詳細（PDF） - NTTファシリティーズ総合研究所
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1. A3O 3 B 3 B ALARP as low as reasonably practicable gt B3 3 C 3 C gt 1 Annual Report No 26 June 20152. EMC 5 2 5 1 Annual Report No 26 June 2015 NTT Facilities Research Institute 59 1 5 1
3. 6 R Map EMED 1 2 de 3 4 II 70C MIL HDBK 217F 9 1x10 7 8 9 5x 10 5 4
4. BEREK Jt 0 I I I NV 4 R Map 1 R Map A1 4 R Map C Al A3 B 1 B3 C 7 ISO IEC Guide51 I
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6. AC AC BO EU E S 5 5 1 WH
7. CL 62 NTT No 26 2015 6 9 R Map ZAR SX X 1 R Map R Map 1 2011 5 http www juse or jp src reliability 2015 4 30
8. 1 5 2 1 EC 56 5 2 2 NITE 129 m
9. 2014 4 1 3 3 MA
10. 2 FMEA FMEA Failure Modes and Effects Analysis FMEA
11. IL gt I gt JM uL 3 R1 R1 2 750kO 2
12. 1h 2010 5 http www meti go jp product safety recall risk assessment pdf 2015 4 30 2011 6 http www meti go jp product_safety recall N 3 risk assessment practice pdf 2015 4 30 JIS Z 8051 2004 ISO IEC Guide 51 1999 2004 3 R Map FTA SSS2011 21 pp 13 16 2011 12 2013 7 1 JEITA RCR 9102B 2006 6 ISO IEC GUIDE 51 2014 Safety aspects Guidelines for their inclusion in standards 2014 4 JIS C 57504 32011 4 3 FMEA IEC 60812 2006 2011 1 JIS C 5750 4 4 2011 4 4
13. 2 OM v JSV OO VANTIN OOOO 1 2 3 2 ISO IEC 1999 ISO IEC Guide51 1999 5
14. 1 1 10 1 6x10 16FIT 1 4 x10 1 5 0 10 10 2 10 1 000 10 1
15. FTA IEC 61025 2006 2011 1 11 41 1 1 3 p 15 2005 JIS Q 31010 2012 IEC ISO 31010 2009 2012 4 13 JISC0508 1 2012 7 IEC 61508 7 2010 2012 10 14 AREF OHM pp 68 79 2012 1 15 I TRIZ 2 pp 112 164 2013 MIL HDBK 217F Notice 2 Reliability prediction of electronic equipment 9 1 2006 6 4 5 6 w T 8 w 9 10 12 gt 16
16. 2 9 5x 10 9 0x10 2 4 B1 R1 3 500kQ 3 3 9 5 x10 8 6x10 0 2 4 C 4 R Map 8 BE
17. 7 NITE http wwwjiko nite go jp php jiko index html rise 41 7 JIS Q 31010 2012 Hk 32 JIS C 0508 7 2000 7 IEC 62305 2 Ed2 0 2010 TRIZ AFD AFP
18. 100 0 1 5 Jv R Map 58 NTT No 26 2015 6 10 3
19. gt e d f EZ Z zi JV 172 R1 2 M An C1 2 2 RERE SM n RHR SM n R1 2 R1 3 Annual Report No 26 June 2015 NTT Facilities Research Institute 61
20. 50V 0 1 7F 13 IC1 PIC 5 5V 5 5V 120 R1 3 WROK FTA FTA Fault Tree Analysis X AND OR FTA FTA JIS C 5750 4 4 2011 4 ETA ETA Event Tree Ana
21. IEEE Synopsis Use of R Map for effective Risk Management during Product Development Naoki MURAKAMI This paper presents methods of performing risk assessment of electrical products using an R Map based on the Risk Assessment Handbook Practical Version issued by the Ministry of Economy Trade and Industry The R Map is a matrix that shows risk levels divided into six levels of frequency of occurrence on the vertical axis and five levels of extent of injury on the horizontal axis with the risk level increasing toward the upper right corner Hazards are indentified from elements such as injury incident scenarios FMEA FTA and examples of accidents with the frequency of occurrence and degree of injury of each converted into numerical values and applied to the R Map thus facilitating verification of risk levels easily As a result risk reduction measures can be validated using the R Map to achieve a tolerable risk level Annual Report No 26 June 2015 NTT Facilities Research Institute 63
22. FMEA 1 FMEA JIS C 5750 4 3 2011 FMEA gt 3 DC660V FMEA 3 R1 1 5MQ 3W R2 10k O0 0 1W 660V 60 NTT No 26 2015 6 R1 R 2 660V 10kQ 43 6W C1
23. NTT Facilities Research Institute 57 1 La 2 10 me 10 10 8 10 lt 10 10 gt 10 10 lt 10 8 TV TIT 2 R Map 0 10
24. 9 NTT R Map Keyword R Map 1 R Map R Map R Map 1999 R Map 2010 5 1 2011 6 ISO
25. IEC 1999 ISO IEC Guide 51 1999 JIS Z 8051 2004 NITE 2008 R Map 2011 10 1 2013 7 Wi R Map 2 R Map R
26. Map 1 fis 0 5 6 0 MV 5 2 10 8 10 4 lt 10 5 10 lt 10 10 S 7 107718 10 7 lt 10 8 10 0 1 I I 1 R Map A B C 3 1 3 A gt
27. lysis X 5 6
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