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Fluke 90 Series - uP Board Tester

1. USE PROBE TO NO CHECK INPUTS TO AODRESS DECODERS ALL MEMORY CHIPS SELECTED fES EXECUTE TEST MEMORY NO ON UUT RAM REPLACE FAULTY ADDRESS DECODERS YES NO CHECK ANO REPAIR OPEN 5 TRACE S EXECUTE CHECKSUM EXECUTE QuickTrace ON ROM PROBE ADDRESS ANO DATA LINES ON SUSPECTED CHIP S YES S CONTINUE DIAGNOSTIC PROCESS BY EXERCISING PERIPHERAL DEVICES WITH MEMORY AND OR 1 0 READ WRITES PROBE FAILED LINE S AT BUFFERS OR DRIVERS NO EXECUTE CHECKSUM rr oh WITH LOOP ON SUSPECTED DRIVER CHIP S ADDRESS SPACE PROBE CHIP CHECK ANO SELECT ON OTHER RAM ROM CHIP S REPLACE SUSPECTED CHIP S REPLACE FAULTY ADDRESS DECODERS BUS TESTS Introduction Bus Tests isolate defects in the UUT data address and control lines inside the microprocessor kernel Before testing make sure that the clip is properly connected to the UUT microprocessor and the tester s self test routines have been successfully completed The prompt should be on the display NOTE Bus Tests disable the normal operation of the UUT Three types of Bus Tests can be executed Test Bus Ramp Test e Shift Test Test Bus TYPICAL USES The primary use of Test Bus is to check for shorts and incorrect connections between UUT components The test also ch
2. Enter a data pattern Press the ENTER key The display shows the following prompt The last soak time entered is represented by tt Enter a time between 0 to 99 minutes Press the ENTER key to start the test While the test is in progress the activity indicator flashes and the following message is displayed MEMORY SOAK aa The starting and ending address is represented by xxxx yyyy The user specified pattern and the soak time remaining is represented by and rr respectively 3 21 TESTS 7 Afterthesoak timehaselapsed the following message is displayed if no failure has been detected The address of the first detected error is represented by zzzz and the pattern written and read at that address is represented by aa and bb respectively Press the ENTER key to display any additional error messages 8 If you press the ENTER key after the first test cycle the test repeats once If you press the LOOP key after the first test cycle test is repeated in a continuous loop until you press the CLEAR or RESET key TESTS Introduction I O tests exercise I O addresses and are similar to the Memory Tests except that the I O Tests use I O access bus cycles rather than memory cycles NOTE If the microprocessor of the UUT does not support a separate I O address space the display shows the message NOT SUPPORTED when one of the
3. Beijing People s Republic of China Tel 65 7281 Colombia Sistemas E Instrumentacion Ltda For Fluke products Carrera 13 No 37 43 Of 401 Ap Aereo 29583 Bogota DE Colombia Tel 232 4532 Denmark Tage Olson A S For Fluke products Ballerup Byveg 222 2750 Ballerup Denmark Tel 658111 Philips Elekronik Systemer A S For Philips products Afd Industri amp Forskning Prags Boulevard 80 1919 DK 2300 Koabenhavn S Tel 572222 Ecuador Proteco Coasin Cia Ltda For Fluke products P O Box 228 A Ave 12 de Octubre 2285 y Orellana Quito Ecuador Tel 526759 Philips Ecuador S A For Philips products Casilla 343 Quito Tel 396100 Egypt and Sudan Electronic Engineering Liaison Office For Fluke products P O Box 2891 Horreya 11361 Heliopolis Cairo Egypt Tel 695705 Philips Egypt Branch of P M OB V Box 1687 10 Abadel Rahman el Rafei St Dokki Cairo Tel 490922 Ethiopia Philips Ethiopia Priv Ltd Co For Philips products Ras Aveve Areguay Avenue P O Box 2565 Addis Ababa Tel 148300 Finland instrumentarium Elektroniikka For Fluke products P O Box 64 Vitikka 1 02631 ESPOO 63 Finland Tel 358 0 5281 OY Philips AB For Philips products Kaivokatu 8 P O Box 255 00101 Helsinki 10 Tel 1 7271 France Electronique S A For Fluke products 606 Rue Fourny P O Box 31 78530 BUC France Tel 9568131 S A Phil
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5. USER S MANUAL 9 0 S e rie S uP BOARD TESTER FLUKE LIMITED WARRANTY Fluke warrants the 90 Series to be free from defects in material and workmanship under norma use and service for 1 year from the date of shipment This warranty extends to you if you are the original purchaser and does not apply to fuses batteries or any product which in our sole opinion has been subject to misuse alteration or abnormal conditions of operation or handling To obtain warranty service contact a Fluke Service Center or send the product with a description of the difficulty postage and insurance prepaid to the nearest Fluke Service Center We assume no risk for damage in transit We will at our option repair or replace the defective product free of charge or refund your purchase price However if we determine that the failure was caused by misuse alteration or a
6. 2 5 PROBE AND PROBE CONNECTOR 2 5 REMOTE INTERFACE CONNECTOR 2 6 EXTERNAL POWER SUPPLY oecite eene 2 6 SYNGYERIGGER INTEREAXGE erinnert Rt 23 Xn rnb 2 8 OPERATION 5 tub Soc 3 1 INTRODUGITTON EE 3 POMER UP SEQUBEINGE s ret scie vi 3 BASIGSDBS DS paient ce RO pg paha ta SUR 3 4 Power Supply Test 2 222372238 o qo IE NON 3 4 Clock GI LA PAA DMA Request Ling Test ESO Hte cand 3 5 UUT DMA Acknowledge Line Test 3 5 UUR Wait Line EE 3 5 Reset Line Drivability Test mec aoc dpt Manes E det NEE 3 5 TROUBLESHOOTING FLOWCHART 3 5 continued on page ii TABLE OF CONTENTS continued SECTION TITLE PAGE BUS Ne eee e De EE 3 7 IntroduclOn quon qub Ti osea E EUR ola Uer ari 3 7 Jeer BUS Zeene ib 3 7 IT VER RR E AGE petiolo dem 3 8 S hift Tes ts qur s 3 11 MEMORY TERTS A EE 3 12 Introductions EE DEE atr eter bt 3 12 Test ORY E Uma to IKA BALAAN 3 12 ee E EE t DU UU Codes 3 14 Memory EX
7. ERROR NUMBER DESCRIPTION Tester RAM bad Tester LCA bad UUT clock failure UUT DMA request line not drivable UUT DMA acknowledge line not operating UUT wait line not drivable UUT reset line stuck active Tester ROM bad Tester LCD not operating Tester RS 232 C Interface not operating 1 2 3 4 5 6 7 8 9 0 Scroll through the test menu by pressing the same test key repeatedly until the name of the desired test or Probe function is displayed Press the ENTER key to select a specific test or Probe function If additional data is not required the test or Probe function is executed If additional data is required a prompt appears the display Use the numeric keys 0 to F to enter data and or addresses After you have entered the data press the ENTER key to execute one test cycle If a fault is detected an error message is displayed and the current test or Probe function is halted The error message overwrites whatever is on the display and remains on the display until an input from the user is received Ifthe ENTER key is pressed the error message is replaced with the appropriate test in progress message and the test or Probe function resumes after the point where the fault was detected If the LOOP key is pressed a test in progress message is displayed an was detected The error message reappears immediately Press the CLEAR or RESET key to terminate a test in progress
8. OVERVIEW OF REMOTE OPERATION 4 3 Cortrol COImidhds Nees 4 3 Test or Command Execution Sequence 4 4 SYNTAX NOTATION CONVENTIONS 4 4 REMOTE COMMANDE Ee are een x e edet 4 5 Memory Fill Conimahnd ee deoa d 4 5 Up Load Command repos rue tr UE EE 4 6 Dowri Lo d Command oe E 4 6 Reset UUT Command syed oet Ced TE Mees nd era 4 6 Transmit Message Command 2 4 7 Intercept Keypad Command 4 7 REMOTE EXECUTION OF LOCAL REMOTE COMMANDS 4 7 InttoduGblOT usen acturi OR HX RERO Nae np E CER 4 7 BREAK POINT FRAME POINT AND EXTERNAL TRIGGERJEUNGTIONS tret aho crede aee has aca e 4 9 IntgoductIOIl meega pel aha A P P EE aa Ua OE uot de 4 9 Command Syntax EEN 4 10 continued on page iii ii TABLE OF CONTENTS continued SECTION TITLE PAGE GPU Function Qualifiers cc naa che SEENEN sem TER its 4 10 MEMORY READ FUNCTION QUALIFIER 4 10 MEMORY WRITE FUNCTION QUALIFIER 4 10 I O READ FUNCTION QUALIFIER 4 10 I O WRITE FUNCTION QUALIFIER 4 1 OPCODE FETCH FUNCTION QUALIFIER 4 11 INTERRUPT ACKNOWLEDGE FUNCTION QUALIFIER 4 11 ereral Bunetion QU
9. Up load from the UUT RH L Reset UUT 1 Display message T2 _m Display message EC Enable keypad intercept A 4 Appendix B opecifications ENVIRONMENTAL SPECIFICATIONS Relative Humidity Up to 8096 0 to 35 C Up to 70 35 to 50 C non condensing Ambient Temperature to 50 C Mechanical Shock and Vibration MIL T 28800D Class 3 Storage Conditions Ambient Temperature 40 to 70 C Relative Humidity 5 to 95 GENERAL SPECIFICATIONS Dimensions 11 inches 279 4 mm x 6 inches 152 4 mm x 3 inches 76 2 mm without feet 2 25 Ibs 1020 58 g Operating Voltage From UUT 4 35V dc to 6 3V dc From External Power Supply 7V dc to 12V dc Power Consumption Less than 75 watts Common Mode Maximum Interface Voltage SAFETY B 1 B 2 Appendix C Sales and Service Centers U S SALES AREAS for all Fluke products Alabama Huntsville 4920 Corporate Drive Suite J Huntsville AL 35805 6202 205 837 0581 Arizona Tempe 2211 S 48th Street Suite B Tempe AZ 85282 602 438 8314 Tucson 602 790 9881 California Burbank 2020 N Lincoln Street Burbank CA 91504 213 849 7181 Northern 2300 Walsh Ave Bldg K Santa Clara 95051 408 727 0513 San Diego 619 292 7657 Southern P O Box 19676 Irvine CA 92713 9676 16969 Von Karman Suite 100 Irvine CA 92714 714 863 9031 Colorado Denver 14180 E Evans Ave Aurora CO 80014 303 695 1000 Connecticut Ha
10. 1 28641 2 TLX 954 22455 Sweden Philips Foersaeljning AB Division Industrielektronik Test amp Measurement 5 115 84 Stockholm Tel 08 782 18 00 Switzerland Traco Electronic AG For Fluke products Jenatschstrasse 1 8002 Zurich Switzerland Tel 41 1 201 0711 TLX 845 815570 Philips AG For Philips products Test und Messtechnik Postfach CH 8027 Zurich Tel 01 4882390 Syria Mabek Electronics Division For Fluke products Box 4238 Damascus Syria Philips Moyen Orient S A R L For Philips products Rue Fardoss 79 P O Box 2442 Damascus Tel 218605 221650 TLX PHISYR 411203 SY Taiwan Schmidt Electronics Corp For Fluke products 5th Floor Cathay Min Sheng Commercial Building 344 Min Sheng East Road Taipei 104 Taiwan R O C Tel 886 2 501 3468 TLX 785 11111 FAX 886 2 5029692 Philips Taiwan Ltd For Philips products 150 Tun Hua North Road P O Box 22978 Taipei Tel 886 2 7120500 TLX 21570 PHILIPEI Tanzania Philips Tanzania Ltd For Philips products T D F L Building 1st Floor P O Box 20104 Ohio Upanga Rd Dar es Salaam Tel 29571 4 TLX 41016 Thailand Measuretronix Ltd For Fluke products 2102 63 Ramkamhaeng Road Bangkok 10240 Thailand Tel 66 2 374 2516 TLX 788 82796 Philips Electrical Co of Thailand Ltd For Philips products 283 Silom Road P O Box 961 Bangkok 10500 Tel 66 2 233 6330 9
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12. Elvezia 2 20052 Monza Tel 039 3635240 8 9 TLX 333343 Japan John Fluke Mfg Co inc Japan Branch For Fluke products Sumitomo Higashi Shinbashi Bldg 1 1 11 Hamamatsucho Minato ku Tokyo 105 Japan Tel 81 3 434 0181 TLX 781 2424331 FAX 81 3 434 0170 John Fluke Mfg Co inc Japan Branch For Fluke products Katsushige Building 2 45 Kohraibashi Higashi ku Osaka 541 Japan Tel 81 6 229 0871 FAX 81 6 229 1098 NF Circuit Design Block Co Ltd For Philips products 3 20 Tsunashima Higashi 6 Chome Kokokuku Yokohama 223 Tel 045 452 0411 TLX 3823 297 Kenya Philips Kenya Ltd For Philips products OL Kalou Road Industrial Area P O Box 30554 Nairobi Tel 254 2 557999 TLX 22225 Nairobi Korea Republic of Myoung Corporation For Fluke products Yeo Eui Do P O Box 14 Seoul Korea Tel 82 2 784 9942 TLX MYOUNG K24283 FAX 82 2 784 2387 Kuwail Al Bahar International Group For Fluke products P O Box 26672 Safat 13127 Safat Kuwait Tel 965 848601 TLX 959 44822 Lebanon and Jordan Mabek Electronic Division For Fluke products P O Box 13 5657 Beirut Lebanon Tel 812523 TLX 923 22889 Philips Middie East S A R L For Philips products B P 11 670 Ave Sami Solh Beyrouth Tel 392320 1 TLX 20765 LE PHIBAN Malaysia Mecomb Malaysia SDN BHD For Fluke products P O Box 24 46700 Petaling Jaya Selangor Mala
13. Paraguay hilips del Paraguay S A For Philips products Av Artigas 1497 Casilla Correo 605 Asuncion Tel 291924 Peru Importaciones Y Representaciones Electronicas S A For Philips products Avda Franklin D Roosevelt 105 Lima 1 Peru Tel 288650 Philips Peruana S A For Philips products Av Alfonso Ugarte 1268 Apartado 1841 Lima Tel 32 6070 Philippines Spark Radio and Electronics Corp For Fluke products Greenhills P O Box 610 San Juan Metro Manila Zip 3113 Philippines Tel 63 2 775192 Philips Industrial Development Inc For Philips products 2246 Pasong Tamo Makati Metro Manila Tel 868951 C 8 Portugal Decada Espectral For Fluke products Equipamentos de Electronica e Cientificos SARL Av Bombeiros Voluntarios Lote 102B Miraflores Alges 1495 Lisboa Portugal Tel 2103420 Philips Portuguesa S A R L For Philips products Av Eng Duarte pacheco Appartado 1331 Lisbon 1 Tel 019 683121 Singapore Rank O Connor s Singapore PTE Ltd For Fluke products 98 Pasir Panjang Road Singapore 0511 Republic of Singapore Tel 4737944 Philips Project Development S Pte Ltd For Philips products Lorong 1 Toa Payoh Box 340 Singapore 1231 Tel 2538811 South Africa Fluke S A Pty Ltd P O Box 39127 Bramley 2018 Republic of South Africa Tel 786 3647 South African Philips Pty Ltd For Philips products 7703 2 He
14. Parts price information is available from the John Fluke Mfg Co Inc or its representative Prices are also available in the Fluke Replacement Parts Catalog which is available on request TRANSPORT AND STORAGE REQUIREMENTS The small size of the tester allows the tester to be carried in a tool box or briefcase Avoid any vibration or temperatures outside those shown in Appendix B Specifications during transport NOTE Do not pick up the tester using the cable as a handle This may damage the cable or internal connectors Appendix A Remote User Command Set INTRODUCTION The command syntax necessary to perform tests viathe RS 232 C interface are listed in this Appendix All commands require a CR 0D Hex character for termination Some command sequences require optional data and or required data Optional data is shown in square brackets 1 e address Required data is shown in parenthesis 1 baud Required spaces are shown underlined _ Multiple fields are shown by three periods i e data data meaning multiple data values All numbers are entered in Hexadecimal notation The 1 flag included with the command sequence puts the command into a loop mode The command is repeated over and over untila B 02Hex or ESC 1B HEX character is sent to the tester or the CLEAR or RESET key is depressed on the keypad CONTROL COMMANDS Table 1 Control Commands HEX KEYPAD VALUE FUNCTION EQUIVALENT X
15. Power Supply Test A portion of the tester always derives its power from the UUT If the UUT power supply is inoperable the tester display remains blank and the tester is not operational Clock Test A malfunctioning clock on the the UUT microprocessor can cause the failure of any test execution and constitutes a fatal error The clock test senses the rising and falling edges of the clock signal If both edges of the clock signal are not present the tester detects a faulty clock all operations are halted and the following message is written on the display This message stays on the display until you enter another command TROUBLESHOOTING FLOWCHART DMA Request Line Test The tester must be able to drive the DMA request line s The tester ensures that these lines are drivable by performing a DMA request line test every time a DMA access is attempted If the line is not drivable the tester halts all operations and displays the following message ERROR A LT CPi BUS REQUEST This message remains on the display until you press another key UUT DMA Acknowledge Line Test The UUT microprocessor must generate a DMA acknowledge signal in response to the tester forcing a DMA request If the DMA acknowledge line does not respond the following message is displayed HU LILIT DCEMOWMLEDGE This message remains on the display until you press another key UUT Wait Line Test The tester must drivethe UUT wait line If th
16. commands are commands that can be executed from the tester keypad or sent tothetesterfrom a host computer orterminalthrough the RS 232 C interface If the optional L flag is included on a command line that command is executed in a continuous loop until the tester receives a B 02 hex or by pressing the CLEAR or RESET key Table 4 4 is a list of local remote commands The list is divided into groups of related commands Refer to Section 3 for a functional description of a particular test 4 7 REMOTE EXECUTION OF LOCAL REMOTE COMMANDS 4 8 Table 4 3 Intercept Keypad Command ASCII Character List CHARACTER HEX VALUE LOOP CLEAR BUS TEST MEM TEST 1 0 TEST PROBE ESI EE 4 4 Local Remote Commands TEST mes COMMAND BUS TESTS Test Bus BT L CR Ramp Test RT L CR Shift Test SH L CR MEMORY TESTS Test Memory MT la ha L CR Checksum Test CK la ha L CR Memory Examine MX la ha L CR Memory Verify MV la d d d L CR Memory Write MW la d d d L CR Memory Soak MS la ha d st L CR Memory Fill ME ai fal d CR 1 0 TESTS O Examine IN Ip hp L CR O Verify d d L CR 1 0 Write IW Ip 9 d d L CR RS232 Configure CP b db PROBE FUNCTIONS QuickTrace QT Probe Address Lines PA Probe Data Lines PD Probe Control Lines PC NOTES b baud rate 300 600 1200 2400 480
17. for replacement of parts and proper storage requirements during non use of the tester Refer to Table 5 1 for part numbers needed for ordering new parts Section 2 UNPACKING THE TESTER contains details for return shipment CLEANING CAUTION To avoid damaging the tester do notuse petroleumbased solvents to clean the case keys or display window These solutions will react with the plastics used in the tester Clean the case keys and display window with a damp cloth dipped in a mild detergent and water Avoid allowing water to enter the case around the key edges REPLACEABLE PARTS Table 5 1 contains the list of replaceable parts the description of each part and the Fluke part number Table 5 1 List of User Replaceable Parts DESCRIPTION FLUKE PART NUMBER Microprocessor Clip 800110 Probe Assembly 825992 RS 232 C Cable 831776 Cable Adapter 831602 5 1 MAINTENANCE Components may be ordered from the manufacturer by using the manufacturer s part number or from John Fluke Mfg Co Inc or its authorized representative by using the Fluke part number In the event the part you order has been replaced by a new or improved part the replacement will by accompanied by an explanatory note and installation instructions if necessary To ensure prompt and efficient handling of your order include the following information Quantity Fluke Stock Number Description Instrument Model and Serial Number
18. is running but before a signal is probed the activity indicator flashes and the following message appears on the display DATA Frabe Dd The decimal number of the last data line to be probed is represented by d To select the desired line press the ENTER key or the Probe button to increment or press the LOOP key to decrement to the next data line Make contact between the Probe and the data line When the correct signal is probed the green light turns on and the red light goes out The following message appears on the display If you are sure that the proper signal has been probed and the red Probe light remains on the signal is either shorted or stuck high or low To select the next signal to be probed press the button on the probe or press ENTER To scroll back to a previous signal press LOOP until the prompt for the desired data signal number is displayed To stop the test at any time press the CLEAR or RESET key PROBE DATA 3 31 PROBE CONTROL 3 32 Probe Control TYPICAL USES Probe Control is used with the Probe to test UUT microprocessor control lines The Probe Control function sequentially prompts the probing of the control lines associated with the UUT microprocessor HOW PROBE CONTROL IS PERFORMED Once you have selected the Probe Control function you are prompted to identify which control line to probe When the requested controlline is probed the lights on the probe toggle fromred
19. on Interrupt Acknowledge GENERAL FUNCTION QUALIFIERS General Function Qualifiers Optional The general function qualifiers summarized in Table 4 8 control the activation of a Break Point Frame Point or External Trigger and its CPU function qualifier to the indicated condition s The general functions qualifiers are optional and may be combined in any combination The following paragraphs explain the types of general function qualifiers ADDRESS GENERAL FUNCTION QUALIFIER The address general function qualifier A address specifies an address that must be detected when the CPU function qualifier is satisfied to trigger a Break point Frame Point or External Trigger action This function 15 disabled by the flag AD DATA GENERAL FUNCTION QUALIFIER The data general function qualifier D address is data that is treated the same as the address general function qualifier above This function is disabled by the flag DD PROBE LOGIC STATE QUALIFIER The logic state qualifiers PL PH DP are states sensed by the Probe and are treated the same as the address and data general function qualifiers above This function is disabled by the flag DP Activation on a high or low state is determined by the flags PH or PL respectively on the same command line Table 4 8 General Function Qualifiers COMMAND DESCRIPTION A address Enable On address AD Disable Address D data Trap On Specific Data DD
20. products P O Box 62 Ramna 16 17 Kawran Bazar C A DHAKA Tel 411976 TLX 65668 Belglum N V Philips Professional Systems S A Test and Measurement Tweestationsstraat 80 Rue des Deux Gares Brussel 1070 Bruxelles Tel 2 5256111 Bolivia Coasin Bolivia S R L For Fluke products Casilla 7295 La Paz Bolivia Tel 591 2 40962 TLX 336 3233 COALAP BV Brazil ATP Hi Tek Eletronica Ltda For Fluke products Al Amazonas 422 Alphaville Barueri CEP 06400 Sao Paulo Brazil Tel 55 11 421 5477 TLX 391 1171413 Philips do Brasil Ltda For Philips products Av Eng Luiz Carlos Berrini 3009 Caixa Postal 8681 04571 SAO PAULO S P Tel 55 11 2411611 TLX 011 32750 Brunei Rank O Connor s Sdn Bhd For Fluke products No 8 Block D Sufri Shophouse Complex Mile 1 Jalan Tutong Bandar Seri Begawan Negara Brunei Darussalam Tel 673 2 23109 or 23557 TLX 799 BU2265 RANKOC Canada Fluke Electronics Canada Inc 400 Britannia Rd East Unit 1 Mississauga Ontario 142 1X9 Canada Tel 416 890 7600 FAX 416 890 6866 Fluke Electronics Canada Inc 1690 Woodward Drive Suite 216 Ottawa Ontario K2C 3R8 Canada Tel 613 723 9453 FAX 613 723 9458 Fluke Electronics Canada Inc 1255 Trans Canada Highway Suite 130 Dorval Quebec H9P 2V4 Canada Tel 514 685 0022 FAX 514 685 0039 Fluke Electronics Canada Inc 101 1144 29th Ave N E Calgary Alberta
21. the name of the last Memory Test performed Press the MEM TEST key repeatedly to scrollthrough the Memory Test menu until MEMORY EXAMINE appears on the display 2 Press the ENTER key The display shows the following prompt Address The last address entered is represented by xxxx Use the numeric entry keys to enter the address in hexadecimal 3 Press the ENTER key The following message appears on the display The address and the data at that address is represented by xxxx and yy respectively 3 16 MEMORY VERIFY 4 Ifatthis point you press the LOOP key to executethistestin the loop mode a read continues to be performed on the same address the following message is displayed and the activity indicator flashes until the CLEAR key or the RESET key is pressed HENGE 3 5 To increment the address by 1 and examine the contents of the new address press the ENTER key Hold the ENTER key down to cause continuous incrementing of the address and display of the new address and data Memory Verify TYPICAL USES Memory Verify is used to write to a memory address and then verify that the data written is still contained at that location NOTE It is recommended that you first execute Test Bus Ramp Test or Quick Trace to make sure that the UUT is operational before executing Memory Verify When Memory Verify is used in the LOOP mode the Probe can be used to check that only
22. the cable and the circuit board PROBE AND PROBE CONNECTOR The Probe shown in Figure 2 4 is a hand held device that detects signal states on the UUT The Probe operates in specific capacities during the Probe Address Data Control and QuickTrace functions These functions are described in Section 3 of this manual When these functions are not active the Probe lights indicate the states of UUT signals The Probe plugs into a connector located on the rear panel of the tester See Figure 2 2 for the location of the connector Ifthe signal being probed is in the highstate or the Probeis not touching a valid digital signal the red light on the Probe is lit If the signal is in the low state the green light is lit Ifthesignalis toggling between a high and low state both red and green lights flash rapidly at a rate that depends on the frequency of the signal the higher the frequency the higher the flash rate During Memory and I O tests the Probe is synchronized to the rising edge of the data valid state on the UUT bus For all tester controlled read write cycles refer to the Probe timing diagram Figure 2 5 Whenever the tester is not executing a test the Probe is synchronized to the rising edge of the data valid state on the UUT bus for all UUT read write cycles ares RED PUSH BUTTON Figure 2 4 Probe 2 5 FEATURES AND FUNCTIONS 2 6 PROBE IS SYNCHRONIZED TO RISING EDGE OF WR or RD Figure 2
23. the key to unlock the keypad and return the tester to local operation A Control command is executed on the terminal by holding down the CTRL key on the keyboard while simultaneously pressing the appropriate letter key NOTE The symbol means CTRL Table 4 2 Control Commands FUNCTION EQUIVALENT X Step or Continue Q Resume Transmission XON S Pause Transmission XOFF B or ESC Terminate Command 4 3 SYNTAX NOTATION CONVENTIONS Test Or Command Execution Sequence In the remote mode a command or test is executed as follows 1 The tester prompts for input by sending the message ENTER or ENTER ifa Break Point is enabled Right angle brackets indicate that the UUT has been halted in a Break Point mode only If you send a Break Point or Frame Point by a CR the current status is displayed 2 test is started when the tester receives a valid command line over the remote interface A valid command line consists of a syntactically correct string of commands constants variables and options that isterminated by a carriage return CR If an illegal command is received the tester responds with the message CR followed by a prompt A Remote commands can be executed in a single test cycle or loop mode To start the loop mode append the optional L flag to a test command line In the loop mode a command is executed continually until the tester receives the control command B
24. the proper memory address is accessed HOW MEMORY VERIFY IS PERFORMED After you enter the address and data the tester writes the specified data into a memory address reads the same address and compares the data read to what was written The read and write operations are performed on the same DMA cycle to prevent the UUT from overwriting the data Memory Verify is the preferred test to change the contents of RAM because this test performs a read after write operation TROUBLESHOOTING HINTS During the execution of Memory Verify erroneous reads are possible because of faulty RAM shorts or faulty memory decoders It is recommended that you first execute Test Bus Ramp Test or QuickTrace to determine if the memory decoders and drivers are functioning properly e Some UUT microprocessors use memory mapped I O that changes state when examined Check the UUT design information first for this situation before performing this test on non RAM addresses MEMORY VERIFY EXECUTING MEMORY VERIFY l Press the MEM TEST key to enter the Memory Test menu The display shows the name of the last Memory Test performed Press the MEM TEST key repeatedly to scroll through the possible Memory Tests until MEMORY VERIFY appears on the display Press the ENTER key The display shows the following prompt HEMBEY Address ie The last address entered is represented by xxxx Use the numeric entry keys to enter the sta
25. the same function as the ENTER key on the tester keypad It allows you to increment to the next signal line without touching the tester Ifthe signal being probed is in the high state or the Probe is not touching a valid digital signal the red light on the Probe is lit If the signalis in the low state the green light is lit If the signal is toggling between a high and low state both red and green lights flash rapidly at a rate that depends on the frequency of the signal the higher the frequency the higher the flash rate Whenever the tester is not executing a test the Probe is synchronized to the data valid state of the UUT bus When the tester is executing a test bus memory or I O the Probe is synchronized with the data valid state of the UUT bus on read or write cycles forced by the tester 3 21 QUICKTRACE QuickTrace TYPICAL USES Quick Trace can be used to rapidly isolate and follow suspected faulty address data or control line s in the UUT By starting at a known good location for example the microprocessor the signal line can be probed to isolate the fault NOTE Not all control lines may be identified by Quick Trace Refer to the decal on the bottom of the instrument for the control lines tested HOW QUICKTRACE IS PERFORMED The QuickTrace function causes the tester to continually search for the signalline being probed During the execution of Quick Trace a memory write cycle is forced to allow identifi
26. to green Select the next control line by pressing ENTER on the keyboard or by pressing the button on the probe TROUBLESHOOTING HINTS Care must be taken with UUT microprocessors with positive true Bus Request signals BUSREQ inactive low and active high If the line is driven directly by a TTL or CMOS gate the pin must be disconnected from the board or a 10 kilohm pull up resistor placed in series with the gate and the microprocessor pin During execution of Probe Control the UUT microprocessor is held in a DMA state and UUT operation is halted Lines shorted to Vcc or ground can not be identified using Probe Control The control lines identified on the bottom decal of the instrument are the only control lines tested During the execution of Probe Control the operation of the UUT is temporarily suspended However inactivity detector circuits software activated may force the UUT through its power up restart sequence It is suggested that any inactivity detector circuit be disabled before executing Probe Control PROBE CONTROL EXECUTING PROBE CONTROL 1 Press the PROBE keytoenter the Probe menu The display shows name ofthe last Probe test performed Press the PROBE key repeatedly to scroll through the possible PROBE menu selections until PROBE CONTROL appears on the display Press the ENTER key While the test is running but before signal is probed the activity indicator flashes and the following message appears o
27. 0 or 9600 d data Hexadecimal number 00 to FF db data bits 7 or 8 la low address Four digit hexadecimal number 0000 to FFFF ha high address Four digit hexadecimal number 0000 to FFFF Ip low port address Two digit hexadecimal number 00 to FF hp high port address Two digit hexadecimal number 00 to FF st soak time Time in minutes between 0 and 99 REMOTE FUNCTIONS An example using the Memory Soak command using the Remote Interface is as follows MS 8000 8FFF 3E 5 CR In the preceding example the command line translates into a command to perform a Memory Soak test beginning at address 8000 Hex and ending at address 8FFF Hex The data value written is 3E Hex and the soak time is 5 minutes BREAK POINT FRAME POINT AND EXTERNAL TRIGGER FUNCTIONS Introduction NOTE The Break Point Frame Point and External Trigger functions are normally used only by experienced technicians and design or test engineers The Break Point Frame Point and External Trigger functions allow you to take a snapshot look at the UUT bus and associated circuits when a defined event occurs These commands are mutually exclusive and are available only through the remote interface See Table 4 5 for a quick reference of these three functions A Break Pont command causes the tester to suspend the programmed operation of the UUT whenthe event is detected puts the UUT microprocessor in a HALT or W AIT mode and displays i
28. 1 Ecuador Proteco Coasin Cia Ltda For Fluke products P O Box 228 A Ave 12 de Octubre 2285 y Orellana Quito Ecuador Tel 593 2 529684 TLX 393 22085 Phllips Ecuador S A For Philips products Casilla 343 Paez 118 y Avenida Patria Quito Tel 593 2 546100 546125 TLX 2227 PHLPSQ ED Proteco Coasin Cia Ltda For Fluke products P O Box 9733 Ave Principal No 204 y Calle Segunda Urbanizacion Miraflores Guayaquil Ecuador Tel 593 4 387519 Egypt and Sudan Electronic Engineering Liaison Office For Fluke products P O Box 2891 Horreya 11361 Heliopolis Cairo Egypt s Tel 20 2 695705 TLX 927 22782 Philips Egypt Liaison Office of Philips For Philips products Export B V 10 Abdel Rahman el Rafei Str P O Box 1687 Dokki Cairo Tel 20 2 3490922 TLX 22816 PHEGY UN Ethiopia For Philips products Philips Ethiopia Priv Ltd Co Ras Abebe Areguay Avenue P O Box 2565 Addis Ababa Tel 148300 Fiji Awa New Zealand Ltd For Fluke products 37 Freestone Walu Bay Road P O Box 858 Suva F iji Tel 679 312079 TLX 792 2347 FAX 679 314379 Finland Instrumentarium Elektroniikka For Fluke products P O Box 64 02631 Espoo 63 Finland Tel 358 0 5281 TLX 857 124426 FAX 358 0 502 1073 OY Philips AB For Philips products P O Box 11 02631 ESPOO Tel 0 5257225 France M B Electronique S A For Fluke products 606
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31. 5 Probe Timing Wave Form REMOTE INTERFACE CONNECTOR The tester is provided with an RS 232 C Interface connector for remote communica tion with a host computer or terminal The RS 232 C Remote Interface connector is located on the rear panel of the tester See Figure 2 2 All tests and Probe functions that can be executed at the keypad can also be executed over the Remote Interface Additional tests can be executed over the Remote Interface only A more detailed description of the Remote Interface commands and additional tests are located in Section 4 of this manual Refer to Section 4 for the pinout of the back panel connector FEATURES AND FUNCTIONS EXTERNAL POWER SUPPLY The External Power Supply is an accessory that provides operating power to the tester In some cases the UUT power supply may not be able to support its own needs and also supply power to the tester If UUT 5 voltage supply falls below 4 35 dc the tester display remains blank The External Power Supply is a 7 to 12 volt unregulated DC Supply with 0 2 Amp minimum and 0 5 Amp maximum capacity It plugs into the rear panel of thetester see Figure 2 2 The outputs must be isolated from the line The plug used is asubminiture phone plug shown in Figure 2 6 WIRE TO POWER SUPPLY Figure 2 6 External Power Supply Plug CAUTION Do not use the external power supply when the UUT 5 voltage supply exceeds 6 2 volts Damage may result from excessive current flo
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34. AIers 5 212 dete emer been 4 12 ADDRESS GENERAL FUNCTION QUALIFIER 4 12 DATA GENERAL FUNCTION QUALIFIER 4 12 PROBE LOGIC STATE QUALIFIER 4 12 LOOP COUNT QUALIFIER 2 0 E cR ett rmt rn 4 12 CPU and General Function Qualifier Examples 4 13 5 GENERAL MAINTENANCE 5 1 INTRODUCTION cas sees oad toad ace I ta Poeti iaa s 5 1 CLEANING E 5 1 REPLACEMENT PARIS cb ege nt canes DE Sana toes 5 1 TRANSPORT and STORAGE REQUIREMENTS 5 2 APPENDICES A REMOTE USER COMMAND SET SPECIFICATIONS e daret oe e s 1 SALES AND SERVICE CENTERS o Cn gente eects C I ii iv List of Tables TABLE TITLE PAGE 2 Test um eu ca imet mc re oii ite ete hae 2 4 3 1 Error Codes eegen Paa EE tUa d Ne REEL 3 3 4 RS2232 Connector Pin Olt a erret cte citados eerte 4 2 4 2 Control Commands 2 UU UR AU ORE 4 3 4 3 Intercept Keypad Command ASCII Character List 4 8 4 4 Local Remote Commands 2 2 4 8 4 5 Remote Function Capabilities 4 9 4 6 Break Point Frame Point and Externa
35. AR or RESET key If a fault occurs during the LOOP mode the activity indicator stops flashing and the message in the display is the same as Step 4 O Write TYPICAL USES The I O Write test is used to write entered data to a specified UUT I O address NOTE Tt is recommended that you execute Test Bus first before executing I O Write as a normal troubleshooting procedure When I O Write is used in the LOOP mode the Probe can be used to check that only the proper I O address is accessed HOW I O WRITE IS PERFORMED After you enter the I O address and data value the tester writes the data to the I O port address specified TROUBLESHOOTING HINTS Writing to I O addresses can cause state changes in the I O circuits Check UUT design information first for this situation before this test EXECUTING WRITE 1 Press the I O TEST key to enter the I O Test menu The display shows the last I O Test performed Press the I O TEST key repeatedly to scroll through the possible I O Tests until I O WRITE appears on the display 1 0 WRITE 3 25 RS 232 C PORT CONFIGURATION Press the ENTER key The display shows the following prompt 120 WRITE Port Br The last address entered is represented by xx Use the numeric keys to enter the start address in hexadecimal Press the ENTER key The display shows the following prompt 20 WRITE Data Gas The last data entered is represented by Enter data and pr
36. AZARD WARNING TO AVOID ELECTRICAL SHOCK ENSURE THAT THE MAXIMUM VOLT AGE FROM THE UUT DOES NOT EXCEED 30V ABOVE EARTH GROUND To determine if the UUT ground is floating take a voltmeter and measure the voltage between the UUT ground and a known good earth ground If you are using a computer to control the tester a potential floating ground hazard may exist There is usually no isolation between the computer and the RS 232 C interface the tester and UUT ground Check the voltage potential between the earth ground ofthe remote computer and the UUT ground If there is a voltage measurement 21V a large current may flow through the tester and cause damage THE FLUKE 90 USER S MANUAL The User s Manual provides general operating information and is not specific to the microprocessor your tester supports Refer to the decal on the bottom of the tester for specific operating information concerning the microprocessor of the UUT Section 2 Features and Functions INTRODUCTION Section 2 describes the general layout and operating features of the tester Refer to Figure 2 1 for the top panel view and Figure 2 2 for the rear panel view UNPACKING THE TESTER Remove the packing material and tester from the shipping container The tester is shipped with the Probe an RS 232 C cable a cable adapter and this manual Save the shipping container and packing material in case you have to reship the tester Check the shipment carefully If anything
37. BREAK POINT FRAME POINT AND EXTERNAL TRIGGER COMMANDS Table A 3 Break Point Frame Point and External Trigger Commands COMMAND NAME COMMAND LINE SYNTAX Break Point BP cpu gen gen CR Frame Point FP cpu gen gen CR External Trigger XT cpu gen gen CR Disable BP FP XT DB CR Break Point Status BP Frame Point Status FP External Trigger Status XT NOTES cpu is a required CPU Function qualifier gen is an optional General Functiori qualifier without a CPU or General Function qualifier appended BP FP and XT commands respond with a status condition CPU FUNCTION QUALIFIERS Table A 4 CPU Function Qualifiers COMMAND DESCRIPTION Enable BP FP or XT on Memory Read Enable BP FP or XT on Memory Write Enable BP FP or XT on 1 0 Read Enable BP FP or XT on 1 0 Write Enable BP FP or XT on OpCode Fetch Enable BP FP or XT on Interrupt Acknowledge A 3 REMOTE USER COMMAND SET GENERAL FUNCTION QUALIFIERS Table A 5 General Function Qualifiers A address Enable On address AD Disable Address D data Trap On Specific Data DD Disable Data PH Trap On The High State Of Probe Signal PL Trap On The Low State Of Probe Signal PD Disable Trap On Probe State MISCELLANEOUS REMOTE COMMANDS Table A 6 Miscellaneous Remote Commands COMMAND DESCRIPTION CP _b _db Configure the RS 232 C interface DN M 4 Down load to the UUT UP la ha M
38. Box 5323 Karachi Pakistan Tel 21 221127 TLX 952 24494 Philips Electrical Co of Pakistan Ltd For Philips products P O Box 7101 M A Jinnah Road Karachi 3 Tel 92 21 725772 TLX 2874 PHPAK PK Paraguay Philips del Paraguay S A For Philips products Avenida Artigas 1519 Casilla de Correo 605 Asuncion Tel 595 21 291924 TLX PY 215 Peru Importaciones y Representaciones Electronicas S A For Fluke products Avda Franklin D Roosevelt 105 Lima 1 Peru Tel 51 14 28 8650 TLX 394 25663 Philips Peruana S A For Philips products Av Alfonso Ugarte 1268 Lima 5 or Apartado 1841 Lima 100 Tel 51 14 326070 TLX 21678 PE PHILPER Philippines Republic of Spark Radio amp Electronics Inc For Fluke products Greenhills P O Box 610 San Juan Metro Manila 3113 Philippines Tel 2 775192 TLX 722 or 732 27901 Philips Industrial Development inc For Philips products 2246 Pasong Tamo P O Box 911 MCCPO Makati Riazal D Metro Manila Tel 63 2 868951 Portugal Decada Espectral Equipamentos de Electronica For Fluke products Av Bombeiros Voluntarios Lote 102B Miraflores Alges 1495 Lisbon Portugal Tel 351 1 4103420 TLX 832 15515 FAX 351 1 410 1844 Philips Portuguesa S A R L Divisao de Sistemas Industrieuis For Philips products e Electri Acasticc Outurila Cavinaxille 2795 Linda A Velha Tel 219007 1 TLX 42987 Saudi Arabia Electro
39. CABLE YNC TRIGGER PULSE INDICATOR DISPLAY FLUKE 90 1 PROBE TEST SELECTION NUMERIC CONTROL KEYS KEYS KEYS m ye fa 6 7 SEI EI DISPLAY VIEWING ANGLE ADJUSTMENT 90 Series uP Board Tester System vi Section 1 Introduction GENERAL DESCRIPTION The Fluke 90 Board Tester also referred to as the tester is hand held easy to operate tester used to diagnose faults in microprocessor based devices The tester is a Direct Memory Access DMA device emulator that connects to the microprocessor in the UUT unit under test The microprocessor does not have to be removed from the circuit The tester forces the DM A and WAIT lines on the UUT bus taking control of the bus from the UUT s microprocessor Power is supplied by either the 5 volt line at the UUT microprocessor or by optional external power supply No connection is required to the UUT otherthan the microprocessor clip Refer to Section 2 for more information on the external power supply The Fluke 90 performs the following Bus Tests to determine if any bus line is stuck high or low or shorted to other bus lines Memory Tests todetermine if RAM can be written and read and if ROM contains the proper bit pattern I O Tests to determine if I O addresses can be written and read QuickTrace to identify the signal name of a
40. Disable Data PH Trap On The High State Of Probe Signal PL Trap On The Low State Of Probe Signal PD Disable Trap On Probe State GENERAL FUNCTION QUALIFIERS LOOP COUNT QUALIFIER A Loop Count qualifier L loops be appended to a Break Point or Frame Point command line NOTE Enter the Loop Count in HEX format If appended to a Break Point command L specifies the number of times the tester must detect a condition before a Break Point occurs If L is appended to a Frame Point command it specifies the number of times a Frame Point function is performed Theloop count function is deactivated by sending a BP or FP command without a loop count qualifier included Use of either L 00 or L 2 01 results in a Break Point at the first occurrence of the condition or a single Frame Point The loop count function cannot be used with the External Trigger function CPU and General Function Qualifier Examples Two examples using the Break Point Function are as follows BP RE A 5A00 The command line translates into Break Point on Read at address 5A00 Hex BP OE A 0A2E PH L 5 The command line translates into Break Point on opcode fetch at address 0A2E Hex when the Probe is sensing a high state on the fifth loop with this condition 4 13 4 14 Section 5 Maintenance INTRODUCTION This section provides user maintenance information for the Fluke 90 Included is a list of user replaceable parts procedures
41. ER key While the test is running but before a signal is probed the activity indicator flashes and the following message appears on the display PROBE ADDRESS a Probe The decimal number of the address line to be probed is represented by aa To select the desired line press the ENTER key or the button located on the Probe to increment or press the LOOP key to decrement Make contact between the Probe and the address line When the correct signal is probed the green Probe light goes on and the red light goes out The activity indicator stops flashing and the following message appears on the display Pai Pg Probe Has Four PROBE RD If you are sure that the proper signal has been probed and the red Probe light remains on the signal is either shorted or stuck high or low To select the next line to be probed press the button on the Probe or press the ENTER key To scroll back to a previous signal press the LOOP key until the prompt for the desired address signal number is displayed To stop the test at any time press the CLEAR or RESET key Probe Data TYPICAL USES Probe Data is used in conjunction with the Probe to test UUT microprocessor data lines The Probe Data function sequentially prompts the probing of all data lines During the execution of Probe Data a memory write cycle is forced to allow identification of data lines outside buffers or drivers HOW PROBE DATA IS PERFORMED Once you have s
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43. OOP mode the Probe can be used to check that only the proper memory address is accessed HOW MEMORY WRITE IS PERFORMED After you enter address and data values the tester writes the entered data into a UUT memory address The data written to the address space is not read back as with Memory Verify TROUBLESHOOTING HINTS During the execution of Memory Write erroneous writes are possible because of faulty RAM shorts or faulty memory decoders It is recommended that you first execute Test Bus Ramp Test or QuickTrace to determine if the address decoders and drivers are functioning properly EXECUTING MEMORY WRITE 1 Press the MEM TEST key to enter the Memory Test menu The display shows the name of the last Memory Test performed Press the MEM TEST key repeatedly to scroll through the possible Memory Tests until MEMORY WRITE appears on the display Press the ENTER key The display shows the following prompt The last address entered is represented by xxxx Use the address data entry keys to enter the address in hexadecimal Press the ENTER key The display shows the following prompt MEMORY Data cuu The last data written is represented by yy Enter new data and press ENTER to execute the test When the test cycle is complete the following message appears on the display MEMORY SOAK 5 Ifyoupressthe ENTER key after the first test cycle the addr
44. RS SHOULD BE USED ONLY GROUNDED TIP SOLDERING IRONS SHOULD BE USED A complete line of static shielding bags and acces sories is available from Fluke Parts Department Telephone 800 526 4731 or write to JOHN FLUKE MFG CO INC PARTS DEPT M S 86 9028 EVERGREEN WAY EVERETT WA 98204 J0089D 07U8604 SE EN Litho in U S A Rev 1 MAR 86 Section 3 Operation INTRODUCTION Section 3 explains how to perform tests from the keypad The organization of this section follows the order in which tests are likely to be performed Your tester may not operate properly unless model of your tester matches the type of microprocessor tested The DMA control line s of the UUT microprocessor are free to be driven both high and low not tied together or tied directly to ground or 5 volts NOTE If the DMA Control line s are tied directly to ground 5 volts or bussed together it is necessary to isolate those line s by carefully removing them from their socket or desoldering if needed After all testing is completed carefully restore the control line s to their original state The UUT has an operational 5 volt supply The power supply of the UUT handles the 150 mA current drawn by the tester This limitation can be overcome by using the optional external power supply with the tester POWER UP SEQUENCE Usethefollowing procedure to operate the tester A detailed procedure for each test is provided unde
45. Remember that pressing the RESET key also resets the UUT If no fault is detected the message TEST COMPLETED message is displayed Ifthe ENTER key is pressed the test restarts Ifthe LOOP key is pressed the test continuously runs and a test in progress message is displayed and the activity indicator flashes until the CLEAR or RESET key is pressed Press any other Test key or the PROBE key to select another test category 3 3 BASIC TESTS 3 4 WARNING THE TESTER IS NOT GROUND ISOLATED ENSURE THAT THE MAXIMUM VOLTAGE FROM THE UUT TO EARTH GROUND DOES NOT EXCEED 30V TODETERMINE IF THE UUT GROUND IS FLOATING TAKE A VOLTMETER AND MEASURE THE VOLTAGE BETWEEN A UUT SIGNAL AND A KNOWN EARTH GROUND BASIC TESTS For the tester to work properly the microprocessor on the UUT must maintain a minimum functional level The tester monitors the operation of the microprocessor on the UUT by automatically running six Basic Tests at the beginning of every DMA access that the tester executes When a Basic Test detects a fault the appropriate error message is displayed and any user selected test is aborted The error message remains on the display until you enter another command The six Basic Tests are Power Supply Test Clock Test DMA Request Line Test UUT DMA Acknowledge Line Test e UUT Wait Line Test Reset Line Drivability Test These tests are described in the following paragraphs
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47. Step or Continue Q Resume Transmission 8 Pause Transmission XOFF B or lt ESC Terminate Command REMOTE USER COMMAND SET LOCAL REMOTE COMMANDS BUS TEST MEMORY TEST 1 0 TEST PROBE FUNCTIONS NOTES b baud rate d data db data bits la low address ha high address m message low port address hp high port address st soak time A 2 Table 2 Local Remote Commands TEST FUNCTION SYNTAX Test Bus Ramp Test Shift Test Test Memory Checksum Test Memory Examine Memory Verify Memory Write Memory Soak Memory Fill O Examine Verify 1 0 Write QuickTrace Probe Address lines Probe Data Lines Probe Control Lines BT L CR RT L CR SH L CR MT la ha L CR CK_ la _ ha L CR ME la ha L CR MV la d d d L CR MW 1a 4d d d L CR MS_ la _ ha _ d _ st L CR CR Ip hp L CR IV 1p d d d L CR IW 1 9 0 CR 300 600 1200 2400 4800 9600 Hexadecimal number 00 FF 7 or 8 four digit hexadecimal number 0000 to FFFF A four digit hexadecimal number 0000 to FFFF Alphanumeric entry less than 16 characters Two digit hexadecimal number 00 to FF Two digit hexadecimal number 00 to FF A time in minutes between 0 and 255 REMOTE USER COMMAND SET
48. T2E 7P1 Canada Tel 403 291 5215 FAX 403 291 5219 Chile Intronica Chile Ltda For Fluke products Casilla 16228 Santiago 9 Chile Tel 56 2 2321886 TLX 332 346351 Philips Chilena S A de Produc Electr For Philips products Avenida Santa Maria 0760 Casilla 2687 Santiago De Chile Tel 56 2 770038 TLX 240239 China Peoples Republlc of Fluke International Corp For Fluke products P O Box C9090 M S 206A Everett WA 98206 U S A Tel 206 356 5511 TLX 185103 FLUKE UT FAX 206 356 5116 Colombia Sistemas E Instrumentacion Ltda For Fluke products Carrera 13 No 37 43 Of 401 Ap Aereo 29583 Bogota DE Colombia Tel 57 232 4532 TLX 396 45787 Industrias Phllips de Colombia S A For Philips products Apartado Aereo 4282 Calle 13 No 51 39 Bogota Tel 57 1 2600600 TLX Philcolon 44776 Cyprus Chris Radiovision Ltd For Fluke products P O Box 1989 Nicosia Cyprus Tel 357 21 66121 TLX 826 2395 Cyprus Northern Ucok Buroteknik For Fluke products 2C amp 2D Muftu Ziyai Street Lefkosa Northern Cyprus Mersin 10 Turkey Tel 90 741 357 20 71777 TLX 821 57267 Denmark Tage Olsen A S For Fluke products Ballerup Byvej 222 2750 Ballerup Denmark Tel 45 2 658111 TLX 855 35293 FAX 45 2 680 300 Phllips A S Test amp Measurement For Philips products Prags Boulevard 80 DK 2300 Kobenhavn S Tel 01 572222 TLX 3120
49. Test amp Meetapparaten For Fluke products Hoevenseweg 55A 5017 AD Tilburg Postbus 115 5000 AC Tilburg Nederland 35 24 55 Philips Nederland B V For Philips products Boschdijk 525 Gebouw VB 5600 MD Eindhoven Tel 782808 New Zealand Northrop Instruments amp Systems Ltd For Fluke products 459 Kyber Pass Road Private Bag Newmarket Auckland 1 New Zealand Tel 501 801 Northrop Instrumente amp Systems Ltd For Fluke products First Floor Northrop Bldg 189 191 Willis Street P O Box 2406 Wellington New Zealand Tel 856 658 Philips Electrical Ind Ltd For Philips products Scientific amp Industrial Div 68 86 Jervois Quay P O Box 2097 Wellington C1 Tel 735735 Nigeria Associated Electronic Products Nigeria Ltd For Philips products Km 16 Ikorodu Road Ojota P O Box 1921 Lagos Tel 932825 Norway Morgenstierne amp Co A S For Fluke products Konghellegate 3 P O Box 6688 Rodelokka Oslo 5 Norway Tel 356110 Norsk Akieselskap Philips Dept Industry and Telecommunication Sandstuveien 70 P O Box 1 Manglerud Oslo 6 Tel 2 680200 Pakistan Pak International Operations For Fluke products 505 Muhammadi House Chundrigar Road P O Box 5323 Karachi Pakistan Tel 221127 239052 Philips Electrical Industries of Pakistan Ltd For Philips products Philips Markaz M A Jinnah Road P O Box 7101 Karachi 3 Pakistan Tel 725772 9
50. The command line syntax is as follows Tl mXCR T2 m lt CR The m essage prompt represents no more than sixteen characters including spaces The TI command line fills the upper 16 character line on the LCD and the T2 command fills the lower 16 character line Intercept Keypad Command The Intercept Keypad command interrupts the normal operation ofthe tester keypad The moment any one of the 24 keys are pressed the labeled action of the key is not interpreted by the tester but instead sent to the remote computer or terminal The command line syntax to enable the Intercept Keypad command is as follows EC CR For example when the Intercept Keypad command is used you can enter UUT serial numbers or other identifying information from the tester keypad instead of using the remote computer keyboard If you press an address data entry key one of 16 keys in the middle of the keypad the tester sends the associated ASCII character for the digit The other six keys send ASCII characters as shown in Table 4 3 Three different actions may be taken to disable the intercept keypad command The ENTER key may be pressed from the tester keypad or B or ESC may be entered at the remote interface Once one of the three actions have been taken the tester sents a CR LF character sequence to the remote interface and the tester keypad returns to normal operation REMOTE EXECUTION OF LOCAL REMOTE COMMANDS Introduction Local Remote
51. The display shows the following prompt The default 1200 value or the last baud rate entered is represented by xxxx USING THE PROBI 3 Pressthe LOOP key repeatedly until the desired baud rate appears on the display 4 Press the ENTER key and the display shows the following prompt either 7 or 8 the default value data bits per character is represented by 5 Pressthe LOOP key until the desired data bit length is displayed Then press the ENTER key to complete the configuration sequence These settings are returned to the default values of 1200 baud and 8 bits per character when power is removed The non changeable parameters of the RS 232 C Interface are no parity and one stop bit USING THE PROBE Introduction The Probe included with the tester can be used to isolate faults in UUT data address and control lines not directly connected to the microprocessor The Probe can function as either a Logic Probe synchronized tothe data valid state ofthe UUT bus or possess the following specific functions QuickTrace Probe Address Lines Probe Data Lines Probe Control Lines CAUTION When you exit a Probe Function the UUT is reset Probe Description The Probe is a hand held device shown in Figure 2 4 that plugs into a connector onthe rear panel of the tester and detects signal states on the UUT The Probe has a push button a red light and a green light The push button on the Probe has
52. aMINE i eletto da Ret yen eda 3 16 Meitiory VEEN aoonoa ERENNERT EE 3 17 Memony NEIES eegener Age detente ei aah ies MORARI ee ER Eid 3 19 Memory ad t os etaed 3 20 NOTES esie etUm E NG a 3 22 JEE eher orte od dese Yt esce eth ore tepore qn ees 3 22 NEE rogue Og DOTT UR GAI 3 23 TOVERI lt lt SR 3 24 Wate ageet one eons NING ea doti Drs 3 25 RS 232 C Port Configuration 3 26 USING THE PROBE masapak nne eom dre Aah Ess 3 27 gt DE EE EE 3 27 Probe IDDeseriptiOn ESA EE gd PAA tee 3 27 Quigl Irae os preven ine CTAA d UE NN els OR AP d 3 28 Aere ador oe ee IR NAN Ue DER RN ee Mota 3 29 BrobetDat Aere 3 30 PROBE CON FO iesse eases NIN dalle ao AN ttt an stent Men 3 32 4 REMOTE OPERATIONS 45 5 3 rr de ogni 4 INTRODUCTION NENA nag erento aea aces ar edet yo 4 1 Local Remote Commands and Remote Commands 4 Reniote I6SHP sete wo sod OY ed Cur e nA i os tar qu bed 4 1 REMOTE COMMUNICATIONS INTERFACE 4 CABLING TESTER A TERMINAL OR HOST 4 2 SYNG TRIGGER INTERFACE NEEN e eee a 4 2
53. an incremented pattern on all address and data lines See Figure 3 3 For each new pattern the tester performs a memory write cycle that enables any address decoders buffers or drivers Activity can be verified for each signal line with the use of the Probe or an oscilloscope Lack of activity may be an indication of a faulty component Address or data line shorts or improper connections outside the UUT kernel can be detected by observing frequency activity of the selected line with respect to its neighboring lines For example if address line 13 A13 is of interest the next lower line A12 should toggle low high low at twice the frequency of A13 and the next higher line A14 should toggle at half the frequency of A13 RAMP TEST ADDRESS JNES FREQUENCY 0 1 2 4 5 6 Figure 3 3 Ramp Test Waveform TROUBLESHOOTING HINTS During the test the UUT is held in a DMA state and UUT operation is not possible Care must be taken with UUT microprocessors that have positive true Bus Request signals BUSREQ inactive low and active high If the line is driven directly by a TTL or CMOS gate the pin must be disconnected from the board ora 10 kilohm pull up resistor placed in series with the gate and the microprocessor pin Only bus drivability is tested no checks are perfor
54. and 27277 is the checksum computed 6 Ifyoupressthe ENTER key after the first test cycle the test is repeated once If you press the LOOP key after the first test cycle the test is executed continuously until the CLEAR or the RESET key is pressed MEMORY EXAMINE Memory Examine TYPICAL USES Memory Examine is used to examine the contents of any memory mapped locationin the address space of the UUT NOTE It is recommended that you first execute Test Bus Ramp Test or QuickTrace to make sure that the UUT bus is operational before executing Memory Examine When Memory Examine is used in the LOOP mode the Probe can be used to check that only the proper memory address is accessed HOW MEMORY EXAMINE IS PERFORMED An address value is entered through the user keypad The tester reads the contents of that address and displays its contents TROUBLESHOOTING HINTS During the execution of Memory Examine erroneous reads are possible because of faulty RAM ROM shorts orfaulty memory decoders Itis recommended that you first execute Test Bus Ramp Test or Quick Trace to determine if the memory decoders and drivers are functioning properly Some UUT microprocessors use memory mapped I O that changes state when examined Check the UUT design information first for this situation before performing this test on non RAM ROM addresses EXECUTING MEMORY EXAMINE 1 Press the MEM TEST key to enter the Memory Test menu The display shows
55. angkok 10 Tel 233 63330 9 Tunisia S T LE T For Philips products 32 bis Rue Ben Ghedhahem Tunis Tel 244268 Turkey Erkman Elektronik Aletler For Fluke products Ticaret Anonim Sirketi Necatiby Cad 92 3 Karakoy Istanbul Turkey Tel 441546 Turk Philips Ticaret A S For Philips products Posta Kutusu 504 Beykoglu Istanbul Tel 1435910 United Arab Emirates Philips Middle East b v For Philips products Dubai int l Trade Centre Level 11 P O Box 6269 Dubai Tel 377000 Uruguay Coasin Uruguaya S A For Fluke products Casilla de Correo 1400 Libertad 2529 Montevideo Uruguay Tel 789015 Industrias Philips del Uruguay For Philips products Avda Uruguay 1287 Casilla de Correo 294 Montevideo Tel 915641 Venezuela Coasin C A For Fluke products Calle 9 Con Catle 4 Edif Edinurbi Apartado de Correos Nr 70 136 Los Ruices Caracas 1070 A Venezuela Tel 241 0309 Industias Venezolanas Philips S A For Philips products Av Ppal de los Ruices Apartado Postal 1167 Caracas Tel 239 3811 Zaire SAME s z rl For Philips products B P 16636 Kinshasa Tel 31693 Zambia Philips Electrica Zambia Ltd For Philips products Mwembeshi Road P O Box 31878 Lusaka Tel 218511 Zimbabwe Philips Electric Pvt Ltd For Philips products P O Box 994 62 Umtali Road Beverley Harare Tel 47211 P N 828723 February 1988 1988 John Fluke Mfg Co Inc All r
56. are prompted to identify which address line to probe When the requested address line is probed the lights on the probe toggle from red to green Select the next address line by pressing ENTER on the keyboard or by pressing the button on the Probe TROUBLESHOOTING HINTS Care must be taken with UUT microprocessors that have positive true Bus Request signals BUSREQ inactive low and active high If the line is driven by a TTL or CMOS gate the pin must be disconnected from the board or a 10 kilohm pull up resistor placed in series with the gate and the microprocessor pin During execution of Probe Address the UUT microprocessor is held in a DMA state and UUT operation is halted Lines shorted to Vcc or ground can not be identified using Probe Address See Test Bus or Ramp Test for information on detecting shorted signal lines During the execution of Probe Address the operation of the UUT is temporarily suspended However inactivity detector circuits software activated may force the UUT through its power up restart sequence It is suggested that any inactivity detector circuit be disabled before executing Probe Address PROBE DATA EXECUTING PROBE ADDRESS 1 5 Press the PROBE key to enter the Probe menu The display shows name of the last Probe function performed Press the PROBE key repeatedly to scroll through the possible PROBE menu selections until PROBE ADDRESS appears on the display Press the ENT
57. ation each memory cell is tested individually See Memory Checksum for more information Static RAM sometimes exhibit a failure mode where it fails to retain its contents after a period of time Since the write read cycle is very short the cycle may not be detected with Test Memory See Memory Soak for more information EXECUTING TEST MEMORY 1 Press the MEM TEST key to enter the Memory Test menu The display shows the name of the last Memory Test performed Press the MEM TEST key repeatedly to scroll through the possible Memory Tests until TEST MEMORY appearsonthe display Press the ENTER key The display shows the following prompt The last starting address is represented by xxxx Use the numeric entry keys to enter the start address in hexadecimal Press the ENTER key The display shows the following prompt The last ending address entered is represented by yyyy Enter the ending address in hexadecimal and press the ENTER key to start the Memory Test During test execution the activity indicator flashes and the following message is displayed TEST MEMORY The starting address and ending address is represented by CHECKSUM TEST 5 Atthe completion of the test the following message appears on the display if no fault is detected TEST MEMORY A The address where the fault is detected is represented by zzzz aa is th
58. bnormal condition of operation or handling you will be billed for the repair The repaired product will be returned to you transportation prepaid THIS WARRANTY IS EXCLUSIVE AND IS IN LIEU OF ALL OTHER WARRANTIES EXPRESS OR IMPLIED INCLUDING BUT NOT LIMITIED TO ANY IMPLIED WARRANTY OF MERCHANTABILITY OR FITNESS FORA PARTICULAR PURPOSE ORUSE FLUKE WILL NOT BE LIABLE FOR ANY SPECIAL INDIRECT INCIDENTAL OR CONSEQUENTIAL DAMAGES OF LOSS WHETHER IN CONTRACT TORT OR OTHERWISE 90 Series uP BOARD TESTER User s Manual P N 828723 February 1988 EH K 1988 John Fluke Mfg Co Inc All rights reserved Litho in U S A SECTION 1 Table of Contents TITLE PAGE INTRODUCTION eorr ee ne Sota nerve 1 1 GENERAL DESGRIPTION nti cree ru tede rre eae deed beh ariete 1 1 OPERATING PRECONDITIONS 1 2 FLUKE 90 UUT FLOATING GROUND HAZARD 1 2 THE FLUKE 90 USER S MANUAL 0 cece cece cece eee ees 1 2 FEATURES AND FUNCTIONS 2 1 INDRODUGTION 4 5 777 70 5 298999991 97 0 Hee tga e 2 1 UNPACKING THE TESTER eg 4005 vs 2 1 RHE DIS PLAY EE 2 2 DISPLAY VIEWING ANGLE ADJUSTMENT 2 2 Lien d D WEE EE EE 2 2 TESUKEYS AE e AE soe RAYA NAP te aS 2 2 Control Keys gode ei a ATO dot Cu KG NN 2 2 Numeric E 2 5 MICROPROCESSOR CLIP and CABLE
59. can also be used to exit from any test or function in addition to the tester and the UUT being reset LOOP Key Press the LOOP key to enter a looping mode on the Bus Memory and I O tests Looping causes a test to be repeated until the RESET key or CLEAR key is pressed In the looping mode the activity indicator on the bottom line of the display flashes NOTE Use the CLEAR key rather than the RESET key to stop the looping mode The CLEAR key resets the tester only it does not reset the UUT The RESET key resets the UUT microprocessor as well as the tester which in some cases is an undesirable situation In the RS 232 C Port Configuration Mode discussed in Section 3 the LOOP key is used to select baud rate and character length In the Probe Address Data and Control modes the LOOP key is used to backup to the previous probed signal 2 3 FEATURES AND FUNCTIONS 2 4 Table 2 1 Test Keys Menu Listing TEST KEY MENU SELECTIONS Test Bus Bus Test Ramp Test Shift Test Test Memory Checksum Test Memory Examine Memory Verify Memory Write Test Memory Soak O Examine Verify Write RS 232 C Port Configuration i O Test QuickTrace Probe Address Probe Data Probe Control Only for Microprocessors with I O ports e CLEAR Key Press the CLEAR key once to clear address or data entries in progress For example if an address is being enteredand anerror is made asingle depress
60. cation of address and data lines of outside buffers or drivers When the probed line is identified the lights on the Probe toggle fromred to green and the signal probed is identified TROUBLESHOOTING HINTS Care must be taken with UUT microprocessors that have positive true Bus Request signals BUSREQ inactive low and active high If the line is driven directly by a TTL or CMOS gate the pin must be disconnected from the board or a 10 kilohm pull up resistor placed in series with the gate and the microprocessor pin During execution of QuickTrace the UUT microprocessor is held in a DMA state and UUT operation is halted The decal on the bottom of the tester identifies the control lines that can be tested by your instrument Lines shorted to Vcc or ground can not be identified using QuickTrace See Test Bus or Ramp Test for information on detecting shorted signal lines During the execution of QuickTrace the operation of the UUT is temporarily suspended However inactivity detector circuits software activated may forcethe UUT through its power up restart sequence It is suggested that any activity detector circuit be disabled before executing QuickTrace EXECUTING QUICKTRACE 1 Press the PROBE key to enter the Probe menu The display shows the name of the last Probe function performed Press the PROBE key repeatedly to scroll through the possible PROBE menu selections until QuickTrace appears on the disp
61. cksum Test operates in a cycle stealing mode and does not interrupt UUT opera tion Some slowing of UUT operation during test execution may be observed CHECKSUM TEST TROUBLESHOOTING HINTS During the execution of Checksum Test the tester reads each memory cell individ ually Shorts or faulty memory decoders may cause erroneous reads Some UUTs use memory mapped I O that changes state when examined Check the UUT design information first for warnings directed at this situation before executing this test on non RAM ROM addresses EXECUTING CHECKSUM TEST 1 Press MEM TEST key to enter the Memory Test menu The display shows the name of the last Memory Test performed Press the MEM TEST key repeatedly to scroll through the possible Memory Tests until CHECKSUM TEST appears the display 2 Press the ENTER key The display shows the following prompt The last start address entered is represented by xxxx Use the numericentry keys to enter the start address in hexadecimal 3 Press the ENTER key The display shows the following prompt CHELK SLM TEST nd The last end address entered is represented by Enter the end address in hexadecimal and press ENTER to start the Checksum Test 4 During the test the activity indicator flashes and the following message is displayed DU TEST x uu The starting address and the ending address is represented by
62. control B O2 Hex or ESC 4 If the Test fails the tester displays the string FAILED prompt followed by additional information about the failure and a CR 5 Advance to the next step by sending a X control X 6 Terminate a command or test by sending B or ESC to the tester You can also terminate the test by pressing the CLEAR or RESET key 7 X must be sent after a command line in order to enable the setup of External Trigger Break Point or Frame Point Each following Frame Point or Break Point is stepped by successive X commands single step on current setup SYNTAX NOTATION CONVENTIONS Thefollowing notation conventions are used to represent the syntax ofthecommands described in this section All numbers are hexadecimal unless otherwise indicated XX Unenclosed upper case letters represent a command that must beentered precisely as given Example BT means enter BT for a Bus Test XX Angle brackets enclosing upper case letters represent a non printing ASCII character Example CR means CARRIAGE RETURN RETURN character 4 4 REMOTE COMMANDS X X Underscoring between elements of a command line represents a man datory space Example MT low address high address L means that a mandatory space must follow the left parenthesis and precede the low and high address values in this statement Xxxx Parentheses enclose required values Example MT low address hig
63. cy or twice the period of DO If the same frequency is found on two lines these lines are shorted together To stop a test cycle at any time press the CLEAR or RESET key TYPICAL USES The Shift Test detects shorted or stuck UUT address and data lines With the use of the Probe or an oscilloscope activity on these lines can be observed Lack of activity may be an indication to the location of a fault HOW SHIFT TEST IS PERFORMED The Shift Test or walking bit test rotates a logic 1 through all address and data lines See Figure 3 4 The Shift Test is different from the Ramp Test in that the Shift Test forces only one address or data line high at a time Like the Ramp Test a meniory write is performed for each new bit pattern During the execution of the Shift test only one bit is enabled and address decoders may not be exercised Shorts between address and or data lines may be easier to locate with the Shift test rather than with the Ramp test because only one address or data line is active at a time TROUBLESHOOTING HINTS During the test the UUT is held in a DMA state and normal UUT operation is not possible The UUT address decoders are not fully exercised due to the lack of signal line activity See Ramp Test for more information UUT control lines are not tested See Probe Control or Quick Trace for more information EXECUTING SHIFT TEST l Press the BUS TEST key to enter the Bus Test menu The displa
64. e UUT wait line is stuck in either a high or low state the following message is displayed E UUT CPU FALLT This message remains on the display until you press another key Reset Line Drivability Test The tester drives the UUT reset line during and after some tests If the reset line is stuck in either a high or low state the following message is displayed This message stays on the display until you press another key TROUBLESHOOTING FLOWCHART To assist you in developing a troubleshooting procedure using the tester a flowchart Figure 3 2 has been provided The flowchart begins with connecting the micro processor dip clip tothe UUT and leading you through a step by step troubleshooting procedure As you proceed through the flowchart the hexagonal blocks suggest the type of test to execute the diamond blocks ask a question for you to make some type of decision the plain rectangular blocks suggest some type of action and the bolded rectangular blocks suggest possible repair or replacement of UUT components 3 5 9 6 4 72 6 a1nD14 START TURN OFF UUT POWER ATTACH FLUKE 90 DIP CLIP TO UUT PERFORM INDICATED POWER ON FLUKE 90 EE SECTION ZS SELF TEST OK EXECUTE RAMP TEST WITH LOOP USING THE PROBE CHECK CHIP SELECT LINES ON ALL UUT RAM amp ROM ALL x USE PROBE TO LYVHIMOT14 INILOOHSITANOYL LINES ON ALL _ RAM amp ROM
65. e pattern written AA Hex or 55 Hex to the location and bb is the pattern read If you press the ENTER key after the first test cycle the test is repeated If you press the LOOP key the test is performed continuously If the test fails the error message is displayed and the test is suspended Press the ENTER key to continue the test or the LOOP key to loop the test on the address where the test failure occurred If the failure is intermittent the test continues from the address where the failure occurred until another failure is encountered Checksum Test TYPICAL USES Checksum Test verifies the operation of ROM in the UUT NOTE It is recommended that you first execute Test Bus Ramp Test or Quick Trace to make sure that the UUT bus is operational before executing Checksum Test Checksum Test can also be used to check for suspected faulty address decoders for both RAM and ROM All memory locations within the selected address range are accessed The selected address range can be used to test a single memory chip and the Probe can be used to check the chip select lines on other memory chip s If any other chip select activity is present it may indicate a faulty address decoder HOW CHECKSUM TEST IS PERFORMED Checksum Test teststhe ROM in the UUT by readingthe data fromthe specified range and accumulating the 16 bit sum of this data This checksum is equivalent to what is generated by most EPROM programming equipment Che
66. ecks the functionality of the microprocessor kernel HOW TEST BUS IS PERFORMED Test Bus determines the integrity and drivability of address data and selected control lines directly attached to the microprocessor inside any latches buffers drivers and or decoders The Fluke 90 forces the bus lines one at a time to specific states It then senses the state of all the bus lines detecting whether the line has achieved the desired state and whether other address data or control lines are shorted to the signal line being forced TROUBLESHOOTING HINTS The UUT is held in DMA state during the test stopping the operation of the UUT Test Bus does not detect address data or control lines that are open or not connected Bus lines outside of any drivers buffers latches or decoders are not checked See Ramp Test or any of the Probe functions for more information Control lines checked by Quick Trace are the only control lines tested See decal on the bottom of the instrument for the control lines tested TEST BUS 3 7 BUS TESTS Introduction Bus Tests isolate defects in the UUT data address and control lines inside the microprocessor kernel Before testing make sure that the clip is properly connected to the UUT microprocessor and the tester s self test routines have been successfully completed The prompt should be on the display NOTE Bus Tests disable the normal operation of the UUT Three types of Bu
67. ection 4 covers the commands tests and functions that are executed remotely Local operation is described in Section 3 Remote Testing Remote testing can be performed interactively or by using a computer program In interactive testing you enter commands at a terminal keyboard the tester responds and results are printed to the screen Remote testing by program requires that the tester commands be included in a computer program which when executed controls the testing process REMOTE COMMUNICATIONS INTERFACE Remote operation communication is conducted through an RS 232 C interface connector located on the rear panel of the tester See Table 4 1 and Figure 4 1 for the pin out and pin location of the connector The connector is a 6 line RJ 12 modular connector Only one point to point connection to a single computer or terminal interface is possible The interface does not support modem control lines The active lines of the interface consist of Transmitted Data Received Data and Ground The baud rate for this interface is selectable between 300 600 1200 2400 4800 and 9600 With aloss of powerthe tester resets to the 1200 baud default value The interface can beconfigured for either 7 or 8 bits per character the default value is 8 bits The interface is configured for one stop bit per character and no parity These settings cannot be changed XON 13H Q and XOFF 11H S characters control character flow An XOFF character
68. el 363139 Hinditron Services Pvt Ltd For Fluke products 15 Community Centre Panchshila Park New Delhi 110 017 India Tel 6433675 Hinditron Services Pvt Ltd Field Service Center For Fluke products Emerald Compiex 1 7 264 5th Floor 114 Sarojini Devi Road Secunderabad 500 003 India Tel 821117 Peico Electronic amp Electricals Ltd For Philips products Shivsagar Estate Block A Dr Annie Besant Road P O B 6598 Worli Bombay 400 018 Tel 4921500 Indonesia P T Lamda Triguna For Fluke products P O Box 6 JATJG Jakarta 13001 Indonesia Tel 8195365 P T Daeng Brothers For Philips products Centre Point Bldg 3rd Floor Ji Jend Gatot Suggroto Kav 35 36 P O Box 41 Tebet Jakaarta 12950 Tel 517335 Iran Philips Iran Ltd For Philips products 1297 Tet 372081 5 Iraq Philips Iraq W L L For Philips products Munir Abbas Building 4th Floor South Gate P O Box 5749 Baghdad Tel 880409 Ireland Philips Electrical Ireland Ltd For Philips products Newstead Clonskeagh Dublin 14 Tel 693355 Israel R D T Electronics Engineering Ltd P O Box 43137 Tel Aviv 61430 Israel Tel 483211 italy Sistrel S p A For Fluke products Via Pelizza da Volpedo 59 20092 Cinisello Balsamo Milan Italy Tel 6181893 Philips S p A For Philips products Sezione S amp I T amp M Dept Viale Elvezia 2 20052 Monza Tel 039
69. elected the Probe Data function you are prompted to probe a data line When the requested data line is probed the lights on the probe toggle from red to green Select the next data line by pressing ENTER on the keyboard or by pressing the button on the probe 3 30 TROUBLESHOOTING HINTS Care must be taken with UUT microprocessors that have positive true Bus Request signals BUSREQ inactive low and active high If the line is driven directly by a TTL or CMOS gate the pin must be disconnected from the board or a 10 kilohm pull up resistor placed in series with the gate and the microprocessor pin Duringexecution of Probe Data the UUT microprocessor is held in a DMA state and UUT operation is halted Lines shorted to Vcc or ground can not be identified using Probe Data See Test Bus or Ramp Test for information on detecting shorted signal lines During the execution of Probe Data the operation of the UUT is temporarily suspended However inactivity detectorcircuits software activated may force the UUT through its power up restart sequence It is suggested that any inactivity detector circuit be disabled before executing Probe Data EXECUTING PROBE DATA L Press the PROBE key toenter the Probe menu The display shows the name ofthe last Probe function performed Press the PROBE key repeatedly to scroll through the possible PROBE menu selections until PROBE DATA appears on the display Press the ENTER key While the test
70. en directly by a TTL or CMOS gate the pin must be disconnected from the board or a 10 kilohm pull up resistor placed in series with the gate and the microprocessor pin Some UUT microprocessors use memory mapped I O that changes state when examined Check the UUT design information first for this situation before performing this test on non RAM addresses During the execution of Memory Soak the operation of the UUT is temporarily suspended However inactivity detector circuits software activated may force the UUT through its power up restart sequence It is suggested that any inactivity detector circuit be disabled before executing Memory Soak 3 20 MEMORY SOAK EXECUTING MEMORY SOAK 1 Press the MEM TEST key to enter the Memory Test menu The display shows the name of the last Memory Test performed Press the MEM TEST key repeatedly to scroll through the possible Memory Tests until MEMORY SOAK appears on the display Press the ENTER key The display shows the following prompt The last start address entered is represented by xxxx Use the numeric entry keys to enter the start address in hexadecimal Press the ENTER key The display shows the following prompt The last end address entered is represented by yyyy Use the numeric entry keys to enter the end address in hexadecimal Press the ENTER key The display shows the following prompt The previous data entered is represented by
71. eria Bureau de Liaison Philips For Philips products 24 bis rue Bougainville TI Mouradia Alger Tel 56 56 72 Antillen Philips Antillana N V For Philips products P O Box 523 Willemstad Curacao Tel 414071 74 Bangladesh Philips Bangla Desh Ltd For Philips products P O Box 62 Ramna Dhaka Tel 234280 Belgium N V Philips amp Mble Assoc Scientific amp Industrial Div 70 Rue des Deux Gares Brussels Belgium Tel 2 525 6111 Brazil Hi Tek Electronica Ltda For Fluke products Al Amazonas 422 Alphaville Barueri CEP 06400 Sao Paulo Brazil Tel 421 5477 Industias Brasileiras Philips Ltd For Philips products Av Eng Luiz Carlos Berrini 3009 7 and CEP 04571 Sao Paulo S P Tel 241 1611 Canada Fluke Electronics Canada Inc 400 Brittania Rd Unit 1 Mississauga Ontario L4Z 1Y9 Tel 416 890 7600 Fluke Electronics Canada Inc For Fluke products 1255 Trans Canada Highway Suite 130 Dorval Quebec H9P 2V4 Tel 514 685 0022 Fluke Electronics Canada Inc For Fluke products 101 1144 29th Ave N E Calgary Alberta T2E 7P7 403 291 5215 Chile Intronica Chile Ltda For Fluke products Casilla 16228 Santiago 9 Chile Tel 2321886 Philips Chilena S A For Philips products Casilla Postal 2687 Santiago de Chile Tel 770038 China Peoples Republic of Instrimpex Fluke Service Center For Fluke products 57 Xisi Dong Da Jie Xicheng qu P O Box 9085
72. ess the ENTER key to execute the test When the test cycle is complete the following message appears on the display Port Bum The address and data written at that address is represented by and bb respectively If you press the ENTER key after the first test cycle the address is incremented by and the display shows a prompt for new data Enter new data or simply press the ENTER key to repeat the test with the previously entered data If you press the LOOP key after the first test cycle the test is repeated in a continuous loop using the same data at the same address until you press the CLEAR or RESET key RS 232 C Port Configuration The RS 232 C port configuration is not an I O test It allows the tester and an external terminal or computer to communicate with the correct baud rate and bits per character You can set the baud rate 300 600 1200 2400 4800 or 9600 and bits per character 7 or 8 for the RS 232 C Remote Communications Interface from the keyboard as well as by a Remote Interface Command See Section 4 and Appendix A for the Configuration command Use the following procedure to set the baud rate and bits per character l Press the 1 O TEST key to enter the I O Test menu The display shows the name of the last I O Test performed Press the I O TEST key repeatedly to scroll through the possible I O Tests until CONFIGURE RS232 appears on the display Press the ENTER key
73. essage is displayed ESAMINE Fart ecu The address and data at that address is represented by and respectively Press the ENTER key to increment the address by 1 and examine the contents of the new address Hold the ENTER key down to cause continuous incrementing of the address and display of the new address and data Press the LOOP key to execute this test inthe loop mode A read is performed on the same address and the following message is displayed The activity indicator flashes until you press the CLEAR or RESET key ESAMINE Fart u 3 23 1 0 VERIFY 3 24 1 0 Verify TYPICAL USES I O Verify is used to write to an I O address and then verify that the written data is still contained at that I O address NOTE It is recommended that first you execute Test Bus before executing I O Verify as a normal troubleshooting procedure HOW VERIFY IS PERFORMED After you enter the I O address and data value the tester writes the data to the specified I O address then reads the same address and compares the data read to what was written The read and write operations are performed on the same DMA cycle to prevent the UUT from overwriting the data TROUBLESHOOTING HINTS I O Verify performs aread after write operation and may return unexpected data or cause state changes in the I O circuits Check the UUT design information first for warnings directed at this situation be
74. essisincremented by L and the display prompts you for new data Enter new data or simply press the ENTER key to repeat the test with previously entered data 6 If you press the LOOP key after the first test cycle the test is repeated in a continuous loop using the same data at the same address until you press the CLEAR key or RESET key Memory Soak TYPICAL USES Memory Soak is used to determine that data written to static RAM of the UUT is retained for a specified period of time NOTE It is recommended that you first execute Test Bus Ramp Test or Quick Trace to make sure that the UUT bus is operational before executing Memory Soak Memory Soak with a soak time of 0 may also be used to fill a specified range of memory HOW MEMORY SOAK IS PERFORMED After youenter the address range data and soak time the Memory Soak test writes the data to the address range The tester counts down the specified time period and at the end of the soak time compares the contents against the data written The UUT is held in a DMA state during this test to prevent the RAM contents from being overwritten TROUBLESHOOTING HINTS During the execution of the Memory Soak test the UUT is held in a DMA state and all UUT operation is suspended This test may not be suitable for dynamic memory Care must be taken with UUT microprocessors that have positive true Bus Request signals BUSREQ inactive low and active high If the line is driv
75. fore performing this test EXECUTING I O VERIFY 1 Press the I O TEST key to enter the I O Test menu The display shows the name of the last I O Test performed Press the I O TEST key repeatedly to scroll through the possible I O Tests until I O VERIFY appears on the display 2 Press the ENTER key The display shows the following prompt Tet VERIFY Fori where represents the last address entered Use the numeric keys to enter the start address in hexadecimal 3 Press the ENTER key The tester displays the following message pog UEBRIFY Data yy The last data entered is represented by 4 Enter new data and press the ENTER key to execute the test When the test cycleis complete the following message appears on the display The address and the data read at that address is represented by and respectively If the read and write do not match the following message appears on the display The data written and read at the verified UO address is represented by and bb respectively 5 Ifyou press the ENTER key after the first test cycle the address is incremented by 1 and the display issues a prompt for new data Enter new data or simply press the ENTER key to repeat the test with previously entered data 6 If you press the LOOP key after the first test cycle the test is repeated in a continuous loop at the same address until you press the CLE
76. fromtheterminal or host computer stops character flow fromthetester and an XON character from the terminal or host computer resumes character flow 4 1 CABLING TESTER TO A TERMINAL OR HOST Table 4 1 RS 232 C Connector Pin Out PIN NUMBER DATA LINES P1 No Connection P2 Ground P3 Receive Data input to tester P4 Transmit Data output from tester P5 Ground P6 No Connection Figure 4 1 RS 232 C Interface Connector CABLING TESTER TO A TERMINAL OR HOST The RS 232 C cable shipped with the tester is terminated by an RJ 12 compatible plug at both ends Oneend plugs into the RJ 12 connector on the tester the other end plugs into an adapter that connects to the serial port on the terminal or host computer The tester is cabled to a terminal or host as shown in the system illustration on the inside cover of this manual CAUTION Do not plug the tester into a telephone wall jack Damage to the tester circuitry may result SYNC TRIGGER INTERFACE The SYNC Trigger interface is located on the rear panel of the tester The interface consists of two metal posts to which a probe and ground of an oscilloscope can be clipped The External Trigger commands using the SYNC Trigger interface can be issued remotely only 4 2 OVERVIEW OF REMOTE INTERFACE CAUTION Be sure that you clip oscilloscope and ground leads to the correct posts as labeled on the tester A misconnection results in a nongeneration of the SYNC Tri
77. gger pulse If the tester is being operated in the remote mode the SYNC Trigger interface can be enabled or disabled If the S YNC Trigger interface is enabled a trigger pulse is output only when the tester detects a selected event that is defined by a Break Point Frame Point or External Trigger command See Break Point Frame Point and External Trigger Commands later in Section 4 If the SYNC Trigger interface is disabled the default condition a pulse is output when the UUT generates a DMA Acknowledge signal in response to the tester forcing a DMA Request Whenever the tester is notexecuting a test the External Trigger on a memory read is the default state and generates a negative going pulse on the rising edge of data valid after you hit a CTRL X You have to enable the trigger output with the CTRL X command before the tester outputs trigger pulses An ESC character disables all External Trigger Frame Point and Break Point setups and returns the system to a default state of External Trigger on a memory read Use CTRL X to enable External Trigger Frame Point and Break Point OVERVIEW OF REMOTE OPERATION Control Commands The Control commands provide the control functions indicated in Table 4 2 when you are operating the tester remotely The first character received by the tester sent by the host or terminal on the remote interface causes the display to read and locks the keypad Press the CLEAR
78. h address means you must provide a low and a high address to execute a memory test xxxx Square brackets enclose optional values Example BT L means that the L flag which will initiate the loop mode is optional X X Periods between elements represent multiple fields Example MW low address data data data L means that multiple data values can be written when a Write Memory test is executed REMOTE COMMANDS The following commands can only be issued over the Remote Interface NOTE Break Point Frame Point and External Trigger are remote commands that are normally used only by experienced technicians and design or test engineers These commandsare treated separately at the end of Section 4 NOTE The low address and high address parameters on the remote command syntax lines can contain up to four digit hexadecimal numbers Memory Fill Command The Memory Fill command writes a single user selected data byte to an inclusive range of addresses in the UUT The command line syntax is as follows ME low address high address data CR 4 5 REMOTE COMMANDS Up Load Command The Up Load command reads data at an inclusive range of addresses in the microprocessor of the UUT and transfers the data read to aterminal or computer The command line syntax is as follows UP low address high address format CR The data transmitted using the Up Load command may be sent in your choice of
79. he tester to execute the selected function Break Point Frame Point or External Trigger when the UUT reads an opcode UUT CPU instruction from memory If no general qualifiers are specified the tester executes the selected function for every instruction execution single step CPU FUNCTION QUALIFIERS INTERRUPT ACKNOWLEDGE CPU QUALIFIER The interrupt acknowledge CPU function qualifier causes the tester to execute the selected function Break Point Frame Point or External Trigger when the UUT responds to an interrupt request If no general qualifiers are specified the tester executes the selected function for every interrupt generated Table 4 6 Break Point Frame Point and External Trigger Syntax COMMAND NAME COMMAND LINE SYNTAX Break Point BP cpu gen gen CR Frame Point FP cpu gen gen CR External Trigger XT cpu gen gen CR Disable BP FP XT DB CR Break Point Status BP Frame Point Status FP External Trigger Status XT NOTES cpu is a required CPU Function qualifier gen is an optional General Function qualifier without CPU or General Function qualifier appended BP FP and XT commands respond with status condition Table 4 7 CPU Function Qualifiers COMMAND DESCRIPTION Enable BP FP or XT on Memory Read Enable BP FP or XT on Memory Write Enable BP FP or XT on O Read Enable BP FP or XT on I O Write Enable BP FP or XT on OpCode Fetch Enable BP FP or XT
80. ights reserved Litho in U S A
81. inactive for a long period of time It may be necessary to defeat this timer when using the Test Memory Checksum Test and Memory Soak tests Before testing makesure that the clip is properly connected to the UUT microprocessor and the tester s self test routines have been successfully completed The prompt gt should be on the display Test Memory TYPICAL USES Test Memory non destructively exercises the UUT RAM to verify its functionality and determine if any faults occur NOTE It is recommended that you first execute Test Bus Ramp Test or QuickTrace to make sure that the UUT bus is operational before executing Test Memory Test Memory can be operated in a LOOP mode so that memory failures due to thermal stress can be induced by heating cooling suspected chip s while Test Memory is executing 3 12 TEST MEMORY HOW TEST MEMORY IS PERFORMED For each selected memory location the contents are read two patterns 55 Hex and AA Hex are written verified and the original contents restored Test Memory does not halt the normal operation of the UUT but operates in a cycle stealing mode Some slowing of UUT operation may be observed during test execution The total time for the read write operations is controlled so that dynamic RAM remains refreshed TROUBLESHOOTING HINTS Due to shorts or faulty memory decoders simultaneous inadvertent reads and writes to multiple memory addresses are possible In normal oper
82. ion of the CLEAR key clears the digits already entered and changes all the digit display spaces to 2 marks Press the CLEAR Key a second time to abort a partially completed data entry For example if you enter the data for a memory writetest pressing the CLEAR key twice cancels data entry and allows you to select a different test If a test or Probe function is executing a single push of the CLEAR key causes termination of the test or function ENTER Key Press the ENTER Key to execute the test indicated on the display or complete the entry of data or an address The push button on the Probe performs the same function as the ENTER key on the keypad For more information on the Probe ENTER button see Section 3 Using the Probe NOTE In the Remote Mode only the CLEAR and RESET keys are active FEATURES AND FUNCTIONS Numeric Keys The Numeric keys 0 to F located in the middle of the keypad are used to enter hexadecimal values needed for the type of test being performed MICROPROCESSOR CLIP AND CABLE The microprocessor cable with attached clip supports only onetype of microprocessor family Information on the bottom of the tester states which microprocessor your tester supports The spring loaded clip is detachable from the cable The cable is not detachable from the tester without opening the case CAUTION Do not use the microprocessor cable as a handle to carry the tester Damage may occur to the connection between
83. ips Industrielle et Comerciale Science et Industry For Philips products 105 Rue de Paris 93002 Bobigny Tel 48301111 Germany F R G Philips GmbH Unternehmensbereich Elektronik fur Wissenschaft und Industrie Werk fur Messtechnik Oskar Messter StraBe 18 8045 Ismaning Deutschland Tel 089 96050 Great Britain Philips Scientific Test amp Measuring Division For Fluke products Colonial Way Watford Herts WD2 4TT United Kingdom Tel 0923 2405 11 Pye Unicam Ltd For Philips products York Street Cambridge CB1 2PX Tel 923 40511 Greece Hellenic Scientific Representations Ltd For Fluke products 11 Vrassida Street Athens 612 Greece Tel 7211140 Philips S A Hellenique For Philips products P O Box 153 54 Ave Syngrou Athens Tel 9215311 Hong Kong Schmidt amp Co H K Ltd For Fluke products 18th Great Eagle Centre 23 Harbour Road Wanchai Hong Kong Tel 8330 222 Philips Hong Kong Ltd For Philips products P O B 2108 27 29 Floor Hopewill Centre 17 Kennedy Road Hong Kong Tek 5 283298 Iceland Heimelistaeki SF For Philips products Saetun 8 Reykjaavik Tel 24000 India Hinditron Services Pvt Ltd For Fluke products 1st Floor 17 B Mahal Industrial Estate Mahakali Road Andheri East Bombay 400 093 India Tel 6300043 Hinditron Services Pvt Ltd For Fluke products 33 44A Raj Maha Villas Extn 8th Main Road Bangalore 560 080 India T
84. is missing or damaged contact the place of purchase immediately If reshipment is necessary use the original shipping container and packing material If the original container is not available be sure that adequate protection is provided to ensure that the tester is not damaged in transit MICROPROCESSOR CLIP CABLE Ee DISPLAY FELLJ K E 9092540 ses SYNC TRIGGER PULSE INDICATOR slk je Je MEM Six Je E Ik Ji NG EB DISPLAY VIEWING ANGLE TEST SELECTION NUMERIC CONTROL ADJUSTMENT KEYS KEYS KEYS Figure 2 1 Case Top Feature and Function Locations 2 1 FEATURES AND FUNCTIONS POWER SUPPLY SYNC TRIGGER ACCESSORY MICROPROCESSOR INTERFACE CONNECTOR CLIP CABLE CONNECTOR RS 232 C PROBE REMOTE CONNECTOR INTERFACE CONNECTOR Figure 2 2 Rear Panel Feature and Function Locations THE DISPLAY The display refer to Figure 2 1 for location is a two line 16 character per line liquid crystal panel The right most character in the bottom line is reserved for an activity indicator The indicator flashes light to dark when the tester is executing a test DISPLAY VIEWING ANGLE ADJUSTMENT The Display Viewing Angle Adjustment is a thumbwheel control that adjusts the display contrast Refer to Figure 2 1 for its location Rotate the control in either direction for improved contrast of the display at various viewing angles KEYPAD The ke
85. ket Auckland 1 New Zealand Tel 64 9 501 801 TLX 791 21570 FAX 64 9 543430 Northrop instruments amp Systems Ltd For Fluke products Information Technology Group First Floor Northrop Bldg 189 191 Willis Street P O Box 2406 Wellington New Zealand Tel 64 4 856 658 TLX 791 3380 Northrop Instruments amp Systems Ltd For Fluke products Information Technology Group 110 Mandeville Street P O Box 8388 Christchurch New Zealand Tel 64 3 488 874 TLX 791 4801 Philips New Zealand Ltd Industrial amp Electro acoustic Systems Division 2 Wagener Place P O Box 4 021 Auckland 3 New Zealand Tel 09 894 160 TLX NZ 2395 FAX 9 862 728 Nigeria Associated Electronic Products Nigeria Ltd For Philips products KM 16 Ikorodu Road Ojota P O Box 1921 Lagos Tel 234 1 900160 69 TLX 21961 NG Norway Morgenstierne amp Co A S For Fluke products Konghellegate 3 Box 6688 Rodelokka Oslo 5 Norway Vel 47 2 356110 TLX 856 71719 FAX 47 2 381457 Norsk AI S Philips For Philips products Dept I amp E Test amp Measurement Sandstuveien 70 P O Box 1 Manglerud Oslo 6 Tel 2 680200 Oman OHI Telecommunications For Fluke products P O Box 889 Muscat Oman Tel 968 603606 TLX 926 5052 Pakistan International Operations PAK Private Ltd For Fluke products 505 Muhammadi House 14 Chundrigar Road
86. l Trigger Syntax 4 11 4 7 GPUEunction Qualifierst eam cese cR ren E ha NANANG 4 11 4 8 General Function Qualifiers role ear eben DEES 4 12 5 1 Listsof User Replaceable Parts reete See teen 5 Conto Commands 24x EE 1 2 Local Remote Commands 5 htt SE Ea A A 2 A 3 Break Point Frame Point and External Trigger Commands A 3 A 4 GPU Function Qualifiers 2 E E ede uae EEDE A 3 5 General Function Qualifiers 4 4 6 Miscellaneous Remote Commands A 4 FIGURE TITLE 2 1 Case Top Feature and Function Locations 2 2 2 Rear Panel Feature and Function Locations 2 2 2 3 Keypad ss t ob eo aca e noo ER tege io s 2 3 2 4 Probe Veris Pepe deem cen oer Peer eee 2 5 2 5 Probe Timing MWayeform o cnt ec hectare dee 2 6 2 6 External Power Supply Plug 2 0 ei cere mre Ie Pm 2 7 3 1 Correct Alignment for Microprocessor Clip 3 2 3 2 Troubleshooting Flowchart 3 6 3 3 Ramptest ENEE Lo ELSA Se et ca 3 9 3 4 Shfttest EN TEE 3 11 4 RS 232 C Interface Connector MICROPROCESSOR CLIP INTERFACE p RS 232 C UUT OPTIONAL MICROPROCESSOR EXTERNAL CLIP
87. lay 2 Press the ENTER key The activity indicator flashes QuickTrace is displayed and the red Probe light is on while the test is running before any signal line is probed 3 28 PROBE ADDRESS 3 Makecontact between the Probe and a bus signal Uponrecognition ofthe signal the Probelights changefromred to green the activity indicator continues to flash and the following message appears on the display Mu beck Trace The signal name probed BUS MEMORY CONTROL is represented by nnnn If you are sure that the proper signal has been probed and the red light remains on the signal is either shorted or stuck high or low Each time you probe a testable signal line the tester identifies the name of the signal When a node with two or more signals connected to it is probed both lights on the probe are lit and all signal names are displayed To clear the display of the last probed signal mains press the button on the Probe or the ENTER key 4 Press the CLEAR or RESET key to stop the test Probe Address TYPICAL USES Probe Address is used with the Probe to test UUT microprocessor address lines The Probe Address function sequentially prompts the probing of all address lines During the execution of Probe Address a memory write cycle is forced to allow identification of address lines outside buffers or drivers HOW PROBE ADDRESS IS PERFORMED Once you have selected the Probe Address function you
88. med onthe RAM or ROM of the UUT See Test Memory and Checksum for more information The UUT control lines are not exercised See Probe Control or QuickTrace for more information Monitoring the frequency of the low order address and data lines may require the use of an oscilloscope to observe Ramp Test wave forms At high frequencies the Probe lights are lit continuously and activity frequency can not be observed EXECUTING RAMP TEST 1 Pressthe BUS TEST key to enter the Bus Test menu The name of the last Bus Test performed is displayed Press the BUS TEST key repeatedly to scroll through the possible bus tests until RAMP TEST appears on the display 2 Press the ENTER key to start the Ramp test While the test is running RAMP TEST is displayed and the activity indicator flashes on the screen 3 Atthe end of one test cycle the following message is displayed RAMP TEST TEET 3 9 SHIFT TEST 4 5 Shift Test After one test cycle has been completed you can execute the test again by pressing the ENTER key Press LOOP to cause the test to be run in a continuous loop While the Ramp Test is running in loop mode you can use the Probe and or an oscilloscope to detect shorts or opens in UUT address and data lines Starting at the lowest order address or data line check each signal line for a decreasing frequency square wave For example when probing the data lines D1 shows a signal of the frequen
89. n address data or control signal line and allows the type of signal line to be tracked in the UUT Detect selected events on the UUT bus by setting and enabling Break Pont Frame Point and SYNC Trigger Interface functions Loads the UUT memory over the Remote Communications Interface Dumpsthe contents of the UUT memory to a remote terminal or computer via the Remote Communications Interface To use the tester effectively you should have a solid background of digital electronics and basic microprocessor architecture QuickTrace is a Trademark of John Fluke Mfg Co Inc Everett Washington 1 1 OPERATING PRECONDITIONS OPERATING PRECONDITIONS The tester can be used only under the following circumstances The tester forces the DMA control line s on the bus For proper operation these control lines must not be tied directly to the power supply Vcc or ground The DMA control line s cannot be bussed together or bussed to any other control line s If this situation exits refer to the introduction of Section 3 for possible remedies Powermust be supplied to the microprocessor in the UUT Ifthe tester is powered by the optional external power supply the UUT microprocessor must still be powered This is done to prevent the tester from supplying power to the UUT Each tester model is microprocessor specific that 15 it can be used on only one type of microprocessor FLUKE 90 UUT FLOATING GROUND H
90. n the display PROBE CONTROL PROBE cece The name of the last control line probed is represented by cccc To select the desired line press the ENTER key or the button on the Probe to increment or press the LOOP key to decrement to the next control line number Make contact between the Probe and the control line Whenthe correct signal is probed the green light goes on and the red light goes out The following message appears on the display PROBE CONTROL moon FOUND If you are sure that the proper signal has been probed and the red Probe light remains on the signal is either shorted or stuck high To select the next signal to be probed press the button on the Probe or press the ENTER key To scroll back to a previous signal press the LOOP key until the prompt for the desired control signal number is displayed To stop the test at any time press the CLEAR or RESET key 3 33 3 34 Section 4 Remote Operations INTRODUCTION The tester can be operated as a stand alone unit in local mode or in conjunction with a host or terminal in remote mode In the local mode all commands are issued from the keypad of the tester in the remote mode all commands are transmitted over an RS 232 C communications interface Local Remote and Remote Commands All tests and functions executed in the local mode are also executable in the remote mode Additional functions can be executed only over the RS 232 C interface S
91. nformation about UUT address and data lines A Frame Point command causes the tester to display the status of UUT address and data lines at a specific event The programmed operation of the UUT microprocessor is not suspended when the event is detected The External Trigger command causes the tester to generate a SYNC Trigger pulse at a specific event The command does not suspend the programmed operation of the UUT microprocessor when that specific event is detected Table 4 5 Remote Function Capabilities OUTPUTS CAPTURES ADDRESS SYNC TRIGGER FUNCTION HALTS UUT AND DATA VALUES PULSE ON MATCH Break Point Frame Point External Trigger CPU FUNCTION QUALIFIERS The event that triggers a Break point Frame point or External Trigger command is selected from a list of qualifiers The qualifiers fall into two categories the CPU Function qualifiers and General Function qualifiers NOTE When Break Point Frame Point External Trigger are enabled a SYNC Trigger pulse is generated only when the selected event is detected Command Syntax The command line syntax for Break Point Frame Point and External Trigger is summarized in Table 4 6 CPU Function Qualifiers Required The commands forthe CPU Function qualifiers are listed in Table 4 7 These qualifiers control the activation of a Break Point Frame Point or External Trigger command to the indicated CPU event One CPU Function qualifier is always required
92. nic Equipment Marketing Co For Fluke products P O Box 3750 Riyadh 11481 Saudi Arabia Tet 928 1 477 1650 TLX 401120 Singapore Republic of Rank O Connor s PTE Ltd For Fluke products O Connor House 98 Pasir Panjang Road Singapore 0511 Republic of Singapore Tel 65 4737944 TLX 786 RS21023 Philips Project Development S Pte Ltd For Philips products Lorong 1 Toa Payoh Singapore 1231 P O Box 340 Toa Payoh Central Post Office Singapore 9131 Tel 65 3502000 TLX Philips RS 21375 South Africa Protea PNI For Fluke products P O Box 39127 Bramley 2018 Republic of South Africa Tel 27 11 786 3647 TLX 960 4 24409 SA FAX 27 11 887 1479 South African Philips Pty Ltd For Philips products P O B 7703 2 Herb Street New Doornfontein Johannesburg 2000 Tel 011 6179111 South Korea Philips Industries Korea Ltd For Philips products CP O Box 3680 Philips House 260 199 Itaewon Dong Yongsan Ku Seoul Tel 82 2 794 5011 5 TLX Philkor K 27291 Spain ESSA For Fluke products Equipos y Sistemas S A C Apolonio Morales 13 B Madrid 16 Spain Tel 34 1 458 0150 TLX 831 42856 FAX 34 1 458 0150 Philips Iberica S A E Dpto For Philips products Aparatos de Medida Martinez Villergas 2 Madrid 28027 Tel 404 2200 Sri Lanka Computerlink Data Systems Ltd For Fluke products 331 Union Place Colombo 2 Sri Lanka Tel 94
93. on the command line and only one CPU function may be active at a time If you select a new CPU function is while another is active the old function is disabled MEMORY READ CPU QUALIFIER The memory read CPU function qualifier causes the tester to execute the selected function Break Point Frame Point or External Trigger when data is read from memory If no general qualifiers are specified all memory read operations cause the selected function to execute MEMORY WRITE CPU QUALIFIER The memory write CPU function qualifier causes the tester to execute the selected function Break Point Frame Point or External Trigger when data is written to memory If no general qualifiers are specified all memory write operations cause the selected function to execute READ CPU QUALIFIER The I O read CPU function qualifier causes the tester to execute the selected function Break Point Frame Point or External Trigger when data is read from an I O address If no general qualifiers are specified all I O read operations cause the selected function to execute WRITE CPU QUALIFIER The I O write CPU function qualifier causes the tester to execute the selected function Break Point Frame Point or External Trigger when data is written to an I O address If no general qualifiers are specified all I O write operations cause the selected function to execute OPCODE FETCH CPU QUALIFIER The opcode fetch CPU function qualifier causes t
94. r the specific test heading in the remainder of Section 3 1 With a voltmeter make sure that the power to the UUT microprocessor does not exceed 6 2V dc Supply voltage above 6 2V dc may damage the tester 2 Turn off power to the UUT Connect the microprocessor clip to the microprocessor on the UUT See Figure 3 1 CAUTION Be sure to align pin 1 of the microprocessor clip marked by a white circle to pin 1 of the microprocessor of the UUT POWER UP SEQUENCE 3 3 2 WHITE WIRE ON CABLE Figure 3 1 Correct Alignment for Microprocessor Clip Turn the power to the UUT back on The following message flashes on the display FLEE 58 Geif Test aan A series of Self Tests transparent to the user are run If the self test routine is completed successfully the following prompt is displayed and output through the Remote Interface The prompt without MM VERS 2 10 is displayed whenever the tester is not running a test and is ready to accept a command from the keyboard If a failure is detected the tester halts and the following message is displayed and output through the Remote Interface The message Error nnn corresponds to an error code whose description can be found in Table 3 1 Information represented by x x is a brief description of the error Select a test category by pressing the BUS TEST MEM TEST I O TEST or the PROBE key POWER UP SEQUENCE Table 3 1 Error Codes
95. rb Street New Doornfontein Johannesburg 2000 Tel 786 3647 Spain Equipos Y Sistemas S A ESSA For Fluke products C Apolanio Morales 13B Madrid 16 Spain Tel 4580150 Philips Iberica S A E For Philips products Dpto Aparatos de Medida Marinez Villergas Z Madrid 28027 Tel 404 2200 Sweden Svenska A B Philips Div Industrielektroik Matinstrument 11584 Stockholm Tel 782 1800 Switzerland Traco Electronic AG For Philips products Jenatschstrasse 1 8002 Zurich Switzerland Tel 2010711 Philips AG For Philips products S amp Equipment Allmendstasse 140 Postfach 670 CH 8027 Zurich Switzerland Tel 488221 Syria Philips Moyen Orient S A For Philips products Rue Fardoss 79 B P 2442 Damascus Tel 221650 Taiwan Schmidt Electronics Corp For Fluke products 5th Floor Cathay Min Sheng Commercial Building 344 Min Sheng East Road Taipei Taiwan R O C Tel 5013468 Yung Kang Trading Co Ltd For Philips products 11th Floor CTS Building 102 Kuang Fu South Road P OBox 1467 Taipei Tel 752 7 421 Tanzania Philips Tanzania Ltd For Philips products P O Box 20104 Dar es Salaam Tel 29571 Thailand Measuretronix Ltd For Fluke products 2102 63 Ramkamhaeng Rd Bangkok 10240 Thailand Tel 3742516 Philips Electrical Company of Thailand Ltd For Philips products Electronic and Communication Systems Dept 283 Silom Road P O Box 961 B
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97. rtford Glen Lochen East 41 C New London Turnpike Glastonbury CT 06033 203 659 3541 Florida Clearwater 813 799 0087 Miami 305 462 1380 Orlando 940 N Fern Creek Ave Orlando FL 32803 805 896 4881 Tampa 813 251 9211 Georgia Atlanta 2700 Delk Road Suite 150 Marietta GA 30067 404 953 4747 Illinois Chicago 1150 W Euclid Avenue Palatine IL 60067 312 705 0500 Indiana Indianapolis 8777 Purdue Road Suite 101 indianapolis IN 46268 817 875 7870 Louisiana New Orleans 504 455 0814 Massachusetts Boston Middlesex Technology Center 900 Middlesex Turnpike Building 8 Billerica MA 01821 617 663 2400 Maryland Baltimore 801 792 7060 Rockville 5640 Fishers Lane Rockville MD 20852 301 770 1570 Michigan Detroit 33031 Schoolcraft Livonia MI 48150 813 522 9140 Minnesota Bloomington 1801 E 79th St Suite 9 Bloomington MN 55420 612 854 5526 Missouri St Louis 11756 Borman Drive Suite 160 St Louis MO 63146 814 993 3805 North Carolina Greensboro 1310 Beaman Place Greensboro NC 27408 919 273 1918 New Jersey Paramus P O Box 930 Paramus NJ 07653 0930 West 75 Century Road Paramus NJ 07652 201 262 9550 New Mexico Albuquerque 505 881 3550 New York Rochester 4515 Culver Road Rochester NY 14622 716 323 1400 Ohio Cleveland Plaza South Three Suite 402 7271 Engle Road Middlebu
98. rting address in hexadecimal Press the ENTER key The displays shows the following prompt MEMORY VERIFY 1 Data cuu The last data entered is represented by yy Enter new data and press the ENTER key to execute the test When the test cycle is complete the following message appears on the display The address and the data read is represented by xxxx and respectively If the read and write do not match the following message appears on the display MEMORY FAI hb The data written and the data read is represented by and bb respectively If you press the ENTER key after the firsttest cycle the addressisincremented by 1 and the display shows a prompt for new data Enter new data or simply pressthe ENTER key to repeat the test with previously entered data If after the first test cycle you press the LOOP key the test is repeated in a continuous loop at the same address until you press the CLEAR or RESET key If a fault occurs during the LOOP mode the activity indicator stops flashing and the message that appears on the display is the same as in Step 4 MEMORY WRIT Memory Write TYPICAL USES Memory Write is used to write data to a specific UUT memory location NOTE It is recommended that you first execute Test Bus Ramp Test or QuickTrace to make sure that the UUT bus is operational before executing Memory Write When Memory Write is used in the L
99. s O Some semiconductors and custom IC s can be damaged by electrostatic discharge during handling This notice explains how you can minimize the chances of destroying such devices 1 Knowing that there is a problem 2 Learning the guidelines for handling them 3 Using the procedures and packaging and bench techniques that are recommended D E The Static Sensitive S S devices identifiedin the Fluke technical manual parts list with the symbol The following practices should be followed to minimize damage to S S devices 3 DISCHARGE PERSONAL STATIC BEFORE HANDLING DEVICES USE A HIGH RESIS 1 MINIMIZE HANDLING TANCE GROUNDING WRIST STRAP B 2 KEEP PARTS IN ORIGINAL CONTAINERS UNTIL READY FOR USE 4 HANDLE S S DEVICES BY THE BODY Page 1 of 2 5 USE STATIC SHIELDING CONTAINERS FOR HANDLING AND TRANSPORT 6 DO NOT SLIDE S S DEVICES OVER ANY SURFACE KI 7 AVOID PLASTIC VINYL AND STYROFOAM IN WORK AREA PORTIONS REPRINTED WITH PERMISSION FROM TEKTRONIX INC AND GENERAL DYNAMICS POMONA DIV Dow Chemical Page 2 of 2 11 WHEN REMOVING PLUG IN ASSEMBLIES HANDLE ONLY BY NON CONDUCTIVE EDGES AND NEVER TOUCH OPEN EDGE CONNECTOR EXCEPT AT STATIC FREE WORK STATION PLACING SHORTING STRIPS ON EDGE CONNECTOR HELPS TO PROTECT INSTALLED SS DEVICES HANDLE S S DEVICES ONLY AT A STATIC FREE WORK STATION ONLY ANTI STATIC TYPE SOLDER SUCKE
100. s Tests can be executed Test Bus e Ramp Test e Shift Test Test Bus TYPICAL USES The primary use of Test Bus is to check for shorts and incorrect connections between UUT components The test also checks the functionality of the microprocessor kernel HOW TEST BUS IS PERFORMED Test Bus determines the integrity and drivability of address data and selected control lines directly attached to the microprocessor inside any latches buffers drivers decoders The Fluke 90 forces the bus lines one at a time to specific states It then senses the state of all the bus lines detecting whether the line has achieved the desired state and whether other address data or control lines are shorted to the signal line being forced TROUBLESHOOTING HINTS The UUT is held in a DMA state during the test stopping the operation of the UUT Test Bus does not detect address data or control lines that are open or not connected Bus lines outside of any drivers buffers latches or decoders not checked See Ramp Test or any of the Probe functions for more information Control lines checked by QuickTrace are the only control lines tested See decal on the bottom of the instrument for the control lines tested TEST BUS 3 7 RAMP TEST 3 8 EXECUTING TEST BUS 1 Press the BUS TEST key to enter the Bus Test menu The display shows the name of the last Bus Test performed Press the BUS TEST key repeatedly
101. three I O tests is selected Three UO tests and the RS 232 C port configuration function are available on the I O TEST key The I O tests are Examine e I O Verify e I O Write 3 22 1 0 EXAMINE Examine TYPICAL USES I O Examine is used to examine the contents of a specified UUT I O address NOTE It is recommended that you first execute Test Bus before executing I O Examine as a normal troubleshooting procedure When I O Examine is used in the LOOP Mode the Probe can be used to check that only the proper UO address is accessed HOW I O EXAMINE IS PERFORMED An I O address value is entered through the user keypad The tester accesses that address in the UUT I O address space and displays its contents TROUBLESHOOTING HINTS ReadingI O addresses can cause state changes in the I Ocircuits Check the UUT design information first for warnings directed at this situation before performing this test EXECUTING I O EXAMINE 1 Press the I O TEST key toenter the 1 Test menu The display shows the name of the last I O Test performed Press the I O TEST key repeatedly to scroll through the possible I O Tests until I O EXAMINE appears on the display Press the ENTER key The display shows the following message 1 0 EXAMINE ex Fort The last address entered is represented by xx Use the numeric keys to enter the address in hexadecimal Press the ENTER key The following m
102. to scroll through the possible Bus Tests until TEST BUS appears on the display 2 Press the ENTER key to start the Test Bus test While the test is running TEST BUS is displayed and the activity indicator flashes on the screen If the test does not detect a fault the following message is displayed TEST EUS FAIL zianalname leua In the second line of the message signalname is the name of the faulty signal and level is either HI or LO If the LOOP key is pressed the tester continues to test the failed line until the CLEAR key is pressed or the failure is removed Press the ENTER key to display any additional failure messages 3 Afteronetest cycle has been run you can run the test again by pressingthe ENTER key Press LOOP to cause the test to be run in a continuous loop 4 To stop a test cycle at any time press the CLEAR or RESET key Ramp Test TYPICAL USES The Ramp Test determines faulty address decoder and buffer outputs connected to the UUT bus The test also determines if the UUT address and or data lines shorted connected improperly A memory write cycle is performed to all UUT memory space addresses during the Ramp Test which should enable all UUT address decoders The output of the address decoders can be monitored using the Probe Any lack of activity during the test may be an indication of a faulty component HOW RAMP TEST IS PERFORMED The Ramp Test outputs
103. two formats INTEL HEX or Motorola HEX Motorola format is used when the M appears in the command line The INTEL format is used when M does not appear in the command line Down Load Command The Down Load command fills memory locations with data through the remote interface The data is transferred in INTEL HEX no M or Motorola HEX M included format The command line syntax is as follows DN format CR data line CR data line CR last data line CR Both formats contain internal beginning and ending address information so there is no need to enter address information with this command Reset UUT Command The Reset UUT command resets the UUT microprocessor and associated circuitry The command does not reset the tester In response to this command the tester forces the UUT RESET line active and then releases it The command line syntax is as follows RH LKCR If the optional L flag is included on the command line the tester forces a UUT reset over and over again in a continuous loop There is 1 second delay between each cycle of this loop INTEL is a registered trade mark ofthe INTEL Corporation Motorola is a registered trade mark of the Motorola Corporation REMOTE EXECUTION OF LOCAL REMOTE COMMANDS Transmit Message Commands The Transmit Message commands are used to display messages on the tester display The commands can be used to display prompts and other data on the tester display
104. w from the UUT to the tester The type of plug used creates a momentary short circuit across the power supply when it is inserted in the tester back panel socket Therefore it is imperative that the plug is plugged into the socket before the power supply is connected to the power outlet 2 7 SYNC TRIGGER INTERFACE 2 8 SYNC TRIGGER INTERFACE The SYNC Trigger Interface is located on the rear panel of the tester The interface consists of two metal posts where an oscilloscope probe and ground can be clipped Refer to Figure 2 2 for location When the tester is executing a Memory or I O test the SYNC Trigger Interface outputs a pulse when the UUT generates a DMA acknowledge signal in response to the tester forcing a DMA request to the UUT If the tester is not executing a test the tester outputs a pulse synchronized to the rising edge of the data valid state on the UUT bus for all UUT read write cycles The SYNC Trigger Interface can also output a pulse when the tester detects a predefined event or condition on the UUT For more information refer to Break Point Frame Point or External Trigger in Section 4 The pulse can be used to trigger an oscilloscope or similar equipment CAUTION Be sure that you clip the oscillosco pe and ground leads to the correct posts as labeled on the tester An incorrect connection prevents generation of the SYNC Trigger pulse A Message From John Fluke Mfg Co Inc static awarenes
105. y shows the name of the last Bus Test performed Press the BUS TEST key repeatedly to scroll through the possible Bus Tests until SHIFT TEST appears on the display Press the ENTER key to start the Shift Test While the test is running the activity indicator flashes on the screen At the end of one test cycle the following message is displayed ST COMPLETED TEST MEMORY Figure 3 4 Shift Test Waveform After one test cycle has been run youcan run the test again by pressingthe ENTER key Press LOOP to cause the test to be run in a continuous loop so that an oscilloscope or the Probe may be used to detect shorts or opens in the UUT address data hus To stop a test cycle at any time press the CLEAR or RESET key 3 11 TEST MEMORY MEMORY TESTS NOTE The UUT bus and kernel must be operational Run the Bus Tests first before Memory Tests Introduction Memory Tests detectfaults in memory and memory related elements of the UUT The tester forces memory read and write cycles on the UUT bus Six Memory Tests can be executed Test Memory Checksum Test Memory Examine Memory Verify Memory Write Memory Soak These tests except for Memory Soak do not disturb the normal operation of the UUT However the Test Memory and Checksum Test tests require a large amount of bus time and may slow normal UUT operations Some UUTs have timer circuits that reset the UUT microprocessor if it is
106. ypad shown in Figure 2 3 consists of 24 keys arranged in a four high by six wide matrix The keys are used to select execute and stop tests and also enter addresses and data Test Keys Four test keys BUS TEST MEM ory TEST I O TEST AND PROBE are located along the left side of the keypad Each key corresponds to a test category Refer to Section 3 for a more detailed explanation of each key menu of tests 15 associated with each test key To access the menu press a test key The last test performed is displayed Press the test key repeatedly to scroll through available tests until the name of the test you desire is displayed Refer to Table 2 1 for the tests available on each test key Control Keys Four control keys RESET LOOP CLEAR and ENTER are located along the right edge of the keypad These keys are used with the test keys and numeric keys discussed below to control the various operations of the the tester A general description of each control key is provided below For additional information pertaining to the operation of a key in a particular test refer to the discussion of that test in Section 3 2 2 FEATURES AND FUNCTIONS ES LLJ K E 90 uP BOARD TESTER BUS C s Je Je J r Jl MEM mJ Je Ji Je 1 0 ele Je Je Je Je TEST SELECTION NUMERIC CONTROL KEYS KEYS KEYS Figure 2 3 Keypad RESET Key Press the RESET key to reset the operation of both the UUT and the tester The RESET key
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Fluke 90 Series - uP Board Tester

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