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Optoelectronics Test

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1. 1 00E 06 5 00E 07 0 00E 00 5 00E 07 1 00E 06 1 50E 06 Time Figure 3 un Lil N Z ea Q LLI om LLI O Q 1 888 KEITHLEY us only KEITHLEY www keithley com A GREATER MEASURE OF CONFIDENCE 525 2520INT Integrating Sphere for Pulsed Measurements The Model 2520INT Integrating Sphere is designed to optimize the Model 2520 Pulsed Laser Diode Test System s optical power measurement capabilities It allows the testing of devices with pulse widths as short as 500ns The short pulses of the Model 2520 combined with the speed of the Model 2520INT make them ideal for measuring the optical power of laser diodes at the bar or chip level before these devices are integrated into temperature controlled modules When connected to the Model 2520 via a low noise triax cable the Model 2520INT allows the Model 2520 to make direct high accuracy measurements of a laser diode s optical power The results are expressed in milliwatts St Designed Specifically for Pulsed Laser Diode Testing Keithley developed the Model 2520INT to address the challenges specific to pulse testing laser diodes which include short pulse periods and fast rise times For example when testing laser diodes in pulse mode the opti cal head used must provide a response that s fast enough to measure light pulses as short as 500ns Many optical power detectors are ha
2. m aD ur 49 ive CN aD ad ur Ce in individual catalog sections raw measurement data from the Model 2420 and the Model 2502 is uploaded to the PC for analysis The LIV Demo Software can calculate ACCESSORIES INCLUDED IN EACH OPTION first and second derivatives of the back facet monitor diode or the w a external photo detector SOURCE MEASURE Includes 2400 LV 2420 or 2440 SourceMeter Instrument 2502 Photodiode Meter 2 GPIB Interface Cabl ieee til ACCESSORIES AVAILABLE Integrating Sphere Cable and adapter Triax 6172 adapter CABLES DUT Cables terminated in Alligator clips BK 7007 1 Double Shielded GPIB Cable 1m 3 3 ft 7007 2 Double Shielded GPIB Cable 2m 6 6 ft TEMPERATURE CONTROL FIBER ADAPTERS Keithley salesperson Includes 2510 AT SourceMeter Instrument s GPIB Interface Cable s System kit has a 1 2 input port For fiber input add adapter below DUT Cables 2500INT FC APC FC APC Fiber Adapter to Integrating Sphere Rackmount Conversion Kit 2500INT FC PC _FC PC Fiber Adapter to Integrating Sphere INTEGRATING SPHERE 2500INT SMA SMA Fiber Adapter to Integrating Sphere Includes 2500INT Integrating Sphere CABINETS 7 ees i ee ut port System kit is supplied with all necessary rack mount hardware Purchase appropriate cabinet and assembly services separately LASER DIODE MOUNT 8000 10 Equipment Cabinet 10 high holds 4 instruments el Includes 854x Laser Diode Mount 8000 14A E
3. 320 2520 PULSED LASER DIODE TEST SYSTEM oe Simplifies laser diode LIV testing prior to packaging or active temperature control Integrated solution for in process LIV production testing of laser diodes at the chip or bar level Sweep can be programmed to stop on optical power limit Combines high accuracy source and measure capabilities for pulsed and DC testing Synchronized DSP based measurement channels ensure highly accurate light intensity and voltage measurements Programmable pulse on time from 500ns to 5ms up to 4 duty cycle Pulse capability up to 5A DC capability up to 1A 14 bit measurement accuracy on three measurement channels V front photodiode back photodiode Measurement algorithm increases the pulse measurements signal to noise ratio Up to 1000 point sweep stored in buffer memory eliminates GPIB traffic during test increasing throughput Digital 1 O binning and handling operations IEEE 488 and RS 232 interfaces 1 888 KEITHLEY v s only acar ENTER Remote Electrical Test Head included ulsed Laser Diode Test System The Model 2520 Pulsed Laser Diode Test System is an integrated synchronized system for testing laser diodes early in the manufacturing process when proper temperature control cannot be easily achieved The Model 2520 provides all sourcing and measurement capabilities needed for pulsed and continuous LIY light cur
4. 2 Tat an Rc aS me c tj WY p ur ad ur aD ad aD jd a an U OPTOELECTRONICS TEST 330 System 25 A custom configuration and ordering guide is available to simplify selecting all the critical items needed to complete a system Single Vendor Solution In addition to the assurance of hardware and software compatibility systems integrators can be confident they ll get all the technical support they need to complete and maintain their systems from a single source Keithley s applications engineers can help systems integrators optimize the performance of each instrument in the system to ensure high speed and accuracy from the system as a whole High Accuracy Building Blocks The standard LIV test system provides a fast flexible solution for testing LDMs by combining the functions of several high speed high accuracy Keithley instruments e Model 2400 LV 2420 or 2440 High Current SourceMeter instru ment During LIV testing the SourceMeter instrument provides a current sweep to drive the laser diode It also synchronizes the measurements made by other instruments in the system The Models 2400 LV 2420 and 2440 SourceMeter instruments are part of Keithley s SourceMeter family and were developed specifically for test applications that demand tightly coupled precision voltage and current sourcing and measurement Selecting the instrument s high current range
5. single device without changing Depending on the card chosen the fiber is either a 9um single mode fiber or 62 5um multimode test setup fiber The input and output fiber channels are available with several connection options including i j FC SPC and a one meter fiber pigtail with a connector For a complete list of available features see Test multiple devices with a the Physical Properties table on the following page single instrument Seamless Integration with Keithley s LIV Test Solution The Model 7090 cards are designed to allow tight integration with Keithley s LIV Test System The LIV Test System combines all of the DC measurement capabilities required to test laser diode modules Single mode or multimode fiber including optical power measurement and tight temperature control of the device under test in an integrated instrument package The high speed Trigger Link interface provided on the instruments and switch mainframe in the LIV Test System allows for tight synchronization of system functions 1x8 and 1x16 optical switching cards Very low insertion loss 0 6dB typ 0 03dB repeatability Faster Test Development Several built in features of the Models 7001 EECA LINS FC SPC connectors and 7002 mainframes simplify system setup Production testing of operation and modifications All aspects of the instrument can be programmed from either the mainframe s front panel or over the IEEE bus Chip on submount laser diodes B
6. www keithley com KEITHLEY A GREATER MEASURE OF CONFIDENCE Model 7090 specifications _ un LLI un Z ea Q LLI om LLI O Q oO 345 un Lil un Z ea Q LLJ ml Lil O _ A Oo 1 888 KEITHLEY us oniy KEITHLEY www keithley com A GREATER MEASURE OF CONFIDENCE 346
7. is insensitive to input beam alignment up to 40 off normal or divergences up to 40 half angle Minimizes Polarization Concerns The randomizing effects of multiple reflections within Keithley s integrat ing sphere minimize beam polarization problems that can affect optical measurement accuracy when measuring polarized sources Beam polariza tion is of particular concern for manufacturers of distributed feedback lasers DFBs and Vertical Cavity Surface Emitting Lasers VCSELs Eliminates Back Reflection The stability of a laser diode is significantly affected by back reflections from objects in the optical path The geometric nature of the integrating sphere and the diffusing properties of the sphere s reflective material help prevent back reflection and ensure greater device stability during testing Attenuates High Power Laser Diode Outputs Detectors have specified maximum power capability which is typically just a few milliwatts By spreading the output power evenly over its interior surface an integrating sphere automatically attenuates the power from the source therefore the power level at any point on the sphere surface is far less than that of a beam that falls directly on the detector The Model 2500INT sphere is particularly useful for testing high power laser diodes because it provides calibrated attenuation of the laser diode output which prevents damage to the detector due to the high density of the output or o
8. 40 to 70 OE a Storage Temperature 55 to 80 C 55 to 80 C 55 to 85 C 7078 TRX 10 Low Noise Triax Cable 3 0m 10 ft Active Area 2 4mm x 2 4mm 5 0mm diameter 3 0mm diameter 7078 TRX 12 Low Noise Triax Cable 3 5m 12 ft Measurement Temperature 10 C 7078 TRX 20 Low Noise Triax Cable 6 0m 20 ft Thermistor Allowable Dissipation 0 2mW 2500INT FC APC FC APC Connector for 2500INT RELEASE Lon Allowable Current 1 0A 2500INT FC PC FC PC Connector for 2500INT 2500INT SMA SMA Connector for 2500INT 6172 2 Slot Male to 3 Lug Female Triax Adapter _ 7a Lid _ un Z ea Q Lul mel Lid O Q o 1 888 KEITHLEY us oniy KEITHLEY www keithley com A GREATER MEASURE OF CONFIDENCE 5338 2510 2510 AT al 2510 AT AUTOTUNING TEC SourceMeter A Groven exit enter Ordering Information 2510 TEC SourceMeter 2510 AT Autotuning TEC SourceMeter Instrument Accessories Supplied User s Manual Input Output Connector ACCESSORIES AVAILABLE 2510 RH Resistive Heater Adapter for Model 2510 2510 CAB 4 Wire Unshielded Cable Phoenix Connector to Unterminated End 7007 1 Shielded IEEE 488 Cable 1m 3 3 ft 7007 2 Shielded IEEE 488 Cable 2m 6 6 ft KPCI 488LPA IEEE 488 Interface Controller for the PCI Bus KUSB 488B IEFFE 488 USB to GPIB Adapter for USB Port SERVICES AVAILABLE 2510 3Y EW 1 year factory warranty extended to 3 years from date o
9. FAR SOURCE OOEES OOG lt SourceMeter Instruments for Optoelectronic FV Testing The SourceMeter family was developed specifically for test applications that demand tightly coupled precision voltage and current sourcing and concurrent measure ment including source read back This family of instru ments can be easily programmed to drive laser diodes throughout the characterization process Any of them can also be programmed to act as a synchronization controller to ensure simultaneous measurements during the test sequence Selecting a fixed current range elimi nates the potential for range offsets that appear as kinks during the LIV sweep testing The Model 2400 LV offers a drive current of up to 1A ideal for testing VCSEL devices The Model 2420 offers a tighter accuracy specifica tion that allows for precise control of transmitter laser devices In addition to higher accuracy the Model 2420 offers a drive current of up to 3A for devices that need drive currents greater than 1A such as pump lasers used in EDFA amplifiers The Model 2440 5A SourceMeter Instrument further broadens the capabilities offered by the popular SourceMeter line The dynamic range and functionality of the Model 2440 makes it ideal for applica tions such as testing high power pump lasers for use in optical amplifiers laser bar tests and testing other higher power components Manufacturers of Raman pump laser modules and optical amplifiers will find
10. 800 0 991 Water Permeability D 570 lt 0 001 hydrophobic 900 0 992 Hardness D 785 20 30 Shore D 1000 0 993 Thermal Stability N A Decomposes at gt 400 C u 1100 0 992 Coefficient of Linear Expansion D 696 5 5 6 5 x 10 gt in in F 10 4 C 1200 0 992 Vacuum Stability N A No outgassing except for entrained air 1300 0 992 Flammability N A Non flammable UL rating V O Incompatible O 1400 0 991 with non polar solvents and greases 1500 0 990 Yield Stress D 638 208psi D 1600 0 989 Ultimate Stress D 638 89 Ipsi a 1700 0 986 Young s Modulus N A 35774psi Elongation in 2 in D 638 42 8 2 Elongation at Failure E 132 91 3 oO Poisson s Ratio D 621 0 296 D Deformation under Load D 621 a a Ar e T Absorbance ax N A 0 07 5 Emittance e N A 0 88 e Volume Resistivity N A gt 108Q cm Dielectric Strength D 149 18V um Refractive Index D 542 1 35 Flammability Rating UL 94 V O ACCESSORIES AVAILABLE PHOTODIODE SPECIFICATIONS Appropriate cables and connectors are required to operate the Model 2500INT Integrating Sphere and must be ordered sepa Cooled Indium Gallium rately They are not included with the instrument Silicon Germanium Arsenide 7078 TRX 1 Low Noise Triax Cable 0 3m 1 ft Wavelength Range 190 1100nm 800 1800nm 900 1670nm 7078 TRX 3 Low Noise Triax Cable 0 9m 3 ft _ a Wavelength 7 a perating Temperature 20 to 60 55 to 60
11. GREATER MEASURE OF System 25 60 OC OO OO ai lc i i hi ke EE en ern te Programmable LIV test system for laser diode modules Sweep and measure 400 points in lt 8s Very low noise current source 50pA for laser diode drive Up to 5A laser diode drive current Measures optical power directly 1fA resolution for dark current measurements Fully digital P I D loop for temperature control 0 005 C temperature stability 0 001 C setpoint resolution Trigger Link source memory and buffer memory support automatic test sequencing which greatly reduces GPIB bus traffic to improve test throughput Expandable and flexible for future requirements 1 888 KEITHLEY v s only Shown 25 22224 fully assembled and installed in optional 8000 10 equipment rack laser diode module not included Laser Diode Test System Kit Complete DC Test System with Temperature Control Keithley s LIV light current voltage Test System Kit is designed to help manufacturers of laser diode modules LDMs keep pace with produc tion demands by allowing them to boost yield and throughput The LIV test system combines all the DC measurement capabilities required to test these modules with optical power measure ment and tight temperature control over the device under test in an integrated instrument package The LIV test system is configured from proven Keithley instrumentation the basic configura
12. Not available in all countries 2520 3Y EW _ 1 year factory warranty extended to 3 years from Prior to the introduction of the Model 2520 test instrument limitations often placed barriers on test performance However with the Model 2520 the limiting factor is not the test instrument but the Model 2520 Remote Test Head High Speed E High Speed Current to Current to Voltage Voltage Converter i Converter Voltage Measure components increases the integration and programming effort while test head to provide maximum flexibility and test throughput severely limiting the flexibility of the test system Sequencing Hi S i gh Speed equencing 3 misel k la oe aseroiode mi Sanal tah Speed puser LE taser iode Computer Oscilloscope P ae Digitizer Source Chip or Bar a rt Parallel Custom Bus High Speed High Speed V Current to Current to W Voltage Voltage bond Converter i tt Converter gt O z SN Figure 1 This schematic reflects the current testing practices of Figure 2 The Model 2520 integrates synchronization source and er major laser diode manufacturers Note that the use of discrete test measure capabilities in a single half rack instrument with remote Lu Q O 1 888 KEITHLEY u s oniy KEITHLEY www keithley com A GREATER MEASURE OF CONFIDENCE 522 2520 physics of the connections to the device Keithley s optoelectronics applica tions engineers have addre
13. Operate autonomously following an input trigger The Model 2520 can be programmed to output a trigger to a compatible OSA or wavelength meter several nanoseconds prior to outputting a programmed drive current value to initiate spectral measurements Accessories and Options The Model 2520 comes with all the interconnecting cables required for the main instrument and the remote test head Production test practices vary widely automated vs semi automated vs manual so the cable assemblies from the remote test head to the DUT can vary significantly To accommo date these differing requirements Keithley has developed the Model 2520 RTH to DUT Cable Configuration Guide to help customers determine the proper cable assemblies to use to connect the remote test head RTH to the DUT Interface Options The Model 2520 provides standard IEEE 488 and RS 232 interfaces to speed and simplify system integration and control A built in digital I O interface can be used to simplify external handler control and binning operations Additional LIV Test Solutions For production testing laser diodes after they have been packaged in temperature controlled modules Keithley offers the Laser Diode LIV Test System with increased 28 bit core measurement resolution allowing for more detailed characterization This flexible system combines all the DC measurement capabilities required to test these modules with tight temper ature control over the DUT in a modula
14. coefficients The autotuning function offers users a choice of a minimum settling time mode or a minimum overshoot mode which provides the Model 2510 AT with the flexibility to be used with a variety of load types and devices For example when controlling a large area TEC in a test fix ture optimized for P I and D values minimum overshoot protects the devices in the fixture from damage Figure 3 For temperature setpoints that do not approach the maximum specified temperature for the device under test the minimum settling time mode can be used to speed up the autotuning function Figure 4 50W Output As the complexity of today s laser diode modules increases higher power levels are needed in temperature controllers to address the module s cooling needs during production test The 50W A GREATER MEASURE OF CONFIDENCE 2510 2510 AT 5A 10V output allows for higher testing speeds and a wider tempera ture setpoint range than other lower power solutions High Stability P I D Control When compared with other TEC controllers which use less sophisticated P I proportional integral loops and hardware control mechanisms this instrument s software based fully digital P I D control provides greater temperature stability and can be easily upgraded with a simple firm ware change The resulting temperature stability 0 005 C short term 0 01 C long term allows for very fine control over the output wavelength and
15. cycles at the same pulse amplitude By making it possible to conduct more thorough testing at the bar or chip level the Model 2520 also eliminates the wasted time and costs associated with assem 2520 KIT1 bling then scrapping modules with non compliant diodes Pulsed Laser Diode Measurement Kit Simple One Box Test Solution includes 2520 2520INT The Model 2520 offers three channels of source and measurement circuitry All three channels are and 3 ft triax cable controlled by a single digital signal processor DSP which ensures tight synchronization of the sourcing and measuring functions The laser diode drive channel provides a current source coupled with voltage measurement capability Each of the two photodetector channels supplies an adjustable User s Manual Quick Reference voltage bias and voltage compliance in addition to current measurement capability These three Guide Triax Cables 2 channels provide all the source and measure capabilities needed for full LIV characterization of laser BNC 100 Coaxial Cables 4 diodes prior to integration into temperature controlled modules By eliminating the need for GPIB commands to perform test sweeps with multiple separate instruments the Model 2520 s integrated sourcing and measurement allows a significant improvement in throughput 2520 Pulsed Laser Diode Test System with Remote Test Head Remote Test Head Maximizes Signal to Noise Ratio ACCESSORIES AVAILABLE The mainframe
16. 10 00 mA 0 7 uA lt 10 0 0 3 20 90 nA ane Ar ae NE Er 180 nA a 3 4 uA lt 3Q 0 3 90 A 420 nA 100 00 mA 6 8 uA 230 0 3 175 uA 840 nA TEMPERATURE COEFFICIENT 0 18 C amp 28 50 C 0 15 x accuracy specification C INPUT PROTECTION The input is protected against shorting to the associated channel s internal bias supply The input is protected for shorts to external supplies up to 20V for up to 1 second with no damage although calibration may be affected SYSTEM SPEEDS READING RATES ms 1 Number of To To Source Points Memory GPIB 1 5 3 6 8 10 8 J5 18 100 8 48 120 1000 8 431 1170 1 888 KEITHLEY v s only www keithley com GENERAL DC FLOATING VOLTAGE User may float common ground up to 10VDC from chassis ground COMMON MODE ISOLATION gt 10 Q OVERRANGE 105 of range on all measurements and voltage compliance SOURCE OUTPUT MODES Fixed DC Level Fixed Pulse Level DC Sweep linear log and list Pulse Sweep linear log and list Continuous Pulse continuous low jitter PROGRAMMABILITY IEEE 488 SCPI 1995 0 RS 232 5 user definable power up states plus factory default and RST DIGITAL INTERFACE Safety Interlock External mechanical contact connector and removable key switch Aux Supply 5V 300mA supply Digital I O 2 trigger input 4 TTL Relay Drive outputs 33V 500mA max diode clamped Trigger Link 6 programmable trigger input outputs Pulse Trig
17. Q 555 2500INT e Choose from silicon germanium or cooled indium gallium arsenide detectors e Spectralon sphere interior ensures high reflectivity e Part of Keithley s high throughput system for production testing of laser diodes and LEDs Ordering Information 2500INT 2 Si Integrating Sphere with Silicon Detector 2500INT 2 Ge Integrating Sphere with Germanium Detector 2500INT 2 IGAC Integrating Sphere with Cooled Indium Gallium Arsenide Detector Accessories Supplied Quick Start Guide Calibration Chart for each sphere TEC Controller included with N LLJ N Z fa ai 25001NT 2 IGAC LLJ sl LLJ A 1 888 KEITHLEY us only 336 Integrating Sphere The Model 2500INT Integrating Sphere is the latest addition to Keithley s growing line of solutions for LIV light current volt age testing When connected via a low noise triax cable to the Model 2502 Dual Photodiode Meter included in Keithley s LIV Test System the integrating sphere allows the system to make direct measurements of optical power with results expressed in watts The integrating sphere simplifies production testing of laser diodes LDs light emitting diodes LEDs and other opti cal components by eliminating common optical power measure ment problems related to detector alignment beam profile polarization and back reflection Choice of Three Detector Types The Model 2500INT
18. advantages It is a nearly perfect diffuse reflector exhibiting Lambertian reflectance properties so it reflects equally in all directions regardless of viewing angle This eliminates the inaccuracies associated with less diffuse materi als by distributing the optical radiation more evenly over the interior of the sphere In addition a Spectralon surface offers high reflectance for wavelengths from 250 2500nm which makes it ideal for laser diode measurement applications It is also chemically inert which helps ensure stable meas urements in harsh environments Eases Beam Alignment If an integrating sphere is not used in laser diode testing the entire beam from the laser APPLICATIONS must shine directly onto the detector in order to Production testing of measure optical power accurately However it is difficult to align a laser and detector with the e Laser diode modules high degree of precision required particularly when the laser is operating outside of the visible Chip on submount laser diodes spectrum With the use of an integrating sphere e Laser diode bars beam alignment is trivial because any light that enters the sphere will be spread evenly across LEDs its interior surface Simply stated it is easier 5 7 Passive optical components to direct a laser into a 12 inch port than it is to P P direct a laser onto a 5mm detector The sphere A GREATER MEASURE OF CONFIDENCE 2500INT Trigger Link 2510 or 2510 A
19. and remote test head architecture of the Model 2520 is designed to enhance pulsed measurement accuracy even at the sub microsecond level The remote test head ensures the meas 2520INT 1 GE Integrating Sphere 1 inch with Germanium i ade a urement circuitry is located near the DUT mounted on the fixture minimizing cable effects As the Detector VY kod ae jv aD ui lee ae oO WV a f OO a a Q Uu amp T 5 5007 1 Double Shielded GPIB Cable 1m 3 3 ft schematic in Figure 1 shows traditional semi custom systems typically employed in the past require 7007 2 Double Shielded GPIB Cable 2m 6 6 ft significant integration The architecture of the Model 2520 Figure 2 offers a far more compact and KPCI 488LPA JEEE 488 Interface Controller for the PCI Bus f eady to use solution ee ne High Speed Pulse and Measure to Minimize Thermal Effects SERVICES AVAILABLE The Model 2520 can accurately source and measure pulses as short as 500 nanoseconds to minimize unwanted thermal effects during LIV testing Users can program the pulse width from 500ns to 5ms datea shipment and pulse off time from 20us to 500ms There is a software duty cycle limit of 4 for currents higher C 2520 3Y DATA 3 7540 1 compliant calibrations within 3 years than 1A To ensure greater accuracy the instrument provides pulse width programming resolution of purchase levels of 10s off time and 100ns on time
20. eliminates the potential for range change glitches if currents higher than 1A are needed during the LIV sweep The Model 2420 offers drive current of up to 3A The Model 2440 offers up to 5A of drive current for demand ing pump laser control e Model 2502 Dual Photodiode Meter The Model 2502 measures the current flow in the back facet photo detector and combines with the Model 2500INT Integrating Sphere to directly measure optical power Both optical power measurement channels are fully independent The measurement timing circuitry is shared between both channels to provide simultaneous measurements to optimize LIV performance Each channel has eight measurement ranges and provides a resolution high enough to measure dark currents of the photodiode The isolated bias sources provide up to 100V of bias The Model 2502 has a high speed analog output that allows the LIV system to be combined with a fiber alignment system Model 2510 AT TEC SourceMeter instrument The Model 2510 AT is a 50W bipolar instrument that controls the operation of an LDM s Thermo Electric Cooler or TEC sometimes called a Peltier device during LIV testing During testing the Model 2510 AT measures the internal temperature of the LDM from any of a variety of temperature sensors then drives power through the TEC in order to maintain the LDM s temperature at the desired setpoint The Model 2510 AT s software based fully digital P I D proportional integral d
21. for delicate active optoelectronic devices e Normal output off mode drives the output terminals toward OV This action de energizes the device and more importantly the induc tive test leads The rate of discharge can be controlled with the source range settings This provides a better environment than shorting relays in conventional laser diode drivers SourceMeter instruments provide program mable compliance range compliance and voltage protection settings to ensure that the DUT isn t subjected to excess voltages or currents Contact check ensures all test leads are in contact with the DUT prior to energizing the device In addition the SourceMeter family is built on a heritage of precision semiconductor test and characterization of much more sensitive devices than active optoelectronic components KEITHLEY MEASURE OF A GREATER CONFIDENCE ad 70 aD _ 70 a GG O mn ad UO v a oO r a E Temes O i S Cc om D OPTOELECTRONICS TEST 519 Selector Guide Optoelectronics Test LIV Test Systems 2602A 2612A System 25 2520 Page 10 10 329 321 3 ADC 1 5 ADC Max EEE u 10 A pulsed per channel 10 A pulsed per channel PA JA DC Pulse DC DC Pulse DC Source Mode Continuous Wave Continuous Wave Continuous Wave Continuous Wave gt Number of Channels 1 Laser Drive 1 Laser Drive 1 Laser Drive 1 Laser Drive Ie 7 1 Photodiode 1 Photod
22. optical power of the laser diode module during production testing of DC characteristics This improved stability gives users higher confi dence in measured values especially for components or sub assemblies in wavelength multiplexed networks The derivative component of the instrument s P I D control also reduces the required waiting time between making measurements at various temperature setpoints The temperature setpoint range of 50 C to 225 C covers most of the test requirements for production testing of cooled optical components and sub assemblies with a resolution of 0 001 C Before the introduction of the Model 2510 AT configuring test systems for new module designs and fixtures required the user to determine the best combination of P I and D coefficients through trial and error experimenta tion The Model 2510 AT s autotuning function uses the modified Zeigler Nichols algorithm to determine the optimal P I and D values automatically Adaptable to Evolving DUT Requirements The Model 2510 and Model 2510 AT are well suited for testing a wide range of laser diode modules because they are compatible with the types of temperature sensors most commonly used in these modules In addition to 100Q2 1kQ 10kQ and 100kQ thermistors they can handle inputs from 100Q or 1kQ RTDs and a variety of solid state temperature sensors This input flexibility ensures their adaptability as the modules being tested evolve over time Prog
23. see the specifications for power ranges by wavelengths of interest Fiber Tap for Additional Measurements The Model 2520INT offers production test engineers the flexibility to decrease overall testing time by supporting multiple optical measurements simultaneously An additional port on the sphere is compatible with an SMA connector together the port and fiber tap can be used to output a fraction of the measured light to an external instrument such as a spectrometer via a multimode fiber for additional optical measurements Eliminates Back Reflections During testing the stability of a laser diode can be significantly affected by back reflections from objects in the optical path The geometry of the Model 2520INT and the diffusing properties of its reflective interior help prevent back reflection and ensure greater device stability during testing Production or Laboratory Environments 2520INT A slight curvature on the face of the sphere makes Model 2520INT easier to integrate into an automated test system This curvature allows additional room to connect the sphere to the DUT electrically and simplifies integration with other system components The Model 2520INT is designed with four stra tegically located mounting holes for flexible mounting on laboratory tables or in automated test fixtures Two of the holes are sized to allows additional room to connect the DUT accommodate metric fixtures while the other electrically in close qu
24. the instrument setup LIV sweep and data transfer times but not the computation times KEITHLEY CONFIDENCE GREATER MEASURE OF System 25 Laser Diode LIV Test System Kit Ordering Information Temperature Control Trigger Link 2510 AT 25 Source Measure O 2400 LV 2502 General Purpose l 2 2420 2502 Transmitter Pump Source Thermistor Peltier Measure 4 2440 2502 Pump Laser Temperature Control O None 1 2510 AT Single Temp Control 2 2510 AT 2510 AT Dual Temp Control Integrating Spheres 00 None 21 2500INT 2 SI 2 Sphere Silicon 22 2500INT 2 GE 2 Sphere Germanium 23 2500INT 2 IGAC 2 Sphere Cooled InGaAs 8 2500INT Laser Diode Mounts Oo None P s o 2 8542 14 Pin DIL Mount Figure 1 The standard LIV test system is designed for applications 4 8544 14 Pin Butterfly Mount that require the highest measurement accuracy The Model 2420 4t 8544 TEC 14 Pin Butterfly w TEC Control SourceMeter instrument drives the laser diode sweeping the drive current from OA up to 3A in programmable steps At each step in the sweep the Model 2420 records the current and voltage measurements while the Model 2502 measures and records the current flow in the photodiodes When the sweep is complete the Select the instrument and accesory for your application Review the detailed specifications of each instrument ur Ez i i aD Q ur aD _ ur gt WY Uu me
25. up to 60V and 3A 60W Power Output Testing Optoelectronic Components 2420 C High Current Use a SourceMeter instrument to measure a component s electrical performance characteristics and SourceMeter to drive laser diodes and other components Contact Check Measurements up to 60V Types of Optoelectronic Components Typical Tests and 3A 60W Power Output e Trigger Link compatibility with switching hardware and other instruments from Keithley e Deep memory buffer The SourceMeter instruments also offer standard RS 232 and GPIB interfaces for integration with a PC Adding one of Keithley s versatile switch systems enables fast synchronized multipoint testing e Laser diodes e LIV test laser diodes and LEDs one DA SATIS ASUS e Laser diode modules e Kink test laser diode Measurements up to 40V and 5A 50W oo e Photodetectots e I V characterization Power Output 2440 C 5A SourceMeter Contact Check Measurements up to 40V and 5A 50W Power Output e Light emitting diodes LEDs e Photovoltaic cells Model 2400 LV 2400 C 2420 2420 C 2440 LV 2440 C Description General Purpose 3A 5A Test Leads User s Manual Service Power Output 20 W 60 W 50 W Manual and LabVIEW Drivers Voltage Range 1 NV to 20 V 1 pV to 63 V 1 uV to 42 V Current Range 50 pA to 1 05 A 500 pA to 3 15 A 500 pA to 5 25 A Ohms Range lt 0 2 Q to gt 200 Q lt 0 2 Q to gt 200 MQ lt 2 0 Q to gt 200 MQ EEN Optoelectronic components Transmitter mod
26. 0 C 0 15 x accuracy specification C B lka PULSE ON TIME 500ns to Sms 100ns programming resolution Setting and Pulse Overchoot Rise Fall Times 9 10 PULSE OFF TIME 20us to 500ms 10us programming resolution Range Load Mode Max amp 8 9 Typical Max VOLTAGE COMPLIANCE 3V to 10V 10mV programming resolution 500 mA 100 Watt ae 0 1 Wis tone POLARITY 1 quadrant source polarity reversal available through internal relay inversion 5 00 A 15 1 Watt Fast 1 0 100 ns 130 ns OUTPUT OFF lt 200mQ short across laser diode measured at Remote Test Head connector 5 00 A 15Q 1 Watt Slow 0 1 1 us 1 3 us LASER DIODE VOLTAGE MEASURE SPECIFICATIONS Minimum Accuracy RMS Noise Range Resolution rdg volts 2 typical 5 00 V 0 33 mV 0 3 65 mV 60 uV 10 00 V 0 66 mV 0 3 8mvV 120 uV TEMPERATURE COEFFICIENT 0 18 C amp 28 50 C 0 15 x accuracy specification C MAX LEAD RESOLUTION 100Q for rated accuracy INPUT IMPEDANCE 2MQ differential 1MQ from each input to common Input bias current 7 5uA max PHOTODIODE VOLTAGE BIAS SOURCE SPECIFICATIONS each channel RANGE 0 to 20VDC PROGRAMMING RESOLUTION 10mV ACCURACY 1 50mV CURRENT 160mA max with V Bias shorted to I Measure RMS NOISE 1kHz to 5MHz 1mV typical PHOTODIODE CURRENT MEASURE SPECIFICATIONS each channel Minimum DC Input Accuracy RMS Noise Range Resolution Impedance rdg current typical
27. 04 0 4 X 0 02 3 Q 0 04 21Q 0 03 100 nA 0 03 500 uV rdg offset THERMISTOR MEASUREMENT ACCURACY GENERAL NOTES N tiinal NOISE REJECTION 1 e rT and device under test in a regulated ambient temperature Ma Mo EE en SPEED NPLC NMRR CMRR 2 With remote voltage sense esistance o o N 1 00 60 dB 120 dB 3 Lyear 23 C 5 C 100 Q 0021C 0 035 C _0 070 C __0 27 C With Lg 5A and Vs OV 1kQ 0 015 C 0 023 C 0 045 C gt 0 18 SOURCE OUTPUT MODES Fixed DC level 5 With Ie 5A and Vin 10V 10 kQ 0 006 C 0 012 C gt 0 026 C 0 15 C PROGRAMMABILITY IEEE 488 SCPI 1995 0 RS 232 6 With 10kQ thermistor as sensor 100 kQ 0 009 C 0 014 C 0 026 C 0 13 C 3 user definable power up states plus factory default 7 Short term stability is defined as 24 hours with Peltier and Model 2510 at 25 C 0 5 8 Long term stability is defined as 30 days with Peltier and Model 2510 at 25 C 0 5 C 9 10Hz to 10MHz measured at 5A output into a 2Q load 10 Common mode voltage OV meter connect enabled connects Peltier low output to thermistor measure circuit ground 0 1 of rdg 0 1Q with meter connect disabled Resistance range 0Q to 20Q for rated accuracy Current through Peltier gt 0 2A Default values shown selectable values of 3uA 104A 334A 100A 833A 2 5mA Note that temperature control performance will degrade at lower currents 14 AC ohms is a dual pulsed measurement using current rev
28. AY EEL a amp 2 7 Gu NUB COM Optoelectronics Test 1S1l SOINOYLIATAOLdO 070 7872 0703 Optoelectronics Test Technical Information 318 Selector CUE srs venen enen hae 320 Pulsed Laser Diode Test System 321 Integrating Sphere for Pulsed Measurements 326 Laser Diode LIWest System 329 SourceMeter Instruments 332 Dual Channel Picoammeter for Photodiode Measurements 335 Integrating Sphere an vere ere eer beed ee 336 TEC SourceMeter Instrument 339 Autotuning TEC SourceMeter Instrument 339 Laser Diode Mounts for LIV Test Systems 343 Optical Switch Cards 344 NUB COM 7150 54 ZE ee Li un Z a4 Q LLI l HJ O Q oO ui a ft ui Sm _ UO a oO r Q r Some tj i G om D H OPTOELECTRONICS TEST 318 Technical Information Active optoelectronic device characterization requires more than a current source A Forward Voltage Vp V Back Facet Detector Current Kink Test dL dl Forward Current le mA Figure 1 Classic LIV curves associated with semiconductor laser diodes Active optoelectronic devices are basic semicon ductor junctions To be fully tested they require not only forward I V characterization but also reverse I V characterization While conv
29. CN temperature 7007 1 Shielded GPIB Cable Im 3 3 f 7007 2 Shielded GPIB Cable 2m 6 6 ft COMMUNICATION INTERFACE 7009 5 RS 232 Cable KPCI 488LPA IEFE 488 Interface Controller for the PCI Bus 8501 1 Trigger Link Cable 1m G3 KUSB 488B IEEE 488 USB to GPIB Adapter for USB Port 8501 2 Trigger Link Cable 2m 6 6 f SWITCHING HARDWARE 8502 Trigger Link Adapter Box 7001 Two Slot Switch System RACK MOUNT KITS ay Teno EO MSDS 4288 1 Single Fixed Rack Mount Kit a High Current switch Card 4288 2 Dual Fixed Rack Mount Kit A GREATER MEASURE OF CONFIDENCE 2400 LV 2400 C p 2420 2420 C SourceMeter Instruments for 2440 2440 C Optoelectronic IV Testing High Throughput to Meet Demanding Production Test Schedules A SourceMeter instrument s highly integrated architecture offers significant throughput advantages 2400 LV Low Voltage Model Many features of this family enable them to take control of the test process eliminating additional 2400 SourceMeter system bus traffic and maximizing total throughput Built in features that make this possible include Measurements up to 20V and 1A 20W e Source Memory List test sequencer with conditional branching Power Output j e Handler prober interface 2400 C General Purpose SourceMeter Contact Check Measurements up to e High speed comparator pass fail limits mathematical scaling 200V and 1A 20W Power Output 2420 High Current SourceMeter Measurements
30. EC SourceMeter Instrument Open Short Lead Detection Both models of the instrument use a four wire measurement method to detect open short leads on the temperature sensor before testing Four wire measurements eliminate lead resistance errors on the measured value reducing the possibility of false failures or device damage Interface Options Like all newer Keithley instruments both models of the instrument include standard IEEE 488 and RS 232 interfaces to speed and simplify system inte gration and control Optional Resistive Heater Adapter The Model 2510 RH Resistive Heater Adapter enables either model of the instrument to provide closed loop temperature control for resistive heater elements rather than for TECs When the adapter is installed at the instrument s output terminal current flows through the resistive heater when the P I D loop indicates heating However no cur rent will flow to the resistive heater when the temperature loop calls for cooling The resistive element is cooled through radiation conduc Figure 6 Optional heater adapter tion or convection Comparison Data 2510 Measured Competitor Measured One Hour Interval Figure 5 This graph compares the Model 2510 2510 AT s A D con verter resolution and temperature stability with that of a leading com petitive instrument While the competitive instrument uses an analog proportional integral P I control loop it displays information in
31. ONTROL TEMPERATURE RANGE 0 to 80 C SENSOR TYPE 2 Model 8544 TEC Only 10kQ thermistor AD592CN REFERENCED MOUNT SPECIFICATIONS LASER DIODE PACKAGE Model 8542 8544 8544 TEC Socket DIL 14 pin Butterfly 14 pin Butterfly 14 pin Base Position j Plate adjustable 0 1 centers 0 1 centers ACCESSORIES AVAILABLE 2400 LV 2420 2440 SourceMeter Instruments 2502 Dual Photodiode Meter 2510 2510AT TEC Control Meters AT Auto Tune feature A GREATER MEASURE OF CONFIDENCE GENERAL RECOMMENDED MAXIMUM RATINGS Drive Current Amps 2 Measured Voltage Volts 3 WEIGHTS 1 0 Ibs 0 45kg DIMENSIONSS 32mm high x 95mm wide x 140mm deep 1 2in x 3 75 in x 5 5 in NOTES 1 The other SourceMeter offerings from Keithley Models 2400 2410 2425 and 2430 are not recommended for use with the 8542 301 and Laser Diode Mounts unless proper interlock and safety precautions are observed especially voltage protection 2 The 8544 TEC unit is shipped with the 10kQ thermistor wired This is the more commonly requested configuration The AD592CN sensor wires are available but not connected 3 The triax inner shield is available on pin 2 of the 8542 3014 This will allow flexibility for the customer to exchange the wire in the LDM from pin 6 to pin 2 To use the second 2510 DB 15 pins 9 15 the customer must internally wire the 8544 TEC Mount to the DUT thermocouple See the Quick Start Guide for wiring con
32. R TAP PORT Connector Type SMA Numerical Aperature NA 0 22 typ Multi Mode Patch Cord Typical Core Diameter 7 um Attenuation dB 400 39 5 100 59 62 5 58 2 50 63 1 888 KEITHLEY v s only www keithley com GENERAL INPUT PORT DIAMETER 0 25 in 6 35mm RECOMMENDED CALIBRATION CYCLE 1 year OPERATING TEMPERATURE 0 50 C STORAGE TEMPERATURE 25 C 65 C DIMENSIONS 8 60 0mm long x 86 4mm high x 45 7mm deep 2 36 in x 3 40 in x 1 80 in WEIGHT 0 15kg 0 33 Ibs NOTES Maximum distance from input port to accept at full maximum acceptance angle 3 1mm 0 12 in Calibration performed at 10nm wavelength intervals Based on detector being linear to up to 25mA photocurrent and on a signal to noise ratio SNR gt 100 1 Calibration of the 2520INT is performed with an open fiber tap port The power measurement will increase by approximately 1 with an SMA patch cord attached to the port Based on resolution of Model 2520 at 10mA lowest current measurement range 6 This configuration MUST have a NEGATIVE reverse bias voltage applied If a positive forward bias is applied the detector photodiode will become damaged 7 Use of single mode fiber is not recommended 8 Only for integrating head does not include post and base A UO N e an Responsivity A W a 1150 1250 1350 1450 1550 Wavelength nm Typical responsivity of the Model 2520INT KEITHLEY CONFIDENCE
33. T Thermistor Peltier GPIB annar 2500INT The Model 2500INT allows the LIV Test System to measure optical inputs directly and to display power measurements in watts Other instruments in the LIV Test System include the Model 2502 Dual Photodiode Meter the Model 2510 TEC SourceMeter Instrument and either the Model 2400 or Model 2420 SourceMeter Instrument Each integrating sphere is characterized at the factory and provided with a calibration constant for every 25 nanometers in the detector s range Prior to testing the user simply enters the constant in the Model 2502 Dual Photodiode Meter to ensure accurate measurements of optical power for that wavelength Silicon Detector Germanium Detector Wavelength Range 190 1100 nm 800 1800 nm Peak Wavelength 960 nm 1550 nm Sensitivity at Peak Wavelength Excellent at 960 nm Good at 1550 nm Sensitivity at Certain Wavelengths Visible me N A 980 nm kkk kk 1310 nm N A kk 1550 nm N A dek gt 1550 nm N A e kK Speed Calibration Accuracy Stability Spectral response changes rapidly with temperature at wavelengths gt 1000nm Spectral response changes rapidly with temperature and above Cost Good tek Best Better N A not applicable 1 888 KEITHLEY v s only www keithley com Extremely stable Spectral response is stable because A calibration is fixed at constant operating temperatures i e 10 C A Integrating Sphere
34. URE LIMIT 250 C max LOWER TEMPERATURE LIMIT 50 C max SETPOINT RESOLUTION 0 001 C lt 400uV lt 200uA 0 01 of nominal 25 C thermistor resistance HARDWARE CURRENT LIMIT 1 0A to 5 25A 5 SOFTWARE VOLTAGE LIMIT 0 5 to 10 5V 5 TEC SourceMeter Instrument Autotuning TEC SourceMeter Instrument TEC OUTPUT SPECIFICATIONS OUTPUT RANGE 10VDC at up to SADC 5 OUTPUT RIPPLE lt 5mV rms AC RESISTANCE EXCITATION 9 6mA 90uA TEC MEASUREMENT SPECIFICATIONS Function 1 Year 23 C 5 C Operating Resistance 1 11 12 2 0 of rdg 0 1Q Operating Voltage 7 0 1 of rdg 4mV Operating Current 0 4 of rdg 8mA AC Resistance 8 0 10 of rdg 0 02Q OPEN SHORTED THERMOELECTRIC DETECTION LOAD IMPEDANCE Stable into 1uF typical COMMON MODE VOLTAGE 30VDC maximum COMMON MODE ISOLATION gt 10 Q lt 1500pF MAX VOLTAGE DROP BETWEEN INPUT OUTPUT SENSE TERMINALS 1V MAX SENSE LEAD RESISTANCE 1Q for rated accuracy MAX FORCE LEAD RESISTANCE 0 1Q SENSE INPUT IMPEDANCE gt 400kQ THERMAL FEEDBACK ELEMENT SPECIFICATIONS and RST POWER SUPPLY 90V to 260V rms 50 G0Hz 75W EMC Complies with European Union Directive 98 336 EEC OPEN SHORTED ELEMENT DETECTION SOFTWARE LINEARIZATION FOR THERMISTOR AND RTD Common Mode Voltage 30VDC Common Mode Isolation gt 10 Q2 lt 1000pF Max Voltage Drop Between Input Output Sense Terminals 1V Max Sense Lead R
35. applications These fixtures provide highly stable temperature control for all telecommunications laser diodes They offer an easy to use platform for testing laser diodes used in telecommunications They are designed to speed and simplify setting up test systems for all laser diode photodiode thermoelectric cooler thermistor configurations For additional information on any of the building blocks of the LIV test system refer to the data sheet for that instrument Laser Diode LIV Sweep Test Demo Ll Sweep Test Parameters KEITHLEY c sueo aii Laser Diode LA Sweep Test Demo Siop Step Curent jA Cunera 4 for oon aws as 0005 o4 0z af 2 r Ten Statistics Threshold Kink Kank Kink Hurnb r od Cunen MM gears Mira Stddew Steps 0011 Od O027 on 100 Total Test Time ABI Second A demonstration software package written in Visual Basic is available with the LIV test system to give programmers a head start on creating their own applications Using the demonstration package users can set a variety of test parameters including NPLC integration time Source Delay settling time before measurement Start Current Stop Current and Step Current These parameters allow users to define the current sweep range and make speed and accuracy trade offs by adjusting Source Delay and NPLC The resulting data can be analyzed to determine threshold current and kink statistics The total test time includes
36. arters such as in wafer two are designed for use with English fixtures probing The Model 2520INT comes with a 1 4 20 base and post Probe Tip VCSEL Wafer A slight curvature on the face of the sphere N LLI un Z ea Q LLI om LLI O Q O A GREATER MEASURE OF CONFIDENCE 527 N O gt QO QO D A N N Te N KT O OPTOELECTRONICS TEST 328 2520INT Integrating Sphere for Pulsed Measurements Specifications FULL ACCEPTANCE ANGLE 90 vertical 50 horizontal max 90 Full Angle Indicator Triax Connector 50 Full Angle Indicator SMA Connector Frontal View of Integrating Sphere Showing Full Acceptance Angle Indicators OPERATING WAVELENGTH RANGE 800 1700nm CONTINUOUS WAVE CW CALIBRATION WAVELENGTH RANGE 950 1010nm and 1280 1620nm Typical Measurable Optical Responsivity Resolution gt Wavelength nm Power Range mA W mW 980 29mW 7W 3 5 0 2 1310 17mW 4W 6 0 0 1 1480 14 5mW 3 5W 7 0 0 1 1550 13 5mW 3W Te 0 1 MAXIMUM REVERSE BIAS 5V recommended DARK CURRENT AT MAX REVERSE BIAS 4uA typ 10uA max PHOTODIODE ELECTRICAL CONNECTIONS ON 3 LUG TRIAX Center o Cathode l Inner Shield Anode 4 Photodiode Outermost Shield not connected isolated from chassis PULSED OPERATION The 2520INT supports the pulse capabilities of the 2520 Pulsed Laser Diode Test System FIBE
37. d guard test lead is low 1 888 KEITHLEY v s only www keithley com Optoelectronics Test the potential leakage paths are neutralized This technique requires an additional instrumenta tion amplifier that senses the output of the programmed source and drives the guard circuit with the same potential with enough current to overcome any leakage between the guard com ponents and ground Deterministic trigger I O Conventional instruments typically support a simple trigger in trigger out convention The challenge to the engineer is controlling the trigger interaction between instruments It is often that case that simple trigger I O doesn t allow for differences in instrument behaviors or synchronization of multiple instruments Figure 9 shows the trigger scheme available on most optoelectronic instrumentation Meter Operation A D Close Channel etc Figure 9 Typical trigger input output scheme Input Output Trigger Trigger A Series 2400 instrument breaks the measure ment cycle into three parts as shown in Figure 10 The three components are the source phase delay phase and measurement phase also known as the SDM cycle The Series 2400 trig ger model allows each phase in the SDM cycle to be programmed so that it can be gated by an input trigger and also to be programmed so that completion of each phase generates an output trigger While many instruments are limited to a single trigger in and single t
38. digital format through a low resolution analog to digital converter In contrast the Model 2510 2510 AT uses a high precision digital P I D control loop which provides greater temperature stability both over the short term 0 005 C and the long term 0 01 C KEITHLEY MEASURE OF GREATER CONFIDENCE a UO p Uj Somes a an E a oO z O qj Q ele od oO mf He n 70 U LLJ pus O ej Ke 2 gt oO UO a Same ad mm a a a f S UO a am OPTOELECTRONICS TEST 541 ur O UO aD a ur L f LO CN o LO CN ET A ro 2510 2510 AT SPECIFICATIONS The Models 2510 and 2510 AT TEC SourceMeter instruments are designed to e Control the power to the TEC to maintain a constant temperature current voltage or thermis tor resistance e Measure the resistance of the TEC e Provide greater control and flexibility through a software P I D loop CONTROL SYSTEM SPECIFICATIONS SET Constant Peltier Temperature Constant Peltier Voltage Constant Peltier Current Constant Thermistor Resistance CONTROL METHOD Programmable software PID loop Proportional Integral and Derivative gains independently programmable SETPOINT SHORT TERM STABILITY 0 005 C rms 67 SETPOINT LONG TERM STABILITY 0 01 C SETPOINT RANGE 50 C to 225 C UPPER TEMPERAT
39. efault Input 23 C 5 C Range Resolution rdg amps Range Resolution Resistance rdg volts N 10 0000 uA 500 pA 0 033 2nA 200 000 mV py gt 10 GQ 0 012 300 uV Y 100 000 uA 5 nA 0 031 20 nA 2 00000 V 10 uV gt 10GQ 0 012 300 uV Pd 100000 mA 50 nA 0 034 200 nA 10 0000 V 100 uv gt 10 GQ 0 015 750 pV 10 0000 mA 500 nA 0 045 2A 40 0000 V 1 mV gt 10 GQ 0 015 3 mV 100 000 mA RT 0 066 20 uA SR 100000 A 50 uA 0 067 900 uA er 5 00000 A 50 uA 0 10 5 4mA LLJ oO Q O 1 888 KEITHLEY u s only KEITHLEY www keithley com A GREATER MEASURE OF CONFIDENCE 554 Tena tenth pan F TE 6 Dual channel instrument for low current measurements 100V bias source Measure current from 1fA to 20mA 1fA current measurement resolution 0 10V analog output for high resolution optical power feedback 3000 point buffer memory on each channel allows data transfer after test completion Digital 1 O and Trigger Link for binning and sweep test operations IEEE 488 and RS 232 interfaces Ordering Information 2502 Dual Channel Picoammeter Accessories Supplied User s Manual 1 888 KEITHLEY uss only ze 90000000 Goca ale E LTER mj TRIG D a e a Go aT oom oa exit enter Dual Channel Picoammeter for Photodiode Measurements current measurement capabilities Each channel of this instrument consists of a voltage source paired w
40. em In a typical laser diode manufacturing line the laser diode is not coupled to an optical fiber until the final stages of the packaging process Therefore any pulse testing performed on a laser diode at the bar or chip level would require a difficult and time consuming beam alignment process in order to focus all of the diode s output on the APPLICATIONS optical detector Bar or chip level LIV production To ensure acceptance of the complete beam with testing of maximum divergence angles the sphere can be 980 or 1480 EDFA pump lasers located up to 3 millimeters from the DUT posi PEIE tioned so the diode s light output enters the e Raman amplifiers pe 14 inch port on the sphere s side Any light that Tel cation diod enters the sphere is captured in the measure a tah ne ment taken by the Model 2520 High power telecommunication z VCSELs Z O ACCESSORIES REQUIRED T 2520 Pulsed Laser Diode Test System ml 7078 TRX Low Noise Triax Cable Ll O Q O 1 888 KEITHLEY v s only A GREATER MEASURE OF CONFIDENCE 526 2520INT Ordering Information 2520INT 1 Ge 1 inch Integrating Sphere with Germanium Detector 2520 KIT1 Pulsed Laser Diode Measurement Package Includes 2520 2520INT and 3 foot triax cable Accessories Supplied Quick Start Guide calibration data supplied as a printed chart and in CSV format on a floppy diskette base and 1 4 20 post for mounting 1 888 KEITHLEY uss o
41. entional laser diode drivers are valuable for providing drive current in the optics lab these current sources aren t suitable for developing a com plete understanding of a semiconductor device The SourceMeter line provides a full range of source and measure capability optimized for semiconductor characterization Figure 2 Characterization of semiconductor junctions requires measuring reverse break down V leakage current I and forward voltage V A complete characterization of an active opto electronic device requires forcing both forward and reverse currents and voltages For instance the reverse breakdown test requires sourcing 1 888 KEITHLEY uss only www keithley com Optoelectronics Test a very small precise reverse current 10nA while measuring the voltage The limited cur rent prevents permanent damage to the device while allowing a precise breakdown voltage to be measured Given the breakdown voltage it s now possible to force a reverse bias that won t harm the device while leakage is measured This leakage current value is often used to qualify the device for further testing Four quadrant source capabilities 200V p Duty cycle limite Figure 3 The Model 2400 can source or sink either current or voltage Other SourceMeter instruments offer different ranges providing a very wide dynamic range from as low as a 1pA range or 200mV to 5A or 1000V The SourceMeter product li
42. ersals avail able over bus only 15 Settable to lt 400uV and lt 200uA in constant V and constant I mode respectively 16 For line frequency 0 1 17 For 1kQ unbalance in LO lead 18 Resistance range 0Q to 100Q for rated accuracy Accuracy figures represent the uncertainty that the Model 2510 may add to the temperature measurement not including thermistor uncertainty These accuracy figures are for thermistors with typical A B C constants m me e w Ne p No KEITHLEY CONFIDENCE 8542 8544 8544 TEC Compatible with Keithley laser diode LIV test solutions Simplifies configuration of LIV test systems Choice of three fixture designs all with necessary cables Cables also available separately Ambient temperature control on TEC version Ordering Information 8542 Dual In Line DIL Telecom Laser Diode Mount Bundle with 8542 301 and CA 321 1 cables Butterfly Telecom Laser Diode Mount Bundle with 8542 301 and CA 321 1 cables 8544 TEC Butterfly Telecom Laser Diode Mount Bundle with TEC thermistor and AD592CN temperature sensor with 8542 301 and CA 322 1 cables Accessories Supplied 8542 301 LIV Cable to connect Model 2500 and 24XX to the fixture 1 8m 6 ft supplied with 8542 8544 and 8544 TEC Temp Control Cable to connect Model 2510 to fixture 1 8m 6 ft supplied with 8542 and 8544 Dual Temp Control Cable to connect 2 Model 2510 to fixture 1 8m 6 ft supp
43. es the force sense and guard test leads are properly connected to the DUT before testing begins Remote voltage measurement SourceMeter instruments offer two or four wire measurement configurations Two wire voltage measurement shares test leads with the source as shown in Figure 7a When sourcing high currents the voltage drop across the test lead becomes significant with respect to the forward voltage across the DUT KEITHLEY MEASURE OF A GREATER CONFIDENCE Technical Information Output Sense HI HI SourceMeter Output Sense LO LO HI HI SourceMeter Output Sense Figure 7b Four wire or Kelvin measurement Four wire voltage measurement uses dedicated test leads for measuring the voltage drop across the DUT Since the voltage measurement circuit has very high impedance inputs the current through the measuring test leads is low The IR drop across the measurement test leads is an extremely small fraction of the voltage dropped across the DUT SourceMeter Output LO Figure 8 The cable guard circuit drives the guard conductor at the same potential as the output HI conductor Low level current measure ments require a driven guard Unique to precision measurement equipment the driven guard minimizes the electrical poten tial difference between the conductors that sur round the source test lead and the test lead see Figure 8 When the electrical potential between the source test lead an
44. esistance 100Q for rated accuracy Sense Input Impedance gt 10 Q CE marking requirements FCC part 15 class B CTSPR 11 IEC 801 2 IEC 801 3 IEC 801 4 VIBRATION MIL PRF 28800F Class 3 Random Vibration WARM UP 1 hour to rated accuracies DIMENSIONS WEIGHT 89mm high x 213 mm high x 370mm deep 3 in x 8 in x 14 in Bench configu ration with handle and feet 104mm high x 238mm wide x 370mm deep 4 in x 9 in x 14 in Net Weight 3 21kg 7 08 Ibs ENVIRONMENT Operating 0 50 C 70 R H up to 35 C Derate 3 R H C 35 50 C Storage 25 to 65 C OPTOELECTRONICS TEST 1 888 KEITHLEY uss only www keithley com GREATER 342 MEASURE OF Sensor Type RTD Thermistor Solid State Current Voltage 100 Q 1kQ 100 Q 1 ko 10 kQ 100 kQ Output IL Output V a 2 5 mA 2 5 mA 833 WA 100 A 33 uA 13 5 V 2 5 mA 13 Selen 4 V max Bee 8 V max 8 V max 8 V max 6 6 V max 833 uA 15 75V max Nominal Resistance Range 0 250 Q 0 2 50 kQ 0 1 kQ 0 10 kQ 0 80 kQ 0 200 kQ Excitation Accuracy 1 5 20 20 2 9 2 9 2 9 12 2 9 Nominal ares 50 to 250 C 50 to 250 C 50 to 250 C 50 to 250 C 50 to 250 C 50 to 250 C 40 to HOOG 40 to 100 C Temperature Range Calibration a B settable o B settable A B C settable A B C settable A B C settable A B C settable Slope amp offset Slope amp offset 13 Measurement Accuracy 0 04 0 07 Q2 0 04 0 04Q2 004 00702 0
45. f shipment 2510 AT 3Y EW 1 year factory warranty extended to 3 years from date of shipment C 2510 3Y DATA 3 Z540 1 compliant calibrations within 3 years of purchase for Models 2510 2510 AT Not available in all countries 1 888 KEITHLEY uss only TEC SourceMeter Instrument Autotuning TEC SourceMeter Instrument The Models 2510 and 2510 AT TEC SourceMeter instruments enhance Keithley s CW Continuous Wave test solution for high speed LIV light current voltage testing of laser diode modules These 50W bipolar instruments were developed in close cooperation with leading manufacturers of laser diode modules for fiberoptic telecom munications networks Designed to ensure tight temperature control for the device under test the Model 2510 was the first in a line of highly specialized instruments created for telecommu nications laser diode testing It brings together Keithley s expertise in high speed DC sourcing and measurement with the ability to control the operation of a laser diode module s Thermo Electric Cooler or TEC Sometimes called a Peltier device accurately The Model 2510 AT expands the capability of the Model 2510 by offering autotuning capability P I and D proportional integral and derivative values for closed loop temperature control are deter mined by the instrument using a modified Zeigler Nichols algorithm This eliminates the need for users to determine the optimal values for these coefficien
46. facet monitor detector to the fiber coupled photodetector at varying levels of input current These functions can be accessed via the front panel or the GPIB interface For test setups with multiple detectors this capability allows for targeted control capabilities for the laser diode module Interface Options To speed and simplify system integration and control the Model 2502 includes the Trigger Link feature and digital I O lines as well as standard IEEE 488 and RS 232 interfaces The Trigger Link feature combines six independent software selectable trigger lines on a single connector for simple direct control over all instruments in a system This feature is especially useful for reducing total test time if the test involves a sweep The Model 2502 can sweep through a series of measurements based on triggers received from the SourceMeter Instrument The digital I O lines simplify exter e EE TE nal handler control and binning operations l F For additional information and detailed specifications see page 114 Model 2502 rear panel A GREATER MEASURE OF CONFIDENCE The Model 2502 combines Keithley s expertise in low level current measurements with high speed ment ranges for testing laser diodes and LEDs in ance measurements measurements of cross talk and insertion loss on optical switches and many requirements for the transmitter as well as pump _ un LLI un Z a4 Q LLI l LLI O
47. figuration 5 Ratings are based on use of mount with provided cables and average majority of laser diode characteristics 6 The weight and dimension is the mounting unit without the cables un LLI un Z ea Q LLI om LLI O Q oO 543 Optical Switch Cards The Model 7090 Optical Switch Cards are members of Keithley s family of switch cards designed for the Models 7001 and 7002 Switch Mainframes These cards simplify making accurate connections from one input fiber channel to either eight or sixteen output fiber channels When combined with existing Series 7001 7002 switch cards these optical switches allow for hybrid switching combinations of opti cal RF and DC switching within a single switch mainframe extending the automated testing environment Combine Optical DC and RF Switching in One Instrument The Model 7090 cards are compatible with all other Series 7001 7002 switch cards so they can be used in conjunction with DC switch cards to control an LIV test system as well as for RF switching needs All of the switches can be used in one mainframe with a single GPIB address Use with 7001 and 7002 scanner mainframes rt Meets a Range of Test Requirements Model 7090 cards offer a number of options to ensure the compatibility of the switch with Perform multiple tests on a the test setup Each switch card has one input fiber aligned to one of eight or sixteen output fibers
48. ger Out BNC 5V 50Q output impedance output trigger corresponding to current source pulse pulse to trigger delay lt 100ns See Figure 3 MAINS INPUT 100V to 240V rms 50 60Hz 140VA EMC Conforms to European Union Directive 89 336 EEC EN61326 1 SAFETY Conforms to European Union Directive 73 23 EEC EN61010 1 CAT 1 VIBRATION MIL PRF 28800F Class 3 Random WARM UP 1 hour to rated accuracy DIMENSIONS WEIGHT Main Chassis bench configuration with handle amp feet 105mm high x 238mm wide x 416mm deep 4 in x 9 in x 16 in 2 67kg 5 90 Ibs Remote Test Head 95mm high x 178mm deep with interlock key installed x 216mm wide 3 in X 7 in X 8 in 1 23kg 2 70 lbs ENVIRONMENT Operating 0 50 C 70 R H up to 35 C Derate 3 R H C 35 50 C Storage 25 to 65 C KEITHLEY CONFIDENCE A GREATER MEASURE OF 2520 Pulsed Laser Diode Test System NOTES Pulse Waveform Flatness 500mA into 20 Ohms ii ee 1year 20 GE 0 6 0 515 2 If v Duty Cycle I exceeds 0 2 accuracy specifications must be derated with an additional error term as follows Full Pulse 500mA Range 0 1 rdg YD I Qa 0 51 5A Range 0 3 rdg VD 1 0 4 0 505 where I current setting Current Expanded Pulse Top Current D duty cycle A 0 3 pe a a 0 5 A This derating must also be applied for a period equal to the time that VD I was 20 2 0 2 0 495 Not including overshoot and setting time Pulse mode on
49. gher Yields To achieve the required signal to noise ratio traditional chip and bar level LIV testing solu tions have required the use of boxcar averagers or test system control software modifications to allow averaging several pulsed measurements The resolution of these measurements is criti cal for the kink test and threshold current calculations With earlier test system designs particularly when performing the kink test low resolution and poor linearity of the analog digitizer made it extremely difficult to discrimi nate between noise in the measurement and an actual device kink The Model 2520 s unique DSP based measurement approach automatically A GREATER MEASURE OF APPLICATIONS Production testing of e Telecommunication laser diodes e Optical storage read write head laser diodes e Vertical Cavity Surface Emitting Lasers VCSELs Thermal impedance e Junction temperature response CONFIDENCE un LLI un Z ea Q LLI om LLI O Q 521 Pulsed Laser Diode Test System identifies the settled region of the pulsed waveforms measured This means the Model 2520 stores only that portion of the pulse that is flat and contains meaningful data All measurements made in the flat portion of the pulse are averaged to improve the Signal to Noise ratio still further If greater resolution is required the Model 2520 can be programmed to perform several pulse and measure
50. hermistor Peltier 2500INT A GREATER MEASURE OF CONFIDENCE _ N LLI N Z Q LLI om LLI O _ A oO 339 _ un Lil un Z O ea gt Lil mel Lid O Q Oo 340 2510 2510 AT 50W TEC Controller combined with DC measurement functions Fully digital P I D control Autotuning capability for the thermal control loop 2510 AT Designed to control temperature during laser diode module testing Wide temperature setpoint range 50 C to 225 C and high setpoint resolution 0 001 C and stability 0 005 C Compatible with a variety of temperature sensor inputs thermistors RTDs and IC sensors Maintains constant temperature current voltage and sensor resistance AC Ohms measurement function verifies integrity of TEC Measures and displays TEC parameters during the control cycle 4 wire open short lead detection for thermal feedback element IEEE 488 and RS 232 interfaces Compact half rack design APPLICATIONS Control and production testing of thermoelectric coolers Peltier devices in e Laser diode modules e IR charge coupled device CCD arrays and charge injection devices CID e Cooled photodetectors e Thermal optic switches Temperature controlled fixtures 1 888 KEITHLEY v s only TEC SourceMeter Instrument Autotuning TEC SourceMeter Instrument T start Figure 2 Laser Diode TEC Minimum Overshoo
51. ifferential control provides excellent temperature stability This high stability allows for very fine control over the output wave length and over the optical power of the LDM during testing Another Model 2510 AT can be added to include ambient fixture control if the test will be done under a variety of ambient conditions The instrument includes a low level TEC resistance measurement function to check TECs for mechanical damage during module assembly 1 888 KEITHLEY uss only www keithley com A Laser Diode LIV Test System Kit The Model 2510 AT offers autotuning capability P I and D propor tional integral and derivative values for closed loop temperature con trol are determined by the instrument using a modified Zeigler Nichols algorithm This eliminates the need for users to experiment by inputting various P I and D coefficients repeatedly in order to determine the optimal values Model 2500INT Integrating Sphere This accessory for the Model 2502 accepts direct optical input and provides for accurate L measurement without being sensitive to polarization mode or beam profile at the end of the fiber The integrating sphere is available with a silicon germa nium or cooled indium gallium arsenide detector to ensure accurate optical power measurements at any wavelength e Model 854x The 854x Laser Diode Mount Series makes it easier than ever to configure a complete laser diode LIV test system for continuous wave test
52. iode 2 Photodiode 2 Photodiode N 3 Photodiode 2 Optical Power Measurement Measurement 2502 6487 6485 2635A 2636A Ky Page 335 110 107 10 s CURRENT MEASURE Si From 15 fA 20 fA 20 fA 120 fA x To 20 mA 20 mA 20 mA 10A EN PHOTODIODE 100V z VOLTAGE BIAS each channel 500 V none 200 V i FEATURES g 2500INT Series 2500INT Series 2500INT Series Optical Measurement Head Si amp Ge Si amp Ge Si amp Ge 190nm 1800nm 190nm 1800nm 190nm 1800nm Number of Channels 2 1 1 1 2 Instrument Connection 3 slot Triax 3 slot Triax BNC 3 slot Triax a a GPIB RS 232 ommunication GPIB RS 232 GPIB RS 232 GPIB RS 232 Ethernet LXI Laser Diode and LED Current Drivers 6220 SOTA OTA 2401 2420 2440 2520 622 __ Page 10 10 332 33 332 33 332 33 321 97 CURRENT SOURCE From 5 pA 5 pA 10 pA 500 pA 500 pA 70 uA 80 fA To 3ADC 10A pulsed 1 5 ADC 10A pulsed 105A EN 5A 5A 100 mA per channel per channel Type DC Pulse DC Pulse DC DC DC DC Pulse DC Pulse _ wi VOLTAGE MEASURE From 1 uV 1 uV 1 uV 10 uV 10 uV 60 uV 10 nV w 2182A 2 To 40 V 200 V 21V 60 V 40 V 10 V 100 V w 2182A FEATURES Instrument Connection Screw Terminal Screw Terminal Banana Banana Banana 1002 BNC 3 slot Triax m Communication GPIB RS 232 TSP GPIBIRS 232 TSP GPIB RS 232 GPIB RS 232 GPIB RS 232 GPIB RS 232 Ethernet m Ethernet LXI Ethernet LXI 6221 only Q O 1 888 KEITHLEY us only KEITHLEY www keithley com A GREATER MEASURE OF CONFIDENCE
53. is available with a silicon 2500INT 2 Si germanium 2500INT 2 Ge or cooled indium gallium arsenide InGaAs detector 2500INT 2 IGAC each calibrated with the sphere Spheres equipped with cooled indium gallium arse nide detectors include a controller to regulate the detector s temperature Unaffected by DUT Beam Profile Laser diodes can produce non gaussian beam profiles which can lead to inaccurate optical power measurements due to underfill or overfill of the detector While a number of methods are available to correct for underfill and overfill these methods can add to the overall inaccuracy of the measurement In contrast an integrating sphere is inherently insensitive to beam profiles The interior of the Model 2500INT integrating sphere has a highly reflective Spectralon surface which scatters reflects and diffuses the source beam produced by the device under test DUT This spreads the light from the DUT uniformly over the interior surface of the sphere with minimal absorption loss A detector can be placed on the interior surface of the sphere then the sphere detector combination can be cali brated The amount of optical radiation striking the detector is the same as any other point on the sphere interior due to the multiple diffuse reflections within the sphere Therefore the calibration and resulting measurement accuracy are independent of beam profile The Model 2500INT s Spectralon surface offers a variety of other
54. it invaluable for a wide range of design and production test applications A Keithley SourceMeter instrument provides a complete economical high throughput solution for component production testing all in one compact half rack box It combines source measure and control capabilities in a form factor that s unique to the industry The SourceMeter is also suitable for making a wide range of low power DC measurements including resistance at a specified current or voltage breakdown voltage leakage current and insulation resistance Single Box Solution By linking source and measurement circuitry in a single unit a SourceMeter instrument offers a vari ety of advantages over systems configured with separate source and measurement instruments For example it minimizes the time required for test station development setup and maintenance while lowering the overall cost of system ownership It simplifies the test process itself by eliminating many of the complex synchronization and connection issues associated with using multiple instruments Its compact half rack size conserves real estate in the test rack or bench ACCESSORIES AVAILABLE LASER DIODE MOUNTS TEST LEADS AND PROBES 8542 Dual In Line Telecom Laser Diode Mount Bundle 5806 Kelvin Clip Lead Set 8544 Butterfly Telecom Laser Diode Mount Bundle CABLES ADAPTERS 8544 TEC Butterfly Telecom Laser Diode Mount Bundle 2499 DIGIO Digital I O Expansion Assembly Ton thermistor and AD592
55. ith a high speed picoammeter Each of the two channels has an independent picoam meter and voltage source with measurements made simultaneously across both channels ER fa A eee F Wide Dynamic Measurement Range The Model 2502 offers current measurement ranges from 2nA to 20mA in decade steps This provides for all photodetector current measure MARGE ALTO RANGE C p applications such as LIV testing LED total radi others The Model 2502 meets industry testing laser modules High Accuracy Dark Current Measurements The Model 2502 s 2nA current measurement range is ideal for measuring dark currents with 1fA resolution Once the level of dark current has been determined the instrument s REL function automatically subtracts the dark current as an offset so the measured values are more accurate for optical power measurements Voltage Bias Capability The Model 2502 provides a choice of voltage bias ranges 10V or 100V This choice gives the system integrator the ability to match the bias range more closely to the type of photodetector being tested typically 10V for large area photodetectors and 100V for avalanche type photodetectors This abil ity to match the bias to the photodetector ensures improved measurement linearity and accuracy Ratio and Delta Measurements The Model 2502 can provide ratio or delta measurements between the two completely isolated channels such as the ratio of the back
56. k verification of a good connection to the DUT before I M liti Couples Some and Measite Capabilities functional testing proceeds This feature helps prevent the loss of precious The tightly coupled nature of a SourceMeter instrument provides many test time due to damaged corroded or otherwise faulty contacts in a test advantages over separate instruments The ability to fit a source and a fixture The innovative contact check design completes the verification meter in a single half rack enclosure saves valuable rack space and simpli and notification process in less than 350us comparable capabilities in fies the remote programming interface Also the tight control and a single other test equipment can require up to Sms to perform the same function GPIB address inherent in a single instr ument r esult in faster test times for Contact check failure is indicated on the instrument s front panel and over ATE applications due to reduced GPIB traffic the GPIB bus The digital I O interface can also be used to communicate contact failure to the component handler in automated applications Standard and Custom Sweeps P pp SourceMeter instruments provide sweep solutions that greatly accelerate testing with automation hooks for additional throughput improvement SOURCEMETER INSTRUMENT SPECIFICATIONS The following tables summarize the capabilities of the Models 2400 LV 2420 and 2440 2400 LV SOURCEMETER l V MEASUREMENTS Current Programming Acc
57. lied with 8544 TEC 1 888 KEITHLEY v s only Laser Diode Mounts for LIV Test Systems The 854X Laser Diode Mount Series makes it easier than ever to configure a complete laser diode LIV test system for con tinuous wave test applications These fixtures provide highly stable temperature control for all telecommunications laser diodes They offer an easy to use platform for testing laser diodes used in telecommunications They are designed to speed and simplify setting up test systems for all laser diode photodiode Lasers not included thermoelectric cooler thermistor configurations Three different fixture bundle designs are available all of which are compatible with Keithley s popu lar laser diode LIV test systems Each bundle includes all cabling required to connect the test instru mentation to the test fixture Cables are also available separately All 14 pin DIL and butterfly laser packages can be mounted on the 854X Series For higher power butterfly packages without integral ther moelectric coolers TECs the Model 8544 TEC offers a TEC and both thermistor and AD592CN sensors SPECIFICATIONS APPLICATIONS e Continuous wave laser diode LIV characterization This series covers the offering of Laser Diode Mounts LDM for use with Continuous LIV Test Solutions The following products 2400 LV 2420 2440 2500 2502 and 2510 2510AT are recom mended for use with these products LASER TEMPERATURE C
58. ly Output 500mA DC on 500mA range and 1A DC on 5A range Refer to Model 2520 Service Manual for test setup of current accuracy Figures 1 and 2 are typical pulse outputs into resistive loads Typical Per ANSI IEEE Std 181 1977 0 Per ANSI IEEE Std 181 1977 10 to 90 11 DC accuracy 700mV output terminal 0 2Q typical output impedance Figure 1 12 At DC 104s measurement pulse width filter off 13 Standard deviation of 10 000 readings with 10s pulse width filter off with I source set to OA DC 14 The A D converter has 14 bit resolution The useful resolution is improved by reading averaging The useful resolution is 0 49 0 485 10 15 25 Time us ZO DNDN RY Pulse Waveform Flatness 5A into 2 Ohms Range 1 ar J Pulse Width ns 400ns 100ns 15 Excluding total programmed Pulse ON time Pulse OFF time 16 Front panel off calc off filter off duty cycle lt 10 binary communications Expa nded Pulse Top 17 Returning 1 voltage and 2 current measurements for each source point ij 18 Sweep mode 19 Valid for both continuous pulse and sweep modes 20 Shown is the Power Distribution based on current settings 21 Timing Cycle PW pw pd 4 max Useful Resolution Full Pulse Averaging Filter Setting Model 2520 specifications 10 15 Time us Figure 2 Pulse Output Trigger Output Relationship Trigger
59. mpered by long rise times so they can only measure a portion of the laser diode s light output Even when using a fast detector many detectors are not good for analog signal measurement By linking the Model 2520 with the optimum combination of sphere and detector characteristics Keithley provides the low level sensitivity needed to ensure accurate pulse measure ments Easier Laser Diode Power Measurements An integrating sphere is inherently insensitive to variations in the beam Mee i profile produced by a device under test DUT The Model 2520INT s Optimized for laser diode pulse interior is highly reflective Spectralon which scatters reflects and diffuses the source beam the testing DUT produces This spreads the light from the DUT uniformly over the sphere s interior surface with minimal absorption loss The detector which reads the amount of optical power produced by the DUT is mounted on the interior surface Due to the multiple diffuse reflections within the sphere the amount of optical radiation that strikes the detector is the same as that which falls on any other Built in germanium detector point on the sphere s interior To convert the attenuated signal measured by the detector into an accurate optical power measurement the sphere and detector are calibrated as a unit Suitable for production and laboratory environments Works seamlessly with the Model 2520 Pulsed Laser Diode Simplifies Beam Alignment Test Syst
60. ne combines a full four quadrant precision source see Figure 3 with measurement capability Source and meas ure ranges provide a very wide dynamic range from as low as a 1uA range or 200mV to 5A or 1000V These very wide dynamic ranges allow testing diverse devices from delicate AlGaAs laser diodes to silicon avalanche photodiodes I IN OUT HI Q e Remote lsource Vmeter Compliance R Remote IN OUT LO Figure 4 In current source mode a SourceMeter instrument can force current while measuring voltage The remote voltage sense ensures the programmable voltage compliance isn t exceeded Imeter Compliance Vsou rce Feedback to Adjust V san x Remote I IN OUT LO Figure 5 In voltage source mode a SourceMeter instrument forces a voltage and measures current Remote sense of the volt age ensures the desired voltage at the DUT Verifying device connections Series 2400 SourceMeter instruments all offer the Contact Check option which automatically verifies all test leads are connected to the DUT prior to energizing the test leads or executing a test sequence Figure 6 shows Contact Check identifying a disconnected remote sense test lead Without the sense test lead connected the voltage compliance couldn t be controlled dur ing test execution GUARD SENSE IN OUT HI _SENSE HI 350us Contact Check Imeter gt optional SENSE LO IN OUT LO Figure 6 The contact check option verifi
61. nly Integrating Sphere for Pulsed Measurements Attenuation of Laser Diode Output Detectors usually have a maximum power limit of a few milliwatts before the detector is over saturated The Model 2520INT Integrating Sphere s highly reflective Spectralon interior surface elimi nates the problem of detector saturation This coating reflects and diffuses the light output from the DUT uniformly over the interior surface of the sphere which inherently attenuates the level of power read by the built in detector The power level at any point on the sphere s interior surface is far less than the power level of a beam that falls directly on the detector This allows testing much higher power devices without risking detector damage The Model 2520INT s design attenuates the power output of a laser diode by approximately 100 1 Optimized for Telecommunications Wavelengths The Model 2520INT s germanium detector is capable of detecting wavelengths from 800 1700nm The detector and the sphere are calibrated as a unit in 10nm increments at wavelengths that are of particular interest for laser diode testing 950 1010nm and 1280 1620nm Calibration constants are provided in printed form as well as in CSV format on a floppy diskette to simplify programming them into a test system When combined with the Model 2520INT the Model 2520 Pulsed Laser Diode Test system is capable of measuring power ranging from 14 5mW to 7W depending on the wavelength
62. oth mainframes offer Trigger Link interfaces to ensure tight control over the test system and eliminate IEEE bus command overhead e LEDs and OLEDs e Passive optical components e VCSEL arrays e Optical add drop multiplexer OADM e Laser diode modules Bulkhead options available e Laser diode bars _ N Lid un Z a4 _ Ad Lil mnl Lil O Q o 1 888 KEITHLEY v s only A GREATER MEASURE OF CONFIDENCE 344 7090 8 4 1x8 Multimode with FC SPC Fiber Pigtail 7090 16 6 1x16 Single Mode with FC SPC Fiber Pigtail User s Manual RELATED DC RF SWITCH OPTIONS 7011 C Quad 1x10 Multiplexer Card 7012 C 4x10 Matrix Card 7053 High Current Switch Card 7016A 2GHz Dual 1x4 50Q Card 7017 800MHz Card 7038 2GHz 75Q Card SERVICES AVAILABLE 7090 16 6 3Y EW 1 year factory warranty extended to 3 years from date of shipment 7090 8 4 3Y EW 1 year factory warranty extended to 3 years from date of shipment Optical Switch Cards PHYSICAL PROPERTIES CONFIGURATION Single channel 1xN non blocking switch Model No of Wavelength Fiber Number Channels Fiber Type nm Connector Length 7090 8 4 1x8 Multimode fiber 780 1350 FC SPC 1m 62 5 125 each ch 7090 16 6 1x16 Single mode fiber SMF 28 1290 1650 FC SPC 1m 9 125 each ch REFERENCED SWITCH MANUFACTURER S OPTICAL SPECIFICATIONS Typical Maximum Units Wavelength Range 780 to 1650 nm Switch Life gt 10 million cycles min Inser
63. quipment Cabinet 14 high V Easy Connect Multi Terminated Laser Diode Cables 8000 174 Bau Cabinet 175 high LJ Easy Connect Multi Terminated Temperature Cables i Ea a GPIB CARDS un CUSTOM SYSTEMS GPIB communication required for complete LIV capabilities Y Custom systems are available Contact your local Keithley sales person MO A cleus a KUSB 488B IEEF 488 USB to GPIB Adapter for USB Port S ASSEMBLY SERVICES E The 25 Systems are not assembled If you would like assembly service contact your local LLJ O Q 1 888 KEITHLEY us only KEITHLEY www keithley com A GREATER MEASURE OF CONFIDENCE 351 _ a Lid N Z Os gt Lil mnl Lil O Q Oo 552 2400 LV 2400 C 2420 2420 C 2440 2440 C TLJ Designed for production testing of VCSELs transmitter high power pump lasers and other high current electronic components Key building block for programmable LIV test system for laser diode modules Very low noise current source 50pA for laser diode drive Up to 5A laser diode drive current Trigger Link Source Memory and buffer memory support automatic test sequencing Reduced GPIB bus traffic improves test throughput Expandable and flexible for future requirements Built in comparator for fast pass fail testing Digital 1 O handler interface 1000 readings second at AW digits Optional contact check function 1 888 KEITHLEY uss only
64. r instrument package Configured from proven Keithley instrumentation the basic configuration can be easily modified to add new measurement functions as new testing needs evolve 1 888 KEITHLEY uss only www keithley com Pulsed Laser Diode Test System biaph va Figure 3 This plot illustrates the Model 2520 s pulsed LIV sweep capabil ity The sweep was programmed from 0 to 100mA in 1mA steps Pulse width was programmed at 1ps at 1 duty cycle providing for a complete sweep in just 10ms excluding data transfer time Figure 4 Model 2520 Remote Test Head KEITHLEY CONFIDENCE GREATER MEASURE OF ur e me 2 me aD WY af Uj r ur aD ud me aD oat gt a O G x c OPTOELECTRONICS TEST 323 Model 2520 specifications un Lil un Z Q LLJ mel Lid O _ A oO 524 2520 Pulsed Laser Diode Test System LASER DIODE PULSE OR DC CURRENT SOURCE SPECIFICATIONS DRIVE CURRENT OFF CURRENT Approx RMS Noise Approx Source Programming Electrical Accuracy 6 typical Programming Electrical Accuracy Range Resolution Resolution rdg mA IkHz 20MHz Range Resolution Resolution rdg mA 0 500 mA 10 A 8 uA 0 2 0 45 70 uA 0 15 mA 1 uA 7 nA typ 0 2 0 45 0 1 0 A DC 0 5 0 A Pulse 100 A 80 A 0 2 45 800 uA 0 150 mA 10 A 70 nA typ 02 45 TEMPERATURE COEFFICIENT 0 18 C amp 28 5
65. rammable Setpoints and Limits Users can assign temperature current voltage and thermistor resistance setpoints The thermistor resistance setpoint feature allows higher cor relation of test results with actual performance in the field for laser diode modules because reference resistors are used to control the temperature of the module Programmable power current and temperature limits offer maximum protection against damage to the device under test Accurate Real Time Measurements Both models can perform real time measurements on the TEC including TEC current voltage drop power dissipation and resistance providing valuable information on the operation of the thermal control system Peltier TEC Ohms Measurement TEC devices are easily affected by mechanical damage such as sheer stress during assembly The most effective method to test a device for damage after it has been incorporated into a laser diode module is to perform a low level AC or reversing DC ohms measurement If there is a change in the TEC s resistance value when compared with the manufacturer s speci fication mechanical damage is indicated Unlike a standard DC resistance measurement where the current passing through the device can produce device heating and affect the measured resistance the reversing DC ohms method does not and allows more accurate measurements 1 888 KEITHLEY uss only www keithley com A TEC SourceMeter Instrument Autotuning T
66. rent voltage testing of laser diodes in one compact half rack instrument The tight synchronization of source and measure capabilities ensures high measurement accuracy even when testing with pulse widths as short as 500ns LIV Test Capability The Model 2520 can perform pulsed LIV testing up to 5A and continuous LIV testing up to 1A Its pulsed testing capability makes it suitable for testing a broad range of laser diodes including the pump laser designs for Raman amplifiers The instrument s ability to perform both DC and pulsed LIV sweeps on the same device simplifies analyzing the impact of thermal transients on the LIV characteristics of the laser diode Maximize Throughput and Eliminate Production Bottlenecks By working in cooperation with leading laser diode manufacturers Keithley designed the Model 2520 specifically to enhance chip and bar level test stand yield and throughput Its inte grated design ease of use high speed and high accuracy provides a complete solution to help laser diode manufacturers meet their production schedules Producers of laser diodes face con stant pressure to increase test throughput and optimize return on investment for their capital equipment used in production testing Until recently these producers were forced to use relatively slow and cumbersome test stands for testing laser diodes at the chip and bar level which often led to production bottlenecks Higher Resolution for Hi
67. rigger out Series 2400 instruments use a Trigger Link Before Measure Before Before Source Delay Series 2400 Input Triggers 5 M Source Measure Sense Series 2400 After After After Outp ut Triggers Source Delay Measure Figure 10 Series 2400 instrument s trigger input output scheme Precision characterization of active optoelectron ic components often requires multiple instru ments working together For instance two Series 2400 instruments can be used together one SourceMeter instrument to drive the device and another SourceMeter instrument connected to a photodiode to record the optical output of the active device Figure 11 shows two Series 2400 instruments working synchronously together to characterize an LED 2400 1 LED 2400 2 PD TRIG INP SENS Line 1 TRIG INP SOUR Line 2 TRIG OUTP SOUR Line 2 TRIG OUTP DEL Line 1 Figure 11 SDM triggers to synchronize two Series 2400 instruments Notice how trigger in and trigger out are tied to different parts of the SDM cycle to ensure that measurements on the LED and the PD are made at the same time This same technique can be applied to ensure that the source current is stable prior to making an optical spectrum meas urement with an additional instrument Complete DUT protection DUT protection is a major concern for optoelec tronic devices SourceMeter instruments are ideal for providing a safe electrical environment
68. ssed these issues by studying and documenting the optimum cable configuration to enhance measurement accuracy with extremely fast pulses Figure 3 illustrates the results of a typical pulse LIV sweep test with the Model 2520 In this test a 100 point pulsed LIV sweep using a lus pulse width at 1 duty cycle was completed in just 110ms including data transfer time several orders of magnitude faster than existing semi custom test systems ESD Protection A laser diode s material make up design and small size make it extremely sensitive to temperature increases and electrostatic discharges ESDs To prevent damage prior to the start of the test and after test completion the Model 2520 shorts the DUT to prevent transients from destroying the device The instrument s 500 nanosecond pulse and measure test cycle minimizes device heating during test especially when a short duty cycle is used Test Sequencing and Optimization Up to five user definable test setups can be stored in the Model 2520 for easy recall The Model 2520 s built in Buffer Memory and Trigger Link interface can reduce or even eliminate time consuming GPIB traffic during a test sequence The Buffer Memory can store up to 1000 points of measurement data during the test sweep The Trigger Link combines six independent soft ware selectable trigger lines on a single connector for simple direct control over all instruments in a system This interface allows the Model 2520 to
69. t 27 Time s Figure 4 Active temperature control is very important due to the sensitivity of laser diodes to temperature changes If the temperature var ies the laser diode s dominant output wavelength may change leading to signal overlap and crosstalk problems Autotuning Function The Model 2510 AT Autotuning TEC SourceMeter instrument offers manufacturers the ability to automatically tune the tem perature control loop required for CW testing of optoelectronic components such as laser diode modules and thermo optic switches This capa bility eliminates the need for time consuming experimentation to determine the optimal P I D coefficient values The Model 2510 AT s P I D Auto Tune software employs a modified Ziegler Nichols algorithm to determine the coefficients used to control the P I D loop This algorithm ensures that the final settling perturbations are damped by 25 each cycle of the oscillation The autotuning process begins with applying a voltage step input to the system being tuned in open loop mode and measuring several parameters of the system s response to this voltage step function The system s response to the step function is illus trated in Figure 2 The lag time of the system response the maximum initial slope and the TAU 63 1 e response time are measured then used to generate the Kp proportional gain constant Ki integral gain constant and Kd derivative gain constant
70. ther problems associated with saturation of the detector Designed Specifically for Laser Diode Testing The design of the Model 2500INT Integrating Sphere is optimized for measuring the optical power of laser diodes Each sphere is two inches in diameter with a inch input port suitable for fiber or direct light as in chip on submount applications The port and detector are positioned so there is no need to use a baffle to prevent the input from shining directly onto the detector Cooled InGaAs Detector Selection Criteria Detector 900 1670 nm When choosing the most appropriate detector 1550 nm for a specific application consider the following Excellent at 1550 nm selection criteria N A e Wavelengths of maximum interest KR wick e Sensitivity at wavelength of interest KKK zoek d Speed KK e Cost e Calibration accuracy stability KEITHLEY OF GREATER MEASURE CONFIDENCE CN LC CN O ae a Sk as 1e WY ad S od a a _ 70 a z aD oO eo VW gt eo oO r UO a aw 7 v LLI OPTOELECTRONICS TEST 337 2500INT Integrating Sphere SPECIFICATIONS TYPICAL REFLECTANCE DATA FOR 1800 0 987 SPECTRALON MATERIAL Wavelength nm Spectralon PHYSICAL THERMO OPTICAL AND ELECTRONIC PROPERTIES OF SPECTRALON MATERIAL ae TT Property ASTM Test Value 700 0 992 Density N A 1 25 1 5g cm
71. tion Loss 0 6 1 2 dB Repeatability 0 03 dB Back Reflection SM MM 4 60 20 55 dB Polarization Dependent Loss PDL 0 05 dB Crosstalk 80 dB GENERAL SWITCHING TIME 1x8 1x16 Reset Open 315ms 450ms Settle Close 500ms 630ms DIMENSIONS WEIGHT 144mm wide x 272mm high x 32mm deep 4 5 in x 10 75 in x 1 25 in Net weight 0 66kg 1 5 Ib ENVIRONMENT Operating Temperature 0 to 40 C Storage Temperature 20 to 65 C Relative Humidity Up to 35 C lt 80 RH non condensing EMC European Union Directive 89 336 EEC EN61326 SAFETY European Union Directive 73 23 EEC EN61010 1 NOTES 1 All optical specifications are referenced without connectors and are guaranteed by switch manufacturer only Connectorization data will be provided for Insertion Loss and Back Reflection for each channel per switch card 2 Measured at 23 5 C 3 Sequential repeatability for 100 cycles at constant temperature after warm up Difference in Insertion Loss 4 Based on standard 1m pigtail length 5 Measured at 1550nm 6 Actuation time measured from system trigger Reset Open refers to Channel N to Reset time Settle Close refers to Reset to Channel N or Channel N to Channel M time Reset position is optically blocked 7 At higher operating temperatures a typical additive insertion loss of 0 1dB should be expected for the strain relief model 0 3dB for the bulkhead model 1 888 KEITHLEY v s only
72. tion can be easily modified to add new measurement functions or to allow for new connections Tight Integration Ensures Higher Test Speeds The LIV test system allows for fast easy integra tion and high test speeds because all the build ing blocks come from the same supplier All newer Keithley instruments include the Trigger Link feature and digital I O lines as well as standard IEEE 488 GPIB and RS 232 interfaces to speed and simplify system integration and control The Trigger Link feature combines independent software selectable trigger lines on a single connector for simple direct control over all instruments in a system without the need for constant traffic over the GPIB This feature is particularly useful for reducing total test time if the test involves a sweep The digital I O lines simplify external handler control and binning operations Source memory and buffer memory provided by Models 2400 LV 2420 2440 and 2502 enable elimination of GPIB traffic during sweep testing Source memory is a built in programmable test sequencer for configuring up to 100 different tests The buffer memory stores data that can be downloaded to the PC via the GPIB after an LIV test sweep is complete Source memory buffer memory and Trigger Link work in concert to form an autonomous test system all it takes to begin the test sequence is a start of test command from the PC Benchmark testing has demonstrated that these features allo
73. ts experimentally In all other respects the Model 2510 and Model 2510 AT provide exactly the same set of features and capabilities The SourceMeter Concept The Model 2510 and Model 2510 AT draw upon Keithley s unique SourceMeter concept which combines precision voltage current sourcing and measurement functions into a single instrument SourceMeter instruments provide numerous advantages over the use of separate instruments includ ing lower acquisition and maintenance costs the need for less rack space easier system integration and programming and a broad dynamic range Part of a Comprehensive LIV Test System In a laser diode CW test stand the Model 2510 or Model 2510 AT can control the temperature of actively cooled optical components and assemblies such as laser diode modules to within 0 005 C of the user defined setpoint During testing the instrument measures the internal temperature of the laser diode module from any of a variety of temperature sensors then drives power through the TEC within the laser diode module in order to maintain its temperature at the desired setpoint Figure 1 The capabilities of the Models 2510 and 2510 AT are intended to complement those of other Keithley instruments often used in laser diode module LIV testing including the Model 2400 and 2420 SourceMeter instruments the Model 2502 Dual Photo diode Meter and the Model 2500INT Integrating Sphere Trigger Link 2510 or 2510 AT T
74. ules 5A pump laser diodes PP VCSELs EDFA pumps Raman amplifiers Model 2400 LV Model 2420 Model 2440 SourceMeter 3A SourceMeter 3A 5A SourceMeter Instrument I Instrument Instrument y 100mA 20V 60V A duty cycle limited The Model 2400 LV is ideal for testing a wide variety Choose the Model 2420 for testing higher power The Model 2440 s wide dynamic range is well suited of devices including diodes resistors resistor networks resistors thermistors Ippo solar cells batteries and for applications such as testing high power pump lasers active circuit protection devices and portable battery high current or medium power diodes including for use in optical amplifiers and laser bar tests as well powered devices and components switching and Schottky diodes as testing other higher power components 1 888 KEITHLEY us only KEITHLEY www keithley com A GREATER MEASURE OF CONFIDENCE ele E 7 a D ad ad aD oO ae oO UO aD O mn Le aD j 70 aD go aD i gt oO ui me K a j oO ka pa lt 00 OPTOELECTRONICS TEST 533 2400 LV 2400 C SourceMeter Instruments for 2420 2420 C 2440 2440 C Optoelectronic EV Testing Faster Easier and More Efficient Testing Optional Contact Check and Automation The Contact Check option available on all Series 2400 SourceMeter instru ments allows quic
75. uracy Voltage Measurement Accuracy u O gt QO QO D A N T T N N ST N T N Accuracy 1 Year Accuracy 1 Year Programming 23 C 5 C Default Input 23 C 5 C Range Resolution rdg amps Range Resolution Resistance rdg volts 1 00000 A 50 pA 0 035 600 pA 200 000 mV 1 py gt 10 GQ 0 01 300 uV 10 0000 uA 500 pA 0 033 2nA 2 00000 V 10 pV gt 10 GQ 0 012 300 uV 100 000 uA 5 nA 0 031 20 nA 20 0000 V 100 uV gt 10 GQ 0 015 1 5 mV 1 00000 mA 50 nA 0 034 200 nA 10 0000 mA 500 nA 0 045 2A 100 000 mA 5 uA 0 066 20 A 1 00000 A 50 uA 0 27 900 uA 2420 SOURCEMETER I V MEASUREMENTS Current Programming Accuracy Voltage Measurement Accuracy Accuracy 1 Year Accuracy 1 Year Programming 23 C 5 C Default Input 23 C 5 C Range Resolution rdg amps Range Resolution Resistance rdg volts 10 0000 uA 500 pA 0 033 2nA 200 000 mV 1 uV gt 10 GQ 0 012 300 uV 100 000 uA 5 nA 0 031 20 nA 2 00000 V 10 uV gt 10 GQ 0 012 300 uV 1 00000 mA 50 nA 0 034 200 nA 20 0000 V 100 uV gt 10 GQ 0 015 1 mV 10 0000 mA 500 nA 0 045 2puA 60 0000 V 1 mV gt 10 GQ 0 015 3 mV 100 000 mA 5 uA 0 066 20 uA 1 00000 A 50 uA 0 067 900 A 3 00000 A 50 uA 0 059 2 7mA 2440 SOURCEMETER l V MEASUREMENTS Current Programming Accuracy Voltage Measurement Accuracy pe Accuracy 1 Year Accuracy 1 Year Lu Programming 23 C 5 C D
76. w the system to complete a 400 point LIV test sweep with data transfer to the PC in less than eight seconds Easy to Program Easy to Use Each kit comes complete with the necessary cables and hardware to use the system Having all the instrumentation supplied by the same vendor simplifies system programming and improves ease of use All instruments in the standard system respond to the same SCPI command structure LabVIEW and Visual Instrument drivers and demonstration software are also available to simplify application development Flexible System Configuration Options In addition to the standard system configurations LIV test systems can be customized to accommo date virtually any test sequence or setup requirement Adding new capabilities or expanding existing ones is as simple as adding a new Keithley instrument or switch system For example to add isola tion resistance measurements just include any of Keithley s Series 2000 Digital Multimeters in the configuration To accommodate multiple pin out schemes choose a Series 7000 Switch Mainframe and plug in one or more switch cards such as the Model 7012 4x10 Matrix Card or the Model 7053 High Current Scanner Card for switching up to 5A Automated switching makes it simple to accommodate future pin out configuration changes un LLI _ un Z ea Q LLI om LLI O Q oO A GREATER MEASURE OF CONFIDENCE 329 90 a aD aD en E

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