FADOS7F1 (10V3) FAULT DETECTOR AND PC OSCILLOSCOPE
Contents
1. Picture 5 Fault Detector VI Tester Screen www burntec com Channel 1 2 Channel Used to select channel Auto When Auto is selected according to feature of touched point the most appropriate values of voltage frequency and current steps are determined 1 2V Voltage Step FADOS 7F1 has various voltage steps 1V 2V 5V 10V simultaneously Very Low Fra Frequency Step FADOS 7F1 has various frequency steps Very Low Freg Low 2 Freq Low 1 Freq Test Freq and High Freq Current Step FADOS 7F1 has various current steps Low Current Middle Current High Current L Current 47K penn Comparison po Ya EI m EKZ SPE Capacitor Test Compare If this option is selected solid and faulty cards are compared by touching probes to the same points of both cards Capacity Test Capacity test determines quality of electrolytic capacitor TTT FET IGBT If this option is selected determines TTT FET IGBT etc Type of semi conductors Recording Opens file form and records or opens recorded file Grf For 3 different steps 3 different graphs are generated and fast passage is possible at any time 1G 2G 3G 1 2 or 3 graphs at different adjustments can be screened Memory Save Test Recording Circuit Test circuit Point 7805 1 Es a m Tolerance fa 3 Test Point Recording Opens file f2. U LO w Add Number W Inc Kan Save Change MODZ ULM2003 3 dat MOOS ULM2003 4 dat NO04 ULM2003 5 dat MOOS ULM2003 6 dat MODB ULM 2003_ 7 dat Open MOO ULM 2003_6 dat MODE ULN2003 9 dat ULN2003_10 HOS ULN2003 10 dat MOTO ULM2003 11 dat MO11 ULM2003 12 dat MUT ULM2003 13 dat MOS ULMZO03 14 dat MO14 ULM2003 15 dat KO15 ULM2003 16 dat www burntec com New Folder Opens a folder by using the name given to a new circuit Open Image Open and upload the circuit of the image Add Number Add numbers automatically test point Inc Increments number automatically Save Saves the value of test point with mentioned name to the determined folder If name is not given saves with serial number Change Changes the marked test point data and Save a new test point data Open Opens data clicked on the list to Channeli Delete Deletes the marked test point data from computer COMPARISION TESTING COMPONENTS OF ELECTRONIC CIRCUIT When a component is tested in a circuit generates a complicated signal other due to parallelism other components in the circuit FADOS 7F1 makes the comparison by removing the component values of the equivalent circuit and measuring signals Connect solid card to Channel 1 connect fault card to Channel 2 and touch same points at the same time If it is same as it is written Harmonious at screen If it is out of tolerance values it is written Dishar
3. OSCILLOSCOPE r Memory Save Test VI TESTER OR Diff 6 Attention YETEMAOT DETECT Tolerance 35 3 a l Ol n m ef Lo yi m CILLOSCOPE oL Current 47K _ _M Current 2K7 W Comparison Capacitor Test et ER Memory Save Test r V TEST gt TECTOI ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor E AULT D l Tolerance 3h E Picture 26 Comparison Test J1 3G 3 DIFFERENT GRAPH DISPLAYS If you click 1G button you see 2G and 3G It means 1 2 or 3 graphs at different adjustments voltage frequency and current can be screened simultaneousiy OUTPUT ANALOG PE SCILLOSCO OS _L Current 47K I Comparison l Capacitor Test FITI EE R Memory Save Test VI TESTE ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor AULT DETECTOR Tolerance 3 Pa 3 Open Circuit Picture 27 3G Graph Display ANALOG OUTPUT PE iz L Current 47K I Comparison l Capacitor Test GELEFEF IGBT ER Memory Save Test VI TEST ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor AULT DETECTOR Tolerance 35 3 Open Circuit Picture 28 3G Graph Display 32 www
4. System icon In the System Properties window click the Hardware tab In the Hardware tab click the Device Manager Button Or Click Start Click Settings Click Control Panel In the Control Panel double click the Systems icon In the System Properties window click the Hardware tab In the Hardware tab click the Device Manager Button Prot Ar Ge FADOS F1 Fault Detector inside Universal Serial Bus Controllers and click right then select update software driver 4 Select Search for the best driver location and click browse find FADOS7F1 Driver s folder 5 Click OK and install driver www burntec com Note Each product has different calibration settings so that please do not lost program CD GENERAL USAGE INFORMATION 1 Product Oscilloscope Analog Output screen pop up and if you click Fault Detector VI Tester button input screen Fault Detect 2 Oscilloscope 1 8 V offset voltage is transmitted output through the internal resistance of 1 MQ If you select 10X probes this resistance is 10 MQ In this case the touched point usually does not make any effect 3 Open circuit s graph is in the middle and horizontal position at Test Fault Detect screen Current Voltage Graph VI makes angle according to the value of resistance capacitor is like circle and ellipse short circuit is vertical position 4 Middle current step if resistance values are high and VI graph is horizontal axi
5. comparing data from memory it can test easily electronic cards In addition to the basic features FADOS7F1 VI Tester can also be used dual channel oscilloscope square wave generator and analogue voltage output www burntec com SECURITY 1 FADOS7F1 is produced by using lead free solder and designed in accordance CE regulations users must use the following usage rules 2 Chassis must be isolated and grounded Connect the chassis ground connection point of the probe is the same as your computer careful to avoid the potential difference 3 Feature of oscilloscope if probe key is set to 1X it measures 5 Voltage probe key is set to 10X it measures 50 Voltage Do not use above these limits of voltage 4 It tests electronic cards without giving to energy Before test electronic card and the devices must be made high voltage capacitor discharges 5 The users of this equipment must have knowledge and experience to repair of electronic cards Thus during using FADOS7F1 do not this mistakes such as touch chassis to high voltage non isolated ground test high voltage capacitor discharges Without enough knowledge and experience in this subject keep away high voltages such as mains voltage which can damage the system and themselves 6 Giving high voltage from probes series resistors which contained in the device damaged and makes the circuit an open circuit In this case the computer port which is connected d
6. pin can be solid 28 www burntec com kFADOS7FI FAULT DETECTOR AND OSCILLOSCOPE Test Channel 1 2 a a 2 O O z lt Z LU O O O Ma O Sa O a O W Comparison l Capacitor Test Memory Save Test ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor Chi Ch2 FAULT DETECTOR VI TESTER Tolerance 3 Picture 22 Comparison Test Integrated Pin Faults Using FADOS 7F1 faults can be easily find Pin of integrated is damaged reverse diode by deterioration diodes can be resistance open circuit or short circuit It is integrated fault One diode damaged and now it is a resistor 29 Channel 1 2 W Automatic ANALOG OUTPUT OSCILLOSCOPE Memory Save Test ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor ECTOR VI TESTER VA y a AULT DET J Tolerance 3 Channel 1 2 mo Automatic SCILLOSCOPE ANALOG OUTPUT MN O Iv Capacitor Test TTT ELT an sm JL Memory Save Test VI TESTER OR M LE EA Mm Cention ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor Ul ET ll 4 Tolerance 3 Picture 24 Comparison Test Parallel Resistor Faults 30 Channel 1 2 WO Automatic ANALOG OUTPUT
7. selects high current step kFADOS7FIi FAULT DETECTOR AND OSCILLOSCOPE Test Channel 1 2 2 a 2 O O za lt Z lt W a O O 0 O ZE O 49 O L Current 47K M Current 2K7 W S L M VINE Jo M Capacitor Test Memory Save Test ATTENMON Probe must be at 1X position High voltage capacitors must be emptied by using a resistor Chi Ch2 Tolerance 3 Picture 6 33 kQ and 470kQ Resistors VI Graph The Equivalent Circuit Diagram and Value Measurement Channel 1 Red Channel 2 Blue FAULT DETECTOR VI TESTER ANALOG OUTPUT Channel 1 2 m Automatic OSCILLOSCOPE Comparison Capacitor Test ROPE IGS ER Memory Save Test VI TEST CTOR kas f LU ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor T Se AULT DI pe Li Tolerance 3 Channel 1 2 WO Automatic SCILLOSCOPE ANALOG OUT EE PE Memory Save Test TOR ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor ETEC AULT DI DA rp Tolerance 3 Picture 8 Short Circuit and Resistor VI Graph 16 www burntec com Capacitor VI Graph Due to their energy storage characteristics reactive components produce a phase shift between voltage and current flow This is displayed as a circula
8. 3 Multicomponent measurement the components from card easily g Y yi Capirem OO DO Om PCO Or Le TS Ororo Function 4 Recording Ch2 data and comparing with recorded data R 8 0K D1 0 6 V R1 2 98 K D2 0 55 V Tolerance 3 R2 1 21 K FAULT DETECTOR VI TESTER Picture 3 FADOS 7F1 Fault Detector VI Tester Screen A FADOSZF1 FAULT DETECTOR AND OSCILLOSCOPE Osciloscope Function 5 Double Channel Oscilloscope Function 6 Square wave Generator Function 7 Analogue Voltage Output Channel f Analog Outph Channel 2 Design Jd or grounded ADVICE Use Probe is10X position Probe X1 EE Top Value 0 00 V Active Low Value 0 00 V Point Signal Frequen DAC Voltage mV 3200 Frequence 800 0 Lt Md Li T gt ta O E O Ul TE LU O a zy lt LL Picture 4 FADOS 7F1 Oscilloscope Analog Output Screen 9 www burntec com INSTALLATION 1 Connect FADOS7F1 to PC via USB Install drivers in CD 2 Click FADOS7F1 SETUP exe and install program 3 Run FADOS7FI exe DRIVER INSTALLATION 1 Connect FADOS7F1 to PC via USB Windows XP New Hardware Found with warning direct you to install the driver Insert the CD into the CD rom and install the driver 2 Windows Vista and Windows 7 open Device Manager 3 Find On the desktop right click on My computer and click Properties of open the Control Panel and double click the
9. 75 mm Width 40 mm Height 200 mm Deep Weights 450 gram with all accessories Picture 1 FADOS 7F1 USB Cable Probes www burntec com CONTENTS Page PRODUCT DESCRIPTION ii iii tit taa tat tr a tw ta a a n ja a a ar e ak e e ka a a e a a e a a e e a ki at a a a n 2 SECURIT Voice a a aka 3 TECHNICAL FEATURES pe tij oralti io a ki ad ta an 4 PRODUCT CONTENT stew vip ai t b aka kt et kl n ta e ef A ML AE M ni 5 PHYSICAL FEATURES WITHOUT ACCESSORIES Lk tt ata aa atann anana aaa na aaeaneteeateseseaeososesnonooe 5 FADOS 7F1 FAULT DETECTOR AND PC OSCILLOSCOPE 0 ratratnataannanaanannannn 7 J YY NONE FEA TURES mea aste ata pi kn ef ne pon te ia ne mo Da e a io be n yb te n amme ni and KK YE kk n ik lk tv a 10 DRIVER INSTALLATION ei tan k pa kaki lp ol ep kk a a yari kli pm p 10 GENERAL USAGE INFORMATION kt kt kannan nn nannan anana aaa 11 VI TEST PROGRAM FEATURES OF FAULT DETECTON PART 0scescesees0 13 PASSIVE COMPONENTS R L C RESISTOR INDUCTOR CAPACITOR CURRENT VOLTAGE VI GRAPHS tett tann nannan nannan annan aa nana aaa aaa aaa anna 15 RESISTOR VL GRAPH k bo ou boko ay ip oto ile ate ot ak au sp a a aki ata flat a a l ip kn ok in a eta e bo n 15 GAPACHIOR VIVGRAPH ot ati aba do ata Gao epe t l a kipa aj v ti ata ef l vi a pati Go one a oka 17 CAPACITOR QUALITY TEST AND RC CIRCUIT tett tanta anana aaa anana nana taa ae eseseteesesesesesesosesonoeoe 17 INDUCTOR W A GPA PI ra m
10. For uploading image click open image and upload electronic card s image and you see electronic card s image on the right On the image buttons are for zoom Click point on the image which you want to save than touch the point which is in the electronic card will be saved by channel 1 if required name or code of this point can be written Then press save button If you click Add number and Increment button points that will be saved are saved in an order In order to test from saved file press record memorized test button select data to be tested and open first saved point Saved data is seen as a red graph at first channel Touch the point to be tested with second channel If it is same as the saved data or in tolerance values it is written Harmonious at screen If it is out of tolerance values it is written Disharmony percentage value is seen and wrong voice is heard When automatic test is activated if a test point is harmonious then it goes to next point automatically By this way cards can be tested faster with the help voices Note Electronic circuit test points we can only register with Channel 1 Using recording menu to open as a reference test points by recorded Channel 1 using Channel 2 comparison data with faulty or solid circuit 25 so H Hew Folder C qc Test Circuit E Poda Files EJ FADISTFI 1043 Step 1 FNewFolder Step 2 Open Image e Test Circuit New Point
11. Passive If active then gives square wave or analogue output from Channel2 Signal DAC Square wave or analogue output is selected 33 www burntec com Frequence 1800 Frequency Output frequency Voltage mV 2600 Voltage Voltage of sguare wave or analogue output Voltage Adjustment Voltage Division Adjusts screen sensitivity of voltage Data received from device is 12 Bit 2 5mV sensitive Zero Adjustment Moves position of OV point up or down Numbers indicate voltage values If numbers are double clicked OV reference of that channel starts from clicked point Displayed Part If Osc Passive then adjusts starting point of displayed part of whole memory Time Adjustment Time Division RECOMMENDATIONS pi Fault detection probes must be set to 1X at fault detection 2 Test solid card channel 1 faulty card channel 2 First touch the channel 1 probe and then touch channel 2 probes 3 Fault detection is important to have same graphics at channel 1 and channel 2 The circuit diagram and values are elements of help The circuit diagram values are not for measuring purposes it is only for comparison purposes 4 For fault detection usually use middle current level For high value resistor or low value capacitor select low current step 5 When recording in the memory click save button after touching solid card s p
12. The Equivalent Circuit ANALOG OUTPUT SCILLOSCOPE tJ ETECTOR ILT D Diagram V L I Comparison Capacitor Test O TTI ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor Tolerance 3 Open Circuit Picture 15 Zener Diode VI Graph The Equivalent Circuit Diagram 21 www burntec com Transistor Triac Thyristor FET IGBT VI Graph Active components such as transistor triac and FET can be tested by transmitting them while both of two channels are used A transistor contains two semiconductor junctions connected Transistors also must have emitter chassis First touch collector with a probe Channel 1 probe or Channel 2 probe Collector must be at non transmission position Then touch other probe Channel 1 probe or Channel 2 probe base in order to provide transistor to start transmitting Transistor characteristics should be seen as at the screen Triac Thyristor Fet and IGBT can be tested in the same way If Thyristor Triac Transistor FET IGBT selection T T T FET IGBT button is applied type of component can be determined kFADOS7FI FAULT DETECTOR AND OSCILLOSCOPE i umam a ttl pre Cut off Current Point of transmitter OSCILLOSCOPE ANALOG OUTPUT Comparison l Capacitor Test Memory Save Test ATTENTION Probe must be at 1X position High voltage capacitors mu
13. acitor Test v Memory Save Test ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor FAULT DETECTOR VI TESTER Tolerance 3 Picture 13 Inductor VI Graph The Equivalent Circuit Diagram SEMI CONDUCTORS Diode Zener Diode VI Graph Diodes start to transmit current after high transmission voltage For this reason diodes are seen horizontally at one part of the graph and are seen vertically at the other part If cathode of diode is connected to chassis a curve appears at horizontal axis at negative voltage and before transmits voltage and the curve appears at vertical axis at transmit voltage If anode of diode is at chassis a curve appears to down at negative voltage A Zener diode exhibits the same signature as a conventional diode for voltages below the Zener voltage When the reverse bias exceeds the Zener voltage a low resistance signature is displayed If diode and resistor are serial on circuit after transmission graph makes an angle to horizon 20 ANALOG OUTPUT SILLOSCOPE or ot Ve ER VI TEST D FAULT DETECTOR Ch 2 D1 and R1 L Current 47K _M Current 2K7 _ Comparison Capacitor Test O TTT z Memory Save Test ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor Tolerance 3 Picture 14 Diode and Serial Diode Resistor VI Graph
14. burntec com OSCILLOSCOPE PROGRAM FEATURES t FADOS7F1 FAULT DETECTOR AND OSCILLOSCOPE Ti r sciloscope Channel 1 Osc Active m Synchronous Channel 1 p 1 Channel Probe X1 Point Freguen Top Value 3 21V Low Value 0 00 V 0 8 KHz Function 7 Analogue Voltage Output Channel Probe X1 FAULT DETECTOR VI TESTER Point Frequen Top Value 0 00 V Low Value 0 00 V Analog Outph Channel 2 Active Signal Frequence 800 Voltage mV 3200 Picture 29 Oscilloscope Screen Osc Active Channel 1 2 Automatic Save d Osc Active Passive Activates oscilloscope or shows latest screen display Channel Selects channel Channeli Channel2 and both channels are selected in an order Manual Auto When automatic catches the latest signal if the signal is off Save Saves oscilloscope data or opens recorded data Channel 1 Up Channel Channel is selected for synchronous Up Down Starts synchronous at increasing or decreasing signal Probe X1 Top Value 1 31 Y Low Value 1 30 V Point Frequen 1 6 KHz Probe X1 Adjusts voltage value according to X1 or X10 coefficient probe Top or Low Highest or lowest value on screen Point Displays voltage value of cursor at vertical line while at memory position Active Signal Active
15. double inverse diode zener diode and diodes It can be capacitors or resistors are connected to these If pin of integrated has double reverse diode it means this pin can be solid We can use the same technique to locate faults in ICs which are large and very complex such as memory chips and microprocessors The pin arrangement of such complex ICs means that it is especially appropriate to use comparison techniques to test these devices As we look at these devices we will find that despite the large number of pins there are only a few distinct graph patterns on a digital IC Note You will frequently notice differences in the signatures between similar ICs from different vendors or which have been manufactured using different technologies Compare the graph on a suspect pin with graphs from other pins on the same device before regarding the device as faulty t FADOS7F1 FAULT DETECTOR AND OSCILLOSCOPE Test Channel 1 2 Automatic OSCILLOSCOPE ANALOG OUTPUT M Capacitor Test Memory Save Test Chi Ch2 FAULT DETECTOR VI TESTER Tolerance 35 BE Picture 18 Solid Integrated Pins Compare 2 Integrated Pins 24 www burntec com ELECTRONIC CIRCUIT REGISTRATION MEMORY AND COMPARISON WITH MEMORY It is possible to save points touched on a card in an order and then comparing them with other cards First open a new file by writing name or code of card that will be saved
16. etc all type electronic cards Unigue Features Eguivalent circuit diagram and measuring values of all components features are unigue in the World As an example if resistor connected parallel to capacitor it shows circuit diagram and value of them at the same time Picture 2 FADOS 7F1 www burntec com FADOS 7F1 includes 7 important functions 1 Double Channel Fault Detection VI Graph Comparing solid and faulty card without giving energy 2 Equivalent Circuit Diagram Composing R C or Diode Circuit Diagram according to the point touched 3 Measuring of Resistor Capacitor and Diode Feature of measuring the value of touched point 4 Fault Detection by Comparison from Memory By recording solid card to memory comparing faulty card from memory 5 Double Channel Digital PC Oscilloscope As occasion may require device can be used as oscilloscope 6 Square Wave Signal Output Ch 1 is used as oscilloscope and Ch 2 is used as signal generator 7 Analogue Voltage Output Ch 1 is used as oscilloscope and Ch 2 gives analog voltage output www burntec com ZE FADOSZF1 FAULT DETECTOR AND OSCILLOSCOPE Test Channel 1 2 Function 1 Double Channel V I Tester OSCILLOSCOPE ANALOG OUTPUT L Current 47K 5 7 M Current 2K Comparison Capacitor Test PEER PEN 1G Function 2 Equivalent circuit diagram By using functions 2 and 3 components values can be measured without dismantling Function
17. evice via USB port damaged but observed in other parts of the computer is not damaged TECHNICAL FEATURES A FAULT DETECTION FEATURE Output Voltage Output Resistance Short Circuit Current Test Freguency Other Feature 1V 2V 5V 10V Current Level Low Medium High Low Current Medium Current High Current Very Low Frequency Low2 Frequency Lowi Frequency Test Frequency High Frequency 2 Equivalent circuit diagram www burntec com 47 KQ 2 7 KQ 550 Ohm 212 pA 3 7 mA 18 mA 2 Hz 3 4 Hz 10 3 Hz 27 3 Hz 780 Hz 3 Resistor capacitors diodes etc measurement 4 Recording data and comparing with recorded data 5 3 graphs at different adjustments can be screened Sampling Rate Input Voltage Probe 1X 5 V Probe10X 50 V Channel ADC 2 Channel 12 Bit Sensivity 2 5 mV Image Rate 0 02 mS div 100 mS div Instant Memory o 64 Kbyte Output Output Voltage simultaneousiy B PC OSCILLOSCOPE FEATURES 400 K S C DIGITAL AND ANALOG OUTPUT Channel 2 5V 5V Adjustable Frequency Digital From 0 2KHz to 25KHZ Table 1 FADOS 7F1 Technical Features 10V 10V 10V 1 Automatic selection steps of voltage current frequency Product Content 1 FADOS7F1 Product 2 Oscilloscope Probes 1 USB Cable 1 Software CD 1 Hand Bag for FADOS7F1 www burntec com Physical Features Without Accessories Dimensions
18. ins with channel 1 When the data open from memory using Channel 2 comparison data with faulty or solid card 6 Each product has different calibration settings which is include in CD so that please do not lost program CD 34 www burntec com WARRANTY AND CONDITIONS 1 The warranty period is 1 year from the date of product delivery 2 The repair period is seven 7 business days 3 Used the product contrary to the matters contained in FADOS user manual are not covered by the warranty Giving high voltage from probes series resistors which contained in the device damaged and makes the circuit an open circuit It is an user error and this situation is not covered under warranty 4 The device is in a solid box Normally use the card is not physically damaged Breaking wetting etc are not covered by warranty 5 Depending of intensive use probes copper which is in the cable may be damaged Therefore failure of the probe is not covered by warranty 6 If device is faulty send us or an authorized repair service or send Prot Ar Ge Company Prot Ar Ge Industrial Project Design R8 D Co Ltd Address Reyhan Mah Mant c Cad Ayti han No 21 15B Osmangazi BURSA Phone 00 90 224 223 17 45 exportQprotarge com www protarge com 35
19. m e tl ole jn ak ao ye b lama a a yim aa We ok oke 19 SEMI CUNDOC FOR S citrine ou ktwv si t el al ia a kak k k ia a a a a ka a a a a a a n a a a a e a a a n a A A 20 DIODE ZENER DIODE VI GRAPH iii aa da ab a all al lala ale il ke a oak yi aa 20 TRANSISTOR TRIAC THYRISTOR FET GBTV GRAPH 22 TESTING INTEGRATED IC SMD INTEGRATES cscescescnsensensensseesensenses 23 ELECTRONIC CIRCUIT REGISTRATION MEMORY AND COMPARISION WITH MEMORY na e a al 25 COMPARISION TESTING COMPONENTS OF ELECTRONIC CIRCUIT 26 3G 3 DIFFERENT GRAPH DISPLAY s m r s d s n n re ne e G a d n 32 OSCILLOSCOPE PROGRAM FEATURES kte kane nannan nannan nan kane an anan nannannannonnan 33 RECOMMENDATIONS iii d v tit ia ik at kt tit rl a a 34 WARRANTY AND CONDITIONS kk kannan nna nana kankan aaa aaa aaa 35 www burntec com FADOS 7F1 FAULT DETECTOR AND PC OSCILLOSCOPE Fault Detector and PC Oscilloscope have been especially developed to determine faults at all type electronic cards by ProT Ar Ge Industrial Project Design R amp D Ltd Co The main purpose make it easier to find fault of electronic cards It is included oscilloscope signal source multimeter etc Usage Areas ECU Automotive electronic cards servo step motor drivers cards of medical devices military electronic cards computer and monitor cards television audio radio cards cards of textile machines mobile phone electronic cards
20. mony percentage value is seen and wrong voice is heard 26 ANALOG OUTPUT SCILLOSCOPE OSC W Comparison l Capacitor Test FITI STER Memory Save Test VI TE Diff nonious ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor AULT DETECTOR r Li D2 0 45 V Tolerance 3 Picture 19 Comparison Test Comparing this system is very sensitive and is considered compatible with the values within the given tolerance ANALOG OUTPUT OSCILLOSCOPE W Comparison M Capacitor Test ER EST Memory Save Test VIT AULT DETECTOR LI Tolerance 96 13 Picture 20 Comparison Test A significant difference different resistance value of the test circuit from reference Circuit 21 www burntec com ZE FADOS7F1 FAULT DETECTOR AND OSCILLOSCOPE 4 L Test Channel 1 2 WO Automatic 2 a Zo O O Sa lt a LI a O O Ma O 4 O 0 O a nemi Tig Memory Save Test AD a rr ATTENTION Probe et be AK anou oun nona voltage capacitors must be emptied by using a resistor Chi Ch2 Tolerance 26 3 Picture 21 Comparison Test FAULT DETECTOR VI TESTER Integrated circuit is usually double reverse diode It can be capacitors or resistors are connected to these If pin of integrated has double reverse diode it means this
21. n difference between solid and faulty card The equivalent circuit and values are auxiliary elements If you always look equivalent circuit and values it can take more times to detect fault This product interprets VI graph The computer program composes equivalent circuit diagram and shows values of components by interpreting graph www burntec com VI TEST PROGRAM FEATURES OF FAULT DETECTON PART FADOS 7F1 was developed by ProT Ar Ge Industrial Project Design R amp D Ltd Co for finding fault of electronic cards While testing with V I graph do not apply power to card Generally probe chassis is connected to card chassis and a signal is applied to touch point by the device V I graph of this signal is seen at the screen Signals scans from negative voltage to positive voltage and when open circuit it appears horizontally in the middle of the screen It can test Mosfet Thyristor IGBT Transistor SCR and Triac etc all electronic components and integrated All control buttons are placed to the left of the panel used in fault detection t FADOS7F1 FAULT DETECTOR AND OSCILLOSCOPE Test Channel 1 2 OSCILLOSCOPE ANALOG OUTPUT r Wa nt AV Wi MO PON EPN po L Current 47K A Current OK W Comparison M Capacitor Test Memory Save Test ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor FAULT DETECTOR VI TESTER Tolerance o E
22. orm and records or opens recorded file Circuit Indicates name or code of point to be tested Folder name in the system Point Name or code of test point Recorded as file name in the system Goes to previous test point gt Goes to next test point Test Point Serial number of test point Auto Test If tolerance of test point is lower than or equal to tolerance mentioned below it goes to next test point automatically Reference Channeli indicates solid circuit Channel2 indicates faulty circuit or circuit to be tested When saved at memory Reference Channel1 is saved Values of circuits composed of resistance capacitor and diode are displayed and circuit diagram is displayed www burntec com PASSIVE COMPONENTS R L C RESISTOR INDUCTOR CAPACITOR CURRENT VOLTAGE VI GRAPHS Resistor VI Graph Resistor current voltage V I graph appears with a specific angle to horizon and resistor symbol and value are seen at the bottom of the graph While resistors at high values appear with angle close to horizontal axis resistors at low values are seen at screen with an angle close to vertical axis Picture 6 and 7 display resistors typical signals and values for the equivalent circuit High resistor generates a line close to horizontal line So that for testing high resistance selects low current step Low resistor generates a line close to vertical line So that for testing low resistance
23. r or elliptical signature Capacitor symbol and value are seen at the bottom Picture 9 displays capacitor typical signals and values for the equivalent circuit High capacitor generates vertical ellipse For testing high capacitor select high current and low frequency Low capacitor generates horizontal ellipse For testing low capacitor lower than 10 nF select low current and high frequency tFADOS7F1 FAULT DETECTOR AND OSCILLOSCOPE va Test Channel 1 2 OSCILLOSCOPE ANALOG OUTPUT ent 47K OM GUITENT ZAY Capacitor Test Memory Save Test ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor Ch1 Ch2 FAULT DETECTOR VI TESTER Tolerance 35 3 Picture 9 Capacitor VI Graph The Equivalent Circuit diagram and Value Measurement Capacitor Quality Test and RC Circuit When Capacitor Test is selected an additional curve displaying the quality of capacitor appears If this curve is at horizontal axis or close to it quality is high and quality is low as much as the angle degree is high High quality capacitor generates a horizontal line 17 ANALOG OUTPUT _L Current 47K _ _M Current 2K7 OSCILLOSCOPE Comparison W Capacitor Test PAER FE Memory Save Test OR VIT T ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor ETEC AULT D i Tole
24. rance 9 13 Open Circuit Channel 1 ANALOG OUTPUT Very Low Fra _L Current 47K OSCILLOSCOPE Comparison w Capacitor Test ERE FEF Gs Memory Save Test ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor Tolerance 3 Fa 3 Open Circuit Picture 11 Low Quality Capacitor 18 www burntec com kFADOS7FI FAULT DETECTOR AND OSCILLOSCOPE Test Channel 1 2 m Automatic ne 2 a 2 O O BEN x L lt x Lu a O O o O ze O 0 O Comparison FM Capacitor Test Memory Save Test ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor Ch1 Ch2 Tolerance 3 Picture 12 Capacitor and RC Circuit FAULT DETECTOR VI TESTER If capacitor and resistor are parallel elliptical shape makes an angle to horizon Inductor VI Graph The diagram below shows the signature of a ferrite transformer primary winding with the test voltage range set Low and test frequency set High This demonstrates the effect of a significant value of resistance causing the inductive ellipse to be tilted 19 www burntec com kFADOS7FI FAULT DETECTOR AND OSCILLOSCOPE 2 a 2 O O a lt Z lt Lu a O O o O a EE O o O L Current 47K i Pa arront 9K Irrel ZI l OH EPN Jo Comparison FM Cap
25. s you can see more clearly high resistance value at low current step If VI graph is more closer to vertical axis it means resistance value is low and values can be read more clearly at high current step 5 Usually test capacitor at high frequency mode If capacitor value is low test at low current step and if capacitor value is high test high current step If capacitor value is like slim ellipse at high current step and vertical axis you can see value of capacitor by reducing freguency of the freguency step 6 Solid integrated pin without pin of supply and ground is usually like double reverse diode Resistor or capacitor effects even as graph observed double reverse diode Some integrated output can be observed one diode But if you see pin of integrated like resistor it means integrated is faulty 7 Capacity test especially determines quality of electrolytic capacitor If this curve is horizontal capacitor is quality Low quality capacitor curve according 11 www burntec com to horizontal makes an angle If angle is more capacitor is faulty Due to current this test may be misleading while testing a capacitor at circuit Therefore considering this situation to test For capacitor quality the best measurement in this product is done by looking at the Capacity Resistance Curve At fault detection important thing is graph display and interpret First try to find fault with compare In a short time you will lear
26. st be emptied by using a resistor FAULT DETECTOR VI TESTER Tolerance 3 Picture 16 Transistor VI Graph 22 www burntec com tFADOSJFE FAULT DETECTOR AND OSCHLOSCORE Test Channel 1 2 IG OUTPUT 41 2V m d ILLOSCOPE ANALI on Very Low Fri Low 2 Fr V W no TI a OSI Comparison Capacitor Test W TTT FET IGBT Memory Save Test ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor FAULT DETECTOR V TESTER Tolerance 4 3 Picture 17 FET VI Graph TESTING INTEGRATED IC SMD INTEGRATES Integrated circuits can be tested all the pins with the help of probes Circuits made up of many components encapsulated within a single package The component count within an IC may vary from as few as half a dozen devices on a chip to many thousands of components in for instance a modern microprocessor Because of the need to package so many components into an extremely small space components within an IC are often microscopically small As a result modern ICs contain components and connections which are susceptible to damage from electrical stress and static discharge at levels far lower than those which would damage normal components For this reason many ICs incorporate protection diodes on their signal input and output pins 23 www burntec com When testing integrates signals display similar to the
27. www burntec com Endustriyel Proje Tasarim Ar Ge Ltd Sti p TO E EI LZ industrial Project Design R amp D Co Ltd FADOS7F1 10V3 FAULT DETECTOR AND PC OSCILLOSCOPE USER MANUAL FADOSITI LI Test yo a gt 3 2 5 anj Very Low Li La Te o a D L Current r x wo 5 g 5 7 o 3 z www burntec com PRODUCT DESCRIPTION FADOS7F1 Fault Detector and PC Oscilloscope is basically computer based VI Voltage Current test equipment It connects to PC via USB port and works 5V voltage by taking energy from USB port FADOS7F1 works by applying sinusoidal voltage through a serial resistor point of touched on circuit and voltage current graph is displayed on the computer screen In addition to this feature computer software by analyzing voltage current graph to displays equivalent circuit diagram and values of electronic components Equivalent circuit diagram and measurement of electronic components values features make successful analyze but sometimes software makes possibility of faulty analysis so that it does not used for measurement on the circuit these features used for convenience to user in giving an information for finding faulty easily Feature of Dual Channel VI test solid and faulty electronic cards comparable with touch of same points at the same time and using this method faulty points out of tolerance can be detected Using feature of recording reference values to memory and
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