Agilent 4287A RF LCR Meter
Contents
1. test handshaking Oe se te 999 9888 OG la OS o ES ES be o o y External keyboard and mouse interface Em GPIB interface Easy to use by simplifying Controlled by external PC Easy integration with an automatic Highest throughput in automatic measurement setup and programming cannot control external devices The 4287A greatly increases manufacturing testing efficiency with fast measurement speeds 9 msec point and a statistical analysis function among the other powerful functions such as the built in comparator function In addition the 4287A improves upon the measurement accuracy and impedance measurement range of previous RF LCR meters These improvements are realized by advanced techniques in analog circuit design The 4287A achieves better measurement repeatability and stability even at the low test signal levels required for SMD inductor testing User friendly interface An object oriented user interface that is navigable using the mouse panel keys or keyboard simplifies complicated measurement setup procedures Setups including test frequency signal level also when using list sweep and limits for the multi function comparator can be performed and verified easily by editing the setup tables The setup editor has eight pag2. 3 GHz which has been difficult to implement so far can easily be performed with good repeatability by using the 4287A with the 16196A B C D test fixtures When the 16200B is used with the 4287A a 7 mm test fixture and an external dc bias source dc bias current can be applied to devices such as the EMI filter up to 1 GHz lt Cap Upper electrode DUT Insulator Outer connector Lower electrode pru 7 mm connector Figure 8 Cross sectional drawing of 16196A B C Figure 9 Total measurement solution example with 16196A EIAJ EIA chip size code Advanced Features For Precise and Versatile Analysis Powerful calibration and compensation functions For manual measurements a low loss capacitor as a phase calibration standard in addition to open short load calibration improves the accuracy of Q measurements as shown In addition to calibration electrical length compensation for a fixture with open short compensation fully correct measurement error caused by use of a test fixture These functions realize high absolute measurement accuracy at the measurement plane which in turn empowers accurate measurement of working standards Calibration wizard function The 4287A offers you the sophisticated calibration compensation method calibration wizard function The calibration wizard function eliminates errors of troublesome calibration compensation procedures and it allows you to eas
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4. Japanese localization 4287A ABA U S English localization 4287A 0BW Add service manual Cabinet options 4287A 1CM Rack flange kit 4287A 1CN Front handle kit 4287A 1CP Handle rack mount kit Note 1 This is used to calibrate the 4287A at the handler DUT contacts It consists of shorting bars and 51 0 Q chip resistors SMD size 1 0 x 0 5 mm 1 6 x 0 8 mm 2 0 x 1 2 mm 3 2 x 1 6 mm 2 The 16195B is used to calibrate the 4287A at the 7 mm calibration plane by using the 3 5 mm to 7 mm adapter It consists of open short load and low loss capacitor standards 10 Accessories 16196A B C D SMD test fixture Frequency range DC to 3 GHz Connector 7 mm Operating temperature range 55 C to 85 C Accommodate SMD sizes 16196A 1608 mm 0603 inch 16196B 1005 mm 0402 inch 16196C 0603 mm 0201 inch 16196D 0402 mm 01005 inch Figure 14 16196A B C 16196D has a different cap shape 16192A SMD test fixture Operating frequency DC to 2 GHz Accommodated SMD size See Figure 19 Figure 15 16191A 16192A 16197A SMD test fixture Frequency range DC to 3 GHz Connector 7 mm Operating temperature range 55 C to 85 C Accommodate SMD sizes 3216 mm 1210 inch 3216 mm 1206 inch 2012 mm 0805 inch 1608 mm 0603 inch 1005 mm 0402 inch Figure 16 16197A 16194A High temperature component fixture Operating frequency DC to 2 GHz O
5. age includes a 3 5 inch floppy disk drive as well as a hard disk drive These powerful storage devices permit save and recall of measurement setup parameters instrument state and measurement data In addition measurement setup parameters and data can be transferred between the 4287A and an external computer via the GPIB or LAN interface LAN lu Handler I F cu 4287A 1m cable 2 m max Option 4287A 020 Figure 7 Handler system example with the 4287A Interfacing with an automated component handler The measurement plane can be extended from the front panel of the instrument to the measurement stage with the 1 m test cable and the small size test head Note that the measurement accuracy is specified at the test head It is possible to extend the test cable an additional meter with a 1 m extension cable In addition connection to an external computer or an automated component handler can be accomplished via the GPIB interface and the opto isolated handler interface The LAN interface enables network communication and greatly empowers massive data transfer to a remote computer Handler Small test head Research and Development of Next Generation Devices and Improving Reliable Quality Control The accurate impedance measurement capability of the 4287A with the various kinds of test accessories offers you total measurement solutions for the areas of research and development as well
6. as quality control Accurate impedance evaluation up to 3 GHz Characterization of components at operating frequencies in excess of 2 GHz is becoming common due to the development and evaluation of RF SMD inductors used in wireless communication equipment The 4287A employs the RF I V measurement method of measuring impedance by measuring the current flowing through a device under test DUT and the voltage applied across the DUT The 4287A enables accurate measurement over an impedance range much wider than that of network analyzers reflection coefficient method Ls g 10 303 ma 115 68 ma y 1 1919 9 Total measurement solution When electronic components are evaluated the test accessories should be suitable for their shape and size for accurate impedance measurements Agilent offers various kinds of 7 mm test fixtures which are compatible with the 4287A You can select the appropriate one for your device s size shape and application The 16196A B C and D SMD test fixtures developed with a coaxial structure make RF impedance measurements to 3 GHz possible The 16196A B C and D correspond to the chip sizes 1608 Gmm 0603 inch 1005 mm 0402 inch 0603 mm 0201 inch and 0402 mm 01005 inch respectively The repeatable DUT positioning capability and reliable contacts enable stable measurement results and reduce the possibility of operator induced error Evaluation of SMD inductors to
7. cal Agilent office The complete list is available at www agilent com find contactus Americas Canada Latin America United States Asia Pacific 877 894 4414 305 269 7500 800 829 4444 Australia China Hong Kong India Japan Korea Malaysia Singapore Taiwan Thailand 1 800 629 485 800 810 0189 800 938 693 1 800 112 929 0120 421 345 080 769 0800 1 800 888 848 1 800 375 8100 0800 047 866 1 800 226 008 Europe amp Middle East Austria Belgium Denmark Finland France Germany Ireland Israel Italy Netherlands Spain Sweden Switzerland United Kingdom 0820 87 44 11 32 0 2 404 93 40 45 70 13 15 15 358 0 10 855 2100 0825 010 700 0 125 minute 01805 24 6333 0 14 minute 1890 924 204 972 3 9288 504 544 39 02 92 60 8484 31 0 20 547 2111 34 91 631 3300 0200 88 22 55 0800 80 53 53 44 0 118 9276201 Other European Countries www agilent com find contactus Revised March 27 2008 Product specifications and descriptions in this document subject to change without notice Agilent Technologies Inc 2000 2003 2004 2005 2008 Printed in USA April 10 2008 5968 5443E x a Agilent Technologies
8. d magnifying lens and tweezers High temperature component fixture EIA EIAJ industry sized short bar set Short bars set 1 x 1 x 2 4 1 6 x 2 4 x 2 3 2 x 2 4 x 2 4 4 5 x 2 4 x 2 4 mm External DC bias adapter Performance test kit 7 mm 11 Web Resource www agilent com find Icrmeters E Agilent Email Updates www agilent com find emailupdates Get the latest information on the products and applications you select Agilent Direct www agilent com find agilentdirect Quickly choose and use your test equipment solutions with confidence Remove all doubt Our repair and calibration services will get your equipment back to you performing like new when promised You will get full value out of your Agilent equipment throughout its lifetime Your equipment will be serviced by Agilent trained techni cians using the latest factory calibration procedures automated repair diagnostics and genuine parts You will always have the utmost confidence in your measurements Agilent offers a wide range of additional expert test and measurement services for your equipment including initial start up assistance onsite education and training as well as design system integration and project management For more information on repair and calibration services go to www agilent com find removealldoubt www agilent com For more information on Agilent Technologies products applications or services please contact your lo
9. e Agilent ee 4287A RF LCR Meter 0 ee 1 MHz 3 GHz 05 50 e e e Technical Overview o e e E Agilent Technologies High Speed RF LCR Meter Anticipating Next Generation Test Needs The Agilent 4287A is a high performance RF LCR meter best fit to production line testing of devices such as SMD inductors and EMI filters where impedance testing at high frequencies is required Signal level monitor function Rdc DC resistance Monitors the test signal voltage measurement function or current applied to the device For contact check under test 8 4 inch color LCD display Selectable measurement Ls 1 8970 nH E parameters 4 parameters can 0 10 303 A Navigation keys and rotary knob be displayed simultaneously Support front panel operation Rs 115 68 mQ without the mouse X 1 19199 Small test head with 1m test cable Extension to an automated component handler without introducing additional error 3 5 mm female test port LAN interface External VGA output For remote test control Display measurement results and fast data transfer on a larger VGA monitor NO o o Peo 7 Oooo eG 5 5 oo ey ooo pices oNoo ooo eee O my aov o KS ee O00 Ed O60 ut 900 Opto isolated handler interface component handler component
10. e Add magnifying lens and tweezers U S English localization Japan Japanese localization Maintenance kits for 16196X Upper electrode set for 16196A B C 5 ea Upper electrode set for 16196D 5 ea 1608 mm short plate set 5 ea 1608 mm lower electrode set 5 ea 1005 mm short plate set 5 ea 1005 mm lower electrode set 5 ea 0603 mm short plate set 5 ea 0603 mm lower electrode set 5 ea 0402 mm short plate set 5 ea 0402 mm lower electrode set 5 ea 1 Manual is not furnished as standard 2 Must specify one of language options ABA or ABJ for operation manual for shipment with product For 16196A B C D magnifying lens and tweezers are not furnished as standard 3 Short bar set is not furnished as standard Magnifying lens and tweezers are not furnished as standard 4 This kit includes an open a short a 50 Q terminations and an air line for the performance test to verify the impedance accuracy 161974 Option 16197A 001 Option 16197A ABA Option 16197A ABJ 161924 Option 16192A 010 Option 16192A 701 Option 16192A 710 161944 Option 16194A 010 Option 16194A 701 16200B 16190B Bottom electrode SMD test fixture Add 0201 inch 0603 mm device guide set U S English localization Japan Japanese localization Parallel electrode SMD test fixture EIA EIAJ industry sized short bar Set Short bars set 1 x 1 x 2 4 1 6 x 2 4 x 2 3 2 x 2 4 x 2 4 4 5 x 2 4 x 2 4 mm Ad
11. e tables and can store eight different setups After the setup tables have been established the active measurement setup can be chosen simply by selecting the corresponding number 1 through 8 Key specifications Setup display select menu J 4287A RF LCR Meter T Frequency COMPEN Kir BIN SORT Average 1 0000 Miz 10 000 MHz 100 00 MHz 1 1 1 Setup editor Changes can be made easily with the mouse or navigation keys 8 page setup tables Figure 1 List sweep setup display Test freguency 1 MHz 3 GHz with 100 kHz resolution With list sweep up to 32 points per sweep is available Impedance parameters Z z rad 0z deg Y 0y rad By deg X G B Ls Lp Cs Cp Rs Rp Q D Display resolutions 5 digits Test signal level V open condition 4 47 mVrms 502 mVrms 447 mVrms when gt 1 GHz I short condition 0 0894 mArms 10 mArms 8 94 mArms when gt 1 GHz Basic accuracy 1 096 Measurement range 200 mQ to 3 kQ 91 MHz accuracy lt 10 Measurement time 9 msec per point max speed Measurement terminal 3 5 mm female Calibration and compensation Open short load low loss capacitor calibration fixture electrical length compensation open short compensation Rdc measurement function For contact check on off selectable Data storage devices About 18 Gbyte internal ha
12. ily make the 4287A ready to measure accurately Frequency characteristics by using list sweep function In the area of research and development the frequency characteristics of the device can be required for their circuit demands The 4287A s list sweep functions enable impedance measurements at a maximum of 256 multiple frequency points 32 points max table x 8 table max By using an external PC spreadsheet software and LAN interface the frequency characteristics can be plotted in a graph as shown below Q Accuracy VOx Ox 96 1M 10M 100M 1G 36 Frequency Hz Figure 10 Q accuracy 7 mm port typical Calibration Wizard Compensation at the coaxial port Setup the hardware configuration of the fiure Set a test foture on the coal port Figure 11 Calibration wizard fixture connection after calibration 90 Qx 300 70 Qx 100 Calibration Wizard Compensation at the coaxial port Setup the hardware configuration of the foture Fiture Type Connect OPEN device and click Next 161964 Lie CT cues Figure 12 Calibration wizard open compensation pea mn I TET E pe TE 1 gl Chip Inductor Evaluation 3 4 Frea Hz impedance ohm deg m 100E 06 644E 0 oE 6 1 10E 06 119E 0
13. nent handler is a factor for bin sorting error in production line testing Contact check using the built in DC resistance measurement function improves the accuracy and efficiency of bin sorting 4287A RF LCR Meter 1 Stml Sel 2 Prmtrs 3 CalfComp 4 Display S Trig Mode 6 Save Recall Z System 8 Help TABLE 1 FREQ 100 MHz I POWER 13 0 dBm AVG 1 FREQ Hz 100 M 500 M 800 M 16 26 36 Cmp Del M n compr TABLE 1 POINT N Po Figure 2 Accurate multiple frequency impedance measurements Ls 0 Existing Product 4287A 0 005 01 015 02 025 03 035 0 05 1 15 2 25 3 35 4 45 nH Figure 3 Stability comparison at low signal level DUT 10 nH Q 10 6 Conditions 100 MHz 200 u A AVG 1 3 Sigma when 100 times measurements Accurate automated testing by advanced calibration It is very important to eliminate complicated error elements caused from the use of test fixtures and cables that extend the test head of the 4287A This is especially true for measurements that use an automated component handler Accurate measurements which correlate well with results obtained from manual testing can be achieved at the measurement plane of a test fixture by performing open short load calibration with a working load standard In other words open short load calibration at the measurement plane is dependent solely on the value a
14. perating temperature range 55 C to 200 C Accommodated SMD size See Figure 19 e ues Figure 17 16194A 16200B External DC bias adapter Operating frequency 1 MHz to 1 GHz External DC bias 5 A max 40 V at the BNC connector from the external dc bias source Operating temperature range 0 C to 55 C Figure 18 16200B 16192A 16197A L 10 200mm L 1 0 32mm L 8 0 21 0 mm Zhe NA 7 Figure 19 Accommodated SMD size L 20 150mm Ordering Information Accessories 16196A Option 16196A 710 Option 16196A ABA Option 16196A ABJ 16196B Option 16196B 710 Option 16196B ABA Option 16196B ABJ 16196C Option 16196C 710 Option 16196C ABA Option 16196C ABJ 16196D Option 16196D 710 Option 16196D ABA Option 16196D ABJ 16196U Option 16196U 010 Option 16196U 020 Option 16196U 100 Option 16196U 110 Option 16196U 200 Option 16196U 210 Option 16196U 300 Option 16196U 310 Option 16196U 400 Option 16196U 410 Note Parallel electrode SMD test fixture Add magnifying lens and tweezers U S English localization Japan Japanese localization Parallel electrode SMD test fixture Add magnifying lens and tweezers U S English localization Japan Japanese localization Parallel electrode SMD test fixture Add magnifying lens and tweezers U S English localization Japan Japanese localization Parallel electrode SMD test fixtur
15. rd disk and 1 44 Mbyte floppy disk Interface GPIB LAN 10base T 100base TX automatically switched and Opto isolated handler interface Improving Throughput and Quality In Production Line Testing Accurate impedance measurement using the RF I V measurement method The 4287A uses the RF I V measurement method for measuring impedance by measuring the current flowing through a device under test DUT and the voltage applied across the DUT These measurements of current and voltage can be made over the entire measurement frequency range to 3 GHz RF I V enables accurate measurement over a wide impedance range The impedance measurement range is much wider than that of network analyzers For a very small inductance on the order of a few nH this is a big advantage Stable measurements at low signal levels with high speed SMD inductors require testing with test currents on the order of 100 micro amps It is difficult to maintain high test throughput with previous RF LCR meters since many sequential measurements are required when averaging to reduce measurement variation Measurement stability at low test signal levels is improved with the 4287A making highly repeatable measurements possible The 4287A can increase test throughput due to the decrease of the averaging factor Contact check using the Rdc measurement function Contact failure between a DUT and the measurement plane of an auto matic compo
16. ssigned to the working standard by manual testing of that component Since different calibration standard reference values can independently be set at each list sweep frequency multi frequency measurements can be made accurately with this reliable calibration function Multi function comparator The 4287A is equipped with a multi function comparator to meet a wide variety of testing needs The comparator setup display is formatted as a table Each row represents a bin number and each column represents the sorting conditions for each bin When all sorting conditions set for a bin are satisfied the judgement result is sorted to the bin There are thirteen bins with four limit values for each bin Conditions such as frequency and measurement parameters can be set independently in each column enabling the 4287A to meet various sorting needs including different parameters at different measurement frequencies 4287A RF LCR Meter 1File 2Edit 3 View 4 Table STIMULUS CAL KIT COMPEN KIT BIN SORT Cal Kit R DC Offset Delay C 7mm Standard Open G ojs Open of s User Defined Short R ofa s Short o s Different calibration reference IET TEES d Model Load R f sofa sj load le B values can independently be set at each list sweep frequency Short EE 2 1 saran san ee saa Er Figure 4 Calibration standard data setup display Co Meets condi
17. tions 1 to 4 of BINT Sans to BINI Meets conditions Sorts to BIN2 1 to 4 of BIN2 YES NO Meets conditions 1 to 4 of BIN13 Sorts to BIN13 NO Sorts to OUT_OF_BINS Figure 5 Bin sort seguence 4287A RF LCR Meter iFile 2Edit 3View 4 Table STIMULUS CAL KIT COMPEN KIT COMPARATOR Conditioni Condition 3 100 00 MHz 3 100 00 MHz Ls 50 0000 nH BIN 1 UpperLimit 1 000 1 00000 G LowerLimit 1 000 100 000 In Out In In UpperLimit 2 000 1 00000 G LowerLimit 2 000 100 000 In Out In In UpperLimit 2 000 100 000 LowerLimit 2 000 1 00000 G In Out In In UpperLimit LowerLimit In Out Figure 6 Comparator setup display Statistical functions The 4287A is equipped with functions to statistically analyze data These functions improve the efficiency of the data acquisition required in quality control The statistical analysis function calculates the following statistical parameters for as many as 240000 measurement points Original measurement results for the statistical analysis function can be obtained via LAN interface Examples of normal data non failure Cumulative normal samples mean maximum minimum standard deviation and 3 o mean Examples of failure analysis Cumulative failure samples cumulative Rdc failures cumulative overload samples Total number of normal failure data Data storage The 42874 built in data stor
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