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Keysight N5392B/C Ethernet Compliance Application Programmer`s

1. Keysight Nb392B C Ethernet Compliance Application Programmer s Reference 2 Configuration Variables and Values Table2 Configuration Variables and Values continued GUI Label Variable Description Location Confgure Waveforms N100BTMaskTestAcqs Accepts Determines the number of user defined text waveforms acquired and analyzed 1 0 10 0 20 0 for the 100 Base TX AOI 30 0 40 0 50 0 Template Test 60 0 70 0 80 0 90 0 100 0 200 0 400 0 500 0 1000 0 5000 0 10000 0 Confgure Avgs N1000BTDroopTestAvgs Accepts Determines the number of user defined text averages used for 1000 Base T 0 0 8 0 16 0 32 0 Droop Tests 64 0 128 0 256 0 512 0 1024 0 2048 0 4096 0 Confgure Avgs N1000BTMaskTestAvgs Accepts Determines the number of user defined text averages used for all 1000 0 0 8 0 16 0 32 0 Base T template tests 64 0 128 0 256 0 512 0 1024 0 2048 0 4096 0 Confgure Avgs N1000BTPeakVoltAvgs Accepts Determines the number of user defined text averages used for all 1000 0 0 8 0 16 0 32 0 Base T Peak Voltage 64 0 128 0 256 0 measurements 512 0 1024 0 2048 0 4096 0 Confgure Avgs N1000BTTM4Avgs Accepts Determines the number of user defined text averages used for all TM4 1 0 50 0 100 0 Distortion test This also 150 0 200 0 250 0 represent the number of cycle used for TM4 measurements Confgure Avgs N100BTOvershootA
2. 100 Base TX Duty Cycle 29 The deviations of the 50 crossing times from a best fit Distortion to a time grid of 16 ns spacing shall not exceed 0 25 ns The peak to peak Duty Cycle Distortion shall not exceed 0 5ns 100 Base TX Receiver Return 886 The Return Loss obtained must conform to the Loss requirements specified in ANSI X3 263 1995 Section 9 2 2 100 Base TX Transmit Jitter 31 Total Transmit jitter including contributions from duty cycle distortion and Baseline Wander shall not exceed 1 4 ns peak to peak 100 Base TX Transmitter 885 The Return Loss obtained must conform to the Return Loss requirements specified in ANSI X3 263 1995 Section 9 1 5 100 Base TX UTP Vout 13 Vout is defined as the straight line best fit for Differential Output Voltage amplitude Here Vout is measured over a 96ns pulse 100 Base TX UTP Vout 14 Vout is defined as the straight line best fit for Differential Output Voltage amplitude Here Vout is measured over a 96ns pulse 100 Base TX UTP AOI 28 The template is first centered vertically on the eye Template pattern baseline It should be translated horizontally and scaled in amplitude for the best fit to the eye pattern For UTP the scaling factor must be between 0 95 and 1 05 100 Base TX UTP Signal 15 The ratio of the Vout magnitude to Vout magnitude Amplitude Symmetry shall be between the limits of 0 98 and 1 02 1000 Base T Difference A B 102 The absolute value of the peak of the wa
3. 100 0 200 0 400 0 500 0 1000 0 5000 0 10000 0 Confgure TP_IDL Waveforms NTOBTMaskTestlDLAcqs Accepts Determines the number of user defined text waveforms acquired and analyzed 1 0 10 0 15 0 for the 10 Base T TP_IDL 20 0 30 0 40 0 Template Test 50 0 60 0 70 0 80 0 90 0 100 0 200 0 400 0 500 0 1000 0 5000 0 10000 0 Confgure TP_IDLWaveforms NTOBTeMaskTestlDLAcqs Accepts Determines the number of user defined text waveforms acquired and analyzed 1 0 10 0 15 0 for the 10 Base Te TP_IDL 20 0 30 0 40 0 Template Test 50 0 60 0 70 0 80 0 90 0 100 0 200 0 400 0 500 0 1000 0 5000 0 10000 0 Confgure Bandwidth ScopeBandwidth 0 1e 9 2e 9 Applies to certain tests if noise Reduction 3e 9 4e 9 5e 9 reduction feature is available 9 Auto means no noise reduction Confgure Clock Data Edges GBEDataEdges Rising Falling Both Determines which Clock and Data edges are used to measure Jitter Confgure Common Mode CommonModeChan CHANT CHAN2 The oscilloscope channel used to BNC CHANS CHAN4 measure common mode voltage of the DUT with a BNC cable connected to fixture 4 Confgure DCD Pattern ExpectedDCDRandom 1 0 0 0 Determines the pattern to use when testing 100 Base TX Duty Cycle Distortion DCD 16 Keysight 5392 Ethernet Compliance Application Programmer s Reference Table2 Configuration Variables and Values continued Location Label VETEL
4. Accepts Determines the number of user defined text averages used for the 10 Base T 0 0 8 0 16 0 32 0 Link Test Pulse and TP_IDL 64 0 128 0 256 0 Template Tests Note that you 512 0 1024 0 may need many averages to 2048 0 4096 0 reduce measurement noise These templates are extremely tight Confgure LTP IDL Avgs N10BTeMaskTestAvgs Accepts Determines the number of user defined text averages used for the 10 Base Te 0 0 8 0 16 0 32 0 Link Test Pulse and TP_IDL 64 0 128 0 256 0 Template Tests Note that you 512 0 1024 0 may need many averages to 2048 0 4096 0 reduce measurement noise These templates are extremely tight Confgure LTP MAU N10BTMaskTestAcqs Accepts Determines the number of Waveforms user defined text waveforms acquired and analyzed 1 0 10 0 20 0 for the 10 Base T Link Test Pulse 30 0 40 0 50 0 and MAU Template Tests 60 0 70 0 80 0 90 0 100 0 200 0 400 0 500 0 1000 0 5000 0 10000 0 Keysight Nb392B C Ethernet Compliance Application Programmer s Reference 2 Configuration Variables and Values Table2 Configuration Variables and Values continued GUI Label Variable Description Location Confgure LTP MAU N10BTeMaskTestAcqs Accepts Determines the number of Waveforms user defined text waveforms acquired and analyzed 1 0 10 0 20 0 for the 10 Base Te Link Test 30 0 40 0 50 0 Pulse and MAU Template Tests 60 0 70 0 80 0 90 0
5. Trigger Level user defined text the Point Template w 0 03 10E 03 Disturbing Signal 15E 03 20E 03 25E 03 30E 03 35E 03 40E 03 45E 03 50E 03 55 03 60E 03 65E 03 70E 03 75E 03 80E 03 Confgure Point H Glitch PointHGlitchTrigLevel 135E 03 140E 03 Determines the trigger level for Trigger Level 145E 03 150E 03 the Point H Template w 155E 03 160E 03 Disturbing Signal 165E 03 Confgure Point H Trigger PointHTrigMethod Event Glith Determines the Trigger Method Method used for Point H Template w Disturbing Signal Confgure PointA PointB N1000BTPeakVscale auto 200E 3 Determines the vertical scale Vertical Scale 400E 3 which used for 1000 Base T Peak Voltage measurements for Point Aand Point B Confgure Preferred Sample JitterPreferredSRate Accepts This sets the preferred sample Rate Sa s user defined text rate for 1000 Base T jitter 9E 37 40 0E 9 measurements This applies to all 20 0 9 10 0E 9 1000 Base T jitter 5 0E 9 4 0E 9 measurements Note that you 2 0E 9 may not be able to achieve this sample rate depending on the configuration Increasing the sample rate will improve measurement resolution but will significantly increase the runtime of the test 22 Keysight N5392B C Ethernet Compliance Application Programmer s Reference Table2 Configuration Variables and Values continued Configuration Variables and Values 2 GUI Label Variable
6. 1 05 1 04 1 03 Determines the minimum scale Scaling 1 02 1 01 1 00 used for the UTP AOI Mask The 0 99 0 98 0 97 mask alignment routines will not 0 96 0 95 scale the mask below the value that you specify here Confgure X axisstepsizefor XStepFine 10E 12 5E 12 This is mainly for mask alignment mask alignment where user can choose the x axis step size for a finer alignment Run Tests Event RunEvent None Fail Margin Names of events that can be used lt Pass with the StoreMode Event RunUntil RunEventAction options Run Tests lt RunEvent Margin lt Any integer in Specify N using the Minimum N Minimum N MinPercent range 0 value required margin control required margin 96 lt 100 Set Up AccessTxtclk AccessTxtclk 0 0 1 0 AccessTxtclk Set Up DisturbingSignal DisturbingSignal 0 0 1 0 DisturbingSignal On Off selection 24 Keysight 5392 Ethernet Compliance Application Programmer s Reference Configuration Variables and Values 2 Table2 Configuration Variables and Values continued GUI Label Variable Description Location Set Up ReturnLossTest ReturnLossTest Use Vector ReturnLossTest method Network Analyzer Use Data File Set Up Tests1 000BT Tests1000BT 0 0 1 0 Tests1000BT Set Up Tests1000BT Tests1000BT 0 0 1 0 Tests1000BT Set Up Tests100BT Tests100BT 0 0 1 0 Tests100BT Set Up Tests100BT EEE Tests100BT 0 0 1 0
7. 50 55 forthe 10 Base T harmonic 60 content Tests Confgure Content NTOBTeHCPeakThreshold 20 25 30 35 Determines peak threshold level Peak Threshold 40 45 50 55 the 10 Base Te harmonic 60 content Tests Confgure High Pass Filter HPFwo Default UDF Determines the mask alignment w o Disturbing method for template test Confgure Jitter DUT Data JitterDataChan CHAN1 CHAN2 The oscilloscope channel used to Keysight Nb392B C Ethernet Compliance Application Programmer s Reference 2 Configuration Variables and Values Table2 Configuration Variables and Values continued c0 Location Confgure Label Jitter Measurement JitterMeas10BT ALL EIGHT BT EIGHT POINT5 BT Description Determines the Jitter Measurements to perform for 10 Base T jitter tests ALL tests jitter at both 8 0BT and 8 5BT as described in the specification 18 0 and 8 5BT test jitter individually at either 8 0 or 8 5BT respectively Confgure Confgure Jitter Measurement Jitter Measurement Point JitterMeas10BTe N10BTeJittPoint ALL EIGHT_BT EIGHT_POINT5_BT Mid Cross Determines the Jitter Measurements to perform for 10 Base Te jitter tests tests jitter at both 8 0BT and 8 5BT as described in the specification 18 0 and 8 5BT test jitter individually at either 8 0 or 8 5BT respectively Determines the Jitter Measurement Point Confgur
8. T EEE Quiet Time 1101 The quiet time of the PHY is determined by the lpi_tx_tq_timer The timer should have a duration of 20 22ms 100 Base T EEE Refresh Time 1102 For a 100 Base T EEE capable PHY the refresh time should be between 200 220us 100 Base T EEE Sleep Time 1103 The sleep time of the PHY is determined by the tx ts timer The timer should have a duration of 200 220us 100 Base T EEE Transmit Wake Time 1104 Measures the wake time of the PHY 100 Base T EEE Transmitter Timing Jitter 1106 The jitter for an EEE capable PHY in LPI is measured using scrambled SLEEP code groups transmitted during the TX_SLEEP state The jitter contributed during the TX QUIET state and the first bus of the TX SLEEP state are ignored The total peak to peak jitter measured shall be less than 1 4ns 100 Base TX Vout Overshoot 24 We define overshoot as the percentage difference between the peak voltage of the waveform and the final adjusted value VOut The peak voltage is measured between the 5096 transition crossing time from 0 to VOut and a point in time 8ns afterward Overshoot 0s computed as Vpeak VOut VOut 100 percent 100 Base TX Vout Overshoot 26 We define overshoot as the percentage difference between the peak voltage of the waveform and the final adjusted value VOut The peak voltage is measured between the 5096 transition crossing time from 0 t
9. defined in Figure 40 19 after normalization shall lie within the time domain template 1 defined in Figure 40 26 and the piecewise linear interpolation between the points in Table 40 10 The waveform around point A is normalized by dividing by the peak value of the waveform at A 1000 Base T Point A Template 5 Fit The Template The voltage waveforms around Test w o Disturbing Signal points A B C D defined in Figure 40 19 after normalization shall lie within the time domain template 1 defined in Figure 40 26 and the piecewise linear interpolation between the points in Table 40 10 The waveform around point A is normalized by dividing by the peak value of the waveform at A 1000 Base T Point B Peak 101 The magnitude of the voltage at Point B shall fall Output Voltage w Disturbing within the range of 0 67 V to 0 82V 0 75V 0 83dB Signal 1000 Base T Point B Peak 1 The magnitude of the voltage at Point B shall fall Output Voltage w o Disturbing Signal within the range of 0 67 V to 0 82V 0 75V 0 83dB Keysight 5392 Ethernet Compliance Application Programmer s Reference Table 4 Test IDs and Names continued 1000 Base T Point B Template Test w Disturbing Signal TestID 106 Test Names and IDs Description Fit The Template The voltage waveforms around points A B C D defined in Figure 40 19 after normalization shall lie within the time domain template 1 defined in Fi
10. the points in Table 40 10 The waveform around point C is normalized by dividing by the 1 2 the peak value of the waveform at A 1000 Base T Point C Template Test w o Disturbing Signal Fit The Template The voltage waveforms around points A B C D defined in Figure 40 19 after normalization shall lie within the time domain template 1 defined in Figure 40 26 and the piecewise linear interpolation between the points in Table 40 10 The waveform around point C is normalized by dividing by the 1 2 the peak value of the waveform at A 1000 Base T Point D Peak Output Voltage w Disturbing Signal 104 The absolute value of the peak of the waveform at point D shall differ by less than 2 0 000000rom 0 5 times the average of the absolute values of the peaks of the waveform at points A and B Keysight Nb392B C Ethernet Compliance Application Programmer s Reference 37 3 Test Names and IDs Table4 Test IDs and Names continued Name TestlD Description 1000 Base T Point D Peak 4 The absolute value of the peak of the waveform at Output Voltage w o Disturbing point D shall differ by less than 2 0 000000rom 0 5 Signal times the average of the absolute values of the peaks of the waveform at points A and B 1000 Base T Point D Template 108 Fit The Template The voltage waveforms around Test w Disturbing Signal points A B C D defined in Figure 40 19 after normalization shall lie within th
11. 0 Base T SLAVE mode jitter measurements Confgure Link Test Pulse LTPHoldoff 100E 09 200E 09 Determines the trigger holdoff for Trigger Holdoff 300E 09 400E 09 the Link Test Pulse tests 500 09 1E 06 2E 06 30E 06 4E 06 5E 06 Confgure Link Test Pulse N10BTeLTPHoldoff 100E 09 200E 09 Determines the trigger holdoff for Trigger Holdoff 300E 09 400E 09 the Link Test Pulse tests 500 09 1E 06 2E 06 30E 06 4E 06 5E 06 Confgure Link Test Pulse LTPTrigLevel 100E 03 200E 03 Determines the trigger level for Trigger Level 300E 03 400E 03 the Link Test Pulse tests 500E 03 600E 03 700E 03 800E 03 900E 03 1 0 1 1 1 2 Confgure Link Test Pulse N10BTeLTPTrigLevel 100E 03 200E 03 Determines the trigger level for Trigger Level 300 03 400E 03 the Link Test Pulse tests 500E 03 600E 03 700E 03 800E 03 900E 03 1 0 1 1 1 2 Confgure MAU Max Scaling MAUMaxScaling 1 1 1 09 1 08 Determines the maximum scale 1 07 1 06 1 05 used for the MAU Mask The 1 04 1 03 1 02 mask alignment routines will not 1 01 1 0 0 99 scale the mask above the value 0 98 0 97 0 96 that you specify here NOTE The 0 95 0 94 0 93 standard does not allow scaling 0 92 0 91 by more than 1 1 Confgure MAU Max Scaling N10BTeMAUMaxScaling 1 1 1 09 1 08 Determines the maximum scale 1 07 1 06 1 05 used for the MAU Mask The 1 04 1 03 1 02 mask alignment routines will not 1 01 1 0 0 99 scale the mas
12. 08 Subclause 14 3 1 3 4 and Annex 4 3 5 10 Base T IDL Template 809 The TP IDL shall always start with a positive waveform with TPM last bit CDO when a waveform conforming to Figure 7 12 is applied to the DO circuit After the zero crossing of the last transition the differential voltage shall remain within the shaded area of Figure 14 10 10 Base T TP IDL Template 811 The TP IDL shall always start with a positive waveform with TPM last bit CD1 when a waveform conforming to Figure 7 12 is applied to the DO circuit After the zero crossing of the last transition the differential voltage shall remain within the shaded area of Figure 14 10 10 Base T TP IDL Template 814 The TP IDL shall always start with a positive waveform without TPM last bit CDO when a waveform conforming to Figure 7 12 is applied to the DO circuit After the zero crossing of the last transition the differential voltage shall remain within the shaded area of Figure 14 10 10 Base T TP IDL Template 816 The TP IDL shall always start with a positive waveform without TPM last bit CD1 when a waveform conforming to Figure 7 12 is applied to the DO circuit After the zero crossing of the last transition the differential voltage shall remain within the shaded area of Figure 14 10 10 Base T Transmitter Return 802 The Return Loss obtained must conform to the Loss requirements specified in IEEE802 3 2008 Subclause 14 3 1 2 2 and Annex B 4 3 2 10 Base T
13. 3 of this document and are also available directly from the application s user interface when the remote interface is enabled View gt Preferences Remote tab Show remote interface hints See the toolkit for more information 8 Keysight N5392B C Ethernet Compliance Application Programmer s Reference Introduction to Programming 1 Licensing To enable programming of compliance applications on your oscilloscope please visit www keysight com find scope apps to purchase 5452 remote programming option license Keysight 5392 Ethernet Compliance Application Programmer s Reference 9 1 Introduction to Programming 10 Keysight 5392 Ethernet Compliance Application Programmer s Reference Keysight N5392B C Ethernet Compliance Application Programmer s Reference 2 Configuration Variables and Values The following table contains a description of each of the 5392 Ethernet Compliance Application options that you may query or set remotely using the appropriate remote interface method The columns contain this information GUI Location Describes which graphical user interface tab contains the control used to change the value Label Describes which graphical user interface control is used to change the value Variable The name to use with the SetConfig method Values The values to use with the SetConfig method Description The purpose or function of the variable For example if the grap
14. 56 0 512 0 1024 0 2048 0 4096 0 Confgure Harmonic N10BTeHarmonicAvgs Accepts Determines the number of user defined text averages used for the 10 Base Te 0 0 8 0 16 0 32 0 Harmonic Ones measurement 64 0 128 0 256 0 512 0 1024 0 2048 0 4096 0 Confgure HarmonicsReport NTOBTeNoHarmonicReportH Accepts Determines the number of in table armonics user defined text harmonics that will report in table 10 0 15 0 20 0 for the 10 Base Te Harmonic 25 0 30 0 35 0 Ones measurement 40 0 45 0 50 0 Confgure HarmonicsReport NoHarmonicReportHarmonic Accepts Determines the number of in table 5 user defined text harmonics that will report in table 10 0 15 0 20 0 for the 10 Base T Harmonic Ones 25 0 30 0 35 0 measurement 40 0 45 0 50 0 Confgure Quiet Waveforms NTOOOBTQuietTimeAcq Accepts Determines the number of user defined text waveforms acquired and analyzed 10 0 20 0 50 0 for the 1000BT EEE Quiet time 100 0 test 12 Keysight 5392 Ethernet Compliance Application Programmer s Reference Table2 Configuration Variables and Values continued Configuration Variables and Values 2 GUI Label Variable Description Location Confgure Quiet Waveforms N100BTQuietTimeAcq Accepts Determines the number of user defined text waveforms acquired and analyzed 10 0 20 0 50 0 for the 100 EEE Quiet time 100 0 test Confgure Refresh N1000BTRe
15. 6 10 0E 06 10 5E 06 Keysight N5392B C Ethernet Compliance Application Programmer s Reference 23 2 Configuration Variables and Values Table2 Configuration Variables and Values continued GUI Label Variable Description Location Confgure Time Range s N1000BTUnfilteredJitterSec Accepts Determines the amount of onds user defined text TX TCLK and DUT MDI Data 0 005 0 1 0 2 0 3 analyzed to compute the 0 4 0 5 0 6 0 7 unfiltered jitter measurements 0 8 0 9 1 0 The specification says that this should between 0 1s and 1s This applies to both MASTER and SLAVE mode unfiltered jitter measurements as well as MASTER and SLAVE mode JTxOut measurements Confgure Trigger Holdoff s JitterTrigHoldofflOBT Accepts Determines the amount of trigger user defined text holdoff used for 10 Base T Jitter 80 0E 9 10 2 6 Tests Note that you may need to adjust this in order to exclude the effects of the TP IDL signal Another alternative is to try the Automatic Triggering Method Confgure Trigger Holdoff s JitterTrigHoldoff10BTe Accepts Determines the amount of trigger user defined text holdoff used for 10 Base Te Jitter 80 0E 9 10 2E 6 Tests Note that you may need to adjust this in order to exclude the effects of the TP_IDL signal Another alternative is to try the Automatic Triggering Method Confgure UTPAOI Template UTPScaling
16. Description Location Confgure Pulse Width T1OOBTRiseFallPulseWidth 80 96 Determines the pulse width of the signal captured for all 100 Base TX measurements Confgure IDL mask End NTOBTIDLEndVertRange Accepts Sets the vertical range for the 10 vertical range user defined text Base T Template End 400E 3 800E 3 Test 1 6 3 2 6 Confgure TP_IDLmask End NTOBTelDLEndVertRange Accepts Sets the vertical range for the 10 vertical range user defined text Base Te TP IDL Template End 400E 3 800E 3 Test 1 6 3 2 6 Confgure Template Mask N10BTeTemplateMaskAlign Auto Manual Determines the MaskAlignment Alignment Method used for Template Measurement Choosing Auto will automatically align the Mask for passing condition Choosing Manual will prompt the user to align the mask itself before continue the test Confgure Template Mask TemplateMaskAlign Auto Manual Determines the MaskAlignment Alignment Method used for Template Measurement Choosing Auto will automatically align the Mask for passing condition Choosing Manual will prompt the user to align the mask itself before continue the test Confgure Test Pair GigabitTestPair ALL A B C D Determines the 1000 Base T pair or pairs tested This setting applies to all 1000 Base T Tests Confgure TestMode1 Trigger NTOOOBTTrigHoldOff Accepts Determines the trigger hold off Hold Off user defined text TestMode1 signal 9 0E 06 9 5E 0
17. I G Configuration Variables and Values Description CHAN3 CHAN4 probe transmitted Ethernet Data from the DUT This channel setting ONLY applies to 1000BT Jitter Tests in both with and without access to TX_TCLK Confgure DUT Clock DUTClockChan CHAN1 CHAN2 Determines the oscilloscope CHAN3 CHAN4 channel used to probe the transmit TX_TCLK clock signal on the DUT with an InfiniiMax probe and solder in diff probe head This signal is used for all 1000 Base T Jitter measurements Confgure DUT D DataPosChan CHAN1 CHAN2 Specifies the oscilloscope CHAN3 CHAN4 channel being used for D Used in tests with disturber or jitter test without access to TX_TCLK Confgure DUT D DataNegChan CHAN1 CHAN2 Specifies the oscilloscope CHAN3 CHAN4 channel being used for D Used in tests with disturber or jitter test without access to TX_TCLK Confgure DUT Data DataChan CHAN1 CHAN2 The oscilloscope channel used to CHAN3 CHAN4 probe transmitted Ethernet Data from the DUT This channel setting does NOT apply to 1000 Base T Jitter Tests Confgure Enable Manual ManMaskAlign True False Enable manual mask alignment Mask Alignment after the auto mask test failed Confgure Ground Reference N100RefPoint Offset Default Determines the 100BT Peak Voltage Measurement Reference Confgure HarmonicContent HCPeakThreshold 20 25 30 35 Determines peak threshold level Peak Threshold 40 45
18. Keysight N5392B C Ethernet Compliance Application KEYSIGHT Programmer s TECHNOLOGIES Reference Notices O Keysight Technologies Inc 2008 2015 No part of this manual may be reproduced in any form or by any means including elec tronic storage and retrieval or translation into a foreign language without prior agree ment and written consent from Keysight Technologies Inc as governed by United States and international copyright laws Manual Part Number Version 02 43 0000 Edition January 5 2015 Available in electronic format only Published by Keysight Technologies Inc 1900 Garden of the Gods Road Colorado Springs CO 80907 USA Warranty The material contained in this docu ment is provided as is and is subject to being changed without notice in future editions Further to the maxi mum extent permitted by applicable law Keysight disclaims all warranties either express or implied with regard to this manual and any information contained herein including but not limited to the implied warranties of merchantability and fitness for a par ticular purpose Keysight shall not be liable for errors or for incidental or consequential damages in connection with the furnishing use or perfor mance of this document or of any infor mation contained herein Should Keysight and the user have a separate written agreement with warranty terms covering the material in this document that conflict with these term
19. Tests100BT EEE Set Up Tests1OBT 51510 0 0 1 0 Tests10BT Set Up Tests10BT_EEE Tests10BT_EEE 0 0 1 0 Tests10BT_EEE Keysight Nb392B C Ethernet Compliance Application Programmer s Reference 25 2 Configuration Variables and Values 26 Keysight 5392 Ethernet Compliance Application Programmer s Reference Keysight N5392B C Ethernet Compliance Application Programmer s Reference 3 Test Names and IDs The following table shows the mapping between each test s numeric ID and name The numeric ID is required by various remote interface methods Name The name of the test as it appears on the user interface Select Tests tab Test ID The number to use with the RunTests method Description The description of the test as it appears on the user interface Select Tests tab For example if the graphical user interface displays this tree in the Select Tests tab All Tests Rise Time Fall Time then you would expect to see something like this in the table below Table 3 Example Test Names and IDs Name TestID Description Fall Time 110 Measures clock fall time Rise Time 100 Measures clock rise time and you would run these tests remotely using ARSL syntax arsl a ipaddress c SelectedTests 100 110 arsl a ipaddress c Run CH syntax remoteAte SelectedTests new int 100 110 remoteAte Run Here are the actual Test names and IDs used by this application KE
20. YSIGHT TECHNOLOGIES 27 3 Test Names and IDs The file TestInfo txt which may be found in the same directory as this help file contains all of the information found in the table below in a format suitable for parsing Table4 Test IDs and Names Name TestlD Description 10 Base T Common Mode 801 The magnitude of the total common mode output Output Voltage voltage ofthe transmitter Ecm measured as shown in Figure 14 14 shall be less than 50 mV peak 10 Base T Harmonic Content 52 When the DO circuit is driven by an all ones Manchester encoded signal any harmonic measured on the TD circuit shall be at least 27 dB below the fundamental 10 Base T Jitter with TPM 53 In accordance with Annex B 4 3 3 An external MAU with a jitterless source driving DO is compliant when all zero crossings fall within the time intervals 8 0 BT 7 ns and 8 5 BT 7 ns with TPM An integrated MAU is compliant when all zero crossings fall within the time intervals 8 0 BT x 11 ns and 8 5 BT 11 ns with TPM 10 Base T Jitter without TPM 54 In accordance with Annex 4 3 3 and B 4 1 System Jitter Budget an external MAU with a jitterless source driving DO is compliant when all zero crossings fall within the time intervals 8 0 BT 16 ns and 8 5 BT 16 ns without TPM An integrated MAU is compliant when all zero crossings fall within the time intervals 8 0 BT 20 ns and 8 5 BT 20 ns without TPM 10 Base T Link Te
21. be a single positive pulse which falls within the shaded area of Figure 14 12 The link test pulse shall be a single positive pulse which falls within the shaded area of Figure 14 12 10 Base Te MAU Template 832 The output signal Vo is defined at the output of the twisted pair model as shown in Figure 14 8 The TD transmitter shall provide equalization such that the output waveform shall fall within the template shown in Figure 14 9 for all data sequences The template voltage may be scaled by a factor of 0 9 to 1 1 but any scaling below 0 9 or above 1 1 shall not be allowed During this test the twisted pair model shall be terminated in 100 Ohms and driven by a transmitter with a Manchester encoded pseudo random sequence with a minimum repetition period of 511 bits This test shall be repeated with the template inverted about the time axis 10 Base Te Peak Differential Voltage 60 For a type 10 5 MAU the peak differential voltage on the TD circuit when terminated with a 100 Q resistive load shall be between 1 54 V and 1 96 V for all data sequences 10 Base Te Receiver Return Loss 823 The Return Loss obtained must conform to the requirements specified in IEEE802 3 2008 Subclause 14 3 1 3 4 and Annex B 4 3 5 10 Base Te TP_IDL Template with TPM last bit CDO 829 The TP_IDL shall always start with a positive waveform when a waveform conforming to Figure 7 12 is applied to the DO circuit Af
22. e Jitter Measurement Point N10JittPoint Mid Cross Determines the Jitter Measurement Point Confgure Jitter Trigger Method JitterTrigger Auto Manual Determines the Trigger Method used for Jitter Measurements This method automatically attempts to determine the packet length and provides a stable trigger in the middle of a random data packet This requires random data packets with a consistent packet size and a consistent inter packet gap Choosing Manual will prompt the user to set up the trigger before continuing the test Keysight 5392 Ethernet Compliance Application Programmer s Reference Configuration Variables and Values 2 Table2 Configuration Variables and Values continued GUI Variable Description Location Confgure Jitter Trigger N10BTeJitterTrigger Auto Manual Determines the Trigger Method Method used for Jitter Measurements This method automatically attempts to determine the packet length and provides a stable trigger in the middle of a random data packet This requires random data packets with a consistent packet size and a consistent inter packet gap Choosing Manual will prompt the user to set up the trigger before continuing the test Confgure LTP TP_IDL Loads TenBTMaskTestLoads ALL LOAD1 Determines which of the 3 LOAD2 LOAD3 required loads to apply when testing 10 Base T Link Test Pulse and TP_IDL Template tests To determine compliance s
23. e Common Mode 821 The magnitude of the total common mode output Output Voltage voltage ofthe transmitter Ecm measured as shown in Figure 14 14 shall be less than 50 mV peak 10 Base Te Harmonic Content 62 When the DO circuit is driven by an all ones Manchester encoded signal any harmonic measured on the TD circuit shall be at least 27 dB below the fundamental 10 Base Te Jitter with TPM 63 In accordance with Annex B 4 3 3 An external MAU with a jitterless source driving DO is compliant when all zero crossings fall within the time intervals 8 0 BT 7 ns and 8 5 BT 7 ns with TPM An integrated MAU is compliant when all zero crossings fall within the time intervals 8 0 BT 11 ns and 8 5 BT 11 ns with TPM Keysight Nb392B C Ethernet Compliance Application Programmer s Reference 29 3 Test Names and IDs Table4 Test IDs and Names continued 10 Base Te Jitter without TPM TestID 64 Description In accordance with Annex B 4 3 3 and B 4 1 System Jitter Budget an external MAU with a jitterless source driving DO is compliant when all zero crossings fall within the time intervals 8 0 BT 16 ns and 8 5 BT 16 ns without TPM An integrated MAU is compliant when all zero crossings fall within the time intervals 8 0 BT 20 ns and 8 5 BT 20 ns without TPM 10 Base Te Link Test Pulse with TPM 10 Base Te Link Test Pulse without TPM 830 835 The link test pulse shall
24. e time domain template 1 defined in Figure 40 26 and the piecewise linear interpolation between the points in Table 40 10 The waveform around point D is normalized by dividing by the negative of 1 2 the peak value of the waveform at A 1000 Base T Point D Template 8 Fit The Template The voltage waveforms around Test w o Disturbing Signal points A B C D defined in Figure 40 19 after normalization shall lie within the time domain template 1 defined in Figure 40 26 and the piecewise linear interpolation between the points in Table 40 10 The waveform around point D is normalized by dividing by the negative of 1 2 the peak value of the waveform at A 1000 Base T Point F Template 109 Fit The Template The voltage waveforms around Test w Disturbing Signal points F and H defined in Figure 40 19 after normalization shall lie within the time domain template 2 defined in Figure 40 26 and the piecewise linear interpolation between the points in Table 40 11 The waveform around point F is normalized by dividing by the peak value of the waveform at F 1000 Base T Point F Template 9 Fit The Template The voltage waveforms around Test w o Disturbing Signal points F and H defined in Figure 40 19 after normalization shall lie within the time domain template 2 defined in Figure 40 26 and the piecewise linear interpolation between the points in Table 40 11 The waveform around point F is normalized by dividing by the peak value of th
25. e waveform at F 1000 Base T Point G Droop 111 The Voltage at Point G 500ns after point F must be Test w Disturbing Signal more than 73 196 of the negative Voltage at Peak F 1000 Base T Point G Droop 11 The Voltage at Point G 500 5 after point F must be Test w o Disturbing Signal more than 73 196 of the negative Voltage at Peak F 38 Keysight 5392 Ethernet Compliance Application Programmer s Reference Table 4 Test IDs and Names continued Test NamesandlDs 3 Name TestlD Description 1000 Base T Point Template 110 Fit The Template The voltage waveforms around Test w Disturbing Signal points F and H defined in Figure 40 19 after normalization shall lie within the time domain template 2 defined in Figure 40 26 and the piecewise linear interpolation between the points in Table 40 11 The waveform around point H is normalized by dividing by the peak value of the waveform at H 1000 Base T Point H Template 10 Fit The Template The voltage waveforms around Test w o Disturbing Signal points F and H defined in Figure 40 19 after normalization shall lie within the time domain template 2 defined in Figure 40 26 and the piecewise linear interpolation between the points in Table 40 11 The waveform around point H is normalized by dividing by the peak value of the waveform at H 1000 Base T Point J Droop 112 The Voltage at Point J 500 5 after point H must be Test w Disturbing Signa
26. elect ALL You may also select individual load if you wish to test only that load Confgure LTP TP Loads TenBTeMaskTestLoads ALL LOAD1 Determines which of the 3 LOAD2 LOAD3 required loads to apply when testing 10 Base Te Link Test Pulse and TP Template tests To determine compliance select ALL You may also select an individual load if you wish to test only that load Confgure LTP TP IDL Tests TenBTStartEndTests Both Start End Determines which parts of the signal to test Start End or Both This setting applieas to the 10 Base T Link Test Pulse and TP IDL Template tests To determine compliance select Both Confgure LTP TP IDL Tests TenBTeStartEndTests Both Start End Determines which parts of the signal to test Start End or Both This setting applieas to the 10 Base Te Link Test Pulse and TP IDL Template tests To determine compliance select Both Keysight N5392B C Ethernet Compliance Application Programmer s Reference 19 2 Configuration Variables and Values Table2 Configuration Variables and Values continued GUI Label Variable Description Location Confgure Link Partner Clock LPClockChan CHAN1 CHAN2 Determines the oscilloscope CHAN3 CHAN4 channel used to probe the transmit TX_TCLK clock signal on the Link Partner with an InfiniiMax probe and solder in diff probe head This signal is used for 100
27. freshTimeAcq Accepts Determines the number of Waveforms user defined text waveforms acquired and analyzed 10 0 20 0 50 0 for the 1000BT EEE Refresh time 100 0 test Confgure Refresh N100BTRefreshTimeAcq Accepts Determines the number of Waveforms user defined text waveforms acquired and analyzed 10 0 20 0 50 0 for the 100 EEE Refresh time 100 0 test Confgure f Rise Fall Avgs N100BTRiseFallAvgs 0 0 8 0 16 0 32 0 Determines the number of 64 0 128 0 256 0 averages used for all 100 512 0 1024 0 Base TX rise time and fall time 2048 0 4096 0 measurements Confgure Rise Fall Meas N100BTRiseFallMeas Accepts Determines the number of rise user defined text and fall time measurements used 1 0 10 0 20 0 for 100 Base TX rise time and fall 50 0 100 0 200 0 time tests This number is used to compute the worst case rise and fall time and the rise and fall symmetry Confgure Waveforms N1000BTCommonModeAcgs_ Accepts Determines the number of user defined text waveforms acquired and analyzed 1 0 10 0 20 0 for the 1000 Base T Common 30 0 40 0 50 0 Mode Output Voltage Test 60 0 70 0 80 0 90 0 100 0 200 0 400 0 500 0 1000 0 5000 0 Confgure Waveforms N1000BTMaskTestAcqs Accepts Determines the number of user defined text waveforms acquired and analyzed 1 0 10 0 20 0 for all 1000 Base T Template 30 0 40 0 50 0 Tests 60 0 70 0 80 0 90 0 100 0 200 0 400 0 500 0
28. gure 40 26 and the piecewise linear interpolation between the points in Table 40 10 The waveform around point B is normalized by dividing by the negative of the peak value of the waveform at A 3 1000 Base T Point B Template Test w o Disturbing Signal 1000 Base T Point Peak Output Voltage w Disturbing Signal Fit The Template The voltage waveforms around points A B C D defined in Figure 40 19 after normalization shall lie within the time domain template 1 defined in Figure 40 26 and the piecewise linear interpolation between the points in Table 40 10 The waveform around point B is normalized by dividing by the negative of the peak value of the waveform at A The absolute value of the peak of the waveform at point C shall differ by less than 2 0 000000rom 0 5 times the average of the absolute values of the peaks of the waveform at points A and B 1000 Base T Point C Peak Output Voltage w o Disturbing Signal The absolute value of the peak of the waveform at point C shall differ by less than 2 0 000000rom 0 5 times the average of the absolute values of the peaks of the waveform at points A and B 1000 Base T Point C Template Test w Disturbing Signal 107 Fit The Template The voltage waveforms around points A B C D defined in Figure 40 19 after normalization shall lie within the time domain template 1 defined in Figure 40 26 and the piecewise linear interpolation between
29. hical user interface contains this control on the Set Up tab Enable Advanced Features then you would expect to see something like this in the table below Table 1 Example Configuration Variables and Values GUI Label Variable Values Description Location Set Up Enable Advanced EnableAd vanced True False Enables a set of optional features Features and you would set the variable remotely using ARSL syntax arsl a ipaddress c SetConfig EnableAdvanced True C syntax KEYSIGHT TECHNOLOGIES 11 2 Configuration Variables and Values remoteAte SetConfig EnableAdvanced True Here are the actual configuration variables and values used by this application Some of the values presented in the table below may not be available in certain configurations Always perform a test run of your remote script using the application s graphical user interface to ensure the combinations of values in your program are valid The file ConfigInfo txt which may be found in the same directory as this help file contains all of the information found in the table below in a format suitable for parsing Table2 Configuration Variables and Values GUI Label Variable Values Description Location Confgure Harmonic Avgs N10BTHarmonicAvgs Accepts Determines the number of user defined text averages used for the 10 Base T 0 0 8 0 16 0 32 0 Harmonic Ones measurement 64 0 128 0 2
30. ht Nb392B C Ethernet Compliance Application Programmer s Reference 35 3 36 Test Names and IDs Table4 Test IDs and Names continued Name TestlD Description 1000 Base T MASTER mode 510 There are no specific requirements for JTxOut JTxOut w TX TCLK However JTxOut is used in all filtered jitter measurements JTxOut measures the amount of jitter on the MDI Data relative to the DUT s transmit clock TX TCLK This measurement is made while the DUT is transmitting the Test Mode 2 signal MASTER timing mode For further information on jitter measurements consult the user manual 1000 Base T MDI Common 501 The magnitude of the total common mode output Mode Output Voltage voltage on any transmit circuit when measured as shown in Figure 40 32 shall be less than 50 mV peak to peak when transmitting data 1000 Base T MDI Return Loss 1004 The Return Loss obtained must conform to the requirements specified in IEEE802 3 2008 Subclause 40 8 3 1 1000 Base T Point A Peak 100 The magnitude of the voltage at Point A shall fall Output Voltage w Disturbing within the range of 0 67 V to 0 82V 0 75V 0 83dB Signal 1000 Base T Point A Peak 0 The magnitude of the voltage at Point A shall fall Output Voltage w o Disturbing within the range of 0 67 V to 0 82V 0 75V 0 83dB Signal 1000 Base T Point A Template 105 Fit The Template The voltage waveforms around Test w Disturbing Signal points A B C D
31. inally OV The AOI rise and fall times 10 90 for Vout and Vout shall fall in the range of 3 to 5 ns Note that this test uses 100 measurements The reported Actual Value is the current last measurement The statistics min max over 100 measurements are used to determine compliance 100 Base TX AOI Vout Rise Time 21 The AOI signal rise is defined as the transition from the baseline voltage nominally OV to either Vout or Vout The AOI rise and fall times 10 90 for Vout and Vout shall fall in the range of 3 to 5 ns Note that this test uses 100 measurements The reported Actual Value is the current last measurement The statistics min max over 100 measurements are used to determine compliance 100 Base TX Vout Rise Fall Symmetry 23 The difference between the maximum and minimum of all rise and fall times shall be less than or equal to 0 5ns The statistics min max Rise Falltime over 100 measurements are used to determine compliance 100 Base TX AOI Overall Rise Fall Symmetry 33 The difference between the maximum and minimum of all rise and fall times shall be less than or equal to 0 5ns The statistics min max Rise Falltime over 100 measurements are used to determine compliance Keysight N5392B C Ethernet Compliance Application Programmer s Reference Table4 Test IDs and Names continued Test Names and IDs 3 Name TestlD Description
32. k above the value 0 98 0 97 0 96 that you specify here NOTE The 0 95 0 94 0 93 standard does not allow scaling 0 92 0 91 by more than 1 1 20 Keysight N5392B C Ethernet Compliance Application Programmer s Reference Table2 Configuration Variables and Values continued Configuration Variables and Values 2 GUI Label Variable Description Location Confgure MAU Min Scaling MAUMinScaling 1 09 1 08 1 07 Determines the minimum scale 1 06 1 05 1 04 used for the MAU Mask The 1 03 1 02 1 01 mask alignment routines will not 1 0 0 99 0 98 scale the mask below the value 0 97 0 96 0 95 that you specify here NOTE The 0 94 0 93 0 92 standard does not allow scaling 0 91 0 9 below 0 9 Confgure MAU Min Scaling N10BTeMAUMinScaling 1 09 1 08 1 07 Determines the minimum scale 1 06 1 05 1 04 used for the MAU Mask The 1 03 1 02 1 01 mask alignment routines will not 1 0 0 99 0 98 scale the mask below the value 0 97 0 96 0 95 that you specify here NOTE The 0 94 0 93 0 92 standard does not allow scaling 0 91 0 9 below 0 9 Confgure MAU Type MAUType Integrated External Determines the type of 10 Base T Media Access Unit MAU Integrated or External Confgure MAU Type N10BTeMAUType Integrated External Determines the type of 10 Base Te Media Access Unit MAU Integrated or External Confgure Mask Alignment UTPMaskAlign Default Manual Determines the mask alignment method for temp
33. l more than 73 196 of the Voltage at Peak H 1000 Base T Point J Droop 12 The Voltage at Point J 500 5 after point H must be Test w o Disturbing Signal more than 73 196 of the Voltage at Peak H 1000 Base T SLAVE mode 511 There are no specific requirements for JTxOut JTxOut w TX TCLK However JTxOut is used in all filtered jitter measurements JTxOut measures the amount of jitter on the MDI Data relative to the DUT s transmit clock TX TCLK This measurement is made while the DUT is transmitting the Test Mode 3 signal SLAVE timing mode For further information on jitter measurements consult the user manual 1000 Base T Transmitter 213 The peak distortion must be less than 10mV Distortion w Disturbing Signal 1000 Base T Transmitter 113 The peak distortion must be less than 10mV Distortion w o Disturbing Signal Keysight Nb392B C Ethernet Compliance Application Programmer s Reference 39 3 Test Names and IDs 40 Keysight 5392 Ethernet Compliance Application Programmer s Reference Index C configuration variables and values 11 IDs and names of tests 27 L licensing 9 N names and IDs of tests 27 notices 3 P programming introduction to 7 R Remote Programming Toolkit 8 T test names and IDs 27 V variables and values configuration 11 Keysight Nb392B C Ethernet Compliance Application Programmer s Reference 4 Index 42 Keysight 5392 E
34. late test Confgure Min Jitter UI N100BTJitterUI Accepts This determines the minimum user defined text number of unit intervals used to 5E 3 25E 3 compute the peak to peak jitter 100E 3 200E 3 value 500E 3 1E 6 10E 6 12 5E 6 100E 6 Confgure Number of DisturbRemovalNumOfSeg 5 4 3 Advanced settings for disturbing Segment for signal removal that fine tune the disturbing signal disturbing signal removal removal algorithm for Point A B C D Confgure Offset removal GBEPeakOffsetRemoval Off On Determines whether offset removal is applied to peak measurements Keysight Nb392B C Ethernet Compliance Application Programmer s Reference 21 2 Configuration Variables and Values Table2 Configuration Variables and Values continued GUI Label Variable Description Location Confgure Phase N1000BTTM4Phase 0 00 1 00 0 05 Determine sampling phase to 0 10 0 15 0 20 analyze in TM4 Distortion test 0 25 0 30 0 35 You can choose All to analyze all 0 40 0 45 0 50 phases individual phase or 0 55 0 60 0 65 Arbitrary for search for the phase 0 70 0 75 0 80 with minimum noise 0 85 0 90 1 00 Confgure Point H Event NonDistPointHtTrig Accepts Determines the trigger level for Trigger Level user defined text the Point Template w o 150E 03 200E 03 Disturbing Signal 250E 03 300E 03 Confgure Point H Event PointHTrigLevel Accepts Determines the trigger level for
35. o VOut and a point in time 8ns afterward Overshoot 0s computed as Vpeak VOut VOut 100 percent Keysight Nb392B C Ethernet Compliance Application Programmer s Reference 31 3 32 Test Names and IDs Table4 Test IDs and Names continued Name 100 Base TX Vout Fall Time TestID 19 Description The AOI signal fall is defined as the transition from the Vout or Vout to the baseline voltage nominally OV The AOI rise and fall times 10 90 for Vout and Vout shall fall in the range of 3 to 5 ns Note that this test uses 100 measurements The reported Actual Value is the current last measurement The statistics min max over 100 measurements are used to determine compliance 100 Base TX AO Vout Rise Time 100 Base TX AOI Vout Rise Fall Symmetry 20 The AOI signal rise is defined as the transition from the baseline voltage nominally OV to either Vout or Vout The AOI rise and fall times 10 90 for Vout and Vout shall fall in the range of 3 to 5 ns A number of rise falltime measurements are made The worst case is reported here The difference between the maximum and minimum of all rise and fall times shall be less than or equal to 0 5ns The statistics min max Rise Falltime over 100 measurements are used to determine compliance 100 Base TX AOI Vout Fall Time 22 The AOI signal fall is defined as the transition from the Vout or Vout to the baseline voltage nom
36. ompliance Application Programmer s Reference Keysight N5392B C Ethernet Compliance Application Programmer s Reference Introduction to Programming Remote Programming Toolkit 8 Licensing 9 This chapter introduces the basics for remote programming a compliance application The programming commands provide the means of remote control Basic operations that you can do remotely with a computer and a compliance app running on an oscilloscope include Launching and closing the application Configuring the options Running tests Getting results Controlling when and were dialogs get displayed Saving and loading projects You can accomplish other tasks by combining these functions KEYSIGHT TECHNOLOGIES 1 Introduction to Programming Remote Programming Toolkit The majority of remote interface features are common across all the Keysight Technologies Inc family of compliance applications Information on those features is provided in the 5452 Compliance Application Remote Programming Toolkit available for download from Keysight here www keysight com find scope apps sw The N5392B C Ethernet Compliance Application uses Remote Interface Revision 3 40 The help files provided with the toolkit indicate which features are supported in this version f In the toolkit various documents refer to application specific configuration variables test information and instrument information These are provided in Chapters 2 and
37. peak to peak jitter shall be greater than 0 3ns For further information on jitter measurements consult the user manual 1000 Base T Jitter MASTER 503 This test measures the peak to peak jitter on the Unfiltered w TX_TCLK DUT s transmit clock TX_TCLK relative to an unjittered reference For further information on jitter measurements consult the user manual Keysight N5392B C Ethernet Compliance Application Programmer s Reference Test NamesandlDs 3 Table4 Test IDs and Names continued Name TestlD Description 1000 Base T Jitter MASTER 508 This test measures the peak to peak jitter of the Unfiltered w o TX TCLK MASTER output at MDI relative to an unjittered reference The result should be less than 1 4ns For further information on jitter measurements consult the user manual 1000 Base T Jitter SLAVE 504 This test makes a number of measurements Jitter is Filtered w TX TCLK measured on the DUT s TX TCLK while in SLAVE mode connected to a MASTER via the Test Channel Jitter on the DUT s TX TCLK is measured relative to the simultaneously captured MASTER TX TCLK The jitter of the MASTER TX TCLK jitter is also measured The SLAVE TX TCLK jitter is passed through a 32kHz high pass filter HPF and the MASTER TX TCLK jitter is passed through a bkHz HPF The 32kHz HPF filtered SLAVE TX TCLK jitter plus the worst SLAVE mode JTxOut minus the 5kHz filtered MASTER TX TCLK jitter must be less than 0 4ns For f
38. s the war ranty terms in the separate agreement shall control Technology Licenses The hard ware and or software described in this document are furnished under a license and may be used or copied only in accor dance with the terms of such license Restricted Rights Legend If software is for use in the performance of a U S Government prime contract or subcon tract Software is delivered and licensed as Commercial computer software as defined in DFAR 252 227 7014 June 1995 or as a commercial item as defined in FAR 2 101 a or as Restricted computer soft ware as defined in FAR 52 227 19 June 1987 or any equivalent agency regulation or contract clause Use duplication or disclo sure of Software is subject to Keysight Tech nologies standard commercial license terms and non DOD Departments and Agencies ofthe U S Government will receive no greater than Restricted Rights as defined in FAR 52 227 19 c 1 2 June 1987 U S Government users will receive no greater than Limited Rights as defined in FAR 52 227 14 June 1987 or DFAR 252 227 7015 0 2 November 1995 as applicable in any technical data Safety Notices CAUTION A CAUTION notice denotes a hazard It calls attention to an operating procedure practice or the like that if not correctly performed or adhered to could result in damage to the product or loss of important data Do not proceed beyond a CAU TION notice until the indicated con di
39. st Pulse 810 The link test pulse shall be a single positive pulse with TPM which falls within the shaded area of Figure 14 12 10 Base T Link Test Pulse 815 The link test pulse shall be a single positive pulse without TPM which falls within the shaded area of Figure 14 12 10 Base T MAU Template 812 The output signal Vo is defined at the output of the twisted pair model as shown in Figure 14 8 The TD transmitter shall provide equalization such that the output waveform shall fall within the template shown in Figure 14 9 for all data sequences The template voltage may be scaled by a factor of 0 9 to 1 1 but any scaling below 0 9 or above 1 1 shall not be allowed During this test the twisted pair model shall be terminated in 100 Ohms and driven by a transmitter with a Manchester encoded pseudo random sequence with a minimum repetition period of 511 bits This test shall be repeated with the template inverted about the time axis 28 Keysight 5392 Ethernet Compliance Application Programmer s Reference Table 4 Test IDs and Names continued Test Names and IDs 3 Name TestlD Description 10 Base T Peak Differential 50 The peak differential voltage on the TD circuit when Voltage terminated with a 100ohm resistive load shall be between 2 2V and 2 8V for all data sequences 10 Base T Receiver Return 803 The Return Loss obtained must conform to the Loss requirements specified in IEEE802 3 20
40. ter the zero crossing of the last transition the differential voltage shall remain within the shaded area of Figure 14 10 10 Base Te TP_IDL Template with TPM last bit CD1 831 The TP_IDL shall always start with a positive waveform when a waveform conforming to Figure 7 12 is applied to the DO circuit After the zero crossing of the last transition the differential voltage shall remain within the shaded area of Figure 14 10 30 Keysight N5392B C Ethernet Compliance Application Programmer s Reference Test Names and IDs Table 4 Test IDs and Names continued 10 Base Te TP IDL Template without TPM last bit CDO TestlD 834 Description The TP IDL shall always start with a positive waveform when a waveform conforming to Figure 7 12 is applied to the DO circuit After the zero crossing of the last transition the differential voltage shall remain within the shaded area of Figure 14 10 3 10 Base Te TP_IDL Template without TPM last bit CD1 10 Base Te Transmitter Return Loss 836 822 The TP_IDL shall always start with a positive waveform when a waveform conforming to Figure 7 12 is applied to the DO circuit After the zero crossing of the last transition the differential voltage shall remain within the shaded area of Figure 14 10 The Return Loss obtained must conform to the requirements specified in IEEE802 3 2008 Subclause 14 3 1 2 2 and Annex B 4 3 2 100 Base
41. thernet Compliance Application Programmer s Reference
42. timer and the postupdate timer 1000 Base T EEE Transmit 1206 The minimum wake time as measured on the medium Wake Time Master Tphy wake min should be greater than 11 55 1000 Base T Transmit 1207 The minimum wake time as measured on the medium Wake Time Slave Tphy wake min should be greater than 4 26ps 1000 Base T EEE Transmitter 1209 The unfiltered jitter requirements of an EEE capable Timing Jitter PHY shall be satisfied during the mode with the exception that clock edges corresponding to the WAIT QUIET QUIET WAKE and WAKE SILENT states are not considered in the measurement 1000 Base T EEE Wake State 1208 While the device is transmitting Idle at the beginning Levels of WAKE the transmit levels shall exceed 6596 of compliant Idle symbol levels for at least 5005 1000 Base T Jitter MASTER 502 This test measures filtered jitter on the DUT s TX TCLK Filtered w TX TCLK signal The jitter on the DUT s TX TCLK signal relative to an unjittered reference is passed through 5kHz high pass filter HPF The 5kHz HPF filtered MASTER TX_TCLK jitter plus the worst MASTER mode JTxOut must be less than 0 3ns For further information on jitter measurements consult the user manual 1000 Base T Jitter MASTER 506 This test measures filtered jitter on the MDI output Filtered w o TX_TCLK The MASTER output at the MDI relative to an unjittered reference is passed through a 5kHz high pass filter HPF The filtered
43. tions are fully understood and met A WARNING notice denotes a haz ard It calls attention to an operat ing procedure practice or the like that if not correctly performed or adhered to could result in personal injury or death Do not proceed beyond a WARNING notice until the indicated conditions are fully understood and met In This Book This book is your guide to programming the Keysight Technologies N5392B C Ethernet Compliance Application Chapter 1 Introduction to Programming starting on page 7 describes compliance application programming basics Chapter 2 Configuration Variables and Values starting on page 11 and Chapter 3 Test Names and IDs starting on page 27 provide information specific to programming the N5392B C Ethernet Compliance Application How to Use This Programmers who are new to compliance application programming should read all Book ofthe chapters in order Programmers who are already familiar with this may review chapters 2 and 3 for changes Keysight 5392 Ethernet Compliance Application Programmer s Reference 3 Keysight 5392 Ethernet Compliance Application Programmer s Reference Contents In This Book 3 1 Introduction to Programming Remote Programming Toolkit 8 Licensing 9 2 Configuration Variables and Values 3 Test Names and IDs Index Keysight 5392 Ethernet Compliance Application Programmer s Reference Keysight 5392 Ethernet C
44. urther information on jitter measurements consult the user manual 1000 Base T Jitter SLAVE 507 This test measures filtered jitter on the MDI output Filtered w o TX TCLK The jitter on the MDI output signal relative to an unjittered reference is passed through a 5kHz high pass filter HPF The 5kHz HPF filtered MASTER output at MDI and the filtered Master jitter shall be less than 0 4ns The result is only meant for informational purposes and cannot be used as conformance limits For further information on jitter measurements consult the user manual 1000 Base T Jitter SLAVE 505 This test measures the peak to peak jitter on the Unfiltered w TX_TCLK DUT s transmit clock TX_TCLK while it is operating in SLAVE mode connected to a MASTER via the Test Channel Jitter on the DUT s TX_TCLK is measured relative to the simultaneously captured MASTER TX_TCLK For further information on jitter measurements consult the user manual 1000 Base T Jitter SLAVE 509 This test measures the unfiltered peak to peak jitter Unfiltered w o TX_TCLK at the MDI output whereby the SLAVE output is relatives to an unjittered reference The resulting unfiltered SLAVE jitter peak to peak value will then be subtracted with the unfiltered MASTER peak to peak jitter The result is only meant for informational purposes and cannot be used as conformance limits For further information on jitter measurements consult the user manual Keysig
45. veform at Peak Output Voltage w points A and B shall differ by less than 1 Disturbing Signal 1000 Base T Difference A B 2 The absolute value of the peak of the waveform at Peak Output Voltage w o points A and B shall differ by less than 1 Disturbing Signal 1000 Base T EEE Quiet Time 1201 The quiet time of the PHY as measured on the medium will be the sum of the lpi_waitwq_timer and lpi_quiet_timer 1000 Base T EEE Refresh 1202 The refresh time is measured from the start of the Time Master WAKE transient to the entry into the WAIT_QUIET state The time measured in this test is the wake timer the lpi_update_timer and the postupdate timer Keysight Nb392B C Ethernet Compliance Application Programmer s Reference 33 3 34 Test Names and IDs Table4 Test IDs and Names continued Name TestlD Description 1000 Base T EEE Refresh 1203 The refresh time is measured from the start of the Time Slave WAKE transient to the entry into the WAIT QUIET state The time measured in this test is the wake timer the update timer and the postupdate timer 1000 Base T EEE Sleep Time 1204 The sleep time of the PHY as measured on the medium Master will be the sum of the update timer and the postupdate timer 1000 Base T Sleep Time 1205 The sleep time of the PHY as measured on the medium Slave will be the sum of the update
46. vgs Accepts Determines the number of user defined text averages used for the 100 0 0 8 0 16 0 32 0 Base TX overshoot tests 64 0 128 0 256 0 512 0 1024 0 2048 0 4096 0 Confgure Avgs N100BTPeakVoltAvgs Accepts Determines the number of user defined text averages used for all 100 0 0 8 0 16 0 32 0 Base TX Peak Voltage 64 0 128 0 256 0 measurements 512 0 1024 0 2048 0 4096 0 14 Keysight 5392 Ethernet Compliance Application Programmer s Reference Table2 Configuration Variables and Values continued c0 Location Label VEEG Configuration Variables and Values Description 2 Confgure fEdges N1000BTFilteredJitterEdges Accepts This sets the minimum number of user defined text TCLK edges to inspect when 1250 0 6000 0 running 1000Base T filtered jitter 100000 measurements This applies to both MASTER and SLAVE mode filtered jitter measurements Confgure Jitter Waveforms NTOBTJitterAcqs Accepts Determines the number of user defined text waveforms hits acquired and 300 0 500 0 analyzed for the 10 Base T Jitter 1000 0 1500 0 Tests 2000 0 3000 0 4000 0 Confgure Jitter Waveforms NTOBTeJitterAcqs Accepts Determines the number of user defined text waveforms hits acquired and 300 0 500 0 analyzed for the 10 Base Te Jitter 1000 0 1500 0 Tests 2000 0 3000 0 4000 0 Confgure LTP IDL Avgs N10BTMaskTestAvgs

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