 the standards were upgraded to IEEE 488 1978 and IEEE 488 1 1987 respectively The Model 2002 conforms to these standards The Model 2002 also conforms to the IEEE 488 2 1987 standard and the SCPI 1991 Standard Commands for Pro grammable Instruments standard IEEE 488 2 defines a syntax for sending data to and from instruments how an instrument interprets this data what registers should exist to record the state of the instrument and a group of common commands The SCPI standard defines a command language protocol It goes one step farther than IEEE 488 2 and defines a standard set of commands to control every pro grammable aspect of an instrument 3 2 IEEE 488 bus connections The Model 2002 can be connected to the IEEE 488 bus through a cable equipped with standard IEEE 488 connec tors an example is shown in Figure 3 1 The connector can be sta
244. amp you must include the READing parameter form elem time read Data elements for the item list can be listed in any order but are always sent in the order shown in Figure 3 18 PRINT 1 output 16 form elem read stat unit elem Specify elements PRINT 1 enter 16 Get response mes sage from 2002 BORDer lt name gt FORMat BORDer lt name gt Specify binary byte order lt name gt NORMal Normal byte order for binary formats SWAPped Reverse byte order for binary formats Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Query Description Program fragment Parameters Query Description Program fragment IEEE 488 Reference BORDer Query byte order This command is used to control the byte order for the IEEE754 binary formats For normal byte order the data format for each element is sent as follows Byte 1 Byte 2 Byte 3 Byte 4 Single precision Byte 1 Byte 2 ove Byte 8 Double precision For reverse byte order the data format for each element is sent as follows Byte 4 Byte 3 Byte 2 Byte 1 Single precision Byte 8 Byte 7 ove Byte 1 Double precision The 0 Header is not affected by this command The Header is always sent at the beginning of the data string for each measurement conversion The ASCII data format can only be sent in the normal byte order The SWAPped selection is simply ignored when the ASCII format is selected
245. an Two Channels Model 2001 SCAN Microsoft QuickBASIC 4 5 Keithley KPC 488 2 Interface 01992 Keithley Instruments Inc Description This program scans and measures two channels of the Model 2001 SCAN Scanner Card Channel 2 is configured for Q2 measurements and channel 4 is configured for RTD temper ature measurements The scan is performed five times for a total of 10 measurements The 10 readings are displayed on the computer CRT Required equipment e Model 2002 Multimeter e Model 2001 SCAN Scanner Card installed in the Model 2002 Program 2001scrd bas CLS FOR I 1 TO 5 CALL SEND 16 form elem read GPIB STATUS CALL SEND 16 sens func RES GPIB STATUSS CALL SEND 16 rout clos 2 GPIB STATUS CALL SEND 16 fetch GPIB STATUSS CALL Enter k2002data Gpib len 16 GPIB STATUS PRINT RES k2002data CALL SEND 16 sens func TEMP GPIB STATUSS SEND 16 rout clos 4 GPIB STATUS CALL SEND 16 fetch GPIB STATUSS CALL Enter k2002data Gpib len 16 GPIB STATUS PRINT TEMP k2002data NEXT I END G 16 e RTD Temperature Sensor connected to channel 4 of the scanner card e Microsoft QuickBASIC 4 5 e Any one of the following IEEE 488 interfaces Keithley Model KPC 488 2 Keithley Model KPC 488 2AT Capital Equipment Corporation PC lt gt 488
246. an zero that depend on the new units are made equal to zero This includes for example relative values and stored readings This avoids the overflow condition of a log of a negative number COUPLING This parameter selects the input coupling for the ACV function AC With AC coupling selected a DC blocking capacitor is placed in series with the input This removes the DC compo nent from the RMS average or peak ACV measurement AC DC When AC DC coupling is selected the blocking capacitor is removed Subsequent RMS average or peak ACV measurements reflect both the AC and DC components of the signal While displaying readings the present coupling setting is shown on the bottom line if not showing a multiple display Note that the coupling settings for ACV and ACI are discrete Thus setting the coupling of ACV has no effect on the cou pling of ACI AC TYPE This parameter selects the measurement type for the ACV function The Model 2002 directly measures RMS average and peak AC voltages For a 330V peak to peak sine wave which is line voltage in the U S the measurements would be e RMS 117V e Average 105V full wave rectified e Peak AC 165V The peak detector is also used to measure positive and nega tive peak spikes riding on a DC signal and they are therefore also configured from the AC TYPE menu RMS and LOW FREQ RMS Selecting between normal RMS mode and low frequency RMS mode depends on the desired
247. and the Model 2002 is addressed to talk the key press code number for the last key pressed either physically or with KEY is sent to the computer 8 15 22 29 5 12 19 26 2 1 Figure 3 39 Key press codes PRINT 1 output 16 syst key 29 Select DCI function SLEEP 3 Wait 3 seconds PRINT 1 output 16 sys key 16 key 16 Select Zero Center Bar Graph SLEEP 3 Wait 3 seconds PRINT 1 output 16 syst key 8 key 8 Return to normal display Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 3 21 10 Description Program fragment 3 21 11 D escription Program fragment 3 21 12 Parameters Query D escription Program fragment 3 21 13 Parameters Query D escription Program fragment IEEE 488 Reference CLEar SYSTem CLEar Clear Error Queue This action command is used to clear the Error Queue of messages PRINT 1 output 16 syst cle Clear Error Queue LFRequency SYSTem LFRequency Query power line frequency This query command is used to read the frequency of the power line that powers the Model 2002 PRINT 1 output 16 syst lfr PRINT 1 enter 16 Query the power lin Get response from 2002 DATE lt yr gt lt mo gt lt day gt SYSTem DATE lt yr gt lt mo gt lt day gt Set date for clock lt yr gt 1993 to 2092 lt mo gt to 12 lt
248. ands are asserted The commands include LAG Listen Address Group These listen commands are derived from an instrument s primary address and are used to address devices to listen The actual command byte is obtained by ORing the primary address with 20 TAG Talk Address Group The talk commands are derived from the primary address by ORing the address with 40 Talk commands are used to address devices to talk IEEE 488 Bus Overview SCG Secondary Command Group Commands in this group provide additional addressing capabilities Many devices including the Model 2002 do not use these commands U naddress commands The two unaddress commands are used by the controller to remove any talkers or listeners from the bus ATN is true when these commands are asserted UNL Unlisten Listeners are placed in the listener idle state by the UNL command UNT Untalk Any previously commanded talkers will be placed in the talker idle state by the UNT command Common commands Common commands are commands that are common to all devices on the bus These commands are designated and defined by the IEEE 488 2 standard Generally these commands are sent as one or more ASCII characters that tell the device to perform a common operation such as reset The IEEE 488 bus treats these commands as data in that ATN is false when the commands are transmitted SC PI commands SCPI commands are commands that are particula
249. anges are made by placing the cursor on the desired chan nel and using the RANGE A and Y keys to select the desired measurement function Table 2 39 CONFIGURE CHANNELS menu structure Front Panel Operation DCV DC volts ACV AC volts Q2W 2 wire ohms QAW 4 wire ohms FRQ Frequency TMP Temperature ALT alternate function see below JN1 JN5 Reference junction type None Q4W function The Q4W function is valid only for chan nels 1 5 for the Model 2001 SCAN and channels 2 5 for the Model 2001 TCSCAN If selected PRD paired will be shown on the corresponding paired channel 6 10 for the Model 2001 SCAN and 7 10 for the Model 2001 TCS CAN Once Q4W is selected for a valid channel changing the assignment to a different function will de assign the paired channel and change the function to none TMP function The TMP function is valid for the same channels as the Q4W function if the temperature sensor is a 4 wire RTD type If a 2 wire RTD type is used channels 6 10 could be assigned to the TMP function but if the sensor type is later changed to a 4 wire RTD any channel from 6 10 will then be set to none Thermocouple TMP mea surements using the Model 2001 TCSCAN can be assigned to channels 2 10 Menu item Description INTERNAL CHANS SET INTERNAL CHANS 1 DCV 2 DCV 3 DCV 4 DCV 5 DCV Defines internal functions Use range and cursor keys to select channels and f
250. anging functions resolu tion or issuing an autozero bus command Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation Table 2 31 Burst mode sequence Action Result Annunciators BURST MODE ON ARM and AUTO off ENTER BURST 00100 READINGS Use A V ENTER EXIT or INFO ENTER 00100 READING BURST Use TRIG to start EXIT to abort TRIG burst readings acquired ARM on post processing of readings on BURST 00100 READINGS Processing rdg xx of 1000 BURST 00100 READINGS ARM and off Storage complete press RECALL BURST 00100 READINGS Use A V ENTER EXIT or INFO RECALL Rdg 00000 Rdg 00099 EXIT BURST 00100 READINGS Use A Y ENTER EXIT or INFO press ENTER to loop back to start EXIT BURST MODE ABORTED ARM and AUTO on Use CONFIG gt STORE to resume normal reading display Notes 1 This table assumes the unit was set for autorange before enabling burst 2 Multiple displays of buffered readings are available when burst data is recalled See paragraph 2 5 4 2 8 2 Configuring data storage The data storage configuration menu is used for the follow ing operations e To acquire a burst of readings at high speed e To select the data types stored in the buffer e To select the buffer control e To clear the buffer of readings and statistics e To specify the number of readings to store e To spe
251. anner card for specific connection information Using an internal scanner card The optional Model 2001 SCAN scanner card allows you to switch or scan up to ten 2 pole channels or five 4 pole chan nels Two of the channels use solid state switching for high speed multiplexing ratio or delta applications The optional Model 2001 TCSCAN Thermocouple General Purpose Scanner Card allows you to multiplex one of nine 2 pole or one of four 4 pole analog signals into the Model 2002 and or any combination of 2 or 4 pole analog signals Refer to the instruction manual for the Model 2001 TCS CAN for complete operation information Front Panel Operation When using these cards the Model 2002 can e Close and open individual channels e Scan through channels using a separate measurement function for each channel if desired e Perform ratio and delta measurements using two user defined channels Using external scanner cards When using external scanning you can define separate mea surement functions for a maximum of 80 channels Note however that you cannot close or open external channels using Model 2002 controls Use the switching mainframe controls to open and close individual channels In order to synchronize Model 2002 measurements with external channel closure connect the Model 2002 external trigger inputs or the trigger link to the external switching mainframe trigger inputs and outputs Refer to paragraphs 2 7 6 a
252. ansitions on the Trigger E vent Register Negative transition effect on Trigger event Trigger Event Register Sequence 1 Sets B1 when leaving the Trigger Layer Effects of negative transitions on the Arm E vent Register Negative transition effect on Arm event Arm Event Register Sequence 1 Sets B1 when leaving an arm layer Effects of negative transitions on the Sequence E vent R egister Negative transition effect on Sequence event Sequence Event Register Layer 1 Sets B1 when leaving arm layer 1 Layer 2 Sets B2 when leaving arm layer 2 PRINT 1 output 16 stat oper ntr 1026 ntr Set Bl and B10 of Operation NIR PRINT 1 enter 16 Get response message from 2002 3 133 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 20 5 Description Program fragment 3 20 6 Description Program fragment 3 134 CO NDition STATus M EA Surement CO N Dition Read Measurement Condition Register STATus Q U EStionable CO NDition Read Questionable Condition Register STATus O PERation CO N Dition Read Operation Condition Register STATus O PERation TRIGger CO N Don Read Trigger Condition Register STATus O PERation ARM CO NDition Read Arm Condition Register STATus O PERation A RM SEQ uence CON Dition Read Sequence Condition Register These query commands are used to read the contents of the condition regist
253. aperture integration rate y NPLCycles lt n gt Set integration rate line cycles 0 01 to 50 1 y 3 18 6 AUTO lt b gt Enable or disable auto NPLC OFF AUTO ONCE Enable and then disable auto NPLC AUTO Query auto line cycle integration NPLCycles Query line cycle integration rate y COUPling ACIDC Specify input coupling AC 3 18 7 COU Pins Query input coupling RANGe Path to configure measurement range y 3 18 8 UPPer lt n gt Select range 0 to 775 715 y UPPer Query range y AUTO lt b gt Enable or disable auto range ON y AUTO ONCE Set range based on present input signal y ULIMit lt n gt Set upper limit for auto range 0 to 775 7715 ULIMit Query upper limit LLIMit lt n gt Set lower limit for auto range 0 to 775 0 2 LLIMit Query lower limit AUTO Query auto range y REFerence lt n gt Specify reference 1100 to 1100 0 y 3 18 9 STATe lt b gt Enable or disable reference OFF y STATe Query state of reference y ACQuire Use input signal as reference REFerence Query reference value y DIGits lt n gt Specify measurement resolution 4 to 9 6 3 18 10 AUTO lt b gt Enable or disable auto resolution ON AUTO ONCE Enable and then disable auto resolution AUTO Query auto resolution DIGits Query resolution AVERage Path to configure and control the filter 3 18 11 TCONtrol lt name gt Select filter type MOVing or REPeat Note 3 TCONtrol Query filter type COU
254. aracter in number EE 123 Exponent too large EE 124 Too many digits EE 128 Numeric data not allowed EE 140 Character data error EE 141 Invalid character data EE 144 Character data too long EE 148 Character data not allowed EE 150 String data error EE 151 Invalid string data EE 154 String too long EE 158 String data not allowed EE 160 Block data error EE 161 Invalid block data EE 168 Block data not allowed EE 170 Expression error EE 171 Invalid expression EE 178 Expression data not allowed EE 200 Execution error EE 201 Invalid while in local EE 202 Settings lost due to rtl EE return to local 210 Trigger error EE 211 Trigger ignored EE 212 Arm ignored EE 213 Init ignored EE 214 Trigger deadlock EE 215 Arm deadlock EE 220 Parameter Error EE 221 Settings conflict EE 222 Parameter data out of range EE 223 Too much data EE 224 Illegal parameter value EE 230 Data corrupt or stale EE 241 Hardware missing EE 260 Expression Error EE 281 Cannot create program EE 282 Ilegal program name EE 314 Save recall memory lost EE 315 Configuration memory lost EE 330 Self Test failed EE 350 Queue overflow EE 410 Query interrupted EE 420 Query unterminated EE 430
255. are used to set or clear the individual bits of the transition filter registers while the PTR and NTR query commands are used to read the registers see paragraph 3 20 for details Reading a transition filter register does not affect its bit pattern The following operations set 1 all bits of all PTR registers and clear 0 all bits of all NTR registers e Cycling power e Sending STATus PRESet 3 7 3 Event registers As shown in the illustrations each status register set has an event register An event register is a latched read only regis ter whose bits are set by the corresponding condition register and transition filter Once a bit in an event register is set it remains set latched until the register is cleared by a specific 3 8 clearing operation The bits of an event register are logically ANDed with the bits of the corresponding enable register and applied to an OR gate The output of the OR gate is applied to another register set or to the Status Byte Register The ESR Common Command is used to read the Standard Event Register see paragraph 3 10 3 All other event regis ters are read using the EVENT query commands in the STATus Subsystem see paragraph 3 20 An event register is cleared when it is read The following operations clear all event registers e Cycling power e Sending CLS 3 7 4 Enable registers As shown in the illustrations each status register set has an enable register An enabl
256. arm layer 1 PTR or that operation has exited from arm layer 1 NTR Bit B2 Layer 2 Lay2 Set bit indicates that instrument operation is in arm layer 2 PTR or that operation has exited from arm layer 2 NTR Bits B3 through B15 Not used Program fragment PRINT 1 output 16 stat meas Query Measure Event Register PRINT 1 enter 16 Get response from 2002 Bit Position B15 B3 B2 Bl BO Event Decimal Weighting 2 21 Value 01 Value 1 Event Bit Set Event Layl Layer 1 0 Event Bit Cleared Lay2 Layer 2 Figure 3 26 Sequence Event Register 3 121 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 20 2 Parameters Query Description Program fragment 3 122 ENABle lt NRf gt STATus M EASurement ENABle lt NRf gt Program Measurement Event Enable Register STATus Q U EStionable ENABle lt NRf gt Program Questionable Event Enable Register STATus O PERation ENABle lt NRf gt Program Operation Event Enable Register STATus O PERation TRIGger ENABle lt NRf gt Program Trigger Event Enable Register STATus O PERation ARM ENABle lt NRf gt Program Arm Event Enable Register STATus O PERation ARM SEQ uence ENABle lt NRf gt Program Sequence Event Enable Register lt NRf gt 0 Clear register lt NRf gt 128 Set bit B7 1 Set bit BO 256 Set bit B8 2 Set bit B1 512
257. asseageabapsectacs sonevenhcessssovabtanascaanstuncsbaaestancectpessvaensunesens Ingger Transition FIET caia nana ici O ces sees dans rae rea pr eE E EE EE E paces E TREERE EEEE EEE ETENEE REE cok Sequence Ree EEN Keypress Cde ironiei areont amenna ire ni ae eeen eea ra AEE EN EEEa EE ege Nee eng IEEE 488 Bus O verview TEEE 488 D S CONTISUEAION tege Eelere Eeer deeg Ee IEEE 488 handshake Sequence cinc NEEN EE ENEE ENEE EENE Command Codes aoro i adriana oir Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com List of Tables 2 Table 2 1 Table 2 2 Table 2 3 Table 2 4 Table 2 5 Table 2 6 Table 2 7 Table 2 8 Table 2 9 Table 2 10 Table 2 11 Table 2 12 Table 2 13 Table 2 14 Table 2 15 Table 2 16 Table 2 17 Table 2 18 Table 2 19 Table 2 20 Table 2 21 Table 2 22 Table 2 23 Table 2 24 Table 2 25 Table 2 26 Table 2 27 Table 2 28 Table 2 29 Table 2 30 Table 2 31 Table 2 32 Table 2 33 Table 2 34 Table 2 35 Table 2 36 Table 2 37 Table 2 38 Table 2 39 Table 2 40 Table 2 41 Table 2 42 Front Panel O peration Data checked On pOwer up escis vesessssessisveissesecccahs EE EEEE Ea E e E URE EEEE ENE E EEE EEE EE E Power Up error MESSASES casino ii de Multiple displays DY TUNCHOT 2 2 05 ccessceasetdisetatssasesecesscsdapstesesnbesveesdcnpcueessdusssigaseepencescseanesssatved Status and error MESSAGES monica cinta REENEN ER WG CONFIGURE
258. at a time Thus for this command the chanlist must consist of only one channel When this command is sent any other closed channel will first open and then the specified channel will close The CLOSe lt list gt query command is used to determine the state closed or not closed of each channel specified by the list parameter For this command the chanlist can consist of multiple channels The following examples demonstrate the various forms for expressing the channel list List 2 Single channel 2 4 6 Multiple channels separated by commas 1 10 Range of channels 1 though 10 Range limits separated by a colon O 1 5 7 Range entry and single entry separated by a comma After sending this query command and addressing the Model 2002 to talk the values for the specified channels are sent to the computer A value of 1 indicates that the channel is closed and a 0 indicates that the channel is not closed PRINT 1 output 16 rout clos 10 clos 10 Close and query chan nel 10 PRINT 1 enter 16 Get response messag from 2002 STATe RO UTe CLO Se STATe Query closed channel This query command is used to determine which if any channel on the Model 2001 SCAN is closed After sending this command and addressing the Model 2002 to talk the channel list is sent to the computer PRI 1 output 16 rout clos stat Query closed channel PRINT 1 enter 16
259. ate Bench reset INIT CONT ON Arm layer Arm source Immediate Arm count 1 Arm trigger control Acceptor Scan layer Scan source Immediate Scan count Infinite Scan trigger control Acceptor Measure layer Measure source TrigLink Trigger link mode Semi synchronous Semi sync line 1 Measure count 10 Measure trigger control Acceptor Indicates that the setting is the BENCH RESET and factory default condition Line 1 Trigger Link 7001 or 7002 Switch System Figure 2 28 Trigger Link connections semi synchronous example 2 62 Trigger Link Cable 8501 Model 7001 or 7002 Idle state Reset INIT CONT OFF Scan list 1 1 1 10 Arm layer Arm spacing Immediate Arm count 1 Arm trigger control Acceptor Scan layer Scan spacing Immediate Number of scans 1 Scan trigger control Acceptor Channel layer Channel spacing TrigLink Trigger link mode Semi synchronous Semi sync line 1 Number of channels Use Scanlist length Channel trigger control Source Indicates that the setting is the RESET and factory default condition To run the test and store the readings in the Model 2002 press STORE on the multimeter enter the desired number of readings ten and press ENTER The Model 2002 waits with the asterisk annunciator lit for a Trigger Link trigger from the Model 7001 7002 Press STEP on the Model 70
260. ated rout open all scan 1 5 lt PMT gt 6 Command execution rules A Commands are executed in the order that they are presented in the program message B An invalid command will generate an error and of course not be executed C Valid commands that precede an invalid command in a multiple command program message will be executed D Valid commands that follow an invalid command in a multiple command program mes sage will be ignored Response messages A response message is the message sent by the instrument to the computer in response to a query command program message 1 Sending a response message After sending a query command the response message is placed in the Output Queue When the Model 2002 is then addressed to talk the response message is sent from the Output Queue to the computer 2 Multiple response messages If you send more than one query command in the same program message see Multiple command messages the multiple response message for all the queries is sent to the computer when the Model 2002 is addressed to talk The responses are sent in the order that the query commands were sent and are separated by semicolons Items within the same query are separated by commas The following example shows 3 27 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference the response message for a program message that contains four single i
261. ation displayed press ENTER RESTORE Use this menu item to return the instrument to a setup that was previously stored see SAVE in memory After selecting RESTORE you will be prompted to enter the memory location number of the setup that you wish to restore Note that 0 is a valid memory location Use the range keys A and W to key in the desired location and press ENTER The instrument will immediately restore that setup configuration POWERON Use this menu item to select the instrument setup that goes into effect on power on The instrument can be set to power on to the factory bench defaults the factory GPIB defaults or to a user setup stored see SAVE at a specific memory location These POW ERON options are explained as follows BENCH Use this option to return the instrument to the bench default conditions see Table 2 42 the next time it is turned on GPIB With this option the unit returns to the GPIB default conditions see Table 2 42 the next time it is turned on USER SETUP NUMBER Using this option the instru ment powers on to a user setup saved at a specific memory location see SAVE After selecting USER SETUP NUMBER you will be prompted to enter the memory location number of the setup that you wish the instrument to power up to Note that 0 is a valid memory location Use the range keys A and V to key in the desired memory location and press ENTER RESET Use this menu option to reset the
262. ay the following menu CONFIGURE CHANNELS INTERNAL CHANS EXTERNAL INPUTS gt a SAVE ALT FCN RESTORE ALT FCN 2 Select INTERNAL CHANS then press ENTER The multimeter will display the following menu SET INTERNAL CHANS 1 DCV 2 DCV 3 DCV 4 DCV 5 DCV gt a 6 DCV 7 DCV 8 DCV 9 DCV_ 10 DCV 3 Using the cursor keys select the desired channel press the right cursor key to display channels 6 through 10 4 Using the range keys select the desired measurement function DCV ACV Q2W Q4W FRQ TMP ALT JN1 JN2 JN3 JN4 JN5 None 5 Repeat steps 3 and 4 for each of the channels you wish to scan Note Select none to omit a channel from the scan list 2 84 6 Examine all ten channels to verify omitted channels and paired PRD channels 7 After selecting all measurement functions press EN TER to return to normal display Step 2 Select internal scan list Use the SCAN OPERATION menu to select the internal scan list as follows 1 Press CONFIG SCAN The Model 2002 will display the following SCAN OPERATION INTERNAL EXTERNAL RATIO DELTA 2 Select INTERNAL then press ENTER Step 3 Start scan After configuring channels and scan list simply press the SCAN key to begin scanning The instrument will prompt you to configure the scan count and scan timer and to enable data storage Pressing the ENTER key will scan through selected channels and make a measurement on each channel using the previously
263. ays enabled and occurs after every device action See Output Triggers for more information Delays The Scan Layer and the Measure Layer have a programmable delay 0 to 999999 999 seconds that is en forced after an event detection Device Action The primary device action is a measure ment However the device action could include a function change and a channel scan if scanner is enabled A channel is scanned closed before a measurement is made When scanning internal channels the previous channel opens and the next channel closes break before make Also included in the device action is the internal settling time delay for the relay Output Triggers In the Arm Layer and Scan Layer the output triggers are enabled only if their respective source by passes are also enabled If a trigger link triglink control source is selected the output trigger pulse is available on the selected TRIGGER LINK output line For all other control 2 45 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation source selections the trigger pulse is available at the METER COMPLETE connector In the Measure Layer the output trigger is always enabled and occurs after every device action If the control source is set for external immediate manual GPIB or timer the out put trigger pulse is available at the METER COMPLETE connector If the trigger link triglink
264. be used to mea sure frequency The upper limit on the voltage terminals is 15MHz on the amps terminals it is 1 MHz The voltage limit is subject to the 2 x 107V Hz product VOLTAGE Specifies the voltage input terminals for fre quency measurements CURRENT Specifies the AMPS input terminals for fre quency measurements COUPLING This parameter selects the input coupling for the frequency function AC With AC coupling selected a DC blocking capacitor is placed in series with the AC measurement circuit This re moves the DC component from the input signal AC DC When AC DC coupling is selected the blocking capacitor is removed Subsequent FREQ measurements re flect both the AC and DC components of the signal Multiple displays There are two multiple displays just for the frequency function e Period calculation e Trigger level The multiple display showing the period of the waveform is calculated from the frequency measurement and as such is only available when the frequency does not equal 0Hz It is also unavailable when math is enabled The trigger level multiple display is the same message that is displayed when the trigger level is changed but it is a perma nent display 2 4 5 Temperature The Model 2002 measures temperature with two different sensor types RTDs and thermocouples With RTDs the Model 2002 can measure temperature between 200 C and 630 C RTDs can be connected to the input termina
265. bit indicates that the Model 2002 has been turned off and turned back on since the last time this register has been read PRINT 1 output 16 esr Query register PRINT 1 enter 16 Get response message from 2002 Event PON JURQ CME EXE DDE QYE Decimal Weighting 128 64 32 16 8 27 26 25 24 23 Kap a Note Bits B8 through B15 are not shown since they are not used Value 1 Event Bit Set Events PON Power On 0 Event Bit Cleared URQ User Request CME Command Error EXE Execution Error DDE Device dependent Error QYE Query Error OPC Operation Complete Figure 3 15 Standard Event Status Register DN identification query Read the identification code The identification code includes the manufacturer model number serial number and firmware revision levels and is sent in the following format KEITHLEY INSTRUMENTS INC MODEL 2002 xxxxxxx yyyyy zzzzz where xxxxxxx is the serial number yyyyy zzzzz is the firmware revision levels of the digital board ROM and display board ROM PRINT 1 output 16 idn Query ID code PRINT 1 enter 16 Get response message from 2002 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 3 10 5 Description Program fragment IEEE 488 Reference OPC operation complete Set the O peration Complete bit in the Standard Event Status Re
266. ble query Read the Service Request Enable Register lt NRf gt 0 Clears enable register 1 Set MSB bit Bit 0 4 Set EAV bit Bit 2 8 Set QSB bit Bit 3 16 Set MAV bit Bit 4 32 Set ESB bit Bit 5 128 Set OSB bit Bit 7 255 Sets all bits The SRE command is used to program the Service Request Enable Register This command is sent with the decimal equivalent of the binary value that determines the desired state 0 or 1 of each bit in the register This register is cleared on power up This enable register is used along with the Status Byte Register to generate service requests SRQ With a bit in the Service Request Enable Register set an SRQ occurs when the corre sponding bit in the Status Byte Register is set by an appropriate event For details on register structure refer to paragraph 3 7 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Program fragment IEEE 488 Reference The Service Request Enable Register is shown in Figure 3 16 Notice that the decimal weight of each bit is included in the illustration The sum of the decimal weights of the bits that you wish to set is the value that is sent with the SRE command For example to set the ESB and MAN bits of the Service Request Enable Register send the following command SSE 34 where ESB bit B5 Decimal 32 MAN bit B4 Decimal 16 lt NRf gt 48 The contents of the Service Request Enable Regi
267. buffer for pre trigger readings DEFault 50 of buffer for pre trigger readings MINimum 0 of buffer for pre trigger readings MAXimum 100 of buffer for pre trigger readings PERCent This command is used to specify how much of the defined buffer POINts will be used to store pre triggered readings When a pre trigger store is started see FEED CONTrol readings are continuously stored in the buffer When the pre trigger event occurs see PRETrig ger SOURce post trigger readings will then fill the part of the buffer that is not reserved for pre trigger readings For example assume 25 of a 100 point buffer is reserved for pre trigger readings When the pre trigger store is started readings continuously fill the buffer When the pre trigger event occurs subsequent readings will then be stored starting at buffer location 26 and continue until buffer location 100 is filled Storage stops after buffer location 100 is filled The result is 25 pre trigger readings and 75 post trigger readings See paragraph 2 8 2 for more information about pre trigger PRINT 1 output 16 trac feed pret amo 25 amo 25 for pre trigger rdgs PRINT 1 enter 16 Get response from 2002 READings lt n gt TRACe FEED PRETrigger AMO unt READings lt n gt Specify number of pre trigger readings No memory option MEM 1 MEM 2 lt n gt 0 to 404 0 to 1381 0 to 5980 Full 0 to 2027 0 to 6909 0 to 29908 Compact MAXimum Present b
268. calculation using scientific notation where necessary Pressing MATH a second time disables the calculation Table 2 37 CONFIGURE MATH menu structure Menu item Description None Select no calculation when MATH key is pressed Polynomial Select polynomial calculation and enter constants Percent Select percent calculation and enter target reference value Percent deviation Select percent deviation calculation NONE With this menu item no math operation goes into effect when the MATH key is pressed The MATH annunciator lights but NONE is displayed on the top line POLYNOMIAL This menu item selects the polynomial calculation and allows you to program the polynomial constants The a2 constant is displayed first You can retain the displayed value or key in a new value In either case press ENTER to display the al constant Retain or change this constant and press ENTER to display the a0 constant If you change the a0 constant be sure to again press ENTER PERCENT This menu item selects the percent calculation and lets you specify the target value If you key in a new target value be sure to press ENTER PERCENT DEVIATION This menu item selects the percent deviation calculation and returns the display to the normal measurement state Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 2 10 5 Calculate multiple display
269. cated at the end of each table e SCPI A checkmark Vv indicates that the command and its parameters are SCPI confirmed An unmarked command indicates that it is non SCPI SCPI confirmed commands that use one or more non SCPI parameters are explained by notes Table 3 4 CALCulate command summary Default Command Description parameter SCPI Ref CALCulate 1 Subsystem to control CALC 1 y 3 12 1 FORMat lt name gt Select math format NONE POLynomial PERCent PERCent y PDEViation POR Mar Query math format y KMATh Path to configure math calculations y MAOFactor lt NRf gt Set a0 for POLynomial 9 999999e20 to 9 999999e20 0 MAOFactor Query a0 factor MA 1 Factor lt NRf gt Set al for POLynomial 9 999999e20 to 9 999999e20 1 MA1Factor Query al factor MA2Factor lt NRf gt Set a2 for POLynomial 9 999e20 to 9 999e20 0 MA2Factor Query a2 factor PERCent lt NRf gt Set PERCENT 9 999999e35 to 9 999999e35 1 PERCent Query PERCENT STATS lt b gt Enable or disable calculation 0 y STATe Query state of math function y DATA Path to read math result of CALC1 y LATest Return the last math of CALC1 y FRESh Return a new fresh math result of CALC1 y IMMediate Recalculate input data y CAL Culate2 Subsystem to control CALC 2 y 3 12 2 FORMat lt name gt Select math format MEAN SDEViation MAXimum NONE y MINimum PKPK or NONE
270. cation exchange between all the devices and is known as the con troller Supervision by the controller consists of determining which device will talk and which device will listen As a talker a device will output information and as a listener a device will receive information To simplify the task of keep ing track of the devices a unique address number is assigned to each one On the bus only one device can talk at a time and is addressed to talk by the controller The device that is talking is known as the active talker The devices that need to listen to the talker are addressed to listen by the controller Each listener is then referred to as an active listener Devices that do not need to listen are instructed to unlisten The reason for the unlisten instruction is to optimize the speed of bus infor mation transfer since the task of listening takes up bus time Through the use of control lines a handshake sequence takes place in the transfer process of information from a talker to a listener This handshake sequence helps ensure the credibility of the information transfer The basic handshake sequence between an active controller talker and a listener is as follows 1 The listener indicates that it is ready to listen 2 The talker places the byte of data on the bus and indi cates that the data is available to the listener 3 The listener aware that the data is available accepts the data and then indicates that the data ha
271. ce value Set A4 coefficient Set B4 coefficient Set A7 coefficient Set B7 coefficient Set C7 coefficient Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Description Example 3 18 19 Parameters IEEE 488 Reference These commands program the various parameters for SPRTD Standard Platinum Resistance Thermometers A single SPRTD however usually cannot be used to cover the entire range so the temperature range is broken up into several subranges An SPRTD is supplied with a certif icate of calibration that lists the calibration constants and the temperature range supported In most cases the supplied coefficients must be translated into Model 2002 values as summarized in the table below See paragraph 2 4 5 in Section 2 for more information Coefficients RTD coefficients to M odel 2002 coefficients Subrange 1 13 8033K 273 16K Not applicable Subrange 2 24 5561K 273 16K A2 to A4 B2 to B4 Subrange 3 54 3584K 273 16K A3 to A4 B3 to B4 Subrange 4 83 8058K 273 16K No substitution needed Subrange 5 234 3156K 302 9146K A5 to A4 A5 to A7 B5 to B4 B5 to B7 Set C7 0 A5 value entered for both A4 and A7 B5 value entered for both B4 and B7 Subrange 6 273 15K 1234 93K Not applicable Subrange 7 273 15K 933 473K No substitution needed Subrange 8 273 15K 692 677K AS to A7 B8 to B7 Set C7 0 Subrange 9 273 15K 505 078K A9 to A7 B9 to B7
272. ceeeeeeeeeeeeeseecaeeacecaecaeecaessaeaeeeeaeens 2 wire RTD temperature MeasureMents eeeceseeceeeceeeecesseceececeseeeneeceeeecseceeaeeneeesaeceeeecsaeeeaeeeeneesss Temperature equations s52c50h evecesshicses asssebiescdatesancesin nevscsedstoensced decsansiueusedaessviesb aeseaicoasesennscvensteeneses Trigger model front panel Operation 2 02 ccceceeeseeeesceesecsceeseceeceaeceeceseeeeceseeseceseeeeeeseeeeeeaeseneeaeeeeeaees External triggering connectors BNC csscscssescs scascsesnessnssteases DEENEN ENEE SEENEN eebe External triggering and asynchronous trigger link input pulse specifications Meter complete and asynchronous trigger link output pulse specifications DUT test SM ono ss External HOESER ion EES tenes dende Trigger link CONDEC LS umi lts il KIEREN E Trigger Link connections asynchronous example 1 Operation model for asynchronous trigger link example 3 Connections using Trigger Link adapter s sic ccccccsvescssssses sescssnviesssenseevscebentssnsecesoesesvscnsvbastenstturdesvesdbeaes DUT test system asynchronous example 2 Trigger Link connections asynchronous example A7 Operation model for asynchronous Trigger Link example 2 0 00 0 eee eeeeeeseeeeeeeeeeeceseeeeeeaeeeeeenees Semi synchronous Trigger Link specifications Typical semi synchronous mode connections Trigger Link connections semi synchronous example cesses ceeceseeeeeeseeeeeeeeeeeeeaeeeeetaeeeeeeaees Operation mode for semi synchronous Trigg
273. cify the source of readings to be stored The buffer is configured from the CONFIG DATA STORE menu see Table 2 29 This menu is displayed by pressing CONFIG and then STORE Rules for navigating menu struc tures are provided in paragraph 2 3 4 BURST MODE The burst mode is discussed in paragraph 2 8 1 DATA GROUP This menu selection chooses the data items that are stored in the buffer Note that changing the data grouping clears the buffer FULL With this selection for each reading the following information is stored units channel number if applicable reading number time stamp and status overflow 2 67 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation The full data group should be used for 6 5 digits or greater resolution It also allows you to change function range or channel while storing COMPACT With this selection readings units reading numbers and status overflow are stored This allows more readings to be stored in the buffer Compact is only accurate and displayed to 5 5 digits It does not allow changes of function range or channel while storing CONTROL This menu item controls the type of data storage FILL AND STOP This control selection fills the buffer with the requested number of readings and stops You can then recall the readings PRETRIGGER This selection continuously stores rea
274. ckBASIC and the user library are in the same DOS directory enter the following command line from the DOS prompt QB L ieeegb qlb The above command line will load QuickBASIC and the user library Init as system controller IT Measure DCV Display reading Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Measure and Display Reading READ Command Microsoft QuickBASIC 4 5 Keithley KPC 488 2 Interface 1992 Keithley Instruments Inc Description Every time this program is run the Model 2002 goes to the DCV range and makes a single measurement using the READ command The reading is then displayed on the computer CRT Required equipment e Model 2002 Multimeter e Microsoft QuickBASIC 4 5 Program 2002rdg bas k2002data SPACES 35 CALL Initialize 21 0 Setup 2002 measurement mod Example Programs e Any one of the following IEEE 488 interfaces Keithley Model KPC 488 2 Keithley Model KPC 488 2AT Capital Equipment Corporation PC lt gt 488 The program assumes that the Model 2002 is set to address 16 Loading user library The user library for QuickBASIC 4 5 is provided with the TIEEE 488 interface ieeeqb qlb Assuming QuickBASIC and the user library are in the same DOS directory enter the following command line from the DOS prompt OB L ieeegb qlb The above command lin
275. cked to allow a number of parallel connections to one instrument Two screws are located on each connector to ensure that connections remain secure Current standards call for metric threads which are identified with dark colored screws Earlier versions had different screws which were sil ver colored Do not attempt to use these type of connectors on the instrument which is designed for metric threads Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 3 1 TestEquipmentDepot com IEEE 488 Reference Figure 3 1 IEEE 488 connector A typical connecting scheme for a multi unit test system is shown in Figure 3 2 Although any number of connectors could theoretically be stacked on one instrument it is recom mended that you stack no more than three connectors on any one unit to avoid possible mechanical damage NOTE In order to minimize interference caused by electromagnetic radiation it is recom mended that only shielded TEEE 488 cables be used The Models 7007 1 and 7007 2 shielded IEEE 488 cables are available from Keithley Instrument Instrument Instrument Controller Figure 3 2 IEEE 488 connections Connect the Model 2002 to the IEEE 488 bus as follows 1 Line up the cable connector with the connector located on the rear panel The connector is designed so that it 3 2 will fit only one way Figure 3 3 shows the location of the IEEE 488 connector on the instrumen
276. cking capacitor is removed Subsequent measurements reflect both the AC and DC components of the signal AC DC Select AC DC for ACI Get response from 2002 PRINT 1 output 16 curr ac coup dc coup PRINT 1 enter 16 Set measurement range for ACI Set measurement range for DCI Set measurement range for ACV Set measurement range for DCV Set measurement range for Q2 Set measurement range for Q4 3 18 8 RANGe commands U PPer lt n gt SEN Se 1 CU RRent AC RAN Ge UPPer lt n gt SEN Se 1 CU RRent DC RANGe U PPer lt n gt SEN Se 1 VO LTage AC RAN Ge U PPer lt n gt SEN Se 1 VO LTage DC RANGel UPPer lt n gt SEN Se 1 RESistance RAN Ge U PPer lt n gt SEN Se 1 FRESistance RAN Ge U PPer lt n gt Parameters lt n gt 0to2 1 Expected reading in amps ACI and DCT 0 to 775 Expected reading in AC volts ACV 0 to 1100 Expected reading in DC volts DCV Oto 1 05e9 Expected reading in ohms Q2 0 to 2 le6 Expected reading in ohms Q4 DEFault 2 1 ACI and DCI 775 ACV 1100 DCV 1 05e9 Q2 2 1e6 94 MINimum 0 All functions MAXimum Same as DEFault Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Query Description Program fragment Parameters Query Description Program fragment IEEE 488 Reference RANGe UPPer Query ACI measurement range RANGe UPPer DEFault Query RST default range
277. command is used to clear reset to 0 the bits of the following registers in the Model Program fragment 2002 Standard Event Status Register Operation Event Register Error Queue Trigger Event Register Sequence Event Register Arm Event Status Register Measurement Event Register Questionable Event Register This command also forces the instrument into the operation complete command idle state and operation complete query idle state PRINT 1 output 16 CLS Clear registers and Error Queue 3 29 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 10 2 Parameters Description Program fragment ESE lt NRf gt event enable program the Standard Event Enable Register ESE event enable query Read the Standard Event Enable Register lt NRf gt 0 Clear register 1 Set OPC BO 4 Set QYE B2 8 Set DDE B3 16 Set EXE B4 32 Set CME B5 64 Set URQ B6 128 Set PON B7 255 Set all bits The ESE command is used to program the Standard Event Enable Register This command is sent with the decimal equivalent of the binary value that determines the desired state 0 or 1 of the bits in the register This register is cleared on power up This register is used as a mask for the Standard Event Status Register When a standard event is masked the occurrence of that event will not set the Event Summary Bit ESB in the Status Byte R
278. control source is selected output trigger action occurs on the selected TRIG GER LINK output line as follows e If the asynchronous Trigger Link mode is selected the output trigger pulse is available on the programmed output line e If the semi synchronous Trigger Link mode is selected and the source bypass is disabled the Trigger Link line is released goes high e If the semi synchronous Trigger Link mode is selected and the source bypass is enabled the Trigger Link line is pulled down low and then released Counters All three layers use programmable counters which allow operation to return to or stay in the respective layer For example programming the Measure Layer counter for infinity keeps operation in the Measure Layer After each device action and subsequent output trigger operation loops back to the Trigger Layer control source A counter resets when operation loops back to a higher layer or idle 2 7 2 Configuring the measure layer The measure layer is used for the following operations To select the measuring event SOURCE for the instru ment e To delay operation in the measure layer e To designate the number of measurements the instru ment will make COUNT e To enable or disable the Source Bypass The measure layer is configured from the MEASURE item of the CONFIGURE TRIGGER menu which is displayed by pressing the CONFIG key and then the TRIG key Gener al rules for navigating through the menu
279. cquisition mode disables autozero This type of measurement requires an autozero refresh once every 24 hours by performing one of the following e Change the display resolution e Change the measurement function The options for AUTOZERO are as follows DISABLE Disables autozero NORMAL Enables normal autozero e SYNCHRONOUS Enables synchronous autozero Changing autozero halts triggers and puts the instrument into the idle state Use the TRIG key to re arm triggers TIMESTAMP A timestamp is available for readings sent over the bus and for readings stored in the buffer This GENERAL menu selection is used to configure the timestamp for readings sent over the IEEE 488 bus From the front panel readings are sent over the bus via the GPIB selection of the MAIN MENU see paragraph 2 12 2 See paragraph 2 8 2 to configure the timestamp for buffer readings Specifically this selection is used to perform the following operations e Select the type of timestamp relative or real time e Reset the relative timestamp to zero e Reset the reading number to zero Timestamp and the reading number are only included with each reading if they are selected as GPIB data elements see paragraph 2 12 2 Figure 3 18 shows how the timestamp and reading number is included with each reading The menu items for TIMESTAMP are explained as follows TY PE This item is used to check or change timestamp type Note that changing
280. d ings until a user programmed trigger event occurs It then stores post trigger readings For example with a buffer size of 100 readings there will be 50 readings stored before the trigger event and 50 readings stored after the trigger The first reading after the trigger is reading zero Pretrigger readings have reading numbers and relative time stamps with a minus sign post trigger readings have reading num bers and relative time stamps with a plus sign After selecting PRETRIGGER configure pretrigger control further as follows e PERCENTAGE or READING COUNT Specify the number of readings to store before the trigger event as a percentage of the total number of stored readings or as a number of pretrigger readings You will be prompted to enter the percentage or count value e EVENT Selects the source of the pretrigger or mark point event This can be a Manual GPIB Trig ger Link or External trigger CONTINUOUS With this control selection readings are always stored in the buffer The process continues with the oldest readings being overwritten in a circular manner until storage is interrupted with the EXIT key NEVER Gets set to this if data storage has been interrupted Pressing the STORE key changes NEVER to FILL AND STOP 2 68 CLEAR ALL This action can be used at any time to clear the data buffer of all stored readings and buffer statistics Since the MEM1 and MEM2 memory options are non volat
281. d no CALC 1 calculation is performed With one of the other formats selected and CALC 1 enabled see STATe the result of the calculation is displayed The calculated reading is refreshed every time the instrument takes a reading Select percent and query PRINT 1 output 16 calc form perc form format PRINT 1 enter 16 Get response message from 2002 KMATh commands MAOFactor lt NRf gt CALCulate 1 KM ATh MAOFactor lt NRf gt Specify a0 factor lt NRf gt 9 999999e30 to 9 999999e30 MAOFactor Query a0 factor This command is used to define the a0 factor for the polynomial calculation Set a0 and query Get response from 2002 PRINT 1 output 16 calc kmat ma0f 6 ma0f PRINT 1 enter 16 MAl1Factor lt NRf gt CALCulate 1 KMATh MA1Factor lt NRf gt Specify al factor lt NRf gt 9 999999e20 to 9 999999e20 MAIFactor Query al factor 3 67 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Description Program fragment Parameters Query Description Program fragment Parameters Query Description Program fragment Parameters Query Description Program fragment Description 3 68 This command is used to specify the al factor for the polynomial calculation PRINT 1 output 16 calc kmat malf 4 malf PRINT 1
282. d 5 5d RMS average 0 01 to lt 0 02 PLC 4 5d 0 02 to lt 10 00 PLC 5 5d 10 00 to 50 PLC 6 5d Notes 1 For normal DC current if the resolution is AUTO and the integration time is SET BY RSLN the resolution will be 6 5 digits and the integra tion time 1 0 PLC 2 For DC in circuit current the integration time setting is ignored 3 For AC current if the resolution is AUTO and the integration time is SET BY RSLN the resolution will be 5 5 digits and the integration time 1 0 PLC IN CIRCUIT In circuit current is a calculation based on a 4 wire resistance measurement and a voltage measurement It is similar to an offset compensated ohms measurement Model 2002 Cc 00 207 ADC ICkt Trace resistance 1 0000Q 2002 MULTIMETER 000 000000jA Q RANGE v ly CKT lsource 7 Basen where Isource LOMA Figure 2 7 DC in circuit current measurements 2 26 Caution Maximum Input 200mV on The current in a low resistance conductor e g a printed circuit trace can be measured without breaking the current path The Model 2002 can do this with a pair of Kelvin test probes across the conductor See Figure 2 7 The method follows 1 Using one set of the Kelvin probe tips the instrument sources a known current Isource through the conductor and simultaneously measures the resulting voltage Vmeasi With the other set of probe tips VMEASI z Uu cr Tsource trace or VMEAS 1 R 3 Zeie
283. de Tea 5 C 200 yA 210 00000 10 pA 0 25 V 50 6 275 25 350 25 500 25 50 5 2mA 2 1000000 100 pA 0 3 V 50 5 275 20 350 20 500 20 50 5 20 mA 21 000000 1nA 0 35 V 50 5 275 20 350 20 500 20 50 5 200 mA 210 00000 10 nA 0 35 V 75 5 300 20 375 20 525 20 50 5 2A 2 1000000 100 nA 11 V 350 5 600 20 750 20 1000 20 50 5 DC Current Uncertainty ppm reading x measured value ppm of range x range used 1 000 000 Accuracy ppm accuracy 10 000 5ppm of Range 10 counts at 6 digits DCI READING RATES PLC Power Line Cycles DFILT Digital Filter KEITHLEY FACTORY CALIBRATION UNCERTAINTY Range ppm of reading 200 yA 43 2 mA 40 20 mA 55 200 mA 162 2A 129 38 Actual maximum burden voltage maximum burden voltage x I MEASURED I FULL SCALE Specifications are for 1 power line cycle autozero on 10 reading repeat digital filter For Tea 1 C following 55 minute warm up Toa is ambient temperature at calibration 23 C at the factory For Tea 5 C following 55 minute warm up Specifications are subject to change without notice Page 8 of 14 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Readings Second with Measurement Default Readings Second to Me
284. de the com Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference mands in the long form version However the short form version is indicated by upper case characters Examples SYSTem PRESet Long form SYST PRES Short form SYSTem PRES Long and short form combination Note that each command word must be in long form or short form and not something in between For example SYSTe PRESe is illegal and will generate an error The command will not be executed Short form rules The following rules can be used to determine the short form version of any SCPI command A Ifthe length of the command word is four letters or less there is no short form version Example auto auto B The following rules apply to command words that exceed four letters a Ifthe fourth letter of the command word is a vowel delete it and all the letters after it Example immediate imm Rule exception The short form version of the following command uses only the first two letters of the word TCouple e b If the fourth letter of the command word is a consonant retain it but drop all the letters after it Example output outp C If there is a question mark query or a non optional number included in the com mand word it must be included in the short form version Examples delay dell layer2 lay2 D As previously explained command words
285. diately EXTERNAL Use external triggers to control measuring MANUAL Use TRIG key to control measuring GPIB Use bus triggers to control measuring TRIGLINK Use Trigger Link triggers to control measuring Enter Trigger Link mode and lines TIMER Use a timer to control measuring and enter interval between triggers 0 001 999999 999sec HOLD Use to hold up the measurement in the measure layer DELAY Use to delay measurement in the measure layer 0 001 999999 999sec COUNT Define number of measurements to make INFINITE Repeat measuring indefinitely ENTER CHAN COUNT Count use defined value 1 99999 CONTROL Select trigger control mode SOURCE Enable Source Bypass ACCEPTOR Disable Source Bypass SCAN Scan layer menu SOURCE Select scan source IMMEDIATE Use to pass operation immediately into the measure layer EXTERNAL Use external triggers to control scanning MANUAL Use TRIG key to control scanning GPIB Use bus triggers to control scanning TRIGLINK Use Trigger Link triggers to control scanning Enter Trigger Link lines TIMER Use a timer to control scanning and enter interval between scans 0 001 999999 999sec HOLD Use to hold up the measurement in the scan layer DELAY Use to delay scan in the scan layer 0 001 999999 999sec COUNT Define number of scans to be performed INFINITE Repeat scanning indefinitely ENTER SCAN COUNT Count user defined value 1 99999 CONTROL Select trigger control mode SOURCE Enable Source Bypass
286. disable the CALC 2 calculation When enabled the selected CALC 2 format will be calculated when the MMediate or MMediate command is executed PRI 1 output 16 calc2 stat on stat Enable CALC 2 and query PRINT 1 enter 16 Get response message from 2002 IMMediate CALCulate2 IM M ediate Perform CALC 2 IMMediate Perform calculation and read result equivalent to CALCulate2 IMMediate DATA The MMediate command is used to perform the selected CALC 2 operation on the readings in the buffer assuming CALC 2 is enabled see STATe After performing the calculation the re sult can be read by using the CALCulate2 DATA query command Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Program fragment Description Program fragment 3 12 3 Parameters Query Description IEEE 488 Reference An alternate way to perform the calculation and read the result is by using the query form of the command MMediate When this command is sent the calculation is performed and the result is queried This example assumes that there are readings stored in the buffer and CALC 2 is enabled PRINT 1 output 16 calc2 form max Select MAX format PRINT 1 output 16 calc2 imm Perform math and query result PRINT 1 enter 16 Get response message from 2002 DATA CALCulate2 D ATA Read CALC 2 result Thi
287. display After selecting a positive or negative peak spikes measure ment from the SET ACV MEASUREMENT menu you are asked to enter a value for the measurement window A typical message follows PEAK WINDOW 0 1 s This sets the time the signal is sampled before the display is updated with a new reading It can range from 0 1sec to 9 9sec As a primary display the resolution of peak spikes can be set from 3 5d to 8 5d but the accuracy is specified at 3 5d As a multiple display the resolution is fixed at 3 5d Front Panel Operation Note that dB and dBm are not allowed as valid units for peak spikes Positive going spikes on a negative DC level could still read as a negative value and the log of a negative num ber is not defined RANGE Set by ACV range auto or fixed REL Operates normally SPEED Set by peak window 0 1 9 9sec FILTER Set by ACV filter AUTO ADV 10 RESOLUTION Set by ACV resolution AUTO 3 5d UNITS Fixed on volts COUPLING Set by ACV coupling 000 0 mVAC Coupling AC DC NOTES 1 Positive peak spikes and negative peak spikes are selected in the CONFIGURE ACV menu 2 Peak spikes measurement is specified for volts at 3 5 digits 3 Peak window is the time a signal is sampled before a reading is displayed Figure 2 4 Positive and negative peak spikes Multiple displays The displays for DC and AC voltage that show multiple func tions are shown in Fig
288. dition Notice that the Model 2002 is reset to BENCH defaults With this selection the multimeter stays armed Since the arm source and scan source are set to Immediate the Model 2002 waits in the measure layer for a trigger With the Channel Trigger Control of the Model 7001 7002 set for Source scan operation initially bypasses the need for Front Panel Operation a Trigger Link trigger to close the first channel Since arm spacing and scan spacing are set to Immediate the scan starts as soon as the scanner is taken out of the idle state by press ing the STEP key To run the test and store the readings in the Model 2002 press STORE on the multimeter enter the desired number of readings ten and press ENTER The Model 2002 waits with the asterisk annunciator lit for a Trigger Link trigger from the Model 7001 7002 Press STEP on the Model 7001 7002 to start the scan The scanner s output pulse triggers the Model 2002 to take a reading store it and send a trigger pulse The following ex planation on operation is referenced to the operation model shown in Figure 2 21 A The BENCH RESET condition arms the Model 2002 and places multimeter operation at point A in the flowchart where it is waiting for a Trigger Link trigger Note that since both the arm layer and scan layer are programmed for Imme diate Source operation immediately drops down to the mea sure layer at point A Pressing STEP takes the Model 7001 7002 o
289. e Power up and STATus PRESet sets all bits of the registers Power up and STATus PRESet clears all bits of the registers Power up and CLS Clears the Error Queue STATus PRESet No effect 7 Enable Disable Error Queue Messages Power up Clears list of messages CLS and STATus PRESet No effect Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 3 61 IEEE 488 Reference Table 3 13 SYSTem command summary Default Command D escription parameter SCPI Ref SYSTem PRESet Return to SYST PRES defaults y 3 21 1 POSetup lt name gt Select power on setup RST PRESet or SAVO SAV9 3 21 2 POSetup Query power on setup FRS Witch Query INPUTS switch 0 rear 1 front 3 21 3 VERSion Query rev level of SCPI standard y 3 21 4 ERRor Query read Error Queue Note y 3 21 5 AZERo Path to set up autozero 3 21 6 TYPE lt name gt Select autozero mode NORMal or SYNChronous SYNC TYPE Query autozero mode STATe lt b gt Enable or disable autozero ON STATe Query autozero AMEThod lt name gt Select reading acquisition method BURSt NOR Mal NORMal 3 21 7 ASTReam or SSTReam AMEThod Query acquisition method LSYNCc Path to control line synchronization of measurements 3 21 8 STATe lt b gt Enable or disable line sync OFF STATe Query line sync KEN lt NRf gt Simulate key press 1 to 31 see Figure 3 39 y 3
290. e SETACV Purpose Format Parameter HP3458A Emulation Mode lt mask gt Decimal weight Bit number Enabled condition 4 2 SRQ command executed 8 3 Power on SRQ 32 5 Error consult the error register 64 6 Service Requested cannot disable this bit 128 7 Data available 0 ROS Returns the weighted sum of all enabled status register bits The ROS command enables one or more bits in the status register When an enabled condition occurs the SRQ line is asserted All other conditions and bits are not supported and thus are always O To enable multiple bits add up the individual bit weights The SRQ command must be sent to enable SRQ ROS 32 SRQ on error ROS 160 SRQ on error and data available To recall an instrument configuration from memory RSTATE lt state gt lt state gt Memory option Valid lt state gt parameters No extended memory SAVO 2002 MEM 1 installed SAVO SAV4 2002 MEM2 installed SAVO SAV9 SAVO The RSTATE command recalls a stored state from memory and configures the multimeter for that state These states are saved by the SSTATE command Note that the number of valid saved states depends on the amount of installed memory as indicated above RSTATE SAVO Recall state 0 To select the RMS conversion technique used for AC and AC DC measurements SETACV lt type gt lt type gt Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipm
291. e buffer while waiting for the pre trigger source event With EXTernal source selected an external trigger via the rear panel EXTERNAL TRIGGER Input provides the pre trigger event With TLINk selected an input trigger via the Trigger Link provides the pre trigger event The Trigger Link line used for the input trigger is programmed from the Trigger subsystem see TRIGger TCONfigure command path With BUS selected a GPIB bus trigger GET or TRG provides the pre trigger event With MANual selected pressing the front panel TRIG key provides the pre trigger event PRINT 1 output 16 trac feed pret sour bus sour Select bus pre trig ger PRINT 1 enter 16 Get response from 2002 CONTrol lt name gt TRACe FEED CON Trol lt name gt Specify buffer control lt name gt NEVer Disables buffer storage NEXT Fills buffer and stops ALWays Continuously stores readings in buffer PRETrigger Use Pretrigger mode to store readings CONTrol Query buffer control Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Description Program fragment 3 22 6 D escription Program fragment 3 22 7 Parameters Query D escription Program fragment IEEE 488 Reference This command is used to select the buffer control With NEVer selected storage into the buffer is disabled After cycling power NEVer is selected With any of the other selections st
292. e dis played as follows 1 0000e 04uAAC Range 200 uAAC Coupling AC Note that the value is not 10000 but 10000u which equals 0 01 With the calculate multiple display selected as described in paragraph 3 10 5 the display would be 1 0000e 04uA AC Reading 100 000 where the bottom line shows the reading in the units and multiplier prefix of the top line before the percentage calcu lation is performed 2 10 3 Percent deviation The following math calculation provides the percent devia tion between the normal display reading and the currently stored REL value for the selected function PD D 100 where X is the normal display reading Y is the REL value for the selected function PD is the displayed result percent deviation Percent Deviation is enabled through the CONFIGURE MATH menu see paragraph 2 10 4 Note that Percent Deviation does not scale based on the m k or M range factor For example 10 deviation on the 20kQ range will be displayed as 10 00000 If the number is too large for the allowed number of leading zeroes for example 10 on the 2kQ range the display will switch to 7 1 2 digit scientific notation 2 76 2 10 4 Selecting and configuring math The polynomial percent or percent deviation calculation is selected and configured from the CONFIGURE MATH menu see Table 2 37 The selected calculation is enabled by pressing the MATH key The Model 2002 then displays the result of the
293. e function specified for the first channel and then close the channel and take a reading When the next trigger 1s received the instrument will open the present channel change to the specified measuring function for the next chan Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com nel and then close the channel and take a reading The pro cess repeats until all channels in the list are scanned The instrument defaults to this selection if it detects a scan ner card on power up Table 2 40 SCAN OPERATION menu structure Menu item Description INTERNAL Enables internal scanning EXTERNAL Enables external scanning RATIO Enables ratio mode internal MEASURE Selects measure channel REFERENCE Selects reference channel FUNCTION Selects ratio function DELTA Enables delta mode inter MEASURE nal REFERENCE Selects measure channel FUNCTION Selects reference channel Selects delta function EXTERNAL This menu selection enables scanning with an external scan ner card located in a switching mainframe This selection operates in a manner similar to INTERNAL except that the internal scanner is not used When this menu item is selected the instrument will immediately change to the selected mea suring function for the first channel When the multimeter is triggered it will take a measurement and then change to the measurement function for the next channel Th
294. e of range 1 From a voltage current or resistance function press CONFIG and then NEXT or PREV DISPLAY The fol lowing is displayed ZERO BARGRAPH 50 00 2 Change the percentage by using the cursor keys and the RANGE A and Y keys to enter a numeric value 0 01 99 99 Press ENTER when done The same percent age of range is used for voltage current and resistance measurements Perform the following to view or change the plus and minus value limit 1 From the frequency or temperature function press CONFIG and then NEXT or PREV DISPLAY The fol lowing menu is displayed BARGRAPH TYPE ZERO AT LEFT ZERO CENTERED 2 Use the cursor keys lt q and Pp to place the cursor on ZERO CENTERED and press ENTER You will access one of the following menus For frequency FREQ ZEROBARGRAPH 1Hz 10Hz 100Hz 1kHz 10kHz lt q 100kKHz 1MHz 10MHz 15MHz For temperature ZERO BARGRAPH 0002 C 3 Change the frequency limits by highlighting one of the selections and pressing ENTER For the temperature use the cursor keys and the RANGE A and Y keys to enter a numeric value 0 9999 C Press ENTER when done Maximum and minimum The maximum and minimum multiple display shows the maximum and minimum readings since the display was en tered See Figure 2 3 The maximum and minimum values are reset by the following Front Panel Operation e Pressing the present function key e Leaving the display by changing
295. e read ing number resets to zero when the instrument is turned on or when this action command is asserted Program fragment PRINT 1 output 16 syst rnum res Reset reading number 3 146 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 22 TRACe subsystem 3 22 1 Description Program fragment 3 22 2 Description Program fragment 3 22 3 Parameters Query Description Program fragment The commands in this subsystem are used to configure and control data storage into the buffer The commands are summarized in Table 3 14 See paragraph 2 8 for more information about the buffer TRACe DATA The bar l indicates that TRACe or DATA can be used as the root command for this subsystem From this point on the documentation in this manual uses TRACe If you prefer to use DATA simply replace all the TRACe command words with DATA CLEar TRACe CLEar Clear buffer This action command is used to clear the buffer of readings If you do not clear the buffer a subsequent store will overwrite the old readings If the subsequent store is aborted before the buffer becomes full you could end up with some old readings still in the buffer PRINT 1 output 16 trac clear Clear buffer FREE TRACe FREE Read status of memory This command is used to read the status of storage memory After sending this command and
296. e register is programmed by the user and serves as a mask for the corresponding event register An event bit is masked when the corresponding bit in the enable register is cleared 0 When masked a set bit in an event reg ister cannot set a bit in a following register set or in the Status Byte Register 1 AND 0 0 To use the Status Byte Register to detect events i e serial poll you must unmask the events by setting 1 the appro priate bits of the enable registers The Standard Event Status Enable Register is programmed and queried using the ESE and ESE Common Com mands respectively see paragraph 3 10 2 All other enable registers are programmed and queried using the ENABle and ENABle commands in the STATus Subsystem see paragraph 3 20 An enable register is not cleared when it is read The Enable registers are affected by the following operations e Cycling power Clears all enable registers e STATus PRESet clears the following enable registers Operation Event Enable Register Questionable Event Enable Register Measurement Event Enable Register e STATus PRESet sets all bits of the following enable registers Trigger Event Enable Register Arm Event Enable Register Sequence Event Enable Register e ESE 0 Clears the Standard Event Status Enable Register Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference opc Standard Ev
297. e relative timestamp operates as a timer that starts at zero seconds when the instrument is turned on or when the relative timestamp is reset SYSTem TSTamp RELative RESet The timestamp for each reading sent over the bus is referenced in seconds to the start time After 99 999 999999 seconds the timer resets back to zero and starts over Timestamp is also available for buffer readings Timestamp can be referenced to the first reading stored in the buffer absolute format which is timestamped at 0 seconds or can provide the time between each reading delta format The TRACe TSTamp FORMat command is used to select the absolute or delta format For the delta format real time timestamp is expressed as the days hours minutes and seconds between each reading while the relative timestamp is expressed as seconds between each reading When using the absolute format for the relative timestamp any pre trigger readings will have a negative timestamp STATus This element indicates if the reading is normal N overflowed O or referenced R to another value This element is not available for the binary formats The ASCII format shown in Figure 3 18 shows the byte order of the data string Keep in mind that the byte order can only be reversed for the binary formats When using this command to add an element you must include all elements that you want in the format For example if the reading is already specified and you want to add the time st
298. e will load QuickBASIC and the user library Init as system controller CLS CALL SETOUTPUTEOS 10 0 CALL SETINPUTEOS 10 CALL SEND 16 init cont off gpib status Disable continuous initiation CALL SEND 16 sens func volt dc gpib status Select DCV CALL SEND 16 sens volt dc dig 8 gpib status Select 7 1 2 digit resolution k2001data SPACES 255 CALL SEND 16 read gpib status Perform measurement CALL Enter k2001data Gpib len 16 gpib statuss k2001data LEFT k2001data Gpib len PRINT k2001data END Display reading G 3 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Example Programs CON Figure and READ Commands Microsoft Q uickC 2 0 National GPIB PC Interface 01992 Keithley Instruments Inc Description This program demonstrates the use of the CONFigure and READ commands In general CONFigure is used to select the FREQ function and then performs a RST The READ command is used to make a measurement which is Program confnat c include lt stc h gt include lt stdio h gt include lt stdlib h gt include lt decl h gt include lt math h gt include lt graph h gt include lt string h gt include lt time h gt define k2002 16 main int stat l char status keych char cmd 255 char ki2002 10 _clearscre
299. eceiving the information The three handshake lines are DAV DATA VALID The source controls the state of the DAV line to indicate to any listening devices whether or not data bus information is valid NRFD Not Ready For Data The acceptor controls the state of NRFD It is used to signal to the transmitting device to hold off the byte transfer sequence until the accepting device is ready NDAC Not Data Accepted NDAC is also controlled by the accepting device The state of NDAC tells the source whether or not the device has accepted the data byte The complete handshake sequence for one data byte is shown in Figure D 2 Once data is placed on the data lines the source checks to see that NRFD is high indicating that all active devices are ready At the same time NDAC should be low from the previous byte transfer If these conditions are not met the source must wait until NDAC and NRED have the correct status If the source is a controller NRFD and NDAC must be stable for at least 100nsec after ATN is set true Because of the possibility of a bus hang up many con trollers have time out routines that display messages in case the transfer sequence stops for any reason Once all NDAC and NRFD are properly set the source sets DAV low indicating to accepting devices that the byte on the data lines is now valid NRFD will then go low and NDAC will go high once all devices have accepted the data Each IEEE 488 Bus Overvi
300. ecified limit test STATe Query state of specified limit test Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Description Program fragment Description Program fragment Description Program fragment Parameters Query IEEE 488 Reference These commands are used to enable or disable LIMIT 1 and LIMIT 2 tests When enabled the test sequence for limits will be performed every time the instrument performs a measurement Testing is performed in the following sequence Low Limit 1 High Limit 1 Low Limit 2 and High Limit 2 Any limit test LIMIT 1 or LIMIT 2 not enabled is simply not performed Note that when a limit test LIMIT 1 or LIMIT 2 is enabled the digital output port cannot be controlled from the Source Subsystem A fail indication see FAIL for LIMIT 1 or LIMIT 2 is cleared when the respective limit test 1s disabled PRINT 1 output 16 calc3 lim stat on stat Enable LIMIT 1 test and query PRINT 1 enter 16 Get response message from 2002 FAIL CALCulate3 LIM it 1 FAIL Read LIMIT 1 test results CALCulate3 LIM it2 FAIL Read LIMIT 2 test results These commands are used to read the results of LIMIT 1 and LIMIT 2 tests 0 Limit test passed 1 Limit test failed The response message 0 or 1 only tells you if a limit test has passed or failed It does not tell you which limit upper or lower has failed To d
301. ecimal W eighting 2 21 Value 0 1 Value 1 Enable Positive Transition 0 Disable Positive Transition A Positive Transition PTR Register Bit Position B15 B2 Bl Event Seq1 Decimal Weighting 2 21 Value 0 1 Value 1 Enable Negative Transition 0 Disable N egative Transition B Negative Transition NTR Register Figure 3 37 Arm Transition Filter 3 130 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Effects of positive transitions on the Sequence E vent R egister Positive transition effect on Sequence event Sequence Event Register Layer 1 Sets B1 when in Arm Layer 1 Layer 2 Sets B2 when in Arm Layer 2 Bit Position B15 B3 BO Event Layl Decimal Weighting E Si Value 0 1 Value 1 Enable Positive Transition 0 Disable Positive Transition A Positive Transition PTR Register Bit Position BO Event Lay2 Layl Decimal Weighting 4 2 22 21 Value 01 01 Value 1 Enable Negative Transition 0 Disable Negative Transition B Negative Transition NTR Register Figure 3 38 Sequence Transition Filter Program fragment PRINT 1 output 16 stat oper ptr 1026 ptr Set Bl and B10 of Operation PTR PRINT 1 enter 16 Get response message from 2002 3 131 Test Equipment Depot 800 517 843
302. ed at 5 digits COUPLING Set by ACI coupling INPUT TERMINALS Fixed on CURRENT A AC RMS or average current and frequency functions Figure 2 8 AC current multifunction multiple displays 2 4 3 Two and four wire resistance The Model 2002 can make 2 wire resistance measurements from 100nQ to 1 05GQ and 4 wire resistance measurements from 100nQ to 2 1MQ The basic measurement procedures for Q2 and Q4 are contained in the Getting Started manual Shielding It helps to shield resistance greater than 100k to achieve a stable reading Place the resistance in a shielded enclosure and electrically connect the shield to the INPUT LO terminal of the instrument 2 28 RMS RANGE Set by ACI range auto or fixed Autoranges independently of other function REL O perates normally SPEED Set by ACI speed FILTER Set by ACI filter RESOLUTION Set by ACI resolution COUPLING Set by ACI coupling 000 000 WAAC AVG 000 000 AAC RANGE Set by ACI range auto or fixed Autoranges independently of other function REL No effect SPEED Set by ACI speed FILTER Unaffected by ACI filter RESOLUTION Fixed at 5 5 digits COUPLING Set by ACI coupling B AC RMS and average current functions Resistance configuration The following information explains the various configura tion options for 2 wire and 4 wire resistance measurements The configuration menus are summarized in Tables 2 16 and 2 17 The
303. eded for the frequency counter to operate properly The instrument only counts cycles with peak amplitudes that reach the trigger level For example if the trigger level is set for 5V cycles with peak amplitudes less than 5V are not counted If using AC DC coupling make sure the trigger level accounts for the DC bias level For example if a 1V peak to peak input signal is riding on a 5V DC bias level a trigger level of 5 5V is appropriate While the display is showing frequency measurements the RANGE A and Y keys can be used to change the trigger lev el of the measurement Each press of a RANGE A or Y key adjusts the trigger level by 0 5 of the presently selected maximum signal level to a maximum of 60 of the range The AUTO RANGE key returns the trigger level to OV or OmA After pressing one of the range keys the present trigger level is momentarily displayed The trigger level is also available as a multiple display See Table 2 21 for the trigger level ranges and increments Table 2 21 Trigger level range and increments Trigger level Maximum signal level Range Increment 1V 0 600 to 0 600V 0 005V 10V 6 00 to 6 00V 0 05V 100V 60 0 to 60 0V 0 5V 1000V 600 to 600V 5V ImA 0 600mA to 0 600mA 0 005mA 10mA 6 00mA to 6 00mA 0 05mA 100mA 60 0mA to 60 0mA 0 5mA 1A 600mA to 600mA SmA 2 32 Frequency configuration The following information explains the various configura tion option
304. ediately open any internal closed channel or chan nel pair for 4 wire functions Channel selection menu Table 2 38 summarizes the channel selection menu structure along with a brief description of each item More detailed descriptions of these menu items are presented in the follow ing paragraphs See paragraph 2 3 4 for general rules on nav igating menus With a scanner card installed in the option slot of the Model 2002 the following options are available when CHAN is pressed Table 2 38 CHANNEL SELECTION menu structure CLOSE CHANNEL This menu item prompts you to enter the channel from 1 to 10 that you wish to close Use the cursor keys and kand the RANGE A and Y keys to display the channel and press ENTER The number of the closed channel will be displayed on the front panel along with normal readings Selecting a different channel from the one that is presently closed will cause the closed channel to open and allow a set tling time before closing the selected channel Channel relays will be closed according to the presently selected function If a 2 wire function is used only the relay for that one channel will be closed If a 4 wire function is selected both the selected channel relay and the matching relay pair will close For example closing channel 2 will also close the channel 7 relay Fixed 4 pole relay pairs are e and 6 not available for Model 2001 TCSCAN e 2and7 e 3and8 e 4and 8 e Sand 1
305. ee layers Arm Layer Arm Layer 2 and the Trigger Layer For front panel operation these layers are known as the Arm Layer Scan Layer and Measure Layer Once the Model 2002 is taken out of the idle state operation proceeds through the layers of the trigger model down to the device action where a measurement occurs Control sources In general each layer contains a control source which holds up operation until the programmed event occurs The control sources are summarized as follows IMMediate With this control source selected event detection is immediately satisfied allowing operation to continue e MANual Event detection is satisfied by pressing the TRIG key Note that the Model 2002 must be taken out of remote before it will respond to the TRIG key Press LOCAL or send LOCAL 16 over the bus to take the instrument out of remote e BUS Event detection is satisfied when a bus trigger GET or TRG is received by the Model 2002 e TIMer Event detection is immediately satisfied on the initial pass through the layer Each subsequent detection is satisfied when the programmed timer inter val 1 to 999999 999 seconds elapses A timer resets to its initial state when operation loops back to a higher layer or idle Note that TIMer is not available in Arm Layer 1 e EXTernal Event detection is satisfied when an input trigger via the EXTERNAL TRIGGER connector is received by the Model 2002 3 20 e TLIN
306. efore plugging in the power cord make sure the front panel power switch is in the off 0 position 3 Connect the female end of the supplied power cord to the AC receptacle on the rear panel Connect the other end of the power cord to a grounded AC outlet Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 2 1 TestEquipmentDepot com Front Panel Operation WARNING The power cord supplied with the M odel 2002 contains a separate ground wire for use with grounded outlets When proper connections are made instru ment chassis is connected to power line ground through the ground wire in the power cord Failure to use a grounded outlet may result in personal injury or death due to electric shock 2 2 2 Line fuse replacement A rear panel fuse located below the AC receptacle protects the power line input of the instrument If the fuse needs to be replaced perform the following steps WARNING Make sure the instrument is disconnect ed from the power line and other equip ment before replacing the line fuse 1 With the power off place the end of a flat blade screw driver into the rear panel LINE FUSE holder Push in gently and rotate the fuse carrier one quarter turn coun terclockwise Release pressure on the holder and its internal spring will push the fuse carrier out of the holder 2 Remove the fuse and replace it with the same type 0 5A 250V slow blow 5 x 20mm The Keithley part numbe
307. egative e exponent bits 11 f fraction bits 52 Normal byte order shown For swapped byte order bytes sent in reverse order Header Byte 8 Byte 7 Byte 1 The Header is only sent once for each measurement conversion Figure 3 20 IEEE754 double precision data format 64 data bits PRINT 1 output 16 form sre form Select SREal format and query PRINT 1 enter 16 Get response message from 2002 ELEMents lt item list gt FORMat ELEMents lt item list gt Specify data elements for data string lt item list gt READing Includes reading in data string CHANnel Includes channel number RNUMber Includes reading number UNITs Includes units TIMEstamp Includes time stamp STATus Includes status of reading NOTE Each item in the list must be separated by a comma ELEMents Query elements in data string This command is used to specify the elements to be included in the data string for each mea surement conversion You can specify from one to all six elements Each element in the list must be separated by a comma These elements shown in Figure 3 18 are explained as follows READing Instrument reading The resolution of this reading tracks the display resolution of the instrument An overflow reading reads as 9 9E37 CHANnel Corresponds the instrument reading to the channel number of a switching card If not scanning the channel number is 00 3 81 Test Equipment Depot 8
308. egister Conversely when a standard event is unmasked enabled the occurrence of that event sets the ESB bit For information on the Standard Event Status Register and descriptions of the standard event bits see paragraph 3 10 3 The Status Byte Register is described in para graph 3 7 6 A cleared bit 0 in the enable register prevents masks the ESB bit in the Status Byte Register from setting when the corresponding standard event occurs A set bit 1 in the enable register allows enables the ESB bit to set when the corresponding standard event occurs The Standard Event Enable Register is shown in Figure 3 14 and includes the decimal weight of each bit The sum of the decimal weights of the bits that you wish to be set is the parameter value that is sent with the ESE command For example to set the CME and QYE bits of the Standard Event Enable Register send the following command ESE 36 where CME bit B5 Decimal 32 QYE bit B2 Decimal 4 lt NRf gt 36 If a command error CME occurs bit B5 of the Standard Event Status Register sets If a query error QYE occurs bit B2 of the Standard Event Status Register sets Since both of these events are unmasked enabled the occurrence of any one of them causes the ESB bit in the Status Byte Register to set The Standard Event Status Event Register can be read by using the ESE query command PRI 1 output 16 ese 24 ese Set bits B3 and B4 and que
309. egration rate line cycles 0 01 to 50 1 y 3 18 6 AUTO lt b gt Enable or disable auto NPLC OFF AUTO ONCE Enable and then disable auto NPLC AUTO Query auto line cycle integration NPL Cycles Query line cycle integration rate y RANGe Path to configure measurement range y 3 18 8 UPPer lt n gt Select range 0 to 1100 1100 y UPPer Query range y AUTO lt b gt Enable or disable auto range ON y AUTO ONCE Set range based on present input signal y ULIMit lt n gt Set upper limit for auto range 0 to 1100 1100 ULIMit Query upper limit LLIMit lt n gt Set lower limit for auto range 0 to 1100 0 2 LLIMit Query lower limit AUTO Query auto range y REFerence lt n gt Specify reference 1100 to 1100 0 y 3 18 9 STATe lt b gt Enable or disable reference OFF y STATe Query state of reference 0 or 1 y ACQuire Use input signal as reference REFerence Query reference value y DIGits lt n gt Specify measurement resolution 4 to 9 8 3 18 10 AUTO lt b gt Enable or disable auto resolution ON AUTO ONCE Enable and then disable auto resolution AUTO Query auto resolution DIGits Query resolution AVERage Path to configure and control the filter 3 18 11 TCONtrol lt name gt Select filter type MOVing or REPeat Note 3 TCONtrol Query filter type COUNt lt n gt Specify filter count 1 to 100 10 COUNt Query filter count ADVanced Path to configure and control advanced filter
310. el 2002 interface function codes ccccccncncnncunaonanancnonnnnnnnnnononanononoconanonannanano nono nnnnonnnnnnnnnnoronanonananannnns Loi D IEEE 488 Bus O verview Table D 1 TEEE 488 bus command SUMMALY 000 ee eee eeeeeceseeeeecaeeceecaeesaecsaesaeceecssecesceseeseseseseeseseseaeeaeeeeeeneeaaes Table D 2 Hexadecimal and decimal command codes Al Table D 3 Typical addressed command Sequence ln Table D 4 Typical common command Sequence ln Table D 5 IEEE command groups susi iio ies E IEEE 488 Conformance Information Table E 1 TEEE 488 documentation requirements oo ceesecseesseceecssecsecesceaeceaeesececeseceeeeeseeeseeseaeeaaecaesaaecaeed Table E 2 Coupled Commands siseses renske ie eeren Eee venestnace Ee Ea ET EE eE RERE ETE E ESE SRE Ebene E 3 H HP3458A Emulation Mode Table H 1 Commands not supported by HP3458A emulation mode coooocnoccnnoccnocononnnonnnconononcnconcconnnnonccnnnoronncnnncnnne Table H 2 Supported HP3458A commands iereitinicin iii ista le H 3 X Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 1 1 General Information Introduction This section contains general information about the Model 2002 Multimeter It is arranged in the following manner 1 2 Features 1 3 Warranty information 1 4 Manual addenda 1 5 Safety symbols and terms 1 6 Specifications 1 7 Inspection 1 8 Options and accessories 1 2 Features Some important Model 20
311. el for a TTL input signal After this command is sent the 10V threshold voltage range is selected and a threshold trigger level of 0 8V is established PRINT 1 output 16 freg thr curr volt ttl Select TTL threshold PRINT 1 output 16 freq thr volt rang lev Query threshold range and trigger level PRINT 1 enter 16 Get response from 2002 7TRANsducer lt name gt SEN Se 1 TEM Perature TRAN sducer lt name gt Specify transducer type lt name gt RTD Two wire RTD transducer FRTD Four wire and three wire RTD transducer TCouple Thermocouple transducer DTC Differential thermocouple transducer INTernal Internal transducer TRANsducer Query transducer type This command is used to program the instrument for the transducer type that you are using If using a two wire RTD transducer select RTD If using a three wire or four wire RTD select FRTD If using a thermocouple select TCouple Select DTC if performing differential TC tem perature measurements using the Model 1801 Nanovolt Preamp Use the INTernal transducer to measure the internal temperature difference from the calibration temperature of the Model 2002 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Program fragment 3 18 18 Parameters Query Description Program fragment Parameters Query Description Program fragment IEEE 488 Reference PRINT 1 output 16
312. elect the desired function then press ENTER Repeat the procedure for all channels to be defined 7 Press EXIT as necessary to return to normal display Step 4 Enable external scanning 1 From normal display press CONFIG SCAN The in strument will display the following SCAN OPERATION INTERNAL EXTERNAL RATIO DELTA 2 Select EXTERNAL then press ENTER Front Panel Operation Step 5 Start scan Press SCAN for instructions to set up the external scanner program the scan count scan timer and data storage Then press ENTER to start scanning When the scan has complet ed you can recall stored data and or scan again Press EXIT to interrupt data storage and disable scanning 2 12 Menu The main menu accesses the various instrument operations for which there are no dedicated keys such as setup storage IEEE 488 setup calibration self test and limits The main menu structure is summarized in Table 2 41 The top level of the main menu is displayed by placing the instrument in the reading display state and then pressing the MENU key Some general rules to navigate the menu levels are given in paragraph 2 3 4 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation 2 88 Table 2 41 Main menu structure Menu item Description SAVESETUP Setup menu SAVE Save setup at a memory location up to 1 5 or 10 RESTORE Return
313. elta measurements After ratio or delta measurements are selected from the SCAN OPERATION menu the SCAN TRIG and EXIT keys control scanning Press the SCAN key to start the oper ation as shown in Figure 2 33 SCAN TRIGGERS HALTED Use SCAN key to resume EXIT to quit SCAN or TRIG Ratio or delta measurements SCAN TRIGGERS HALTED Use SCAN key to resume EXIT to quit EXIT SCANNING DISABLED Use SCAN key to resume EXIT SCANNING DISABLED Use SCAN key to resume Figure 2 33 SCAN key menu structure for ratio and delta Manual scanning When using internal scanning you can manually scan chan nels by pressing the lt or keys To use this feature first close a channel by using the CLOSE CHANNEL option accessible with the CHAN key Use to increment chan nels or use lt q to decrement channels Hold down either key to continuously scan through channels manually Adjacent channel display The multiple display mode can be used to display the two adjacent channels only when manually controlling channels To use this feature first manually close the desired channel then press PREV to display alternate channels You can then use the and keys to scroll through channel displays normally NOTE The adjacent channel display mode cannot be used when scanning channels automat ically using the internal or external scan list Front Panel Operation As an example assume that you close channel 5 using the CHAN key
314. emperature TERM Request INPUTS switch status TIMER Timer interval H 3 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com HP3458A Emulation Mode APER Purpose Format Parameter Default Query Description Example ARANGE Purpose Format Parameter Default Query Description Purpose Example AZERO Purpose Format Parameter To program the A D integration time APER lt aperture gt lt aperture gt 166 67E 6s to 1s 1 67E 4s APER Returns aperture in seconds The APER command programs the Model 2002 A D integration period The unit will accept values between Os and 1s but it rounds values to meet the Model 2002 s valid parameter range APER 1E 3 Program 1ms aperture To enable disable the autorange mode ARANGE lt range gt lt range gt lt range gt Parameter Numeric E quivalent Description OFF 0 ON 1 ONCE 2 OFF ARANGE Returns autorange status correspond numerically to 0 1 and 2 respectively Disable autorange Enable autorange Autorange next reading ARANGE enables disables autorange mode The valid parameters are OFF ON and ONCE which Autorange can also be controlled by the FUNC and RANGE commands Specifying AUTO for the sec ond parameter of the FUNC command turns autoranging ON Specifying AUTO for the first parameter of the RANGE command turns aut
315. en _GWINDOW SendIFC 0 Send 0 k2002 form elem read 24L NLend while kbhit Send 0 k2002 conf freq 20L NLend Send 0 k2002 read 6L NLend Receive 0 k2002 ki2002 20L STOPend printf ss ki2002 G 4 then sent to the computer and displayed This process contin ues until a keystroke occurs Required equipment Model 2002 Multimeter Microsoft QuickC 2 0 National GPIB PC Interface interface software must be installed and configured as explained in the instruction manual The program assumes that the Model 2002 is set to address 16 Set Controller to Addr 0 Include only reading in data string Configure for one shot FREQ measure ments Make measurement Display reading Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Display U ser Defined Message Microsoft QuickBASIC 4 5 Keithley KPC 488 2 Interface 1992 Keithley Instruments Inc Description Example Programs Keithley Model KPC 488 2 Keithley Model KPC 488 2AT Capital Equipment Corporation PC lt gt 488 The program assumes that the Model 2002 is set to address 16 Loading user library The user library for QuickBASIC 4 5 is provided with the This program simply displays a user defined message on the TEEE 488 interface ieeeqb qlb Assuming QuickBASIC display of the Model 2002 Required equip
316. ent Status Register B15 B8 ESR PON URQ CME EXE DDE PON Power On URQ User Request CME Command Error EXE Execution Error DDE Device Dependent Error OR QYE Query Error OPC O peration Complete To Event Summary Bit ESB of amp Logical AND Status Byte OR Logical OR Register See Figure 3 12 Y Standard Event ESE PON URQ CME EXE DDE OPC Status Enable ESE B15 B8 Register Figure 3 5 Standard event status Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference To Operation Summary Bit O SB of Status Byte Register See Figure 3 12 Figure 3 6 Operation event status 3 10 From OR ed summary of From OR ed summary Arm Event Status see of Trigger Event Status Figure 3 7 see Figure 3 9 UE Operation Condition B15 B11 B8 B7 82 B1 Register E a e ee PTR Transition B15 B11 NTR Filter Idle Arm Trig Meas Cal electa Even B15 B11 B10 B9 B8 87 B6 B5 B4 B3 B2 B1 Bo RESIST O peration Event Enable Register B15 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 BO Idle Idle amp Logical AND PTR Positive Transition Filter Arm Waiting in an Arm OR Logica
317. ent Enable Register C Measurement Event Enable Register 4 All bits of the following registers are set to one 1 A Trigger Event Enable Register B Arm Event Enable Register C Sequence Event Enable Register Note Registers not included in the above list are not affected by this command PRINT 1 output 16 stat pres Return registers to defaults Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 3 20 7 Description Program fragment Parameters Query Description IEEE 488 Reference Q U Eue commands N EXT STATus Q U Eue N EXT Read Error Queue As error and status messages occur they are placed into the Error Queue This query command is used to read those messages The Error Queue is a first in first out FIFO register Every time you read the queue the old est message is read and that message is then removed from the queue The queue will hold up to 10 messages If the queue becomes full the message 350 Queue Overflow will occupy the last memory location in the register On power up the Error Queue is empty When the Error Queue is empty the message 0 No error is placed in the Error Queue The messages in the queue are preceded by a number Negative numbers are used for SCPI defined messages and positive numbers are used for Keithley defined messages The mes sages are listed in Table 2 4 A
318. entDepot com HP3458A Emulation Mode Default Query Description Example SRQ Purpose Format Parameter Description SSTATE Purpose Format Parameter Description Example lt type gt parameter Numeric equivalent Description ANA 1 RMS conversion RNDM 2 Low frequency voltage measurements SYNC 3 Low frequency voltage measurements ANA SETACV Returns the currently specified conversion technique A 3 is returned for RNDM or SYNC The SETACV command selects the RMS conversion technique to be used for the AC or AC DC volt age measurement modes Note that both RNDM and SYNC choose the low frequency voltage mea surement mode SETACV SYNC Select low frequency AC mode To enable SRQ SRO None The SRO command sets bit 2 in the Model 2002 status register When bit 2 is enabled the SRQ line will be asserted when certain conditions occur See ROS command To store the instrument s present configuration in memory SSTATE lt state gt lt state gt Memory option Valid lt state gt parameters No extended memory SAVO 2002 MEM 1 installed SAVO SAV4 2002 MEM2 installed SAVO SAV9 SSTATE stores the multimeter s present state in the given state memory location Note that the num ber of available states depends on installed memory options as indicated above Instrument states may recalled with the RSTATE command SSTATE SAVO Save state 0 Test Equipment Depo
319. enter 16 If you wish to display the response message on the CRT the computer will have to read the message and then print it to the CRT display as follows LINE INPUT 2 AS PRINT AS The following programming example shows how all the above statements are used together The program fragment is shown in bold typeface OPEN ieee FOR OUPTUT AS 1 Open driver OPEN ieee FOR INPUT AS 2 Open driver PRINT 1 interm crlf CRLF terminator Select ACV and query PRINT 1 output 16 func volt ac func PRINT 1 enter 16 Get response messag LINE INPUT 2 AS Read response mes sage Display message PRINT AS 3 3 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 5 General bus commands General bus commands are those commands such as DCL that have the same general meaning regardless of the instru ment Table 3 1 lists the general bus commands Also included is the programming statement for each command using the Keithley KPC 488 2 IEEE interface and the HP style Universal Language Driver CECHP Note that the commands requiring that a primary address be specified assume that the address is set to 16 This is the address that 1s set at the factory 3 5 1 REN remote enable The remote enable command is sent to the Model 2002 by the controller to set up the instrument for remote operatio
320. ently saved this command is a No Op no operation PRINT 1 output 16 alt rec Recall alternate setup FUNCtion lt name gt SEN Se 1 FUNCtion lt name gt Select measurement function lt name gt VOLTage AC Select ACV VOLTage DC Select DCV RESistance Select Q2 FRESistance Select Q4 CURRent AC Select ACI CURRent DC Select DCI FREQuency Select FREQ TEMPerature Select TEMP FUNCtion Query currently programmed function 3 91 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Description Program fragment 3 18 4 Description Program fragment Description Program fragment 3 92 The FUNCtion command is used to select the measurement function of the instrument Note that parameter names are enclosed in single quotes However double quotes can instead be used For example func volt dc func volt dc Each measurement function remembers its own unique setup configuration such as range speed resolution filter and rel This eliminates the need to re program setup conditions every time you switch from one function to another PRI 1 output 16 func volt ac func Select ACV function PRI 1 enter 16 Get response from 2002 D ATA commands LATest SEN Se 1 D ATA LATest Return latest reading This query command
321. er Link example 000 ce eee eeeeeeeeeeeeeeeseeeeeeeeeeeeenees Averaging and advanced filter types 0 ccescececcesseceecesseceseecesteceaeeeneeceeeecaeceneeeneesaecenecsaeeeneeeeneesss Moving and repeating filter modes ooo ee cece ceeeceeceeeeeeeeeeeeeetacecaeeseecaecsaecaeceaceaecaeeeeeeeeeeeeseaes SCAN Key Open di savages encia SCAN key menu structure for ratio and delta oe cee eeeceeceeeeeeeeeeeeeeeseeeaeeseecaecaeecaesaeeaesaeeasens Limits bar graph example rentas a eea reaa nE Aerer visa vgecen sl iden co Using limit test to start 1002 resistor ote eeeeeecseeseeseesececeecaeseeeeceecseeseesecsecseeeeeeecaecaseeesaesaseeeees Digital VO portan lc Digital I O port simplified schematic ce eeeesecseeseeecseceeeseeseceeeecsacseeeeesecsaeseeseseesaeeaeeeeaesaseeeeaes Sample externally powered relay sample eee cesses ceeceeeceeceseeeeeeeeeeeeeseeeaesaeecaecaeecaecsaesaeeeeaeens Line cycle synchronization sssini ene aerae EE EE AEE rone IEE A oE aaie eE aiei tes TAERE S Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 vii TestEquipmentDepot com 3 Figure 3 1 Figure 3 2 Figure 3 3 Figure 3 4 Figure 3 5 Figure 3 6 Figure 3 7 Figure 3 8 Figure 3 9 Figure 3 10 Figure 3 11 Figure 3 12 Figure 3 13 Figure 3 14 Figure 3 15 Figure 3 16 Figure 3 17 Figure 3 18 Figure 3 19 Figure 3 20 Figure 3 21 Figure 3 22 Figure 3 23 Figure 3 24 Figure 3 25 Figure 3 26 Fi
322. er bits CSB None The CSB command clears all bits in the status register including bit 6 SRQ To program the time interval between the trigger and sample events DELAY lt time gt lt time gt 1E 7s to 6000s Os H 5 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com HP3458A Emulation Mode Query Description Example DISP Purpose Format Parameter Default Query Description Example EMASK Purpose Format H 6 DELAY Returns delay time in seconds The DELAY command programs the time interval between the trigger event and the first sample event in seconds Although the valid parameter range is from 1E 7s to 6000s the Model 2002 rounds any value below 1ms 0 001s to 1ms Specifying a delay of O selects the minimum delay time possible DELAY 50E 3 Program 50ms delay To enable disable the front panel display to clear the display and to send a message to the display DISP lt control gt lt message gt lt control gt lt control gt Parameter Numeric equivalent Description OFF 0 Display off or message ON 1 Normal operation MSG 2 Display message CLR 3 Clear display lt message gt Up to 52 character string enclosed in double quotes ON DISP Returns present value of lt cont rol gt parameter The DISP command enables disables the multimeter s display and may be used to send a message to the
323. erial poll The serial poll automatically resets RQS of the Status Byte Register This will allow subsequent serial polls to monitor Bit 6 for an SRQ occurrence generated by other event types After a serial poll the same event can cause another SRQ even if the event register which caused the first SRQ has not been cleared A serial poll clears RQS but does not clear MSS The MSS bit will stay set until all Status Byte event summary bits are cleared The following QuickBASIC 4 5 program using the KPC 488 2 interface and the CECHP driver demonstrates how serial poll can be used to detect an SRQ CLS OPEN ieee FOR OUTPUT AS 1 OPEN ieee FOR INPUT AS 2 PRINT 1 output 16 cls Clear Status Byte Register PRI 1 output 16 ese 32 Unmask command errors PRIN 1 output 16 sre 32 Unmask event sum mary message PRI 1 output 16 ese Error missing parameter SLEEP 1 PRINT 1 SPOLL 16 Serial poll 2002 INPUT 2 S Read Status Byte Register S S OR 191 OR register with a mask IF S 255 THEN GOSUB srq Go to subroutine to acknowledge SRO END IF PRIN ID srq PRINT SRO Has Occurred ROS bit B6 is set 1 RETURN 3 8 Trigger model IEEE 488 operation The following information describes the operation process of the Model 2002 over the IEEE 488 bus The flowchart in Figure 3 13
324. ero Type Standard Alpha Beta Delta Qat0 C Front Panel Operation PT100 TIS 90 0 003850 0 10863 1 49990 100 00000 D100 ITS 90 0 003920 0 10630 1 49710 100 00000 F100 ITS 90 0 003900 0 11000 1 49589 100 00000 PT385 IPTS 68 0 003850 0 11100 1 50700 100 00000 PT3916 IPTS 68 0 003916 0 11600 1 50594 100 00000 e USER This selection allows you to change one or more of the RTD factors listed in the above table The equation using the factors are shown in Figure 2 11 SPRTD Choosing type SPRTD takes you to the SPRTD COEFFICIENTS menu which allows you to program the following parameters R ZERO RTD 0 C resistance value A4 set A4 coefficient B4 set B4 coefficient AT set A7 coefficient B7 set B7 coefficient C7 set C7 coefficient Coefficients The ITS 90 standard provides two reference equations for Standard Platinum Resistance Thermometers covering the temperature range 18 8033K to 1234 93K A single SPRTD however usually cannot be used to cover the entire range The temperature range is therefore broken up into several subranges These subranges depend on the calibration points of the temperature scale and are based on the melting or tri ple points of various pure substances For an exact list of the elements needed and details on RTD calibration refer to NIST Technical Note 1265 Guidelines For Realizing the International Temperature Scale of 1990 In each subrange the calibration constants required for that ra
325. ers Each set of event registers except the Standard Event register set has a condition register A condition register is similar to its corresponding event register except that it is a real time register that constantly updates to reflect the current operating status of the instrument See EVENt for register bit descriptions Note from the status structure paragraph 3 7 that the condition registers precede the transition filters Thus only the PTR descriptions apply to the condition registers After sending one of these commands and addressing the Model 2002 to talk a decimal value 1s sent to the computer The binary equivalent of this decimal value indicates which bits in the register are set For example if sending stat meas cond returns a decimal value of 512 binary 0000001000000000 bit B9 of the Measurement Condition Register is set indicating that the trace buffer is full PRINT 1 output 16 stat oper cond Query Op Condition Register PRINT 1 enter 16 Get response message from 2002 PRESET STATU S PRESET Return registers to default conditions When this command is sent the SCPI event registers are affected as follows 1 All bits of the positive transition filter registers are set to one 1 2 All bits of the negative transition filter registers are cleared to zero 0 3 All bits of the following registers are cleared to zero 0 A Operation Event Enable Register B Questionable Ev
326. ers For example you could set up a specific set of operating param eters for the straight DCV function and a second DCV setup as the ALT function This arrangement allows you to specify changes in virtually any measurement parameter from chan nel to channel even if the measurement functions are the same NOTE Some functions may not be compatible with certain scanner cards For example you should not use the DCI and ACT func tions with the Model 2001 SCAN and 2001 TCSCAN internal scanner cards SAVE ALT FCN stores the presently selected function and all its configured settings as the ALT function RESTORE ALT FCN restores the function that was saved as the ALT function and all associated settings as if a normal function change were taking place 2 11 5 Using CO NFIG SCAN to configure scanning The SCAN OPERATION menu allows you to configure the following scanner aspects e Select the internal or external channel list for scanning e Enable ratio and delta operation Table 2 40 summarizes the SCAN OPERATION menu structure which is discussed in more detail in the following paragraphs See paragraph 2 3 4 for more information on menu navigation Pressing CONFIG SCAN will display the SCAN OPERA TION menu These choices select the action the instrument will take when it is triggered INTERNAL This selection enables scanning with the internal scanner card When this selection is chosen the Model 2002 will change to th
327. essage mode The instrument may become so busy displaying status mes sages that keypresses are no longer acknowledged You may have to clear status message display by pressing the EXIT key or sending a bus command DISPlay SMESsage OFF to get out of this mode 2 12 7 GENERAL The GENERAL menu is used for the following operations e To control the state and sense of the digital outputs to view the state of the digital input e To view the serial number memory option SCPI ver sion and firmware revision levels of the Model 2002 To control the frequency of autozero readings and to set line synchronization of readings To configure timestamp e To choose the character displayed for a decimal To set the real time clock 2 99 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation DIGITAL I O Overview The Model 2002 s Digital I O port is a 9 pin D sub miniature connector located on the rear panel The port s location and pin designations are shown in Figure 2 36 Connector J1031 Pin Designations igital Input y back connection 5V to 30V Ground Output 1 Output 2 Output 4 Output 3 10 ES gt LO 0 OU PUNA Hou uw ot ou ie ue t 99990 lt zz9 IMSS Figure 2 36 Digital I O port The Model 2002 s Digital I O port can be used to control external circuitry The port provides four output li
328. estamp type for buffer readings is coupled to timestamp type for bus readings Thus if you change timestamp type from this menu structure it also changes in the MAIN MENU structure see TIMESTAMP in paragraph 2 12 7 FORMAT This menu item is used to check and or change the timestamp format Note that if format is changed after readings are stored in the buffer the timestamps will change to reflect the alternate format e ABSOLUTE With this selection each timestamp provides the time and date that the reading was taken see REAL TIME timestamp type or the number of seconds from the first buffer reading that the reading was taken see RELATIVE TIME timestamp type Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com e DELTA With this selection each timestamp is refer enced to the timestamp for the previous reading This provides the time between buffer readings Timestamps are provided in days hours minutes and seconds see REAL TIME timestamp type or in seconds see REL ATIVE TIME timestamp type COUNT With this menu selection you specify the number of read ings to store ENTER COUNT This item allows you to specify the buff er size in number of readings USE TRIGGER MODEL This selection lets you default to the measure count in the present trigger configuration as long as the measure count is a finite value FEED This selection allows you to select the
329. et Melrose MA 02176 TestEquipmentDepot com Binary Data Transfer Microsoft Q uickC 2 0 Keithley KPC 488 2 Interface 1992 Keithley Instruments Inc Description This program demonstrates the binary data transfer capabil ity of the Model 2002 The Model 2002 sends binary read ings to the computer using the IEEE754 Single Precision Data Format Required equipment e Model 2002 Multimeter e Microsoft QuickC 2 0 Program bintran c include lt stdio h gt include lt stdlib h gt include lt string h gt include lt ieee c h gt define K2002 16 IEEE main address of 2002 int status 1 char r 80 float meas float dummy initialize 21 0 setinputEOS 10 setoutputEOS send K2002 IDN amp status enter r 80 1 K2002 amp status printf Data received s n r send K2002 syst pres amp Sstatus send K2002 form elem read amp status send K2002 form data sre bord swap amp status 10 0 while 1 send K2002 fetch amp status transmit MLA TALK 16 amp status rarray amp meas 5 amp l amp status printf Data received e n meas Example Programs e Any one of the following IEEE 488 interfaces Keithley Model KPC 488 2 Keithley Model KPC 488 2AT Capital Equipment Corporation PC lt gt 488 The program assumes that the Model 2002 is set to address 16 Linking p
330. etermine which limit has failed you will have to read the Measurement Event Register see paragraph 3 20 1 Reading the results of a limit test does not clear the fail indication of the test A failure can be cleared by using a CLEar command or by disabling the test STATe OFF PRINT 1 output 16 calc3 lim fail Query result of LIMIT 1 test PRINT 1 enter 16 Get response message from 2002 CLEar commands IMM ediate CALCulate3 LIM it 1 CLEar IM M ediate Clear LIMIT 1 test failure CALCulate3 LIM it2 CLEar IM M ediate Clear LIMIT 2 test failure These action commands are used to clear the fail indication of LIMIT 1 and LIMIT 2 tests Note that a failure is also cleared when the limit test is disabled STATe OFF PRINT 1 output 16 calc3 lim cle Clear fail condition of LIMIT 1 test AUTO lt b gt CALCulate3 LIMit 1 CLEar AUTO lt b gt Control auto clear LIMIT 1 CALCulate3 LIMit2 CLEar AUTO lt b gt Control auto clear LIMIT 2 lt b gt 1 or ON Enable auto clear for limit failure 0 or OFF Disable auto clear for limit failure AUTO Query state of auto clear 3 73 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Description Program fragment Parameters Query Description Program fragment With auto clear enabled the fail indication of a limit test clears when instrument operatio
331. evel in volts voltage threshold DEFault 1mA maximum signal level current threshold 10V maximum signal level voltage threshold MINimum 1mA maximum signal level current threshold 1V maximum signal level voltage threshold MAXimum 1A maximum signal level current threshold 1000V maximum signal level voltage threshold RANGe Query maximum signal level RANGe DEFault Query RST default signal level RANGe MINimum Query the lowest allowable signal level RANGe MAXimum Query the largest allowable signal level These commands are used to specify the expected input level The instrument will then auto matically select the most sensitive current or voltage threshold range For example if you spec ify the expected input current to be 20mA the instrument selects the 100mA current threshold range PRINT 1 output 16 fregq thr curr rang 15 range Select I threshold range PRINT 1 enter 16 Get response from 2002 LEVel lt n gt SEN Se 1 FREQ uency TH Reshold CU RRent LEVel nz Set current threshold level SEN Se 1 FREQ uency TH Reshold VO LTage LEVel lt n gt Set voltage threshold level Current Threshold lt n gt 0 0006 to 0 0006 Trigger level for 1mA range 0 006 to 0 006 Trigger level for 10mA range 0 06 to 0 06 Trigger level for 100mA range 0 6 to 0 6 Trigger level for 1A range DEFault OA trigger level MINimum Range dependent as shown above MAXimum Range dependent as sh
332. ew device will release NDAC at its own rate but NDAC will not be released to go high until all devices have accepted the data byte The sequence just described is used to transfer both data talk and listen addresses as well as multiline commands The state of the ATN line determines whether the data bus con tains data addresses or commands as described in the fol lowing paragraph DATA SOURCE DAV SOURCE VALID a ALL READY ACCEPTOR NRFD a ALL ACCEPTED NDAC ACCEPTOR Figure D 2 IEEE 488 handshake sequence Bus commands The instrument may be given a number of special bus com mands through the IEEE 488 interface This section briefly describes the purpose of the bus commands which are grouped into the following three categories 1 Uniline Commands Sent by setting the associated bus lines true For example to assert REN Remote Enable the REN line would be set low true 2 Multiline Commands General bus commands which are sent over the data lines with the ATN line true low 3 Common Commands Commands that are common to all devices on the bus sent with ATN high false 4 SCPI Commands Commands that are particular to each device on the bus sent with ATN false These bus commands and their general purpose are summa rized in Table D 1 D 3 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Bus Overview T
333. ew reading The FALSE to TRUE transition can be used to trigger an external device handler to check digital outputs 1 3 for sorting parts into bins When binning is enabled from the front panel or with the bus command CALCulate3 BSTRobe STATe ON the binning strobe signal is set to FALSE When binning is disabled the strobe signal is left unchanged Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com DISABLED Use this selection to disable strobe control ENABLED Use this selection to enable strobe control PASS PATTERN This item allows you to program the on off states of the dig ital output lines for when all limit tests pass Note that when the binning strobe is enabled digital output line 4 cannot be used Selecting PAS PATTERN displays the digital output pattern that occurs when all limit tests pass To change the pattern use the cursor keys and the range keys The range keys toggle the parameter values between OFF and ON Limits example This example sorts a quantity of 100Q resistors into five bins according to the following tolerances e Values less than 90Q outside 10 tolerance e Values greater than 110Q outside 10 tolerance e Values between 90Q and 99Q meets 10 tolerance Values between 101Q and 110Q meets 10 toler ance Values between 99Q and 101Q meets 1 tolerance The desired test is shown in Figure 2 35 Use the following pr
334. fault parameter 4 The RST default parameter is OFF for all functions The S YSTem PRESet default is OFF for ACI ACV and TEMP and ON for DCI DCV Q2 and 04 5 The RST default parameter is OFF for all functions The S Y STem PRESet default parameter is ON for ACI DCI ACV DCV Q2 and Q4 and OFF for TEMP Table 3 11 SOURce command summary Default Command Description parameter SCPI SOURce Note 1 Note 2 TTL I LEVel lt b gt TTL I LEVel TTL2 LEVel lt b gt TTL2 LEVel TTL3 LEVel lt b gt TTL3 LEVel TTLA LEVel lt b gt TTLA LEVel Set digital output line 1 true 1 or ON or false 0 or OFF Query digital output line 1 Set digital output line 2 true 1 or ON or false 0 or OFF Query digital output line 2 Set digital output line 3 true 1 or ON or false 0 or OFF Query digital output line 3 Set digital output line 4 true 1 or ON or false 0 or OFF Query digital output line 4 Notes 1 RST and SYSTem PRESet have no affect on the state of the output lines However cycling power sets all output lines false OFF 2 All SOURce subsystem commands are non SCPI Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 3 59 IEEE 488 Reference Table 3 12 STATus command summary Default Command Description parameter SCPI Ref STATus y MEASurement Path to control measurement eve
335. ffer Pretriggered 0 Measurement Event Cleared BFL Buffer Full BHF Buffer Half Full BAV Buffer Available RAV Reading Available HL2 High Limit 2 LL2 Low Limit 2 HL1 High Limit 1 LL1 Low Limit 1 ROF Reading O verflow Figure 3 21 Measurement Event Register Questionable E vent R egister Bits BO through B3 Not used Bit B4 Temperature Summary Temp Set bit indicates that an invalid reference junction measurement has occurred for thermocouple temperature measurements PTR or a subsequent valid reference junction measurement has occurred NTR Bits B5 B6 and B7 Not used Bit B8 Calibration Summary Cal Set bit indicates that an invalid calibration constant was detected during the power up sequence PTR The instrument will instead use a default calibra tion constant This error will clear after successful calibration of the instrument Bits B9 through B13 Not used Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Bit B14 Command Warning Warn Set bit indicates that a Signal Oriented Measurement Command parameter has been ignored PTR or a subsequent Signal Oriented Measurement Command has executed successfully NTR Note Whenever a questionable event occurs the ERR annunciator will turn on The annunciator will turn off when the questionable event clears Bit Positi
336. ffset lt n gt 0 09999 to 0 09999 Specify voltage offset at 0 C DEFault 0 01V offset MINimum 0 09999V offset MAXimum 0 09999V offset OFFSet Query voltage offset OFFSet DEFault Query RST default voltage offset OFFSet MINimum Query lowest allowable voltage offset OFFSet MAXimum Query largest allowable voltage offset This command is used to specify the offset voltage at 0 C for the specified reference junction PRINT 1 output 16 temo rjunl real offs 05 offs Set voltage offset PRINT 1 enter 16 Get response from 2002 ACQuire SEN Se 1 TEM Perature RJU N ctionX ACQ uire Update reference temperature This action command is used to update the stored reference temperature Simulated or Real for generating a temperature measurement PRINT 1 output 16 temo rjunl acq Update reference temperatur 3 113 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 18 21 Parameters Query Description Program fragment 3 18 22 Parameters Query Description Program fragment 3 114 0COMpensated lt b gt SEN Se 1 RESistance O COMpensated lt b gt Control offset compensation for Q2 SEN Se 1 FRESistance O COMpensated lt b gt Control offset compensation for Q4 lt b gt OorOFF Disable offset compensated ohms lorON Enable offset compensated ohms OCOMpensated Query state of off
337. filter count is the number of readings that are acquired and stored in the filter buffer for the averaging calculation The larger the filter count the more filtering that is performed PRINT 1 output 16 volt dc aver coun 20 coun Set filter count PRINT 1 enter 16 Get response from 2002 STATe lt b gt SEN Se 1 CU RRent AC AVERage STATe lt b gt Control filter for ACI SEN Se 1 CU RRent D C AVERage STATe lt b gt Control filter for DCI SEN Se 1 VO LTage AC AVERagel STATe lt b gt Control filter for ACV SEN Se 1 VO LTage D C AVERage STATe lt b gt Control filter for DCV SEN Se 1 RESistance AVERage STATe lt b gt Control filter for Q2 SEN Se 1 FRESistance AVERage STATe lt b gt Control filter for Q4 SEN Se 1 TEM Perature AVERage STATe lt b gt Control filter for TEMP lt b gt OorOFF Disable the digital filter lorON Enable the digital filter STATe Query state of digital filter These commands are used to enable or disable the digital averaging filter for the specified func tion When enabled readings will be filtered according to how the filter is configured PRINT 1 output 16 volt dc aver on aver Enable filter PRINT 1 enter 16 Get response from 2002 3 103 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Parameters Query Description Progr
338. fined simulated junction tempera ture is used If the junction type is real you must manually close that channel from the scanner before acquiring the temperature INTERNAL TEMP This option of the TEMP SENSOR TYPE menu is used to select the internal temperature trans ducer With this selection the internal temperature difference from the calibration temperature of the Model 2002 will be displayed when the TEMP function is selected For T lt 0 C Ry Ball AT BT CT T 100 For 0 C lt T lt 630 C Ry Ry 1 AT BT Where _ A A d bell B ade 104 C ofe 108 Above 0 C the equation solves faster by applying R A AS 4B 1 eil T Ro 7 2B Below 0 C it is an iterative solution and it runs slower Figure 2 11 Temperature equations UNITS This parameter selects the displayed units for temperature measurements DEG C Displays temperature measurement units in C DEG F Displays temperature measurement units in F K Displays temperature measurement units in K Kelvin Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com There is a multiple display for the temperature function that shows the reading expressed in all three temperature units SPEED The SPEED parameter sets the integration time of the A D converter the period of time the input signal is measured al so known as aperture It is discussed in paragraph 2 4 1
339. formation on limits PRINT 1 output 16 sour ttl on ttl Set line 1 true PRI 1 enter 16 Get response from 2002 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 20 STATus subsystem 3 20 1 D escription The STATus subsystem is used to control the status registers of the Model 2002 These registers and the overall status structure is explained in paragraph 3 7 The commands in this subsystem are summarized in Table 3 12 EVENt STATus M EASurement EV EN t Read M easurement Event Register STATus Q U EStionable EVEN t Read Questionable Event Register STATus O PERation EVENt Read O peration Event Register STATus O PERation TRIG ger EV EN t Read Trigger Event Register STATus O PERation ARM EVEN t Read Arm Event Register STATus O PERation ARM GEO uence EV EN t Read Sequence Event Register These query commands are used to read the event registers After sending one of these com mands and addressing the Model 2002 to talk a decimal value is sent to the computer The binary equivalent of this value determines which bits in the appropriate register are set The event registers are shown in Figures 3 21 through 3 26 Note that reading an event register clears the bits in that register For example assume that reading the Measurement Event Register results in an acquired deci mal value of 544 The binary equivale
340. fter this command is sent and the Model 2002 is addressed to talk the oldest message in the queue is sent to the computer Note The STATus QUEue NEXT query command performs the same function as the SYSTem ERRor query command see System subsystem PRINT 1 output 16 stat que Query oldest message in queu PRINT 1 enter 16 Get response message from 2002 ENABle lt list gt STATus Q U Eue ENABle lt list gt Enable messages for Error Q ueue lt list gt numlist where numlist is a specified list of messages that you wish to enable for the Error Queue ENABle Query list of enabled messages On power up all error messages are enabled and will go into the Error Queue as they occur Status messages are not enabled and will not go into the queue This command is used to specify which messages you want enabled Messages not specified will be disabled and prevented from entering the queue When this command is sent all messages will first be disabled then the messages specified in the list will be enabled Thus the returned list ENABle will contain all the enabled messages Messages are specified by numbers see Table 2 4 The following examples show various forms for expressing a message numlist Numlist 110 Single message 110 140 222 Messages separated by commas 110 222 Range of messages 100 through 222 110 222 230 Range entry and single entry separated by
341. function or entering a menu 15 82867 VDC Max 05 74602 Min 15 82867 Maximum Eon value value Figure 2 3 Maximum and minimum multiple display The resolution units and prefix on the bottom line are the same as shown for top line reading If necessary the bottom line values automatically change to scientific notation rounded to 4 5 digits 2 3 2 Information messages Press the INFO key to view context sensitive information from most of the displays An arrow lt q or on the bot tom line indicates that there is more information Use the cursor keys and gt to view the complete line To exit an INFO display just press INFO ENTER EXIT or a func tion key 2 3 3 Status and error messages During Model 2002 operation and programming you will encounter a number of front panel messages Typical messages are either of status or error variety as listed in Table 2 4 The most recent status or error messages can be momentarily displayed Just enter a configuration menu or the main menu and press the PREV key The display is blank if no message is queued 2 7 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation Table 2 4 Status and error messages cont Number Description Event 113 Undefined header EE 114 Header suffix out of range EE 120 Numeric data error EE 121 Invalid ch
342. functions the RANGE A and W keys increase and decrease the trigger level by 0 5 On temperature the keys have no effect 2 5 4 Autoranging To enable autoranging press the AUTO key The AUTO annunciator turns on when autoranging is selected While autoranging is selected the instrument automatically chooses the best range to measure the applied signal NOTE Autoranging should not be used when op timum speed is required 2 40 Note that up ranging occurs at 105 of range while down ranging occurs at 10 of range To cancel autoranging press AUTO or the RANGE A or Y key Pressing AUTO to cancel autoranging leaves the instru ment on the present range Pressing the RANGE Y key when the instrument has auto ranged to the lowest range displays the following momentary typical message and leaves the instrument in autorange Range at minimum 200 mVDC The instrument operates similarly if the RANGE A key is pressed when the instrument has autoranged to the highest range For the frequency function pressing the AUTO key returns the trigger level to 0 0V The AUTO key has no effect in the temperature function 2 6 Relative The rel relative operation subtracts a reference value from actual readings When rel is enabled by the REL key the in strument uses the present reading as a relative value Subse quent readings will be the difference between the actual input value and the rel value You can also enter and enable a
343. g is no longer greater than the High Limit 2 setting NTR Bit B5 Reading Available RAV Set bit indicates that a reading was taken and processed PTR or that a subsequent reading is in process NTR Bit B6 Not used 3 117 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 118 Bit B7 Buffer Available BAV Set bit indicates that there are at least two readings in the trace buffer PTR or the buffer has become empty NTR Bit B8 Buffer Half Full BHF Set bit indicates that the trace buffer is half full PTR or that the buffer is no longer half full NTR Bit B9 Buffer Full BFL Set bit indicates that the trace buffer is full PTR or that the buffer is no longer full NTR Bit B10 Not used Bit B11 Buffer Pretriggered BPT Set bit indicates that the trace buffer pretrigger event has occurred PTR or the operations associated with the pretrigger have been completed NTR Bits B12 through B15 Not used Bit Position B15 B12 B11 Event bm BPT BFL BHF BAV RAV HL2 LL2 HL1 LL1 ROF Decimal Weighting 2048 512 256 128 32 16 8 4 2 1 241 29 28 27 25 24 23 22 21 20 Value 01 O 1 0 1 0 1 O 1 0 1 0 1 0 1 0 1 0 1 Value 1 Measurement Event Set Events BPT Bu
344. ge S Energize the circuit using the installed connect disconnect device and make measurements without disconnecting the multimeter 5 De energize the circuit using the installed connect disconnect device 6 Disconnect the test leads from the circuit under test WARNING The maximum common mode voltage voltage between INPUT LO and chas sis ground is 500V peak Exceeding this value may cause a breakdown in insula tion creating a shock hazard 2 4 2 2 5 Power on default conditions Power on default conditions are those conditions the instru ment assumes when it is first turned on You can change these power on default conditions except the primary address by using the save setup feature that is available with the MENU key as described in paragraph 2 12 1 Depending on the installed memory option either one five or ten user defined setups can be stored any one of which could be selected as the power on default Table 2 42 in paragraph 2 12 1 lists the default conditions that are set at the factory to optimize bench and GPIB IEEE 488 operation 2 2 6 Warm up period The Model 2002 can be used within one minute after it is turned on However the instrument should be turned on and allowed to warm up for at least four hours before use to achieve rated accuracy 2 2 7 1EEE 488 primary address The IEEE 488 primary address of the instrument must be the same as the primary address you specify in the cont
345. ge off Y For TCAL 5 C normal autozero 1 year or 2 year accuracy can be found by applying the same speed accuracy ppm changes to the 1 year or 2 year base accuracy 12 Typical values Peak to peak noise equals 6 times rms noise 3 In burst mode display off Burst mode requires autozero refresh by changing resolution or measurement function once every 24 hours 14 For line frequency 10 1 15 Applies for 1kQ imbalance in the LO lead For 400Hz operation subtract 10dB For the 200V and 1000V ranges subtract 20dB 18 For noise synchronous to the line frequency Specifications are subject to change without notice SPEC 2002 Rev H February 2009 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Page 2 of 14 Keithley Instruments Inc Multimeter Specifications 28775 Aurora Road Cleveland Ohio 44139 1 888 KEITHLEY www keithley com DCV READING RATES e Readings Second with Time Measurement Default Readings Second to Memory Readings Second to IEEE 488 Stamp to IEEE 488 PLC Aperture Bits Digits Autozero Off Autozero On Autozero Off Autozero On Autozero Off Autozero On 10 167 ms 200 ms 29 8 6 5 2 1 7 6 5 2 1 6 6 5 2 1 6 2 33 4 ms 40 ms 27 TA 29 25 9 7 6 29 24 9 7 4 27 22 9 7 4 1 16 7 ms 20 ms 26 TA 56 48 47 40 55 45 46 38 50 41 42 34 0 2 3 34 ms 4 ms 23 6 235 209 154 137 225 200 146 130 152 135 1
346. ge without notice SPEC 2002 Rev H February 2009 Page 5 of 14 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com KEITHLEY Keithley Instruments Inc 28775 Aurora Road Cleveland Ohio 44139 1 888 KEITHLEY www keithley com Settling Characteristics Normal Mode rms avg Low Frequency Mode rms OHMS lt 300ms to 1 of step change lt 450ms to 0 1 of step change lt 500ms to 0 01 of step change lt 5s to 0 1 of final value Common Mode Rejection For 1kQ imbalance in either lead gt 60dB for line frequency 0 1 Maximum Volt Hz Product 2 x 10 V Hz for inputs above 20V Autoranging Autoranges up at 105 of range down at 10 of range TWO WIRE AND FOUR WIRE OHMS Model 2002 Multimeter Specifications Maximum Maximum Maximum Full Current Open HI Lead LO Lead Offset Range Scale Resolution Source Circuit Resistance Resistance Compensation 200 21 0000000 100 nO 7 2 mA 5V 50 0 100 10 2 V 2000 210 000000 1 yO 960 yA 5V 200 Q 100 Q 0 2V 2kQ 2100 00000 10 pO 960 pA 5V 200 Q 150 Q 0 2 Vto 2 V 20 kQ 21 0000000 100 pO 96 yA 5V 1 5 kO 1 5 kO 0 2 Vto 2 V 200 kO 210 000000 1mQ 9 6 pA 5V 1 5 KQ 15k0 2MO 2 10000000 10 mQ 1 9 UA DV 1 5 kO 1 5 kO 20 MQ 21 0000000 100 MQ 1 4 yA 14V 200 MO 210 000000 10 1 4 yA 14V 1GQ 1 05000000 100 1 4 yA 14 V Range ppm of reading
347. gg Decimal W eighting Value Value 1 Operation Event Set 0 Operation Event Cleared Figure 3 23 Operation Event Register Trigger E vent Register Bit B0 Not used Events Idle Idle state of the 2002 Arm Waiting for Arm Trig Waiting for Trigger Meas Measuring Cal Calibrating Bit B1 Sequence 1 Seq1 Set bit indicates that the instrument is in the trigger layer PTR or that the instrument has exited from the trigger layer NTR Bits B2 through B15 Not used Bit Position Bl BO Event Seql Decimal Weighting 2 21 Value 01 Value 1 Event Bit Set Event Seql Sequence 1 0 Event Bit Cleared Figure 3 24 Trigger Event Register Arm E vent Register Bit BO Not used 3 120 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Bit B1 Sequence 1 Seq1 Set bit indicates that the instrument is in an arm layer PTR or that the instrument has exited from the arm layers NTR Bits B2 through B15 Not used Bit Position B15 B2 Bl BO Event gt Decimal W eighting Value Value 1 Event Bit Set Event Seql Sequence 1 0 Event Bit Cleared Figure 3 25 Arm Event Register Sequence E vent R egister Bit BO Not used Bit B1 Layer 1 Lay1 Set bit indicates that instrument operation is in
348. gister after all pending commands are complete On power up or when CLS or RST is executed the Model 2002 goes into the Operation Complete Command Idle State OCIS In this state there are no pending overlapped com mands There are three overlapped commands used by the Model 2002 INITiate INITiate CONTinuous ON TRG When the OPC command is sent the Model 2002 exits from OCIS and enters the Operation Complete Command Active State OCAS In OCAS the instrument continuously monitors the No Operation Pending flag After the last pending overlapped command is complete No Operation Pending flag set to true the Operation Complete OPC bit in the Standard Event Status Register sets and the instrument goes back into OCIS Note that the instrument always goes into OCAS when OPC is executed If there are no pend ing command operations e g trigger model in idle state the Model 2002 immediately sets the OPC bit and returns to OCIS When used with the INITiate or INITiate CONTinuous ON command the OPC bit of the Stan dard Event Status Register will not set until the Model 2002 goes back into the idle state The initiate operations are not considered finished until the instrument goes into the idle state When used with the TRG command the OPC bit will not set until the operations associated with the TRG command and the initiate command are finished The TRG command is con sidered to be finished when the Device Action com
349. gure 3 27 Figure 3 28 Figure 3 29 Figure 3 30 Figure 3 31 Figure 3 32 Figure 3 33 Figure 3 34 Figure 3 35 Figure 3 36 Figure 3 37 Figure 3 38 Figure 3 39 D Figure D 1 Figure D 2 Figure D 3 Vili IEEE 488 Reference TEEE 488 CONNDECTOL escocia ME TEEES488 CONNDECHONS cuina talon ion TEEE 488 connector location Model 2002 status register SETUCTUTES ia cc ccc scs seaecncssssseesnscvensteanedecssesveovaunssbebowsses SEEE EEE eeaeee Standard eventStal s sisrersip seei caido eere ta e ee EEE ESERE EE ET E RE E SEE EEE E E E EE R a EEE RETENE R EE Operation eyent StalUs enee AE ENEE ENEE EE EE AORE CEE AE Ee EEN Arm event SLALUS unit EES Eve Sequence eyent EE Trigger E EE Meastifement event Status seier abia o ees ie Eege ed Questionable event status ooooccnonccccnonccnononcncnnonnnonononononnnnonnnnnnnn nn nono nnnnnn nn nnnnn nn nono n rro nnrnnnn rn nano rrrnnnnnnnnnss Status byte and service request SRQ ou eeceseesseceseeceseeceseeeneeceeeesseceeneesaeceseeceeeecaeeeneeceeeeeaeeeseeees Trigger Model IEEE 488 bus operation oooocnnccnonononoonnooncnnncnnonnncnnonnnnnnnnnnnnonnnrnn cnn nena crono nn non cre ncrnnons Standard Event Enable Register sde ee NEE See EE Ee leo li Standard Event Stats Register oc sccisisccsescssusecsescascesvieandasteapessipsosusccedeteenbs sovebasebabdessdpnesiissbtateadesssneouse Service Request Enable REGISTER ricino iba Status Byte A vances sveave EEN EEE EEE E EE OEE UREE E Ee a EEE EVKE
350. hat the measure layer of the trigger model be configured for the Immediate control source infinite count and zero delay When externally triggered EXT TLINK TIMER or GET the maximum reading rate for either stream mode is 680 per second Table 3 17 Minimum delay times for stream mode Function Range Delay msec DCV 200mV 150 2V 160 20V 150 200V 220 1000V 210 ACV RMS and average 200mV 270 2V 260 20V 210 200V 200 750V 210 DCI 2004 A 130 2mA 140 20mA 170 200mA 140 2A 190 ACI RMS and average 2004A 230 2mA 180 20mA 230 200mA 220 2A 160 Q2 209 190 2000 180 2kQ 140 20kQ 170 200kQ 270 2MQ 880 20MQ 1840 200MQ 1920 IGQ 1920 Program fragment 1 Burst acquisition PRI 1 output 16 syst amet burs PRINT 1 output 16 init Select burst mode Start acquisition process Program fragment 2 ASTReam mode PRINT 1 output 16 opc PRINT 1 enter 16 PRINT 1 output 16 syst amet astr SLEEP 1 FOR I 1 TO 200 PRINT 1 enter 16 Send opc Wait for operation complete Go into ASTReam mode Wait for 1 second Set counter to loop 200 times Get reading from 2002 3 142 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 3 21 8 Parameters Query Description Program fragment 3 21 9 Parameters Query Description IEEE 488 Reference NEXT I Repeat loop un
351. he LLO command is used to prevent local operation of the instrument After the unit receives LLO all its front panel controls except POWER are inoperative In this state press ing LOCAL will not restore control to the front panel The GTL command restores control to the front panel Program fragment PRINT 1 remote 16 Place 2002 in remote RINT 1 local lockout Lock out front panel including LOCAL key Wait 6 seconds Restore front panel op eration SLEEP 6 PRINT 1 local 16 Table 3 1 General bus commands and associated statements Command Programming statement Effect on Mode 2002 REN REMOTE 16 Goes into effect when next addressed to listen IFC ABORT Goes into talker and listener idle states LLO LOCAL LOCKOUT LOCAL key locked out GTL LOCAL 16 Cancel remote restore front panel operation for 2002 LOCAL Cancel remote restore front panel operation for all devices DCL CLEAR Returns all devices to known conditions SDC CLEAR 16 Returns Model 2002 to known conditions GET TRIGGER 16 Initiates a trigger SPE SPD SPOLL 16 Serial Polls the Model 2002 3 4 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 3 5 4 GTL go to local The GTL command is used to take the instrument out of the remote state Operation of the front panel keys will also be restored by GTL Program fragment Place 2002 in remote Wait
352. his command is used to enable or disable preamp Program fragment PRINT 1 output 16 inp pre stat on Enable preamp PRINT 1 enter 16 FlLTer lt name gt INPut PREamp FiLTer lt name gt Select filter response Get response from 2002 Parameters lt name gt SLOW Select slow filter response MED Select medium filter response FAST Select fast filter response Query FILTer Query selected filter response Description This command is used to select the filter response for the preamp Note that only the FAST response is available for the ACV and FREQ functions Program fragment PRINT 1 output 16 inp pre filt fast PRINT 1 enter 16 Select FAST filter response Get response from 2002 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 16 OUTPut subsystem The OUTPut subsystem is used to set polarities for the digital output port Commands in this subsystem are summarized in Table 3 8 LSENse lt name gt OUTPut TTL 1 LSENse lt name gt Set polarity of line 1 OUTPut TTL2 LSENse lt name gt Set polarity of line 2 OUTPut TTL3 LSENse lt name gt Set polarity of line 3 OUTPut TTL4 LSENse lt name gt Set polarity of line 4 Parameters lt name gt AHIGh Set polarity of specified line to active high ALOW Set polarity of specified line to active low Query LSENse Query polarity of specified li
353. hoose from AC or DC Example CURRent AC COUPling AC Select AC coupling lt name gt Name parameter Select a parameter name from a listed group Example lt name gt NEVer NEXt ALWays PRETrigger TRACe FEED CONTrol PRETrigger 3 23 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 24 lt NRf gt Numeric representation format This parameter is a number that can be expressed as an integer e g 8 a real number e g 23 6 or an exponent 2 3E6 Example SYSTem KEY 16 Press NEXT key from over the bus lt n gt Numeric value A numeric value parameter can consist of an NRf number or one of the following name parameters DEFault MINimum or MAXimum When the DEFault parameter is used the instrument is programmed to the RST default value When the MINimum parameter is used the instrument is programmed to the lowest allowable value When the MAXimum param eter is used the instrument is programmed to the largest allowable value Examples TRIGger TIMer 0 1 Sets timer to 100msec TRIGger TIMer DEFault Sets timer to 0 1sec TRIGger TIMer MINimum Sets timer to Imsec TRIGger TIMer MAXimum Sets timer to 999999 999sec lt list gt List Specify one or more switching channels Examples ROUTe SCAN 1 10 Specify scan list 1 through 10 ROUTe SCAN 2 4 6 Specify scan list 2 4 and 6 Angle brackets lt g
354. hting 2 1 21 29 Value 0 1 O 1 Value 1 Enable Positive Transition 0 Disable Positive Transition A Positive Transition PTR Register Bit Position B15 B11 B10 B9 B1 BO Event Set Cal Decimal W eighting 2 1 ey on Value 0 1 0 1 Value 1 Enable Negative Transition 0 Disable Negative Transition B Negative Transition N TR Register Figure 3 35 Operation Transition Filter 3 128 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Effects of positive transitions on the Trigger E vent Register Positive transition effect on Trigger event Trigger Event Register Sequence 1 Sets B1 when waiting in Trigger Layer Bit Position BO Event Decimal W eighting Value Value 1 Enable Positive Transition 0 Disable Positive Transition A Positive Transition PTR Register BO Value 1 Enable Negative Transition 0 Disable N egative Transition B Negative Transition N TR Register Figure 3 36 Trigger Transition Filter 3 129 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Effects of positive transitions on the A rm E vent Register Positive transition effect on Arm event Arm Event Register Sequence 1 Sets B1 when in an arm layer Bit Position B15 B2 B1 BO Event Seql D
355. iate digital pattern is placed on the other three lines of the output port the gt 10usec strobe pulse is asserted on line 4 The strobe is used to inform your external binning circuit that the output port lines 1 2 and 3 is ready to be read PRINT 1 output 16 calc3 bstr stat on stat Enable strobe and query PRINT 1 enter 16 Get response message from 2002 IMM ediate CALCulate3 IM M ediate Perform CALC 3 When you change the configuration of the limit test the next reading is evaluated according to that new test configuration If the instrument is not in a continuous measurement mode e g waiting for a manual trigger the test will not be performed until the next reading conversion occurs This action command allows you to re process the current input data to test new limits For example assume the instrument is in a non continuous measurement mode and requires a man ual trigger to cause the next reading conversion Changing the test limits will not affect the last test result However sending the MMediate command reprocesses the data and evaluates the reading according to the new test limits Note that sending the MMediate command does not initiate a reading conversion PRINT 1 output 16 trig sour bus Place 2002 in one shot mode SLEEP 3 Wait three seconds PRINT 1 output 16 calc3 inm Re perform limit test 3 75 Test Equipment Depot 8
356. ic effects on DCI and ACI it is covered here AUTO This parameter for a digital filter optimizes its use for the present measurement function The defaults for auto matic filtering of DCI and ACI are listed in Table 2 14 RESOLUTION The RESOLUTION parameter sets the display resolution It is discussed in paragraph 2 4 1 DC and AC voltage Only the differences for DC and AC current are noted here AUTO Refer to Table 2 15 for the resolution associated with the integration time MEASUREMENT MODE This option selects the DC current measurement mode either normal or in circuit measurements NORMAL This option is for normal current measuring where the meter is placed in series with the current path and the voltage across an internal shunt resistor is measured Table 2 14 DCI and ACI auto filter Measurement Noise function and type State Type Readings tolerance Mode DC current On Advanced 10 1 0 Moving DC in circuit current On Advanced 10 1 0 Moving AC current Off Advanced 10 5 0 Moving 2 25 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation Table 2 15 DCI and ACI auto resolution Measurement function and type Integration time Resolution DC current 0 01 to lt 0 02 PLC 4 5d 0 02 to lt 0 20 PLC 5 5d 0 20 to lt 2 00 PLC 6 5d 2 00 to 50 PLC 7 5d DC in circuit current Not use
357. ice In general this consists of sourcing a current through the device and measuring the voltage drop across the device 2 Turns off the internal current source and again measures the voltage drop across the device This is the voltage caused by an external device 3 Calculates and displays the corrected resistance value Offset compensation not only corrects for small error voltages in the measurement circuit but it also compensates for thermal voltages generated within the Model 2002 Consequently the use of offset compensation yields greater accuracy The OFFSETCOMP selections are explained as follows ON Enables offset compensation OFF Disables offset compensation Offset compensated readings are indicated by OCmp to the right of the reading Front Panel Operation Note that the offset compensation settings of the ohms func tions are discrete Thus enabling offset compensation in 2 wire ohms has no effect on 4 wire ohms MAXAUTORANGE By setting an upper limit on autoranging you can prevent changes to ranges that you do not want to use This speeds up the reading rate while still using auto ranging MAXAUTORANGE selections for 22 and Q4 1G Q 200M9 20M9 2MQ 200kQ or 20kQ Sets maxi mum autorange limit for Q2 2MQ 200kQ 20kQ 2kQ 200Q or 20 Sets maximum autorange limit for Q4 Multiple displays There are three multiple displays available just for the resis tance functions e Source c
358. igger Link example 1 With the Model 706 set for External Triggering the test would start when the single scan mode is selected and initiated Asynchronous Trigger Link example 2 In this example the test system Figure 2 23 includes a Model 2002 to measure each DUT at two different bias lev els that are provided by a Model 230 voltage source With the source set to the first voltage level the ten channels are scanned and measured The source is then set to the second voltage level and the ten channels are again scanned and measured Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com oD Trigger OTO b J 2002 Multimeter Trigger Link Cable 8501 Figure 2 22 Connections using Trigger Link adapter DUT 8502 Trigger Link Adapter Front Panel Operation BNC to BNC Cables 2 7501 ef Channel Ready External Bor Se Di aAa Di Ei Di Di ii ii Di DUT 2 230 Voltage Source Figure 2 23 DUT test system asynchronous example 2 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 7011 MUX Card 706 Scanner eH Input LO 2002 Multimeter 2 57 Front Panel Operati
359. ile clear all is the only way for the operator to clear the reading buffer TIMESTAMP When using FULL data grouping see DATA GROUP a timestamp is included with each buffer reading This menu selection is used to check and or change the timestamp type and format TYPE This menu item is used to check and or change the timestamp type Note that changing the timestamp type clears the buffer e RELATIVE TIME With this selection timestamps are oriented to a timer with the first buffer reading timestamped at 0 000000 seconds Each following timestamp is then based on the currently selected for mat see FORMAT With the ABSOLUTE format selected the timestamp for each reading is referenced in seconds to the first buffer reading With the DELTA format selected each timestamp is referenced in sec onds to the previous timestamp e REAL TIME With this selection timestamps are oriented to the real time clock and are based on the cur rently selected format see FORMAT With the ABSO LUTE format selected each reading is simply timestamped with the actual time and date Time can be expressed in the 12 hour AM PM format or the 24 hour format see CLOCK in paragraph 2 12 7 With the DELTA format selected the first buffer read ing is timestamped at 00000d 00h 00m 00 00s zero days hours minutes and seconds Each subsequent timestamp is referenced in days hours minutes and seconds to the previous timestamp Tim
360. ime clock control source for the Arm Layer must be set using the 24 hour format Note that real time timestamps for bus readings are always provided in the 24 hour format regardless of the FORMAT selection Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 2 105 Front Panel Operation 2 106 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 1 Introduction This section contains reference information on programming the Model 2002 over the IEEE 488 bus and is organized as follows 3 2 EEE 488 bus connections Explains instrument con nections to the IEEE 488 bus 3 3 Primary address selection Explains how to set the primary address from the front panel 3 4 QuickBASIC 4 5 programming Summarizes pro gramming using QuickBASIC 4 5 with the KPC 488 2 interface and Universal Language Driver CECHP 3 5 General bus commands Covers the general IEEE 488 commands required for basic operations such as placing the unit in remote 3 6 Front panel aspects of IE E E 488 operation Covers status indicators messages that pertain to bus opera tion and the use of the LOCAL key 3 7 Status structure Explains the various registers and queues that make up the status structure of the Model 2002 3 8 Trigger model Explains the operation process Trig ger Model over the IEEE 488 bus 3 9 Progr
361. ines configured as desired press ENTER OUTPUT SENSE Use this menu item to check or change the sense of the digital output lines The sense of each line can be active high ON 5V or active low ON OV When OUTPUT SENSE is selected you will be prompted to select the desired output line e TTL1 TTL2 TTL3 OR TTL4 Selects the digital output line and displays the following options ACTIVE HIGH Use this option to set the sense of the selected output line to active high ACTIVE LOW Use this option to set the sense of the selected output line to active low To check or change output sense place the cursor on the appropriate line and press ENTER Cursor position indicates the present logic sense for the selected line ACTIVE HIGH or ACTIVE LOW To change the sense place the cursor on the alternate selection and press ENTER Front Panel Operation INPUT Use this menu item to read ON or OFF the digital input line Its sense is fixed at active high ON 5V The status is updated when INPUT is selected SERIAL This item displays the serial number memory option SCPI version and firmware revision levels of the instrument The following information is displayed Serial XXXXXX MEM1 SCPI version 1991 0 p gt lt software rev AXX AY Y where XXXXXX is the serial number of the instrument MEM is the memory option present also could be STD or MEM2 AXX is the firmware level for the main microcontr
362. ing and scan spacing are set to Immediate the scan starts as soon as the scanner is taken out of the idle state by pressing the STEP key When the front panel STEP key is pressed The scanner arms and closes the first channel e After Channel 1 1 settles a trigger is sent from Channel Ready of the Model 7001 7002 to External Trigger Input of the Model 2002 to trigger a measurement of DUT 1 e After the Model 2002 completes the measurement it outputs a trigger from Meter Complete Output to Exter nal Trigger of the Model 7001 7002 which closes the next channel e After Channel 1 2 settles a trigger is sent to the Model 2002 to trigger a measurement of DUT 2 This process continues until all ten channels are scanned and measured The data store capability of the Model 2002 could be used to store the measurements as they occur Just press the STORE Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com key to set the number of readings to store then press ENTER The Model 2002 waits with the asterisk annuncia tor lit for an external trigger from the Model 7001 7002 before taking a reading storing it and sending a trigger pulse External triggering example 2 External triggering can also be used in a test system consist ing of a Model 2002 Multimeter and a Model 706 Scanner with an appropriate scanner card The external trigger connections are the same as those shown
363. ing takes about 2msec reading If any filter or math operations are enabled the post processing time is longer To make this reading rate possible certain tradeoffs are made with the unit s function ality as described in the following paragraph Before burst mode can be enabled the following changes must be made to the present instrument configuration Select a valid measurement function for the burst mode as listed in Table 2 30 e Select a fixed range for the expected signal or choose autorange to let the instrument select a fixed range when burst mode starts e Set the trigger event source in the measure layer to immediate external trigger link or timer e Disable any multiple displays e Disable scanning 2 65 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation Table 2 30 Available functions in burst mode Function Type DC voltage Normal AC voltage RMS average DC current Normal AC current RMS average 2 wire resistance Normal If these changes are not made a Settings conflict error or similar message is displayed when you attempt to turn on burst mode When burst mode is selected the Model 2002 is automati cally configured for taking fast measurements The instru ment s previous settings are restored when burst mode is aborted Selecting burst mode makes these temporary changes e Triggers a
364. ings X according to the following polynomial calculation Y a2 X al X a0 where X is the normal display reading a2 al and a0 are user entered constants Y is the displayed result The value of the a2 al and a0 constants can be changed through the CONFIGURE MATH menu see para graph 2 10 4 The before and after calculation can be viewed with one of the multiple displays as described in paragraph 2 10 5 When necessary the resulting Y value is displayed in scientific notation The polynomial can be used in place of the more familiar mX b slope calculation Simply let a2 0 al m and a0 b Over the bus the mX b calculation still exists and is coupled to the polynomial calculation Thus changing al and or a0 changes m and or b respectively See paragraph 3 11 for details 2 75 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation 2 10 2 Percent This operation lets you specify a target reading value The displayed reading will be expressed as a percentage of the target value often in scientific notation The percentage cal culation is performed as follows Input Reading 100 P t eel Target Value As an example consider the default target value for percent age calculations where 100 1 000000e 00 Therefore on the 200uA range a 100HA input would be 0 01 of the target value and a typical reading would b
365. input line These commands are used to select an input line for the asynchronous Trigger Link of the spec ified layer Keep in mind that asynchronous Trigger Link input and output see OLINe cannot share the same line If you assign the input to a line that is already being used for the output an error occurs and the command is ignored PRINT 1 output 16 trig tcon asyn ilin 3 inlin Select input line PRI 1 enter 16 Get response from 2002 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Parameters Query Description Program fragment Parameters Query Description Program fragment 3 23 10 Parameters Query IEEE 488 Reference OLINe lt NRf gt ARM SEQ uence 1 LAYer 1 TCO Nfigure ASYN chronous OLINe lt NRf gt Select output trigger line arm layer ARM SEQ uence 1 LAYer2 TCO Nfigure ASYN chronous OLINe lt NRf gt Select output trigger line scan layer TRIG ger SEQ uence 1 1 TCO Nfigure ASYN chronous OLINe lt NRf gt Select output trigger line measure layer lt NRf gt 1 Line 1 lt NRf 4 Line 4 2 Line 2 5 Line 5 3 Line 3 6 Line 6 OLINe Query programmed output line These commands are used to select an output line for the asynchronous Trigger Link of the spec ified layer Keep in mind that asynchronous Trigger Link input and output cannot share the same line If you assign the output to a li
366. instrument to the bench or GPIB default conditions see Table 2 42 The RESET options are explained as follows BENCH With this option the instrument returns to the bench default conditions see Table 2 42 After selecting BENCH the instrument returns to the normal display of readings after requesting an ENTER to confirm your selection GPIB With this option the unit returns to the GPIB default conditions see Table 2 42 After selecting GPIB the instru ment returns to the normal display of readings after request ing an ENTER to confirm your selection Note that the instrument goes to the Idle state Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation Table 2 42 Factory default conditions Function or operation Bench default GPIB default AC current AC type RMS RMS Coupling AC AC Filter Off Off Auto On Off Averaging Off Off Readings 10 10 Advanced On On Readings 10 10 Noise tolerance level 5 5 Filter mode Moving Repeat Range Auto Auto Relative Off Off Value 0 0 0 0 Resolution Auto 5 5d Auto 5 5d Speed Normal 1 PLC Normal 1 PLC AC voltage AC type RMS RMS Peak spikes window 0 1sec 0 1sec Coupling AC AC Filter Off Off Auto On Off Averaging Off Off Readings 10 10 Advanced On On Readings 10 10 Noise tolerance level 5 5 Filter mode Moving Repeat Range Auto Auto Relative Off Off Value 0 0 0 0 Resolut
367. ion Read the negative transition register y CONDition Read the condition register y 3 20 5 SEQuence Path to control sequence status registers y EVENt Read the event register Note 2 y 3 20 1 ENABle lt NRf gt Program the enable register Note 3 y 3 20 2 ENABle Read the enable register y PTRansition lt NRf gt Program the positive transition register Note 4 y 3 20 3 PTRansition Read the positive transition register y NTRansition lt NRf gt Program the negative transition register Note 5 y 3 20 4 NTRansition Read the negative transition register y CONDition Read the condition register y 3 20 5 TRIGger Path to control trigger status registers y EVENt Read the event register Note 2 y 3 20 1 ENABle lt NRf gt Program the enable register Note 3 y 3 20 2 ENABle Read the enable register y PTRansition lt NRf gt Program the positive transition register Note 4 y 3 20 3 PTRansition Read the positive transition register y NTRansition lt NRf gt Program the negative transition register Note 5 y 3 20 4 NTRansition Read the negative transition register y CONDition Read the condition register y 3 20 5 3 60 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Table 3 12 Continued STATus command summary IEEE 488 Reference Default Command Description parameter SCPI Ref STAT
368. ion You can change the rel value using the cursor keys lt q and and the RANGE A and W keys When ENTER is pressed the instrument returns to the measurement display state with that value of rel enabled If you try to enter an invalid rel value a message indicating the rel limit will be displayed and the rel operation will be cancelled Previously stored rel values are converted if temperature or AC voltage units are changed For example a rel value of 100 that was stored with units of DEG C is converted to 212 if temperature units are changed to DEG F Note that a bench or GPIB reset clears any stored rel values and disables rel for all functions 2 6 2 Enabling rel From the normal reading display the REL key toggles the rel operation on and off Each time rel is enabled by the REL key the present reading becomes the new rel value for that function You cannot rel an overflow reading To make a new reading the rel value rel must first be dis abled and then enabled again Disabling rel does not clear any stored rel value Front Panel Operation When rel is enabled the resulting reading is the algebraic difference between the actual input value and the rel value rel d reading actual value relative value With math enabled the rel d reading is acted on by the math operation displayed reading math operation rel d reading A rel value expressed in dB or dBm is applied after the read ing is referenced
369. ion Auto 5 5d Auto 5 5d Speed Normal 1 PLC Normal 1 PLC Units Volts Volts dB reference 1V 1V dBm reference 750 750 Autozero On Synchronous On Synchronous Buffer Burst mode No effect No effect Control No effect No effect Count No effect No effect Data group No effect No effect Feed No effect No effect Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 2 91 Front Panel Operation Table 2 42 Factory default conditions cont Function or operation Bench default GPIB default DC current Filter On Off Auto On Off Averaging Off Off Readings 10 10 Advanced On On Readings 10 10 Noise tolerance level 1 1 Filter mode Moving Repeat Measurement mode Normal Normal Range Auto Auto Relative Off Off Value 0 0 0 0 Resolution Auto 6 5d Auto 6 5d Speed Normal 1 PLC Normal 1 PLC DC voltage Filter On Off Auto On Off Averaging Off Off Readings 10 10 Advanced On On Readings 10 10 Noise tolerance level 1 1 Filter mode Moving Repeat Range Auto Auto Relative Off Off Value 0 0 0 0 Resolution Auto 7 5d Auto 7 5d Speed Normal 1 PLC Normal 1 PLC Digital I O Output states No effect No effect Output sense No effect No effect Frequency Coupling AC AC Maximum signal level Function Voltage Voltage Voltage level 10V 10V Current level 1mA 1mA Relative Off Off Value 0 0 0 0 Resolution Auto 5d Auto
370. ion command DIGits AUTO is coupled to the command that manually selects resolution DIGits lt n gt When auto resolution is enabled the parameter value for DIGits lt n gt changes to the automatically selected resolution value Thus when auto resolution is dis abled the instrument remains at the automatically selected resolution PRINT 1 output 16 volt dc dig auto on auto Enable auto resolution PRI 1 enter 16 Get response from 2002 AVERage commands The AVERage commands are used to configure and control the filter See paragraph 2 9 for details TCONtrol lt name gt SEN Se 1 CU RRent AC AVERage TCONtrol lt name gt Select filter type for ACI SEN Se 1 CU RRent D C AVERage TCONtrol lt name gt Select filter type for DCI SEN Se 1 VO LTage AC AVERage TCONtrol lt name gt Select filter type for ACV SEN Se 1 VO LTage DC AVERage TCONtrol lt name gt Select filter type for DCV SEN Se 1 RESistance AVERage TCONtrol lt name gt Select filter type for Q2 SEN Se 1 FRESistance AVERage TCONtrol lt name gt Select filter type for Q4 SEN Se 1 TEM Perature AVERage TCONtrol lt name gt Select filter type for TEMP lt name gt REPeat Select repeating filter MOVing Select moving filter TCONtrol Query filter type These commands are used to select the type of averaging filter REPeat or MOVing for the specified function Test Equipment Depot 800 517 8431 99 Washington S
371. ire Filter On Off Auto On Off Averaging Off Off Readings 10 10 Advanced On On Readings 10 10 Noise tolerance level 1 1 Filter mode Moving Repeat Offset compensation Off Off Range Auto Auto Maximum autorange 2MQ 2MQ Relative Off Off Value 0 0 0 0 Resolution Auto 7 5d Auto 7 5d Speed Normal 1 PLC Normal 1 PLC Scanning Channels No effect No effect Scan list Internal list External list Function Scan operation Ratio Reference channel Measure channel Function Delta Reference channel Measure channel Function No channels No channels DC voltage None 5 10 DC voltage 3 10 DC voltage No channels No channels DC voltage None 5 10 DC voltage 5 10 DC voltage 2 94 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation Table 2 42 Factory default conditions cont Function or operation Bench default GPIB default Temperature Filter On Off Auto On Off Averaging On On Readings 10 10 Filter mode Moving Repeat Relative Off Off Value 0 0 0 0 Resolution Auto 0 01 C Auto 0 01 C RTDs Type PT100 PT100 Resistance at 0 C 1000 1000 Alpha 0 00385 0 00385 Beta 0 10863 0 10863 Delta 1 49990 1 49990 Sensor 4 wire RTD 4 wire RTD Speed Normal 1 PLC Normal 1 PLC Thermocouples Type J J Reference junction Simulated Simulated Default temperature 23 C 23 C Real junction temp 10mV
372. is process repeats until all channels in the scan list are scanned The instrument defaults to this selection if it does not detect a scanner card on power up RATIO and DELTA Either of these two selections configures the Model 2002 to measure the two specified internal scanner channels and then compute the ratio or difference delta between them When Front Panel Operation RATIO or DELTA is selected the instrument will close the scanner reference channel and then wait for a trigger When the reading is triggered the unit will make a measurement on the reference channel switch to the measurement channel and then take a second measurement After measuring the measurement channel the unit will compute and display the ratio or delta value and switch back to the reference channel to wait for the next trigger Note that the ratio mode uses 7 1 2 digits of display resolution but the channel number will not be displayed The following options are available for RATIO and DELTA MEASURE This option is used to select the measure chan nel After selecting MEASURE place the cursor on the desired channel and press ENTER REFERENCE This option is used to select the measure channel After selecting REFERENCE place the cursor on the desired channel and press ENTER FUNCTION This option is used to select the function After selecting FUNCTION place the cursor on the desired function DCV Q2 or Q4 and press ENTER Ratio and
373. is restricted to 2 5V If using the digital output to sink current from external devices a Model 2002 containing the additional 10kQ resis tor will function correctly The transistor switch is open restricting current flow through the external device in the high state 5V However if the output is directly used as an input to a typical logic input the 2 5V high state may not be reliably detected as a high To correct this condition if a 2 5V high is unacceptable add external 1kQ pull up resis tors to the logic circuit inputs remove the built in test resis tors R734 R737 R739 and R741 or use an external voltage supply External voltage supply Each output can be operated from external voltage supplies voltage range from 5V to 30V applied through the device being driven Refer to Figure 2 37 for a simplified schemat ic of the digital I O port The high current sink capacity of the output driver allows direct control of relays solenoids and lamps with no additional circuitry needed Each output channel contains a fly back diode for protection when switching inductive loads such as a low power solenoid or relay coils To use these fly back diodes connect the exter nal supply voltage to pin 4 of J1031 the digital I O port Make sure the external supply voltage is between 5V and 30V and the current required by the device does not exceed 100mA Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02
374. is the programmed control source The control source is programmed from the TRIGger subsystem see paragraph 3 22 TRG can also be used as the pre trigger for buffer operation PRINT 1 output 16 trg Trigger 2002 TST self test query Run the self test and acquire the result This query command is used to perform a checksum test on ROM and places the coded result 0 or 1 in the Output Queue When the Model 2002 is addressed to talk the coded result is sent from the Output Queue to the computer A returned value of zero 0 indicates that the test passed and a value of one 1 indicates that the test has failed PRINT 1 output 16 tst Run test and query result PRINT 1 enter 16 Send response message to 2002 3 39 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 10 15 Description Program fragment 3 40 WAI wait to continue prevent the execution of commands until all previous commands are completed There are two types of device commands Sequential commands and Overlapped commands A Sequential command is a command whose operations are allowed to finish before the next com mand is executed An Overlapped command is a command that allows the execution of subse quent commands while device operations of the Overlapped command are still in progress The WAI command is used to hold off the execution
375. isable auto filter AUTO Query auto filter TRANsducer lt name gt Select transducer RTD FRTD TCouple DTC or INTer FRTD 3 18 17 nal TRANsducer Query transducer RTD Path to configure RTD measurements 3 18 18 TYPE lt name gt Select RTD parameters PT100 D100 F100 PT385 PT100 PT3916 USER or SPRTD TYPE Query RTD type ALPHa lt NRf gt Specify constant for USER type 0 to 0 01 0 00385 ALPHa Query alpha BETA lt NRf gt Specify constant for USER type 0 to 1 0 111 BETA Query beta DELTa lt NRf gt Specify constant for USER type 0 to 5 1 507 DELTa Query delta RZERo lt NRf gt Specify constant for USER type 0 to 1000 100 RZERo Query rzero SPRTD RZERo lt NRf gt Set RTD zero value 100 A4 lt NRf gt Set A4 coefficient B4 lt NRf gt Set B4 coefficient A7 lt NRf gt Set A7 coefficient B7 lt NRf gt Set B7 coefficient C7 lt NRf gt Set C7 coefficient TCouple Path to configure TC measurements 3 18 19 TYPE lt name gt Select thermocouple type J T K E R S B or N J TYPE Query TC type RJUNctionX Path to configure reference junctions X 1 to 5 3 18 20 RSELect lt name gt Select reference type SIMulated or REAL SIMulated RSELect Query reference type SIMulated lt n gt Specify simulated temperature 23 C SIMulated Query simulated temperature REAL Command path to specify real reference junction TCOefficient lt n gt Specify TC 0 0
376. ise pickup Care must be taken to provide adequate shielding Specifications are subject to change without notice SPEC 2002 Rev H February 2009 Page 7 of 14 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com KEITHLEY Keithley Instruments Inc 28775 Aurora Road Cleveland Ohio 44139 1 888 KEITHLEY www keithley com Model 2002 Multimeter Specifications 4 WIRE RESISTANCE READING RATES Error Bookmark not defined Readings or Readings with Time Stamp Second to Memory or IEEE 488 Measurement Default Autozero Off Autozero Off Autozero On Autozero On PLC Aperture Bits Digits Offset Comp Off Offset Comp On Offset Comp Off Offset Comp On 10 167 ms 200 ms 29 8 6 5 3 2 5 2 1 6 1 0 8 2 33 4 ms 40 ms 27 Th 27 22 13 10 7 9 7 4 4 3 5 1 16 7 ms 20 ms 26 Th 50 41 25 20 42 34 20 16 0 2 3 34 ms 4 ms 23 6 154 137 76 68 115 102 54 48 0 1 1 67 ms 2 ms 22 6 184 176 92 88 123 118 63 60 0 02 334 us 400 us 20 5 186 186 107 107 126 126 72 72 0 01 167 us 167 ys 19 4 211 211 107 107 133 133 72 72 DC AMPS DCI INPUT CHARACTERISTICS AND ACCURACY Maximum Relative Accuracy Temperature Coefficient Burden ppm of reading ppm of range ppm of reading ppm of range C Range Full Scale Resolution Voltage 24 Hours 90 Days 1 Year 2 Years Outsi
377. isters As shown in the illustrations all status register sets except the standard event status register set have a condition regis ter A condition register is a real time read only register that constantly updates to reflect the current operating conditions of the instrument For example while a calculation is being performed bit B9 Calc of the Operation Condition Regis ter is set When the calculation is completed bit B9 clears The CONDition query commands in the STATus Sub system are used to read the condition registers See para graph 3 20 for details 3 7 2 Transition filters As shown in the illustrations all status register sets except the standard event status register set have a transition filter A transition filter is made up of two registers that are pro grammed by the user It is used to specify which transition 0 to 1 or 1 to 0 in the corresponding condition register will set the corresponding bit in the event register A filter can be programmed for positive transitions PTR negative transitions NTR or both When an event is pro grammed for a positive transition the corresponding bit in the event register sets when the corresponding bit in the con dition register changes for O to 1 Conversely when pro grammed for a negative transition the bit in the event register sets when the corresponding bit in the condition register changes from to 0 The PTR and NTR commands in the Status Subsystem
378. ital UO Receptacle Connector J1031 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 2 101 Front Panel Operation Model 2002 A A A LLL Pin 4 External Voltage Flyback 100 connection 5V to 30V To other three l digital outputs External Power 5V to 30V 10kQ Pull U p Resistor l Digital O utput 1 7 Flyback Diode Pin 6 Digital O utput 1 ee ee ee Pin 5 Digital Ground Digital I O Receptacle Deeeeel gor 6 Connector J1031 Equivalent Circuit External Power 5V to 30V Flyback Diode Transistor Switch Figure 2 38 Sample externally powered relay sample de NOTE Outputs used as logic inputs If any LIMITS control is enabled To use the digital outputs as logic inputs to active TTL Low LOLIM1 or 2 HILIM1 or 2 High Low power TTL or CMOS inputs or Pass the OUTPUT STATE menu does not check or change the output status Re fer to paragraph 2 12 5 for information on limits 1 Connect the Model 2002 digital outputs to the logic inputs 2 Connect the digital grounds 3 Using the STATE menu check the output state setting of the Model 2002 output lines The STATE value for each Input output used should be ON 4 Using the LOGIC SENSE menu check the logic sense setting of the Model 2002 output lines TTL1 through TTL4 Make sure the correct LOGIC SENSE value is selected for each out
379. itter 0 5 us GPIB DATA FORMATTING TRANSMISSION TIME Readings Only Readings with Time Stamp Format Time Rdg s Time Rdg s DREAL Double precision real 0 51 ms 1961 3 1 ms 323 SREAL Single precision real 0 38 ms 2632 3 3 ms 303 ASCII 6 2 ms 161 10 2 ms 98 SINGLE FUNCTION SCAN SPEED INTERNAL SCANNER 2w0 4wa RTD Temp DCV 20V 2kQ 2kQ ACV Freq TC Temp 2 Wire Time Rate Time Rate Time Rate Time Rate Time Rate Time Rate Time Rate per Chan per Chan per Chan per Chan per Chan per Chan per Chan TYPE Chan second Chan second Chan second Chan second Chan second Chan second Chan second Ratio or Delta 22 ms 122 8 5 ms 118 188ms 53 2 channels Fast Scan using solid state 8 2 ms 122 6 3 ms 159 501 ms 2 559 ms 1 8 12 8 ms 78 channels Normal Scan 14 ms 71 11 4 ms 88 14 4 ms 69 506 ms 2 564 ms 1 8 17 2 ms 58 43 ms 23 Based on 100kHz input frequency 5 Using 386 33 computer average time for 1000 readings byte order swapped display off 51 For on scale readings no trigger delays display off 0 01 power line cycles autorange off digital filter off offset compensation off autozero off 5 Ratio and delta functions output one value for each pair of measurements Specifications are subject to change without notice Page 12 of 14 SPEC 2002 Rev H February 2009 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 Te
380. ive Transition Filter NTR Negative Transition Filter SKS LL2 HL1 LL1 ROF Sn ng O verflow NTR Transition Filter Measurement Event as BPT BFL BHF BAV RAV HL2 LL2 HL1 LL1 ROF B15 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 BO AA IO BPT BFL BHF BAV RAV HL2 LL2 HLI LL1 ROF B15 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 BO EE A Deeg BPT BFL BHF BAV RAV HL2 LL2 HL1 LLI ROF a B15 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 BO Register M easurement Event Enable Register Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Warn B14 B14 B13 B9 Temp B4 B3 BO mo To Questionable Summary Bit Q SB of Status Byte Register Warn Command Warning Cal Calibration Summary Temp Temperature Summary amp Logical AND OR Logical OR PTR Positive Transition Register NTR Negative Transition Register Figure 3 11 Questionable event status Questionable Condition Register PTR Questionable NTR Transition Filter Questionable Event Register Questionable Event Enable Register 3 15 Test Equipment Depot 800 517 8431 99 Washington Street
381. junction exclusive of thermocouple errors Junction temperature may be external Applies for 90 days 1 year or 2 years Tear 5 C 48 For display off 0 01 power line cycles autorange off digital filter off autozero on offset compensation off Display on may impact time by 3 worst case To eliminate this impact press ENTER hold to freeze display Specifications are subject to change without notice SPEC 2002 Rev H February 2009 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Page 11 of 14 Keithley Instruments Inc Multimeter Specifications 28775 Aurora Road Cleveland Ohio 44139 1 888 KEITHLEY www keithley com 200kQ 30 ms 2MQ 105 ms Any except ACV ACI Freq Any 60 ms ACV ACI Any 573 ms Any Temp Any 7 6 ms RANGE CHANGE SPEED Typical delay before measurement initiation after making a range change Function From To Time DCV Any Any 5 2 ms ACV Any Any 559 ms DCI Any Any 7 6 ms ACI Any Any 503 ms 2W0 Any 200 to 2k0 5 2 ms Any 20k0 15 ms Any 200kQ 27 ms Any 2MQ 103 ms Any 20MQ 153 ms Any 200M0 1GQ 253 ms 4wQ Any 200 to 2k0 5 2 ms Any 20kQ 15 ms Any 200kQ0 27 ms Any 2MQ 103 ms TRIGGER SPEED EXTERNAL TRIGGER OR TRIGGER LINK Autozero Off Autozero On Trigger Latency lt 2 us 1 2 ms typical Trigger J
382. k Event detection is satisfied when an input trigger via the TRIGGER LINK is received by the Model 2002 e RTCLock Event detection is satisfied when the pro grammed time and date occurs Note that the real time clock is only available as a control source for Arm Layer 1 e HOLD With this selection event detection is not sat isfied by any of the above control source events and operation is held up Control source loops As can be seen in the flowchart each layer has three paths that allow operation to loop around the control source These three paths are described as follows e DIRection Source Bypass When a source bypass 1s enabled DIRection SOURce and the EXTernal or TLINK control source is selected operation will loop around the control source on the initial pass through the layer If programmed for another event detection in the layer the bypass loop will not be in effect even though it is still enabled The bypass loop resets be in effect if operation loops back to a higher layer or idle In Arm Layer 1 and Arm Layer 2 enabling a source bypass also enables the respective output trigger In the Trigger Layer its output trigger is always enabled and occurs after every device action See Output Triggers for more information e MMediate Each time an MMediate command is sent operation loops around the respective control source It is used when you do not wish to wait for the programmed even
383. k up to the scan layer PRINT 1 output 16 trig coun 10 coun Set measure layer count PRINT 1 enter 16 Get response from 2002 DELay lt n gt ARM SEQ uence 1 LAYer2 DELay lt n gt Set scan layer delay TRIGger SEQ uence 1 1 DELay lt n gt Set measure layer delay lt n gt 0 to 999999 999 Specify delay in seconds DEFault 0 second delay MINimum 0 second delay MAXimum 999999 999 second delay DELay Query the programmed delay DEI aw DEFault Query the RST default delay DELay MINimum Query the lowest allowable delay DELay MAXimum Query the largest allowable delay These delay periods are used to delay operation in the specified layer After the programmed event occurs the instrument waits until the delay period expires before proceeding on in the Trigger Model Note that the Arm Layer Arm Layer 1 does not use a delay PRINT 1 output 16 trig del 1 del Set delay for measure layer PRINT 1 enter 16 Get response from 2002 3 153 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 23 6 Parameters Query Description Program fragment 3 23 7 Parameters 3 154 SOURce lt name gt ARM SEQ uence 1 LAYer 1 SOURce lt name gt Specify arm event control source ARM SEQ uence 1 LAYer2 SO URce lt name gt Specify scan event control source TRIGger SEQ uence 1
384. l OR NTR Negative Transition Filter Layer Trig Waiting in Trigger Layer Set Settling Cal Calibrating Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Figure 3 7 Arm event status IEEE 488 Reference From O Red Summary of Sequence Event Status See Figure 3 8 E Arm B14 B2 Condition Register PTR arm o NTR Transition Filter Arm Event Register To Bit B6 Arm of Operation Event Condition Register See Figure 3 6 zeg Arm Event B15 8614 82 81 Bo Enable Register Seq 1 Sequence 1 Set bit indicates that the 2001 sin the arm layer of Sequence 1 amp Logical AND OR Logical OR PTR Positive Transition Register NTR Negative Transition Register Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Figure 3 8 Always Zero Sequence Condition Register B14 B3 PTR EE pad A Sequence NTR Transition Filter B14 B3 Sequence Event Register To Sequence 1 Bit Seq 1 of Arm Event Condition Register See Figure 3 7 Sequence Event B14 B3 Enable Register Layl Layer 1 Set bit indicates that 2002 is in arm layer 1 Lay2 Layer 2 Set bit indicates that 2002 is in arm layer 2 amp Logical AND OR Logical OR PTR Positive Transition Register NTR Negative
385. l input port of the Model 2002 Each test provides the status of the read opera tion If Status O then the read operation was successful Also displayed is the result of the read operation If the dig ital input port is high on then Databyte 1 Conversely if the input port is low off then Databyte 0 Pressing any key on the computer keyboard terminates the program Required equipment e Model 2002 Multimeter e Microsoft QuickBASIC 4 5 e Any one of the following IEEE 488 interfaces Keithley Model KPC 488 2 Keithley Model KPC 488 2AT Capital Equipment Corporation PC lt gt 488 The program assumes that the Model 2002 is set to address 16 Loading user library The user library for QuickBASIC 4 5 is provided with the TEEE 488 interface ieeeqb qlb Assuming QuickBASIC and the user library are in the same DOS directory enter the following command line from the DOS prompt QB L ieeegb qlb The above command line will load QuickBASIC and the user library Program testdio2 bas SINCLUDE CLS CALL initialize 21 0 CALL SETTIMEOUT 1000 CALL setoutputEOS 10 0 CALL setinputEOS 10 ieeegb bi CALL send 16 RST CLS syst pres status Clear and reset 2002 zZ 0 rdata SPACES 8 WHILE INKEYS Gs zt L CALL send lp sens2 ttll data status GOSUB test status t TIMER WHILE TIMER t lt Dr WEND CALL enter rdata 3 16 status GOSU
386. l int Scan internal channels 3 90 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 18 Sense subsystems 3 18 1 3 18 2 D escription Program fragment D escription Program fragment 3 18 3 Parameters Query The Sense subsystems are used to configure and control the measurement functions Sense 1 and to read the digital input port Sense 2 The commands for the Sense subsystems are sum marized in Table 3 10 SEN Se 1 subsystem This Sense 1 Subsystem is used to configure and control the measurement functions of the Model 2002 Keep in mind that a function does not have to be selected in order to program its various configurations When the function is later selected it assumes the programmed states ALTernate 1 commands SAVE SEN Se 1 ALTernate 1 SAVE Save Alternate setup This command is used to save the current instrument setup as the Alternate setup The instru ment can be returned to the Alternate setup by using the ALTernate 1 RECall command An Alternate setup can be used as the function parameter for a scan see ROUTe SCAN PRINT 1 output 16 alt save Save present setup as alternate setup RECall SEN Se 1 ALTernate 1 RECall Return to Alternate setup This command is used to return the instrument to an Alternate setup see ALTernate 1 S AVE Tf there is no Alternate setup curr
387. l other data elements units reading number time stamp etc are not included A line feed LF with EOI is used as a terminator for each reading An overflowed reading is returned as a 30 000 count reading For example a 10kQ resistor being measured on the 2kQ range will return the following overranged reading 3 0000E 03 Overranged ASTReam reading Single integer stream mode The SSTReam mode sends single precision integer readings Each reading is 2 bytes in size and is not terminated by a line feed LF EOI is asserted with the second byte of each reading With SSTReam only the number of A D counts are sent For example a 1 5V reading on the 2V range will be sent as follows 15000 The same reading 1 5V on the 20V range is sent as follows 1500 An overrange reading is expressed as 30 000 counts For example if a 50kQ resistor is mea sured on the 20kQ range the overranged reading will be expressed as follows 30000 Overranged SSTReam reading Operating considerations Before going into a stream mode make sure the instrument is on the desired function and range Once in a stream mode all front panel controls are disabled and all SCPI and Common com mands are ignored Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Before going into the SSTReam mode make sure the data format byte order is correct for your computer IBM and IB
388. line is used for both input and output triggers Note that the arm and scan layers only use the asynchronous Trigger Link mode and therefore do not have to be selected Program fragment PRINT 1 output 16 trig tcon prot ssyn prot Select semi sync proto col PRINT 1 enter 16 Get response from 2002 DIRection lt name gt ARM SEQ uence 1 LAYer 1 TCO Nfigure DIRection lt name gt Control arm Source Bypass ARM SEQ uence 1 LAYer2 TCON figure DIRection lt name gt Control scan Source Bypass TRIG ger SEQ uence 1 TCONfigure DIRection lt name gt Control measure Source Bypass Parameters lt name gt SOURce Enable Source Bypass ACCeptor Disable Source Bypass 3 155 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Query Description Program fragment Parameters Query Description Program fragment 3 156 DIRection Query Source Bypass state When a source bypass is enabled and the External or Trigger Link control source is selected operation loops around the appropriate control source on the initial pass through that layer Note that the source bypass for the scan and measure layers also loops around the delay If programmed for another pass through the specified layer count gt 1 the bypass loop is not in effect even though it is still enabled The bypass loop will be in effect if operation first goes
389. lrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Parameters Query Description Program fragment Parameters Query Description Program fragment Query Description FO RMat lt name gt CALCulate2 FORMat lt name gt Specify CALC 2 format lt name gt MEAN Mean value of readings in buffer SDEV Standard deviation of readings in buffer MAX Largest reading in buffer MIN Lowest reading in buffer PKPK Peak to peak value of readings in buffer NONE No calculation FORMat Query programmed math format This command is used to specify the format for the CALC 2 math calculation The calculation operations for CALC 2 use data stored in the buffer With NONE selected no CALC 2 calculation will be performed With one of the other formats selected and CALC 2 enabled see STATe the calculation is performed every time the IMMe diate or MMediate command is executed Details on MEAN SDEV MAX and MIN are provided in paragraph 2 8 4 PKPK MAX MIN where MAX is the largest reading in the buffer MIN is the lowest reading in the buffer PRINT 1 output 16 calc2 form max form Select MAX format and query PRINT 1 enter 16 Get response message from 2002 STATe lt b gt CALCulate2 STATe lt b gt Control CALC 2 lt b gt Oor OFF Disable CALC 2 calculation 1 or ON Enable CALC 2 calculation STATe Query state on or off of CALC 2 This command is used to enable or
390. lrose MA 02176 Cl TestEquipmentDepot com ASCII Character Codes and IEEE 488 Multiline Interface Command Messages IEEE 488 Decimal Hexadecimal ASCII M essages 32 20 SP MLA 0 33 21 MLA 1 34 22 KR MLA 2 35 23 MLA 3 36 24 MLA 4 37 25 MLA 5 38 26 amp MLA 6 39 27 MLA 7 40 28 MLA 8 41 29 MLA 9 42 2A g MLA 10 43 2B MLA 11 44 2C MLA 12 45 2D MLA 13 46 2E i MLA 14 47 2F MLA 15 48 30 0 MLA 16 49 31 1 MLA 17 50 32 2 MLA 18 51 33 3 MLA 19 52 34 4 MLA 20 53 35 5 MLA 21 54 36 6 MLA 22 55 37 7 MLA 23 56 38 8 MLA 24 57 39 9 MLA 25 58 3A i MLA 26 59 3B MLA 27 60 3C lt MLA 28 61 3D MLA 29 62 3E gt MLA 30 63 3F UNL IEEE 488 Decimal Hexadecimal ASCII M essages 64 40 MTA 0 65 41 A MTA 1 66 42 B MTA 2 67 43 C MTA 3 68 44 D MTA 4 69 45 E MTA 5 70 46 F MTA 6 71 47 G MTA 7 72 48 H MTA 8 73 49 I MTA 9 74 4A J MTA 10 75 4B K MTA 11 76 4C L MTA 12 77 4D M MTA 13 78 4E N MTA 14 79 4F O MTA 15 80 50 P MTA 16 81 51 Q MTA 17 82 52 R MTA 18 83 53 S MTA 19 84 54 T MTA 20 85 55 U MTA 21 86 56 V MTA 22 87 57 W MTA 23 88 58 X MTA 24 89 59 Y MTA 25 90 5A Z MTA 26 91 5B MTA 27 92 5C MTA 28 93 5D MTA 29 94 5E MTA 30 95 SF UNL Message sent or received with ATN true Numbers shown repre sent primary address resulting in MLA My Listen Address C 2 Message sent or received with ATN true Numbers shown are pri mary address resulting in MTA M
391. ls These commands are used to assign measurement functions for internal channels e g Model 2001 SCAN or external channels You can assign a unique measurement function to each chan nel The function parameter specifies the measurement function for the channels specified by the channel list chanlist See CLOSe for examples to express a chanlist Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Program fragment Parameters Query Description Program fragment Parameters Query Description IEEE 488 Reference The function parameter specifies the measurement function for the channels listed in the chan list As a scan is being performed the Model 2002 will select the specified measurement func tion for each channel in the scan Any measurement function except current ACI and DCI can be used for internal scanning Note that the Keithley Model 2001 SCAN scanner card cannot be used to make thermocouple temperature measurements Any measurement function can be used for external scanning assuming you are using the appropriate switching card With the NONE function parameter selected the channels specified in the chanlist will not be scanned This will not change the defined scan list it will simply cause the specified channels to be skipped With the ALTernate function parameter selected the specified channels in the chanlist will be measured according to the sa
392. ls or the optional Model 2001 SCAN scanner card When using thermocouples the instrument measures tem perature over a range that is dependent on the thermocouple type refer to the specifications in Appendix A Thermocou ples can be connected to the Model 2001 TCSCAN card which plugs into the option slot of the Model 2002 or to an external thermocouple card such as a Model 7057A or 7402 installed in a Model 7001 or 7002 Switch System Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation Temperature measurements The basic measurement procedure for 4 wire RTD tempera ture measurements is contained in the Getting Started manu al The procedure for measuring temperature with 3 wire and 2 wire RTDs is similar Connection diagrams for these RTDs are provided by Figures 2 9 and 2 10 Be sure that the tem perature function is configured for the correct sensor type Use the 4 WIRE RTD selection for a 3 wire RTD sensor If using the Model 2001 TCSCAN to make thermocouple temperature measurements refer to its instruction manual for connection information and the measurement procedure If using the Model 7057A or 7402 connect the output of the thermocouple card to INPUT HI and LO of the Model 2002 and refer to its instruction manual for operating information Short Model 2002 E 000 00 C 4W RTD type PT385 Input HI The Models 70
393. lt 500pF external circuit capacitance by source impedance and cable dielectric absorption characteristics Ohms Voltage Drop Measurement Available as a multiple display Autoranging Autoranges up at 105 of range down at 10 of range 2 WIRE RESISTANCE READING RATES TI Reading settling times are affected Readings Second with Measurement Default Readings Second to Memory Readings Second to IEEE 488 Time Stamp to IEEE 488 PLC Aperture Bits Digits Autozero Off Auto zero On Autozero Off Autozero On Autozero Off Autozero On 10 167 ms 200 ms 29 8 6 5 2 1 7 6 5 2 1 6 6 5 2 1 6 2 33 4 ms 40 ms 27 7 29 25 9 7 6 29 24 9 7 4 27 22 9 7 4 1 16 7 ms 20 ms 26 7 56 48 47 40 55 45 46 38 50 41 42 34 0 27 3 34 ms 4 ms 23 6 222 197 156 139 220 196 148 132 156 139 107 95 0 17 1 67 ms 2ms 22 6 330 317 176 169 305 293 166 159 157 151 110 106 0 02 334 ys 400 ps 20 5 330 330 182 182 305 305 172 172 160 160 113 113 0 017 167 ys 167 ps 19 D 384 384 186 186 352 352 172 172 179 179 123 123 0 017 167 ys 167 ps 19 D 2000 2000 2000 2000 3 Specifications are for 1 power line cycle normal autozero digital filter off autorange off 4 wire mode offset compensation off except as noted 37 Ohms measurements at rates lower than 1 power line cycle are subject to potential no
394. lvin test probes such as Keithley Model 5805 or 5806 to the Model 2002 INPUT HI and LO terminals and SENSE HI and LO terminals 3 For Rrrace lt 50mQ or where the conductors are physi cally hot rel out zero correct any thermal offsets that are present before measuring in circuit current With power to the test circuit removed place the probes on the desired trace and enable rel from the DCI function 4 Turn on the power to the test circuit and read the in circuit current calculation The speed of this measurement is four readings per second at 1PLC Its range is fixed at 12A The default filter for in circuit current is a moving average of ten readings Additional filtering may be needed at low current levels Front Panel Operation A measurement overflow occurs for any of the following conditions e The measured voltage exceeds 200mVI e The trace resistance is less than 1m4 or greater than 10Q e The in circuit current is greater than 12A COUPLING This parameter selects the input coupling for the ACI function AC With AC coupling selected a DC block capacitor is placed in series with the AC measurement circuit note that the current shunt resistors are always DC coupled to the inputs This removes the DC component from the RMS and average ACI measurement AC DC When AC DC coupling is selected the blocking capacitor is removed Subsequent RMS or average ACI measurements reflect both the AC and DC compone
395. m GTS O B Connections to Terminal Block Figure 2 10 2 wire RTD temperature measurements Input HI Front Panel Operation Platinum RTD WARNING To avoid a shock hazard and possible instrument damage do not use the Model 8680 RTD Probe Adapter to measure voltages exceeding 30V RMS 42 4V peak UU o oo oO SE Gees 1 234 Input HI Input LO 2 35 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation Table 2 23 CONFIG TEMPERATURE menu structure Menu item Description SENSOR Sensor type menu 4 WIRE RTD 4 wire RTD type menu PT100 Select PT100 type D100 Select D100 type F100 Select F100 type USER Use to set R zero alpha beta delta PT385 Select PT385 type PT3916 Select PT3916 type SPRTD Select SPRTD type RTD 2 wire RTD type menu PT100 Select PT100 type D100 Select D100 type F100 Select F100 type USER Use to set R zero alpha beta delta PT385 Select PT385 type PT3916 Select PT3916 type SPRTD Select SPRTD type THERMOCOUPLE Thermocouple setup menu THERMOCOUPLE TYPE Select desired thermocouple type J K T E R S B N REF JUNCTIONS Configure reference junction menu JCN1 thru JENS CONFIGURE Configure simulated or real junction ACQUIRE REF TEMP INTERNAL TEMP UNITS DEG C DEG F K SPEED NORMAL FAST MEDIUM HIACCURACY SET SPEED EXACTLY SET BY RSLN
396. main input power disconnect device must be provided in close proximity to the equipment and within easy reach of the operator For maximum safety do not touch the product test cables or any other instruments while power is applied to the circuit under test ALWAYS remove power from the entire test system and discharge any capacitors before connecting or disconnecting cables or jumpers installing or removing switching cards or making internal changes such as installing or removing jumpers Do not touch any object that could provide a current path to the common side of the circuit under test or power line earth ground Always make measurements with dry hands while standing on a dry insulated surface capable of withstanding the voltage being measured The instrument and accessories must be used in accordance with its specifications and operating instructions or the safety of the equipment may be impaired Do not exceed the maximum signal levels of the instruments and accessories as defined in the specifications and operating information and as shown on the instrument or test fixture panels or switching card When fuses are used in a product replace with the same type and rating for continued protection against fire hazard Chassis connections must only be used as shield connections for measuring circuits NOT as safety earth ground connections If you are using a test fixture keep the lid closed while power is applied to the device under
397. mains circuits including the power transformer test leads and input jacks must be purchased from Keithley Instruments Standard fuses with applicable national safety approvals may be used if the rating and type are the same Other components that are not safety related may be purchased from other suppliers as long as they are equivalent to the original component note that selected parts should be purchased only through Keithley Instruments to maintain accuracy and functionality of the product If you are unsure about the applicability of a replacement component call a Keithley Instruments office for information To clean an instrument use a damp cloth or mild water based cleaner Clean the exterior of the instrument only Do not apply cleaner directly to the instrument or allow liquids to enter or spill on the instrument Products that consist of a circuit board with no case or chassis e g a data acquisition board for installation into a computer should never require cleaning if handled according to instructions If the board becomes contaminated and operation is affected the board should be returned to the factory for proper cleaning servicing Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Table of Contents 1 1 1 2 1 3 1 4 1 5 1 6 1 7 1 8 2 1 2 2 2 2 1 2 2 2 2 2 3 2 2 4 2 2 5 2 2 6 2 2 7 2 3 2 3 1 2 3 2 233 2 3 4 2 4 2 4 1 2 4 2 2 4 3 2 4 4 2 4 5 2
398. mand summary 3 64 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Default Command Description parameter SC PI Ref ARM SEQuence 1 Path to configure arm layers y LAYer 1 Path to program Arm Layer 1 y IMMediate Loop around control source y 3 23 3 COUNt lt n gt Specify arm count 1 to 99999 or INF 1 y 3 23 4 COUNt Query arm count y SOURce lt name gt Select control source HOLD IMMediate RTCLock IMMediate Note 2 3 23 6 MANual BUS TLINk or EXTernal SOURce Query control source y SIGNal Loop around control source y 3 23 8 TCONfigure Path to configure Triggers 3 23 9 DIRection lt name gt Enable SOURce or disable ACCeptor DIRection Query direction ACCeptor ASYNchronous Path to configure asynchronous Trigger Link ILINe lt NRf gt Select input line 1 to 6 ILINe Query input line 2 OLINe lt NRf gt Select output line 1 to 6 OLINe Query output line 1 RTCLock Path to configure the RTCLock control source 3 23 10 DATE lt yr gt lt mo gt lt day gt Specify the date for the clock event DATE Query the date for the clock event TIME lt hr gt lt min gt lt sec gt Specify the time for the clock event TIME Query the time for the clock event LAYer2 Path to program Arm Layer 2 y IMMediate Loop around control source y 3 23 3 COUNt lt n gt Specify scan count 1 to 99999 or INF Note 3 y 3 23 4
399. manually increment channels or press the key to manually decrement channels Hold down either key to manually scan through channels con Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation tinuously Auto repeat of cursor keys is disabled when adjacent channel next display is shown 3 With the unit in the normal display mode press the PREV key to enable adjacent channel display Note that the lower and upper adjacent channel readings will ap pear on the lower display section 4 Manually scan through channels with the lt or key Note that the adjacent display channel numbers track the channel on the main display 5 Press the NEXT key to cancel the alternate channel dis play mode then use the CHAN key to open channels when done scanning Scanning internal channels Internal channels are scanned by configuring scan channels and programming the Model 2002 to perform a scan The following steps demonstrate the basic procedures for per forming basic scanning using the Model 2001 SCAN scan ner card NOTE Depending on selected trigger modes it may be necessary to trigger the instrument to perform scanning Refer to paragraph 2 7 for detailed information on triggering Step 1 Configure channels Use CONFIG CHAN to select the measurement functions for each of the scanner channels as follows 1 Press CONFIG CHAN The instrument will displ
400. may include range changing filtering calculations data storing scanning and other operations See Section 3 for detailed information on bus triggers NOTE The front panel TRIG key see MANU AL is active with bus triggering selected Pressing the TRIG key performs a device action TRIGLINK With this selection the measure source is con trolled by the Trigger Link of the Model 2002 Trigger Link is an enhanced trigger system that uses up to six lines to direct trigger pulses to and from other instruments Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com When the Model 2002 receives a trigger over the Trigger Link it performs a device action as defined by the trigger model In addition to a measurement this may include range changing filtering calculations data storing scanning and other operations See paragraph 2 7 7 for details on using the Trigger Link NOTE The front panel TRIG key see MAN UAL is active with the Trigger Link selected Pressing the TRIG key performs a device action After selecting TRIGLINK as the measurement event select one of the following trigger link modes e ASYNCHRONOUS The ascynchronous trigger link mode is used for trigger configurations that require input and output triggers to be routed on separate lines After selecting this trigger link mode you will be prompted to select an input line and then an output line Note
401. memory option and the user programmable data group See Table 2 28 Table 2 28 Reading storage options Data group Memory Full Compact Type Standard 404 2027 Volatile MEM option 1381 6909 MEM2 option 5980 29908 Non volatile Non volatile 2 64 A full data group includes the readings units channel reading time stamp and status overflow A compact data group does not include channel or time stamp information In addition to these items recalled data also includes statis tical information such as minimum maximum average and standard deviation The following paragraphs discuss configuration of the buffer acquisition speed data grouping and buffer control as well as recalling buffered data The CONFIG DATA STORE menu structure is shown and summarized in Table 2 29 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation Table 2 29 CONFIGURE DATA STORE menu structure Menu item Description Burst mode Acquire 4 5 digit readings at 2000 readings sec and store in buffer Data group Select data types to store in buffer Full Store reading units channel reading time stamp and status overflow Compact Store reading units reading and status overflow Control Select type of buffer control Fill and stop Fill buffer with readings and stop Pretrigger Wait for pretrigger event store before and
402. ment e Model 2002 Multimeter e Microsoft QuickBASIC 4 5 e Any one of the following IEEE 488 interfaces Program 2002disp bas CALL Initialize 21 0 Setup 2002 commands CLS Enable message mode CAL Send 16 and the user library are in the same DOS directory enter the following command line from the DOS prompt QB L ieeegb qlb The above command line will load QuickBASIC and the user library Init as system controller disp text stat on Gpib status Display first message CAL Send 16 SLE EP 2 disp text data GOOD MORNING Gpib status Display second message CAL Send 16 disp text data HOW ARI Test Equipment Depot 800 517 TestEquipmentDepot com E YOU TODAY Gpib status G 5 8431 99 Washington Street Melrose MA 02176 Example Programs Four W ire O hms Measurements Microsoft Q uickBASIC 4 5 10 tech Interface and Driver 488 Software 1992 Keithley Instruments Inc Description This program configures the Model 2002 to make four wire ohms measurements The Model 2002 makes five measure ments stores them in its internal buffer and then sends them to the computer where the readings are displayed This pro cess continues until a keystroke occurs to stop the program Program ohmsbufi bas OPEN dev ieeeout FOR OUTPUT AS 1 IOCTL 1 break PRINT 1 reset OPEN dev ieeein FOR INPU
403. ment chan nels If you have selected a trigger mode that requires a sep arate trigger for each reading you will of course have to Front Panel Operation trigger the instrument to obtain each ratio reading refer to paragraph 2 7 for details on triggering Step 6 Disabling and cancelling the ratio mode You can disable the ratio mode by pressing EXIT while ratio readings are being displayed To cancel the ratio mode press CONFIG SCAN then select another option under the SCAN OPERATION menu RTD temperature measurements The following paragraphs outline the basic procedures for making RTD temperature measurements using the internal scanner For more detailed information on temperature mea surements in general refer to paragraph 2 4 5 Step 1 Connect RTD probes Connect RTD probes to the scanner using the basic resis tance connections outlined in the scanner card manual For 4 wire probes pair the connections as follows e Channels 1 and 6 probe 1 e Channels 2 and 7 probe 2 e Channels 3 and 8 probe 3 e Channels 4 and 9 probe 4 e Channels 5 and 10 probe 5 Step 2 Select sensor type and units Use the CONFIGURE CHANNELS menu to select the RTD sensor type and the units you wish to display See paragraph 2 4 5 for details Step 3 Configure channels 1 Press CONFIG CHAN The instrument will display the following CONFIGURE CHANNELS INTERNAL CHANS EXTERNAL INPUTS bk a SAVE ALT FCN RESTORE ALT FCN 2
404. menus are accessed by pressing CONFIG and then Q2 or Q4 Paragraph 2 3 5 summarizes the rules for navigat ing through the menus Note that a function does not have to be selected in order to be configured When the function is selected it will assume the programmed status Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation Table 2 16 CONFIGURE OHMS 2W menu structure Menu item Description SPEED Measurement speed integration time menu NORMAL Select 1 PLC power line cycle 16 67msec for 60Hz 20msec for 50Hz and 400Hz FAST Select 0 01 PLC MEDIUM Select 0 1 PLC HIACCURACY Select 10 PLC SET SPEED EXACTLY Set integration time in PLC 0 01 50 SET BY RSLN Default to setting appropriate for resolution FILTER Digital filter menu AUTO Default to filter appropriate for integration time AVERAGING Program a simple average filter 1 100 readings ADVANCED Program a simple average filter 1 100 readings with a noise tolerance window 0 AVERAGING MODE RESOLUTION AUTO 3 5d 4 5d 5 5d 6 5d 7 5d 8 5d OFFSETCOMP 100 of range Select moving average or repeating average mode Display resolution menu Default to resolution appropriate for integration time Select a specific resolution Enable disable offset compensation 20Q 20kQ ranges MAXAUTORANGE Set upper limit for autoranging of 2 wire resistance 1GQ 200M 20M9 2M
405. mers Note that the timer is in effect only if the timer is the selected control source Also note that the arm layer Arm Layer 1 does not use a timer timer for Measure Layer Program fragment PRINT 1 output 16 trig tim 25 tim Set Get response from 2002 PRINT 1 enter 16 3 23 8 SIG Nal ARM SEQ uence 1 LAYer 1 SIG N al Bypass arm control source ARM SEQ uence 1 LAYer2 SIGN al Bypass scan control source TRIG ger SEQ uence 1 SIGN al Bypass measure control source Description These action commands are used to bypass the specified control source and also when you do not wish to wait for the programmed event Keep in mind that the instrument must be waiting for the appropriate event when the command is sent Otherwise an error occurs and this com mand is ignored Program fragment PRINT 1 output 16 trig sign Bypass measure control source 3 23 9 TCON figure commands PROTocol lt name gt TRIG ger SEQ uence 1 1 TCO Nfigure PRO Tocol lt name gt Specify Trigger Link protocol Parameters lt name gt ASYNchronous Asynchronous Trigger Link mode SSYNchronous Semi synchronous Trigger Link mode Query PROTocol Query programmed Trigger Link protocol Description This command is used to select the protocol for the measure layer Trigger Link With ASYN chronous selected separate trigger lines are used for input and output triggers With SS YNchro nous selected a single trigger
406. meters Query Description Program fragment Parameters Query Description Program fragment Description Program fragment IEEE 488 Reference The ACQuire command is then used to store the simulated reference temperature PRINT 1 output 16 unit temp c Select C temp scal PRINT 1 output 16 temp rjunl sim 0 sim Set reference for 0 C PRINT 1 enter 16 Get response from 2002 TCO efficient lt n gt SEN Se 1 TEM Perature RJU N ctionX REAL TCO efficient lt n gt Specify temperature coefficient lt n gt 0 09999 to 0 09999 Specify temperature coefficient DEFault 0 01 temperature coefficient MINimum 0 09999 temperature coefficient MAXimum 0 09999 temperature coefficient TCOefficient Query temperature coefficient TC TCOefficient DEFault Query RST default TC TCOefficient MINimum Query lowest allowable TC TCOefficient MAXimum Query largest allowable TC This command is used to specify the temperature coefficient TC of the real temperature ref erence junction TC is specified in C volt and is not affected by the UNIT TEMPerature com mand The ACQuire command can then be used to acquire the reference temperature PRINT 1 output 16 temp rjunl real tco 05 tco Set temp coefficient PRINT 1 enter 16 Get response from 2002 0 FFSet lt n gt SEN Se 1 TEM Perature RJU N ctionX REAL O FFSet lt n gt Specify voltage o
407. mmand que ries can be performed to check for specific error conditions 3 6 2 1EEE 488 status indicators The REM remote TALK talk LSTN listen and SRQ service request annunciators show the present IEEE 488 status of the instrument Each of these indicators is briefly described below REM This indicator shows when the instrument is in the remote state Note that REM does not necessarily indicate the state of the REN line as the instrument must be addressed to listen with REN true before the REM indicator 3 5 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference turns on When the instrument is in remote all front panel keys except for the LOCAL key are locked out When REM is turned off the instrument is in the local state and front panel operation is restored TALK This indicator is on when the instrument is in the talker active state The unit is placed in this state by address ing it to talk with the correct MTA My Talk Address com mand TALK is off when the unit is in the talker idle state The instrument is placed in the talker idle state by sending it an UNT Untalk command addressing it to listen or with the IFC Interface Clear command LSTN This indicator is on when the Model 2002 is in the listener active state which is activated by addressing the in strument to listen with the correct MLA My Listen Address comma
408. mmands Functional elements required for SCPI commands Buffer size limitations for block data Syntax restrictions Response syntax for every query command Device to device message transfer that does not follow rules of the standard Block data response size Common Commands implemented by 2002 Calibration query information Trigger macro for DDT Macro information See Appendix B Cannot enter an invalid address Address changes and bus resets Determine by SYSTem POSetup para 3 21 2 256 bytes None All queries Common Commands and SCPI None See Table E 2 Contained in SCPI command subsystems tables see Tables 3 4 through 3 16 Block display messages Top display 20 characters max bottom display 32 characters max See paragraphs 3 10 through 3 24 See paragraphs 3 10 through 3 24 None See paragraph 3 13 See paragraph 3 10 See Calibration Manual Not applicable Not applicable Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com E 1 TIEEE 488 Conformance Information Table E 1 cont IEEE 488 documentation requirements Requirement 16 Response to IDN identification 17 Storage area for PUD and PUD 18 Resource description for RDT and RDT 19 Effects of RST RCL and SAV 20 TST information 21 Status register structure 22 Sequential or overlapped commands 2
409. mocouple using the RTEMperature command When using other thermocouple types USER selected you must specify the thermocouple slope coefficient using the USLope command Refer to the Model 1801 Nanovolt Preamp Instruction manual for details on making differential thermocouple temperature measurements PRINT 1 output 16 temp dtc type K type Select type K TC PRI 1 enter 16 Get response from 2002 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Parameters Query Description Program fragment Parameters Query Description Program fragment 3 18 23 Description Program fragment IEEE 488 Reference USLope lt n gt SEN Se 1 TEM Perature D TCouple U SLope lt n gt Set TC slope lt n gt 0 99999 to 0 99999 Specify TC slope DEFault Set TC slope to 20E 6 MINimum Set TC slope to 0 99999 MAXimum Set TC slope to 0 99999 USLope Query TC slope USLope DEFault Query RST default slope value USLope MINimum Query minimum slope value USLope MAXimum Query maximum slope value When the USER type thermocouple is selected see previous command this command is used to set the slope coefficient for the thermocouple or thermopile that you are using Refer to the Model 1801 Nanovolt Preamp Instruction manual for details on making differential thermocouple temperature measurements PRINT 1 output 16 temp dtc usl 10E
410. mory Readings Second to IEEE 488 Time Stamp to IEEE 488 PLC Aperture Bits Digits Autozero Off Autozero On Autozero Off Autozero On Autozero Off Autozero On 10 167 ms 200 ms 29 Th 6 5 2 1 7 6 5 2 1 6 6 5 2 1 6 2 33 4 ms 40 ms 27 Th 29 25 9 7 6 29 24 9 7 4 27 22 9 7 4 1 16 7 ms 20 ms 26 6 56 48 47 40 55 45 46 38 50 41 42 34 0 2 3 34 ms 4 ms 23 6 222 197 157 140 209 186 150 133 156 139 113 100 0 1 1 67 ms 2 ms 22 5 334 321 178 171 310 298 168 161 186 178 124 119 0 02 334 ys 400 us 20 5 334 334 184 184 310 310 174 174 187 187 127 127 0 01 167 us 167 us 19 4 387 387 186 186 355 355 176 176 202 202 128 128 0 01 167 us 167 us 19 4 2000 2000 2000 2000 SPEED AND ACCURACY op Days ACCURACY TI ppm of reading ppm of range ppm of range rms noise 1PLC DFILT On 1PLC 0 1PLC 0 01PLC Range 10 Readings DFILT Off DFILT Off DFILT Off 200yA 275 25 0 275 25 0 5 300 25 50 300 200 80 2 mA 275 20 0 275 20 0 5 300 20 50 300 200 80 20 mA 275 20 0 275 20 0 5 300 20 50 300 200 80 200 mA 300 20 0 300 20 0 5 325 20 50 325 200 80 2A 600 20 0 600 20 0 5 625 20 50 625 200 80 SPEC 2002 Rev H February 2009 Model 2002 KEITHLEY Keithley Instruments Inc 28775 Aurora Road Cleveland Ohio 44139 1 888 KEITHLEY www keithley com Multimeter Specifications Factory calibration uncertainty represents traceability to NIST This uncertainty is added t
411. n Generally the instrument should be placed in the remote mode before you attempt to program it over the bus Simply setting REN true does not actually place the instrument in the remote state Instead the instrument must be addressed to lis ten after setting REN true before it goes into remote Note that the instrument need not be in remote to be a talker Program fragment PRINT 1 remote 16 Place 2002 in remote turn on REM annunciator Note that all front panel controls except for LOCAL and POWER are inoperative while the instrument is in remote You can restore normal front panel operation by pressing the LOCAL key 3 5 2 IFC interface clear The IFC command is sent by the controller to place the Model 2002 in the local talker and listener idle states The unit responds to the IFC command by cancelling front panel TALK or LISTEN lights if the instrument was previously placed in one of those states Note that this command does not affect the status of the instrument settings data and event registers are not changed To send the IFC command the controller need only set the IFC line true for a minimum of 100usec Program fragment PRINT 1 output 16 idn Send query command PRINT 1 enter 16 Read data turn on TALK annunciator SLEEP 3 Wait 3 seconds PRINT 1 abort Talker idle state turn off TALK annun ciator 3 5 3 LLO local lockout T
412. n en ters the idle state With auto clear disabled the fail indication will remain until it is cleared by the CLEar IMMediate command PRINT 1 output 16 calc3 lim cle auto on auto Enable auto clear and query PRINT 1 enter 16 Get response messag from 2002 PASS SO URce lt NRf gt CALCulate3 PASS SO U Rce lt N Rf gt Specify pass pattern lt NRf gt 0to 15 Specify digital pattern for output port SOURce Query programmed source value This command is used to specify which line s of the Digital Output Port will go true when there are no failures in the limit tests Each output line is assigned a decimal weight as follows Digital Output Decimal Weight Line 1 Line 2 Line 3 Line 4 o A Ne The parameter value for the digital pattern is determined by adding the decimal weights of the desired output lines For example if you want output lines 2 and 3 to go true when all enabled limit tests pass use a parameter value of 6 2 4 The actual true state high or low of each digital output line depends on its programmed polar ity Polarity is programmed from the OUTPut Subsystem see paragraph 3 16 Note that when the binning strobe is enabled see BSTRobe command path output line 4 is not considered to be part of the digital output pattern The binning strobe uses line 4 With the strobe enabled parameter values 8 through 15 are treated the same as parameters O through 7
413. n the first pass through the model Since Channel Trigger Source of the Model 7001 7002 is also set to Source the scan does not wait at point B for a trigger Instead it bypasses Wait for Trigger Link Trig ger and closes the first channel point C Note that the By pass is in effect only on the first pass through the model D After the relay settles the Model 7001 7002 outputs a Trigger Link trigger pulse point D Since the instrument is programmed to scan ten channels operation loops back up to point B where it waits for an input trigger Note that Bypass is no longer in effect Front Panel Operation E The trigger pulse from the Model 7001 7002 triggers the Model 2002 to make a measurement of DUT 1 After the measurement is complete the multimeter outputs a Trig ger Link trigger pulse point E The trigger applied to the Model 7001 7002 from the Model 2002 closes the next channel in the scan which in turn trig gers the multimeter to measure the next DUT This process continues until all ten channels are scanned and measured E After the last channel is scanned and measured oper ation proceeds to point F where the Model 7001 7002 out puts a trigger pulse Since the Model 7001 7002 is programmed to perform two scans its operation loops back up to point A where it waits for an input trigger Note that Bypass is no longer in effect The trigger pulse from the Model 7001 7002 triggers the Model
414. n the buffer BURST 00100 READINGS After ENTERing the desired buffer size the following typi cal message will be displayed 00100 READING BURST Use TRIG to start EXIT to abort Burst mode operation Table 2 31 details the sequence of steps during burst mode The steps assume just one burst of readings before aborting the burst mode but you are able to initiate more than one burst each time overwriting the previously stored readings As can be seen from the table a front panel trigger starts the burst acquisition The Model 2002 remains looping in the measure layer of the trigger model until the requested num ber of readings is acquired To enhance burst acquisition speed the front panel is not updated until the raw readings are being post processed Meter Complete output pulses are sent at the rate of 2kHz during the acquisition phase Note The last one is not sent until post processing is done After the acquisition phase the unit returns to the idle state and starts post processing which consists of converting the raw readings into measurements by applying the calibration constants During the post processing phase the front panel annunciator is lit The acquisition phase of burst mode can be aborted by press ing the EXIT key Then the Model 2002 starts post process ing on that portion of the reading buffer Since burst mode turns off autozero an autozero refresh is required once every 24 hours by ch
415. n value of the buffered readings for example AVG 1 6345e 00 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com The equation used to calculate the mean is where x is a stored reading and n is the number of stored readings Note If n 0 the result is NAN not a number 4 SDEV This operation displays the standard deviation of the stored readings for example SDEV 1 4944e 03 The equation used to calculate the standard deviation is n 1 where x is a stored reading and nis the number of stored readings Note If n lt 1 the result is NAN not a number NOTE These statistics are invalid if the measure ment function changed during data store e g when scanning different functions The Model 2002 uses IEEE 754 floating point format for math calculations The last display in this series allows you to dump the buff ered readings to a printer See paragraph 2 12 2 for details on configuring printers 2 9 Filter Filtering stabilizes noisy measurements The Model 2002 uses a digital filter which is based on reading conversions The displayed stored or transmitted reading is simply an av erage of a number of reading conversions When a filter is enabled the selected filter configuration for that measurement function is in effect Filtering is enabled Front Panel Operation by pressing the FILTER key FILT annunciator turns on
416. nal IMMediate MANual BUS or TIMer the out put trigger pulse is available at the METER COMPLETE connector If the TLINk control source is selected output trigger action occurs on the selected TRIGGER LINK output line as follows e If the asynchronous Trigger Link mode is selected the output trigger pulse is available on the programmed output line IEEE 488 Reference e If the semi synchronous Trigger Link mode is selected and the source bypass is disabled trig tcon dir acc the Trigger Link line is released goes high e If the semi synchronous Trigger Link mode is selected and the Source Bypass is enabled trig tcon dir sour the Trigger Link line is pulled down low and then released Counters All three layers use programmable counters which allow operation to return to or stay in the respective layer For example programming the Trigger Layer counter for infinity trig coun inf keeps operation in the Trigger Layer After each device action and subsequent output trig ger operation loops back to the Trigger Layer control source A counter resets when operation loops back to a higher layer or idle 3 21 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 22 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 9 Programming syntax The following information
417. nal scan list FUNCtion lt list gt lt name gt Assign measurement function to specified channels VOLT DC FUNCtion lt list gt Query function for each specified channel RATio Command path to configure ratio calculation RCHannel lt list gt Specify reference channel 1 to 10 5 RCHannel Query reference channel MCHannel lt list gt Specify measure channel 1 to 10 10 MCHannel Query measure channel DELTa Command path to configure delta calculation RCHannel lt list gt Specify reference channel 1 to 10 5 RCHannel Query reference channel MCHannel lt list gt Specify measure channel 1 to 10 10 MCHannel Query measure channel LSELect lt name gt Select scan operation INTernal EXTernal RATio NONE DELTa or NONE LSELect Query scan operation Table 3 10 SENSe command summary Default Command Description parameter SCPI Ref SENSe 1 3 18 1 ALTernate 1 Path to control an Alternate setup 3 18 2 SAVE Save current setup as Alternate setup Note 1 RECall Return instrument to Alternate setup FUNCtion lt name gt Select measurement function VOLTage AC VOLTage DC VOLT DC y 3 18 3 RESistance FRESistance CURRent AC CURRent DC FREQuency TEMPerature FUNCtion Query function y DATA Path to read reading conversions y 3 18 4 LATest Return the last instrument reading y FRESh Return a new fresh reading y 3 50 Test Equipme
418. nce OFF y STATe Query state of reference y ACQuire Use input signal as reference REFerence Query reference value y DIGits lt n gt Specify measurement resolution 4 to 9 7 3 18 10 AUTO lt b gt Enable or disable auto resolution ON AUTO ONCE Enable and then disable auto resolution AUTO Query auto resolution DIGits Query resolution AVERage Path to configure and control the filter 3 18 11 TCONtrol lt name gt Select filter type MOVing or REPeat Note 3 TCONtrol Query filter type COUNt lt n gt Specify filter count 1 to 100 COUNt Query filter count 10 ADVanced Path to configure and control advanced filter NTOLerance lt n gt Specify noise tolerance level 0 to 100 5 NTOLerance Query noise tolerance level STATe lt b gt Enable or disable advanced filter ON STATe Query state of advanced filter STATe lt b gt Enable or disable filter Note 4 STATe Query state of digital filter AUTO lt b gt Enable or disable auto filter Note 5 AUTO ONCE Enable and then disable auto filter AUTO Query auto filter DETector Path to select function 3 18 12 FUNCtion lt name gt Select type of AC measurement RMS AVERage RMS FUNCtion Query detector function 3 51 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Table 3 10 Continued SENSe command summary Default
419. nchronous operation In the Semi synchronous Trigger Link mode all triggering input and output is controlled by a single line When the normally high 5V trigger line is pulled low OV a trigger occurs on the negative going edge When the trigger line is released a trigger occurs on the positive going edge see Figure 2 26 The advantage of this single line trigger is that as long as one of the instruments in the system holds the line low the trigger is suppressed In other words the trigger does not occur until all instruments in the system are ready Trigger on negative going vA edge Trigger on positive going E edge a 45V OV D5 7 Released by acceptor instruments Ye Pulled low by source instrument Figure 2 26 Semi synchronous Trigger Link specifications Trigger Link Cables 2 8501 Front Panel Operation For example assume that a Model 2002 is connected to two Model 7001 or 7002 Switch Systems for semi synchronous operation as shown in Figure 2 27 All three instruments are programmed to use trigger line 1 The two Model 7001s 7002s have relay settling times of 10msec and 50msec re spectively The Model 2002 is designated as the trigger con trol source and the two Model 7001 7002 units as trigger control acceptors Assume that the Model 2002 initially performs a measure ment After the reading is done the Model 2002 drives the trigger line low The negative going edge triggers b
420. nd Listen is off when the unit is in the listener idle state The unit can be placed in the listener idle state by send ing UNL Unlisten addressing it to talk or by sending IFC Interface Clear over the bus SRQ The instrument can be programmed to generate a service request SRQ when one or more errors or conditions occur When this indicator is on a service request has been generated This indicator will stay on until the serial poll byte 3 6 1s read or all the conditions which caused SRQ have ceased to exist See paragraph 3 7 6 for details 3 6 3 LOCAL key The LOCAL key cancels the remote state and restores local operation of the instrument Pressing LOCAL also turns off the REM indicator and returns the display to normal if a user defined message was displayed Note that the LOCAL key is also inoperative if the LLO Local Lockout command is in effect 3 7 Status structure The status structure for the Model 2002 is summarized in Figure 3 4 Instrument events such as errors are monitored and manipulated by seven status register sets Notice that these seven status register sets feed directly or indirectly into the Status Byte Register More detailed illustrations of these register sets are provided by Figures 3 5 through 3 11 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference
421. nd The last command sent REFerence lt n gt or ACQuire establishes the reference When a reference is set using the REFerence lt n gt command the REFerence query command returns the programmed value Conversely when a reference is set using the ACQuire command the REFerence query com mand returns the acquired reference value PRINT 1 output 16 curr ac ref 1 ref Set reference to 1A PRINT 1 enter 16 Get response from 2002 3 99 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference STATe lt b gt SEN Se 1 CU RRent AC REFerence STATe lt b gt Control reference for ACI SEN Se 1 CU RRent DC REFerence STATe lt b gt Control reference for DCI SEN Se 1 VO LTage AC REFerence STATe lt b gt Control reference for ACV SEN Se 1 VO LTage DC REFerence STATe lt b gt Control reference for DCV SEN Se 1 RESistance REFerence STATe lt b gt Control reference for Q2 SEN Se 1 FRESistance REFerence STATe lt b gt Control reference for Q4 SEN Se 1 FREQ uency REFerence STATe lt b gt Control reference for FREQ SEN Se 1 TEM Perature REFerence STATe lt b gt Control reference for TEMP Parameters lt b gt lorON Enable reference OorOFF Disable reference Query STATe Query state of reference Description These commands are used to enable or disable Reference for the specified function When enabled the dis
422. nd 2 7 7 for examples on using external triggering and the trigger link 2 11 2 Front panel scanner controls Controls that affect scanner card operation include e CHAN Allows you to open and close internal scanner card channels e CONFIGURE CHAN Defines the measurement func tions for each internal and external scanner card chan nel selects the number of external channels defines channels assigned to the internal scan list and saves restores an alternate measurement function CONFIGURE SCAN Selects internal or external scan ning and controls ratio delta operation when using the internal scanner e SCAN Starts stops scanning using the selected scan list Configures scan count scan interval and enables buffer storage and recall if internal or external list is selected e EXIT Disables scanning and returns to normal operation Trigger model is restored to pre scanning configuration e lt q and gt Allows you to manually scan through chan nels e PREV NEXT DISPLAY Allows you to display the two adjacent channels manual scanning only 2 77 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation 2 11 3 UsingCHAN key to close and open internal channels The CHAN key controls channels on the internal scanner card only The CHAN key allows you to directly e Close a specific channel or channel pair for 4 wire functions e Imm
423. nd put 2002 in idle Set trigger layer source to BUS and count to 10 Select DCV function Set reading rate to 0 01 nplc Include reading and channel number in data string sens volt dc aver stat 0 gpib status Disable filter Take 2002 out of idle Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Program scan2001 bas FOR x 1 TO 5 Tl TIMER CALL send 16 rout clos 5 gpib status CALL transmit UNL UNT LISTEN 16 GET gpib status CALL send 16 fetch gpib status CALL enter k2002data gpib len 16 gpib status PRINT DCV k2002data 2 TIMER 3 T2 T1 PRINT It took T3 seconds CALL send 16 rout clos 10 gpib status CALL transmit UNL UNT LISTEN 16 GET gpib status CALL send 16 fetch gpib status CALL enter k2002data gpib len 16 gpib status PRINT DCV k2002data 2 TIMER 3 T2 T1 PRINT It took T3 seconds EXT Xx END Example Programs Close channel 5 Trigger a measurement Fetch reading Display reading Close channel 10 Trigger a measurement Fetch reading Display reading Display time it took to take reading Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Example Programs Sc
424. nd status messages occur they are placed into the Error Queue This query command 1s used to read those messages The Error Queue is a first in first out FIFO register that can hold up to 10 messages Every time you read the queue the oldest message is read and that message is then removed from the queue If the queue becomes full the message 350 Queue Overflow occupies the last memory loca tion in the register On power up the queue is empty When the Error Queue is empty the mes sage 0 No error is placed in the Error Queue The messages in the queue are preceded by a number Negative numbers are used for SCPI defined messages and positive numbers are used for Keithley defined messages Table 2 4 lists the messages NOTE The SYSTem ERRor query command performs the same function as the STA Tus QUEue query command see STATus subsystem PRINT 1 output 16 syst err Query Error Queue PRINT 1 enter 16 Get response message from 2002 AZERo commands TYPE lt name gt SYSTem AZERo TYPE lt name gt Specify autozero type lt name gt NORMal Autozero every 200msec SYNChronous Autozero for every reading TYPE Query autozero type The AZERo commands are used to control the autozero phase of each measurement Auto zero is explained in paragraph 2 12 7 The AZERo STATe command is used to enable or disable autozero PRINT 1 output
425. ne Description These commands are used to set the polarity of the digital output lines When set for active high AHIGh polarity the specified output line is true ON when the output level is high The out put line is false OFF when the output level is low When set for active low ALOW polarity the output line is true ON when the output level is low The output line is false OFF when the output level is high The logic levels true or false of the digital output lines are set from the SOURce Subsystem see paragraph 3 19 Program fragment PRINT 1 output 16 outp ttl lsen alow lsen Set line 1 to ALOW PRINT 1 enter 16 Get response message from 2002 3 85 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 17 RO U Te subsystem 3 17 1 Parameters Query D escription Program fragment D escription Program fragment 3 17 2 Parameters The commands in this subsystem are used to configure and control switching and are summa rized in Table 3 9 CLOSe lt list gt ROUTe CLOSe lt list gt Close specified channel lt list gt chanlist Specify channel to be closed where chanlist is the channel 1 to 10 to be closed CLOSe lt list gt Query specified channel The CLOSe lt list gt command is used to close a channel on the Model 2001 SCAN scanner card Only one channel can be closed
426. ne that is already being used for the input an error occurs and the command is ignored PRINT 1 output 16 trig tcon asyn olin 4 olin Select output line PRINT 1 enter 16 Get response from 2002 SSYNchronous LINE lt NRf gt TRIG ger SEQ uence 1 TCO Nfigure SSYN chronous UNE lt NRf gt Specify semi synchronous Trigger Link line for measure layer lt NRf gt 1 Line 1 lt NRf 4 Line 4 2 Line 2 5 Line 5 3 Line 3 6 Line 6 LINE Query programmed output line This command is used to select one of the six trigger lines for the semi synchronous Trigger Link PRINT 1 output 16 trig tcon ssyn line 6 line Select Trigger Link line PRINT 1 enter 16 Get response from 2002 RTCLock commands The following commands are used to specify the date and time for the RTCLock control source see paragraph 3 23 6 for details DATE lt yr gt lt mo gt lt day gt ARM SEQ uence 1 LAYer RTCLock DATE lt yr gt lt mo gt lt day gt Set date for RTCLock control source lt yr gt 1993 to 2092 Specify year lt mo gt l to 12 Specify month lt day gt 1to31 Specify day DATE Query the date 3 157 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Description Program fragment Parameters Query Description Program fragment 3 158 This command is used to set the da
427. nel Operation 7001or 7002 Press STEP to start scan Bypass W ait for Trigger Link Trigger Scan Channel O utput Trigger a Trigger U Scanned 10 Channels Figure 2 21 Operation model for asynchronous trigger link example 1 External Triggering and Trigger Link As previously mentioned the trigger pulses for the asynchro nous Trigger Link are identical to the trigger pulses used for External Triggering The only thing that prevents them from being used together in a test system is connection incompat ibility Trigger Link uses 8 pin micro DIN connectors while External Triggering uses BNC connectors This connection problem can be solved by using the Model 8502 Trigger Link Adapter The adapter has two 8 pin micro DIN connectors and six BNC connectors The micro DIN connectors mate directly to the Trigger Link connector on the Model 2002 using a trigger link cable The BNC connectors mate directly to the External Triggering BNC connectors on other instruments using standard male BNC to BNC cables 2 56 2002 7 Wait for Trigger Link Trigger Make Measurement y al Output Trigger Figure 2 22 shows how a Keithley Model 706 Scanner can be connected to the Trigger Link of the Model 2002 using the adapter With this adapter a Model 706 could be substituted for the Model 7001 7002 in the previous example Asyn chronous Tr
428. nes and one input line Each open collector output can be set high 5V or low OV and will sink up to 100mA A TTL high on the Model 2002 s digital input is read as ON The four output lines can also operate external supplies from 5V to 30V Use the DIGITAL I O Menu to select the following options e OUTPUT STATE ON or OFF selectable for each output line 1 through 4 Use to check or change the output state e OUTPUT SENSE ACTIVE HIGH or ACTIVE LOW selectable for each output line TTL1 through TTL4 Use to check or change the output sense 2 100 e INPUT ON or OFF Use to check or change the status of the digital input line Sense is fixed at active high ON 5V Controlling digital circuitry Each of the four digital open collector outputs connector J1031 pins 6 through 9 includes a built in pull up resistor to 5V The output transistor is capable of sinking up to 100mA from voltages up to 30V The outputs can be controlled independently or tied to one of four limit values two high two low Paragraph 2 12 5 contains information about con trolling digital outputs from the limits menu Early versions of the Model 2002 have an additional 10kQ resistor connected between the collector and the internal built in test circuitry Under certain combinations of output states this resistor limits the output high to 2 5V For example Output 1 set high 5V Outputs 2 3 and 4 set low OV Output 1
429. ng conversion is shifted into a stack as the oldest con version is shifted out FIFO When the stack is full a simple average is taken to yield a reading REPEAT This menu item selects a repeating filter where an average of a selected number of reading conversions is taken for each reading 2 10 Math Model 2002 math operations are divided into four catego ries e Math performed on single readings polynomial per cent and percent deviation Front Panel Operation e Math performed on buffered readings maximum and minimum values average and standard deviation e Math performed on single readings as a part of a pass fail limits test e Math performed on scanned readings ratio and delta The first category is configured from the CONFIGURE MATH menu and is described in this paragraph Math oper ations on buffered readings are available in multiple displays of recalled data and are discussed in paragraph 2 8 Limit tests are described in paragraph 2 12 under main menu op erations Ratio and delta calculations on scanned channels are available from the CONFIGURE SCAN menu as dis cussed in paragraph 2 11 Note that once enabled for a function the polynomial and the percentage calculations are in effect across function changes NOTE The Model 2002 uses IEEE 754 floating point format for math calculations 2 10 1 Polynomial This math operation allows you to mathematically manipu late normal display read
430. ng for a GPIB trigger the following program fragment will provide the GET IEEE 488 Reference Program fragment PRINT 1 trigger 16 Trigger 2002 from over the bus This sends IEEE 488 commands UNT UNL LISTEN 16 GET When the command is executed the trigger event oc curs The command TRIGGER just sends GET Any other listeners are triggered when the command is executed 3 5 8 SPE SPD serial polling The serial polling sequence is used to obtain the Model 2002 serial poll byte The serial poll byte contains important infor mation about internal functions as described in paragraph 3 7 6 Generally the serial polling sequence is used by the controller to determine which of several instruments has requested service with the SRQ line However the serial polling sequence may be performed at any time to obtain the status byte from the Model 2002 Program fragment PRINT 1 spoll 16 Serial poll the 2002 INPUT 2 S Read the serial poll byte PRINT S Display the decimal value of the serial poll byte 3 6 Front panel aspects of IEEE 488 operation The following paragraphs discuss aspects of the front panel that are part of IEEE 488 operation including messages sta tus indicators and the LOCAL key 3 6 1 Error and status messages Table 2 4 summarizes the error and status messages associ ated with IEEE 488 programming Note that the instrument may be programmed to generate an SRQ and co
431. ng while the measure count is programmed for infinite an error will occur and the command will be ignored You cannot have an infinite buffer size PRINT 1 output 16 trig coun 200 Set measure count PRI 1 output 16 trac poin auto on auto Enable auto buffer sizing PRI 1 enter 16 Get response from 2002 FEED lt name gt TRACe FEED lt name gt Specify readings source lt name gt SENSe 1 Put raw readings in buffer CALCulate 1 Put calculated readings in buffer NONE Put no readings in buffer Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Query Description Program fragment Parameters Query Description Program fragment Parameters IEEE 488 Reference FEED Query buffer feed This command is used to select the source of readings to be placed in the buffer With SENSe 1 selected raw readings are placed in the buffer when storage is performed With CALCulate 1 selected calculated math readings POLYnomial or PERCent or NONE are placed in the buffer With NONE selected no readings are placed in the buffer when storage is performed over the bus PRINT 1 output 16 trac feed calc feed CALC buffer readings PRINT 1 enter 16 Get response from 2002 PERCent lt n gt TRACe FEED PRETrigger AMO unt PERCent lt n gt Specify percentof pre trigger readings lt n gt 0 to 100 of
432. nge are listed An SPRTD as supplied from the manufacturer will come with a certificate of calibration that lists the calibration constants and the temperature range supported In all cases except subranges 4 and 7 translation of the supplied coefficients to Model 2002 values will be required In most cases this translation is done simply entering the A value for example supplied with the SPRTD into the A4 position temperatures less than 0 C or A7 value temperatures above 0 C required by the Model 2002 The same procedure is used for translating the B and where applicable C constants The following table should be helpful in translating SPRTD coefficients to Model 2002 SPRTD coefficients The Model 2002 supports SPRTD temperatures between 83 805K and 933 473K For any of the subranges below only temperatures within the range from 83 805K to 933 47K will be measured RTD coefficients to M odel 2002 coefficients Subrange 1 13 8033K 273 16K Subrange 2 24 5561K 273 16K Subrange 3 54 3584K 273 16K Subrange 4 83 8058K 273 16K Subrange 5 234 3156K 302 9146K Subrange 6 273 15K 1234 93K Subrange 7 273 15K 933 473K Subrange 8 273 15K 692 677K Subrange 9 273 15K 505 078K Subrange 10 273 15K 429 7485K Subrange 11 273 15K 302 9146K Not applicable A2 to A4 B2 to B4 A3 to A4 B3 to B4 No substitution needed A5 to A4 A5 to A7 B5 to B4 B5 to B7 Set C7 0 A5 value entered for b
433. nging from 1 to 0 001 AUTO Display resolution is dictated by temperature sensor type Table 2 25 lists the resolution for the various sensor types 1 0 1 0 01 or 0 001 Sets display resolution for TEMP Table 2 25 Temperature auto resolution Resolution Sensor Degree Digits RTDs 2 3 or 4 wire 0 01 5 5d Thermocouples J K T E 0 1 4 5d Thermocouples R S B N 1 3 5d Note If the resolution is AUTO and the integration time SET BY RSLN the integration time will be 1 0 PLC Multiple displays The available multiple displays for temperature depend on the presently selected sensor type except for the multiple display that shows temperature in three different units 0000 0 C 0000 0 F 0000 0 K RTD measurements have a multiple display for the resis tance of the RTD such as RTD Resistance 0 0000 Q Thermocouple measurements have multiple displays for the thermocouple voltage and reference junction temperature Sample displays are Thermocouple Voltage 0 0000mV Reference junction 00 0 C Note that the reference junction temperature is shown in the units selected by the SET TEMP UNITS menu The display of two blinking question marks at the right of the reference junction temperature indicates an overflow of the reference junction measurement Thermocouple measurements will be made normally using the existing reference temperature value Test Equipment Depot
434. ngton Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation After selecting TRIGLINK you will be prompted to select an input line and then an output line Note that you cannot use the same trigger line for both input and output RT Clock With this selection the arm source is controlled by the real time clock When the programmed time and date occurs the Model 2002 passes operation into the scan layer e SET TIME Use this selection to set the time hour minute and second for the arm event Set the time using the 12 hour format of AM or PM is displayed see CLOCK in paragraph 2 12 7 Otherwise set the time using the 24 hour format e SET DATE Use this selection to set the date month day and year for the arm event HOLD When HOLD is selected the arm source is sup pressed As a result operation does not pass into the scan lay er until HOLD is cancelled by selecting one of the other arm source selections Select HOLD from the SELECT ARM SOURCE menu by placing the cursor on HOLD and press ing ENTER The instrument returns to the SETUP arm layer menu COUNT This menu item defines the number of times operation returns to the arm layer INFINITE Use this selection to continuously return opera tion to the arm layer ENTER ARM COUNT With this selection the user deter mines the number of times operation returns to the arm layer You can program the Model 2002 to arm up to 9999
435. nner card documentation for details on signal connections Paragraphs 2 7 6 and 2 7 7 provide information on external triggering and using the trig ger link Step 2 Configure trigger parameters Using CONFIG TRIG select the required trigger layer pa rameters based on the desired scanner and multimeter oper ation See paragraph 2 7 for Model 2002 trigger parameter details Step 3 Configure external channels and functions 1 From normal display press CONFIG CHAN The in strument will display the following CONFIGURE CHANNELS INTERNAL CHANS EXTERNAL INPUTS gt lt SAVE ALT FCN RESTORE ALT FCN 2 Select EXTERNAL INPUTS then press ENTER The Model 2002 will prompt you to enter the number of channels EXTERNAL INPUTS 80 3 Use the range and cursor keys to set the number of exter nal channels you will be using then press ENTER The instrument will prompt you to set functions SET CHAN FUNCTIONS DEFAULT CHOOSE FUNCTIONS Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 4 If you wish to use the current default function for all channels select DEFAULT then press ENTER 5 If you intend to program a separate function for each channel choose CHOOSE FUNCTIONS then press ENTER The instrument will prompt you for a channel number as in the following typical display SELECT CHAN 01 DCV 6 Use the cursor and range keys to select a channel then press ENTER S
436. nononnnnnononnnnnnnnnonnnnnnnnnnnnnnonnnnnnnnnenenanncnnanannns OCOMpensatediZb gt gt coin ii ad Ade died DTCouplec mMa dS EE R roeas es SENSe2 SUDSYSIEM EE FEVENT nt ele 3 ENABLE NR ion PTRansiti n CH EE NTRansition lt NR gt E CONDON ainia nto aii PRESEA deis S DIEN E SLES YING IS FAVS EE TREY EN IEN SCL AR EE D d EH UR E DATE lt yr gt lt mo gt lt day gt TIME lt hr gt lt min gt lt sec gt ES EE EE Id RN E HOLLER escisiones EEN E EGROUP TEE E SEET o iii FEED KE OS tata ls Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 3 23 Trig g r SUBSYSTEM aci o ies tells 3 23 1 STINE Prete commands dd 3 23 2 BOR E E 3 23 3 DM U1 ate a rr ES EES 3 23 4 JN OO E 3 23 5 d KI E f 3 23 6 AS A e a ESEE TE A AEE ENESE 3 23 7 TIME KEE L 3 23 8 SIGNAL ide i 3 23 9 TCONfigure COMMMANAS 25 5 05cssssevssezensbeenssalssdanesteacssctesondcseusesdunsveassdansauasenasestancecauessnasneancyenieesvanbuaneseass y 3 23 10 AC commands coi sein 3 24 SUNIT SODSY STO svessesczssvesnexsvecsvaasiaguns re REEE OR RES E Er EEE EE EE SEET EA E EREE ERA TEE TEES OEE EE EEEn EEE ENNEN A Specifications B Interface Function Codes C ASCII Character Codes and IEEE 488 Multiline Interface Command Messages D EEE 488 Bus O verview E IEEE 488 Conformance Information F SCPI Conformance Information G Example Programs H HP3458A Emulation Mode Test Equipme
437. nt Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Table 3 10 Continued SENSe command summary IEEE 488 Reference Default Command Description parameter SCPI Ref CURRent AC Path to configure AC current y APERture lt n gt Set integration rate in seconds 166 67e 6 to 1 Note 2 y 3 18 5 AUTO lt b gt Enable or disable auto aperture OFF AUTO ONCE Enable and then disable auto aperture AUTO Query auto aperture APERture Query aperture integration rate y NPLCycles lt n gt Set integration rate line cycles 0 01 to 50 1 y 3 18 6 AUTO lt b gt Enable or disable auto NPLC OFF AUTO ONCE Enable and then disable auto NPLC AUTO Query auto line cycle integration NPLCycles Query line cycle integration rate y COUPling ACIDC Specify input coupling AC 3 18 7 COU Pins Query input coupling RANGe Path to configure measurement range y 3 18 8 UPPer lt n gt Select range 0 to 2 1 2 1 y UPPer Query range y AUTO lt b gt Enable or disable auto range ON y AUTO ONCE Set range based on present input signal y ULIMit lt n gt Set upper limit for auto range 0 to 2 1 2 1 ULIMit Query upper limit LLIMit lt n gt Set lower limit for auto range 0 to 2 1 0 0002 LLIMit Query lower limit AUTO Query auto range y REFerence lt n gt Specify reference 2 1 to 2 1 0 y 3 18 9 STATe lt b gt Enable or disable refere
438. nt Depot 800 517 8431 99 Washington Street Melrose MA 02176 Vv TestEquipmentDepot com List of Illustrations 2 Figure 2 1 Figure 2 2 Figure 2 3 Figure 2 4 Figure 2 5 Figure 2 6 Figure 2 7 Figure 2 8 Figure 2 9 Figure 2 10 Figure 2 11 Figure 2 12 Figure 2 13 Figure 2 14 Figure 2 15 Figure 2 16 Figure 2 17 Figure 2 18 Figure 2 19 Figure 2 20 Figure 2 21 Figure 2 22 Figure 2 23 Figure 2 24 Figure 2 25 Figure 2 26 Figure 2 27 Figure 2 28 Figure 2 29 Figure 2 30 Figure 2 31 Figure 2 32 Figure 2 33 Figure 2 34 Figure 2 35 Figure 2 36 Figure 2 37 Figure 2 38 Figure 2 39 Front Panel O peration Bar graph zero at left multiple display Zero centered bar graph multiple display Maximum and minimum multiple display 2 0 0 ceeccesecsseeeneeeeeceseceeeeceaecesaeceeeeceaeeeneeeeneeseeeeneeeeeees Positive dnd negative peak Spikes conoce rie DC voltage multifunction multiple displays ooncncnincninononioonconcnncnnncnnnonnnononnncnnnnn nan conc cnn n nano nn non conan AC voltage multifunction multiple displays oooonncnnninnnnonononncnonnnacnnnoncn ocn nonnnonon non nonnnrc ro nro narco nc nncncannos DC in circuit current MeasuUreMen S coccncnccnnnnnncnnnnnnnnonononncnn non nr nn non nn non cone non nn nen ik senri skei Ekeren ess AC current multifunction multiple displays 00 cess cseesseceeceseceeceseeeeeeseseeeeeeeeeseaeeeeesaeesaeeaees 3 wire RTD temperature measurements 0 eee eeseeseceeceeecee
439. nt has occurred Sets B8 when an invalid calibration constant is detected on power up Sets B14 when a Signal Oriented Measurement Command parameter Calibration summary Command warning 1s ignored Bit Position B15 B14 B13 B9 B8 B7 B5 B4 B3 BO Event Warn A Decimal Weighting 16384 214 Value 0 0 1 0 1 0 1 Value 1 Enable Positive Transition 0 Disable Positive Transition A Positive Transition PTR Register Bit Position B15 B14 B13 B9 B8 B7 B5 B4 B3 BO Event Warn Cal Temp 7 Decimal W eighting e 256 16 28 24 Value 0 0 1 0 1 0 1 Value 1 Enable Negative Transition 0 Disable Negative Transition B Negative Transition NTR Register Figure 3 34 Questionable Transition Filter 3 127 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Effects of positive transitions on the Operation E vent Register Positive transition effect on Operation event Operation Event Register Calibrating Sets BO at the start of calibration Measuring Sets B4 at the start of a measurement Trigger layer Sets B5 when waiting in the Trigger Layer Arm layer Sets B6 when waiting in an arm layer Idle Sets B10 when entering the idle state Bit Position B15 B11 B10 B9 B1 BO Event Set Cal Decimal Weig
440. nt is 0000001000100000 For this binary value bits BS and B9 of the Measurement Event Register are set The significance of a set bit in these registers depends on how the transition filter is programmed see PTRansition and NTRansition commands If an event is programmed for a positive tran sition PTR the corresponding bit in this register sets when the event occurs If the event is instead programmed for a negative transition NTR the bit sets when the event becomes not true Measurement E vent R egister Bit BO Reading Overflow ROF Set bit indicates that the reading exceeds the measurement range of the instrument PTR or the instrument has gone from an overflow condition to a nor mal reading condition NTR Bit B1 Low Limit 1 LL1 Set bit indicates that the reading is less than the Low Limit 1 setting PTR or that a subsequent reading is no longer less than the Low Limit setting NTR Bit B2 High Limit 1 HL1 Set bit indicates that the reading is greater than the High Limit 1 setting PTR or that a subsequent reading is no longer greater than the High Limit 1 setting NTR Bit B3 Low Limit 2 LL2 Set bit indicates that the reading is less than the Low Limit 2 setting PTR or that a subsequent reading is no longer less than the Low Limit 2 setting NTR Bit B4 High Limit 2 HL2 Set bit indicates that the reading is greater than the High Limit 2 setting PTR or that a subsequent readin
441. nt registers EVENt Read the event register Note 2 3 20 1 ENABle lt NRf gt Program the enable register Note 3 3 20 2 ENABle Read the enable register PTRansition lt NRf gt Program the positive transition register Note 4 3 20 3 PTRansition Read the positive transition register NTRansition lt NRf gt Program the negative transition register Note 5 3 20 4 NTRansition Read the negative transition register CONDition Read the condition register 3 20 5 OPERation Path to control operation status registers y EVENt Read the event register Note 2 y 3 20 1 ENABle lt NRf gt Program the enable register Note 3 y 3 20 2 ENABle Read the enable register y PTRansition lt NRf gt Program the positive transition register Note 4 y 3 20 3 PTRansition Read the positive transition register y NTRansition lt NRf gt Program the negative transition register Note 5 y 3 20 4 NTRansition Read the negative transition register y CONDition Read the condition register y 3 20 5 ARM Path to control arm event registers y EVENt Read the event register Note 2 y 3 20 1 ENABle lt NRf gt Program the enable register Note 3 y 3 20 2 ENABle Read the enable register y PTRansition lt NRf gt Program the positive transition register Note 4 y 3 20 3 PTRansition Read the positive transition register y NTRansition lt NRf gt Program the negative transition register Note 5 y 3 20 4 NTRansit
442. nt units C CEL F FAR or K C y TEMPerature Query temperature units y VOLTage Path to configure ACV units AC lt name gt Select ACV measurement units V DB or DBM V DB Path to set DB reference voltage REFerence lt n gt Specify reference in volts 1 REFerence Query DB reference DBM Path to set DBM reference impedance IMPedance lt n gt Specify reference impedance 1 9999 75 IMPedance Query DBM reference impedance AC Query ACV units 3 66 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 12 Calculate subsystems 3 12 1 Parameters Query D escription Program fragment Parameters Query D escription Program fragment Parameters Query The commands in this subsystem are used to configure and control the three Calculate sub systems and are summarized in Table 3 4 CALCulate 1 This subsystem is used to configure and control the Polynomial and Percent math calculations Detailed information on math calculations is provided in paragraph 2 10 FORMat lt name gt CALCulate 1 FO RM at lt name gt Specify CALC 1 format lt name gt NONE No calculation POLynomial Polynomial math calculation PERCent Percent math calculation PDEViation Percent deviation math calculation FOR Mat Query programmed math format This command is used to specify the format for the CALC 1 math calculation With NONE selecte
443. ntDepot com IEEE 488 Reference 3 140 When storage starts the ARM indicator turns on to denote that raw input readings are being stored in the buffer After the storage process is finished the indicator turns on to denote that post processing i e math calculations is being performed on the readings When post process ing is finished the indicator turns off and the instrument returns to the idle state The Trace subsystem is used to read the buffer Sending a bus command to the Model 2002 while raw readings are being acquired aborts the acquisition and post processes the readings already stored in the buffer ASTReam and SSTReam These two stream parameters are used to send fresh A D readings over the IEEE 488 bus at maximum speed The ASTReam parameter is used to send readings in the ASCII format and the SSTReam parameter is used to send readings in the Single Integer counts format The stream modes can be used for the following functions DCV ACV average and RMS DCI ACI average and RMS and Q2 TEMP FREQ 4 in circuit current and peak measurements cannot be used with stream mode With ASTReam up to 1000 readings per second can be sent over the bus and with SSTReam up to 2000 readings per second can be sent Once the Model 2002 is placed in a stream mode one A D reading is sent over the bus every time the instrument is addressed to talk ASCII stream mode With ASTReam only the reading is sent Al
444. nto the idle state When used with the TRG command an ASCII 1 will not be placed into the Output Queue and the MAV bit will not set until the operations associated with the TRG command and the initiate command are finished The TRG command is considered to be finished when the Device Action completes or when operation stops at a control source to wait for an event see Trigger Model in paragraph 3 8 In order to use OPC exclusively with the TRG command you will have to first force the com pletion of the initiate command so that only the TRG command is pending To do this send the ABORt command to place the instrument in idle which by definition completes the initiate command Since continuous initiation is on operation continues on into the Trigger Model After sending the TRG command an ASCII 1 is placed in the Output Queue and the MAV bit sets when the TRG command is finished After OPC is executed additional commands cannot be sent to the Model 2002 until the pend ing overlapped commands have finished For example INITiate CONTinuous ON followed by OPC locks up the instrument and requires a device clear DCL or SDC before it will accept any more commands NOTE See OPC TRG and WAI for more information PRI 1 output 16 syst pres Select defaults PRI 1 output 16 init cont off abort Place 2002 in idle PRI 1 output 16 arm coun 1
445. ntrol the measurement units for TEMP and ACV and is summarized in Table 3 16 TEMPerature lt name gt UNIT TEM Perature lt name gt Specify TEMP units lt name gt CorCEL C temperature units For FAR F temperature units K K temperature units TEMPerature Query temperature units This command is used to specify the units for temperature measurements PRINT 1 output 16 unit temp f temp Select F for TEMP PRINT 1 enter 16 Get response message from 2002 AC lt name gt UNIT VOLTage AC lt name gt Specify ACV units lt name gt V AC voltage measurement units DB dB AC voltage measurement units DBM dBm AC voltage measurement units AC Query AC voltage units This command is used to select the units for ACV measurements With volt V units selected normal AC voltage measurements are made for the ACV function With DB units selected AC dB voltage measurements are performed The DBM units selection is used to make decibel mea surements referenced to 1mW dB and dBm measurements are explained in paragraph 2 4 1 UNITS PRINT 1 output 16 unit volt ac do ac Select dB units for ACV PRINT 1 enter 16 Get response message from 2002 DB REFerence lt n gt UNIT VO LTage AC DB REFerence lt n gt Specify dBm reference lt n gt 0 001 to 750 Specify reference in volts DEFault 1V reference MINimum 0 001V reference MAXimum 750V reference RE
446. nts of the signal Note that the coupling settings for ACI and ACV are discrete Thus setting the coupling of ACI has no effect on the cou pling of ACV AC TYPE This parameter selects the measurement type for the ACI function The Model 2002 directly measures RMS and aver age AC current RMS With this parameter selected the instrument performs RMS AC current measurements AVERAGE When this item is selected the signal path in the instrument bypasses the RMS converter and the average ACI measurement is the filtered output of a full wave rectifier Multiple displays The multiple displays for AC current that show multiple functions are shown in Figure 2 8 There are no multifunc tion displays for DC current 2 27 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation RMS or AVG RANGE Set by ACI range auto or fixed Autoranges independently of other function REL O perates normally SPEED Set by ACI speed FILTER Set by ACI filter RESOLUTION Set by ACI resolution COUPLING Set by ACI coupling AC TYPE Set by ACI AC Type 000 000 WAAC 0 0000 Hz RMS or AVG RANGE Set by MAX SIGNAL LEVEL in CONFIGURE FREQUENCY menu Autorange has no effect REL No effect TRIGGER LEVEL Set while in FREQ Not available in CONFIGURE FREQUENCY menu FILTER Unaffected by ACI filter FREQ has no filter RESOLUTION Fix
447. nually sets the NPLC value NPLC lt n gt When auto NPLC is enabled the parameter value for NPLC lt n gt changes to the automatically selected NPLC value Thus when auto NPLC is disabled NPLC remains at the automatically 3 95 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference selected value Also a valid NPLC value sent using the NPLC lt n gt command disables auto NPLC Auto NPLC is also coupled to auto aperture Enabling or disabling auto NPLC also enables or disables auto Aperture Also a valid aperture value sent using the APERture command disables auto NPLC Program fragment PRINT 1 enter 16 3 18 7 COU Bling AC DC SEN Se 1 CU RRent COUPling AC DC SEN Se 1 VO LTage CO UPling AC DC SEN Se 1 FREQ uency COUPling AC DC PRINT 1 output 16 curr ac nplc auto on auto Enable auto NPLC for ACI Get response from 2002 Specify coupling for ACI Specify coupling for ACV Specify coupling for FREQ Parameters AC AC coupling DC AC DC coupling Query COUPling Query currently programmed coupling Description Program fragment This command is used to select the input coupling for the AC ACV and the FREQ functions When AC coupling is selected a DC blocking capacitor is placed in series with the AC measure ment circuit This removes the DC component from the measurement When DC coupling is selected the blo
448. o Off Autozero On 10 167 ms 200 ms 29 6 6 5 2 1 7 6 5 2 1 6 6 5 2 1 6 2 33 4 ms 40 ms 27 5 29 25 9 7 6 28 23 9 7 4 27 22 9 7 4 1 16 7 ms 20 ms 26 5 56 48 47 40 53 43 44 36 47 38 40 33 0 2 3 34 ms 4 ms 23 5 163 145 102 91 139 124 100 89 95 84 74 66 0 1 1 67 ms 2 ms 22 5 163 156 104 100 139 133 101 97 95 91 75 72 0 02 334 ys 400 us 20 5 163 163 107 107 139 139 103 103 95 95 76 76 0 01 167 us 167 ys 19 4 384 384 110 110 253 253 103 103 164 164 76 76 0 01 167 us 167 us 19 4 2000 2000 2000 2000 Add 0 005 of range uncertainty for current above 0 5A rms for self heating Specifications are subject to change without notice SPEC 2002 Rev H February 2009 Page 9 of 14 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Keithley Instruments Inc Multimeter Specifications 28775 Aurora Road Cleveland Ohio 44139 1 888 KEITHLEY www keithley com AC COUPLING For AC only coupling add the following of reading 20 50Hz 50 100Hz 100 200Hz rms Average 0 55 0 09 0 015 AC DC COUPLING For DC gt 20 of AC rms voltage apply the following additional uncertainty multiplied by the ratio DC total rms of Reading of Range rms Average 0 05 0 1 HIGH CREST FACTOR ADDITIONAL ERROR of reading Applies to rms measurements Crest Factor 1 2
449. o real time RESET TIME Reset relative timestamp to zero RESET RDG Reset reading number to zero DECIMAL Select period or comma for display of decimal point CLOCK Clock menu TIME Check or set time of day DATE Check or set date FORMAT Select clock format 12 HOUR 12 hour format AM PM 24 HOUR 24 hour format Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation 2 90 2 12 1 SAVESETUP The SAVESETUP option of the main menu is used for the following operations e To save the present instrument configuration in non volatile memory e To restore the instrument to a previously saved instru ment configuration e To set the instrument s power on configuration e To reset the instrument to a factory default configuration SAVE Use this menu item to save the present instrument setup in a specific memory location Depending on the memory option you can store up to one STD five MEM1 or ten MEM2 setups in non volatile memory The installed memory option is displayed on power up and in the SERIAL option of the General Menu see paragraph 2 12 7 After selecting SAVE you will be prompted to save the present setup in a memory location Note that the numbering of setup locations starts with setup 0 You can save the setup at memory location 0 or you can use the RANGE A and Y keys to enter a different value With the desired memory loc
450. o relative accuracy specifications to obtain absolute accuracies The uncertainties for each range are equal to the uncertainty of the respective calibration sources Settling Characteristics lt 500us to 50ppm of step size Reading settling times are affected by source impedance and cable dielectric absorption characteristics Maximum Allowable Input 2 1A 250V Overload Protection 2A fuse 250V accessible from front for front input and rear for rear input Autoranging Autoranges up at 105 of range down at 10 of range DC IN CIRCUIT CURRENT The DC in circuit current measurement function allows a user to measure the current through a wire or a circuit board trace without breaking the circuit o Q eee Se os S 10 When the In Circuit Current Measurement function is selected the 2002 will first perform a s 42 4 wire resistance measurement then a voltage measurement and will display the 3 Specified calculated current 100m 2 M tR ZG easurement Range g 10m2 TYPICAL RANGES e S Current 100pA to 12A FP mi I Trace Resistance 1mQ to 100 100HA 1mA 10mA100mA 1A 10A 100A Voltage 200mV max across trace Speed 4 measurements second at 1 power line cycle Measured Current o eee Accuracy 5 500A For 1 power line cycle autozero on 10 reading digital filter Tear 5 C 90 days 1 year or 2 years ACI INPUT CHARACTERISTICS Temperature Coefficient
451. o resolution AUTO Query auto resolution 0 or 1 DIGits Query resolution AVERage Path to configure and control the filter 3 18 11 TCONtrol lt name gt Select filter type MOVing or REPeat Note 3 TCONtrol Query filter type COUNt lt n gt Specify filter count 1 to 100 10 COUNt Query filter count ADVanced Path to configure and control advanced filter NTOLerance lt n gt Specify noise tolerance level 0 to 100 1 NTOLerance Query noise tolerance level STATe lt b gt Enable or disable advanced filter ON STATe Query state of advanced filter STATe lt b gt Enable or disable filter Note 4 STATe Query state of digital filter AUTO lt b gt Enable or disable auto filter Note 5 AUTO ONCE Enable and then disable auto filter AUTO Query auto filter METHod lt name gt Select measure technique NORMal or ICIRcuit 3 18 14 METHod Query method NORMal 3 52 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Table 3 10 Continued SENSe command summary IEEE 488 Reference Default Command Description parameter SCPI Ref VOLTage AC Path to configure AC voltage y APERture lt n gt Set integration rate in seconds 166 67e 6 to 1 Note 2 y 3 18 5 AUTO lt b gt Enable or disable auto aperture OFF AUTO ONCE Enable and then disable auto aperture AUTO Query auto aperture APERture Query
452. o start taking readings on a bus trigger Set Measur Event Register to flag on buffer full Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Program ohmsbufi bas cont PRINT 1 Output 16 CLS cmd trac feed sens poin 5 feed cont next cmd cmd init cont on PRINT 1 Output 16 cmd PRINT 1 Output 16 TRG PRINT Data collection in progress DO PRINT 1 Output 16 stat meas even PRINT 1 Enter 16 INE INPUT 2 pollval LOOP UNTIL VAL pollval AND 512 512 resistance SPACE 100 PRINT 1 Output 16 trac data PRINT 1 Enter 16 LINE INPUT 2 resistance FOR x 0 TO 4 reading MID resistance x 15 1 13 PRINT reading NEXT x cmd init cont off abor trace cle PRINT 1 Output 16 cmd END Example Programs Clear 2002 Set up buffer to store 5 points after averaging arm 2002 Trigger 2002 to start Check to s if the buffer is full Get status value Get data Turn off trigger model Clear data buffer G 7 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Example Programs Test Digital Input Port Microsoft QuickBASIC 4 5 Keithley KPC 488 2 Interface 1992 Keithley Instruments Inc Description This program continuously tests the digita
453. ocedure to program the limits 1 From the LIMITS menu set the limit values and actions according to the following table Limit Value Action LOLIM1 902 HILIM1 110Q LOLIM2 990 DIGOUTI 0N others OFF DIGOUT2 0N others OFF DIGOUT1 ON DIGOUT2 ON others OFF HILIM2 101Q DIGOUT3 ON others OFF 2 Enable the binning strobe signal from the STROBE CONTROL item of the LIMITS menu 3 Set a pass pattern of all lines off from the PASS PAT TERN item of the LIMITS menu 4 Enable the control of the digital output lines by limit set 1 and limit set 2 from the LIMIT SET 1 and LIMIT SET 2 menus This sets the digital output lines to the pass pattern all OFF in this example Since binning is enabled digital output 4 is also OFF Front Panel Operation Note that the actual state high or low of the digital output lines depends on the polarity ACTIVE HIGH or ACTIVE LOW This is programmed from the DIGITAL I O selection of the GENERAL menu Tolerance Bands La 10 1 e Resistance qq Jj lA 900 99Q 1010 1100 Bit 001 011 000 100 010 Patterns and LOLIM1 LOLIM2 HILIM2 HILIM1 Limits Figure 2 35 Using limit test to sort 100Q resistors 2 12 6 STATUS MSG This selection is used to enable or disable the status messag es mode When enabled status messages are displayed to identify specific operations that are performed ON Enable the status message mode OFF Disable the status m
454. od measurements Signal types include AC voltage AC current AC DC voltage and AC DC current Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Example FUNC Purpose Format Parameter Default Query Description Notes Example ID Purpose Format R esponse HP3458A Emulation Mode FSOURCE ACV FSOURCE ACDCI Select AC voltage source Select AC DC current source To select the measurement function and range FUNC lt function gt lt max_input gt lt _resolution gt lt function gt lt function gt Parameter NumericEquivalent Description DCV 1 DC voltage ACV 2 AC voltage ACDCV 3 DC coupled AC volts OHM 4 2 wire resistance OHMF 5 4 wire resistance DCI 6 DC current ACI 7 AC current ACDCI 8 DC coupled AC current FREQ 9 Frequency PER 10 Period lt max_input gt AUTO for autorange or full range value lt _resolution gt Ignored DCV AUTO FUNC Returns two responses separated by a comma 1 the present measurement func tion and 2 that function s present range The FUNC command selects the type of measurement for the Model 2002 It also allows you to spec ify the measurement range for the respective function See paragraph 3 18 for details on ranges for the various measurement functions The lt s_resolution gt parameter is not supported by the Model 2002 and will be ignored 1 The FUNC header may be omitted when
455. of leads for connection to Model 2002 rear panel inputs Keithley part number CA 109 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Model 2001 TCSCAN This is a thermocouple general pur pose scanner card that installs in the option slot of the Model 2002 The card has nine analog input channels that can be used for high accuracy high speed scanning A built in tem perature reference allows multi channel cold junction com pensated temperature measurements using thermocouples Model 4288 1 Single Fixed Rack Mount K it Mounts a sin gle Model 2002 in a standard 19 inch rack Model 4288 2 Side by side Rack Mount Kit Mounts two instruments Models 182 428 486 487 2001 2002 7001 side by side in a standard 19 inch rack Mode 4288 3 Side by side Rack Mount Kit Mounts a Model 2002 and a Model 199 side by side in a standard 19 inch rack Model 4288 4 Side by side Rack Mount Kit Mounts a Model 2002 and a 514 inch instrument Models 195A 196 220 224 230 263 595 614 617 705 740 775 etc side by side in a standard 19 inch rack Models 7007 1 and 7007 2 Shielded IEEE 488 Cables Connect the Model 2002 to the IEEE 488 bus using shielded cables and connectors to reduce electromagnetic interference EMI The Model 7007 1 is one meter long the Model 7007 2 is two meters long Models 8501 1 and 8501 2 Trigger Link Cables Connect the Model 2002 to other instrumen
456. of reading of range 90 Days 1 Year or 2 Years Tou 5 C Temperature Coefficient 20Hz 1kHz 10kHz 30kHz 50kHz 100kHz 300kHz 500kHz 750kHz of reading of range C Range 1kHz 10kHz 30kHz 50kHz 100kHz 300kHz 500kHz 750kHz 1MHz Outside Tea 5 C 200 mV 0 08 0 7 0 09 0 7 0 1 0 7 0 15 0 7 0 25 0 7 1 0 0 7 2 5 0 7 5 5 0 7 9 0 7 0 002 0 03 2V 0 08 0 3 0 09 0 3 0 1 0 3 0 15 0 3 0 25 0 3 1 0 0 3 2 5 0 3 5 5 0 3 9 0 3 0 002 0 03 20V 0 1 0 7 0 11 0 7 0 14 0 7 0 19 0 7 0 25 0 7 1 0 0 7 2 5 0 7 5 5 0 7 9 0 7 0 004 0 03 200 V7 0 1 0 3 0 11 0 3 0 14 0 3 0 19 0 3 0 25 0 3 1 0 0 3 2 5 0 3 5 5 0 3 9 0 3 0 004 0 03 750 V7 0 12 0 6 0 16 0 6 0 2 0 6 0 25 0 6 0 5 0 6 0 01 0 02 Valid of Range 10 400 10 400 10 400 10 350 10 350 10 250 10 150 10 100 7 5 75 Default Measurement Resolution 4 digits Non Repetitive Peak 10 of range per us typical slew rate for single spikes Peak Width Specifications apply for all peaks 21us Peak Measurement Window 100ms per reading Maximum Input 1100V peak 2 x 1028V Hz for inputs above 20V 2 Subject to peak input voltage specification 27 AC peak specifications assume AC DC coupling for fre quencies below 200Hz 8 For overrange readings 200 300 of range add 0 1 of reading uncertainty For 300 400 of range add 0 2 of reading uncertainty Specifications are subject to chan
457. of subsequent commands until the device oper ations of all previous Overlapped commands are finished The WAI command is not needed for Sequential commands There are three Overlapped commands in the Model 2002 INITiate INITiate CONTinuous ON and TRG NOTE See OPC OPC and TRG for more information The INITiate commands take the Model 2002 out of the idle state The device operations of INITiate are not considered complete until the Model 2002 goes back into idle By sending the WAI command after the INITiate command all subsequent commands will not execute until the Model 2002 goes back into idle The TRG command issues a bus trigger which could be used to provide the arm scan and mea sure events for the Trigger Model By sending the WAI command after the TRG command subsequent commands will not be executed until the pointer for the Trigger Model has finished moving in response to TRG and has settled at its next state PRI 1 output 16 syst pres Select defaults PRINT 1 output 16 init cont off abort Place 2002 in idle PRINT 1 output 16 arm coun 1 Program for 30 measurements and then stop idle PRI 1 output 16 arm lay2 coun 1 PRI 1 output 16 trig coun 30 sour tim PRINT 1 output 16 init wai Start measurements and send wal PRI 1 output 16 data Query a reading PRINT 1 enter 16 Get reading after 2002
458. oller AYY is the firmware level for the display microcontroller A D CONTROLS With this GENERAL MENU item you can control auto zero and line synchronization LINE SYNC Synchronizing A D conversion with the pow er line frequency increases common mode and normal mode noise rejection When line cycle synchronization is enabled the measurement is initiated at the first positive going zero crossing of the power line cycle after the trigger See Figure 2 39 When LINE SYNC is selected the power line frequency is displayed and the options for line synchronization are displayed e ENABLED Enables line synchronization e DISABLED Disables line synchronization Changing the state of line synchronization halts triggers and puts the instrument into idle Press TRIG to return to re arm triggers 2 103 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation Trigger 1 Trigger 2 Trigger 3 occursin occursin occursin this region this region this region gt Power Line Frequenc a y 1 2 3 PLC A D A D A D Conversion Conversion Conversion 1 starts 2 starts 3 starts Note A D conversions assume an integration time of lt 1 PLC Power Line Cycle Figure 2 39 Line cycle synchronization AUTOZERO In order to maintain stability and accuracy over time and temperature the Model 2002 intermittently measures internal voltages corres
459. om electric shock and contact with hazardous live circuits Maintenance personnel perform routine procedures on the product to keep it operating properly for example setting the line voltage or replacing consumable materials Maintenance procedures are described in the user documentation The procedures explicitly state if the operator may perform them Otherwise they should be performed only by service personnel Service personnel are trained to work on live circuits perform safe installations and repair products Only properly trained service personnel may perform installation and service procedures Keithley Instruments products are designed for use with electrical signals that are rated Measurement Category and Measurement Category Il as described in the International Electrotechnical Commission IEC Standard IEC 60664 Most measurement control and data I O signals are Measurement Category and must not be directly connected to mains voltage or to voltage sources with high transient over voltages Measurement Category ll connections require protection for high transient over voltages often associated with local AC mains connections Assume all measurement control and data I O connections are for connection to Category sources unless otherwise marked or described in the user documentation Exercise extreme caution when a shock hazard is present Lethal voltage may be present on cable connector jacks or test fixtures The American Nation
460. ommand or the occurrence of a service request RQS bit set can be detected by per forming a Serial Poll Bit 7 Operation Summary Bit OSB Set bit indicates that an enabled operation event has occurred The event can be identified by reading the Operation Event Status Register using the STATus OPERation query command see paragraph 3 20 for details PRINT 1 output 16 stb Query Status Byte Register PRINT 1 enter 16 Send response message to 2002 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 3 10 13 Description Program fragment 3 10 14 Description Program fragment IEEE 488 Reference Bit Position B7 B6 B5 B4 B3 B2 B1 BO Event Ee ESB Decimal Weighting 128 64 27 28 Value 0 1 0 1 Value 1 Event Bit Set Events OSB Operation Summary Bit 0 Event Bit Cleared MSS Master Summary Status RQS Request Service ESB Event Summary Bit MAV Message Available QSB Questionable Summary Bit EAV Error Available MSB Measurement Summary Bit Figure 3 17 Status Byte Register TRG trigger sendacpis trigger to the Model 2002 The TRG command is used to issue a GPIB trigger to the Model 2002 It has the same effect as a group execute trigger GET The TRG command is used as an arm scan and or measure event to control operation The Model 2002 reacts to this trigger if GPIB
461. on 7001 or 7002 Switch System 230 Voltage Source Figure 2 24 Trigger Link connections asynchronous example 2 Since this example uses an instrument that does not have Trigger Link Model 230 the Model 8502 Trigger Link Adapter is required Connections are shown in Figure 2 24 For this example the Model 230 is programmed for External Triggering and is set to source the first voltage level The Models 2002 and 7001 7002 are configured as follows Model 2002 Idle state Bench reset INIT CONT ON Arm layer Arm source Immediate Arm count 1 Arm trigger control Acceptor Scan layer Scan source Immediate Scan count Infinite Scan trigger control Acceptor Measure layer Measure source TrigLink Trigger link mode Asynchronous Input line 3 Output line 4 Measure count 20 Measure trigger control Acceptor Indicates that the setting is the BENCH RESET and factory default con dition 2 58 Trigger Link Cables 8501 Trigger Oo Link EY 2002 Multimeter Trigger Link Adapter 23 4 5 6 BNC to BNC Cables 7501 Model 7001 or 7002 Idle state Reset INIT CONT OFF Scan list 1 1 1 10 Arm layer Arm spacing Immediate Arm count 1 Arm trigger control Acceptor Scan layer Scan spacing TrigLink Trigger link mode Asynchronous Input line 2 Output line 1 Number of scans 2 Scan trigger control
462. on OFF OFF NPLC line frequency varies per function OFF varies per function varies per function OFF presently displayed reading OFF OFF OFF OFF OFF VOLT AC ANER AUTO 1s ON VOLT AC AVER AUTO 1s ON VOLT AC AVER AUTO 1s ON VOLT AC AVER AUTO 1s ON VOLT AC AVER AUTO 1s ON function is 4 wire and closed channel gt 5 DIG AUTO is ON DIG AUTO is ON APER AUTO is ON NPLC AUTO is ON Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Table E 2 cont Coupled commands IEEE 488 Conformance Information CURR DC METH FREQ THR VOLT TTL TEMP TRAN TEMP RTD TYPE TEMP RTD ALPH RES RANG AUTO ULIM RES RANG AUTO LLIM CURR DC RANG UPP CURR DC RANG AUTO CURR DC AVER STAT CURR DC AVER COUN CURR DC AVER TCON CURR DC AVER ADV STAT CURR DC AVER ADV NTOL FREQ THR VOLT RANG FREQ THR VOLT LEV ROUT SCAN INT ROUT SCAN INT FUNC TEMP DIG TEMP RTD ALPH TEMP RTD BETA TEMP RTD DELT TEMP RTD RZER TEMP RTD TYPE 200k 200k 12 OFF varies per function varies per function varies per function varies per function varies per function 10 0 8 very complicated algo rithm very complicated algo rithm varies per transducer varies per RTD type varies per RTD type varies per RTD type varies per RTD type USER Command Also changes To If
463. on B15 B14 B13 B9 B8 B7 B5 B4 B3 BO Event Cal Temp Decimal Weighting 16384 256 gt 16 gt 214 28 24 Value o on 0 1 0 1 Value 1 Questionable Event Bit Set Events Warn Command Warning 0 Questionable Event Bit Cleared Cal Calibration Summary Temp Temperature Summary Figure 3 22 Questionable Event Register Operation E vent R egister Bit BO Calibrating C al Set bit indicates that the instrument is calibrating PTR or cali bration is complete NTR Bits B1 B2 and B3 Not used Bits B4 Measuring Meas Set bit indicates that the instrument is actively measuring PTR or the measurement has finished Bit B5 Waiting for Trigger Trig Set bit indicates that the instrument is waiting in the trig ger layer PTR of the trigger model or that it has left the trigger layer NTR Bit B6 Waiting for Arm Arm Set bit indicates that the instrument is waiting in an arm layer of the trigger model PTR or operation has proceeded from the arm layers into the trigger layer NTR Bits B7 B8 and B9 Not used Bit B10 Idle Set bit indicates that the instrument is in the idle state PTR or has left the idle state to perform an operation NTR Bits B11 through B15 Not used 3 119 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Bit Position B15 B11 Event
464. on Result Annunciator STORE STORE 00100 READINGS ENTER Storing reading xx of 100 on 100 rdgs stored continuous ON RECALL Rdg 00000 Time 003 903546 sec EXIT 100 rdgs stored continuous ON RECALL Rdg 00000 Time 067 709331 sec EXIT 100 rdgs stored continuous ON EXIT STORAGE INTERRUPTED off Table 2 34 Pretrigger sequence RECALL Rdg 00050 Time 004 999990 sec Rdg 00000 Time 000 000000 sec Rdg 00049 Time 004 899996 sec EXIT normal reading display Action Result Annunciator STORE STORE 00100 READINGS ENTER Waiting for pretrigger event on TRIG Storing reading xx of 50 Storage complete press RECALL off Note A manual trigger is used as an example Other pretrigger events include GPIB trigger link and external 2 8 4 Buffer multiple displays Math operations performed on buffered readings are avail able when readings are recalled Just press NEXT DISPLAY to view the math operation on the bottom line of front panel display in the following order 1 MAX maximum reading in buffer for example MAX 1 635968e 00 at RDG 00090 Notes A Display response may be slow due to calculation of statistics for large buffers 2 70 B Exponents are in terms of primary units of function on top line i e volts not millivolts MIN minimum reading in buffer for example MIN 1 627611e 00 at RDG 00012 AVG This math operation displays the mea
465. onfigured to display the calibration due date at power up the unit shows the following Model 2002 Calibration due mmm dd yy where mmm is the month abbreviation dd is the day and yy is the year If no calibration date is set the display shows that it is due now See the Model 2002 Calibration Manual to set the calibration due date and paragraph 2 12 3 of this manual to set the display option After the power up sequence the instrument begins its nor mal display for example 000 0000 mVDC Power up error messages Error messages that may be displayed during power up are summarized in Table 2 2 These are shown when one of the checksum tests of Table 2 1 fails Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Table 2 1 Data checked on power up Front Panel Operation Data Type of storage Memory option TEEE 488 address Power on default Calibration constants Calibration dates Instrument setups Electrically erasable PROM Electrically erasable PROM Electrically erasable PROM Electrically erasable PROM 1 in electrically erasable PROM STD MEM1 MEM2 STD MEM1 MEM2 STD MEM1 MEM2 STD MEM1 MEM2 STD MEM1 MEM2 Reading buffer 4 more in non volatile RAM MEM1 9 more in non volatile RAM MEM2 Volatile RAM STD Non volatile RAM MEM1 MEM2 Note STD is standard memory MEM1 is memory option 1
466. ontinuous external trigger the GPIB talk command as well as timer events All other HP3458A trigger events are not supported by the Model 2002 NRDGS 10 SYN NRDGS 100 EXT Take 10 readings per talk command Take 100 readings per external trigger event To enable or disable the offset compensated ohms mode OCOMP lt control gt lt control gt lt control gt parameter Numeric equivalent OFF 0 ON 1 Description Offset compensated ohms off Offset compensated ohms on ON power on default OFF OCOMP Returns the current offset compensated ohms state The OCOMP command enables disables the offset compensated ohms function OCOMP ON Enable offset compensated ohms To program the data format for both normal and memory readings OFORMAT lt format gt lt format gt lt format gt parameter Numeric equivalent Description ASCII 1 ASCII SREAL 4 Single real DREAL 5 Double real ASCII OFORMAT Returns the present setting of the output format Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com HP3458A Emulation Mode Description Example OPT Purpose Format R esponse Description PER Purpose Format Parameter Description Example PRESET Format Parameter The OFORMAT command controls the designated GPIB output format for readings transferred over the bus for both normal readings
467. orage is performed as long as buffer feed is not set for NONE see TRACe FEED NONE When NEXT is selected the storage process starts fills the buffer and then stops The buffer size is specified by the POINts command When ALWays is selected the storage process starts and continues to store readings even after the buffer fills After the buffer fills readings overwrite the previously stored readings When PRETrigger is selected the buffer stores readings continuously like ALWays until the programmed pre trigger event occurs When the pre trigger event occurs the section of the buffer specified for post trigger readings fill with new readings The storage process stops when the post trigger portion of the buffer becomes full with new readings see TRACe FEED PRETrigger PRINT 1 output 16 trac feed cont next cont Fill buffer and stop PRINT 1 enter 16 Get response from 2002 DATA TRACe DATA Send buffer readings When this command is sent and the Model 2002 is addressed to talk all the readings stored in the buffer are sent to the computer The format that readings are sent over the bus is controlled by the FORMat subsystem PRINT 1 output 16 trac data Read entire buffer PRINT 1 enter 16 Get readings from 2002 TSTamp FO RM at lt name gt TRACe TSTamp FORMat lt name gt Select timestamp format lt name gt ABSolute Reference to first buffer reading DELTa Time
468. oranging ON ARANGE ARANGE ON Enable autorange 0 Disable autorange To enable disable the autozero mode AZERO lt mode gt lt mode gt Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com D efault Query Description Example CALSTR Purpose Format Response Description CSB Purpose Format Parameter Description DELAY Purpose Format Parameter Default HP3458A Emulation Mode lt mode gt Parameter NumericEquivalent Description OFF 0 Disable autozero ON 1 Enable autozero ONCE 2 Not supported ignored ON AZERO Returns autozero status AZERO enables disables the autozero mode The valid parameters are OFF ON and ONCE which correspond numerically to 0 1 and 2 respectively Note that the Model 2002 does not support the ONCE parameter if this parameter is sent it is ignored and no mode change is executed The Model 2002 autozeroing synchronous mode is used when autozero is enabled The Model 2002 must be in the idle state for this command to work Trigger HOLD trigger SYN AZERO ON Enable autozero To request the calibration date CALSTR mmm dd 19yy month date year The CALSTR query requests the calibration date from the instrument which returns the information as a string in month date year format The Model 2002 does not support the associated CALSTR command To clear status regist
469. ormance Modular Test Leads Model 2002 User s Manual and Model 2002 Calibra tion Manual e Accessories as ordered e Full calibration data conforming to MIL STD 45662A If an additional manual is required order the appropriate manual package e Keithley part number 2002 900 00 for the User s Manual e Keithley part number 2002 902 00 for the Repair Manual e Keithley part number 2002 903 00 for the Getting Started Manual e Keithley part number 2002 905 00 for the Calibration Manual The manual packages include a manual and any pertinent addenda 1 8 Optionsand accessories The following options and accessories are available from Keithley for use with the Model 2002 Model 1050 Padded Carrying Case A carrying case for a Model 2002 or a Model 7001 Includes handles and shoulder strap Models 2002 M E M 1 and 2002 ME M2 These optional con figurations of the Model 2002 extend its storage capacity The MEM option has 32K bytes for non volatile storage of five setups and 7000 readings in compact format or 1400 readings in full format The MEM2 option has 128K bytes for non volatile storage of ten setups and 30000 compact readings or 6000 full readings Model 2001 SCAN This is a 10 channel scanner card that installs within the Model 2002 It has eight channels of 2 pole relay switching and two channels of 2 pole solid state switching All channels can be configured for 4 pole opera tion Included are two pairs
470. orms the following operations 1 Returns the Model 2002 to the RST default conditions see SCPI tables 2 Cancels all pending commands 3 Cancels response to any previously received OPC and OPC commands PRINT 1 output 16 rst Return 2002 to rst defaults GAV Save save the current setup in memory No extended Model 2002 MEM1 Model 2002 MEM2 memory installed installed lt NRf gt 0 lt NRf gt 0 to 4 lt NRf gt 0 to 9 The SAV command is used to save the current instrument setup configuration in memory for later recall Any control affected by RST can be saved by the SAV command The RCL com mand is used to restore the instrument to a saved setup configuration If the Model 2002 does not have any extended memory installed only one setup configuration can be saved and recalled In this situation memory location 0 is the only valid parameter for the SAV command If the Model 2002 MEM1 memory element is installed up to five setup configurations can be saved and recalled In this situation memory locations 0 through 4 are valid parameters If the Model 2002 MEM2 memory element is installed up to 10 setup configurations can be saved and recalled Memory locations 0 through 9 are then valid parameters PRINT 1 output 16 SAV 0 Store setup at memory location 0 SRE lt NRf gt service request enable Program the Service Request Enable Register SRE service request ena
471. ote PASS FAIL indication is not available on ACV ACI and in circuit current If low limit 1 is less than high limit 1 you will see a display similar to that shown in Figure 2 34 Note that the Model 2002 does not check the validity of the high and low limit values when you enter them If low limit 1 is greater than or equal to high limit 1 the following 2 98 message is shown on the bottom line of the limits bar graph next display No bar graph LLIM1 gt HLIM1 The programmed values for limit set 1 are shown by press ing the INFO key from the limits bar graph next display LLIM1 HLIM1 E d i Low Limit 1 La Limit 1 Average of midpoint Average of midpoint and Low Limit 1 and High Limit 1 Midpoint of Low Limit 1 and High Limit 1 A Defined points of display Reading Pass Fail indication 00 2836 VDC PASS HLIM1 leaky 30 of difference between midpoint and Low Level 1 LLIM1 1V t A NOTES 1 Press INFO to view the programmed Low Limit 1 and High Limit 1 values 2 Multiple display of limit values do not use unit prefixes i e volts not millivolts B Example Display with Limits 1V Figure 2 34 Limits bar graph example STROBE CONTROL This menu item enables or disables the use of digital output 4 as a binning strobe signal If enabled the strobe signal is set TRUE for greater than 10 microseconds after all limit tests have been performed on a n
472. oth A4 and A7 B5 value entered for both B4 and B7 Not applicable No substitution needed A8 to A7 B8 to B7 Set C7 0 A9 to A7 B9 to B7 Set C7 0 A10 to A7 B10 to B7 Set C7 0 A11 to A7 Set B7 0 C7 0 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation Measurement Example Suppose you are using an SPRTD that has been calibrated for subrange 2 above in which case the RTD is calibrated for measurements between 24 5561 and 273 16K The Model 2002 however supports only SPRTD temperatures down to 83 805K so temperatures below this value will be reported as an overflow even though the SPRTD is capable of measuring lower The calibration certificate lists A2 B2 C1 C2 and C3 as the calibration coefficients You can set up the Model 2002 for this measure ment as follows 1 Set the temperature sensor type to be FRTD 4 wire measurement from the CONFIG TEMP SENSOR TYPE menu 2 Choose the SPRTD RTD type using the CONFIG TEMP SENSOR TYPE FRTD SPRTD menu 3 From the SPRTD COEFFICIENTS menu set the RTD 0 C resistance value and the following coefficients e Set the Model 2002 A4 coefficient to the RTD certif icate A2 value e Set the Model 2002 B4 coefficient to the RTD certif icate B2 value Note that the A7 B7 and C7 values will not be used for this sensor 4 Switch to the temperature function and begin taking readings THER
473. oth Mod el 7001s 7002s to close a channel While the Model 7001s 7002s are in the process of closing a channel they hold the trigger line low Ten milliseconds after switch closure the first Model 7001 7002 releases the trigger line However the second Model 7001 7002 continues to hold the line low since it is not finished Fifty milliseconds after switch closure the second Model 7001 7002 releases the trigger line The posi tive going edge triggers the Model 2002 to make a measure ment and subsequently pull the trigger line back down to close the next channels This process continues until all channels are scanned and measured Trigger d Link o06 Y IN FOUT 5O b d cp Line 1 2002 M ultimeter Figure 2 27 Typical semi synchronous mode connections Trigger Link 7001 or 7002 Switch System Line 1 Trigger Link 7001 or 7002 Switch System Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 2 61 Front Panel Operation Semi synchronous Trigger Link example This example uses the same test system Figure 2 19 that was used for the Asynchronous Trigger Link example 1 However triggering is done using the Semi synchronous mode Trigger Link connections are shown in Figure 2 28 The two instruments are configured as follows Model 2002 Idle st
474. ou wish to change the address use the RANGE A and Y keys to display the desired number and press ENTER TALK ONLY In the talk only mode the Model 2002 ignores commands from the bus and merely outputs data as requested by the printer When the instrument is in the talk only mode the TALK annunciator turns on The options for TALK ONLY are explained as follows FEED This item has options that select the type of readings printed readings after a math operation is performed AFTER MATH readings before a math operation BEFORE MATH or no readings NONE INTERFACE With the IEEE 488 option of this item data elements are sent to an IEEE 488 bus printer set for listen always With the CENTRONICS option data elements are sent to a printer with a Centronics parallel interface The printer must be connected with a Model 8530 IEEE 488 to Centronics Printer Adapter Cable INTERVAL The INTERVAL option controls how often readings are printed expressed as 1 out of nnnn readings FORMFEED Use the FORMFEED option of the menu to enable or disable the sending of a formfeed character to the printer after printing a user selectable number of lines per page 1 255 lines 2 96 ELEMENTS This menu item lets you select the data elements sent e Reading The numeric value of the reading e Units The units of the reading e Reading The buffer location of the reading The reading number can be reset to zero from the GEN
475. output 16 curr ac nplc 2 nplc Set NPLC for ACI PRINT 1 enter 16 Get response from 2002 AUTO lt b gt ONCE SEN Se 1 CURRent AC NPLCycles AUTO lt b gt ONCE Control auto NPLC for ACI SEN Se 1 CURRent DC NPLCycles AUTO lt b gt ONCE Control auto NPLC for DCI SEN Se 1 VO LTage AC NPLCycles AUTO lt b gt ONCE Control auto NPLC for ACV SEN Se 1 VO LTage DC NPLCycles AUTO lt b gt ONCE Control auto NPLC for DCV SEN Se 1 RESistance N PLCycles AUTO lt b gt ONCE Control auto NPLC for 22 SEN Se 1 FRESistance N PLCycles AUTO lt b gt ONCE Control auto NPLC for Q4 SEN Se 1 TEM Perature N PLCycles AUTO lt b gt ONCE Control auto NPLC for TEMP lt b gt 1orON Enable auto NPLC 0 or OFF Disable auto NPLC ONCE Enable and then disable auto NPLC AUTO Query state of auto NPLC These commands are used to enable or disable auto NPLC for the specified measurement func tion With auto NPLC enabled the instrument automatically optimizes the NPLC value for the present resolution setting Tables 2 8 2 13 2 18 and 2 24 provide the integration times for SET BY RSLN AUTO The ONCE parameter is analogous to a momentary toggle switch When AUTO ONCE is sent auto NPLC turns on momentarily and then disables While enabled it automatically selects the appropriate value as summarized in the tables When auto NPLC disables NPLC remains at the selected value NPLC AUTO is coupled to the command that ma
476. ovide the desired precision Table 2 19 22 and QA auto filter Measurement Noise Avg function State Type Rdg tolerance Mode 2 wire resistance On Advanced 10 1 0 Moving 4 wire resistance On Advanced 10 1 0 Moving 2 30 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com AUTO Refer to Table 2 20 for the resolution associated with the integration time Table 2 20 22 and Q4 auto resolution Integration time Resolution 0 01 to lt 0 02 PLC 4 5d 0 02 to lt 0 10 PLC 5 5d 0 10 to lt 1 00 PLC 6 5d 1 00 to lt 10 00 PLC 7 5d 10 00 to 50 PLC 8 5d Note If the resolution is AUTO and the integration time SET BY RSLN the resolution will be 7 5 digits and the integration time 1 0 PLC OFFSETCOMP Offset compensation is used to compensate for voltage potentials such as thermal offsets across the device under test This feature eliminates errors due to a low level external voltage source configured in series with the unknown resis tor Offsets up to 0 2V on the 20Q and 200Q ranges and from 0 2V to 2V on the 2kQ and 20kQ ranges can be cor rected with offset compensation Offset compensation is available for 2 and 4 wire resistance measurements During offset compensated resistance measurements the Model 2002 performs the following steps for each A D con version 1 Makes a normal resistance measurement of the dev
477. own above 3 107 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Query Description Program fragment Description Program fragment 3 108 3 18 17 Parameters Query Description Voltage Threshold lt n gt 0 6 to 0 6 Trigger level for 1V range 6 to 6 Trigger level for 10V range 60 to 60 Trigger level for 100V range 600 to 600 Trigger level for 1000V range DEFault OV trigger level MINimum Range dependent as shown above MAXimum Range dependent as shown above LEVel Query trigger level LEVel DEFault Query RST default trigger level LEVel MINimum Query lowest allowable trigger level LEVel MAXimum Query largest allowable trigger level These commands are used to specify trigger levels for the specified current or voltage input signal An appropriate trigger level is necessary in order for the frequency counter to operate properly The instrument only counts cycles whose peak signal amplitude reaches the pro grammed trigger level See paragraph 2 4 4 Trigger Level for more information PRINT 1 output 16 freq thr curr rang 01 Select threshold range PRINT 1 output 16 freg thr curr lev 005 lev Set trigger level PRINT 1 enter 16 Get response from 2002 TTL SEN Se 1 FREQ uency TH Reshold VO LTage TTL Select TTL trigger level This action command is used to configure the voltage trigger lev
478. paragraph 3 7 For example for an acquired decimal value of 48 the binary equivalent is 00110000 This binary value indicates that Bits 4 and 5 of the Status Byte Register are set The bits of the Status Byte Register are described as follows Bit 0 Measurement Status MSB Set bit indicates that a measurement event has occurred The event can be identified by reading the Measurement Event Status Register using the STATus MEASurement command see paragraph 3 20 for details Bit 1 Not used Bit 2 Error Available E AV Set bit indicates that an error or status message is present in the Error Queue The message can be read using one of the following SCPI commands SYSTem ERRor STATus QUE ue See paragraphs 3 21 and 3 20 for details Bit 3 Questionable Summary Bit QSB Set bit indicates that a calibration error has occurred Bit 4 Message Available MAV Set bit indicates that a message is present in the Output Queue The message is sent to the computer when the Model 2002 is addressed to talk Bit 5 Event Summary Bit ESB Set bit indicates that an enabled standard event has occurred The event can be identified by reading the Standard Event Status Register using the ESE query command see paragraph 3 10 2 Bit 6 Master Summary Status MSS Request Service RQS Set bit indicates that one or more enabled Status Byte conditions have occurred The MSS bit can be read using the STB query c
479. pending on device configuration all front panel controls except the LOCAL button if the device is so equipped may be locked out when REN is true Generally REN should be sent before attempt ing to program instruments over the bus EOI End or Identify EOI is used to positively identify the last byte in a multi byte transfer sequence thus allowing data words of various lengths to be transmitted easily IFC Interface Clear IFC is used to clear the interface and return all devices to the talker and listener idle states ATN Attention The controller sends ATN while trans mitting addresses or multiline commands SRQ Service Request SRQ is asserted by a device when it requires service from a controller Universal multiline commands Universal commands are those multiline commands that require no addressing All devices equipped to implement such commands will do so simultaneously when the com mands are transmitted As with all multiline commands these commands are transmitted with ATN true LLO Local Lockout LLO is sent to the instrument to lock out the LOCAL key and thus all their front panel controls DCL Device Clear DCL is used to return instruments to some default state Usually instruments return to their power up conditions Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com SPE Serial Poll Enable SPE is the first step in the se
480. perform identical functions Select ASCII format Select double real format FORMAT ASCII FORMAT DREAL To request reading memory size MSIZE Returns two responses separated by a comma 1 total memory size in bytes and 2 the total amount of available memory in bytes The MSIZE query is useful for determining total memory size and the number of memory bytes still available for storage To program the number of display digits used for readings NDIG lt _digits gt lt _digits gt 3 to 8 3 1 2 digits to 8 1 2 digits 7 7 1 2 digits NDIG Returns the currently specified number of display digits Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com HP3458A Emulation Mode Description Note Example NPLC Purpose Format Parameter Default Query Description Example NRDGS Purpose Format Parameter Default Query The NDIG command programs the number of digits the instrument uses when displaying readings Note that there is an implied 1 2 digit so when you specify n digits n 1 2 are displayed The Model 2002 frequency function is limited to only 4 or 5 digits NDIG 3 or NDIG4 Values greater than 4 will be set to 4 with the frequency function NDIG 5 Display 5 1 2 digits NDIG 8 Display 8 1 2 digits To program the A D converter integration time in power line cycles NPLC lt power_line_cycles gt lt po
481. pikes On Advanced 10 5 0 Moving RMS average low fre Any Off Advanced 10 5 0 Moving quency RMS ACV peak Volts On Advanced 10 5 0 Moving dB dBm On Averaging 10 Moving RESOLUTION Table 2 10 DCV and ACV auto resolution Except for frequency temperature and some special cases of AC voltage all functions can operate with 34 to 8 4 digit Measurement resolution or they can default to a setting appropriate for the function and type Integration time Resolution selected integration time DCV 0 01 to lt 0 02 PLC 4 5d 3 5d 4 5d 5 5d 6 5d 7 5d or 8 5d Sets resolution to the 0 02 to lt 0 10 PLC 5 5d specified number of digits 0 10 to lt 1 00 PLC 6 5d 1 00 to lt 10 00 PLC 7 5d AUTO optimizes the resolution for the present integration 10 00 to 50 PLC 8 5d time setting See Table 2 10 for the default resolutions of the DCV peak spikes Not used 3 5d DCV and ACV functions The default resolutions of the other functions are listed in Tables 2 15 2 20 and 2 25 RMS average 0 01 to lt 0 02 PLC 4 5d 0 02 to lt 10 00 PLC 5 5d UNITS 10 00 to 50 PLC 6 5d This parameter selects the displayed units for AC voltage Low frequency RMS Not used 5 5d measurements ACV peak Not used 4d Notes VOLTS With volts selected as the units AC voltage mea surements are expressed in volts dB Expressing AC voltage in dB makes it possible to com press a large range of measurements into a much smaller scope The relationship between dB and volt
482. play the following SCAN OPERATION INTERNAL EXTERNAL RATIO DELTA 2 Select RATIO then press ENTER The Model 2002 will display the following CONFIGURE RATIO MEASURE REFERENCE FUNCTION 3 Select MEASURE then press ENTER The instrument will display the following RATIO MEASURE CHAN CHI 23 456789 10 4 Using the cursor keys select the channel you wish to define as the measure channel then press ENTER Step 3 Define reference channel 1 From the CONFIGURE RATIO menu select REFER ENCE then press ENTER The Model 2001 will display the following message RATIO REFERENCE CHAN CHI 23 456789 10 2 Using the cursor keys select the channel to be defined as the reference channel then press ENTER Step 4 Select measurement function 1 From the CONFIGURE RATIO menu select FUNC TION then press ENTER The instrument will display the following SET RATIO FUNCTION DCV Q2 Q4 Note that only DC volts and 2 and 4 wire ohms func tions are available for ratio and delta modes 2 Use the cursor keys to select the desired function then press ENTER 3 Press EXIT as necessary to return to normal display Step 5 Display ratio readings Once the reference channel measurement channel and ratio function have been defined press SCAN to halt triggers then press TRIG or SCAN to display ratio readings The instru ment will automatically display ratio readings computed from signals applied to the reference and measure
483. played reading will include the programmed reference value see REFerence lt n gt and ACQuire When disabled the displayed reading will not include the reference value Program fragment PRI 1 output 16 curr ac ref stat on stat Enable reference PRINT 1 enter 16 Get response from 2002 ACQuire SEN Se 1 CU RRent AC REFerence ACQ uire Acquire Reference for ACI SEN Se 1 CU RRent D C REFerence ACQ uire Acquire Reference for DCI SEN Se 1 VO LTage AC REFerence ACQ uire Acquire Reference for ACV SEN Se 1 VO LTage DC REFerence ACQuire Acquire Reference for DCV SEN Se 1 RESistance REFerence ACQ uire Acquire Reference for Q2 SEN Se 1 FRESistance REFerence ACQ uire Acquire Reference for Q4 SEN Se 1 FREQ uency REFerence AC Quire Acquire Reference for FREQ SEN Se 1 TEM Perature REFerence ACQ uire Acquire Reference for TEM P Description When one of these commands is sent the measured input signal is acquired and established as the reference value This command is typically used to zero the display For example if the instrument is displaying a 2mA offset sending this command and enabling Reference see STATe zeroes the display This command is functional only if the instrument is on the specified measurement function Sending this command while in any other function causes an error Also if the latest reading is overflowed OFLO or a reading has not been triggered
484. ple FSO URCE Purpose Format Parameter Default Query Description H 8 To request the error number and error response string ERRSTR lt error_number gt lt error_string gt The ERRSTR query returns two responses separated by acomma The first response is the error num ber and the second is the message explaining the error Unlike the HP3458 Model 2002 errors are returned in the order generated instead of the error reg ister bit order No error register bits are cleared until the last error is read at which time all bits are cleared To select the frequency measurement function FREQ lt max_input gt lt _resolution gt lt max_input gt 1V 10V or 100V lt _resolution gt Ignored The FREQ command selects the frequency measurement mode for the Model 2002 The first param eter selects a maximum input level of 1V 10V or 100V while the second parameter is not supported by the Model 2002 and will be ignored FREQ Select frequency FREQ 10 Select frequency 10V maximum input To select the signal type for frequency or period measurements FSOURCE lt source gt lt source gt lt source gt parameter Numeric equivalent Description ACV 2 AC voltage ACDCV 3 AC DC voltage ACI 7 AC current ACDCI 8 AC DC current ACV FSOURCE Returns the present frequency source The FSOURCE command specifies the type of signal to be used as the input signal for frequency or peri
485. pletes or when operation stops at a control source to wait for an event see Trigger Model in paragraph 3 8 In order to use OPC exclusively with the TRG command you will have to first force the com pletion of the initiate command so that only the TRG command is pending To do this send the ABORt command to place the instrument in idle which by definition completes the ini tiate command Since continuous initiation is on operation continues on into the Trigger Model After sending the TRG command the OPC bit sets when the TRG command is finished GOSUB ReadRegister Clear register by reading it PRINT 1 output 16 init cont off abort Place 2002 in idle PRINT 1 output 16 init opc Start measurements and send OPC SLEEP 2 Wait two seconds GOSUB ReadRegister Read register to show that OPC is not set PRINT 1 output 16 abort Place 2002 back in idle SUB ReadRegister Read register to show that OPC is now set END ReadRegister PRINT 1 output 16 esr Query Standard Event Status Register PRINT 1 enter 16 Get response message from 2002 INE INPUT 2 aS Read decimal value of register PRINT aS Display decimal value of register RETURN 3 33 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 10 6 Description Program fragment O
486. ponding to offsets and gains of amplifiers This process is known as autozeroing There are three types of autozero synchronous normal and off The characteristics of each are described below e Synchronous the default mode is the most accurate but slowest mode In this mode each trigger causes three A D conversions one for input signal one for an internal zero and one for an internal gain This mode also yields a constant reading rate e Normal is slightly less stable than synchronous but significantly faster In this mode internal measurements are only taken often enough to maintain specified accu racy Because internal readings are not consistently tak en the reading rate is higher but not constant e Off disables the autozeroing mechanism This mode yields the fastest reading rate at the expense of decreased reading stability With this selection the type of autozero is chosen Changing autozero halts triggers and puts the instrument into the idle state Use the TRIG key to re arm triggers In addition enter ing the burst data acquisition mode disables autozero NOTE With autozero disabled calibration accu racy will drift with time and temperature It is recommended that an autozero refresh be performed every 24 hours to ensure measurement integrity This can be per formed by enabling and then disabling autozero by changing speed or function or by issuing an autozero bus command 2 104 The burst data a
487. put line The LOGIC SENSE value varies according to the type of TTL Low power TTL or CMOS inputs used ACTIVE HIGH or ACTIVE LOW The single digital input is located on the digital I O port con nector J1031 pin 1 The input sense is fixed at active high ON 5V Use the INPUT menu to change the status of the input to ON or OFF 2 102 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Digital 1 0 menu Access the DIGITAL I O menu as follows 1 Display the GENERAL MENU 2 Use the lt and gt keys to highlight DIGITAL I O and press Enter The following will be displayed DIGITAL I O MENU OUTPUT STATE OUTPUT SENSE INPUT The DIGITAL I O menu is used to configure the following operations e Check or change the OUTPUT STATE ON or OFF of the four digital output lines e Check or change the OUTPUT SENSE of the digital output lines The logic sense can be active high ON 5V or active low ON OV e Check the status ON or OFF of the single digital input line OUTPUT STATE Use this menu item to check or change the state on or off of the four digital output lines The actual level of an on line is determined by the sense which is controlled by the next menu item OUTPUT SENSE The state on or off of a digital output line is changed by placing the cursor on the desired line and pressing the RANGE A or Y key These keys simply toggle the state With the l
488. query Read the Standard Event Status Register and clear it IDN Identification query Returns the manufacturer model number serial number and firm ware revision levels of the unit OPC Operation complete command Sets the Operation Complete bit in the Standard Event Status Reg ister after all pending commands have been executed OPC Operation complete query Places an ASCII 1 into the output queue when all pending selected device operations have been completed OPT Option identification query Returns an ID code that indicates which memory option is installed and whether or not the optional scanner card is installed RCL lt NRf gt Recall command Returns the Model 2002 to the setup configuration stored in the specified memory location RST Reset command Returns the Model 2002 to the RST default conditions SAV lt NRf gt Save command Saves the current setup to the specified memory location SRE lt NRf gt Service request enable command Programs the Service Request Enable Register SRE Service request enable query Reads the Service Request Enable Register STB Read status byte query Reads the Status Byte Register TRG Trigger command Sends a bus trigger to the 2002 TST Self test query Performs a checksum test on ROM and returns the result WAI Wait to continue command Wait until all previous commands are executed 3 10 1 CLS clear status clear status registers and error queue Description The CLS
489. r Status Queue when it is read The Error Queue is considered cleared when it is empty An empty Error Queue clears the EAV bit in the Sta tus Byte Register An error message from the Error Queue is read by sending either of the following SCPI query com mands and then addressing the Model 2002 to talk SYSTem ERRor STATus QUE ue Refer to paragraphs 3 20 7 STATus QUEue and 3 21 5 SYSTem ERRor for complete information on reading error messages 3 7 6 Status byte and service request SRQ Service request is controlled by two 8 bit registers the Status Byte Register and the Service Request Enable Register The structure of these registers is shown in Figure 3 12 Status Byte Register The summary messages from the status registers and queues are used to set or clear the appro priate bits BO B2 B3 B4 B5 and B7 of the Status Byte Register These bits do not latch and their states 0 or 1 are solely dependent on the summary messages 0 or 1 For example if the Standard Event Status Register is read its register will clear As a result its summary message will reset to 0 which in turn will clear the ESB bit in the Status Byte Register Bit B6 in the Status Byte Register is either e The Master Summary Status MSS bit sent in response to the STB command indicates the status of any set bits with corresponding enable bits set e The Request for Service RQS bit sent in response to a serial poll indicate
490. r is FU 71 CAUTION Do not use a fuse with a higher current rating than specified or instrument damage may occur If the instrument repeatedly blows fuses locate and cor rect the cause of the trouble before replacing the fuse See the optional Model 2002 Repair Manual for trouble shooting information 3 Install the new fuse and fuse carrier into the holder by reversing the above procedure 2 2 2 2 3 Power up sequence On power up the Model 2002 performs self tests on its EPROM and RAM and checksum tests on data stored in non volatile memory See Table 2 1 If a failure is detected the instrument momentarily displays an error message and the ERR annunciator turns on Messages are listed in Table 2 2 NOTE If a problem develops while the instrument is under warranty return it to Keithley Instruments Inc for repair If the instrument passes the self tests the firmware revision levels memory option if installed and presently selected TEEE 488 primary address are displayed An example of this display is shown as follows Model 2002 Rev A01 A01 MEM1 IEEE Addr 16 The firmware revision levels left to right are for the main microcontroller and display microcontroller The revision level number may be different in your particular unit If the MEM1 or MEM2 memory options are not present that por tion of the bottom line is left blank The IEEE 488 address is its default value of 16 Next if the unit is c
491. r to each device on the bus These commands are designated by the instrument manufacturer and are based on the instrument model defined by the Standard Commands for Programma ble Instruments SCPI Consortium s SCPI standard Generally these commands are sent as one or more ASCII characters that tell the device to perform a particular opera tion such as setting a range or closing a relay The IEEE 488 bus treats these commands as data in that ATN is false when the commands are transmitted Command codes Command codes for the various commands that use the data lines are summarized in Figure D 3 Hexadecimal and the decimal values for the various commands are listed in Table D 2 D 5 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Bus Overview 2 N gt lt QU Ln 35 gt BX ANY au a aon X d dn N Dad z200 ozu a 909 a HO o G Du p Ou DE en AN E EC oO X dn Al a ONDoDOoO7am nonooob Auewtd a aaa aA NNNNANNANA AM S D s a oeut s Ss zH es Ho ECKE D viso SEI Sea a SC a CHNMTtTNMNORADAAANA Y cane al y Dam OD D M JS SO NS Odd y al E CRMODROHAMYT HOR oo S Auewtd H oo aa ANNNNNANA AMS E oO oan mn dg mot oO o NA e Ao 220 EE m a ASEC S256 6023 SEI ssoippy 5 Ing Z fieuug CHANmMtTMNORADODOAAAT 50m lt dck N 3 Ah RB of ue t es Xomo N JO Ei O J
492. ragraph 2 11 for details 3 89 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Program fragment PRINT 1 output 16 rout scan rat mch 2 mch Select and query reference channel PRINT 1 enter 16 Get response mes sage from 2002 LSELect lt name gt ROUTe SCAN LSELect lt name gt Perform specified scan operation Parameters lt name gt INTernal Enable scan for internal scanner card EXTernal Enable scan for external scanner card RATio Perform ratio calculation DELTa Perform delta calculation NONE Disable all scan operations Query LSELect Query scan operation Description This command is used to select and perform the desired scan operation When INTernal is se lected the Model 2002 scans the channels of the internal switching card according to how the scan is configured see ROUTe SCAN INTernal EXTernal is used to measure channels that are controlled by an external switch system When EXTernal is selected the Model 2002 scans the external scan list see SCAN EXTernal With RATio or DELTa selected the Model 2002 performs the appropriate math calculation us ing the specified reference channel and measure channel see RCHannel and MCHannel The NONE selection disables all operations associated with a scan Program fragment PRINT 1 output 16 syst pres Return 2002 to defaults PRINT 1 output 16 rout scan lse
493. rameters depend on which memory option is installed in the Model 2002 and are summarized as follows Memory option Valid SAV parameters STD SAVO MEM1 SAVO through SAV4 MEM2 SAVO through SAV9 ct power on defaults PRINT 1 output 16 syst pos pres pos Sel Get response message from 2002 PRINT 1 enter 16 FRSWitch SYSTem FRSWitch Read INPUTS switch This query command is used to read the position of the FRONT REAR INPUTS switch Switch position code is defined as follows 1 Front panel inputs selected 0 Rear panel inputs selected PRINT 1 output 16 syst frsw Query INPUTS switch position PRINT 1 enter 16 Get response message from 2002 3 137 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 21 4 D escription Program fragment 3 21 5 D escription Program fragment 3 21 6 Parameters Query D escription Program fragment 3 138 NERGon SYSTem VERSion Read SCPI version This query command is used to read the version of the SCPI standard being used by the Model 2002 Example code 1991 0 The above response message indicates the version of the SCPI standard PRINT 1 output 16 syst vers Query version of SCPI standard PRINT 1 enter 16 Get response message from 2002 ERRor SYSTem ERRor Read Error Queue As error a
494. range of reading of range Range 20 50Hz 50 100Hz 0 1 2kHz 2 10kHz 10 30kHz 30 50kHz 50 100kHz 100 200kHz 0 2 1MHz 1 2MHz 200 mV 0 25 0 015 0 07 0 015 0 02 0 02 0 02 0 02 0 025 0 02 0 05 0 02 0 3 0 015 0 75 0 025 2 0 1 5 0 2 2V 0 25 0 015 0 07 0 015 0 02 0 02 0 02 0 02 0 025 0 02 0 05 0 02 0 3 0 015 0 75 0 025 2 0 1 5 0 2 20V 0 25 0 015 0 07 0 015 0 03 0 015 0 04 0 015 0 05 0 015 0 07 0 015 0 3 0 015 0 75 0 025 4 0 2 7 0 2 200 V7 0 25 0 015 0 07 0 015 0 03 0 015 0 04 0 015 0 05 0 015 0 07 0 015 0 3 0 015 0 75 0 025 4 0 2 750 V7 0 25 0 015 0 1 0 015 0 05 0 015 0 06 0 015 0 08 0 015 0 1 0 015 0 5 0 015 dB ACCURACY RMS dB 90 Days 1 Year or 2 Years TCAL 5 C Reference 1V Autoranging Low Frequency Mode AC DC Coupling Input 1 100Hz 0 1 30kHz 30 100kHz 100 200kHz 0 2 1MHz 1 2MHz 54 to 40 dB 2 mV to 10 mV 0 230 0 225 0 236 0 355 40 to 34 dB 10 mV to 20 mV 0 036 0 031 0 041 0 088 34 to 6 dB 20 mV to 2 V 0 023 0 018 0 028 0 066 0 265 0 630 6 to 26 dB 2 V to 20 V 0 024 0 024 0 028 0 066 0 538 0 820 26 to 46 dB 20 V to 200 V 0 024 0 024 0 028 0 066 0 538 46 to 57 8 dB 200 V to 775 V 0 018 0 021 0 049 ACV READING RATES 2 Readings Second with Measurement Default Readings Second to Memory Readings Second to IEEE 488 Time Stamp to IEEE 488 PLC Aperture Bits Digits Autozero
495. ration f is the power line frequency Note For 400Hz line power use 50Hz to calculate aperture When the integration period is set using the APERture command the value for the NPLCycle command changes accordingly to reflect the new integration period Conversely if the integra tion period is set using the NPLCycle command the value for the APERture command changes accordingly On power up the instrument uses the NPLC value to determine the integration period Thus if using a different power line frequency NPLC will remain the same but aperture may change Note If line synchronization is enabled see LSYNc command in SYSTem subsystem the integration period will not start until the beginning of the next power line cycle For example if a reading is triggered at the positive peak of a power line cycle the integration period will not start until that power line cycle is completed The integration period starts when the positive going sine wave crosses zero volts See paragraph 2 12 7 for more details PRINT 1 output 16 curr ac aper 16 67e 3 aper Select aperture for ACI PRINT 1 enter 16 Get response from 2002 3 93 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Parameters Query Description Program fragment 3 94 3 18 6 Parameters AUTO lt b gt ONCE SEN Se 1 CU RRent AC APERture AUTO lt b gt ONC
496. re idled between bursts e Autoranging is disabled e Autozero is disabled e Integration time is set to 0 01 PLC 167usec e Resolution is fixed at 4 5 digits Buffer data group is set to compact e Buffer control is set to fill and stop NOTE Some instrument settings allowed in burst mode such as a trigger event source of timer in the measure layer may affect the acquisition speed of 2000 readings second Enabling burst mode Once burst mode is enabled the instrument is dedicated to that purpose Other than setting the buffer size you cannot change any configuration parameters until burst mode is aborted Thus make sure to configure the instrument s function range and triggering to be compatible with burst mode before enabling it An incompatible configuration causes a Set tings conflict error when you try to enable burst mode Burst mode is enabled through the CONFIG DATA STORE menu This menu us displayed by pressing CONFIG and 2 66 then STORE Rules for navigating menu structures are pro vided in paragraph 2 3 4 BURST MODE This CONFIG DATA STORE menu selection is used to enable or disable the burst mode OFF Selecting this menu item returns the instrument to the CONFIG DATA STORE menu ON Select ON to enable burst mode This action clears the buffer puts the unit into idle and takes it out of autorange The following typical message then prompts you for the number of readings to store i
497. remains at the selected value APERture AUTO is coupled to the command that manually sets the aperture value APERture lt n gt When auto aperture is enabled the parameter value for APERture lt n gt changes to the automatically selected aperture value Thus when auto aperture is disabled the aperture remains at the automatically selected value Also a valid aperture value sent using the APERture lt n gt command disables auto aperture Auto aperture is also coupled to auto NPLC Enabling or disabling auto aperture also enables or disables auto NPLC Also a valid NPLC value sent using the NPLC command disables auto aperture PRINT 1 output 16 curr ac aper auto on auto Enable auto APER for ACI PRI 1 enter 16 Get response from 2002 NPLCycles lt n gt SEN Se 1 CU RRent AC NPLCycles lt n gt Set NPLC for ACI SEN Se 1 CURRent DC NPLCycles lt n gt Set N PLC for DCI SEN Se 1 VO LTage AC N PLCycles lt n gt Set NPLC for ACV SEN Se 1 VO LTage DC N PLCycles lt n gt Set NPLC for DCV SEN Se 1 RESistance N PLC ycles lt n gt Set N PLC for Q2 SEN Se 1 FRESistance N PLCycles lt n gt Set N PLC for Q4 SEN Se 1 TEM Perature N PLCycles lt n gt Set NPLC for TEMP lt n gt 0 01 to 50 Power line cycles per integration DEFault 1 MINimum 0 01 MAXimum 50 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Que
498. rial polling sequence which is used to determine which device has requested service SPD Serial Poll Disable SPD is used by the controller to remove all devices on the bus from the serial poll mode and 1s generally the last command in the serial polling sequence Addressed multiline commands Addressed commands are multiline commands that must be preceded by the device listen address before that instrument will respond to the command in question Note that only the addressed device will respond to these commands Both the commands and the address preceding it are sent with ATN true SDC Selective Device Clear The SDC command per forms essentially the same function as the DCL command except that only the addressed device responds Generally instruments return to their power up default conditions when responding to the SDC command GTL Go To Local The GTL command is used to remove instruments from the remote mode With some instruments GTL also unlocks front panel controls if they were previ ously locked out with the LLO command GET Group Execute Trigger The GET command is used to trigger devices to perform a specific action that depends on device configuration for example take a reading Although GET is an addressed command many devices respond to GET without addressing Address commands Addressed commands include two primary command groups and a secondary address group ATN is true when these com m
499. rogram with library After writing and compiling the program you will have to link it with the library support files provided with the IEEE 488 interface From the DOS prompt enter the following command line CL myprog c link ieee488 The above command line will link your program to the library The program can now be run using QuickC PC controller address 2 Set EOS for input amp ouput Query 2002 for ID string Get ID string Print response Power Up reset Readings only Single precision reals byte order swapped Loop Fetch a reading Put 2002 in talk mode Get reading Print reading Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Example Programs Scan High Speed Channels Model 2001 SCAN Microsoft QuickBASIC 4 5 Keithley KPC 488 2 Interface 1992 Keithley Instruments Inc Description This program scans and measures DCV the two high speed channels ch 5 and 10 of the Model 2001 SCAN Scanner Card The 2 channel scan keeps repeating until the buffer of the Model 2002 is filled The readings are then sent to the computer where they are displayed Required equipment e Model 2001 Multimeter e Model 2001 SCAN Scanner Card installed in the Model 2002 Program fastscan bas CALL Initialize 21 0 Setup 2001 measurement mod DIM k2001data AS STRING
500. roller s programming language The default primary address of the instrument is 16 but you can set the address to any value from 0 to 30 by using the MENU key Refer to paragraph 2 12 2 for step by step instructions on setting the primary address Section 4 contains details on using the Model 2002 over the IEEE 488 bus 2 3 Display The display of the Model 2002 is primarily used to display readings along with the units and type of measurement When not displaying readings it is used for informational messages such as menu headings and selections At the top of the display are annunciators to indicate various states of operation The Getting Started manual covers the display basics 2 3 1 Multiple displays Each measurement function has its own set of multiple dis plays shown on the bottom line of the front panel display The PREVious and NEXT DISPLAY keys scroll through the selections for the present function Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Some of the multiple displays are for multiple functions where different functions are measured sequentially from the same set of test leads The readings are shown simulta neously such as e Top line shows a DC voltage measurement bottom line shows positive and negative peak spike measurements e Top line shows an AC RMS voltage reading bottom line shows an AC frequency measurement and a crest factor calcula
501. roller only one controller may be active at any given time Certain protocol is used to pass control from one controller to another Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 D 1 TestEquipmentDepot com IEEE 488 Bus Overview TO OTHER DEVICES DEVICE 1 ABLE TO TALK LISTEN AND CONTROL COMPUTER DATA BUS DEVICE 2 ABLE TO TALK AND LISTEN 7001 DATA BYTE TRANSFER CONTROL DEVICE 3 ONLY ABLE TO LISTEN PRINTER GENERAL INTERFACE MANAGEMENT DEVICE 4 ONLY ABLE TO TALK D101 8 DATA 8 LINES DAV NRFD HANDSHAKE DAC BUS REN MANAGEMENT Figure D 1 IEEE 488 bus configuration The IEEE 488 bus is limited to 15 devices including the controller Thus any number of talkers and listeners up to that limit may be present on the bus at one time Although several devices may be commanded to listen simultaneously the bus can have only one active talker or communications would be scrambled A device is placed in the talk or listen state by sending an appropriate talk or listen command These talk and listen commands are derived from an instrument s primary address The primary address may have any value between 0 and 31 and is generally set by rear panel DIP switches or programmed in from the front panel of the instrument The actual listen address value sent out over the bus is obtained by ORing the primary address with 20
502. rom 2002 3 101 IEEE 488 Reference Parameters Query Description Program fragment 3 102 3 18 11 Parameters Query Description AUTO lt b gt ONCE SEN Se 1 CURRent AC DIGits AUTO lt b gt ONCE Control auto resolution for ACI SEN Se 1 CURRent DC DIGits AUTO lt b gt ONCE Control auto resolution for DCI SEN Se 1 VO LTage AC DIGits AUTO lt b gt ONCE Control auto resolution for ACV SEN Se 1 VO LTage DC DIGits AUTO lt b gt ONCE Control auto resolution for DCV SEN Se 1 RESistance DIGits AUTO lt b gt ONCE Control auto resolution for Q2 SEN Se 1 FRESistance DIGits AUTO lt b gt ONCE Control auto resolution for Q4 SEN Se 1 TEM Perature DIGits AUTO lt b gt ONCE Control auto resolution for TEMP lt b gt 1 or ON Enable auto resolution 0 or OFF Disable auto resolution ONCE Enable and then disable auto resolution AUTO Query state of auto resolution These commands are used to enable or disable auto resolution for the specified function With auto resolution selected the instrument automatically selects the optimum resolution for the present integration time setting see Tables 2 10 2 15 2 20 and 2 25 The ONCE parameter is analogous to a momentary toggle switch When AUTO ONCE is sent auto resolution turns on momentarily and then disables While enabled resolution is selected automatically Auto resolution then disables but the selected value is retained The auto resolut
503. rt PRINT 1 enter 16 Get response from 2002 3 115 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 19 SO U Rce subsystem Parameters Query Description Program fragment 3 116 This subsystem is used to set the logic level true or false of each digital output line The com mands for this subsystem are summarized in Table 3 11 LEVel lt b gt SOURce TTL 1 LEVel lt b gt Control digital output line 1 SOURce TTL2 LEVel lt b gt Control digital output line 2 SOURce TTL3 LEVel lt b gt Control digital output line 43 SOURce TTL4 LEVel lt b gt Control digital output line 4 lt b gt lorON Set output line true 0orOFF Set output line false LEVel Query logic level of specified line These commands are used to set the logic levels for the digital output port The actual level high or low of a digital output line depends on its programmed polarity see Output subsystem If the polarity of a line is active high then that line is high when it is set to be true 1 or ON and low when it is set to be false 0 or OFF Conversely if polarity is active low the line is low when it is set to be true and high when it is set to be false NOTE If a LIMITS control is enabled LOLIM1 or 2 HILIM1 or 2 High Low or Pass this command does not check or change the output status Refer to para graph 2 12 5 for in
504. rument will prompt you to enter the number of channels being used Use the cursor and range keys to select the number of chan nels 1 80 then press ENTER Once the number of inputs is selected you will be prompted for channel functions Briefly these menu items allow you to select the following DEFAULT This selection assigns the presently selected measurement function to all external channels CHOOSE FUNCTION This menu item allows you define functions for each external channel When selected you will be prompted to enter the channel to be programmed Use the cursor keys and the range keys to key in the channel and press ENTER The instrument will then display the available functions Use the cursor keys to select the desired function then press ENTER Repeat the procedure for every external channel to be defined SAVE ALT FCN and RESTORE ALT FCN An ALT alternate function is one that cannot be directly ac cessed with one of the eight function keys For example as sume that you select the ACV peak function using CONFIG ACV You can then use SAVE ALT to assign peak ACV to the ALT function Whenever the ALT function is encoun tered in the scan list the instrument will switch to the ACV 2 80 peak function for that channel even if the instrument is mea suring a different type of ACV RMS for example You can also use the ALT function to store an existing main function but with a different set of operating paramet
505. ry Description Program fragment Parameters Query Description IEEE 488 Reference NPLCycles Query programmed NPLC value NPLCycles DEFault Query RST default value NPL Cycles MINimum Query minimum NPLC value NPLCycles MAXimum Query maximum NPLC value The integration period measurement speed for the Model 2002 can be set using either of two commands APERture paragraph 3 18 5 or NPLCycle Aperture specifies time in seconds per integration while NPLC expresses the integration period by basing it on the power line fre quency See paragraph 2 4 for details on integration SPEED When the integration period is set using the NPLCycles command the time value for the APERture command changes accordingly to reflect the new integration rate Conversely if the integration period is set using the APERture command the value for the NPLCycle command changes accordingly On power up the instrument uses the NPLC value to determine the integration period Note If line synchronization is enabled see LSYNc command in SYSTem subsystem the integration period will not start until the beginning of the next power line cycle For example if a reading is triggered at the positive peak of a power line cycle the integration period will not start until that power line cycle is completed The integration period starts when the positive going sine wave crosses zero volts See paragraph 2 12 7 for more details PRINT 1
506. ry PRI 1 enter 16 Get response from 2002 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 3 10 3 Description IEEE 488 Reference Decimal Weighting 128 64 32 16 8 4 1 27 28 25 24 23 2 2 Value 0 1 0 1 O 1 O 1 O 1 o1 0 1 Note Bits B8 through B15 are not shown since they are not used Value 1 Enable Standard Event Events PON PowerOn 0 Disable Mask Standard Event URQ User Request CME Command Error EXE Execution Error DDE Device dependent Error QYE Query Error OPC Operation Complete Figure 3 14 Standard Event Enable Register ESR event status register query Read the Standard Event Status Register and clear it This command is used to acquire the value in decimal of the Standard Event Status Register see Figure 3 15 The binary equivalent of the returned decimal value determines which bits in the register are set This register is cleared on power up or when CLS is sent A set bit in this register indicates that a particular event has occurred For example for an acquired decimal value of 48 the binary equivalent is 00110000 For this binary value bits B4 and B5 of the Standard Event Status Register are set These set bits indicate that a device dependent error and command error have occurred The bits of the Standard Event Status Register are described as follows Bit
507. s 0 to 2 1E9 are accepted and modified as appropriate The remaining arm events not listed are not supported by the Model 2002 TARM EXT Arm on external trigger Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com HP3458A Emulation Mode TEMP Purpose To request the internal temperature of the Model 2002 Format TEMP Response Model 2002 internal temperature in C Description The TEMP query returns the internal temperature of the Model 2002 The response is in standard numeric format in degrees Celsius TERM Purpose To request INPUTS switch status Format TERM lt source gt Parameter lt source gt Not used Query ERM Returns status of INPUTS switch 1 Front 2 Rear Description The TERM command is a no op and thus it is ignored It is included for HP3458A compatibility The ERM query returns the status of the INPUTS switch as indicated above TIMER Purpose To define the timer sample interval Format TIMER lt time gt Parameter lt time gt Os to 6000s Default 1s power on 0s Query TIMER Returns the currently specified time interval in seconds Description The TIMER command defines the time interval in seconds for the TIMER sample event in the NRDGS command The Model 2002 will accept time values from Os to 6000s but will modify values appro priately for compatibility Example TIMER
508. s AC voltage AC RMS voltage frequency and crest factor 2 4 1 AC RMS average and peak voltages DC current none specific to function 2 4 2 AC current AC RMS or average current and frequency 2 4 2 Data storage buffer AC RMS and average current 2 wire resistance Source current 2 4 3 Voltage drop across DUT 4 wire resistance Source current 2 4 3 Voltage drop across DUT Lead resistance Frequency Period calculation 2 4 4 Trigger level Temperature Celsius Fahrenheit and Kelvin units 2 4 5 RTD resistance or thermocouple voltage Reference junction thermocouples only Maximum and minimum values 2 8 Average and standard deviation Notes 1 Multiple displays for calculated values and limits bar graph are not available for the frequency function 2 The multiple display for adjacent channel readings is not available for the DC and AC current functions 2 5 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation Bar graph The normal bar graph with a zero at the left end is a graphical representation of a reading as a portion of a range See Figure 2 1 The vertical lines displayed along the bar designate 0 25 50 75 and 100 of full scale Each full segment of the bar represents approximately 4 of the range limit 11 96859 VDC Full Range 25 of 50 of 75 of full range full range full range Figure 2 1
509. s been accepted 4 The talker aware that the data has been accepted stops sending data and indicates that data is not being sent 5 The listener aware that there is no data on the bus indi cates that it is ready for the next byte of data Bus description The IEEE 488 bus which is also frequently referred to as the GPIB General Purpose Interface Bus was designed as a parallel transfer medium to optimize data transfer without using an excessive number of bus lines In keeping with this goal the bus has only eight data lines that are used for both data and with most commands Five bus management lines and three handshake lines round out the complement of bus signal lines A typical set up for controlled operation is shown in Figure D 1 Generally a system will contain one controller and a number of other instruments to which the commands are given Device operation is categorized into three operators controller talker and listener The controller does what its name implies it controls the instruments on the bus The talker sends data while a listener receives data Depending on the type of instrument any particular device can be a talker only a listener only or both a talker and listener There are two categories of controllers system controller and basic controller Both are able to control other instru ments but only the system controller has the absolute authority in the system In a system with more than one con t
510. s for frequency measurements The configuration menu is summarized in Table 2 22 This menu is accessed by pressing CONFIG and then FREO Paragraph 2 3 5 summa rizes the rules for navigating through the menus Note that a function does not have to be selected in order to be configured When the function is selected 1t will assume the programmed status MAX SIGNAL LEVEL The maximum signal level is used to specify the maximum expected peak input voltage or current level for frequency measurements The following MAX SIGNAL LEVEL selections depend on which input terminals are presently selected see INPUT TERMINALS 1V 10V 100V 1000V or TTL Sets the maximum signal level for the voltage input terminals Selecting the TTL parameter configures the maximum signal level to 10V and the trigger level to 0 8V ImA 10mA 100mA or 1A Sets the maximum signal level for the AMPS input terminals The MAX SIGNAL LEVEL setting is critical to the accu racy of frequency measurements If the selected level is too large the input signal is not large enough to trigger the instrument s zero crossing circuitry and a OmHz reading results To verify the proper level use the AC voltage or AC current function to measure the rms value of the input signal The resultant reading indicates the best level to use For example if the rms value is 2V a maximum signal level setting of 10V is appropriate Note that the coupling used in the AC measurement
511. s query command is used to read the result of the CALC 2 operation If CALC 2 is disabled or NONE is selected the raw reading will instead be read Note that this command does not initiate a calculation This command is used to simply read the result of the last calculation PRINT 1 output 16 calc2 data Query CALC2 reading PRINT 1 enter 16 Get response message from 2002 CALCulate3 This Calculate subsystem is used to configure and control the limit tests LIMIT 1 test and LIM IT 2 test See paragraph 2 12 5 for details on limit tests CDATA lt n gt CALCulate3 LIM it 1 U PPer DATA lt n gt Specify upper LIMIT 1 CALCulate3 LIM it 1 LO Wer DATA lt n gt Specify lower LIMIT 1 CALCulate3 LIM it2 U PPer DATA lt n gt Specify upper LIMIT 2 CALCulate3 LIM it2 LO Wer DATA lt n gt Specify lower LIMIT 2 lt n gt 9 999999e35 to 9 999999e35 Specify limit value DEFault Set specified upper limit to 1 Set specified lower limit to 1 MINimum Set specified limit to 9 999999e35 MAXimum Set specified limit to 9 999999e35 UPPer Query specified upper limit UPPer DEFault Query RST default upper limit UPPer MINimum Query lowest allowable upper limit UPPer MAXimum Query largest allowable upper limit LOWer Query specified lower limit LOWer DEFault Query RST default lower limit LOWer MINimum Query lowest allowable lower limit LOWer MAXimum Query largest allowable lower
512. s which device was requesting ser vice by pulling on the SRQ line For description of the other bits in the Status Byte Register refer to paragraph 3 10 12 The IEEE 488 2 standard uses the following common query command to read the Status Byte Register STB When reading the Status Byte Register using the STB command bit B6 is called the MSS bit None of the bits in the Status Byte Register are cleared when using the STB command to read it The IEEE 488 1 standard has a serial poll sequence that also reads the Status Byte Register and is better suited to detect a service request SRQ When using the serial poll bit B6 is called the RQS bit Serial polling causes bit B6 RQS to reset Serial polling is discussed in more detail later in this paragraph see Serial Poll and SRQ Any of the following operations clear all bits of the Status Byte Register e Cycling power e Sending the CLS common command NOTE The MAV bit may or may not be cleared Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Status Summary M essages Service x H Request A Generation Serial Poll t Read by Serial Poll lt t Read by STB OSB Operation Summary Bit MSS Master Summary Status RQS Request for Service ESB Event Summary Bit MAV Message Available QSB Questionable
513. sages to select from Use the appropriate cursor key to display them 4 A numeric parameter is keyed in by placing the cursor on the digit to be changed and using the RANGE A or Y key to increment or decrement the digit 5 A change is only executed when ENTER is pressed Entering an invalid parameter generates an error and the entry is ignored 6 The EXIT key is used to back out of the menu structure Any change that is not entered is cancelled when EXIT 1s pressed The EXIT key has additional actions and are summarized in Table 2 5 2 4 Functions To minimize the need to reprogram setup conditions every time you switch from one function to another each function Table 2 5 EXIT key actions Front Panel Operation remembers its own unique setup configuration Setup con figuration parameters that are remembered include e Range e Relative e Integration time Filtering e Display resolution Multiple displays To access the configuration menus for the measurement functions press the CONFIG key and then a function key DCV ACV DCI ACI 22 04 FREQ TEMP Rules for navigating the menu structures are covered in paragraph 2 3 4 2 4 1 DC and AC voltage The Model 2002 can make DCV measurements from 1nV to 1100V and ACV measurements from 10nV to 775V The basic measurement procedures for DCV and ACV are con tained in the Getting Started manual Voltage configuration The following information explains
514. se MEDIUM when a compromise between noise performance and speed is acceptable NORMAL Sets integration time to 1 PLC A compromise like MEDIUM but NORMAL provides better noise perfor mance at the expense of speed HIACCURACY Sets integration time to 10 PLC Use HI ACCURACY when high common mode and normal mode rejection is required SET SPEED EXACTLY When this parameter is selected the current PLC value is displayed By using the cursor keys lt q and and the RANGE A and Y keys you can enter any PLC value from 0 01 to 50 Be sure to press ENTER after keying in a new value Note that an integer PLC value will increase noise rejection SET BY RSLN This parameter optimizes the integration time for the present resolution setting See Table 2 8 for the default integration times of the DCV and ACV functions The default set by resolution integration times of other func tions are listed in Tables 2 13 2 18 and 2 24 2 12 FILTER FILTER lets you set the digital filter response The filter menu is available from the function configuration menus i e CONFIGURE DCV or by pressing CONFIGURE FILTER with the desired function already selected All of the param eters menu items for FILTER are explained in paragraph 2 9 Since the AUTO parameter has specific effects on DCV and ACV it is covered here AUTO This parameter for a digital filter optimizes its use for the present measurement function The defaults for auto matic
515. seisc c ccsessueesseccasaceapaccvienn NEE bee aprietan EEEE EREK ESERE E CREE EESE NEUE testes ene Ee RE Ment E IEEE 488 Reference elek et e EE TEEE 488 bus connections Eh Leet EE QuIckKBASIC 4 5 pro Sram sses sirians res oa ERE ea En EEE EEEE EEEE EO ETE EEEE EERE dra snake ENEE General b scommandS EE E REN remote enable iia a adas IFC Ee EN E ENEE Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 3 5 3 LLO Kale Ree EE 3 5 4 GIL CEO 10 EE ve 3 5 5 DELAS na 3 5 6 SDC selective device Clear in di tii tdci 3 3 7 GET group Execute Ig TET EE 3 5 8 SPE SPD serial polling EE 3 6 Front panel aspects of IEEE 488 operation ln 3 6 1 Error and Status MESSABE comodo EEE ES ET P Ion ERE E EEEE EK EE E oE o pea T iaeei 3 6 2 TREE 488 status ii Gators caian dond er ele liso aer aa eadi 3 6 3 LOCAL EE 3 7 NE E aa a ASE EA E E E E 3 7 1 IRA ar EEEE EE TE REEERE EEE E E a E o edea 3 7 2 o a a A AEE EE EE E ade 3 7 3 EAEI EE D 3 7 4 Enable EE D 3 7 5 A a R 3 7 6 Status byte and service request SRQ o eeeecesseceseecsseesececeneeeseceeneeseecesaeceeecaeeeneeceeecaeceeaeeeeeesaeeeeeecsas 3 8 Trigger model OPER ANN operation ooocncconnnonnnncnononononncononononnncnnonnnonnnnn nn enn ran non nena nen no non on oran cen n nn nn conan nnnnans 3 9 SAI e EE 3 10 RL E 3 10 1 CIS Clear SLAMS ciar Ti SE 3 10 2 We EE ESE enable query EE 3 10 3 AS EA AA nssdesasceuaene
516. selected measurement function for each channel When the scan has completed you can recall stored data and or scan again To disable scanning press the EXIT key Using ratio and delta The Model 2002 can display the difference DELTA or quo tient RATIO between the signal on any two internal scan ner channels The following paragraphs discuss ratio and delta calculations and also give step by step procedures for using ratio and delta When the instrument is first placed in the ratio or delta mode it will close the scanner reference channel and then wait for a trigger When the reading is triggered the unit will make a measurement on the reference channel switch to the mea surement channel and then take a second measurement After measuring the measurement channel the unit will compute and display the ratio or delta value and switch back to the reference channel to wait for the next trigger The steps below outline the basic procedure for making ratio measurements The procedure for delta measurements is essentially the same except that you would select DELTA in the appropriate menu Step 1 Connect inputs Input signals must be connected to the two channels you intend to define as measurement and reference channels Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Step 2 Define measurement channel 1 From normal display press CONFIG SCAN The in strument will dis
517. set Second option presents negative spikes and lowest spike Highest and lowest spike can be reset by pressing DCV function button Third option displays the maximum and minimum levels of the input signal Spikes displays are also available through CONFIG ACV ACTYPE as primary displays 17 For on scale readings no trigger delays internal trigger digital filter off normal autozero display off SREAL format These rates are for 60Hz and 50Hz Rates for 400Hz equal those for 50Hz 18 Using Internal Buffer Ge Specifications apply for sine wave input with a 10 reading digital filter If no filter is used add 0 25 of range typical uncertainty 20 Specifications assume AC DC coupling for frequencies below 200Hz Below 20Hz add 0 1 of reading additional uncertainty 21 Add 0 001 of reading x VIN 100V 2 additional uncertainty for inputs above 100V 2 Typical values Specifications are subject to change without notice SPEC 2002 Rev H February 2009 Page 3 of 14 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Keithley Instruments Inc Multimeter Specifications 28775 Aurora Road Cleveland Ohio 44139 1 888 KEITHLEY www keithley com AC VOLTS ACV INPUT CHARACTERISTICS Temperature Coefficient of reading of range C Rms Range Peak Input Full Scale rms Resolution Input Impedance Outside Toa 45 C 200 mV IV 210 0000 100 nv 1MQ 2 with lt 140pF
518. set compensated ohms This command is used to enable or disable the offset compensated ohms feature Offset com pensation is used to cancel the effects of offset voltages such as thermal EMFs when making resistance measurements Offset compensation is explained in detail in paragraph 2 4 3 OFF SETCOMP PRINT 1 output 16 res ocom on ocom Enable offset compensation PRINT 1 enter 16 Get response from 2002 DTCouple commands The following commands are used to make differential thermocouple temperature measure ments using the Model 1801 Nanovolt Preamp Refer to the instruction manual for the Model 1801 for details TYPe lt type gt SEN Se 1 TEM Perature DTCouple TYPE lt type gt Set thermocouple type lt type gt J Set operation for Type J thermocouple K Set operation for Type K thermocouple T Set operation for Type T thermocouple E Set operation for Type E thermocouple R Set operation for Type R thermocouple S Set operation for Type S thermocouple B Set operation for Type B thermocouple N Set operation for Type N thermocouple USER Select user defined slope for other type of thermocouples TYPe Query DTC type This command is used to set thermocouple type for differential thermocouple measurements using the Model 1801 Nanovolt Preamp Selecting one of the seven standard thermocouples J K T E R S B or N requires that you specify the reference temperature for the reference ther
519. size to 35 points Select Full element group Select IEE format E754 single precision data Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Example Programs Program bufclint bas cont cmd trac feed cont next OPC GOSUB send2002 cmds rout scan lsel ext GOSUB send2002 trigger equipment cmds init GOSUB send7001 init GOSUB send2002 cmds Start filling tl TIMER Wait for buffer to fill DO DO LOOP UNTIL srg spoll DmmAddr poll status LOOP UNTIL poll AND 64 cmd stat meas even GOSUB send2002 enter Sme length 16 status CALL CALL Go get buffer contents cmds CALL transmit UNT UNL trac data GOSUB send2002 DIM Readings 1 TO 350 dummy 1 TO 1 Setup CEC for LISTEN amp 2002 for TALK A TALK 16 status Read 2 bytes 0 r SPACES 2 CALL receive r 1 status NumDataPoints 35 Get Data in 4 blocks since C per data transfer NumBytes NumDataPoints 4 CALL rarray Readings 1 NumBytes 1 status get Terminator Character s CALL settimeout 100 CALL rarray dumy 1 1 1 status CALL settimeout 10000 CALL transmit UNT UNL status t2 TIMER t3 t2 t1 FOR i 1 TO 35
520. spednnsssvacevbansseubesvieess 3 10 4 IDN identification QuELY varices 3 10 5 OPC operation Complete e casscsssetsasesses sanescescbsaansscaevenssedisensteutansedetesaiesbiasocepessdinssnessabevedsiseibesstenss 3 10 6 OPC Operation complete query EE 3 10 7 OPT option identification QUeLY scsses sceseecassssinnseotevennvessdeseaesdesstasnssanesnsatondensesssobnssepsdevens sesubesoieeds 3 10 8 PERCY TE Cal macia in e ri ile cantos ii ise tents 3 10 9 PRS To POSED EE 3 10 10 SAV EE 3 10 11 SRE lt NRf gt Service request enable i c ssc esccesssssnsssunsvoneseasdessderssnstaszen sur Er EEEa Eer T ERE ETVE SRE service request Enable Query coconciricocnn cinco racincas recorrieron ereer vesit cesos vi Seo sciences 3 10 12 RE EEN e UE EE 3 10 13 NEE TEE 3 10 14 PDS Te Self test QUE ii oa 3 10 15 WE EE Ee 3 11 Signal oriented measurement COMMANAS cococnccconnnononnnonnnnnnnnn ron nnnn ono non n enn n en nene n on nr one none neon nen nen n narran enn rra nan 3 12 Calculate subsystem ai alii id 3 12 1 JCAL Collate css oc taste ve peered eee ee aera 3 12 2 d RRE EE 3 12 3 LON E E WEE 3 13 DISPlay UDS Y te EE 3 14 ANAIS O 3 15 dl Ier L EE 3 16 QUT PUE SUD Y EE 3 17 ROUTE SUD VS iii ls eee cluusuieeseuenedueusonsod sects 3 17 1 RER 3 17 2 OPEN Cl iia aiii 3 17 3 FOPEN GAL Lindh sou nian sinensis eine AGS nid eG oases eee Gent eae Gane ease 3 17 4 AAA O 3 18 KL EE E 3 18 1 RTSKKI RR IER 3 18 2 ALTernate 1
521. st programs use only the Model Microsoft QuickC 2 0 Most examples use the Keithley 2002 while some include additional equipment such as the CEC IEEE 488 interface cards Other interfaces used Model 2001 SCAN Scanner Card or a Model 7001 or 7002 include IOtech and National GPIB Switch System Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 G 1 TestEquipmentDepot com Example Programs Measure and Display Reading MEASure Command Microsoft QuickBASIC 4 5 Keithley KPC 488 2 Interface 1992 Keithley Instruments Inc Description Every time this program is run the Model 2002 goes to the most sensitive DCV range and makes a single measurement using the MEASure command The reading is then dis played on the computer CRT Required equipment e Model 2002 Multimeter Program 2002tst bas CALL initialize 21 0 MODEL 2002 COMMANDS CALL send 16 CLS Gpib status CALL send 16 meas volt dc Gpib status data SPACES 80 CALL enter data Gpib len 16 Gpib status PRINT data G 2 e Microsoft QuickBASIC 4 5 e Any one of the following IEEE 488 interfaces Keithley Model KPC 488 2 Keithley Model KPC 488 2AT Capital Equipment Corporation PC lt gt 488 The program assumes that the Model 2002 is set to address 16 Loading user library The user library for QuickBASIC 4 5 is provided with the TEEE 488 interface ieeeqb qlb Assuming Qui
522. stEquipmentDepot com KEITHLEY Keithley Instruments Inc 28775 Aurora Road Cleveland Ohio 44139 1 888 KEITHLEY www keithley com MAXIMUM INPUT LEVELS Model 2002 Multimeter Specifications Rated Input Overload Recovery Time HI to LO 1100V lt 900 ms HI Sense to LO 350V pk 250V rms lt 900 ms LO Sense to LO 150V pk 100V rms lt 900 ms Input to LO 2A 250V fused HI to Earth 1600V lt 900 ms LO to Earth 500V Time Stamp Resolution us Accuracy 0 01 of elapsed time 1ps Maximum 2 100 000 000000 seconds 24 days 7 hours Delay Time Trigger edge to reading initiation Timer Maximum 999 999 999 seconds 11 days 14 hours Resolution 1ms Jitter 1ms Reading initiation to reading initiation Maximum 999 999 999 seconds 11 days 14 hours Resolution 1ms Jitter 1ms IEEE 488 BUS IMPLEMENTATION Implementation IEEE 488 2 SCPI 1991 0 Multiline Commands DCL LLO SDC GET GTL UNT UNL SPE SPD Uniline Commands IFC REN EOI SRQ ATN Interface Commands SH1 AH1 T5 TEO L4 LEO SR1 RL1 PPO DC1 DT1 CO E1 DIGITAL UO Connector Type 8 pin D subminiature Input One pin TTL compatible Outputs Four pins Open collector 30V maximum pull up voltage 100mA maximum sink current 100 output impedance Control Direct control by output or set real time with limits GENERAL SPECIFICATIONS AND STANDARDS COMPLIA
523. ster can be read using the SRE query com mand PRINT 1 output 16 sre 32 sre Unmask ESB bit and query register PRINT 1 enter 16 Send response message to 2002 Bit Position B7 Event OSB MAV QSB Decimal Weighting 128 16 8 27 24 23 Value 0 1 O 1 O 1 0 11 Of1 0 1 Value 1 Enable Service Request Events OSB Operation Summary Bit Event ESB Event Summary Bit 0 Disable M ask Service MAV Message Available Request Event QSB Questionable Summary Bit EAV Error Available MSB Measurement Summary Bit Figure 3 16 Service Request Enable Register 3 37 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 10 12 Description Program fragment STB status byte query Read the Status Byte Register The STB query command is used to acquire the value in decimal of the Status Byte Register The Status Byte Register is shown in Figure 3 17 The binary equivalent of the decimal value determines which bits in the register are set All bits except Bit 6 in this register are set by other event registers and queues Bit 6 sets when one or more enabled conditions occur The STB query command does not clear the status byte register This register can only be cleared by clearing the related registers and queues Register and queue structure are explained in
524. t IEEE 488 OY Ey Figure 3 3 IEEE 488 connector location 2 Tighten the screws securely but do not overtighten them 3 Add additional connectors from other instruments as required 4 Make certain that the other end of the cable is properly connected to the controller Most controllers are equipped with an IEEE 488 style connector but a few may require a different type of connecting cable Con sult the instruction manual for your controller for the proper connecting method NOTE The IEEE 488 bus is limited to a maxi mum of 15 devices including the control ler The maximum cable length is 20 meters or two meters times the number of devices whichever is less Failure to observe these limits may result in erratic bus operation 3 3 Primary address selection The Model 2002 is shipped from the factory with a pro grammed primary address of 16 The primary address may be set to any value between 0 and 30 as long as address con flicts with other instruments are avoided Note that control lers are also given a primary address so do not use that address either Most frequently controller addresses are O or 21 but you should consult the controller s instruction man ual for details Whatever primary address you choose you must make certain that it corresponds with the value speci fied as part of the controller s programming language Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA
525. t 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com STB Purpose Format R esponse Description Note SW EEP Purpose Format Parameter Default Query Description Example Tor TRIG Purpose Format HP3458A Emulation Mode To request the status register value GER Decimal weight Bit number Status register condition 4 2 SRQ command executed 8 3 Power on 16 4 Ready for instructions 32 5 Error as set by EMASK 64 6 Service requested SRQ 128 7 Data available The STB query returns a number representing the weighted sum of all set bits in the status register The instrument may be programmed to generate an SRQ for specific status register conditions with the ROS command The STB query will always show bit 4 as being cleared since the query is being processed but this bit can be checked by using serial polling To program the interval between readings and the number of samples per trigger SWEEP lt effective_interval gt lt _samples gt 0 001 to 9999999 99 lt effective_interval gt lt _samples gt 1 to 99999 Interval 0 samples 1024 power on 1 SWEEP Returns two responses separated by a comma 1 the specified interval and 2 the specified number of samples The SWEEP command specifies the both the effective interval between readings samples and the total number of samples taken per trigger event
526. t Angle brackets lt gt are used to denote parameter type Do not include the brackets in the program message For example SOURce TTL2 lt b gt The lt b gt indicates that a Boolean type parameter is required Thus to set digital input line 2 true you must send the command with the ON or parameter as follows SOURce TTL2 ON or SOURce TTL2 1 Query commands This type of command requests queries the currently programmed sta tus It is identified by the question mark at the end of the fundamental form of the com mand Most commands have a query form Example TRIGger TIMer Queries the timer interval Most commands that require a numeric parameter lt n gt can also use the DEFault MINi mum and MAXimum parameters for the query form These query forms are used to deter mine the RST default value and the upper and lower limits for the fundamental command Examples TRIGger TIMer DEFault Queries the RST default value TRIGger TIMer MINimum Queries the lowest allowable value TRIGger TIMer MAXimum Queries the largest allowable value Case sensitivity Common commands and SCPI commands are not case sensitive You can use upper or lower case and any case combination Examples RST rst SCAN scan SYSTem PRESet system preset Long form and short form versions A SCPI command word can be sent in its long form or short form version The command subsystem tables in this section provi
527. t Output are the eight data lines used to transmit both data and multiline commands and are bidirectional The data lines operate with low true logic Bus management lines The five bus management lines help to ensure proper inter face control and management These lines are used to send the uniline commands ATN Attention The ATN line is one of the more impor tant management lines in that the state of this line determines how information on the data bus is to be interpreted IFC Interface Clear As the name implies the IFC line controls clearing of instruments from the bus REN Remote Enable The REN line is used to place the instrument on the bus in the remote mode Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com EOI End or Identify The EOI is usually used to mark the end of a multi byte data transfer sequence SRQ Service Request This line is used by devices when they require service from the controller Handshake lines The bus handshake lines operate in an interlocked sequence This method ensures reliable data transmission regardless of the transfer rate Generally data transfer will occur at a rate determined by the slowest active device on the bus One of the three handshake lines is controlled by the source the talker sending information while the remaining two lines are controlled by accepting devices the listener or lis teners r
528. t n gt Specify reference for ACV SEN Se 1 VO LTage DC REFerence lt n gt Specify reference for DCV SEN Se 1 RESistance REFerence lt n gt Specify reference for Q2 SEN Se 1 FRESistance REFerence lt n gt Specify reference for Q4 SEN Se 1 FREQ uency REFerence lt n gt Specify reference for FREQ SEN Se 1 TEM Perature REFerence lt n gt Specify reference for TEMP lt n gt 2 1 to4 2 1 Reference for ACI and DCI 1100 to 1100 Reference for DCV and ACV 0 to 1 05e9 Reference for Q2 0 to 2 1e6 Reference for Q4 0 to 1 5e7 Reference for FREQ 328 to 3310 Reference for TEMP F 200 to 1821 Reference for TEMP C 73 to 2094 Reference for TEMP K DEFault 0 All functions MINimum Minimum value for specified function MAXimum Maximum value for specified function REFerence Query programmed reference value REFerence DEFault Query RST default reference value REFerence MINimum Query lowest allowable reference value REFerence MAXimum Query largest allowable reference value These commands are used to establish a reference value for the specified function When Ref erence is enabled see REFerence STATe the result will be the algebraic difference between the input signal and the reference value Reading Input signal Reference From the front panel reference is called relative REL See paragraph 2 6 for more information on REL The REFerence lt n gt command is coupled to the ACQuire comma
529. t que cle Clear Error Queue Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 21 SYSTem subsystem 3 21 1 D escription Program fragment 3 21 2 Parameters Query D escription Program fragment 3 21 3 Description Program fragment The SYSTem subsystem contains miscellaneous commands that are summarized in Table 3 16 PRESet SYSTem PRESet Return to SY STem PRESet defaults This command returns the instrument to states optimized for front panel operation SYS Tem PRESet defaults are listed in the SCPI tables Tables 3 4 through 3 16 PRINT 1 output 16 syst pres Return 2002 to default conditions PO Setup lt name gt SYSTem PO Setup lt name gt Program power on defaults lt name gt RST Select RST defaults on power up PRESet Select SYSTem PRESet defaults on power up SAVX Select saved defaults on power up where X 0 to 9 POSetup Query power on setup This command is used to select the power on defaults With RST selected the instrument pow ers up to the RST default conditions With PRES selected the instrument powers up to the SYStem PRESet default conditions Default conditions are listed in the SCPI tables Tables 3 4 through 3 16 With one of the SAV parameters selected the instrument powers on to the setup that is saved in the specified memory location using the SAV command Valid SAV pa
530. t to occur or when the HOLD control source is selected Note that in Arm Layer 1 and the Trigger Layer MMediate also loops operation around the delays es SIGNal Same function as an IMMediate command Delays Arm Layer 2 and the Trigger Layer have a pro grammable Delay 0 to 999999 999 seconds that is asserted after an event detection Note however that a Delay can be bypassed by sending an MMediate or SIGNal command Device Action The primary device action is a measure ment However the device action could include a function change and a channel scan 1f scanner is enabled A channel is scanned closed before a measurement is made When scanning internal channels the previous channel opens and the next channel closes break before make Also included in the device action is the internal settling time delay for the relay Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Output Triggers In Arm Layers 1 and 2 the output triggers are enabled only if their respective source bypasses are also enabled If a TLINk control source is selected the output trigger pulse is available on the selected TRIGGER LINK output line For all other control source selections the trigger pulse is available at the METER COMPLETE connector In the Trigger Layer the output trigger is always enabled and occurs after every device action If the control source is set for EXTer
531. tails Select in circuit I measure Get response from 2002 PRINT 1 output 16 curr dc meth icir meth PRINT 1 enter 16 SOURce lt name gt SEN Se 1 FREQ uency SOURce lt name gt Specify input source for FREQ lt name gt CURRent Select current frequency input source VOLTage Select voltage frequency input source SOURce Query frequency input source Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Description Program fragment 3 18 16 Parameters Query Description Program fragment Parameters IEEE 488 Reference This command is used to select the input source for the signal to be measured If connecting a current signal to the Model 2002 AMPS and LO INPUT terminals select the CURRent input source If connecting a voltage signal HI and LO INPUT terminals select the VOLTage input source PRINT 1 output 16 freq sour curr sour Select current input source PRINT 1 enter 16 Get response from 2002 THReshold commands Use these commands to set the maximum signal level and the trigger level for frequency mea surements RANGe lt n gt SEN Se 1 FREQ uency TH Reshold CURRent RANGe lt n gt Set current threshold range SEN Se 1 FREQ uency TH Reshold VO LTage RANGe lt n gt Set voltage threshold range lt n gt Otol Specify signal level in amps current threshold 0 to 1000 Specify signal l
532. tainties of the operator s sources may be different All AC specifications are given as absolute accuracies TYPICAL ACCURACIES Accuracy can be specified as typical or warranted All specifications shown are warranted unless specifically noted Almost 99 of the 2002 s specifications are warranted specifications In some cases it is not possible to obtain sources to maintain traceability on the performance of every unit in production on some measurements e g high voltage high frequency signal sources with sufficient accuracy do not exist These values are listed as typical 2002 SPECIFIED CALIBRATION INTERVALS Measurement Function 24 Hour 90 Day 1 Year 2 Year DC Volts DH DC Volts Peak Spikes DH AC Volts rms D DN 2 AC Volts Peak DH AC Volts Average DN D D AC Volts Crest Factor H Ohms DC Current DH A DC In Circuit Current H P AC Current Frequency H Temperature Thermocouple H Temperature RTD DH DC VOLTS DCV INPUT CHARACTERISTICS AND ACCURACY Enhanced Accuracy 10PLC DFILT 10 Relative Accuracy Temperature Coefficient ppm of reading ppm of range ppm of reading ppm of range C Range Full Scale Resolution Input Resistance Transfer 24 Hours 90 Days 1 Year 2 Years Outside TCAL 5 C 200 mV 210 000000 1 nV gt 100
533. tamp see paragraphs 3 14 FORMat ELEMents and 3 22 7 TRACe TSTamp FORMat TYPE lt name gt SYSTem TSTamp TYPE lt name gt Select timestamp type Parameters lt name gt RELative Select relative time timestamp RTClock Select real time timestamp l RELative is a 55 day max clock at a lus resolution 2 RTCLock is a 100 year max calendar at a 10ms resolution Query TYPE Query timestamp type Description This command is used to select the timestamp type RTClock selects the real time clock time stamp Readings are reference to the date and time RELative selects the relative time time stamp Readings are referenced in seconds to a timer The timer starts at zero seconds when the instrument is turned on or when the timestamp is reset see next command Program fragment PRINT 1 output 16 syst tst type rtc type Select RIClock and query PRINT 1 enter 16 Get response message from 2002 RELative RESet SYSTem TSTamp RELative RESet Reset relative timestamp to 0 Description This action command is used to reset the relative time timestamp to zero seconds Program fragment PRINT 1 output 16 syst tst rel res Reset relative timestamp 3 21 15 RN U Mber RESet SYSTem RN U M ber RESet Reset reading number to zero When the reading number is included as a GPIB data element see paragraph 3 14 FOR MAT ELEMents each reading sent over the bus is assigned a number starting at 0 Th
534. te for the RTCLock control source Setting an invalid date i e February 29 1994 for the clock event results in an error and the previous date is retained PRINT 1 output 16 arm rtcl date lt 1993 gt lt 12 gt lt 1 gt date Set date to December 1 1993 andquery PRINT 1 enter 16 Get response message from 2002 TIME lt hr gt lt min gt lt sec gt ARM SEQ uence 1 LAYer RTCLock TIME lt hr gt lt min gt lt sec gt Set time for RTCLock control source lt hr gt 0 to 23 Specify hour 24 hour format lt min gt 0 to 59 Specify minute lt sec gt 0 00 to 59 99 Specify second round to 1 100 sec DATE Query the time This command is used to set the time for the RTCLock control source Note that the time must be set using the 24 hour format i e hour 13 is 1pm Setting an invalid time results in an error and the previous time is retained TIME returns the time to nearest hundreth of a second PRINT 1 output 16 arm rtcl time lt 14 gt lt 36 gt lt 0 gt time Set time to 2 36 pm and query PRINT 1 enter 16 Get response message from 2002 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 24 UNIT subsystem Parameters Query Description Program fragment Query Description Program fragment Parameters Query The UNIT subsystem is used to configure and co
535. te or local modes PP Parallel Poll Function The instrument does not have parallel polling capabilities PPO DC Device Clear Function DC1 defines the ability of the instrument to be cleared initialized DT Device Trigger Function DTI defines the ability of the Model 2002 to have readings triggered C Controller Function The instrument does not have controller capabilities CO TE Extended Talker Function The instrument does not have extended talker capabilities TEO LE Extended Listener Function The instrument does not have extended listener capabilities LEO E Bus Driver Type The instrument has open collector bus drivers E1 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 B 1 TestEquipmentDepot com ASCII Character Codes and IEEE 488 Multiline Interface Command Messages IEEE 488 lE E E 488 Decimal Hexadecimal ASCII M essages Decimal Hexadecimal ASCII M essages 0 00 NUL 16 10 DLE 1 01 SOH GTL 17 11 DCI LLO 2 02 STX 18 12 DC2 3 03 ETX 19 13 DC3 4 04 EOT SDC 20 14 DC4 DCL 5 05 ENQ PPC 21 15 NAK PPU 6 06 ACK 22 16 SYN 7 07 BEL 23 17 ETB 8 08 BS GET 24 18 CAN SPE 9 09 HT TCT 25 19 EM SPD 10 OA LF 26 1A SUB 11 OB VT 27 1B ESC 12 0C FF 28 1C FS 13 0D CR 29 1D GS 14 OE SO 30 1E RS 15 OF SI 31 1F US Message sent or received with ATN true Test Equipment Depot 800 517 8431 99 Washington Street Me
536. ted number of reading conver sions averages them and yields a reading It then flushes its stack and starts over This characteristic is useful when scan ning channels If burst mode is enabled with filtering the post processing time increases A filter mode setting of repeating is ignored in burst mode Filter modes are compared in Figure 2 31 2 71 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation 2 72 Voltage po of range B Window Violation ei Los of range e of range A Lao of range Integration Time H d Le t 2 t tu ts t t tg to to ta Type averaging Conversions Az A2 A3 A4 As Ae By Ba B3 B4 Bs Ay Ay A gt A3 A4 As As By B gt B gt B4 Ad e Ay Ay Ay Ay A3 Ay Ay As By By B3 Readings 5 A Ay Ay Ay A2 A3 A3 A4 As By B2 Ay Ay Ay A1 Al A2 A2 A3 A4 As By Mode moving Reading Reading Reading Reading Reading Reading Reading Reading Reading Reading Reading 1 2 3 4 5 6 7 8 9 10 11 Type advanced Conversions A1 A2 Az Ag As Ae Bi B2 B3 B4 B5 i Ay A gt A3 A4 As By By B gt B gt B4 Readings 5 AL Ay Ay A2 Az Aa By By By B2 B3 J Ay Ay Ay Az A2 A3 By By By By B2 Mode moving A Ar Ay AL AL A2 Bi Bi D Br D Noise level 1 of range i i i A Reading Reading Reading Reading Reading Reading Reading Reading Reading Reading Reading 1 2 3 4 5 6 7 8 9 10 11 Type averaging Conversions Ai
537. tem query commands 0 1 1 0 3 Response Message Terminator RMT Each response message is terminated with an LF line feed and EOI end or identify The following example shows how a multiple response message is terminated 0 1 1 0 lt RMT gt Message exchange protocol The message exchange protocol can be summarized by the two following rules Rule 1 You must always tell the M odel 2002 what to send to the computer The following two steps must always be performed in this order to send information from the instrument to the computer 1 Send the appropriate query command s in a program message 2 Address the Model 2002 to talk Rule 2 The complete response message must be received by the computer before another program message can be sent to the Model 2002 3 28 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 3 10 Common commands IEEE 488 Reference Common commands summarized in Table 3 2 are device commands that are common to all devices on the bus These com mands are designated and defined by the IEEE 488 2 standard Table 3 2 IEEE 488 2 common commands and queries Mnemonic Name Description CLS Clear status Clears all event registers and Error Queue ESE lt NRf gt Event Enable command Program the Standard Event Enable Register ESE Event Enable query Read the Standard Event Enable Register ESR Event status register
538. test Safe operation requires the use of a lid interlock Ifa screw is present connect it to safety earth ground using the wire recommended in the user documentation The A symbol on an instrument indicates that the user should refer to the operating instructions located in the user documentation The A symbol on an instrument shows that it can source or measure 1000V or more including the combined effect of normal and common mode voltages Use standard safety precautions to avoid personal contact with these voltages The A symbol on an instrument shows that the surface may be hot Avoid personal contact to prevent burns The de symbol indicates a connection terminal to the equipment frame If this symbol is on a product it indicates that mercury is present in the display lamp Please note that the lamp must be properly disposed of according to federal state and local laws The WARNING heading in the user documentation explains dangers that might result in personal injury or death Always read the associated information very carefully before performing the indicated procedure The CAUTION heading in the user documentation explains hazards that could damage the instrument Such damage may invalidate the warranty Instrumentation and accessories shall not be connected to humans Before performing any maintenance disconnect the line cord and all test cables To maintain protection from electric shock and fire replacement components in
539. that you cannot use the same trigger line for both input and output e SEMI SYNCHRONOUS In this mode the input and output triggers for the Model 2002 are assigned to the same line After selecting this trigger link mode you will be prompted to select the trigger line TIMER Use the timer to control the time interval between measurements The timer can be set for an interval from 0 001 seconds 1msec to 999999 999 seconds with 1msec resolution After a measurement is triggered to start the next measure ment starts at the end of the programmed timer interval If however the programmed timer interval is shorter than the time it takes to complete a single measurement the next measurement does not start until the previous one is done NOTE The front panel TRIG key see MAN UAL is active with the timer selected Pressing the TRIG key after the comple tion of a measurement starts the next mea surement assuming the Model 2002 is programmed for another measurement see COUNT Front Panel Operation HOLD When HOLD is selected the measure source is sup pressed As a result measuring is stopped and does not con tinue until HOLD is cancelled by selecting one of the other measure source selections Select HOLD from the SELECT MEASURE SRC menu by placing the cursor on HOLD and pressing ENTER The instrument returns to the SETUP mea sure layer menu DELAY This delay is used to hold up operation in the measure layer
540. the corresponding event register sets when the corresponding bit in the condition register changes from 1 to 0 For example if bit B9 of the Negative Transition Register of the Measurement Transition Filter is set then the buffer full event is programmed for a negative transition The BFL bit B9 in the Measurement Event Register sets when the trace buffer is no longer full For details on register structure see para graph 3 7 The NTR registers are shown in Figures 3 33B through 3 38B Included is the decimal weight of each bit The sum of the decimal weights of the bits that you wish to set is the parameter lt NRf gt that is sent with the command For example to program RAV B5 and BFL B9 mea surement events for negative transitions send the following command stat meas ntr 544 where BFL bitB9 Decimal 512 RAV bit B5 Decimal 32 lt NRf gt 544 Effects of negative transitions on the Measurement E vent R egister Negative transition effect on Measurement event Measurement Event Register Reading overflow Sets BO when a reading has gone from overflow to normal Low limit 1 Sets B1 when the reading is no longer less than the low limit 1 setting High limit 1 Sets B2 when the reading is no longer greater than the low limit 1 setting Low limit 2 Sets B3 when the reading is no longer less than the low limit 2 setting High limit 2 Sets B4 when the reading is no longer greater than the high limit 2 setting
541. the next scan sequence starts at the end of the programmed timer interval If however the programmed timer interval is shorter than the time it takes to complete a single scan sequence the next scan sequence does not start until the previous one is done NOTE The front panel TRIG key see MAN UAL is active with the timer selected Pressing the TRIG key after the comple tion of a scan sequence starts the next scan sequence assuming the Model 2002 is programmed for another scan sequence see COUNT HOLD When HOLD is selected the scan source is sup pressed As a result operation does not pass into the measure layer until HOLD is cancelled by selecting one of the other scan source selections Select HOLD from the SELECT SCAN SOURCE menu by placing the cursor on HOLD and pressing ENTER The instrument returns to the SETUP SCAN LAYER menu Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com DELAY This delay is used to hold up operation in the scan layer After the scan event occurs the instrument waits until the delay period times out 0 to 999999 999sec before proceed ing to the measure layer COUNT This menu item defines the number of times operation returns to the scan layer INFINITE Use this selection to continuously return opera tion to the scan layer ENTER SCAN COUNT With this selection the user determines the number of times operation returns to the scan
542. the timestamp type clears the buffer The two timestamp types are described as follows e RELATIVE TIME With this selection timestamps are oriented to a timer and references each reading to a point in time The timer starts at 0 000000 seconds when the instrument is turned on or when the relative timestamp is reset see RESET TIME After 99 999 999999 seconds the timer resets to zero seconds and starts over e REAL TIME With this selection timestamps are oriented to the real time clock and provide the current time 24 hour format and date for each reading Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Timestamp type for bus readings is coupled to timestamp type for buffer readings Thus if you change timestamp type from this menu structure it also changes in the CONFIG DATA STORE menu structure see paragraph 2 8 RESET TIME This item is used to reset the relative time stamp to 0 000000 seconds The timestamp also resets to zero seconds when the instrument is turned on It has no effect on the real time clock RESET RDG This menu item is used to reset the reading number to zero The reading number also resets to zero when the instrument is turned on DECIMAL This menu item lets you select between periods and commas to signify decimal points on the front panel display The following options are available for DECIMAL PERIOD This option selects the period
543. the various configura tion options for DC and AC voltage measurements The con figuration menus are summarized in Tables 2 6 and 2 7 The menus are accessed by pressing CONFIG and then DCV or ACV Paragraph 2 3 5 summarizes the rules for navigating through menus Note that a function does not have to be selected in order to be configured When the function is selected it will assume the programmed status Condition EXIT key action e g TRIGGERS HALTED INFO message displayed Reading display hold Scanning Data storage Temporary message displayed Cancels display of temporary message Cancels INFO message returns to menu or normal reading display Cancels reading display hold resumes normal reading display Disables scanning Also stops data storage if enabled Stops data storage Temporary message STORAGE INTERRUPTED is displayed 2 9 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation Table 2 6 CONFIGURE DCV menu structure AVERAGING MODE Menu item Description SPEED Measurement speed integration time menu NORMAL Select 1 PLC power line cycle 16 67msec for 60Hz 20msec for 50Hz and 400Hz FAST Select 0 01 PLC MEDIUM Select 0 1 PLC HIACCURACY Select 10 PLC SET SPEED EXACTLY Set integration time in PLC 0 01 50 SET BY RSLN Default to setting appropriate for resolution FILTER Digital filter menu
544. thley Instruments 28775 Aurora Road Cleveland Ohio 44139 1 888 KEITHLEY www keithley com Inc Model 2002 Multimeter Specifications DC Voltage Uncertainty ppm of reading x measured value ppm of range x range used 1 000 000 Accuracy ppm accuracy 10 000 1ppm of Range 20 counts for ranges up to 200V and 10 counts on 1000V range at 7H digits NORMAL ACCURACY 1PLC DFILT OFF Relative Accuracy ppm of reading ppm of range Temperature Coefficient Input ppm of reading ppm of range C Range Full Scale Resolution Resistance 24 Hours 90 Days 1 Year 2 Years Outside Tea 5 C 200 mv 210 00000 10 nV gt 100 GO 3 5 6 15 11 19 12 23 13 2 18 2ve 2 1000000 100 nV gt 100 GQ 1 2 0 6 6 1 1 10 1 2 14 1 3 0 2 0 18 20 V 21 000000 1 uV gt 100 GQ 3 2 0 35 8 0 4 12 0 4 16 0 4 0 3 0 02 200 V 210 00000 10 uv 10 MO 1 5 12 14 28 22 2 8 30 2 8 1 5 0 3 1000 V7 1100 0000 100 uV 10 MQ 1 5 04 14 0 7 22 0 7 30 0 7 1 5 0 06 SPEED AND ACCURACY 90 DAYS Accuracy ppm of reading ppm of range ppm of range rms noise 12 10PLC 1PLC 1PLC 0 1PLC 0 01PLC Range DFILT On 10 Readings 10PLC DFILT Off DFILT On 10 Readings DFILT Off DFILT Off DFILT Off 200 mV 15 8 0 15 8 0 5 15 8 07 15 8 1 25 10 13 100 200 15 2V 6 0 8 0 6 0 8 0 05 6 0 8 0 07
545. til 200 rdgs acquired PRINT 1 clear 16 Cancel stream mode SLEEP 1 Wait 1 second LSYNc STATe lt b gt SYSTem LSYNc STATe lt b gt Control line synchronization lt b gt OorOFF Disable line synchronization lorON Enable line synchronization STATe Query state of line synchronization This command is used to enable or disable line synchronization When enabled the integration period will not start until the beginning of the next power line cycle For example if a reading is triggered at the positive peak of a power line cycle the integration period will not start until that power line cycle is completed The integration period starts when the positive going sine wave crosses zero volts With line synchronization disabled the integration period starts when the reading is triggered See paragraph 2 12 7 for details IMPORTANT NOTE The Model 2002 must first be in idle before you can enable line synchronization Place 2002 in idle Enable line sync Get response from 2002 Take 2002 out of idle PRINT 1 output 16 init cont off abor PRINT 1 output 16 syst lsyn stat on stat PRINT 1 enter 16 PRINT 1 output 16 init KEY lt NRf gt SYSTem KEY lt NRf gt Simulate key press lt NRf gt 1 Up Arrow lt NRf gt 16 NEXT 2 TEMP 17 Down Arrow 3 Left Arrow 18 ENTER 4 MENU 19 Q4 5 ACI 20 FILTER 6 STORE 21 SCAN 7 LOCAL 22 ACV 8 PREV 23 REL 9 AUTO 26 FREQ 1
546. tion Also the multiple displays can show a reading in a different form or give additional information about the reading for example e Top line shows a reading bottom line shows a zero centered bar graph with adjustable limits Front Panel Operation e Top line shows a frequency measurement bottom line shows the adjustable trigger level To scroll through the multiple displays available for each measurement function repeatedly press and release the NEXT DISPLAY key The same action with the PREVious DISPLAY key does a reverse scroll through the displays To return to the default reading display just press and hold either key Multiple displays that are specific to a particular function or operation are discussed later in this section such as the peak spikes displays in DC voltage and the calculations display in math See Table 2 3 for paragraph references Displays that are common to most of the measurement functions are dis cussed here Table 2 3 Multiple displays by function Function Next display Paragraph All Bar graph 2 3 1 Zero centered bar graph 2301 Maximum and minimum values 2 3 1 Relative and actual values 2 6 Calculated and actual values see Note 1 2 10 Limits bar graph see Note 1 2 12 5 Adjacent channel readings see Note 2 2 11 DC voltage DC volts AC ripple voltage and frequency 2 4 1 Positive peak spikes and highest value Negative peak spikes and lowest value Positive and negative peak spike
547. tly of other functions REL Operates normally SPEED Set by DCV speed FILTER Set by DCV filter RESOLUTION Set by DCV resolution 000 0000 mVDC Pos Pk 000 0mV Highest 000 0mV RANGE Follows the DCV range REL No effect REL No effect RESOLUTION Fixed at 3 5 digits SPEED Fixed at 100msec UNITS Fixed on volts Peak window has no effect FILTER Unaffected by DCV and ACV filters NOTE The highest value is reset by pressing the RESOLUTION Fixed at 3 5 digits DCV key or changing function i e leaving this UNITS Fixed on volts display COUPLING Fixed on AC DC coupling NOTE The peak detector captures the maximum value of the input signal B DC voltage and positive peak spikes functions Figure 2 5 DC voltage multifunction multiple displays cont Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation DCV RANGE Set by DCV range auto or fixed Autoranges independently of other functions REL Operates normally SPEED Set by DCV speed FILTER Set by DCV filter RESOLUTION Set by DCV resolution 000 0000 mVDC N eg Pk 000 0mV Lowest 000 0mV RANGE Follows the DCV range REL No effect REL No effect RESOLUTION Fixed at 3 5 digits SPEED Fixed at 100msec UNITS Fixed on volts Peak window has no effect FILTER Unaffected by DCV and ACV filters NOTE The lowest value is reset by pressing the RE
548. to 2 1e6 0 y 3 18 9 STATe lt b gt Enable or disable reference OFF y STATe Query state of reference y ACQuire Use input signal as reference REFerence Query reference value y DIGits lt n gt Specify measurement resolution 4 to 9 8 3 18 10 AUTO lt b gt Enable or disable auto resolution ON AUTO ONCE Enable and then disable auto resolution AUTO Query auto resolution DIGits Query resolution AVERage Path to configure and control filter 3 18 11 TCONtrol lt name gt Select filter type MOVing or REPeat Note 3 TCONtrol Query filter type COUNt lt n gt Specify filter count 1 to 100 10 COUNt Query filter count ADVanced Path to configure and control advanced filter NTOLerance lt n gt Specify noise tolerance level 0 to 100 1 NTOLerance Query noise tolerance level STATe lt b gt Enable or disable advanced filter ON STATe Query state of advanced filter STATe lt b gt Enable or disable filter Note 4 STATe Query state of digital filter AUTO lt b gt Enable or disable auto filter Note 5 AUTO ONCE Enable and then disable auto filter AUTO Query auto filter OCOMpensated lt b gt Enable or disable Offset Compensation OFF y 3 18 21 OCOMpensated Query Offset Compensation y 3 56 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Table 3 10 Continued SENSe command summary IEEE 488 Reference
549. treet Melrose MA 02176 TestEquipmentDepot com Program fragment Parameters Query Description Program fragment Parameters Query Description Program fragment IEEE 488 Reference The number of readings that are averaged by the filter is set with the AVERage COUNt com mand The AVERage STATe command is used to enable or disable the filter Changing the filter type disables auto filter PRINT 1 output 16 volt dc aver tcon rep tcon Select repeating filter PRINT 1 enter 16 Get response from 2002 COUNt lt n gt SEN Se 1 CU RRent AC AVERage COUNt lt n gt Specify filter count for ACI SEN Se 1 CU RRent DC AVERage COUNt lt n gt Specify filter count for DCI SEN Se 1 VO LTage AC AVERage COUNt lt n gt Specify filter count for ACV SEN Se 1 VO LTage D C AVERage COUNt lt n gt Specify filter count for DCV SEN Se 1 RESistance AVERage COUNt lt n gt Specify filter count for Q2 SEN Se 1 FRESistance AVERage COUNt lt n gt Specify filter count for 24 SEN Se 1 TEM Perature AVERage COUNt lt n gt Specify filter count for TEMP lt n gt to 100 Specify filter count DEFault 10 MINimum 1 MAXimum 100 COUNt Query filter count COUNt DEFault Query the RST default filter count COUNt MINimum Query the lowest allowable filter count COUNt MAXimum Query the largest allowable filter count These commands are used to specify the filter count In general the
550. ts when the trace buffer becomes full For details on register structure see paragraph 3 7 The PTR registers are shown in Figures 3 33A through 3 38A Included is the decimal weight of each bit The sum of the decimal weights of the bits that you wish to set is the parameter lt NRf gt that is sent with the command For example to program RAV B5 and BFL B9 mea surement events for positive transitions send the following command stat meas ptr 544 3 125 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference 3 126 where BFL bitB9 512 RAV bitB5 32 lt NRf gt 544 Effects of positive transitions on the Measurement E vent R egister Positive transition effect on Measurement event Measurement Event Register Reading overflow Sets BO when reading exceeds range limits Low limit 1 Sets B1 when reading is less than the low limit 1 setting High limit 1 Sets B2 when reading is greater than the low limit 1 setting Low limit 2 Sets B3 when reading is less than the low limit 2 setting High limit 2 Sets B4 when reading is greater than the high limit 2 setting Reading available Sets BS after a reading is taken and processed Buffer available Sets B7 when the trace buffer has at least two readings Buffer half full Sets B8 when the trace buffer becomes half full Buffer full Sets B9 when the trace buffer becomes full Buffer pretriggered Sets B11
551. ts with Trigger Link con nectors e g Model 7001 Switch System The Model 8501 1 is one meter long the Model 8501 2 is two meters long Model 8502 Trigger Link Adapter Allows you to connect the Trigger Link of the Model 2002 to instruments that use the standard BNC In Out external triggering technique Model 8530 IEEE 488 to Centronics Printer Adapter Cable Translates the IEEE 488 connector pinout and signal level to a Centronics termination This permits a standard Centronics parallel printer to be connected to a Model 2002 in TALK ONLY mode Model 8605 High Performance M odular Test L eads Con sists of two high voltage 1000V test probes and leads The test leads are terminated with a banana plug with retractable sheath on each end Each Model 2002 is shipped with one set of these test leads Model 8606 High Performance Probe Tip K it Consists of two spade lugs two alligator clips and two spring hook test probes The spade lugs and alligator clips are rated at 30V General Information RMS 42 4V peak the test probes are rated at 1000V These components are designed to be used with high performance test leads terminated with banana plugs such as the Model 8605 High Performance Modular Test Leads The following test leads and probes are rated at 30V RMS 42 4V peak Models 5805 and 5805 12 K elvin Probes Consists of two spring loaded Kelvin test probes with banana plug termina tion Designed to be used with
552. u soidal waveforms the crest factor is 1 414 For a symmetrical square wave the crest factor is unity The crest factor of a rectangular pulse is related to its duty cycle as the duty cycle decreases the crest factor increases For the Model 2002 the additional error term for RMS mea surements caused by a high crest factor is specified up to a value of five The maximum displayable value is 9 99 else it shows over Note that the crest factor is not calculated if dB or dBm is the presently selected units Low level considerations For sensitive measurements external considerations besides the Model 2002 affect the accuracy Effects not noticeable when working with higher voltages are significant in micro volt signals The Model 2002 reads only the signal received at its input therefore it is important that this signal be prop erly transmitted from the source The following paragraphs indicate factors that affect accuracy including thermal off sets and stray pick up Shielding AC voltages that are extremely large compared with the DC signal to be measured may produce an errone ous output Therefore to minimize AC interference the cir cuit should be shielded with the shield connected to the Model 2002 INPUT LO particularly for low level sources Improper shielding can cause the Model 2002 to behave in one or more of the following ways e Unexpected offset voltages e Inconsistent readings between ranges e
553. uence Event Enable Register PTRansition lt NRf gt STATus M EASurement PTRansition lt NRf gt Program Measurement Transition Filter PTR STATus Q U EStionable PTRansition lt NRf gt Program Questionable Transition Filter PTR STATus O PERation PTRansition lt NRf gt Program O peration Transition Filter PTR STATus O PERation TRIGger PTRansition lt NRf gt Program Trigger Transition Filter PTR STATus O PERation ARM PTRansition lt NRf gt Program Arm Transition Filter PTR STATus O PERation ARM SEQuence PTRansition lt NRf gt Program Sequence Transition Filter PTR lt NRf gt 0 Clear Register lt NRf gt 128 Set bit B7 1 Set bit BO 256 Set bit B8 2 Set bit B1 512 Set bit B9 4 Set bit B2 1024 Set bit B10 8 Set bit B3 2048 Set bit B11 16 Set bit B4 16384 Set bit B14 32 Set bit B5 65535 Set all bits 64 Set bit B6 PTRansition Query PTR register These commands are used to program the positive transition PTR registers A positive transi tion is defined as a O to 1 state change in the condition register Thus when an event is pro grammed for a positive transition the appropriate bit in the corresponding event register sets when the corresponding bit in the condition register changes from 0 to 1 For example if bit B9 of the Positive Transition Register of the Measurement Transition Filter is set then the buffer full event is programmed for a positive transition The BFL bit B9 in the Measurement Event Register se
554. uffer size which is set by TRACe POINts DEFault Half present buffer size which is set by TRACe POINts MINimum 0 all cases 3 149 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Query Description Program fragment Parameters Query Description Program fragment 3 150 Parameters Query READ This command is used to specify how much of the defined buffer POINts will be used to store pre triggered readings This command is essentially the same as the PERCent command except the amount is expressed as an exact value instead of a percent Sending a value that exceeds the defined size of the buffer see POINts generates an error The command is ignored PRINT 1 output 16 trac poin 75 Set buffer size PRINT 1 output 16 trac feed pret amo read 30 read 30 pre trugger rdgs for buffer Get response from 2002 PRINT 1 enter 16 SO URce lt name gt TRACe FEED PRETrigger SOURce lt name gt Specify pre trigger event lt name gt EXTernal Use External Trigger as pre trigger event TLINk Use Trigger Link as pre trigger event BUS Use bus trigger as pre trigger event MANual Use TRIG key as pre trigger event SOURce Query buffer source This command is used to specify the event for the pre trigger storage mode With the pre trigger mode selected CONTrol PRETrigger readings are continuously stored in th
555. uit under test also helps by minimizing air currents The REL control can be used to null out constant offset voltages Note that additional thermals may be generated by the optional Model 2002 SCAN scanner card AC voltage offset The Model 2002 at 5 d resolution will typically display 150 counts of offset on AC volts with the input shorted This offset is caused by the offset of the TRMS converter This offset will not affect reading accuracy and should not be zeroed out using the rel feature The fol lowing equation expresses how this offset Noper is added to the signal input Vm Displayed reading Ap E e Example Range 2VAC Offset 150 counts 1 5mV Input 200mV RMS Display reading 200mV 1 5mV 0 04V 2 25 x 10 V 200005V The offset is seen as the last digit which is not displayed Therefore the offset is negligible If the rel feature were used to zero the display the 150 counts of offset would be sub tracted from V y resulting in an error of 150 counts in the dis played reading Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 2 4 2 DC and AC current The Model 2002 can make normal DCI measurements from 10pA and 2 1A and ACI measurements from 100pA to 2 1A The basic measurement procedures for DCI and ACI are con tained in the Getting Started manual AMPS fuse replacement There are two protection fuses for
556. unctions EXTERNAL INPUTS EXTERNAL INPUTS 80 DEFAULT CHOOSE FUNCTIONS SELECT CHAN 01 CHANNEL 01 FUNCTION Sets number of external channels and functions of external channels 1 80 Selects default function for all external channels Use to select channel functions Select channel using range and cursor keys Select function using cursor keys SAVE ALT FCN RESTORE ALT FUNCTION Stores present function as alternate Restores saved alternate function Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com 2 79 Front Panel Operation J N functions Note that there are five reference temperature functions available JN1 JN5 With the Model 2001 TCS CAN the reference junction must be assigned to channel 1 Junction types are defined using the CONFIGURE TEM PERATURE menu NOTE The JN functions in the internal menu are intended for use with thermocouple scanner card Model 2001 TCSCAN The Model 2001 SCAN internal scanner card is not intended to be used with thermocouples No function Selecting none effectively removes that channel from the scan list When scanning the instru ment will skip any channels that have no function defined EXTERNAL INPUTS This menu item allows you to select measurement functions for external scanner cards used with the Model 2002 Multi meter When the EXTERNAL INPUTS menu item is select ed the inst
557. ure Event Detection TRIGger SOURce IMM ediate TRIGger SOURce MAN ual TRIGger SOURce BUS TRIGger SOURce TIMer TRIGger SOURce EXTernal TRIGger SOURce TLINk TRIGger SOURce HOLD Trigger Layer Another Measure Output Trigger M easure Layer TRIGger DELay lt num gt Action SYSTem PRESet and RST default Figure 3 13 Trigger Model IEEE 488 bus operation Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com ARM LAYer2 COUNt lt n gt IN Finite TRIGger COUNt lt n gt INFinite 3 19 IEEE 488 Reference Idle and initiate The instrument is considered to be in the idle state whenever 1t is not operating within one of the layers of the trigger model The front panel ARM indicator is off when the instrument is in the idle state While in the idle state the instrument cannot perform any measure or scan functions Over the bus there are two SCPI commands that can be used to take the instrument out of the idle state INITiate or INITiate CONTinuous ON Notice that with continuous initiation enabled INIT CONT ON the instrument will not remain in the idle state after all programmed operations are completed However the instru ment can be returned to the idle state at any time by sending the RST command the RCL command or the SYST PRES command Trigger model layers As can be seen in Figure 3 13 the trigger model uses thr
558. urement function except frequency has its own configuration for a digital filter A digital filter configuration menu is shown in Table 2 36 Table 2 36 CONFIGURE FILTER menu structure Menu item Description Auto Default to filter appropriate for mea surement function and type Averaging Program simple average filter 1 100 readings Advanced Program simple average filter 1 100 readings with a noise tolerance window 0 100 of range Averaging mode Select moving average or repeating average mode 2 74 Choosing the filter parameters for each function follows the same procedure There are three ways to display a filter con figuration menu eTo configure the filter of the present function just press CONFIG then FILTER eTo configure the filter of another function and remain in the present function press CONFIG and the appro priate function key then select FILTER from its menu eTo configure the filter of another function and change to that function press the appropriate function key and CONFIG then FILTER AUTO This menu item selects auto filtering When chosen auto fil tering enables the filter parameters listed in Table 2 35 for the function you are presently configuring Note that select ing AUTO immediately enables the filter for that function when the state listed in Table 2 35 is ON In this case if you are configuring the filter for the present measurement func tion the
559. ures 2 5 and 2 6 The multiple display for crest factor which is calculated from the peak and RMS values is described here Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation DCV RANGE Set by DCV range auto or fixed Autoranges independently of other functions REL Operates normally SPEED Set by DCV speed FILTER Set by DCV filter RESO LUTION Set by DCV resolution 000 0000 mVDC 000 000 mVAC 000 00 Hz RANGE Set by ACV range auto or fixed RANGE Set by MAX SIGNAL LEVEL in CONFIGURE Autoranges independently of other functions FREQUENCY menu REL No effect Autorange has no effect SPEED Set by ACV speed REL No effect FILTER Unaffected by DCV and ACV filters TRIGGER LEVEL Set while in FREQ Not available in RESOLUTION Set by ACV resolution CONFIGURE FREQUENCY menu UNITS Fixed on volts FILTER Unaffected by DCV filter FREQ has no filter COUPLING Fixed on AC coupling RESOLUTION Fixed at 5 digits AC TYPE Fixed on normal mode RMS COUPLING Fixed on AC coupling INPUT TERMINALS Fixed on VOLTAGE A DC voltage AC voltage and frequency functions Figure 2 5 DC voltage multifunction multiple displays Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation DCV RANGE Set by DCV range auto or fixed Autoranges independen
560. urrent e Voltage drop e Lead resistance Q4 only Source current This is the value of the current being sourced for the present resistance range It is based on the calibration constants and is shown as follows Source Current 0 0000 mA Voltage drop This display shows the voltage drop across the resistance under test It is shown as follows Voltage Drop 0 0000 mV This voltage drop is determined by multiplying the source current by the resistance and does not include voltage contri butions from other current that may be flowing through the resistance Lead Resistance This display available only for 4 wire ohms shows the value of the lead resistance that is being nulled by using the Q4 function You can use the information to decide if a 4 wire measurement is necessary The display is as follows Lead Resistance 0 0000 Q If the lead resistance exceeds 1kQ the display is 2 WIRE OHMS measurement overflow Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation 2 4 4 Frequency The Model 2002 can make frequency measurements from 1Hz to 15MHz through its INPUT HI and INPUT LO termi nals and from 1Hz to 1MHz through its AMPS and INPUT LO terminals The basic measurement procedure for FREQ is contained in the Getting Started manual Trigger level The frequency function has an adjustable trigger level An appropriate trigger level is ne
561. ursor keys and the RANGE A and V keys to enter a numeric value 0 9999 C Press EN TER when done Zero centered bar graph The zero centered bar graph is a graphical representation of a reading with plus and minus limits See Figure 2 2 The limits are expressed in a user selectable percentage of range for voltage current and resistance and a user selectable val ue for frequency and temperature 05 95770 VDC 50 50 of range 25 of range 50 L 50 of range 25 of range eelere 0 Figure 2 2 Zero centered bar graph multiple display The vertical lines displayed along the bar designate the plus and minus limits zero and halfway to either limit There are ten full segments between zero and each end so each full segment represents 10 of the limit When a line at the limit changes to an arrow the reading exceeds the programmed range The plus and minus percentage of range that is programmed 0 01 99 99 applies to all voltage current and resistance functions Because of rounding values greater than 99 5 are shown as 100 and likewise values greater than 1 such as 1 67 are shown rounded to the nearest integer percent Note that the zero centered bar graph is not available when the ACV units are dB or dBm Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Perform the following to view or change the plus and minus percentag
562. used to specify the type of reference junction that is going to be used for ther mocouple temperature measurements Specify REAL if using an actual reference junction The REAL TCoefficient command is then used to specify the temperature coefficient of the refer ence junction Specify SIMulated if you wish to use a simulated reference temperature The SIMulated com mand is then used to specify the desired simulated reference temperature Specify reference Get response from 2002 PRINT 1 output 16 temp rjunl rsel sim rsel PRINT 1 enter 16 SIMulated lt n gt SEN Se 1 TEM Perature RJU NctionX SIMulated lt n gt Specify simulated reference temperature lt n gt 0 to 50 Specify temperature in C 32 to 122 Specify temperature in F 273 to 323 Specify temperature in K DEFault 23 C 73 F 296K MINimum 0 C 32 F 273K MAXimum 50 C 122 F 323K SIMulated Query simulated reference SIMulated DEFault Query default RST reference SIMulated MINimum Query lowest allowable reference SIMulated MAXimum Query largest allowable reference This command is used to specify the simulated reference temperature The temperature value depends on which temperature scale is currently selected C F or K Typically 0 or 23 C is used as the simulated reference temperature Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Program fragment Para
563. ut of the idle state and places operation at point B in the flowchart Since both the arm layer and scan layer are programmed for Immediate Spacing operation drops down to the channel layer at point B Since Channel Trigger Source is set to Source the scan does not wait at point B for a trigger Instead it bypass es Wait for Trigger Link Trigger and closes the first chan nel point C Note that the Bypass is in effect only on the first pass through the model into a layer D After the relay settles the Model 7001 7002 outputs a Channel Ready pulse point D Since the instrument is pro grammed to scan ten channels operation loops back up to point B where it waits for an input trigger Note that Bypass 1s no longer in effect E and E Remember that the Model 2002 operation is at point A waiting for a trigger The output Channel Ready pulse from the Model 7001 7002 triggers the multimeter to measure DUT 1 point E After the measurement is com plete the Model 2002 outputs a completion pulse point F and then loops back to point A where it waits for another in put trigger The trigger applied to the Model 7001 7002 from the Model 2002 closes the next channel in the scan This triggers the multimeter to measure the next DUT The process continues until all ten channels are scanned and measured 2 55 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Pa
564. various configura tion options for DC and AC current measurements The con figuration menus are summarized in Tables 2 11 and 2 12 The menus are accessed by pressing CONFIG and then DCI or ACI Paragraph 2 3 5 summarizes the rules for navigating through the menus Note that a function does not have to be selected in order to be configured When the function is selected 1t will assume the programmed status 2 23 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation Table 2 11 CONFIGURE DCI menu structure Menu item Description SPEED Measurement speed integration time menu NORMAL Select 1 PLC power line cycle 16 67msec for 60Hz 20msec for 50Hz and 400Hz FAST Select 0 01 PLC MEDIUM Select 0 1 PLC HIACCURACY Select 10 PLC SET SPEED EXACTLY Set integration time in PLC 0 01 50 SET BY RSLN Default to setting appropriate for resolution FILTER Digital filter menu AUTO Default to filter appropriate for integration time AVERAGING Program a simple average filter 1 100 readings ADVANCED Program a simple average filter 1 100 readings with a noise tolerance window 0 AVERAGING MODE 100 of range Select moving average or repeating average mode RESOLUTION Display resolution menu AUTO Default to resolution appropriate for integration time 3 5d 4 5d 5 5d 6 5d Select a specific resolution 7 5d 8 5d MEASUREMENT MODE
565. ved alternate setup conditions An alternate setup is saved using the SENSe 1 ALTernate SANG command see Sense subsystem Assign DCV to specified channels PRINT 1 output 16 rout scan func 1 3 5 7 volt dc RCHamnel lt list gt ROUTe SCAN RATio RCHannel lt list gt Specify reference channel for Ratio RO UTe SCAN DELTa RCHannel lt list gt Specify reference channel for Delta lt list gt chanlist where chanlist is a single channel number 1 to 10 RCHannel Query reference channel These commands are used to select the reference channel for the ratio and delta calculations Note that channel 5 and channel 10 which is the default are the high speed solid state switches on the Model 2001 SCAN See paragraph 2 11 for details PRINT 1 output 16 rout scan rat rch 1 rch Select and query ref erence channel PRINT 1 enter 16 Get response messag from 2002 MCHannel lt list gt RO UTe SCAN RATio MCHannel lt list gt Specify measure channel for Ratio RO UTe SCAN DELTa MCHannel lt list gt Specify measure channel for Delta lt list gt chanlist where chanlist is a single channel number 1 to 10 MCHannel Query measure channel These commands are used to select the measure channel for the ratio and delta calculations Note that channel 5 and channel 10 which is the default are the high speed solid state switches on the Model 2001 SCAN See pa
566. verage mode Display resolution menu Default to resolution appropriate for integration time Select a specific resolution Display units menu Select volts Select dB and set voltage reference level Select dBm and set reference impedance Coupling menu Select AC coupled measurements Select DC coupled measurements Type of ACV measurement menu Select true RMS ACV Select average ACV Select peak ACV Select low frequency typically lt 50Hz true RMS ACV Select positive DCV peak spikes measurements Select negative DCV peak spikes measurements Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation SPEED The SPEED parameter sets the integration time of the A D converter the period of time the input signal is measured also known as aperture The integration time affects the usable resolution the amount of reading noise as well as the ultimate reading rate of the instrument From the front panel the integration time is specified in parameters based on a number of power line cycles NPLC where 1 PLC for 60Hz is 16 67msec and 1 PLC for 50Hz and 400Hz is 20msec The SPEED parameters for all functions except frequency are explained as follows FAST Sets integration time to 0 01 PLC Use FAST if speed 1s Of primary importance at the expense of increased reading noise and less usable resolution MEDIUM Sets integration time to 0 1PLC U
567. wer_line_cycles gt 0 01 to 50 0 01 NPLC Returns the currently specified integration time in power line cycles The NPLC command programs the A D converter integration time in terms of power line cycles The programmable range is from 0 01 to 100 power line cycles A value of 100 PLC will be adjusted to 10 PLC Other values above 50 PLC will be adjusted to 50 PLC NPLC 1 Program 1 power line cycle integration period NPLC 5 Program 5 power line cycle integration period To program the number of readings per trigger and the trigger event NRDGS lt count gt lt event gt lt count gt of readings 1 to 99999 lt event gt lt event gt parameter Numeric equivalent Description AUTO 1 Initiates readings continuously EXT 2 Initiates reading on negative transition on the exter nal trigger line TIMER 6 Same as AUTO with interval specified by TIMER command count NRDGS Returns two responses separated by a comma 1 the number of readings per trig ger and 2 the present trigger event Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Description Example OCOMP Purpose Format Parameter Default Query Description Example OFORMAT Purpose Format Parameter Default Query HP3458A Emulation Mode The NRDGS command programs the number of readings per trigger as well as the event that initiates the trigger Available events include c
568. when the trace buffer pretrigger event occurs Bit Position B15 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 BO Event E BPT BFL BHF BAV RAV HL2 LL2 HL1 LL1 ROF Decimal Weighting 2048 512 256 128 32 16 8 4 2 1 211 29 28 27 25 24 23 22 21 20 Value 0 1 D I 0 1 01 0 1 0 1 0 1 0 1 0 1 0 1 Value 1 Enable Positive Transition 0 Disable Positive Transition A Positive Transition PTR Register Bit Position B15 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 BO Event 6 BPT BFL BHF BAV RAV HL2 LL2 HL1 LL1 ROF Decimal Weighting 2048 512 256 128 32 16 8 4 2 1 211 29 28 27 25 24 23 22 21 2 Value 0 1 D I 0 1 0 1 0 1 0 1 0 1 0 11 0 1 0 1 Value 1 Enable Negative Transition 0 Disable Negative Transition B Negative Transition NTR Register Figure 3 33 Measurement Transition Filter Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Effects of positive transitions on the Questionable E vent R egister Positive transition effect on Questionable event Questionable Event Register Temperature summary Sets B4 when an invalid reference junction measureme
569. xplain how to program the three layers of the measurement Triggers on Leading Edge TTL High 2V 5V TTL Low lt 0 8V ra Jus gt Minimum Figure 2 14 External triggering and asynchronous trigger link input pulse specifications Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Meter complete The METER COMPLETE OUTPUT jack provides a TTL compatible output pulse that can be used to trigger other instruments The specifications for this trigger pulse are shown in Figure 2 15 M eter Complete TTL High 3 4V Typical TTL Low 0 25V Typical lt 10us gt Minimum Figure 2 15 Meter complete and asynchronous trigger link output pulse specifications Typically you would want the Model 2002 to output a trig ger after the settling time of each measurement Settling time includes the internally set measurement settling time and the user programmed DELAY period An output com pletion pulse occurs after each measurement as long as the measure source is set to external timer manual or immedi 7011 MUX Card Figure 2 16 DUT test system Front Panel Operation ate See paragraph 2 7 2 for details on programming the mea sure layer The Model 2002 can also output a completion pulse while in the scan and or arm layers of operation Figure 2 12 shows where these triggers occur in the trigger model If the scan layer Source Bypass is en
570. y AHI Acceptor Handshake capability T5 Talker basic talker talk only serial poll unaddressed to talk on LAG L4 Listener basic listener unaddressed to listen on TAG SR1 Service Request capability RL1 Remote Local capability PPO No Parallel Poll capability DC1 Device Clear capability DTI Device Trigger capability CO No Controller capability El Open collector bus drivers TEO No Extended Talker capability LEO No Extended Listener capability SH Source Handshake Function SH1 defines the abil ity of the instrument to initiate the transfer of message data over the data bus AH Acceptor Handshake Function AH1 defines the ability of the instrument to guarantee proper reception of message data transmitted over the data bus T Talker Function The ability of the instrument to send data over the bus to other devices is provided by the T func tion Instrument talker capabilities T5 exist only after the instrument has been addressed to talk L Listener Function The ability for the instrument to receive device dependent data over the bus from other devices is provided by the L function Listener capabilities L4 of the instrument exist only after it has been addressed to listen SR Service Request Function SR1 defines the ability of the instrument to request service from the controller RL Remote Local Function RL1 defines the ability of the instrument to be placed in the remo
571. y Talk Address Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com ASCII Character Codes and IEEE 488 Multiline Interface Command Messages lE E E 488 lE E E 488 Decimal Hexadecimal ASCII M essages Decimal Hexadecimal ASCII M essages 96 60 MSA 0 PPE 112 70 p MSA 16 PPD 97 6l a MSA 1 PPE 113 71 q MSA 17 PPD 98 62 b MSA 2 PPE 114 72 r MSA 18 PPD 99 63 c MSA 3 PPE 115 73 s MSA 19 PPD 100 64 d MSA 4 PPE 116 74 t MSA 20 PPD 101 65 e MSA 5 PPE 117 75 u MSA 21 PPD 102 66 f MSA6 PPE 118 76 v MSA 22 PPD 103 67 g MSA 7 PPE 119 77 w MSA 23 PPD 104 68 h MSA 8 PPE 120 78 D MSA 24 PPD 105 69 1 MSA 9 PPE 121 79 y MSA 25 PPD 106 6A j MSA 10 PPE 122 TA Z MSA 26 PPD 107 6B k MSA 11 PPE 123 7B MSA 27 PPD 108 6C l MSA 12 PPE 124 7C MSA 28 PPD 109 6D m MSA 13 PPE 125 TD MSA 29 PPD 110 6E n MSA 14 PPE 126 TE MSA 30 PPD 111 6F o MSA 15 PPE 127 TF DEL Message sent or received with ATN true Numbers represent second ary address resulting in MSA My Secondary Address C 3 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Bus O verview Introduction Basically the IEEE 488 bus is simply a communication sys tem between two or more electronic devices A device can be either an instrument or a computer When a computer is used on the bus it serves to supervise the communi
572. y buffer size y FEED lt name gt Select source of readings SENSe 1 CALCulate 1 NONE y 3 22 5 PRETrigger Path to configure pre trigger storage AMOunt Path to specify number of pre trigger readings PERCent lt n gt Specify 0 to 100 of buffer PERCent Query percentage READings lt n gt Specify as a number READings Query number of readings SOURce lt name gt Select pre trigger source event EXTernal TLINk BUS or MANual SOURce Query pre trigger source event CONTrol lt name gt Select buffer control mode NEVer NEXT y AL Ways or PRETrigger CONTrol Query buffer control mode y FEED Query source of readings for buffer y DATA Read all readings in the buffer y 3 22 6 TSTamp Path to select timestamp format for buffer readings 3 22 7 FOR Mat lt name gt Select timestamp format ABSolute or DELTa FOR Mat Query timestamp format SYSTem PRESet and RST have no effect on the commands in this subsystem Table 3 15 Trigger command summary Default Command Description parameter SC PI Ref INITiate Subsystem command path y 3 23 1 IMMediate Initiate one trigger cycle y CONTinuous lt b gt Enable or disable continuous initiation Note 1 y CONTinuous Query continuous initiation y ABORt Reset trigger system y 3 23 2 3 63 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Table 3 15 Continued Trigger com
573. ype K thermocouples E Set operation for Type E thermocouples R Set operation for Type R thermocouples 3 111 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference Query Description Program fragment 3 18 20 Parameters Query Description Program fragment Parameters Query Description 3 112 S Set operation for Type S thermocouples B Set operation for Type B thermocouples N Set operation for Type N thermocouples TYPE Query thermocouple type This command is used to configure the Model 2002 for the thermocouple type that you are using to make temperature measurements See paragraph 2 4 5 SENSOR for more information Specify TC type Get response from 2002 PRINT 1 output 16 temp tc type k type PRINT 1 enter 16 RJUN ctionX commands Where X 1 to 5 to specify reference junction These commands are used to configure the specified reference junction for thermocouple tem perature measurements Typically each thermocouple switching card uses a single reference junction See paragraph 2 4 5 REF JUNCTIONS for more information RSELect lt name gt SEN Se 1 TEM Perature RJUN ctionX RSELect lt name gt Specify reference junction type lt name gt SIMulated Use simulated temperature as reference REAL Use a measured temperature as reference RSELect Query reference junction type This command is
574. ys cont Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com Front Panel Operation RMS RANGE Set by ACV range auto or fixed Autoranges independently of other functions REL O perates normally SPEED Set by ACV speed FILTER Set by ACV filter RESOLUTION Set by ACV resolution UNITS Set by ACV units COUPLING Set by ACV coupling AC TYPE Fixed on normal mode RMS 000 000 mVAC RMS 000 00Hz Crest Factor 0 00 Crest Factor RANGE Set by MAX SIGNAL LEVEL in CONFIGURE RANGE ACV peak measurement range set by ACV range FREQUENCY menu auto or fixed Peak measurement autoranges independently Autorange has no effect of other functions REL No effect REL No effect TRIGGER LEVEL Set while in FREQ Not available in SPEED Fixed at 100msec Peak window has no effect CONFIGURE FREQUENCY menu FILTER If ACV filter is on crest factor is effectively filtered as FILTER Unaffected by ACV filter FREQ has no filter well RESOLUTION Fixed at 5 digits RESOLUTION Fixed at 3 digits COUPLING Set by ACV coupling UNITS None INPUT TERMINALS Fixed on VOLTAGE COUPLING ACV peak measurement coupling set by ACV coupling NOTE Crest factor up to 9 99 is calculated from an ACV peak measurement divided by the raw without rel ACV RMS measure ment A AC RMS voltage frequency and crest factor Figure 2 6 AC voltage multifunction multiple
575. ystem Use to control switching Sense subsystems Use SENSel to configure and control the measurement functions Use SENSe2 to read the digital input port SOU R ce subsystem Use to control the digital output port STATus subsystem Use to configure and control the status registers SY STem subsystem Commands not covered by the other subsystems TRAC e subsystem Use to control the reading buffer Trigger subsystem Use to configure the Trigger Model U NIT subsystem Use to select measurement units 3 45 Test Equipment Depot 800 517 8431 99 Washington Street Melrose MA 02176 TestEquipmentDepot com IEEE 488 Reference SCPI Command Summary Tables 3 4 through 3 16 summarize the commands for each SCPI subsystem General notes e Brackets are used to denote optional character sets These optional characters do not have to be included in the pro gram message Do not use brackets in the program message e Angle brackets lt gt are used to indicate parameter type Do not use angle brackets in the program message e The Boolean parameter lt b gt is used to enable or disable an instrument operation 1 or ON enables the operation and 0 or OFF disables the operation e Upper case characters indicate the short form version for each command word e Default Parameter Listed parameters are both the RST and S YSTem PRESet defaults unless noted otherwise Param eter notes are lo

Model 2002 Multimeter User`s Manual

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