EMC TEST REPORT
Contents
1. Power AC 230V Pol Phase LINE Test Mode 1 LINK LAN 1Gbps HDD R W Temperature 23 C Memo Humidity 57 Level dBuV Date 2011 07 06 CLASS A AWG Ah Read Value Factor Result dBuV dB dBuV 21 379 0 116 21 495 31 786 0 116 31 902 33 562 0 120 33 682 41 612 0 120 41 732 31 977 0 159 32 136 39 604 0 159 39 763 46 732 1 159 47 891 54 535 1 159 55 694 50 505 1 216 51 721 58 636 1 216 59 852 43 406 1 292 44 698 51 839 1 292 53 131 66 79 66 79 60 73 60 73 60 Pd 60 73 000 000 000 000 000 000 000 000 000 000 000 000 Average QP Average QP Average QP Average QP Average QP Average QP Remarks 1 Result Read Value Factor 2 Factor LISN ISN Factor Cable Loss E e Issued Date Jul 28 2011 Cerpass Technology Corp Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 12 of 56 SN 2 CERPASS TECHNOLOGY CORP Report No TECE1107001 C Cerpass Tec Tel 886 2 2655 8100 Fax 886 2 2655 8200 Power AC 230V Pol Phase NEUTRAL Test Mode 1 LINK LAN 1Gbps HDD R W Temperature 23 C Memo Humidity 57 90 Level dBuV Date 2011 07 06 0 15 0 5 1 2 5 10 20 Frequency MHz Read em Freq Value Factor Result Lim2. Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No A3 of A4 oe CERPASS TECHNOLOGY CORP Report No TECE1107001 C 9 Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No A4 of A4
3. 13 22 7 255 dla 22 12 1 Pass 14 0 4 0 9 15 19 7 3 0 15 0 3l 16 0 Pass 16 0 4 0 7 Lhe 17 4 6 0 34 4 6 1 35 4 Pass 18 0 5 0 7 ei 19 15 6 4 8 30 6 5 0 32 7 Pass 20 0 4 0 6 21s 14 1 3 5 25 2 3 6 25 9 Pass 22 0 4 0 6 23 12 9 2 5 19 6 2 6 21 0 Pass 24 0 4 0 6 gt 25 11 8 3 6 30 9 3 8 32 7 Pass 26 0 5 0 8 o 27 10 9 2 2 20 5 Zu 21 4 Pass 28 0 4 0 6 29 10 2 1 7 16 8 1 8 18 5 Pass 30 0 4 0 6 31 9 5 1 8 18 9 1 9 20 3 Pass 32 0 4 0 6 331 9 0 3 8 42 7 3 9 44 2 Pass 34 0 3 0 5 35 8 4 3 4 40 3 3 5 42 1 Pass 36 0 4 0 5 37 8 0 4 1 51 1 4 1 51 8 Pass 38 0 2 0 4 39 7 6 Za 35 2 2 6 35 6 Pass 40 0 3 lt 0 5 e POHC 33 0 947 29 3 9 7 29 5 Not used Test engineer cd Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 29 of 56 LO CE i CERPASS TECHNOLOGY CORP Report No TECE1107001 6 Voltage Fluctuations Test 6 1 Test Procedure The equipment shall be tested under the conditions of Clause 5 The total impedance of the test circuit excluding the appliance under test but including the internal impedance of the supply source shall be equal to the reference impedance The stability and tolerance of the reference impedance shall be adequate to ensure that the overall accuracy of 8 is achieved during th
4. 12 5 Test Photographs Front View Rear View Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 53 of 56 i CERPASS TECHNOLOGY CORP Report No TECE1107001 Ch l 13 Voltage Dips and Voltage Interruptions Immunity Test Setup 13 1 Test Conditions 1 Source voltage and frequency 100 230 240V 50Hz Single phase 2 Test of interval 10 sec 3 Level and duration Sequence of 3 dips interrupts 4 Voltage rise and fall time 1 5 us 5 Test severity Voltage dips and Interrupt Test Duration reduction period gt 95 250 13 2 Measurement Equipment Instrument Manufacturer Model No Serial No Calibration Date Valid Date EMC Pro KeyTek EMC Pro 0309207 2011 03 24 2012 03 23 Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 54 of 56 LO CE CERPASS TECHNOLOGY CORP Report No TECE1107001 13 3 Test Result and Data Final Test Result PASS Pass performance Criteria B for voltage interruption A for voltage dips Required performance Criteria C for voltage interruption B C for voltage dips Basic Standard IEC 61000 4 11 Product Standard EN 55024 Temperature 24 C Relative Humidity 53 Atmospheri
5. CE i CERPASS TECHNOLOGY CORP Report No TECE1107001 Car E dx According to EN 55022 2006 A1 2007 Class A EN 55024 1998 A1 2001 A2 2003 EN 61000 3 2 2009 IEC 61000 4 2 2008 EN 61000 3 3 2008 IEC 61000 4 3 2010 IEC 61000 4 4 2010 IEC 61000 4 5 2005 IEC 61000 4 6 2008 IEC 61000 4 8 2009 IEC 61000 4 11 2004 Applicant QSAN Technology Inc 2F No 23 Lane 583 RuiGuang Rd Neihu Dist Taipei 114 Taiwan R O C Equipment Disk array Storage system RAID system Address P11XV04 where X could be 0 9 for software E difference and marketing purpose Trade Name Qsan The test result refers exclusively to the test presented test model sample Without written approval of Cerpass Technology Corp the test report shall not be reproduced except in full This test report is only applicable to European Community 9 Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 1 of 56 fo CE CERPASS TECHNOLOGY CORP Report No TECE1107001 Contents GERTIFIGATE OFCOMPLIANGE Licia 4 1 Declaration of Conformity and the CE Mark U U U U u u uu uu u u 5 2 Test Configuration of Equipment under Test 6 2 1 Feature of Equipment under Tes
6. Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 3 of 56 fo CE CERPASS TECHNOLOGY CORP Report No TECE1107001 CERTIFICATE OF COMPLIANCE According to EN 55022 2006 A1 2007 Class A EN 55024 1998 A1 2001 A2 2003 EN 61000 3 2 2009 IEC 61000 4 2 2008 EN 61000 3 3 2008 IEC 61000 4 3 2010 IEC 61000 4 4 2010 IEC 61000 4 5 2005 IEC 61000 4 6 2008 IEC 61000 4 8 2009 IEC 61000 4 11 2004 Applicant QSAN Technology Inc Address 2F No 23 Lane 583 RuiGuang Rd Neihu Dist Taipei 114 Taiwan R O C Equipment Disk array Storage system RAID system Model No P11XV04 where X could be 0 9 for software difference and marketing purpose HEREBY CERTIFY THAT The measurements shown in this test report were made in accordance with the procedures given in EUROPEAN COUNCIL DIRECTIVE 2004 108 EC The equipment was passed the test performed according to European Standard EN 55022 2006 A1 2007 Class A EN61000 3 2 2009 EN 61000 3 3 2008 and EN 55024 1998 A1 2001 A2 2003 IEC 61000 4 2 2008 IEC 61000 4 3 2010 IEC 61000 4 4 2010 IEC 61000 4 5 2005 IEC 61000 4 6 2008 IEC 61000 4 8 2009 IEC 61000 4 11 2004 The test was carried out on Jul 26 2011 at Cerpass Technology Corp Signature YA Hill Chen EMC RF B U Chief of Engineering Dept Y n r A Th _ _ Cerpass Technology Corp Issued Date
7. Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 4 of 56 Ce CERPASS TECHNOLOGY CORP Report No TECE1107001 1 Declaration of Conformity and the CE Mark There are three possible procedures pertaining to the declaration of conformity 1 1 Conformity Testing and Declaration of Conformity by the Manufacturer or His Authorized Representative Established within the Community or by an Importer Article 10 1 of the EMC Directive 83 1 no 2a of the EMC Act 1 2 Declaration of Conformity Issued by the Manufacturer or His Authorized Representative Established within the Community or by an Importer Following Testing of the Product and Issued of an EC certificate of conformity by a competent body Article 10 2 of the EMC Directive 83 1 no 2b of the EMC Act 1 3 Declaration of Conformity Issued by the Manufacturer or His Authorized Representative Established within the Community or by an Importer Following Testing and Certification of the Product by a Notified Body Article 10 5 of the EMC Directive 83 1 no 2b of the EMC Act radio transmitting installations 1 4 Specimen For The CE Marking Of Electrical Electronical Equipment The components of the CE marking shall have substantially the same vertical dimension which may not be less than 5 mm CO n nII _ S Cerpass Technology Corp Issued Date Jul 28 2011 Tel
8. MHz Read Ant Tab Item Freq Value Factor Result Limit Margin Remark Pos Pos MHz dBuV dB m dBuV m dBuV m dB cm Deg 1 1165 00 56 30 8 38 47 92 76 00 28 08 Peak 100 360 2 1240 00 51 22 7 95 43 27 76 00 32 73 Peak 100 360 3 1500 00 52 78 6 43 46 35 76 00 29 65 Peak 100 360 4 1725 00 48 29 5 03 43 26 76 00 32 74 Peak 100 360 5 2255 00 48 58 2 44 46 14 76 00 29 86 Peak 100 360 6 2430 00 51 29 1 85 49 44 76 00 26 56 Peak 100 360 Remarks 1 Result Read Value Factor 2 Factor Antenna factor Cable loss Amplifier factor GY Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 25 of 56 e C e CERPASS TECHNOLOGY CORP Report No TECE1107001 Power AC 230V Pol Phase HORIZONTAL Test Mode 1 LINK LAN 1Gbps HDD R W Temperature 25 C Memo Humidity 46 Level dBuV m Date 2011 07 05 97 CISPR CLASS A CISPR CLASS A AVE 1000 2000 3000 4000 5000 6000 Frequency MHz Read Ant Tab Item Freq Value Factor Result Limit Margin Remark Pos Pos MHz dBuV dB m dBuV m dBuV m dB cm Deg 1135 00 51 69 8 56 43 13 76 00 32 87 Peak 100 0 2 1240 00 51 08 7 95 43 13 76 00 32 87 Peak 100 0 3 1500 00 51 68 6 43 45 25 76 00 30 75 Peak 100 o 4 1840 00 49 42 4 30 45 12 76 00 30 88 Peak 100 0 5 1905 00 52 38 3 90 48 48 76 00 27 52 Peak 100 0 6 2440 00 52 00 1 81 50 19 76 00 25 81 Peak 100 0 Remarks 1 Resu
9. The polarization of the field generated by the bucolical antenna necessitates testing each position twice once with the antenna positioned vertically and again with the antenna positioned horizontally The circular polarization of the field from the log spiral antenna makes a change of position of the antenna unnecessary d At each of the above conditions the frequency range is swept 80 1000 MHz pausing to adjust the R F signal level or to switch oscillators and antenna The rate of sweep is in the order of 1 5 10 3 decades s The sensitive frequencies or frequencies of dominant interest may be discretely analyzed 8 2 Test Severity Levels Frequency Band 80 1000 MHz Test field strength V m X Specified Remark X is an open class 8 3 Measurement Equipment Instrument Manufacturer Model No Serial No Ao Valid Date Amplifiers 80 1000MHz 100W SCHAFFNER CBA9413B 43510 N A N A Amplifiers 80 3000MHz 20W SCHAFFNER CBA9428 43515 N A N A Antenna SCHAFFNER CBL6141A 4257 N A N A Power Meter Boonton 4231A 01 115902 2010 11 30 2011 11 29 Field Probe HOLADAY HI 6005 00035824 2011 05 19 2012 05 18 Signal Generator HP 8648C 3836U02289 2010 11 12 2011 11 11 Power Sensor Boonton 51011 EMC 33312 2010 11 30 2011 11 29 Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 26
10. 61000 4 6 2008 Power Frequency Magnetic Field IEC 61000 4 8 2009 DIPS IEC 61000 4 11 2004 Frequency Range Investigated Conducted Emission Test from 150kHz to 30 MHz Radiated Emission Test from 30 MHz to 6 000 MHz Test Distance The test distance of radiated emission below 1GHz from antenna to EUT is 10 M The test distance of radiated emission above 1GHz from antenna to EUT is 3M Conducted Emission 30 MHz 1 000 MHz Radiated Emission 1 000 MHz 18 000 MHz Cerpass Technology Corp Tel 886 2 2655 8100 Fax 886 2 2655 8200 Uncertainty 2 71dB 3 52 dB Polarization LINE NEUTRAL Vertical Horizontal Vertical Horizontal 3 39 dB 4 39 dB 5 25 dB Issued Date Jul 28 2011 Page No 8 of 56 Ce CERPASS TECHNOLOGY CORP Report No TECE1107001 2 6 History of this test report E ORIGINAL O Additional attachment as following record Attachment No Issue Date Description 9 Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 9 of 56 LO CERPASS TECHNOLOGY CORP Report No TECE1107001 C 3 Test of Conducted Emission 3 1 Test Limit Conducted Emissions were measured from 150 kHz to 30 MHz with a bandwidth of 9 kHz and return leads of the EUT acc
11. 85 140 195 250 305 Frequency MHz MHz dBuV dB m dBuV m dBuV m dB cm Deg 48 98 61 34 25 09 36 25 40 00 3 75 QP 200 0 2 66 58 58 26 25 43 32 83 40 00 7 17 QP 200 0 3 100 88 56 43 17 51 38 92 40 00 1 08 QP 100 105 4 117 45 48 51 13 68 34 83 40 00 5 17 QP 200 0 5 143 85 51 68 15 47 36 21 40 00 3 79 QP 200 0 6 184 00 49 99 19 36 30 63 40 00 9 37 QP 200 0 Remarks 1 Result Read Value Factor 2 Factor Antenna factor Cable loss Amplifier factor WTSr s KshV Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 21 of 56 CERPASS TECHNOLOGY CORP Report No TECE1107001 Power AC 230V Pol Phase VERTICAL Test Mode 1 LINK LAN 1Gbps HDD R W Temperature 25 C Memo Humidity 46 80 Level dBuV m Date 2011 07 05 CISPR CLASS A 300 440 580 720 860 1000 Frequency MHz Read Ant Tab Item Freq Value Factor Result Limit Margin Remark Pos Pos MHz dBuV dB m dBuV m dBuV m dB cm Deg 500 20 50 13 18 99 31 14 47 00 15 86 QP 100 0 2 624 80 46 31 16 79 29 52 47 00 17 48 QP 100 0 3 750 10 43 92 10 57 88 35 47 00 13 65 QP 100 0 4 792 80 49 08 10 61 38 47 47 00 8 53 QP 100 0 5 833 40 47 32 6 50 40 82 47 00 6 18 QP 100 o 6 875 40 42 85 7 14 dna 47 00 11 29 QP 100 0 7 937 70 39 26 3 25 36 01 47 00 10 99 QP 100 0 Remarks 1 Result Read Value Factor 2 Factor Ant
12. A A A LED A A A A A A Note A means the EUT function is normal working during the test Test engineer Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 36 of 56 SP se CERPASS TECHNOLOGY CORP Report No TECE1107001 eg V 7 6 Test Photographs Front View Rear View Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 37 of 56 Ce CERPASS TECHNOLOGY CORP Report No TECE1107001 8 Radio Frequency electromagnetic field immunity test 8 1 Test Procedure a The equipment to be tested is placed in the center of the enclosure on a wooden table The equipment is then connected to power and signal leads according to pertinent installation instructions b The antenna which is enabling the complete frequency range of 80 1000 MHz is placed 3m away from the equipment The required field strength is determined by placing the field strength meter s on top of or directly alongside the equipment under test and monitoring the field strength meter via a remote field strength indicator outside the enclosure while adjusting the continuous wave to the applicable antennae c The test is normally performed with the antenna facing the most sensitive side of the EUT
13. CERPASS TECHNOLOGY CORP Report No TECE1107001 9 Electrical Fast Transient Burst Immunity Test 9 1 Test Procedure a In order to minimize the effect of environmental parameters on test results the climatic conditions when test is carrying out shall comply with the following requirements ambient temperature 15 C to 35 C relative humidity 45 to 75 Atmospheric pressure 86 Kpa 860 mbar to 106 Kpa 1060 mbar b In order to minimize the effect of environmental parameters on test results the electromagnetic environment of the laboratory shall not influence the test results c The variety and diversity of equipment and systems to be tested make it difficult to establish general criteria for the evaluation of the effects of fast transients bursts on equipment and systems d Test on Power Line The EFT B generator was located on the GRP The length from the EFT B generator to the EUT is not exceeding 1 m The EFT B generator provides the ability to apply the test voltage in a non symmetrical condition to the power supply input terminals of the EUT e Test on Communication Lines The coupling clamp is composed of a clamp unit for housing the cable length more than 3 m and was placed on the GRP The coupling clamp provides the ability of coupling the fast transient bursts to the cable under test f The test results may be classified on the basic of the operating conditions and the functional specificatio
14. Voltage KV of Level Test Voltage KV of Contact discharge Air Discharge 1 2 1 2 2 4 2 4 3 6 3 8 4 8 4 15 X Specified X Specified Remark X is an open level 7 4 Measurement Equipment Instrument Manufacturer Model No Serial No Calibration Date Valid Date ESD Simulator Schaffner NSG438 878 2011 06 16 2012 06 15 Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 35 of 56 O CE CERPASS TECHNOLOGY CORP Report No TECE1107001 7 5 Test Result and Data Final Test Result PASS Pass performance criteria A Required performance criteria B Basic Standard IEC 61000 4 2 Product Standard EN 55024 Test votage EE Temperature 25 C Relative Humidity 51 Atmospheric Pressure 1012 hPa Test Date Jul 27 2011 Contact Discharge Air Discharge 25 times each 10 times each Voltage 2KV 4 KV 2 KV 4 KV 8 KV Point Polarity 0 l 0 0 HCP A A A A VCP A A A A Case A A A A Screw A A A A Power Port A A A A A A RJ45 Port A A A A Console Port A A A A Button A A A A A A Panel A A A
15. product standard or test plan g All lower levels including the selected test level shall be satisfied For testing the secondary protection the output voltage of the generator shall be increased up to the worst case voltage breakdown level let through level of the primary protection h Ifthe actual operating signal sources are not available that may be simulated Under no circumstances may the test level exceed the product specification The test shall be carried out according to a test plan i To find all critical points of the duty cycle of the equipment a sufficient number of positive and negative test pulses shall be applied For acceptance test previously unstressed equipment shall be used to the protection devices shall be replaced 10 2 Test Severity Level Open circuit test voltage 10 KV Specified NOTE X is an open class This level can be specified in the product specification Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 45 of 56 Ce i CERPASS TECHNOLOGY CORP Report No TECE1107001 10 3 Measurement Equipment Instrument Manufacturer Model No Serial No Calibration Date Valid Date EMC Pro KeyTek EMC Pro 0309207 2011 03 24 2012 03 23 10 4 Test Result and Data Final Test Result PASS Pass performance criteria A Required performance criteria B Basic Standard IEC
16. steel ground reference plane The minimum size of the ground reference plane is 2 5 m x 2 5 m the exact size depending on the dimensions of the EUT It was connected to the protective grounding system The EUT was arranged and connected according to its functional requirements A distance of 1m minimum was provided between the EUT and the wall of the lab and any other metallic structure In cases where this length exceeds the length necessary to apply the discharges to the selected points the excess length shall where possible be placed non inductively off the ground reference plane and shall not come closer than 0 2m to other conductive parts in the test setup Where the EUT is installed on a metal table the table was connected to the reference plane via a cable with a 470k ohm resister located at each end to prevent a build up of charge The test setup was consist a wooden table 0 8m high standing on the ground reference plane A HCP 1 6 m x 0 8 m was placed on the table The EUT and cables was isolated from the HCP by an insulating support 0 5 mm thick The VCP size 0 5 m x 0 5 m 9 Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 34 of 56 Ce CERPASS TECHNOLOGY CORP Report No TECE1107001 7 3 Test Severity Levels Contact Discharge Air Discharge Level Test
17. 0 125 0 00 Pst classifier Duration Flicker 0 1 0 16 0 7 0 12 1 0 0 311 1 5 0 10 2 2 0 09 3 0 09 4 0 08 6 0 07 8 0 06 10 0 05 13 0 05 17 0 04 30 0 03 50 0 02 80 0 01 Test engineer ni Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 31 of 56 SP LO C e CERPASS TECHNOLOGY CORP Report No TECE1107001 e 7 U U U U lll C 6 4 Test Photographs Front View Rear View Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 82 of 56 O CE CERPASS TECHNOLOGY CORP Report No TECE1107001 7 Electrostatic Discharge Immunity Test 7 1 Test Procedure a In the case of air discharge testing the climatic conditions shall be within the following ranges e ambient temperature 15 C to 35 C relative humidity 30 to 60 atmospheric pressure 86 KPa 860 mbar to 106 KPa 1060 mbar b Test programs and software shall be chosen so as to exercise all normal modes of operation of the EUT The use of special exercising software is encouraged but permitted only where it can be shown that the EUT is being comprehensively exercised CH The test voltage shall be increased from the minimum to the selected test severity level in order to determine any threshold of failure The final severity level should not exceed the product specification va
18. 05 74 000 21 395 Average 12 18 920 45 336 10 512 55 848 387 000 31 152 OP Remarks 1 Result Read Value Factor 2 Factor LISN ISN Factor Cable Loss Test engineer 9 Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 15 of 56 SN se CERPASS TECHNOLOGY CORP Report No TECE1107001 e AAA AA I III TIL ZK 1 r rr 3 6 Test Photographs of Power Port Front View Rear View Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 16 of 56 AP LO C CERPASS TECHNOLOGY CORP Report No TECE1107001 C MM M a 2 3 7 Test Photographs of Telecommunication Port Rear View Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 17 of 56 ro CERPASS TECHNOLOGY CORP Report No TECE1107001 C 4 Test of Radiated Emission 4 1 Test Limit The EUT shall meet the limits of below Table when measured at the measuring distance R in accordance with the methods described in European Standard EN 55022 Clause 10 If the reading on the measuring receiver shows fluctuations close to the limit the reading shall be observed for at least 15 s at each measurement frequency the highest reading shall be recorded with the exception of any brie
19. 26 45 953 74 000 28 047 Average 7 663 41 411 10 426 51 837 87 000 35 163 QP 9 808 22 854 10 513 33 367 74 000 40 633 Average 9 808 26 053 10 513 36 566 387 000 50 434 QP 10 000 37 682 10 520 48 202 74 000 25 798 Average 10 10 000 43 389 10 520 53 909 87 000 33 091 QFP 11 12 500 49 382 310 521 59 903 74 000 14 097 Average 12 12 800 55 510 10521 66 031 87 000 20 969 QP Remarks 1 Result Read Value Factor 2 Factor LISN ISN Factor Cable Loss n SS II Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 14 of 56 se CERPASS TECHNOLOGY CORP Report No TECE1107001 Power AC 230V Temperature 23 C Test Mode2 ISN LAN 100Mbps Humidity 57 Yo Memo Level dBuV Date 2011 07 06 120 CLASS A4SN Frequency MHz Read Item Freq Value Factor Result Limit Margin Remark MHz dBuV dB dBuV dBuV dBuV 1 765 39 457 10 076 49 533 74 000 24 467 Average 2 765 42 115 10 076 52 191 87 000 34 809 OP 3 940 43 855 10 518 54 373 74 000 19 627 Average 4 940 46 559 10 518 57 077 87 000 29 923 QP 5 11 650 42 240 10 521 52 761 74 000 21 239 Average 6 11 650 46 260 10 521 56 781 87 000 30 219 OP z 14 030 45 323 10 518 55 841 74 000 18 159 Average 8 14 030 48 492 10 518 59 010 87 000 27 990 QP 9 17 690 41 003 10 514 51 517 74 000 22 483 Average 10 17 690 43 969 10 514 54 483 387 000 32 517 QP 11 18 920 42 093 10 512 52 6
20. 55 8200 Page No 38 of 56 Ce CERPASS TECHNOLOGY CORP Report No TECE1107001 8 4 Test Result and Data Final Test Result PASS Pass performance criteria A Required performance criteria A Basic Standard IEC 61000 4 3 Product Standard EN 55024 Frequency Range 80 1000 MHz Temperature 24 C Relative Humidity 52 Atmospheric Pressure 1012 hPa Test Date Jul 22 2011 Modulation AM 80 1KHz sine wave Dwell time 2 9 S Frequency Step Size 1 96 of preceding frequency value Frequency MHz Antenna Polarization face Field strength V m Result 80 1000 Vertical Front 3 V m A 80 1000 Vertical Rear 3 V m A 80 1000 Vertical Left 3 V m A 80 1000 Vertical Right 3 V m A 80 1000 Horizontal Front 3 V m A 80 1000 Horizontal Rear 3 V m A 80 1000 Horizontal Left 3 V m A 80 1000 Horizontal Right 3 V m A Note A means the EUT function is normal working during the test Test engineer Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 39 of 56 a LO C e CERPASS TECHNOLOGY CORP Report No TECE1107001 8 5 Test Photographs Front View Rear View Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 40 of 56 Ce
21. 61000 4 5 Product Standard EN 55024 Test Voltage Input AC Power Port 0 5 kV 1 0 kV 2 0 kV Temperature 24 C Relative Humidity 53 Atmospheric Pressure 1012 hPa Test Date Jul 26 2011 Power Port Waveform 1 2 50us 8 20us Repetition rate 60 sec Time 5 time each condition Phase Voltage Mode Polarity Result 0 90 180 270 0 5 kV 1 0kV L N M a 2 i A A A A A A A A ud M L PE N PE e FI P Note A means the EUT function is normal working during the test Signal Port RJ45 where normal functioning cannot be achieved because of the impact of the CDN on the EUT Test engineer 9 Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 46 of 56 se CERPASS TECHNOLOGY CORP Report No TECE1107001 C SO 10 5 Test Photographs Front View Rear View Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 47 of 56 Ce CERPASS TECHNOLOGY CORP Report No TECE1107001 11 Conduction Disturbances induced by Radio Frequency Fields 11 1 Test Procedure a The EUT shall be operated within its intended climatic conditions The temperature and relative humidity should be recorded b This test method test can be performed without using a sell shielded encl
22. 886 2 2655 8100 Fax 886 2 2655 8200 Page No 5 of 56 O CE i CERPASS TECHNOLOGY CORP Report No TECE1107001 2 Test Configuration of Equipment under Test 2 1 Feature of Equipment under Test Please refer to user manual 2 2 Test Manner a During testing the interface cables and equipment positions were varied according to Europe Standard EN55022 Class A b The complete test system included PC Monitor Keyboard Mouse Modem Printer and EUT for EMI test c The complete test system included PC Monitor Keyboard Mouse and EUT for EMS test d The test mode of conduction radiation and EMS test as follow Test Mode 1 LINK LAN 1Gbps HDD R W e The test modes of disturbances at telecommunication ports test as follow Test Mode 1 ISN LAN 10Mbps Test Mode 2 ISN LAN 100Mbps Test Mode 3 ISN LAN 1 10Mbps Test Mode 4 ISN LAN 1 100Mbps Test Mode 5 ISN LAN 1 1Gbps Test Mode 6 ISN LAN 2 10Mbps Test Mode 7 ISN LAN 2 100Mbps Test Mode 8 ISN LAN 2 1Gbps The Test Mode 1 2 generated the worst test result they were reported as final data f During the disturbances at telecommunication port test the condition of LAN utilization in excess of 10 g An executive program WINFCC exe under WIN 2008 which generates a complete line of continuously repeating H pattern was used as the test software The program was executed as follows 1 Turn on the power of all equipment 2 The PC reads the test prog
23. ERPASS TECHNOLOGY CORP Report No TECE1107001 3 2 Test Procedures a The EUT was placed on a desk 0 8 meters height from the metal ground plane and 0 4 meter from the conducting wall of the shielding room and it was kept at least 0 8 meters from any other grounded conducting surface Connect EUT to the power mains through a line impedance stabilization network LISN All the support units are connecting to the other LISN The LISN provides 50 ohm coupling impedance for the measuring instrument The CISPR states that a 50 ohm 50 micro Henry LISN should be used Both sides of AC line were checked for maximum conducted interference The frequency range from 150 kHz to 30 MHz was searched Set the test receiver system to Peak Detect Function and Specified Bandwidth with Maximum Hold Mode Ta so 3 3 Typical Test Setup 3 4 Measurement Equipment Instrument Manufacturer Model No Serial No Calibration Date Valid Date EMI Receiver R amp S ESCI 100443 2011 02 08 LISN Schwarzbeck NSLK 8127 8127 516 2011 05 05 LISN Schwarzbeck NSLK 8127 8127 568 2010 09 17 ISN TESEQ GMBH ISN T8 24315 2011 06 01 Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 11 of 56 ER oe CERPASS TECHNOLOGY CORP 3 5 Test Result and Data 3 5 1 Conducted Emission for Power Port Test Data Report No TECE1107001 C
24. HDD RW Temperature 25 C Memo Humidity 46 80 Level dBuV m Date 2011 07 05 CISPR CLASS A 300 440 580 720 860 1000 Frequency MHz Read Ant Tab em Freq Value Factor Result Limit Margin Remark Pos Pos MHz dBuV dB m dBuV m dBuV m dB cm Deg 432 30 46 89 19 70 27 19 47 00 19 81 QP 100 0 500 20 52 28 16 35 35 93 47 00 11 07 QP 100 0 624 80 43 98 12 88 31 10 47 00 15 90 QP 100 0 792 10 42 24 8 30 33 94 47 00 13 06 QP 100 0 833 40 42 46 7 32 35 14 47 00 11 86 QP 100 o 875 40 40 71 7 87 32 84 47 00 14 16 QP 100 0 937 70 37 82 6 57 31 25 47 00 15 75 QP 100 0 1000 00 42 97 6 38 36 59 47 00 10 41 QP 100 0 Remarks 1 Result Read Value Factor 2 Factor Antenna factor Cable loss Amplifier factor 8 Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 24 of 56 SN se CERPASS TECHNOLOGY CORP Report No TECE1107001 E 4 6 Test Result and Data 1GHz 6GHz Power AC 230V Pol Phase VERTICAL Test Mode 1 LINK LAN 1Gbps HDD R W Temperature 25 C Memo Humidity 46 97 Level dBuV m Date 2011 07 05 CISPR CLASS A CISPR CLASS A AVE 1000 2000 3000 4000 5000 6000 Frequency
25. SS Pass performance criteria A Required performance criteria A Basic Standard IEC 61000 4 6 Product Standard EN 55024 Coupling mode CDN M3 for AC power ports CDN T400 for Signal Ports Temperature 24 C Relative Humidity 52 96 Atmospheric Pressure 1012 hPa Test Date Jul 22 2011 Frequency 0 15 80MHz Modulation AM 8096 1KHz sine wave Dwell time 2 9s Frequency Step Size 1 96 of preceding frequency value Frequency Test Mode Voltage V Result 0 15 80MHz Power M3 3 A 0 15 80MHz RJ45 LAN 10M 100M 3 A 0 15 80MHz Clamp 1G 3 A Note A Means the EUT function is normal working during the test Test engineer i Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 49 of 56 e CERPASS TECHNOLOGY CORP Report No TECE1107001 C fe ee eee SS l 11 5 Test Photographs Front View Rear View Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 50 of 56 e c e CERPASS TECHNOLOGY CORP Report No TECE1107001 12 Power Frequency Magnetic Field Immunity Test 12 1 Test Setup GPR Ground plane C1 Power supply circuit A Safety earth C2 Signal circuit S Insulating support L Communication line EUT Equipment under test B To power supply source Lc Inducti
26. and reported Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 19 of 56 ro 4 3 Typical Test Setup Receiver Antenna CERPASS TECHNOLOGY CORP Test distance Report No TECE1107001 C Equipment under Test Ground Plane Turn Table 4 4 Measurement Equipment Instrument Manufacturer Model No Serial No Calibration Date Valid Date Amplifier Agilent 8447D 2944A10531 2011 01 21 2012 01 20 Bilog Antenna Schaffner CBL6112D 22242 2011 02 09 2012 02 08 EMI Receiver HP 8546A 3807A00454 2010 09 27 2011 09 26 RF Filter Section HP 85460A 3704A00386 2010 09 27 2011 09 26 Spectrum Analyzer R amp S FSP40 100219 2010 11 05 2011 11 04 Horn Antenna EMCO 3115 31589 2011 05 02 2012 05 01 Preamplifier Agilent 8449B 3008A01954 2011 03 02 2012 03 01 EI tttt r I I Cerpass Technology Corp Tel 886 2 2655 8100 Fax 886 2 2655 8200 Issued Date Page No Jul 28 2011 20 of 56 A CERPASS TECHNOLOGY CORP Report No TECE1107001 4 5 Test Result and Data 30MHz 1GHz Power AC 230V Pol Phase VERTICAL Test Mode 1 LINK LAN 1Gbps HDD R W Temperature 25 C Memo Humidity 46 80 Level dBuV m Date 2011 07 05 CISPR CLASS A 30
27. c Pressure 1012 hPa Test Date Jul 26 2011 Voltage UT AC 230 V 50 Hz Interval s 105 Times 3 Test level Phase Result Test mode reduction URBS S period 0 180 Voltage interruptions gt 95 250 B B 30 25 A A Voltage dips gt 95 0 5 A A Note A means the EUT function is normal working during the test B means the EUT function is affected during the test but it can be recovered automatically after a while Test engineer Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 55 of 56 se CERPASS TECHNOLOGY CORP Report No TECE1107001 C SO nD N I IIo 13 4 Test Photographs Front View Rear View Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 56 of 56 e CERPASS TECHNOLOGY CORP Report No TECE1107001 C Appendix A Photographs of EUT Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No A1 of A4 iv Ne CERPASS TECHNOLOGY CORP Report No TECE1107001 C DLL ILLI AA ua Y as LU Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No A2 of A4 e CERPASS TECHNOLOGY CORP Report No TECE1107001 C Nr i a f
28. ce the value of the specified test level g In cases of dispute the test procedure using a step size not exceeding 1 of the start and thereafter 196 of preceding frequency value shall take precedence h Attempts should be made to fully exercise the EUT during testing and to fully interrogate all exercise modes selected for susceptibility i The use of special exercising programs is recommended j Testing shall be performed according to a Test Plan which shall be included in the test report k It may be necessary to carry out some investigatory testing in order to establish some aspects of the test plan 11 2 Test Severity Levels Voltage Level EMF 1V 3V 10V Specified NOTE x is an open class This level can be specified in the product specification 11 3 Measurement Equipment Instrument Manufacturer Model No Serial No Calibration Date Valid Date CS GENERATOR Schaffner NSG 2070 1059 2010 10 06 2011 10 05 CDN M2 M3 Schaffner M016 20056 2010 10 05 2011 10 04 CDN Schaffner T400 19818 2010 10 05 2011 10 04 EM CLAMP Schaffner KEMZ 801 19793 2010 10 05 2011 10 04 Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 48 of 56 LO CE CERPASS TECHNOLOGY CORP Report No TECE1107001 11 4 Test Result and Data Final Test Result PA
29. e internal sources of the EUT is above 1 GHz the measurement shall be made up to 5 times the highest frequency or 6 GHz whichever is less i Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 18 of 56 e CE CERPASS TECHNOLOGY CORP Report No TECE1107001 4 2 Test Procedures a The EUT was placed on a rotatable table top 0 8 meter above ground b The EUT was set 3 10 meters from the interference receiving antenna which was mounted on the top of a variable height antenna tower c The table was rotated 360 degrees to determine the position of the highest radiation The antenna is a half wave dipole and its height is varied between one meter and four meters above ground to find the maximum value of the field strength both horizontal polarization and vertical polarization of the antenna are set to make the measurement e For each suspected emission the EUT was arranged to its worst case and then tune the antenna tower from 1 M to 4 M and turn table from 0 degree to 360 degrees to find the maximum reading f Set the test receiver system to Peak Detect Function and specified bandwidth with Maximum Hold Mode g Ifthe emission level of the EUT in peak mode was 3 dB lower than the limit specified then testing will be stopped and peak values of EUT will be reported otherwise the emissions which do not have 3 dB margin will be repeated one by one using the quasi peak method
30. e whole assessment procedure 6 2 Measurement Equipment Instrument Manufacturer Model No Serial No Calibration Date Valid Date EENS TTI HA1600 198226 2010 12 28 2011 12 27 Analyzer Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 30 of 56 SN g CE oe CERPASS TECHNOLOGY CORP Report No TECE1107001 6 3 Test Result and Data Final Test Result PASS Basic Standard EN 61000 3 3 Temperature 27 C Test Data Jul 15 2011 Relative Humidity 54 96 Supply Voltage 230 7 to 230 8 Vrms 328 4 Vpk Frequency 50 00 Hz THD 0 5 Crest Factor 1 423 peak at 89 2 deg Load Power 0 072 to 0 081 kW 0 091 KVA Power Factor 0 891 Load Current 0 36 to 0 39 Arms 0 65 Apk Crest Factor 1 568 Voltage Variations Highest Half cycle level 0 83 Lowest Half cycle level 0 06 d max 0 88 Pass Number of Change Intervals 34 Highest d t for 500 ms 0 08 pass Longest d t over 3 30 0 02 seconds Steady Stater definition gt 1000 ms below 0 32 Highest Steady State level 0 33 Lowest Steady State level 0 31 max d c between adjacent 0 01 Pass max d c between any 0 01 Flicker Long term Flicker indicator Plt 0 14 Short term Flicker indicator Pst Plt Interval Pst Ls 0 18 23 0 19 3 0 19 4 0 19 5t 0 19 6 0 19 753 0 18 8 0 00 9 0 00 10 0 00 dele 0 0
31. enna factor Cable loss Amplifier factor OO_ m_E gt gt zy gt kz lt D gt sg Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 22 of 56 e C oe CERPASS TECHNOLOGY CORP Report No TECE1107001 Power AC 230V Pol Phase HORIZONTAL Test Mode 1 LINK LAN 1Gbps HDD RW Temperature 25 C Memo Humidity 46 80 Level dBuV m Date 2011 07 05 CISPR CLASS A 30 85 140 195 250 305 Frequency MHz Read Ant Tab Item Freq Value Factor Result Limit Margin Remark Pos Pos MHz dBuV dB m dBuV m dBuV m dB cm Deg 1 53 93 58 21 27 99 30 22 40 00 9 78 QP 200 0 2 99 85 66 31 30 63 35 68 40 00 4 32 QP 200 0 3 148 80 54 54 27 74 26 80 40 00 13 20 QP 200 0 4 172 18 55 91 28 85 27 06 40 00 12 94 QP 200 0 5 201 60 53 98 29 55 24 43 40 00 15 57 QP 200 0 6 250 00 54 66 26 71 27 95 47 00 19 05 QP 200 0 Remarks 1 Result Read Value Factor 2 Factor Antenna factor Cable loss Amplifier factor 8 Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 23 of 56 SN 2 CERPASS TECHNOLOGY CORP Report No TECE1107001 C Power AC 230V Pol Phase HORIZONTAL Test Mode 1 LINK LAN 1Gbps
32. f isolated high reading which shall be ignored Table Limits for radiated disturbance of class A ITE at a measuring distance of 10 m Frequency range Quasi peak limits MHz dB uV m 30 to 230 40 230 to 1000 47 NOTE 1 The lower limit shall apply at the transition freguency NOTE 2 Additional provisions may be required for cases where interference occurs The EUT shall meet the limits of below Table when measured in accordance with the method described in European Standard EN 55022 Clause 10 and the conditional testing procedure described below Table Limits for radiated disturbance of class A ITE at a measuring distance of 3 m Frequency range Average limit Peak limits GHz dB uV m dB uV m 1 to 3 56 76 3 to 6 60 80 NOTE The lower limit applies at the transition frequency Conditional testing procedure The highest internal source of an EUT is defined as the highest frequency generated or used within the EUT or on which the EUT operates or tunes If the highest frequency of the internal sources of the EUT is less than 108 MHz the measurement shall only be made up to 1 GHz If the highest frequency of the internal sources of the EUT is between 108 MHz and 500 MHz the measurement shall only be made up to 2 GHz If the highest frequency of the internal sources of the EUT is between 500 MHz and 1 GHz the measurement shall only be made up to 5 GHz If the highest frequency of th
33. ic pressure 86 kPa to 106 kPa 860 mbar to 1060 mbar b Electromagnetic conditions the electromagnetic environment of the laboratory shall not influence the test results c The test shall be performed according the test plan that shall specify the test set up with generator and other equipment utilized test level voltage current generator source impedance internal or external generator trigger number of tests at least five positive and five negative at the selected points repetition rate maximum 1 min inputs and outputs to be tested representative operating conditions of the EUT sequence of application of the surge to the circuit phase angle in the case of AC power supply actual installation conditions for example AC neutral earthed DC or earthed to simulated the actual earthing conditions d If not otherwise specified the surges have to be applied synchronized to the voltage phase at the zero crossing and the peak value of the AC voltage wave positive and negative e The surges have to be applied line to line and line s and earth When testing line to earth the test voltage has to be applied successively between each of the lines and earth if there is no other specification f The test procedure shall also consider the non linear current voltage characteristics of the equipment under test Therefore the test voltage has to be increased by steps up to the test level specified in the
34. it Margin Remark MHz dBuV dB dBuV dBuV dBuV 0 150 21 341 0 096 21 437 66 000 44 563 Average 0 150 31 858 0 096 31 954 79 000 47 046 QP 22 110 38 903 0 783 39 686 60 000 20 314 Average 22 110 46 279 0 783 47 062 373 000 25 938 QP 23 890 43 609 0 818 44 427 60 000 15 573 Average 23 890 51 966 0 818 52 784 73 000 20 216 QP 24 610 43 535 0 833 44 368 60 000 15 632 Average 24 610 50 646 0 833 51 479 73 000 21 521 QP 26 400 49 364 0 874 50 238 60 000 9 762 Average 26 400 57 872 0 874 58 746 73 000 14 254 QP 27 450 47 697 0 900 48 597 60 000 11 403 Average 27 450 56 300 0 900 57 200 73 000 15 800 QP Remarks 1 Result Read Value Factor 2 Factor LISN ISN Factor Cable Loss Jul 28 2011 13 of 56 hnology Corp Issued Date Page No Pa se CERPASS TECHNOLOGY CORP Report No TECE1107001 e _ I L_1l _r tt __ _ rrmrrrrr_________ m 3 5 2 Conducted Emission for Telecommunication Port Test Data Power AC 230V Temperature 23 C Test Mode1 ISN LAN 10Mbps Humidity 57 Memo Level dBuV Date 2011 07 06 120 CLASS A SN CLASS A ISN AVG Frequency MHz Read Item Freq Value Factor Result Limit Margin Remark MHz dBuV dB dBuV dBuV dBuV 0 767 39 796 10 076 49 872 74 000 24 128 Average 0 767 41 782 10 076 51 858 87 000 35 142 QP 7 011 29 361 10 398 39 759 74 000 34 241 Average 7 011 34 075 10 398 44 473 87 000 42 527 QP 7 663 35 527 10 4
35. lding 1 35 m Keyboard DELL SK 8115 USB Cable Shielding 1 85m Mouse DELL MOC5UO USB Cable Shielding 1 85m Use Cable Cable Quantity Description RJ45 3 Unshielding 1 8m Console 1 Unshielding 1 5m RS232 1 Unshielding 1 5m RR Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 7 of 56 fo CERPASS TECHNOLOGY CORP Report No TECE1107001 C 2 4 General Information of Test 2 5 Measurement Uncertainty Measurement Item Measurement Frequency 9 kHz 30 MHz Test Site Cerpass Technology Corp 2F 11 No 3 Yuan Qu St Nankang Software Park Taipei Taiwan 115 R O C Test Site Location OATS2 SD No 68 1 Shihbachongsi Shihding Township Taipei City 223 Taiwan R O C FCC Registration Number TW1049 TW1061 488071 390316 IC Registration Number 4934B 1 4934D 1 VCCI Registration Number T 543 for Telecommunication Test C 3328 for Conducted emission test R 3013 for Radiated emission test G 97 for radiated disturbance above 1GHz Test Voltage AC 230V 50Hz Test in Compliance with EMI Test conduction and radiation EN 55022 2006 A1 2007 Class A Harmonics Test EN 61000 3 2 2009 Voltage Fluctuations Test EN 61000 3 3 2008 EMS Test EN 55024 1998 A1 2001 A2 2003 ESD IEC 61000 4 2 2008 RS IEC 61000 4 3 2010 EFT IEC 61000 4 4 2010 SURGE IEC 61000 4 5 2005 CS IEC
36. lt Read Value Factor 2 Factor Antenna factor Cable loss Amplifier factor Test engineer sT n ss Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 26 of 56 SN g CE oe CERPASS TECHNOLOGY CORP Report No TECE1107001 4 7 Test Photographs Front View Rear View T 7 a E Beet Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 27 of 56 Ce CERPASS TECHNOLOGY CORP Report No TECE1107001 5 Harmonics Test 5 1 Limits of Harmonics Current Measurement Limits for Class A equipment Limits for Class D equipment Harmonics Max Permissible Harmonics Max Permissible Max Permissible Order harmonics Order harmonics current per harmonics current n current n watt mA W A A Odd Harmonics only Odd harmonics 3 3 4 2 30 3 2 30 5 1 9 1 14 5 1 14 7 1 0 0 77 7 0 77 9 0 5 0 40 9 0 40 11 0 35 0 33 11 0 33 13 0 30 0 21 13 0 21 15 lt n lt 39 3 85 n 0 15 x15 n 15 lt n lt 39 0 15x 15 n Even harmonics 2 1 08 4 0 43 6 0 30 8 n 40 0 23x8 n NOTE 1 Class A and Class D are classified according to item section 5 of EN 61000 3 2 2006 A1 2009 A2 2009 2 According go section 7 of EN 61000 3 2 2006 A1 2009 A2 2009 the above limits for all equipment except for lighting equipment are for all applications having a
37. lue in order to avoid damage to the equipment d The test shall be performed with both air discharge and contact discharge On reselected points at least 10 single discharges in the most sensitive polarity shall be applied on air discharge On reselected points at least 25 single discharges in the most sensitive polarity shall be applied on contact discharge e For the time interval between successive single discharges an initial value of one second is recommended Longer intervals may be necessary to determine whether a system failure has occurred f In the case of contact discharges the tip of the discharge electrode shall touch the EUT before the discharge switch is operated g In the case of painted surface covering a conducting substrate the following procedure shall be adopted fthe coating is not declared to be an insulating coating by the equipment manufacturer then the pointed tip of the generator shall penetrate the coating so as to make contact with the conducting substrate Coating declared as insulating by the manufacturer shall only be submitted to the air discharge The contact discharge test shall not be applied to such surfaces h In the case of air discharges the round discharge tip of the discharge electrode shall be approached as fast as possible without causing mechanical damage to touch the EUT After each discharge the ESD generator discharge electrode shall be removed from the EUT The generato
38. n active input power 75 W and no limits apply for equipment with an active input power up to and including 75 W 5 2 Measurement Equipment Instrument Manufacturer Model No Serial No Calibration Date Valid Date Power Hanania TTI HA1600 198226 2010 12 28 2011 12 27 Analyzer 9 Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 28 of 56 SN g CE se CERPASS TECHNOLOGY CORP Report No TECE1107001 5 3 Test Result and Data Final Test Result PASS Basic Standard EN 61000 3 2 Temperature 27 C Test Data Jul 15 2011 Relative Humidity 54 96 Supply Voltage 230 8 Vrms 328 4 Vpk Frequency 50 00 Hz THD 0 5 Crest Factor 1 423 peak at 89 4 deg Failed Crest Limits Load Power 72 74 to 76 77 W 86 83 VA Power Factor 0 884 Load Current 359 to 376 mArms 603 mApk Crest Factor 1 579 Limits EN 61000 3 2 2006 Class D limits for 77W maximum power Harmonic Limit Average Maximum Time Assessment Number current current Limit current Limit gt 150 mA mA mA Fundamental 361 8 365 1 2 3 3 Lal 3 261 1 38 3 14 7 38 5 14 8 Pass 4 0 8 2o DE 145 9 Zal 2 26 1 8 Pass 6 0 7 1 3 gt 7 76 8 6 1 8 0 6 2 8 3 Pass 8 0 5 0 9 9 38 4 5 7 14 8 557 15 1 Pass 10 0 4 0 8 11 26 9 4 3 a 4 7 17 6 Pass 12 0 4 0 7
39. n of the equipment under test according to the following performance criteria Normal performance within the specification limits Temporary degradation or loss of function or performance which is self recoverable Temporary degradation or loss of function or performance which requires operator intervention or system reset Degradation or loss of function which is not recoverable due to damage of equipment components 9 2 Test Severity Levels The following test severity levels are recommended for the fast transient burst test X Specified Specified Remark X is an open level The level is subject to negotiation between the user and manufacturer or is specified by the manufacturer 9 3 Measurement Equipment Instrument Manufacturer Model No Serial No Calibration Date Valid Date EMC Pro KeyTek EMC Pro 0309207 2011 03 24 2012 03 23 _ n VA I AAr HnV O r 1 e V Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 41 of 56 LO CE i CERPASS TECHNOLOGY CORP Report No TECE1107001 9 4 Test Result and Data Final Test Result PASS Pass performance criteria A Required performance criteria B Basic Standard IEC 61000 4 4 Product Standard EN 55024 Test Voltage A ee Temperature 24 C Relative Humidity 53 Atmospheric Pressure 1012 hPa Test Da
40. on coil D To signal source simulator E Earth terminal G To the test generator 12 2 Test Severity Levels Level Magnetic field strength A m 1 1 2 3 3 10 4 30 5 100 x special NOTE 1 X is an open level This level can be given in the product specification 12 3 Measurement Equipment Instrument Manufacturer Model No Serial No Calibration Date Valid Date Magnetic Field F 1000 4 8 G KAA KeyTek 125A N A 2010 10 05 2011 10 04 9 Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 51 of 56 O CE CERPASS TECHNOLOGY CORP Report No TECE1107001 12 4 Test Result and Data Final Test Result PASS Pass performance criteria A Required performance criteria A Basic Standard IEC 61000 4 8 Product Standard EN 55024 Temperature 24 C Relative Humidity 53 Atmospheric Pressure 1012 hPa Test Date Jul 22 2011 Power Frequency Magnetic Field 50 Hz _1 A m Coil Orientation Testing duration Note A Mean the EUT function is normal working during the test Test engineer n F n V 8 Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 52 of 56 a se CERPASS TECHNOLOGY CORP Report No TECE1107001 oe e e
41. ording to the methods defined in European Standard EN 55022 The EUT was placed on a nonmetallic stand in a shielded room 0 8 meters above the ground plane as shown in section 4 2 The interface cables and equipment positioning were varied within limits of reasonable applications to determine the position producing maximum conducted emissions Table 1 Class A Line Conducted Emission Limits Frequency range Limits dB p V MHz Quasi Peak Average 0 15 to 0 50 79 66 0 50 to 30 73 60 Note The lower limits shall apply at the transition freguencies Table 2 Limits of conducted common mode asymmetric mode disturbance at telecommunication ports in the frequency range 0 15 MHz to 30 MHz for class A equipment Frequency Voltage limits Current limits range dB pu V dB u A MHz Quasi peak Average Quasi peak Average 0 15 to 0 5 97 to 87 84 to 74 53 to 43 40 to 30 0 5 to 30 87 74 43 30 Note 1 The limits decrease linearly with the logarithm of the frequency in the range 0 15 to 0 5 MHz Note 2 The current and voltage disturbance limits are derived for use with an impedance stabilization network ISN which presents a common mode asymmetric mode impedance of 1500 to the telecommunication under test conversion factor is 20 log4o 150 1 44dB 8 Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 10 of 56 Ce C
42. osure This is because the disturbance levels applied and the geometry of the setups are not likely to radiated a high amount of energy especially at the lower frequencies If under certain circumstances the radiated energy is too high a shielded enclosure has to be used c Thetest shall be performed with the test generator connected to each of the coupling and decoupling devices in turn while the other non excited RF input ports of the coupling devices are terminated by a 50 ohm load resistor d The frequency range is swept from 150 KHz to 80 MHz using the signal levels established during the setting process and with the disturbance signal 80 amplitude modulated with a 1KHz sign wave pausing to adjust the RF signal level or to switch coupling devices as necessary The rate of sweep shall no exceed 1 5 x 10 decades s Where the frequency is swept incrementally the step size shall no exceed 196 of the start and thereafter 196 of the preceding frequency value e The dwell time at each frequency shall not be less than the time necessary for the EUT to be exercised and able to respond Sensitive frequencies e g clock frequency ies and harmonics or frequencies of dominant interest shall be analyzed separately f An alternative test procedure may be adopted wherein the frequency range is swept incrementally with a step size not exceeding 496 of the start ad thereafter 496 of the preceding frequency value The test level should be at least twi
43. r is then retriggered for a new single discharge This procedure shall be repeated until the discharges are completed In the case of an air discharge test the discharge switch which is used for contact discharge shall be closed Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 33 of 56 O CE CERPASS TECHNOLOGY CORP Report No TECE1107001 7 2 Test Setup for Tests Performed in Laboratory VCP 0 5x0 5 m Table Size 1 6LX0 8WX0 8H m 1 6mx0 8m The test setup consists of the test generator EUT and auxiliary instrumentation necessary to perform DIRECT and INDIRECT application of discharges to the EUT as applicable in the follow manner a Contact Discharge to the conductive surfaces and to coupling plane b Air Discharge at insulating surfaces The preferred test method is that of type tests performed in laboratories and the only accepted method of demonstrating conformance with this standard The EUT was arranged as closely as possible to arrangement in final installed conditions A ground reference plane was provided on the floor of the test site It was a metallic sheet copper or aluminum of 0 25 mm minimum thickness other metallic may be used but they shall have at least 0 65 mm thickness In the Cerpass Technology Corp we provided 1 mm thickness stainless
44. ram from the hard disk drive and runs it 3 The PC sends H messages to the monitor and the monitor displays H patterns on the screen 4 The PC sends H messages to the internal Hard Disk and the Hard Disk reads and writes the message 5 Repeat the steps from 2 to 4 h An executive program WINTHRAX EXE under WIN 2008 was executed to read and write data from HDD i An executive program PING EXE under WIN 2008 was executed to transmit and receive data to the EUT through LAN P Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 6 of 56 Ce CERPASS TECHNOLOGY CORP Report No TECE1107001 2 3 Description of Support Unit EMI Device Manufacturer Model No Description PC ASUS TS300 E5 Power Cable Unshielding 1 8m Power Cable Unshielding 1 8m ZANA ERR venter VGA Cable Shielding 1 35 m Keyboard Logitech Y SU61 PS2 Cable Shielding 1 85m Mouse Logitech OF 2854 PS2 Cable Shielding 1 85m Power Cable Unshielding 1 8m Monami AGEEK Da RS232 Cable Shielding 1 35 m Power Cable Unshielding 1 8m Printer HP ee USB Cable Shielding 1 6 m EMS Device Manufacturer Model No Description PC ASUS TS300 E5 Power Cable Unshielding 1 8m Power Cable Unshielding 1 8m Monitor DELE AA TURIG VGA Cable Shie
45. sult and Data estne sasawaqa aa ahas kan nnns ettet tnra aa ns sites ntes 46 10 5 Test Photographs cii Pe ure ae ceci Ala een pit Eae dep re ees ER d dee cce Ba eo ae 47 11 Conduction Disturbances induced by Radio Frequency Fields 48 We Tosi PIOCOGOUIEG xu u rero rene ese 5 5 st 48 11 2 Test Severity Levels need eR Au au Qa eie En Rite and rra E EE 48 11 3 Measurement Equipment 48 11 4 Test Result and Dal uuu u dere eae e eie Rente ton OR ER RR i Exe SERRE 49 119 Test Photographs asieran a ete e t beta Sera etx Ede dien s ex ua ER ea ea 50 12 Power Frequency Magnetic Field Immunity TES iii 51 1 IBI TIU C EE 51 12 2 Test Severity levels ertt AA ene tacet per esee eo 51 12 3 Measurement EQU IDIWent ene A 51 12 4 Test Result and Datg uuu eiie eiii ertet diera a uwa ia d d RR RR E decas 52 12 5 Test Photographs iei rdiet dee ted ce Hd Ice d dd ee EL E devas Lacu b dae Xon na 53 13 Voltage Dips and Voltage Interruptions Immunity Test Setup 54 Ue IBI Cere M 54 13 2 Measurement Equipment 54 19 3 Test ene RRE EE 55 13 4 Test Photographs aussi ali e be ete Alla 56 Appendix A Photographs of EUT iii A1 A4 9 Cerpass Technology Corp
46. t 6 CET TEE 6 2 9 Description of Support d EE 7 2 4 General Information of Test 8 2 5 Measurement Uncertainty AA 8 2 6 History of this test report awahi aio 9 3 Test of Conducted Emission lesse iii 10 s T O LN EMT Lm 10 3 2 ell 11 3 9 Typical Test EE 11 3 4 Measurement Equipment i 11 3 5 Test Result and Dalai iaia 12 3 6 Test Photographs of Power Pont enne n nentes nennen 16 3 7 Test Photographs of Telecommunication Port 17 4 Test of Radiated Emission l l u u u u u U U U J J J J 18 ASV Tes Bilik uu S AA SS Qu Sau A AUA WA 18 4 2 ASP SE aa aaa awa aaa maana 19 4 3 Typical SD aaa 20 4 4 Measurement Equipment ii 20 4 5 Test Result and Data 30MHz 1GHZ i 21 4 6 Test Result and Data 1GHz 6GH2Z i 25 4 10 TE E 27 5 Harmonics Test Lelio ile 28 5 1 Limits of Harmonics Current Measurement iii 28 5 2 Test hesult and Data atea rai 29 6 Voltage Fl ctuations Test 30 6 1 JestProced re oue ied E ied ER eode HE UE Oda ce be Aa FEEDER Le c REA Pod anda 30 6 2 Measurement Equipment ui 30 6 9 NESI WAA 3i 6 4 Test Photographs nett ete tel eo ae aan 32 7 Electrostatic Discharge Immunity Test mma mama namana mamaaa mwanama esses sienne nnne naanza nakaza wanaam
47. te Jul 26 2011 Pulse 5 50 ns Repetition Rate 2 5 kHz above 2 0 kV Burst 15m 300ms 5 kHz below and equal 2 0Kv Test time 1 min each condition Voltage Mode Polarity Result Phase m TAS A nio L A A A A N A A A A L N A A A A Power Line PE A A A A L PE A A A A N PE A A A A L N PE A A A A Signal Line RJ45 10M 100M 16 A A Note A Means the EUT function is normal working during the test Test engineer Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 42 of 56 LO CERPASS TECHNOLOGY CORP Report No TECE1107001 C C _ Y6__6 6_ 6 6 I L v E EE eo 9 5 Test Photographs Front View Rear View Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 43 of 56 LO CC oe CERPASS TECHNOLOGY CORP Report No TECE1107001 Clamp HU Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 44 of 56 Ce i CERPASS TECHNOLOGY CORP Report No TECE1107001 10 Surge Immunity Test 10 1 Test Procedure a Climatic conditions The climatic conditions shall comply with the following requirements ambient temperature 15 C to 35 C relative humidity 10 to 75 Yo atmospher
48. ua 33 Tate estProced re eerie e dae aa aaa 33 7 2 Test Setup for Tests Performed in Laboratory i 34 T8 Test Severity Levels u uu ache aaa i 35 7 4 Measurement Eouipment nenun nn nenn 35 7 5 Test Result and Data 36 7 6 CTestPhotogtaplis pria aaa 37 8 Radio Frequency electromagnetic field immunity test eese 38 8 1 lest lee E 38 8 2 Test Severity Levels ouis a a eee sire desig dee e Eee e ER adn Fe LE EB IER ug 38 Cerpass Technology Corp Issued Date Jul 28 2011 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 2 of 56 fo CE CERPASS TECHNOLOGY CORP Report No TECE1107001 8 3 Measurement Equipment iii 38 8 4 Test Result and Data i ala eight 39 8 5 JestPhotographs aide iaia aiar 40 9 Electrical Fast Transient Burst Immunity TeSt nin 41 NNI duet 41 9 2 Test Severity LevelSs entren tnn entes nnns sin maizi aaa 41 9 3 Measurement Equipment ui 41 9 4 Test Result and Data itte dnte e tt vea v n e tte P 42 9 5 Test Photographsi ideale aaa 43 10 Surge Immunity A CT EE 45 10 41 Test iProG8dureu ru uu ua G aaa 45 10 2 TestSeverity Level uu uu uu u iaia 45 10 3 Measurement EQUIPMENT 46 10 4 Test Re
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