User Guide for FEBFSQ500L_H257v1 Evaluation Board
Contents
1. 23 9 vcn 24 2011 Fairchild Semiconductor Corporation 2 FEBFSQ500L_H257v1 Rev 1 0 2 fJ FAIRCHILD El SEMICONDUCTORS ww fairchildsemi com This user guide supports the evaluation kit for the FSQ500L It should be used in conjunction with the FSQ500L datasheet as well as Fairchild s application notes and technical support team Please visit Fairchild s website at www fairchildsemi com 1 Introduction This engineering report describes 2 04 W power supply using FSQ500L This power supply is targeted for a flyback converter replaces linear power supplies with low cost and small size 1 1 General Description This device combines a current mode Pulse Width Modulator PWM with a SenseFET and high voltage regulator connected from the DRAIN pin to supply the Vcc This device does not need to use bias winding and associated external components Using SOT 223 package FSQ500L reduces total size and weight while increasing efficiency productivity and system reliability Using FSQSOOL this design example for 2 04 W can be implemented with few external components and minimized cost 1 2 Features Single Chip 700 V SenseFET Power Switch Precision Fixed Operating Frequency 130 kHz No load consumption 250 mW at 265 Vac with Burst Mode Down to 60 mW with External Bias2. Ch3 aval i Figure 15 85 Vac 60 Hz at No Load Figure 16 85 60 Hz at Max Load Ch 1 Vo Ch 2 Vps Ch 3 1 Vo Ch 2 Vps Ch 3 Ch Ch3 Ch1 Ch2 Pins 2 Gi Figure 17 264 Vac 50 Hz at No Load Figure18 264 50 Hz at Max Load Ch 1 Vo Ch 2 Vps Ch 3 1 Vo Ch 2 Vps Ch 3 Ves 4 7 Line and Load Regulation 4 7 1 Test Condition Measure line and load regulation according to Table 7 with output cable Table 7 Test Result 2011 Fairchild Semiconductor Corporation 10 FEBFSQ500L_H257v1 Rev 1 0 2 fJ FAIRCHILD ae SEMICONDUCTORS ww fairchilds mi om 4 8 Efficiency 4 8 1 Test Condition Output at maximum load Table 8 Test Result Table 9 Test Result Efficiency Input Voltage 25 Load E 1 Load 75 Load Load Average 115 Vac 60 Hz 55 31 58 58889 64 43 66 662205 61 21 230 Vac 50 Hz 43 01 46 97 50 96 56 62 49 41 4 9 Output Ripple and Noise 4 9 1 Test Condition Ripple and noise are measured by using a 20 MHz bandwidth limited oscilloscope with a 10 uF capacitor paralleled with a high frequency 0 1 uF capacitor across each output Table 10 Test Result Ch1 Ch1 Figure 19 85 Vac 60 Hz at No Load Ch 1 Vo Figure 20 85 Vac 60 Hz at Max Load Ch 1 Vo 2011 Fairchild Semiconductor Corporation 11 FEBFSQ500L_H257v1 Rev 1 0 2 SSS FAIRCHILD
3. SEMICONDUCTORS ww fairchildsemi com Ch1 Chi EN L RENI L NET Measue P1 pkpk C1 2 P3 Ph Measure P1 pkpk C1 value mv 9 status status v 00 H LD ott 10 Figure 21 120 Vac 60 Hz at No Load Ch 1 Vo Figure 22 120 Vac 60 Hz at Max Load Ch 1 Vo D B Measure pipk Ct P2 P3 Measure P1 pipk Ct P2 P3 P amp value 53mv value status v status GDE Le 10 MS doe 00 500 5 Sg 422 Figure 23 24 OVac 50 Hz at No Load Ch 1 Vo Figure 24 240 Vac 50 Hz at Max Load Ch 1 Vo Ch1 Ch1 Measure pkpk Ct P amp Measure P1 pkpk C1 2 P3 amp P amp value 50 16 mv status v 50m 7 000 Ba 10 ge na 500 Sis Edoe Figure 25 264 Vac 50 Hz at Load Ch 1 Vo Figure 26 264 Vac 50 Hz at Max Load Ch 1 Vo 4 10 Step Load Response 4 10 1 Test Condition Dynamic loading 20 80 of the full load 5 ms duty cycle 2 5 A us rise fall time Table 11 Test Result 2096 8096 of the Full Load Input Voltage Undershoot 2011 Fairchild Semiconductor Corporation 12 FEBFSQ500L_H257v1 Rev 1 0 2 AAA FAIRCHILD sl SEMICONDUCTORS ww fairchildsemi om Ch1 Chi Hin SZ cca
4. Time m 9 4 7 Leer ulation nn 10 4 5 11 4 user PEPPER 5270000 11 er ponse BER EE 12 nt Protection Waaa nne s 13 SIS si oo ooo oo s ss n A 13 Protection 14 Duty Ratio BERE 15 A D WS AND 15 dum cmllemperature _ 15 4 17 Voltage Stress of Drain and Secondary Rectilftier 16 aveforms ERO 17 du uer KE sene NND 18 ALO BOD Leer sc 18 E Chou E 19 pecilication 20 7 Cl ci vie
5. Internal Startup Switch Soft Start Time Tuned by External Capacitor Under Voltage Lockout UVLO with Hysteresis Pulse by Pulse Current Limit Overload Protection OLP and Internal Thermal Shutdown Function TSD with Hysteresis Auto Restart Mode No Need for Auxiliary Bias Winding 2011 Fairchild Semiconductor Corporation 3 FEBFSQ500L_H257v1 Rev 1 0 2 ww fairchilds mi om fJ FAIRCHILD El SEMICONDUCTORS Vcc D um TE Figure 1 Internal Block Diagram 2 Specifications Table 1 Summary of Features and Performance me _ Total Output Power Full oad Output Power e Peak Output Power 2011 Fairchild Semiconductor Corporation 4 FEBFSQ500L_H257v1 Rev 1 0 2 PE FAIRCHILD SEMICONDUCTORS ww fairchildsemi om 3 Photographs amp PCB Layout Figure 3 Bottom Layer Pattern a 2 0 38 E000MJA Se Figure 4 Bottom Overlay Silk Screen 2011 Fairchild Semiconductor Corporation 5 FEBFSQ500L_H257v1 Rev 1 0 2 fJ FAIRCHILD El SEMICONDUCTORS ww fairchilds mi om 4 Function Test Report Test Model FEBFSQ500L H257v1 Test Date June 23 2008 Test Temperature AC source 6800 AC POWER SOURCE Electronic load Chroma 63030 Power meter WT210 Oscilloscope LeCory 24Xs Test Equipment Input Current Input Wattage at No Load Condition Burst Mode Test Soft Start Test Turn On Delay T
6. Al HI ll IN Figure 27 85 Vac 60 Hz Ch 1 Vo Figure 28 264 Vac 50 Hz Ch 1 Vo 4 11 Over Current Protection 4 11 1 Test Condition Increase output loading gradually and measure the maximum output power Table 12 Test Result 4 12 Hold up Time 4 12 1 Test Condition Set output at maximum load Measure the time interval between AC off and output voltage falling to the lower limit of the rated value The AC waveform should be off at zero phase Table 13 Test Result Input Voltage Hold up Time 115 Vac 60 Hz 18 64 ms 230 Vac 50 Hz 77 27 ms 264 Vac 50 Hz 101 41 ms 2011 Fairchild Semiconductor Corporation 13 FEBFSQ500L_H257v1 Rev 1 0 2 ww fairchildsemi com SSS FAIRCHILD SEMICONDUCTOR Ch1 maen 29 85 60 2 Load Figure a 115 Vac 60 Hz at Max Load Ch 1 Vo Ch 4 Vac Ch 1 Vo Ch 4 Vac l Chi Ch4 Ch4 1 IAAAAAAA AAAAANAAR LA A LI AH KX KI A Ta a mmm mmm mmm rt WUVVVVVI VVVVVVV 1 Figure 31 230 50 Hz at No Load Figure x 264 Vac 50 Hz at Max Load Ch 1 Vo Ch 4 Vac Ch 1 Vo Ch 4 Vac 4 13 Short Circuit Protection 4 13 1 Test Condition Short the output of the power supply The power supply should enter Auto Restart Mode protection with less than 2
7. Soft Start Test 4 4 1 Test Condition ww fairchildsemi com Measure the soft start waveform at maximum load with ambient after short after OTP Table 4 Test Result Input Voltage Soft Start Time 240 Mac Hz 14 ms Under 100v 100w SM2 00ms A Chl 7 3 04 V Ch3 1 00 wCh4 50 0 2 ii 30 00 Figure 7 120 V4c 60 Hz at Max Load Ambient Ch 1 Vo Ch 2 Ch 3 Vcc Ch 4 IpnAIiN 29 7H 2008 02 21 24 1 00 V T 00 V uMd 00ms Cha f Ch3 1 00 wCh4 S0 0mAg ii 19 80 120 Vac 60 Hz at Max Load After Short Ch gt Vo Ch 2 Ves Ch 3 Vcc Ch 4 IDRAIN Tek ER u T Qm dV r A 13 Ems I I 00 5 65ms 2 29 7H 2008 02 25 16 Figure 9 A I Ai il A ta 0 wchz T 00 v SM4 00ms A Chl J 2 98 V Ch3 1 00 V 50 0 2978 200 ii 51 20 04 21 36 Figure 11 120 Vac 60 Hz at Load After OTP 1 Vo Ch 2 Ch 3 Vcc Ch 4 IpnAIiN 2011 Fairchild Semiconductor Corporation Tek 1 ChB mI 100 wchz 1 00v SM2 00ms A Chl 3 04 V Ch3 T 0 V Cha 50 is 30 00 240 Vac 50 Hz at Max Load Ambient Ch 1 Vo Ch 2 Ves Ch 3 Vcc Ch 4 IDRAIN Tek 128 2978 2008 02 23 34 Figure 8 60
8. 0mVv m G 12 215 w KO ous 1 00 Chi 1 00V WM ooms A Cha 192mA Ch3 1 00 wCh4 5 ii 19 80 Figure 10 240 Vac 50 Hz at Max Load After Short Ch 1 Vo Ch 2 Vreg Ch 3 Vcc Ch 4 Ibran Tek 98 2978 200 02 30 32 LIZV SIV 13 0 5 ms Ch di TTE n WII 1 00V cha 1 007 SM4 00ms A Chl 7 2 98 V Ch3 1 00 MCha S0 0mA u 29 7H 200 ii 51 20 X 04 30 25 Figure 12 240 Vac 50 Hz at Max Load After Ch Vo Ch 2 3 Vcc Ch 4 IDRAIN FEBFSQS500L_H257v1 Rev 1 0 2 SSS FAIRCHILD Le SEMICONDUCTORS 4 5 Turn On Delay Test ww fairchildsemi com 4 5 1 Test Condition Set the output at maximum loading Measure the interval between AC plug in and stable output Table 5 Test Result 85 Vac 60 Hz 89 60 ms 264 Vac 50 Hz 99 08 ms Figure 13 85 Vac 60 Hz at Max Load Figure 14 264 Vac 50 Hz at Max Load Ch 1 Vo Ch 4 Vac Ch 1 Vo Ch 4 Vac 4 6 DC Output Rising Time 4 6 1 Test Condition Set output at maximum loading and no loading Measure the time interval between 10 and 90 of output voltage during startup Table 6 Test Result 2011 Fairchild Semiconductor Corporation 9 FEBFSQ500L_H257v1 Rev 1 0 2 SSS 3 FAIRCHILD BEES SEMICONDUCTORS ww fairchildsemi com Ch1 Ch1 m Ch2 _
9. DUCTOR 5 Schematic WSLSAS POBO0 ae pu 2090080 g Schematlic Figure 49 Rev 1 0 2 FEBFSQ500L H257v1 19 2011 Fairchild Semiconductor Corporation SSS FAIRCHILD SEMICONDUCTOR ww fairchildsemi com 6 Transformer Specification 1 Dimension _ LS A 1 5mm B 19 5mm MAX C 21 0mm MAX D 4 0 0 5mm E 3 2 0 5mm F 15 5 0 5mm G 0 84 O 1mm Note Pin3 4 5 6 7 8 removed UNIT menm DRAWN CHECK TITLE TRANS pou 0222166293 2215 8293 SEN HUEI INDUSTRIAL CO LTD 2011 Fairchild Semiconductor Corporation 20 FEBFSQ500L_H257v1 Rev 1 0 2 fJ FAIRCHILD aes ww fairchildsemi eam SEMICONDUCTORS 2 Schematic Tape 5T Tape 2T mej S CORE ROUNDING TAPE 2011 Fairchild Semiconductor Corporation 21 FEBFSQ500L_H257v1 Rev 1 0 2 fJ FAIRCHILD El SEMICONDUCTORS 3 Electrial Specification ww fairchildsemi com 3 1 Inductance test at 100 KHz 1 V P 2 1 800 pH 5 3 2 DC Resistance test at 25 C P 2 1 xx Max not fixed P 10 9 xx Max not fixed 3 3 Hi pot test AC 3 0 KV 60 Hz 5 mA hi pot for one minute between pri to sec AC 1 5 KV 60 Hz 5 mA hi pot for one minute between pri to core AC 1 5 KV 60 Hz 5 mA hi pot for one minute between sec to core 3 4 Insulation test The insulation resistance is between pri to se
10. R 70 CLRWR 70 50220 50220 60 60 5022 5022 5 0 50 40 40 20 20 10 10 0 0 150 kHz 150 MHz 150 kHz 150 MHz Date 7 AUG 2008 17 54 47 Date 7 AUG 2008 17 43 44 Figure 44 Conduction Line at 115 Vac Figure 45 Conduction Neutral at 115 Vac i RBW 120 kHz RBW 120 kHz M T 50 ms MT 50 ms Att 10 dB PREAMP OFF Att 10 dB PREAMP OFF 100 1 MHz 10 MHz 100 MHz 100 1 MHz 10 MHz 100 MHz 90 90 OVLD ME ZS CLRWR ICLRWR 80 80 2 AV 2 AV CLRWR 70 CLRWR 70 50220 50220 60 60 5022 5022 50 50 40 40 30 30 20 20 10 10 0 0 150 kHz 150 MHz 150 kHz 150 MHz Date 7 AUG 2008 17 13 20 Date 7 AUG 2008 17 25 34 Figure 46 Conduction Line at 230 Vac 2011 Fairchild Semiconductor Corporation Figure 47 Conduction Neutral at 230 Vac 17 FEBFSQS500L H257v1 Rev 1 0 2 ww fairchildsemi com SSS FAIRCHILD BEES SEMICONDUCTORS 4 19 Surge Test M Voltage Pass Pass Pass Pass v Figure 48 ESD Test Setup 2011 Fairchild Semiconductor Corporation 18 FEBFSQ500L_H257v1 Rev 1 0 2 ww fairchildsemi com FAIRCHILD SEMICON
11. TP 4 16 1 Test Condition Set the output at maximum loading Heat the IC with a heatgun measure the waveform to enable the OTP and disable the OTP 2011 Fairchild Semiconductor Corporation 15 FEBFSQ500L_H257v1 Rev 1 0 2 SSS FAIRCHILD LG SEMICONDUCTORS ww fairchildsemi om L Ch2 Ch2 Ch1 MAMM Ch3 Ch3 MAA MMMM III HE HN E Ch4 Ch1 Figure 38 120 Vac 60 Hz at Max Load Enable Figure 39 120 Vac 60 Hz at Max Load Disable Ch 1 Vo Ch 2 Vcc Ch 3 Ves Ch 4 Vps Ch 1 Vo Ch 2 Vcc Ch 3 4 Vps h AARAA Ch3 M ANKAAAAAAAAARAAAAAAA WWWWWWwww Ch3 WAAAY Ch4 Ch1 40 240 50 Hz at Load Enable Figure 41 240 Vac 50 Hz at Disable Ch ili Vo Ch 2 Vee Ch 3 Vcc Ch 4 Vps Ch 1 Vo Ch 2 Vrg Ch 3 Vcc Ch 4 Vps 4 17 Voltage Stress of Drain and Secondary Rectifier 4 17 1 Test Condition Measure the voltage stress of drain and secondary rectifiers under conditions specified in the table below 4 17 2 Test Result Stress On Stress On MOSFET Output Rectifier 85 60 Hz Maximum Load 231 V 494V 00 0 494V 00 0 V 85 60 Hz Maximum Load Startup 234 V 600 V 85 60 Hz Maximum Load Output Short 22V V 264 Vac 50 Hz Maximum Load EM V 264 50 Hz Maximum Load Startup 496 V 264 50 Hz Maxi
12. W input voltage Table 14 Test Result Input Wattage at Input Wattage at 120 Vac 60 Hz 0 574 W 05722W 572 05722W Pin lt 2 W 240 50 Hz Ch2 Ch2 h Ch3 Ch1 Ch3 4 Ch4 Figure 33 120 60 Hz at Max Load Figure 34 240 50 Hz at Max Load Ch 1 Vo Ch 2 Vcc Ch 3 Ch 4 Vps Ch 1 Vo Ch 2 Vcc Ch 3 Ch 4 Vps 2011 Fairchild Semiconductor Corporation 14 FEBFSQ500L_H257v1 Rev 1 0 2 SSS FAIRCHILD Le SEMICONDUCTORS ww fairchildsemi com 4 14 Maximum Duty Ratio 4 14 1 Test Condition Set the output at maximum loading Decrease the input voltage with 5 Vac step Verify the FB voltage is under overload state between 2 7 4 V Measure the maximum duty and waveform Tek Prevu 46 mA D ARus 3 48 ps a gt SP Duty 45 74 Unstable histogram Chz Max 2 74 Ch4 286m Chi 1 00 V cha 1 00 v SM2 00us A 248mA Ch3 1 00 v SE loomaAchy 29 ul 2005 ii 51 20 04 48 00 Figure 35 50 Vac 60 Hz at Max Load Ch 1 Vo Ch 2 Ch 3 Vcc Ch 4 Ibran 4 15 Power Off 4 15 1 Test Condition Set the output at the maximum load Remove power Ch2 Ch1 Ch4 Figure 36 120 Vac 60 Hz at Max Load Figure 37 240 50 Hz at Max Load Ch 1 Vo Ch 2 Vec Ch 3 Ch 4 Vps Ch 1 Vo Ch 2 Vec Ch 3 Veg Ch 4 Vps 4 16 Over Temperature Protection O
13. c and windings to core measured by DC 500 V must Be over 100 MQ 3 5 Terminal strength 1 0 Kg on terminals for 30 seconds test the breakdown UNIT DRAWN CHECK TITLE TRANS IDENT No 26 1 Lane 128 Sec 2 DWG SEN HUEI INDUSTRIAL CO LTD NO Singnan Rd Jhonghe City Taipei County 235 Taiwan 2011 Fairchild Semiconductor Corporation 22 FEBFSQ500L_H257v1 Rev 1 0 2 SSS FAIRCHILD E SEMICONDUCTOR 7 Bill of Materials ww fairchildsemi com 4 Part Number Quantity Description Manufacturer F1 R3 R9 7 2 TAPING REEL REEL REEL REEL REEL REEL REEL 8 11 1 2 1 1 1 1 1 1 1 Metal Oxide Resistor 1 W S 100 5 SMD Resistor 0805 30 5 SMD Resistor 0805 300 5 SMD Resistor 0805 1 KO 1 SMD Resistor 0805 2 KO 1 SMD Resistor 0805 2 20 1 SMD Resistor 0805 4K7Q 1 SMD Resistor 1206 200 5 Electrolytic Capacitor 4 7 uF 400 V 105 C 6 11 1 Electrolytic Capacitor 47 uF 50 V 105 C 6 11 1 missi 1 u 400 V 105 C ew ozo 1 220 FBV 1050 REL 1 223 50 __ Ww REL 1 05 10 __ 2 1 Pxedidudos4TOUHsION _ DRASCIBuH 1 mdctrTRNDSS o MEME EE coo es ij Fairchild Semicond EEN ma E 1 R4 5 C9 l N 2011 Fairchild Semico
14. e Export Administration Regulations for the ultimate destination listed on the commercial invoice Diversion contrary to U S law is prohibited U S origin products and products made with U S origin technology are subject to U S Re export laws In the event of re export the user will be responsible to ensure the appropriate U S export regulations are followed 2011 Fairchild Semiconductor Corporation 24 FEBFSQ500L_H257v1 Rev 1 0 2
15. erein DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY FUNCTION OR DESIGN FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS NOR THE RIGHTS OF OTHERS LIFE SUPPORT POLICY FAIRCHILD S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION As used herein 1 Life support devices or systems are devices or systems which a 2 A critical component is any component of a life support device or are intended for surgical implant into the body or b support or system whose failure to perform can be reasonably expected to sustain life or c whose failure to perform when properly used in cause the failure of the life support device or system or to affect its accordance with instructions for use provided in the labeling can be safety or effectiveness reasonably expected to result in significant injury to the user ANTI COUNTERFEITING POLICY Fairchild Semiconductor Corporation s Anti Counterfeiting Policy Fairchild s Anti Counterfeiting Policy is also stated on our external website www fairchildsemi com under Sales Support Counterfeiting of semiconductor parts is a growing problem in the ind
16. est DC Output Rising Time Line and Load Regulation Efficiency Output Ripple and Noise Step Load Response Over Current Protection Hold Up Time Short Circuit Protection Maximum Duty Ratio Power Off Over Temperature Protection OTP Voltage Stress of Drain and Secondary Rectifier EMI Waveforms Surge Test ESD Test Test Items 4 1 Input Current 4 1 1 Test Condition Measure the AC input current at maximum loading Table 2 Test Result Input Voltage Input Current 85 VAC 60 Hz 57 62 mA 264 Vac 50 Hz 35 73 mA 2011 Fairchild Semiconductor Corporation 6 FEBFSQ500L_H257v1 Rev 1 0 2 fel IN SSS FAIRCHILD MR SEMICONDUCTORS 4 2 Input Wattage at No Load Condition 4 2 1 Test Condition Measure the input wattage and output voltage at no load Table 3 Test Result Input Voltage Input Wattage Output Voltage Specification 120 Vac 60 Hz 0 116 W 5 224 V 230 Vac 50 Hz 0 209 W 5 224 V 264 Vac 50 Hz 0 242 W 0 224 V 4 3 Burst Mode Test 4 3 1 Test Condition Measure the waveform and frequency in Burst Mode at no load Ch2 Figure 5 85 Vac 60 Hz at No Load Figure 6 264 Vac 50 Hz at No Load Ch 1 Vo Ch 2 Vps Ch 3 Ch 1 Vo Ch 2 Vps Ch 3 2011 Fairchild Semiconductor Corporation 7 FEBFSQ500L_H257v1 Rev 1 0 2 SSS FAIRCHILD SEMICONDUCTORS 4 4
17. fJ FAIRCHILD SEMICONDUCTOR ww fairchilds mi om User Guide for FEBFSQ500L H257v1 Evaluation Board Compact Green Mode Controller FSQ500L 5 1V 400 mA Flyback Design Featured Fairchild Product FSQ500L Direct questions or comments about this evaluation board to Worldwide Direct Support Fairchild Semiconductor com 2011 Fairchild Semiconductor Corporation 1 FEBFSQ500L_H257v1 Rev 1 0 2 fJ FAIRCHILD SEMICONDUCTOR ww fairchilds mi om Table of Contents Jio O00 ss s USE UE DN 3 S G ii ID ii NETT OT TT 3 IM M eu esa A sss 3 Di P NUI IBI RES 4 3 Photographs amp Layout 2065 _ 4 Function Test Report 6 4 1 Input 22 6 4 2 Input Wattage at No Load Condition 7 4 3 Burst Mode Test 7 4 4 Soft Start Test 9 4 5 Test n _ SSES 9 4 6 DC
18. mum Load Output Short 471 V 264 Vac 50 Hz Maximum Load Turns Off 2011 Fairchild Semiconductor Corporation 16 FEBFSQ500L_H257v1 Rev 1 0 2 SSS FAIRCHILD E SEMICONDUCTOR Ch4 A A A ES Avo Ww Ww wa WA TU VN AANGAAN AANT A TNT FN V V VA j V V A e V V V V V f f lg Bn arm Measure Pt pkpk C3 P2 pkpkcC4 P3 P4 value 413v 500 status v 20 0 E Figure 42 264 Vac 50 Hz at Max Load Operating Ch 3 rectitier Ch 4 Vps PS ps d lt 20 1 em 500 73 106 Y 500 5 10 nij 4 18 EMI Waveforms ww fairchildsemi com Measure Pt pkpk C3 P2pkpk C4 413v 494 status v v 200 Vidv 50 00 V ofst Ch4 Ch3 P4 p5 0 e 50 0 Fuk 106 V 250 KS 500 kp 972 nij Figure 43 264 V4c 50 Hz at Max Load Power Off Ch 3 rectitier Ch 4 Vps RBW 120 kHz RBW 120 kHz 50 ms MT 50 ms Att 10 dB PREAMP OFF Att 10 dB PREAMP OFF 100 1 MHz 10 MHz 100 MHz 100 1 MHz 10 MHz 100 MHz 90 90 OvLD SES 6345141 CLRWRI 80 80 2 AV 2 AV CLRW
19. nductor Corporation FEBFSQ500L_H257v1 Rev 1 0 2 FAIRCHILD ee ww fairchildsemi com SEMICONDUCTOR ku 8 Revision History Dae Desen OO Change User Guide EVB number from FEB257_001 to FEBFSQ500L 257 1 3 6 12 Formatting amp Editing pass by Tech Docs prior to posting 2 21 13 Change IC pin numbering on Figure 49 WARNING AND DISCLAIMER Replace components on the Evaluation Board only with those parts shown on the parts list or Bill of Materials in the Users Guide Contact an authorized Fairchild representative with any questions This board is intended to be used by certified professionals in a lab environment following proper safety procedures Use at your own risk The Evaluation board or kit is for demonstration purposes only and neither the Board nor this User s Guide constitute a sales contract or create any kind of warranty whether express or implied as to the applications or products involved Fairchild warrantees that its products meet Fairchild s published specifications but does not guarantee that its products work in any specific application Fairchild reserves the right to make changes without notice to any products described herein to improve reliability function or design Either the applicable sales contract signed by Fairchild and Buyer or if no contract exists Fairchild s standard Terms and Conditions on the back of Fairchild invoices govern the terms of sale of the products described h
20. ustry All manufacturers of semiconductor products are experiencing counterfeiting of their parts Customers who inadvertently purchase counterfeit parts experience many problems such as loss of brand reputation substandard performance failed applications and increased cost of production and manufacturing delays Fairchild is taking strong measures to protect ourselves and our customers from the proliferation of counterfeit parts Fairchild strongly encourages customers to purchase Fairchild parts either directly from Fairchild or from Authorized Fairchild Distributors who are listed by country on our web page cited above Products customers buy either from Fairchild directly or from Authorized Fairchild Distributors are genuine parts have full traceability meet Fairchild s quality standards for handling and storage and provide access to Fairchild s full range of up to date technical and product information Fairchild and our Authorized Distributors will stand behind all warranties and will appropriately address any warranty issues that may arise Fairchild will not provide any warranty coverage or other assistance for parts bought from Unauthorized Sources Fairchild is committed to combat this global problem and encourage our customers to do their part in stopping this practice by buying direct or from authorized distributors EXPORT COMPLIANCE STATEMENT These commodities technology or software were exported from the United States in accordance with th
Download Pdf Manuals
Related Search